WO2020031847A1 - Dispositif de détermination de la qualité de grain - Google Patents

Dispositif de détermination de la qualité de grain Download PDF

Info

Publication number
WO2020031847A1
WO2020031847A1 PCT/JP2019/030239 JP2019030239W WO2020031847A1 WO 2020031847 A1 WO2020031847 A1 WO 2020031847A1 JP 2019030239 W JP2019030239 W JP 2019030239W WO 2020031847 A1 WO2020031847 A1 WO 2020031847A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
light source
grain
sample dish
determination device
Prior art date
Application number
PCT/JP2019/030239
Other languages
English (en)
Japanese (ja)
Inventor
秀昭 松島
池田 学
Original Assignee
株式会社サタケ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社サタケ filed Critical 株式会社サタケ
Priority to BR112021002386-0A priority Critical patent/BR112021002386A2/pt
Priority to CN201980052351.8A priority patent/CN112534244B/zh
Publication of WO2020031847A1 publication Critical patent/WO2020031847A1/fr

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids

Definitions

  • the present invention relates to a grain quality discriminating apparatus for discriminating the appearance quality of grains such as rice, wheat, beans, and corn.
  • the present invention includes an illumination mechanism that can prevent reflection of a light source on the bottom of a sample dish, and can accurately determine the appearance quality of grains placed on the sample dish.
  • an illumination mechanism that can prevent reflection of a light source on the bottom of a sample dish, and can accurately determine the appearance quality of grains placed on the sample dish.
  • Patent Literature 1 includes an upper imaging / illumination unit, a lower illumination unit, and a tray disposed between the upper imaging / illumination unit and an arbitrary number of grains to be discriminated, and a grain placed on the tray.
  • Light is emitted from the upper light emitting unit of the upper imaging / illumination unit to the grain, and the reflected light is imaged by the upper imaging / illumination unit, or light is emitted from the lower light emitting unit of the lower illumination unit to the grain.
  • an apparatus that includes an imaging unit that irradiates the light, images the transmitted light with an upper imaging / illumination unit, and acquires image data based on reflected light or transmitted light from the grain.
  • a base member a rotating member rotatably disposed in the base member and having a light source on one side, and an outer frame mounted on the base member together with the base member.
  • a cover member having an opening for receiving a sample dish on which a grain is placed, which is located above the rotating member, wherein a sample dish on which a plurality of grains are placed is placed in the opening of the cover member.
  • An apparatus is described in which the light source is set to irradiate the transparent bottom surface of the sample dish with light by the light source from obliquely below, and light is transmitted obliquely from below to a plurality of grains placed on the sample dish. .
  • the kernel is used.
  • the appearance quality of the grains can be determined.
  • an operator can detect cracked rice or the like by observing the presence or absence of a dark shadow in the grain visually or the like from above the sample dish.
  • Patent Literature 1 places a tray on a lower light-emitting unit, and the lower light-emitting unit is reflected on the bottom of the tray, and an image of a grain obtained by the imaging unit is obtained. There is a problem that the appearance quality of the grain cannot be determined with high accuracy because it affects the data.
  • the device described in Patent Document 2 arranges a light source on a lower side of a sample dish and irradiates light to a bottom surface of the sample dish from obliquely below. Otherwise, the light source is reflected on the bottom of the sample dish and affects the observation of the grain by a worker from above the sample dish. Etc. cannot be accurately detected.
  • the present invention provides a grain quality discriminating apparatus that can accurately determine the appearance quality of grains placed on the sample dish by preventing reflection of a light source on the bottom of a transparent sample dish.
  • the purpose is to provide.
  • one embodiment of the present invention provides: A grain that irradiates light to a grain placed on a sample dish having a transparent bottom surface, transmits light to the grain, and determines the appearance quality of the grain based on transmitted light from the grain.
  • a grain quality determination device An illumination mechanism having a light source is arranged below the sample dish, The illumination mechanism irradiates the kernel placed on the sample dish with indirect light.
  • the illumination mechanism has a light source block disposed diagonally below the sample dish, and the light source is disposed inside the light source block, It is preferable that the illumination mechanism reflects the light from the light source inside the light source block and irradiates the kernel placed on the sample dish as indirect light from obliquely below.
  • the light source block is a fixed portion to which the light source is fixed, and is located above the fixed portion and extends toward the center of the sample dish to block direct light (direct light) from the light source toward the bottom of the sample dish.
  • a black reflector serving as a background is provided below the sample dish, while the illumination mechanism is provided adjacent to the outside of the black reflector, and the light source block includes a light source and a light source.
  • the sides are white.
  • One embodiment of the present invention is: It is preferable that a plurality of the illumination mechanisms are disposed diagonally below the sample dish, and that the light from the light source is radiated from a plurality of directions as indirect light to the grains placed on the sample dish.
  • the grain quality discriminating apparatus irradiates light to a grain placed on a sample dish having a transparent bottom surface, and transmits and / or reflects light to the grain, and transmits light from the grain and / Or a grain quality determination device that determines the appearance quality of the grain based on reflected light, Disposing an upper illumination mechanism having an upper light source diagonally above the sample dish, The upper illumination mechanism, a fixed portion to which the upper light source is fixed, a lower light-shielding portion that is located below the upper light source and blocks direct light from the upper light source toward the sample dish and reflects upward, An upper light-shielding portion that is located above and has an upper light-shielding portion that intercepts the direct light heading upward from the upper light source and the reflected light reflected by the lower light-shielding portion and reflects the light downward, It is preferable that the upper illumination mechanism reflects light from the upper light source at each of the light-shielding portions, and irradiates the kernel
  • One embodiment of the present invention is: It is preferable that a plurality of the upper illuminating mechanisms are provided on the inner surface of the cylindrical body, and the light from the upper light source irradiates the kernel placed on the sample dish as indirect light from a plurality of directions.
  • One embodiment of the present invention is: Preferably, while each of the light-shielding portions is black, the inner surface of the cylindrical body is white below the upper light-shielding portion and black above the upper light-shielding portion.
  • a black light-shielding plate having a circular opening and having a diaphragm function for adjusting the amount of transmitted light and / or reflected light from the grain is disposed above the upper light-shielding portion and inside the cylindrical body. Is preferred.
  • the illumination mechanism irradiates the light from the light source from below onto the grains placed on the sample dish as indirect light, so that the light is applied to the bottom of the sample dish.
  • the reflection of the light source can be prevented. Therefore, according to the grain quality determination device of one embodiment of the present invention, it is possible to accurately determine the appearance quality of the grains placed on the sample dish based on the transmitted light from the grains.
  • the illumination mechanism irradiates the light from the light source to the grains placed on the sample dish as indirect light from below, the illumination mechanism emits light to the bottom of the sample dish.
  • the illumination mechanism In order to prevent the reflection of the light source, it is not necessary to dispose the illumination mechanism away from the center of the sample dish to the side. Therefore, according to the grain quality discriminating apparatus of one embodiment of the present invention, it is possible to prevent the apparatus from increasing in size in order to prevent the light source from being reflected on the bottom of the sample dish.
  • the illumination mechanism has a light source block disposed obliquely below the sample dish, and the light source is disposed inside the light source block, If the illumination mechanism reflects the light from the light source inside the light source block and irradiates the grains placed on the sample dish as indirect light from obliquely below, the illumination mechanism includes: The light from the light source can be turned into indirect light with a simple configuration.
  • the grain quality determination device of one embodiment of the present invention is suitable for detecting cracks in the body if the light from the light source is radiated diagonally from below on the grains placed on the sample dish. It is.
  • the grain quality determination device is configured such that the light source block is a fixed portion to which the light source is fixed, is located above the fixed portion, extends toward the center of the sample dish, and extends from the light source.
  • the apparatus can be downsized. Further, in the grain quality determination device according to the embodiment of the present invention, the illumination mechanism can guide most of the light from the light source to the reflection portion of the light source block, so that the light can be effectively used. .
  • the grain quality determination device is arranged such that a black reflector serving as a background is disposed below the sample dish, while the illumination mechanism is adjacent to the outside of the black reflector. If the inner surfaces of the respective parts of the light source block are made white, the light of the light source is effectively reflected by the white inner surfaces of the respective parts of the light source block to be effectively utilized. can do. Further, since most of the light incident on the black reflector serving as the background from the illumination mechanism is indirect light, it is possible to prevent the reflection of the light source on the bottom of the sample dish due to reflection from the black reflector. Can be.
  • the grain quality determination device is configured such that a plurality of the illumination mechanisms are disposed diagonally below the sample dish, and light from the light source is placed on the sample dish. In contrast, by irradiating the indirect light from a plurality of directions, it is possible to accurately detect body cracks and the like regardless of the direction of the grains.
  • the upper illumination mechanism reflects light from the upper light source at the lower light-shielding portion and the upper light-shielding portion, and indirect light is applied to the kernel placed on the sample dish. If the irradiation is performed diagonally from above, the reflection of the upper light source on the sample dish can be prevented. Therefore, according to the grain quality determination device of one embodiment of the present invention, it is possible to accurately determine the appearance quality of a grain placed on a sample dish based on transmitted light and / or reflected light from the grain. Can be.
  • the upper illumination mechanism reflects the light from the upper light source at each light shielding unit, and indirectly lights the grain placed on the sample dish from obliquely above. If irradiation is performed, it is not necessary to dispose the upper illumination mechanism away from the center of the sample dish to the side in order to prevent reflection of the upper light source on the bottom of the sample dish. Therefore, according to the grain quality discriminating apparatus of one embodiment of the present invention, it is possible to prevent the apparatus from increasing in size in order to prevent the light source from being reflected on the bottom of the sample dish.
  • the upper illumination mechanism is provided in plural on an inner surface of a cylindrical body, and indirect light is applied to the kernel placed on the sample dish by light from the upper light source. If the irradiation is performed from a plurality of directions, the appearance quality can be accurately determined regardless of the direction of the grain.
  • the inner surface of the cylindrical body is white below the upper light-shielding portion and black above the upper light-shielding portion. If so, the light from each of the upper light sources can be effectively utilized by the white inner surface below the upper light-shielding portion of the cylindrical body.
  • an image of the grain placed on the sample dish is to be acquired, etc., but each of the above-mentioned cylinders above the cylinder by the black inner surface above the upper light-shielding portion. Since the wraparound of the light from the upper light source can be prevented, a clear image of the grain can be obtained.
  • the grain quality determination device has a circular opening above the upper light-shielding portion and inside the cylindrical body, and has transmitted light and / or reflected light from the grain. If a black light-shielding plate having a diaphragm function for adjusting the amount of light is provided, when acquiring an image of a grain placed on the sample dish from above the cylindrical body, etc., the grain is sharp. Images can be acquired. Further, by changing the size of the opening of the black light-shielding plate, it is possible to adjust a range in which an image of a grain placed on the sample dish can be obtained, and thus the sample of the light source or the upper light source can be adjusted. This is effective in preventing reflection on the bottom of the dish.
  • a grain quality determination device capable of accurately determining the appearance quality of grains placed on the sample dish by preventing reflection of a light source on the bottom of a transparent sample dish.
  • FIG. 1 is a schematic explanatory diagram of a grain quality determination device. Explanatory drawing of a lower illumination mechanism. AA sectional drawing of FIG. Explanatory drawing of an upper illumination mechanism. FIG. 5 is a sectional view taken along line BB of FIG. 4. Explanatory drawing of another example of a lower illumination mechanism. The schematic explanatory drawing of another grain quality discriminating apparatus. The schematic explanatory drawing of the modification of the grain quality determination apparatus of FIG.
  • FIG. 1 is a schematic explanatory diagram of a grain quality determination device according to an embodiment of the present invention.
  • the grain quality determination device 1 shown in FIG. 1 includes a lower illumination storage unit 2 and an upper illumination cylinder 3.
  • the storage unit 2 for lower illumination has a rectangular space in plan view, and the lower illumination mechanism 20 is stored along the side surface.
  • a circular opening 24 is provided at the upper center of the lower illumination storage unit 2, and a circular transparent carton 4 made of a transparent material is placed on the opening 24.
  • a black reflector 23 serving as a background is disposed below the transparent carton 4 at the bottom of the lower illumination storage unit 2.
  • the lower illumination mechanism 20 is disposed obliquely below the transparent carton (a sample dish having a transparent bottom surface) 4 and irradiates the grain placed on the transparent carton 4 from obliquely below.
  • the lower illumination mechanism 20 may be disposed directly below the transparent carton 4, as shown in FIG.
  • the lower illumination mechanism 20 is configured by a member having the same color as that of the black reflection plate 23, and configured to function as a background.
  • the upper illumination tube 3 has a cylindrical shape and is disposed concentrically with the opening 24 above the lower illumination storage unit 2.
  • An upper illumination mechanism 30 is provided on the inner surface of the upper illumination tube 3.
  • the upper illumination tube 3 is closed at its upper part by a lid 34 and is placed on the transparent carton 4 by an image acquisition means (sensor) 5 such as a camera through an opening 35 provided at the center of the lid 34. Image data of the grain to be obtained.
  • the upper illumination mechanism 30 is disposed obliquely above the transparent carton 4, and irradiates the grain placed on the transparent carton 4 from obliquely above.
  • FIG. 2 is an explanatory view of the lower illumination mechanism and shows a light source block.
  • FIG. 3 is a sectional view taken along line AA of FIG.
  • the lower illumination mechanism 20 has a lower light source 21 and an elongated light source block 22.
  • the light source block 22 includes a fixing portion 221 to which the lower light source 21 is fixed, and is located at an upper end of the fixing portion 221 and extends to the center side of the transparent carton 4 so that a bottom portion of the transparent carton 4 from the lower light source 21.
  • a light guide portion 222 that blocks direct light (direct light) directed toward and reflects the light downward.
  • the light source block 22 is located below the fixing portion 221, and the upper surface is inclined downward toward the center of the transparent carton 4, so that the direct light from the lower light source 21 or the light from the light guide portion 222 is It has a reflector 223 that reflects the reflected light.
  • the lower illumination mechanism 20 reflects light from the lower light source 21 at each of the portions of the light source block 22, and the grain placed on the transparent carton 4 from the reflecting portion 223 or via the black reflector 23.
  • the particles are irradiated from below as oblique light as indirect light.
  • the lower illumination mechanism 20 contributes to miniaturization of the device because the lower light source 21 can be narrowed in a range where the lower light source 21 is reflected on the bottom of the transparent carton 4 by the light guide 222. Further, since the lower illumination mechanism 20 can guide most of the light from the lower light source 21 to the reflecting portion 223 of the light source block 22, the light can be effectively used.
  • the inner surfaces of the fixed part 221, the light guide part 222, and the reflective part 223 are white.
  • the lower illumination mechanism 20 is disposed adjacent to the bottom of the lower illumination storage unit 2 and outside the black reflector 23.
  • the lower illumination mechanism 20 can effectively reflect and effectively utilize the light of the lower light source 21 by the white inner surfaces of the respective portions of the light source block 22. Since most of the light incident on the black reflector 23 from the lower illumination mechanism 20 is indirect light, the reflection of the lower light source 21 on the bottom of the transparent carton 4 due to reflection from the black reflector 23 is reflected. Can be prevented.
  • the lower illumination mechanism 20 only needs to have one or more lower light sources 21. If it has a plurality of lower light sources 21, it may be fixed linearly in the longitudinal direction of the light source block 22. Further, although an LED (light emitting diode) light source is used for the lower light source 21, a light source other than the LED light source can be used. Since the lower illumination mechanism 20 irradiates the light from the lower light source 21 to the grains placed on the transparent carton 4 from obliquely below, the lower illumination mechanism 20 is suitable for detecting cracks in the body.
  • LED light emitting diode
  • FIG. 4 is an explanatory view of the upper illumination mechanism.
  • FIG. 5 is a sectional view taken along line BB of FIG.
  • the upper illumination mechanism 30 includes an upper light source 31, a lower light-blocking block 32 fixed to an inner surface of the upper illumination tube 3, and an upper light-blocking block 33.
  • the lower light-blocking block 32 is provided with a fixing portion 321 to which the upper light source 31 is fixed, and is provided in an L-shape below the fixing portion 321 to block direct light from the upper light source 31 toward the transparent carton 4 and upward. It has a lower light-shielding portion 322 that reflects light.
  • the lower light-blocking block 32 is fixed to the inner surface of the upper illumination tube 3 at the fixing portion 321.
  • the upper light-blocking block 33 is mounted or fixed on the fixing portion 321 of the lower light-blocking block 32 above the upper light source 31, and is provided with direct light (direct light) directed upward from the upper light source 31. (Light) and the light reflected by the lower light-shielding portion 322.
  • the upper light-blocking block 33 is a single ring-shaped member having a circular opening at the center, and a common one is used for the four upper lighting mechanisms 30. Can also be used.
  • the upper illumination mechanism 30 reflects the light from the upper light source 31 on the lower light-shielding block 32 and the light-shielding portions 322 and 331 of the upper light-shielding block 33, and applies the light to the kernel placed on the transparent carton 4.
  • the indirect light is emitted from obliquely above, reflection of the upper light source 31 on the bottom of the transparent carton 4 can be prevented.
  • the lower light shielding block 32 and the upper light shielding block 33 are black.
  • the inner surface of the upper illumination tube 3 is white below the lower surface of the upper light-blocking block 33 (upper light-shielding portion 331), and black above the lower surface of the upper light-shielding block 33 (upper light-shielding portion 331). It is said.
  • the upper illumination mechanism 30 can effectively utilize the light of each of the upper light sources 31 by the white inner surface below the lower surface of the upper light-blocking block 33 of the upper illumination tube 3. Also, from above the upper illumination tube 3, image data of grains placed on the transparent carton 4 by an image acquisition means 5 such as a camera through an opening 35 provided at the center of the lid 34. However, since the black inner surface above the lower surface of the upper light-blocking block 33 can prevent the light of each of the upper light sources 31 from flowing above the upper illumination tube 3, Clear image data of the grain can be obtained.
  • the cylindrical thing was used for the said cylindrical body 3 for upper illuminations, the thing of a square tube shape, such as a square tube shape, can also be used, for example.
  • an LED (light emitting diode) light source is used as the upper light source 31, a light source other than the LED light source can be used.
  • the transparent carton 4 on which grains are placed is set so as to be positioned on the opening 24 provided at the upper center of the lower lighting storage unit 2.
  • the LEDs of the lower light source 21 and / or the upper light source 31 are turned on, respectively, and light is applied to the grains placed on the transparent carton 4. Transmitting and / or reflecting light to the grain;
  • a transmission image and / or a reflection image of the kernel placed on the transparent carton 4 is acquired by the image acquisition unit 5.
  • the grain quality discriminating apparatus 1 uses a microcomputer (not shown) based on the acquired transmission image to obtain shape information such as external shape, area, length, width, and the like (color information (R, G, B), milky white). Etc.), extracting optical information such as body splitting, and extracting shape information such as external shape, area, length, width, etc. based on the acquired reflection image, and extracting the extracted shape information and optical information.
  • shape information such as external shape, area, length, width, and the like (color information (R, G, B), milky white).
  • Etc. extracting optical information such as body splitting
  • shape information such as external shape, area, length, width, etc.
  • the appearance quality of the grain is determined based on
  • the lower illumination mechanism 20 irradiates the light from the lower light source 21 to the grains placed on the transparent carton 4 as indirect light from obliquely below, the lower light source 21 on the bottom of the transparent carton 4 Can be prevented from being reflected.
  • the upper illumination mechanism 30 irradiates the light from the upper light source 31 to the grains placed on the transparent carton 4 as indirect light from obliquely above, the upper part of the transparent carton 4 The reflection of the light source 31 can be prevented. Therefore, according to the grain quality determination device 1, the appearance quality of the grain placed on the transparent carton 4 can be accurately determined based on the transmitted light and / or the reflected light from the grain.
  • the grain quality determination device 1 Since the lower lighting mechanism 20 irradiates the light from the lower light source 21 to the kernels placed on the transparent carton 4 as indirect light from obliquely below, the grain quality determination device 1 It is not necessary to dispose the lower illumination mechanism 20 away from the center of the transparent carton 4 to the side in order to prevent the lower light source 21 from being reflected on the bottom of the transparent light. Further, in the grain quality determination device 1, the upper illumination mechanism 30 irradiates the light from the upper light source 31 to the grains placed on the transparent carton 4 as indirect light from obliquely above, so that the transparent It is not necessary to dispose the upper illumination mechanism 30 away from the center of the transparent carton 4 to the side in order to prevent the upper light source 31 from being reflected on the bottom of the carton 4. Therefore, according to the grain quality determination device 1, it is possible to prevent the size of the device from increasing in size in order to prevent the lower light source 21 and the upper light source 31 from being reflected on the bottom of the transparent carton 4.
  • the grain quality determination device 1 has a circular opening above the upper light-blocking block 33 and inside the upper illumination cylinder 3 and has a circular opening and transmits and / or reflects light from the grain.
  • a black light shielding plate having an aperture function (not shown) for adjusting the amount of light can be provided.
  • the black light shielding plate having a diaphragm function is provided inside the upper illumination tube 3
  • the black light shielding plate is provided on the lid 34 of the upper illumination tube 3.
  • the range in which an image of the kernel placed on the transparent carton 4 can be obtained can be adjusted. Alternatively, this is effective in preventing the reflection of the upper light source 31 on the bottom of the transparent carton 4.
  • the grain quality discriminating apparatus 1 has been described as an example in which the two lower illumination mechanisms 20 are accommodated in the lower illumination storage unit 2. What is necessary is just to accommodate the mechanism 20.
  • the light sources of the four lower illumination mechanisms 20 are sequentially turned on to acquire each transmission image.
  • the four light sources of the lower illumination mechanism 20 are simultaneously turned on to acquire a transmission image, it is possible to accurately detect cracked grains and the like regardless of the orientation of grains.
  • FIG. 6 is an explanatory view of another example of the lower illumination mechanism, and shows a cross-sectional view of a light source block.
  • the lower illumination mechanism 20 shown in FIG. 6 differs from the lower illumination mechanism 20 shown in FIGS. 2 and 3 in that the upper surface of the reflector 223 of the light source block 22 is substantially parallel to the bottom of the lower illumination storage unit 2. I do.
  • the lower illumination mechanism 20 shown in FIG. 6 also reflects light from the lower light source 21 inside the light source block 22 and emits light from the reflection portion 223 or black reflection similarly to the lower illumination mechanism 20 shown in FIGS. Grains placed on the transparent carton 4 are radiated from below obliquely through the plate 23 as indirect light.
  • FIG. 7 is a schematic explanatory diagram of a grain quality determination device according to another embodiment of the present invention.
  • the grain quality discriminating apparatus 101 shown in FIG. 7 includes the lower lighting storage unit 2 and only the lower lighting mechanism 20, and does not include the upper lighting cylinder. This is different from the determination device 1.
  • the grain quality discriminating apparatus 101 shown in FIG. 7 is suitable for use in visually inspecting cracked rice and the like, similarly to the apparatus described in JP-A-2014-173884.
  • the grain quality determination device 101 shown in FIG. 7 also irradiates the light from the lower light source 21 to the kernels placed on the transparent carton 4 as indirect light from obliquely below, so that the grain to the bottom of the transparent carton 4
  • the reflection of the lower light source 21 can be prevented, and the appearance quality of the kernel can be accurately determined based on the transmitted light from the kernel.
  • FIG. 8 is a schematic explanatory diagram of a modified example of the grain quality determination device shown in FIG.
  • the grain quality discriminating apparatus 1 shown in FIG. 8 differs from the grain quality discriminating apparatus shown in FIG. 1 in that the lower illumination mechanism 20 is disposed directly below the transparent carton 4.
  • the lower illumination mechanism 20 stores, for example, a circular cup-shaped light source block 22 to which the lower light source 21 is fixed inside in the lower illumination storage unit 2 upside down. Is black and can function as a background.
  • the storage section 2 for lower illumination may have a circular space in plan view.
  • the lower illumination mechanism 20 reflects light from the lower light source 21 on the light source block 22 and the inner side surface of the lower illumination storage unit 2,
  • the mounted grains are irradiated from below as indirect light.
  • the grain quality determination device 1 shown in FIG. 8 can also prevent the lower light source 21 from reflecting on the bottom of the transparent carton 4, so that the appearance quality of the grain can be reduced based on the transmitted light from the grain. It is possible to determine with high accuracy.
  • the upper illumination mechanism 30 may be provided on the inner surface of the upper illumination cylinder 3, similarly to the grain quality determination device illustrated in FIG. 1. it can. Further, the grain quality determination device 1 shown in FIG. 8 may be configured not to include the upper illumination tubular body 3, similarly to the grain quality determination device 101 shown in FIG.
  • the grain quality discriminating apparatus is not limited to discriminating the appearance quality of rice grains, but can be used for discriminating the appearance quality of all grains.
  • the grain quality determination device of the present invention can accurately determine the appearance quality of the grains placed on the sample dish by preventing the reflection of the light source on the bottom of the transparent sample dish. Yes, excellent in practicality.

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Threshing Machine Elements (AREA)
  • Sowing (AREA)

Abstract

La présente invention vise à fournir un dispositif de détermination de la qualité de grain capable de déterminer avec précision la qualité d'aspect de grain placé sur une plaque d'échantillon en empêchant une source de lumière de réfléchir sur le fond transparent de la plaque d'échantillon. La présente invention concerne par conséquent un dispositif de détermination de la qualité de grain qui expose à une lumière un grain placé sur une plaque d'échantillon ayant une surface inférieure transparente de façon à provoquer la transmission de la lumière à travers le grain, et détermine la qualité d'aspect du grain sur la base de la lumière transmise du grain. Le dispositif de détermination de la qualité de grain est caractérisé en ce qu'un mécanisme d'éclairage ayant une source de lumière est disposé au-dessous de la plaque d'échantillon, et le mécanisme d'éclairage expose, à une lumière indirecte, le grain placé sur la plaque d'échantillon. Dans la présente invention, il est préférable que le mécanisme d'éclairage comprenne un bloc de source de lumière qui est disposé obliquement en dessous de la plaque d'échantillon, que la source de lumière soit disposée à l'intérieur du bloc de source de lumière, et que le mécanisme d'éclairage amène la lumière provenant de la source de lumière à réfléchir à l'intérieur du bloc de source de lumière de façon à, à l'aide de la lumière réfléchie en tant que lumière indirecte, exposer le grain placé sur la plaque d'échantillon depuis le dessous, de façon oblique.
PCT/JP2019/030239 2018-08-09 2019-08-01 Dispositif de détermination de la qualité de grain WO2020031847A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
BR112021002386-0A BR112021002386A2 (pt) 2018-08-09 2019-08-01 dispositivo de determinação de qualidade de grãos
CN201980052351.8A CN112534244B (zh) 2018-08-09 2019-08-01 谷粒品级判别装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018-150179 2018-08-09
JP2018150179A JP6981381B2 (ja) 2018-08-09 2018-08-09 穀粒品位判別装置

Publications (1)

Publication Number Publication Date
WO2020031847A1 true WO2020031847A1 (fr) 2020-02-13

Family

ID=69415352

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2019/030239 WO2020031847A1 (fr) 2018-08-09 2019-08-01 Dispositif de détermination de la qualité de grain

Country Status (5)

Country Link
JP (1) JP6981381B2 (fr)
CN (1) CN112534244B (fr)
BR (1) BR112021002386A2 (fr)
TW (1) TWI802732B (fr)
WO (1) WO2020031847A1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3818351A4 (fr) 2018-07-03 2022-03-23 Inficon, Inc. Procédé d'affichage de données de concentration d'une substance et appareil associé
JP7404895B2 (ja) * 2020-01-29 2023-12-26 株式会社サタケ 穀粒判別器
JP7512733B2 (ja) 2020-07-21 2024-07-09 株式会社サタケ 穀粒検査器
JP7044150B1 (ja) * 2020-12-18 2022-03-30 株式会社サタケ 基準部材、および穀粒判別器
CN116670498A (zh) * 2020-12-23 2023-08-29 株式会社佐竹 谷粒判别装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003057611A (ja) * 2001-08-13 2003-02-26 San Contact Lens:Kk コンタクトレンズ検査装置
JP2007078581A (ja) * 2005-09-15 2007-03-29 Shinko Seiki Co Ltd 外観検査用照明装置
JP2018084496A (ja) * 2016-11-24 2018-05-31 第一実業ビスウィル株式会社 外観検査装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10300679A (ja) * 1997-04-22 1998-11-13 Satake Eng Co Ltd 粒状物色彩選別機における光学検出装置
TW539853B (en) * 2001-09-10 2003-07-01 Yamagataken Grain quality judging sample container, grain quality judger, grain quality judging system, grain image reading device, sample arraying jig for the grain image reading device, sample arraying method, and sample arrayer for the grain image reading device
JP2008203093A (ja) * 2007-02-20 2008-09-04 Mitsutoyo Corp 照明装置、画像測定装置
JP2009217222A (ja) * 2008-03-06 2009-09-24 Takashi Goto 反射型透過照明補助装置付観察台
WO2012095905A1 (fr) * 2011-01-14 2012-07-19 パナソニック株式会社 Source lumineuse d'éclairage
JP6094186B2 (ja) * 2012-12-04 2017-03-15 株式会社サタケ 穀物外観検査キット及び穀物外観検査方法
JP6229278B2 (ja) * 2013-03-06 2017-11-15 株式会社サタケ 穀粒透視器
JP6203611B2 (ja) * 2013-05-27 2017-09-27 株式会社ケット科学研究所 操作パネル式情報端末を穀粒外観検査用手段として機能させるアプリケーションプログラム、及び撮像手段と操作パネル式情報端末とを組み合わせた穀粒判別システム
JP2015094644A (ja) * 2013-11-12 2015-05-18 株式会社クボタ 卵の外観検査装置および方法
KR101474191B1 (ko) * 2014-02-03 2014-12-18 삼성전기주식회사 조명 모듈 및 이를 이용하는 외관 검사 시스템
JP6036778B2 (ja) * 2014-09-26 2016-11-30 ウシオ電機株式会社 光照射装置および光硬化材料処理装置
JP5973521B2 (ja) * 2014-10-15 2016-08-23 株式会社クボタ 光学式穀粒評価装置
CN107250774B (zh) * 2014-12-19 2020-07-31 株式会社佐竹 谷粒品级判别装置
WO2016158780A1 (fr) * 2015-03-31 2016-10-06 オリンパス株式会社 Dispositif d'observation et procédé d'observation
JP6687826B2 (ja) * 2015-04-06 2020-04-28 株式会社サタケ 穀粒品位判別装置及び該装置における穀粒からの光の受光方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003057611A (ja) * 2001-08-13 2003-02-26 San Contact Lens:Kk コンタクトレンズ検査装置
JP2007078581A (ja) * 2005-09-15 2007-03-29 Shinko Seiki Co Ltd 外観検査用照明装置
JP2018084496A (ja) * 2016-11-24 2018-05-31 第一実業ビスウィル株式会社 外観検査装置

Also Published As

Publication number Publication date
CN112534244B (zh) 2024-10-25
TWI802732B (zh) 2023-05-21
CN112534244A (zh) 2021-03-19
TW202012915A (zh) 2020-04-01
JP2020026963A (ja) 2020-02-20
JP6981381B2 (ja) 2021-12-15
BR112021002386A2 (pt) 2021-05-04

Similar Documents

Publication Publication Date Title
WO2020031847A1 (fr) Dispositif de détermination de la qualité de grain
TWI525316B (zh) 晶片型led檢測設備
US9385150B2 (en) Image sensor device
CN110691966B (zh) 检查系统以及检查方式
JP3895772B2 (ja) 紙幣または有価証券などのシート材を検査する装置および方法
KR101857539B1 (ko) 검사용 조명 장치 및 검사 시스템
KR101756614B1 (ko) 검사용 조명장치 및 검사 시스템
JP2010540954A5 (fr)
EP3514524B1 (fr) Dispositif d'inspection d'image et dispositif d'éclairage
CN111272656B (zh) 用于识别转动位置的设备和方法
JP7128116B2 (ja) バルク材料を検査するための装置およびその方法
KR20110084093A (ko) 나사산의 검사 장치
JP2016197065A (ja) 穀粒品位判別装置及び該装置における穀粒からの光の受光方法
KR101717730B1 (ko) 비전 검사 장치
JP2017058367A5 (fr)
JP6766825B2 (ja) 測色装置
KR101746416B1 (ko) Led칩 검사 장치
JP7404895B2 (ja) 穀粒判別器
JP2016085221A (ja) 容器検査方法及び装置
JP4508838B2 (ja) 容器の口部の検査装置
JP7355258B2 (ja) 穀粒判別装置
JP2024158828A (ja) 透明物品の撮像装置及び透明物品の検査装置
WO2017037948A1 (fr) Système de mesure de caractéristique de réflexion
KR20220055267A (ko) 필터 검사 장치
JPH0783618A (ja) 原稿サイズ検知センサ

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 19846487

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

REG Reference to national code

Ref country code: BR

Ref legal event code: B01A

Ref document number: 112021002386

Country of ref document: BR

ENP Entry into the national phase

Ref document number: 112021002386

Country of ref document: BR

Kind code of ref document: A2

Effective date: 20210208

122 Ep: pct application non-entry in european phase

Ref document number: 19846487

Country of ref document: EP

Kind code of ref document: A1