WO2020031847A1 - Grain quality determination device - Google Patents

Grain quality determination device Download PDF

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Publication number
WO2020031847A1
WO2020031847A1 PCT/JP2019/030239 JP2019030239W WO2020031847A1 WO 2020031847 A1 WO2020031847 A1 WO 2020031847A1 JP 2019030239 W JP2019030239 W JP 2019030239W WO 2020031847 A1 WO2020031847 A1 WO 2020031847A1
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WO
WIPO (PCT)
Prior art keywords
light
light source
grain
sample dish
determination device
Prior art date
Application number
PCT/JP2019/030239
Other languages
French (fr)
Japanese (ja)
Inventor
秀昭 松島
池田　学
Original Assignee
株式会社サタケ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 株式会社サタケ filed Critical 株式会社サタケ
Priority to CN201980052351.8A priority Critical patent/CN112534244A/en
Priority to BR112021002386-0A priority patent/BR112021002386A2/en
Publication of WO2020031847A1 publication Critical patent/WO2020031847A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids

Definitions

  • the present invention relates to a grain quality discriminating apparatus for discriminating the appearance quality of grains such as rice, wheat, beans, and corn.
  • the present invention includes an illumination mechanism that can prevent reflection of a light source on the bottom of a sample dish, and can accurately determine the appearance quality of grains placed on the sample dish.
  • an illumination mechanism that can prevent reflection of a light source on the bottom of a sample dish, and can accurately determine the appearance quality of grains placed on the sample dish.
  • Patent Literature 1 includes an upper imaging / illumination unit, a lower illumination unit, and a tray disposed between the upper imaging / illumination unit and an arbitrary number of grains to be discriminated, and a grain placed on the tray.
  • Light is emitted from the upper light emitting unit of the upper imaging / illumination unit to the grain, and the reflected light is imaged by the upper imaging / illumination unit, or light is emitted from the lower light emitting unit of the lower illumination unit to the grain.
  • an apparatus that includes an imaging unit that irradiates the light, images the transmitted light with an upper imaging / illumination unit, and acquires image data based on reflected light or transmitted light from the grain.
  • a base member a rotating member rotatably disposed in the base member and having a light source on one side, and an outer frame mounted on the base member together with the base member.
  • a cover member having an opening for receiving a sample dish on which a grain is placed, which is located above the rotating member, wherein a sample dish on which a plurality of grains are placed is placed in the opening of the cover member.
  • An apparatus is described in which the light source is set to irradiate the transparent bottom surface of the sample dish with light by the light source from obliquely below, and light is transmitted obliquely from below to a plurality of grains placed on the sample dish. .
  • the kernel is used.
  • the appearance quality of the grains can be determined.
  • an operator can detect cracked rice or the like by observing the presence or absence of a dark shadow in the grain visually or the like from above the sample dish.
  • Patent Literature 1 places a tray on a lower light-emitting unit, and the lower light-emitting unit is reflected on the bottom of the tray, and an image of a grain obtained by the imaging unit is obtained. There is a problem that the appearance quality of the grain cannot be determined with high accuracy because it affects the data.
  • the device described in Patent Document 2 arranges a light source on a lower side of a sample dish and irradiates light to a bottom surface of the sample dish from obliquely below. Otherwise, the light source is reflected on the bottom of the sample dish and affects the observation of the grain by a worker from above the sample dish. Etc. cannot be accurately detected.
  • the present invention provides a grain quality discriminating apparatus that can accurately determine the appearance quality of grains placed on the sample dish by preventing reflection of a light source on the bottom of a transparent sample dish.
  • the purpose is to provide.
  • one embodiment of the present invention provides: A grain that irradiates light to a grain placed on a sample dish having a transparent bottom surface, transmits light to the grain, and determines the appearance quality of the grain based on transmitted light from the grain.
  • a grain quality determination device An illumination mechanism having a light source is arranged below the sample dish, The illumination mechanism irradiates the kernel placed on the sample dish with indirect light.
  • the illumination mechanism has a light source block disposed diagonally below the sample dish, and the light source is disposed inside the light source block, It is preferable that the illumination mechanism reflects the light from the light source inside the light source block and irradiates the kernel placed on the sample dish as indirect light from obliquely below.
  • the light source block is a fixed portion to which the light source is fixed, and is located above the fixed portion and extends toward the center of the sample dish to block direct light (direct light) from the light source toward the bottom of the sample dish.
  • a black reflector serving as a background is provided below the sample dish, while the illumination mechanism is provided adjacent to the outside of the black reflector, and the light source block includes a light source and a light source.
  • the sides are white.
  • One embodiment of the present invention is: It is preferable that a plurality of the illumination mechanisms are disposed diagonally below the sample dish, and that the light from the light source is radiated from a plurality of directions as indirect light to the grains placed on the sample dish.
  • the grain quality discriminating apparatus irradiates light to a grain placed on a sample dish having a transparent bottom surface, and transmits and / or reflects light to the grain, and transmits light from the grain and / Or a grain quality determination device that determines the appearance quality of the grain based on reflected light, Disposing an upper illumination mechanism having an upper light source diagonally above the sample dish, The upper illumination mechanism, a fixed portion to which the upper light source is fixed, a lower light-shielding portion that is located below the upper light source and blocks direct light from the upper light source toward the sample dish and reflects upward, An upper light-shielding portion that is located above and has an upper light-shielding portion that intercepts the direct light heading upward from the upper light source and the reflected light reflected by the lower light-shielding portion and reflects the light downward, It is preferable that the upper illumination mechanism reflects light from the upper light source at each of the light-shielding portions, and irradiates the kernel
  • One embodiment of the present invention is: It is preferable that a plurality of the upper illuminating mechanisms are provided on the inner surface of the cylindrical body, and the light from the upper light source irradiates the kernel placed on the sample dish as indirect light from a plurality of directions.
  • One embodiment of the present invention is: Preferably, while each of the light-shielding portions is black, the inner surface of the cylindrical body is white below the upper light-shielding portion and black above the upper light-shielding portion.
  • a black light-shielding plate having a circular opening and having a diaphragm function for adjusting the amount of transmitted light and / or reflected light from the grain is disposed above the upper light-shielding portion and inside the cylindrical body. Is preferred.
  • the illumination mechanism irradiates the light from the light source from below onto the grains placed on the sample dish as indirect light, so that the light is applied to the bottom of the sample dish.
  • the reflection of the light source can be prevented. Therefore, according to the grain quality determination device of one embodiment of the present invention, it is possible to accurately determine the appearance quality of the grains placed on the sample dish based on the transmitted light from the grains.
  • the illumination mechanism irradiates the light from the light source to the grains placed on the sample dish as indirect light from below, the illumination mechanism emits light to the bottom of the sample dish.
  • the illumination mechanism In order to prevent the reflection of the light source, it is not necessary to dispose the illumination mechanism away from the center of the sample dish to the side. Therefore, according to the grain quality discriminating apparatus of one embodiment of the present invention, it is possible to prevent the apparatus from increasing in size in order to prevent the light source from being reflected on the bottom of the sample dish.
  • the illumination mechanism has a light source block disposed obliquely below the sample dish, and the light source is disposed inside the light source block, If the illumination mechanism reflects the light from the light source inside the light source block and irradiates the grains placed on the sample dish as indirect light from obliquely below, the illumination mechanism includes: The light from the light source can be turned into indirect light with a simple configuration.
  • the grain quality determination device of one embodiment of the present invention is suitable for detecting cracks in the body if the light from the light source is radiated diagonally from below on the grains placed on the sample dish. It is.
  • the grain quality determination device is configured such that the light source block is a fixed portion to which the light source is fixed, is located above the fixed portion, extends toward the center of the sample dish, and extends from the light source.
  • the apparatus can be downsized. Further, in the grain quality determination device according to the embodiment of the present invention, the illumination mechanism can guide most of the light from the light source to the reflection portion of the light source block, so that the light can be effectively used. .
  • the grain quality determination device is arranged such that a black reflector serving as a background is disposed below the sample dish, while the illumination mechanism is adjacent to the outside of the black reflector. If the inner surfaces of the respective parts of the light source block are made white, the light of the light source is effectively reflected by the white inner surfaces of the respective parts of the light source block to be effectively utilized. can do. Further, since most of the light incident on the black reflector serving as the background from the illumination mechanism is indirect light, it is possible to prevent the reflection of the light source on the bottom of the sample dish due to reflection from the black reflector. Can be.
  • the grain quality determination device is configured such that a plurality of the illumination mechanisms are disposed diagonally below the sample dish, and light from the light source is placed on the sample dish. In contrast, by irradiating the indirect light from a plurality of directions, it is possible to accurately detect body cracks and the like regardless of the direction of the grains.
  • the upper illumination mechanism reflects light from the upper light source at the lower light-shielding portion and the upper light-shielding portion, and indirect light is applied to the kernel placed on the sample dish. If the irradiation is performed diagonally from above, the reflection of the upper light source on the sample dish can be prevented. Therefore, according to the grain quality determination device of one embodiment of the present invention, it is possible to accurately determine the appearance quality of a grain placed on a sample dish based on transmitted light and / or reflected light from the grain. Can be.
  • the upper illumination mechanism reflects the light from the upper light source at each light shielding unit, and indirectly lights the grain placed on the sample dish from obliquely above. If irradiation is performed, it is not necessary to dispose the upper illumination mechanism away from the center of the sample dish to the side in order to prevent reflection of the upper light source on the bottom of the sample dish. Therefore, according to the grain quality discriminating apparatus of one embodiment of the present invention, it is possible to prevent the apparatus from increasing in size in order to prevent the light source from being reflected on the bottom of the sample dish.
  • the upper illumination mechanism is provided in plural on an inner surface of a cylindrical body, and indirect light is applied to the kernel placed on the sample dish by light from the upper light source. If the irradiation is performed from a plurality of directions, the appearance quality can be accurately determined regardless of the direction of the grain.
  • the inner surface of the cylindrical body is white below the upper light-shielding portion and black above the upper light-shielding portion. If so, the light from each of the upper light sources can be effectively utilized by the white inner surface below the upper light-shielding portion of the cylindrical body.
  • an image of the grain placed on the sample dish is to be acquired, etc., but each of the above-mentioned cylinders above the cylinder by the black inner surface above the upper light-shielding portion. Since the wraparound of the light from the upper light source can be prevented, a clear image of the grain can be obtained.
  • the grain quality determination device has a circular opening above the upper light-shielding portion and inside the cylindrical body, and has transmitted light and / or reflected light from the grain. If a black light-shielding plate having a diaphragm function for adjusting the amount of light is provided, when acquiring an image of a grain placed on the sample dish from above the cylindrical body, etc., the grain is sharp. Images can be acquired. Further, by changing the size of the opening of the black light-shielding plate, it is possible to adjust a range in which an image of a grain placed on the sample dish can be obtained, and thus the sample of the light source or the upper light source can be adjusted. This is effective in preventing reflection on the bottom of the dish.
  • a grain quality determination device capable of accurately determining the appearance quality of grains placed on the sample dish by preventing reflection of a light source on the bottom of a transparent sample dish.
  • FIG. 1 is a schematic explanatory diagram of a grain quality determination device. Explanatory drawing of a lower illumination mechanism. AA sectional drawing of FIG. Explanatory drawing of an upper illumination mechanism. FIG. 5 is a sectional view taken along line BB of FIG. 4. Explanatory drawing of another example of a lower illumination mechanism. The schematic explanatory drawing of another grain quality discriminating apparatus. The schematic explanatory drawing of the modification of the grain quality determination apparatus of FIG.
  • FIG. 1 is a schematic explanatory diagram of a grain quality determination device according to an embodiment of the present invention.
  • the grain quality determination device 1 shown in FIG. 1 includes a lower illumination storage unit 2 and an upper illumination cylinder 3.
  • the storage unit 2 for lower illumination has a rectangular space in plan view, and the lower illumination mechanism 20 is stored along the side surface.
  • a circular opening 24 is provided at the upper center of the lower illumination storage unit 2, and a circular transparent carton 4 made of a transparent material is placed on the opening 24.
  • a black reflector 23 serving as a background is disposed below the transparent carton 4 at the bottom of the lower illumination storage unit 2.
  • the lower illumination mechanism 20 is disposed obliquely below the transparent carton (a sample dish having a transparent bottom surface) 4 and irradiates the grain placed on the transparent carton 4 from obliquely below.
  • the lower illumination mechanism 20 may be disposed directly below the transparent carton 4, as shown in FIG.
  • the lower illumination mechanism 20 is configured by a member having the same color as that of the black reflection plate 23, and configured to function as a background.
  • the upper illumination tube 3 has a cylindrical shape and is disposed concentrically with the opening 24 above the lower illumination storage unit 2.
  • An upper illumination mechanism 30 is provided on the inner surface of the upper illumination tube 3.
  • the upper illumination tube 3 is closed at its upper part by a lid 34 and is placed on the transparent carton 4 by an image acquisition means (sensor) 5 such as a camera through an opening 35 provided at the center of the lid 34. Image data of the grain to be obtained.
  • the upper illumination mechanism 30 is disposed obliquely above the transparent carton 4, and irradiates the grain placed on the transparent carton 4 from obliquely above.
  • FIG. 2 is an explanatory view of the lower illumination mechanism and shows a light source block.
  • FIG. 3 is a sectional view taken along line AA of FIG.
  • the lower illumination mechanism 20 has a lower light source 21 and an elongated light source block 22.
  • the light source block 22 includes a fixing portion 221 to which the lower light source 21 is fixed, and is located at an upper end of the fixing portion 221 and extends to the center side of the transparent carton 4 so that a bottom portion of the transparent carton 4 from the lower light source 21.
  • a light guide portion 222 that blocks direct light (direct light) directed toward and reflects the light downward.
  • the light source block 22 is located below the fixing portion 221, and the upper surface is inclined downward toward the center of the transparent carton 4, so that the direct light from the lower light source 21 or the light from the light guide portion 222 is It has a reflector 223 that reflects the reflected light.
  • the lower illumination mechanism 20 reflects light from the lower light source 21 at each of the portions of the light source block 22, and the grain placed on the transparent carton 4 from the reflecting portion 223 or via the black reflector 23.
  • the particles are irradiated from below as oblique light as indirect light.
  • the lower illumination mechanism 20 contributes to miniaturization of the device because the lower light source 21 can be narrowed in a range where the lower light source 21 is reflected on the bottom of the transparent carton 4 by the light guide 222. Further, since the lower illumination mechanism 20 can guide most of the light from the lower light source 21 to the reflecting portion 223 of the light source block 22, the light can be effectively used.
  • the inner surfaces of the fixed part 221, the light guide part 222, and the reflective part 223 are white.
  • the lower illumination mechanism 20 is disposed adjacent to the bottom of the lower illumination storage unit 2 and outside the black reflector 23.
  • the lower illumination mechanism 20 can effectively reflect and effectively utilize the light of the lower light source 21 by the white inner surfaces of the respective portions of the light source block 22. Since most of the light incident on the black reflector 23 from the lower illumination mechanism 20 is indirect light, the reflection of the lower light source 21 on the bottom of the transparent carton 4 due to reflection from the black reflector 23 is reflected. Can be prevented.
  • the lower illumination mechanism 20 only needs to have one or more lower light sources 21. If it has a plurality of lower light sources 21, it may be fixed linearly in the longitudinal direction of the light source block 22. Further, although an LED (light emitting diode) light source is used for the lower light source 21, a light source other than the LED light source can be used. Since the lower illumination mechanism 20 irradiates the light from the lower light source 21 to the grains placed on the transparent carton 4 from obliquely below, the lower illumination mechanism 20 is suitable for detecting cracks in the body.
  • LED light emitting diode
  • FIG. 4 is an explanatory view of the upper illumination mechanism.
  • FIG. 5 is a sectional view taken along line BB of FIG.
  • the upper illumination mechanism 30 includes an upper light source 31, a lower light-blocking block 32 fixed to an inner surface of the upper illumination tube 3, and an upper light-blocking block 33.
  • the lower light-blocking block 32 is provided with a fixing portion 321 to which the upper light source 31 is fixed, and is provided in an L-shape below the fixing portion 321 to block direct light from the upper light source 31 toward the transparent carton 4 and upward. It has a lower light-shielding portion 322 that reflects light.
  • the lower light-blocking block 32 is fixed to the inner surface of the upper illumination tube 3 at the fixing portion 321.
  • the upper light-blocking block 33 is mounted or fixed on the fixing portion 321 of the lower light-blocking block 32 above the upper light source 31, and is provided with direct light (direct light) directed upward from the upper light source 31. (Light) and the light reflected by the lower light-shielding portion 322.
  • the upper light-blocking block 33 is a single ring-shaped member having a circular opening at the center, and a common one is used for the four upper lighting mechanisms 30. Can also be used.
  • the upper illumination mechanism 30 reflects the light from the upper light source 31 on the lower light-shielding block 32 and the light-shielding portions 322 and 331 of the upper light-shielding block 33, and applies the light to the kernel placed on the transparent carton 4.
  • the indirect light is emitted from obliquely above, reflection of the upper light source 31 on the bottom of the transparent carton 4 can be prevented.
  • the lower light shielding block 32 and the upper light shielding block 33 are black.
  • the inner surface of the upper illumination tube 3 is white below the lower surface of the upper light-blocking block 33 (upper light-shielding portion 331), and black above the lower surface of the upper light-shielding block 33 (upper light-shielding portion 331). It is said.
  • the upper illumination mechanism 30 can effectively utilize the light of each of the upper light sources 31 by the white inner surface below the lower surface of the upper light-blocking block 33 of the upper illumination tube 3. Also, from above the upper illumination tube 3, image data of grains placed on the transparent carton 4 by an image acquisition means 5 such as a camera through an opening 35 provided at the center of the lid 34. However, since the black inner surface above the lower surface of the upper light-blocking block 33 can prevent the light of each of the upper light sources 31 from flowing above the upper illumination tube 3, Clear image data of the grain can be obtained.
  • the cylindrical thing was used for the said cylindrical body 3 for upper illuminations, the thing of a square tube shape, such as a square tube shape, can also be used, for example.
  • an LED (light emitting diode) light source is used as the upper light source 31, a light source other than the LED light source can be used.
  • the transparent carton 4 on which grains are placed is set so as to be positioned on the opening 24 provided at the upper center of the lower lighting storage unit 2.
  • the LEDs of the lower light source 21 and / or the upper light source 31 are turned on, respectively, and light is applied to the grains placed on the transparent carton 4. Transmitting and / or reflecting light to the grain;
  • a transmission image and / or a reflection image of the kernel placed on the transparent carton 4 is acquired by the image acquisition unit 5.
  • the grain quality discriminating apparatus 1 uses a microcomputer (not shown) based on the acquired transmission image to obtain shape information such as external shape, area, length, width, and the like (color information (R, G, B), milky white). Etc.), extracting optical information such as body splitting, and extracting shape information such as external shape, area, length, width, etc. based on the acquired reflection image, and extracting the extracted shape information and optical information.
  • shape information such as external shape, area, length, width, and the like (color information (R, G, B), milky white).
  • Etc. extracting optical information such as body splitting
  • shape information such as external shape, area, length, width, etc.
  • the appearance quality of the grain is determined based on
  • the lower illumination mechanism 20 irradiates the light from the lower light source 21 to the grains placed on the transparent carton 4 as indirect light from obliquely below, the lower light source 21 on the bottom of the transparent carton 4 Can be prevented from being reflected.
  • the upper illumination mechanism 30 irradiates the light from the upper light source 31 to the grains placed on the transparent carton 4 as indirect light from obliquely above, the upper part of the transparent carton 4 The reflection of the light source 31 can be prevented. Therefore, according to the grain quality determination device 1, the appearance quality of the grain placed on the transparent carton 4 can be accurately determined based on the transmitted light and / or the reflected light from the grain.
  • the grain quality determination device 1 Since the lower lighting mechanism 20 irradiates the light from the lower light source 21 to the kernels placed on the transparent carton 4 as indirect light from obliquely below, the grain quality determination device 1 It is not necessary to dispose the lower illumination mechanism 20 away from the center of the transparent carton 4 to the side in order to prevent the lower light source 21 from being reflected on the bottom of the transparent light. Further, in the grain quality determination device 1, the upper illumination mechanism 30 irradiates the light from the upper light source 31 to the grains placed on the transparent carton 4 as indirect light from obliquely above, so that the transparent It is not necessary to dispose the upper illumination mechanism 30 away from the center of the transparent carton 4 to the side in order to prevent the upper light source 31 from being reflected on the bottom of the carton 4. Therefore, according to the grain quality determination device 1, it is possible to prevent the size of the device from increasing in size in order to prevent the lower light source 21 and the upper light source 31 from being reflected on the bottom of the transparent carton 4.
  • the grain quality determination device 1 has a circular opening above the upper light-blocking block 33 and inside the upper illumination cylinder 3 and has a circular opening and transmits and / or reflects light from the grain.
  • a black light shielding plate having an aperture function (not shown) for adjusting the amount of light can be provided.
  • the black light shielding plate having a diaphragm function is provided inside the upper illumination tube 3
  • the black light shielding plate is provided on the lid 34 of the upper illumination tube 3.
  • the range in which an image of the kernel placed on the transparent carton 4 can be obtained can be adjusted. Alternatively, this is effective in preventing the reflection of the upper light source 31 on the bottom of the transparent carton 4.
  • the grain quality discriminating apparatus 1 has been described as an example in which the two lower illumination mechanisms 20 are accommodated in the lower illumination storage unit 2. What is necessary is just to accommodate the mechanism 20.
  • the light sources of the four lower illumination mechanisms 20 are sequentially turned on to acquire each transmission image.
  • the four light sources of the lower illumination mechanism 20 are simultaneously turned on to acquire a transmission image, it is possible to accurately detect cracked grains and the like regardless of the orientation of grains.
  • FIG. 6 is an explanatory view of another example of the lower illumination mechanism, and shows a cross-sectional view of a light source block.
  • the lower illumination mechanism 20 shown in FIG. 6 differs from the lower illumination mechanism 20 shown in FIGS. 2 and 3 in that the upper surface of the reflector 223 of the light source block 22 is substantially parallel to the bottom of the lower illumination storage unit 2. I do.
  • the lower illumination mechanism 20 shown in FIG. 6 also reflects light from the lower light source 21 inside the light source block 22 and emits light from the reflection portion 223 or black reflection similarly to the lower illumination mechanism 20 shown in FIGS. Grains placed on the transparent carton 4 are radiated from below obliquely through the plate 23 as indirect light.
  • FIG. 7 is a schematic explanatory diagram of a grain quality determination device according to another embodiment of the present invention.
  • the grain quality discriminating apparatus 101 shown in FIG. 7 includes the lower lighting storage unit 2 and only the lower lighting mechanism 20, and does not include the upper lighting cylinder. This is different from the determination device 1.
  • the grain quality discriminating apparatus 101 shown in FIG. 7 is suitable for use in visually inspecting cracked rice and the like, similarly to the apparatus described in JP-A-2014-173884.
  • the grain quality determination device 101 shown in FIG. 7 also irradiates the light from the lower light source 21 to the kernels placed on the transparent carton 4 as indirect light from obliquely below, so that the grain to the bottom of the transparent carton 4
  • the reflection of the lower light source 21 can be prevented, and the appearance quality of the kernel can be accurately determined based on the transmitted light from the kernel.
  • FIG. 8 is a schematic explanatory diagram of a modified example of the grain quality determination device shown in FIG.
  • the grain quality discriminating apparatus 1 shown in FIG. 8 differs from the grain quality discriminating apparatus shown in FIG. 1 in that the lower illumination mechanism 20 is disposed directly below the transparent carton 4.
  • the lower illumination mechanism 20 stores, for example, a circular cup-shaped light source block 22 to which the lower light source 21 is fixed inside in the lower illumination storage unit 2 upside down. Is black and can function as a background.
  • the storage section 2 for lower illumination may have a circular space in plan view.
  • the lower illumination mechanism 20 reflects light from the lower light source 21 on the light source block 22 and the inner side surface of the lower illumination storage unit 2,
  • the mounted grains are irradiated from below as indirect light.
  • the grain quality determination device 1 shown in FIG. 8 can also prevent the lower light source 21 from reflecting on the bottom of the transparent carton 4, so that the appearance quality of the grain can be reduced based on the transmitted light from the grain. It is possible to determine with high accuracy.
  • the upper illumination mechanism 30 may be provided on the inner surface of the upper illumination cylinder 3, similarly to the grain quality determination device illustrated in FIG. 1. it can. Further, the grain quality determination device 1 shown in FIG. 8 may be configured not to include the upper illumination tubular body 3, similarly to the grain quality determination device 101 shown in FIG.
  • the grain quality discriminating apparatus is not limited to discriminating the appearance quality of rice grains, but can be used for discriminating the appearance quality of all grains.
  • the grain quality determination device of the present invention can accurately determine the appearance quality of the grains placed on the sample dish by preventing the reflection of the light source on the bottom of the transparent sample dish. Yes, excellent in practicality.

Abstract

The purpose of the present invention is to provide a grain quality determination device capable of precisely determining the appearance quality of grain placed on a sample plate by preventing a light source from reflecting on the transparent bottom of the sample plate. The present invention is a grain quality determination device that irradiates, with light, grain placed on a sample plate having a transparent bottom surface so as to cause the light to transmit through the grain, and determines the appearance quality of the grain on the basis of the transmitted light from the grain. The grain quality determination device is characterized in that a lighting mechanism having a light source is disposed below the sample plate, and the lighting mechanism irradiates, with indirect light, the grain placed on the sample plate. In the present invention, it is preferable that the lighting mechanism has a light source block which is disposed obliquely below the sample plate, the light source is disposed inside the light source block, and the lighting mechanism causes light from the light source to reflect inside the light source block so as to, by using the reflected light as indirect light, irradiate the grain placed on the sample plate from obliquely below.

Description

穀粒品位判別装置Grain quality determination device
　本発明は、米、麦、豆、コーン等の穀粒の外観品位を判別する穀粒品位判別装置に関する。特に本発明は、試料皿の底部への光源の映り込みを防ぐことができる照明機構を備え、前記試料皿に載置される穀粒の外観品位を精度良く判別することができる穀粒品位判別装置に関する。 The present invention relates to a grain quality discriminating apparatus for discriminating the appearance quality of grains such as rice, wheat, beans, and corn. In particular, the present invention includes an illumination mechanism that can prevent reflection of a light source on the bottom of a sample dish, and can accurately determine the appearance quality of grains placed on the sample dish. Related to the device.
　従来、穀粒に光を照射し、前記穀粒に前記光を透過及び／又は反射させ、前記穀粒からの透過光及び／又は反射光に基づいて前記穀粒の外観品位を判別する装置が知られている（特許文献１，２参照）。 Conventionally, there is a device that irradiates light to a grain, transmits and / or reflects the light to the grain, and determines the appearance quality of the grain based on transmitted light and / or reflected light from the grain. It is known (see Patent Documents 1 and 2).
　特許文献１には、上部撮像・照明ユニットと、下部照明ユニットと、これらの間に配置した判別対象である任意数の穀粒を載置するトレーとを具備し、前記トレーに載置した穀粒に対して上部撮像・照明ユニットの上部発光部から光を照射し、その反射光を上部撮像・照明ユニットにより撮像し、又は、前記穀粒に対して下部照明ユニットの下部発光部から光を照射し、その透過光を上部撮像・照明ユニットにより撮像し、前記穀粒からの反射光又は透過光による画像データを取得する撮像手段を備える装置が記載されている。 Patent Literature 1 includes an upper imaging / illumination unit, a lower illumination unit, and a tray disposed between the upper imaging / illumination unit and an arbitrary number of grains to be discriminated, and a grain placed on the tray. Light is emitted from the upper light emitting unit of the upper imaging / illumination unit to the grain, and the reflected light is imaged by the upper imaging / illumination unit, or light is emitted from the lower light emitting unit of the lower illumination unit to the grain. There is described an apparatus that includes an imaging unit that irradiates the light, images the transmitted light with an upper imaging / illumination unit, and acquires image data based on reflected light or transmitted light from the grain.
　また、特許文献２には、ベース部材と、前記ベース部材内に回転可能に配設され、一側方に光源を有する回転部材と、前記ベース部材上に取り付けられて該ベース部材とともに外枠を構成し、前記回転部材の上方に位置して穀粒を載置する試料皿を受ける開口部を有するカバー部材を備え、複数の穀粒が載置された試料皿を前記カバー部材の開口部にセットし、前記光源によって前記試料皿の透明な底面に対し斜め下方から光を照射し、前記試料皿に載置された複数の穀粒に対し斜め下方から光を透過させる装置が記載されている。 Also, in Patent Document 2, a base member, a rotating member rotatably disposed in the base member and having a light source on one side, and an outer frame mounted on the base member together with the base member. A cover member having an opening for receiving a sample dish on which a grain is placed, which is located above the rotating member, wherein a sample dish on which a plurality of grains are placed is placed in the opening of the cover member. An apparatus is described in which the light source is set to irradiate the transparent bottom surface of the sample dish with light by the light source from obliquely below, and light is transmitted obliquely from below to a plurality of grains placed on the sample dish. .
　上記特許文献１に記載された装置によれば、撮像手段により取得された穀粒からの反射光又は透過光による画像データと、穀粒検査用の基準画像データとを比較することで、前記穀粒の外観品位を判別することができる。 According to the device described in Patent Document 1, by comparing image data obtained by reflected light or transmitted light from the kernel acquired by the imaging unit with reference image data for kernel inspection, the kernel is used. The appearance quality of the grains can be determined.
　また、上記特許文献２に記載された装置によれば、試料皿の上方から作業者が目視等により穀粒内の暗影の有無を観察することで胴割れ米等を検出することができる。 According to the device described in Patent Literature 2, an operator can detect cracked rice or the like by observing the presence or absence of a dark shadow in the grain visually or the like from above the sample dish.
　ところで、特許文献１に記載された装置は、下部発光部の上にトレーを載置するものであり、前記下部発光部が前記トレーの底部に映り込み、前記撮像手段により取得する穀粒の画像データに影響を及ぼすために穀粒の外観品位を精度良く判別できない問題がある。 By the way, the device described in Patent Literature 1 places a tray on a lower light-emitting unit, and the lower light-emitting unit is reflected on the bottom of the tray, and an image of a grain obtained by the imaging unit is obtained. There is a problem that the appearance quality of the grain cannot be determined with high accuracy because it affects the data.
　他方、特許文献２に記載された装置は、光源を試料皿の下部側方に配設し、前記試料皿の底面に対し斜め下方から光を照射するものであるが、前記光源を前記試料皿の側方へ遠ざけて配設しない場合には、前記光源が前記試料皿の底部に映り込み、試料皿の上方からの作業者の目視等による穀粒の観察に影響を及ぼすために胴割れ米等を正確に検出できない問題がある。 On the other hand, the device described in Patent Document 2 arranges a light source on a lower side of a sample dish and irradiates light to a bottom surface of the sample dish from obliquely below. Otherwise, the light source is reflected on the bottom of the sample dish and affects the observation of the grain by a worker from above the sample dish. Etc. cannot be accurately detected.
特開２０１５－７６０６号公報JP-A-2015-7606 特開２０１４－１７３８８４号公報JP 2014-173884 A
　そこで、本発明は、透明な試料皿の底部への光源の映り込みを防ぐことで、前記試料皿に載置される穀粒の外観品位を精度良く判別することができる穀粒品位判別装置を提供することを目的とする。 Therefore, the present invention provides a grain quality discriminating apparatus that can accurately determine the appearance quality of grains placed on the sample dish by preventing reflection of a light source on the bottom of a transparent sample dish. The purpose is to provide.
　上記目的を達成するため、本発明の一実施形態は、
　透明な底面を有する試料皿に載置された穀粒に対し光を照射し、前記穀粒に光を透過させ、前記穀粒からの透過光に基づいて前記穀粒の外観品位を判別する穀粒品位判別装置であって、
　前記試料皿の下方には光源を有する照明機構を配設し、
　前記照明機構が、前記試料皿に載置された穀粒に対し間接光を照射することを特徴とする。 To achieve the above object, one embodiment of the present invention provides:
A grain that irradiates light to a grain placed on a sample dish having a transparent bottom surface, transmits light to the grain, and determines the appearance quality of the grain based on transmitted light from the grain. A grain quality determination device,
An illumination mechanism having a light source is arranged below the sample dish,
The illumination mechanism irradiates the kernel placed on the sample dish with indirect light.
　本発明の一実施形態は、
　前記照明機構が前記試料皿の斜め下方に配設される光源ブロックを有し、前記光源が前記光源ブロックの内側に配設されてなり、
　前記照明機構が、前記光源からの光を前記光源ブロックの内側で反射させ、前記試料皿に載置された穀粒に対し間接光として斜め下方から照射することが好ましい。 One embodiment of the present invention is:
The illumination mechanism has a light source block disposed diagonally below the sample dish, and the light source is disposed inside the light source block,
It is preferable that the illumination mechanism reflects the light from the light source inside the light source block and irradiates the kernel placed on the sample dish as indirect light from obliquely below.
　本発明の一実施形態は、
　前記光源ブロックが、前記光源が固定される固定部、前記固定部の上部に位置し前記試料皿の中心側へ延出して前記光源から前記試料皿の底部に向かう直接光（直射光）を遮り反射させる導光部、前記固定部の下部に位置し前記光源からの直接光又は前記導光部からの反射光を反射させる反射部を有し、
　前記照明機構が、前記光源からの光を前記光源ブロックの前記各部の内側面で反射させ、前記試料皿に載置された穀粒に対し間接光として斜め下方から照射することが好ましい。 One embodiment of the present invention is:
The light source block is a fixed portion to which the light source is fixed, and is located above the fixed portion and extends toward the center of the sample dish to block direct light (direct light) from the light source toward the bottom of the sample dish. A light guide portion for reflection, a reflection portion for reflecting direct light from the light source or reflected light from the light guide portion, which is located below the fixed portion,
It is preferable that the illumination mechanism reflects light from the light source on the inner surface of each section of the light source block and irradiates the kernel placed on the sample dish as indirect light from obliquely below.
　本発明の一実施形態は、
　前記試料皿の下方にバックグラウンドとなる黒色反射板が配設される一方で、前記照明機構が前記黒色反射板の外方に隣接して配設されてなり、前記光源ブロックの前記各部の内側面が白色とされることが好ましい。 One embodiment of the present invention is:
A black reflector serving as a background is provided below the sample dish, while the illumination mechanism is provided adjacent to the outside of the black reflector, and the light source block includes a light source and a light source. Preferably, the sides are white.
　本発明の一実施形態は、
　前記照明機構が前記試料皿の斜め下方に複数配設されてなり、前記光源からの光を前記試料皿に載置された穀粒に対し間接光として複数の方向から照射することが好ましい。 One embodiment of the present invention is:
It is preferable that a plurality of the illumination mechanisms are disposed diagonally below the sample dish, and that the light from the light source is radiated from a plurality of directions as indirect light to the grains placed on the sample dish.
　本発明の一実施形態は、
　前記穀粒品位判別装置が、透明な底面を有する試料皿に載置された穀粒に対し光を照射し、前記穀粒に光を透過及び／又は反射させ、前記穀粒からの透過光及び／又は反射光に基づいて、前記穀粒の外観品位を判別する穀粒品位判別装置であって、
　前記試料皿の斜め上方に上部光源を有する上部照明機構を配設し、
　前記上部照明機構が、前記上部光源が固定される固定部、前記上部光源の下方に位置し前記上部光源から前記試料皿に向かう直接光を遮り上方へ反射させる下側遮光部、前記上部光源の上方に位置し前記上部光源から上方へ向かう直接光及び前記下側遮光部で反射した反射光を遮り下方へ反射させる上側遮光部を有し、
　前記上部照明機構が、前記上部光源からの光を前記各遮光部で反射させ、前記試料皿に載置された穀粒に対し間接光として斜め上方から照射することが好ましい。 One embodiment of the present invention is:
The grain quality discriminating apparatus irradiates light to a grain placed on a sample dish having a transparent bottom surface, and transmits and / or reflects light to the grain, and transmits light from the grain and / Or a grain quality determination device that determines the appearance quality of the grain based on reflected light,
Disposing an upper illumination mechanism having an upper light source diagonally above the sample dish,
The upper illumination mechanism, a fixed portion to which the upper light source is fixed, a lower light-shielding portion that is located below the upper light source and blocks direct light from the upper light source toward the sample dish and reflects upward, An upper light-shielding portion that is located above and has an upper light-shielding portion that intercepts the direct light heading upward from the upper light source and the reflected light reflected by the lower light-shielding portion and reflects the light downward,
It is preferable that the upper illumination mechanism reflects light from the upper light source at each of the light-shielding portions, and irradiates the kernel placed on the sample dish as indirect light from obliquely above.
　本発明の一実施形態は、
　前記上部照明機構が筒体の内面に複数設けられ、前記上部光源からの光を前記試料皿に載置された穀粒に対し間接光として複数の方向から照射することが好ましい。 One embodiment of the present invention is:
It is preferable that a plurality of the upper illuminating mechanisms are provided on the inner surface of the cylindrical body, and the light from the upper light source irradiates the kernel placed on the sample dish as indirect light from a plurality of directions.
　本発明の一実施形態は、
　前記各遮光部が黒色とされる一方で、前記筒体の内面が前記上側遮光部より下方が白色、前記上側遮光部より上方が黒色とされることが好ましい。 One embodiment of the present invention is:
Preferably, while each of the light-shielding portions is black, the inner surface of the cylindrical body is white below the upper light-shielding portion and black above the upper light-shielding portion.
　本発明の一実施形態は、
　前記上側遮光部の上方であって前記筒体の内部に、円形状の開口を有し前記穀粒からの透過光及び／又は反射光の光量を調整する絞り機能を有する黒色遮光板を配設することが好ましい。 One embodiment of the present invention is:
A black light-shielding plate having a circular opening and having a diaphragm function for adjusting the amount of transmitted light and / or reflected light from the grain is disposed above the upper light-shielding portion and inside the cylindrical body. Is preferred.
　本発明の一実施形態の穀粒品位判別装置は、照明機構が、光源からの光を試料皿に載置された穀粒に対し間接光として下方から照射するので、前記試料皿の底部への光源の映り込みを防ぐことができる。
　したがって、本発明の一実施形態の穀粒品位判別装置によれば、穀粒からの透過光に基づいて試料皿に載置される穀粒の外観品位を精度良く判別することができる。 In the grain quality discriminating apparatus according to one embodiment of the present invention, the illumination mechanism irradiates the light from the light source from below onto the grains placed on the sample dish as indirect light, so that the light is applied to the bottom of the sample dish. The reflection of the light source can be prevented.
Therefore, according to the grain quality determination device of one embodiment of the present invention, it is possible to accurately determine the appearance quality of the grains placed on the sample dish based on the transmitted light from the grains.
　また、本発明の一実施形態の穀粒品位判別装置は、照明機構が光源からの光を試料皿に載置された穀粒に対し間接光として下方から照射するので、前記試料皿の底部への光源の映り込みを防ぐために前記照明機構を前記試料皿の中心から側方へ遠ざけて配設する必要がない。
　したがって、本発明の一実施形態の穀粒品位判別装置によれば、試料皿の底部への光源の映り込みを防ぐために装置が大型化することを防止できる。 Further, in the grain quality determination device of one embodiment of the present invention, since the illumination mechanism irradiates the light from the light source to the grains placed on the sample dish as indirect light from below, the illumination mechanism emits light to the bottom of the sample dish. In order to prevent the reflection of the light source, it is not necessary to dispose the illumination mechanism away from the center of the sample dish to the side.
Therefore, according to the grain quality discriminating apparatus of one embodiment of the present invention, it is possible to prevent the apparatus from increasing in size in order to prevent the light source from being reflected on the bottom of the sample dish.
　本発明の一実施形態の穀粒品位判別装置は、前記照明機構が前記試料皿の斜め下方に配設される光源ブロックを有し、前記光源が前記光源ブロックの内側に配設されてなり、前記照明機構が、前記光源からの光を前記光源ブロックの内側で反射させ、前記試料皿に載置された穀粒に対し間接光として斜め下方から照射することとすれば、前記照明機構は、前記光源からの光を簡単な構成によって間接光とすることができる。 The grain quality determination device according to an embodiment of the present invention, wherein the illumination mechanism has a light source block disposed obliquely below the sample dish, and the light source is disposed inside the light source block, If the illumination mechanism reflects the light from the light source inside the light source block and irradiates the grains placed on the sample dish as indirect light from obliquely below, the illumination mechanism includes: The light from the light source can be turned into indirect light with a simple configuration.
　なお、本発明の一実施形態の穀粒品位判別装置は、光源からの光を試料皿に載置された穀粒に対し斜め下方から照射することとすれば、胴割れ粒等の検出に好適である。 Note that the grain quality determination device of one embodiment of the present invention is suitable for detecting cracks in the body if the light from the light source is radiated diagonally from below on the grains placed on the sample dish. It is.
　本発明の一実施形態の穀粒品位判別装置は、前記光源ブロックが、前記光源が固定される固定部、前記固定部の上部に位置し前記試料皿の中心側へ延出して前記光源から前記試料皿の底部に向かう直接光（直射光）を遮り反射させる導光部、前記固定部の下部に位置し前記光源からの直接光又は前記導光部からの反射光を反射させる反射部を有し、前記照明機構が、前記光源からの光を前記光源ブロックの前記各部の内側面で反射させ、前記試料皿に載置された穀粒に対し間接光として斜め下方から照射することとすれば、前記導光部によって前記光源が前記試料皿の底部に映り込む範囲を狭くすることができるので、装置を小型化することができる。
　また、本発明の一実施形態の穀粒品位判別装置は、前記照明機構が前記光源からの光の大半を前記光源ブロックの前記反射部に導光できるので、光の有効利用を図ることができる。 The grain quality determination device according to an embodiment of the present invention is configured such that the light source block is a fixed portion to which the light source is fixed, is located above the fixed portion, extends toward the center of the sample dish, and extends from the light source. A light guide section for blocking and reflecting direct light (direct light) directed toward the bottom of the sample dish; and a reflection section located below the fixed section and reflecting direct light from the light source or reflected light from the light guide section. Then, if the illumination mechanism reflects light from the light source on the inner surface of each section of the light source block, and irradiates the kernel placed on the sample dish as indirect light from obliquely below. Since the range in which the light source is reflected on the bottom of the sample dish by the light guide section can be narrowed, the apparatus can be downsized.
Further, in the grain quality determination device according to the embodiment of the present invention, the illumination mechanism can guide most of the light from the light source to the reflection portion of the light source block, so that the light can be effectively used. .
　本発明の一実施形態の穀粒品位判別装置は、前記試料皿の下方にバックグラウンドとなる黒色反射板が配設される一方で、前記照明機構が、前記黒色反射板の外方に隣接して配設されてなり、前記光源ブロックの前記各部の内側面が白色とされることとすれば、前記光源ブロックの前記各部の白色の内側面によって前記光源の光を効果的に反射させ有効活用することができる。また、前記照明機構からバックグラウンドとなる前記黒色反射板に入射する光の大半が間接光となるため、前記黒色反射板からの反射による前記試料皿の底部への前記光源の映り込みを防ぐことができる。 The grain quality determination device according to an embodiment of the present invention is arranged such that a black reflector serving as a background is disposed below the sample dish, while the illumination mechanism is adjacent to the outside of the black reflector. If the inner surfaces of the respective parts of the light source block are made white, the light of the light source is effectively reflected by the white inner surfaces of the respective parts of the light source block to be effectively utilized. can do. Further, since most of the light incident on the black reflector serving as the background from the illumination mechanism is indirect light, it is possible to prevent the reflection of the light source on the bottom of the sample dish due to reflection from the black reflector. Can be.
　本発明の一実施形態の穀粒品位判別装置は、前記照明機構が、前記試料皿の斜め下方に複数が配設されてなり、前記光源からの光を前記試料皿に載置された穀粒に対し間接光として複数の方向から照射することとすれば、胴割れ粒等を穀粒の向きに関係なく精度よく検出することができる。 The grain quality determination device according to an embodiment of the present invention is configured such that a plurality of the illumination mechanisms are disposed diagonally below the sample dish, and light from the light source is placed on the sample dish. In contrast, by irradiating the indirect light from a plurality of directions, it is possible to accurately detect body cracks and the like regardless of the direction of the grains.
　本発明の一実施形態の穀粒品位判別装置は、上部照明機構が、上部光源からの光を下側遮光部及び上側遮光部で反射させ、試料皿に載置された穀粒に対し間接光として斜め上方から照射することとすれば、前記試料皿への前記上部光源の映り込みを防ぐことができる。
　したがって、本発明の一実施形態の穀粒品位判別装置によれば、穀粒からの透過光及び／又は反射光に基づいて試料皿に載置される穀粒の外観品位を精度良く判別することができる。 In the grain quality determination device according to one embodiment of the present invention, the upper illumination mechanism reflects light from the upper light source at the lower light-shielding portion and the upper light-shielding portion, and indirect light is applied to the kernel placed on the sample dish. If the irradiation is performed diagonally from above, the reflection of the upper light source on the sample dish can be prevented.
Therefore, according to the grain quality determination device of one embodiment of the present invention, it is possible to accurately determine the appearance quality of a grain placed on a sample dish based on transmitted light and / or reflected light from the grain. Can be.
　また、本発明の一実施形態の穀粒品位判別装置は、上部照明機構が上部光源からの光を各遮光部で反射させ、試料皿に載置された穀粒に対し間接光として斜め上方から照射することとすれば、試料皿の底部への上部光源の映り込みを防ぐために前記上部照明機構を前記試料皿の中心から側方へ遠ざけて配設する必要がない。
　したがって、本発明の一実施形態の穀粒品位判別装置によれば、試料皿の底部への光源の映り込みを防ぐために装置が大型化することを防止できる。 Further, in the grain quality determination device of one embodiment of the present invention, the upper illumination mechanism reflects the light from the upper light source at each light shielding unit, and indirectly lights the grain placed on the sample dish from obliquely above. If irradiation is performed, it is not necessary to dispose the upper illumination mechanism away from the center of the sample dish to the side in order to prevent reflection of the upper light source on the bottom of the sample dish.
Therefore, according to the grain quality discriminating apparatus of one embodiment of the present invention, it is possible to prevent the apparatus from increasing in size in order to prevent the light source from being reflected on the bottom of the sample dish.
　本発明の一実施形態の穀粒品位判別装置は、前記上部照明機構が、筒体の内面に複数設けられ、前記上部光源からの光を前記試料皿に載置された穀粒に対し間接光として複数の方向から照射することとすれば、穀粒の向きに関係なく外観品位を精度よく判別することができる。 In the grain quality determination device according to one embodiment of the present invention, the upper illumination mechanism is provided in plural on an inner surface of a cylindrical body, and indirect light is applied to the kernel placed on the sample dish by light from the upper light source. If the irradiation is performed from a plurality of directions, the appearance quality can be accurately determined regardless of the direction of the grain.
　本発明の一実施形態の穀粒品位判別装置は、前記各遮光部は黒色とされる一方で、前記筒体の内面は前記上側遮光部より下方が白色、前記上側遮光部より上方が黒色とされることとすれば、前記筒体の前記上側遮光部より下方の白色の内面によって前記各上部光源の光を有効に活用することができる。また、前記筒体の上方からは前記試料皿に載置された穀粒の画像を取得等することとなるが、前記上側遮光部より上方の黒色の内面によって前記筒体の上方への前記各上部光源の光の回り込みを防止することができるため、前記穀粒の鮮明な画像を取得することができる。
　本発明の一実施形態の穀粒品位判別装置は、前記上側遮光部の上方であって前記筒体の内部には、円形状の開口を有し前記穀粒からの透過光及び／又は反射光の光量を調整する絞り機能を有する黒色遮光板を配設することとすれば、前記筒体の上方から前記試料皿に載置された穀粒の画像取得等するに際し、前記穀粒の鮮明な画像を取得することができる。また、前記黒色遮光板の前記開口の大きさを変更することで、前記試料皿に載置された穀粒の画像取得できる範囲を調整することができるので、前記光源又は前記上部光源の前記試料皿の底部への映り込みを防止する上で有効である。 In the grain quality determination device of one embodiment of the present invention, while each of the light-shielding portions is black, the inner surface of the cylindrical body is white below the upper light-shielding portion and black above the upper light-shielding portion. If so, the light from each of the upper light sources can be effectively utilized by the white inner surface below the upper light-shielding portion of the cylindrical body. In addition, from above the cylinder, an image of the grain placed on the sample dish is to be acquired, etc., but each of the above-mentioned cylinders above the cylinder by the black inner surface above the upper light-shielding portion. Since the wraparound of the light from the upper light source can be prevented, a clear image of the grain can be obtained.
The grain quality determination device according to one embodiment of the present invention has a circular opening above the upper light-shielding portion and inside the cylindrical body, and has transmitted light and / or reflected light from the grain. If a black light-shielding plate having a diaphragm function for adjusting the amount of light is provided, when acquiring an image of a grain placed on the sample dish from above the cylindrical body, etc., the grain is sharp. Images can be acquired. Further, by changing the size of the opening of the black light-shielding plate, it is possible to adjust a range in which an image of a grain placed on the sample dish can be obtained, and thus the sample of the light source or the upper light source can be adjusted. This is effective in preventing reflection on the bottom of the dish.
　本発明により、透明な試料皿の底部への光源の映り込みを防ぐことで、前記試料皿に載置される穀粒の外観品位を精度良く判別することができる穀粒品位判別装置を提供できる。 Advantageous Effects of Invention According to the present invention, it is possible to provide a grain quality determination device capable of accurately determining the appearance quality of grains placed on the sample dish by preventing reflection of a light source on the bottom of a transparent sample dish. .
穀粒品位判別装置の概略説明図。FIG. 1 is a schematic explanatory diagram of a grain quality determination device. 下部照明機構の説明図。Explanatory drawing of a lower illumination mechanism. 図２のＡ－Ａ断面図。AA sectional drawing of FIG. 上部照明機構の説明図。Explanatory drawing of an upper illumination mechanism. 図４のＢ－Ｂ断面図。FIG. 5 is a sectional view taken along line BB of FIG. 4. 下部照明機構の他の例の説明図。Explanatory drawing of another example of a lower illumination mechanism. 他の穀粒品位判別装置の概略説明図。The schematic explanatory drawing of another grain quality discriminating apparatus. 図１の穀粒品位判別装置の変形例の概略説明図。The schematic explanatory drawing of the modification of the grain quality determination apparatus of FIG.
　本発明の実施の形態を図面に基づいて説明する。
　図１は本発明の実施の形態における穀粒品位判別装置の概略説明図を示す。
　図１に示す穀粒品位判別装置１は、下部照明用収納部２と上部照明用筒体３とを備える。
　前記下部照明用収納部２は、平面視矩形状の空間を有し、側面に沿って下部照明機構２０が収納される。ここでは、２組の下部照明機構２０が収納される例を示す。
　前記下部照明用収納部２の上部中央には円形状の開口部２４が設けられ、前記開口部２４上に透明な材料で形成される円形状の透明カルトン４が載置される。また、前記下部照明用収納部２の底部であって前記透明カルトン４の下方にはバックグラウンドとなる黒色反射板２３が配設される。
　前記下部照明機構２０は、前記透明カルトン（透明な底面を有する試料皿）４の斜め下方に配設され、前記透明カルトン４に載置される穀粒に対し斜め下方から光を照射する。
　前記下部照明機構２０については、後述する図８に示すように、前記透明カルトン４の真下に配設してもよい。この場合、前記下部照明機構２０は、前記黒色反射板２３と同色となる部材で構成し、バックグラウンドとしての機能を果たせる構成とする。 An embodiment of the present invention will be described with reference to the drawings.
FIG. 1 is a schematic explanatory diagram of a grain quality determination device according to an embodiment of the present invention.
The grain quality determination device 1 shown in FIG. 1 includes a lower illumination storage unit 2 and an upper illumination cylinder 3.
The storage unit 2 for lower illumination has a rectangular space in plan view, and the lower illumination mechanism 20 is stored along the side surface. Here, an example is shown in which two sets of lower illumination mechanisms 20 are housed.
A circular opening 24 is provided at the upper center of the lower illumination storage unit 2, and a circular transparent carton 4 made of a transparent material is placed on the opening 24. A black reflector 23 serving as a background is disposed below the transparent carton 4 at the bottom of the lower illumination storage unit 2.
The lower illumination mechanism 20 is disposed obliquely below the transparent carton (a sample dish having a transparent bottom surface) 4 and irradiates the grain placed on the transparent carton 4 from obliquely below.
The lower illumination mechanism 20 may be disposed directly below the transparent carton 4, as shown in FIG. In this case, the lower illumination mechanism 20 is configured by a member having the same color as that of the black reflection plate 23, and configured to function as a background.
　前記上部照明用筒体３は、円筒形状であって、前記下部照明用収納部２の上部に前記開口部２４と同心状に配設される。
　前記上部照明用筒体３の内面には、上部照明機構３０が設けられる。ここでは、円周方向に４組（１組は図示省略）の上部照明機構３０が設けられる例を示す。
　前記上部照明用筒体３は上部が蓋体３４により閉ざされており、前記蓋体３４の中央に設けられる開口３５を通してカメラ等の画像取得手段（センサ）５により前記透明カルトン４上に載置される穀粒の画像データを取得する。
　前記上部照明機構３０は、前記透明カルトン４の斜め上方に配設され、前記透明カルトン４に載置される穀粒に対し斜め上方から光を照射する。 The upper illumination tube 3 has a cylindrical shape and is disposed concentrically with the opening 24 above the lower illumination storage unit 2.
An upper illumination mechanism 30 is provided on the inner surface of the upper illumination tube 3. Here, an example in which four sets (one set is omitted) of the upper illumination mechanism 30 in the circumferential direction is provided.
The upper illumination tube 3 is closed at its upper part by a lid 34 and is placed on the transparent carton 4 by an image acquisition means (sensor) 5 such as a camera through an opening 35 provided at the center of the lid 34. Image data of the grain to be obtained.
The upper illumination mechanism 30 is disposed obliquely above the transparent carton 4, and irradiates the grain placed on the transparent carton 4 from obliquely above.
　図２は下部照明機構の説明図であって光源ブロックを示す。図３は図２のＡ－Ａ断面図を示す。
　前記下部照明機構２０は、下部光源２１と長尺状の光源ブロック２２とを有する。
　前記光源ブロック２２は、前記下部光源２１が固定される固定部２２１、前記固定部２２１の上部先端に位置し前記透明カルトン４の中心側へ延出して前記下部光源２１から前記透明カルトン４の底部に向かう直接光（直射光）を遮り下方へ向けて反射させる導光部２２２を有する。
　また、前記光源ブロック２２は、前記固定部２２１の下部に位置し前記透明カルトン４の中心側に向けて上面が下方へ傾斜し、前記下部光源２１からの直接光又は前記導光部２２２からの反射光を反射させる反射部２２３を有する。 FIG. 2 is an explanatory view of the lower illumination mechanism and shows a light source block. FIG. 3 is a sectional view taken along line AA of FIG.
The lower illumination mechanism 20 has a lower light source 21 and an elongated light source block 22.
The light source block 22 includes a fixing portion 221 to which the lower light source 21 is fixed, and is located at an upper end of the fixing portion 221 and extends to the center side of the transparent carton 4 so that a bottom portion of the transparent carton 4 from the lower light source 21. And a light guide portion 222 that blocks direct light (direct light) directed toward and reflects the light downward.
Further, the light source block 22 is located below the fixing portion 221, and the upper surface is inclined downward toward the center of the transparent carton 4, so that the direct light from the lower light source 21 or the light from the light guide portion 222 is It has a reflector 223 that reflects the reflected light.
　前記下部照明機構２０は、前記下部光源２１からの光を前記光源ブロック２２の前記各部で反射させ、前記反射部２２３から又は前記黒色反射板２３を介して前記透明カルトン４に載置された穀粒に対し間接光として斜め下方から照射する。
　前記下部照明機構２０は、前記導光部２２２によって前記下部光源２１が透明カルトン４の底部に映り混む範囲を狭くすることができるので、装置の小型化に貢献する。
　また、前記下部照明機構２０は、前記下部光源２１からの光の大半を前記光源ブロック２２の前記反射部２２３に導光できるので、光の有効利用を図ることができる。 The lower illumination mechanism 20 reflects light from the lower light source 21 at each of the portions of the light source block 22, and the grain placed on the transparent carton 4 from the reflecting portion 223 or via the black reflector 23. The particles are irradiated from below as oblique light as indirect light.
The lower illumination mechanism 20 contributes to miniaturization of the device because the lower light source 21 can be narrowed in a range where the lower light source 21 is reflected on the bottom of the transparent carton 4 by the light guide 222.
Further, since the lower illumination mechanism 20 can guide most of the light from the lower light source 21 to the reflecting portion 223 of the light source block 22, the light can be effectively used.
　ここで、前記光源ブロック２２は、前記固定部２２１、前記導光部２２２及び前記反射部２２３の各部の内側面が白色とされる。
　また、前記下部照明機構２０は、前記下部照明用収納部２の底部であって前記黒色反射板２３の外方に隣接して配設される。 Here, in the light source block 22, the inner surfaces of the fixed part 221, the light guide part 222, and the reflective part 223 are white.
The lower illumination mechanism 20 is disposed adjacent to the bottom of the lower illumination storage unit 2 and outside the black reflector 23.
　前記下部照明機構２０は、前記光源ブロック２２の前記各部の白色の内側面によって前記下部光源２１の光を効果的に反射させ有効に活用することができる。
　また、前記下部照明機構２０から前記黒色反射板２３に入射する光は大半が間接光となるため、前記黒色反射板２３からの反射による前記透明カルトン４の底部への前記下部光源２１の映り込みを防ぐことができる。 The lower illumination mechanism 20 can effectively reflect and effectively utilize the light of the lower light source 21 by the white inner surfaces of the respective portions of the light source block 22.
Since most of the light incident on the black reflector 23 from the lower illumination mechanism 20 is indirect light, the reflection of the lower light source 21 on the bottom of the transparent carton 4 due to reflection from the black reflector 23 is reflected. Can be prevented.
　前記下部照明機構２０は、１個以上の下部光源２１を有するものであればよく、複数の下部光源２１を有する場合、前記光源ブロック２２の長手方向に直線状に固定すればよい。
　また、前記下部光源２１にはＬＥＤ（発光ダイオード）光源を用いるが、ＬＥＤ光源以外の光源を用いることもできる。
　なお、前記下部照明機構２０は、前記下部光源２１からの光を透明カルトン４に載置された穀粒に対し斜め下方から照射するので、胴割れ粒等の検出に好適である。 The lower illumination mechanism 20 only needs to have one or more lower light sources 21. If it has a plurality of lower light sources 21, it may be fixed linearly in the longitudinal direction of the light source block 22.
Further, although an LED (light emitting diode) light source is used for the lower light source 21, a light source other than the LED light source can be used.
Since the lower illumination mechanism 20 irradiates the light from the lower light source 21 to the grains placed on the transparent carton 4 from obliquely below, the lower illumination mechanism 20 is suitable for detecting cracks in the body.
　図４は上部照明機構の説明図を示す。図５は図４のＢ－Ｂ断面図を示す。
　前記上部照明機構３０は、上部光源３１と、前記上部照明用筒体３の内面に固定される下側遮光ブロック３２、及び上側遮光ブロック３３を有する。
　前記下側遮光ブロック３２は、前記上部光源３１が固定される固定部３２１、前記固定部３２１の下部にＬ字状に設けられ前記上部光源３１から前記透明カルトン４に向かう直接光を遮り上方へ反射させる下側遮光部３２２を有する。
　前記下側遮光ブロック３２は、前記固定部３２１において前記上部照明用筒体３の内面に固定される。 FIG. 4 is an explanatory view of the upper illumination mechanism. FIG. 5 is a sectional view taken along line BB of FIG.
The upper illumination mechanism 30 includes an upper light source 31, a lower light-blocking block 32 fixed to an inner surface of the upper illumination tube 3, and an upper light-blocking block 33.
The lower light-blocking block 32 is provided with a fixing portion 321 to which the upper light source 31 is fixed, and is provided in an L-shape below the fixing portion 321 to block direct light from the upper light source 31 toward the transparent carton 4 and upward. It has a lower light-shielding portion 322 that reflects light.
The lower light-blocking block 32 is fixed to the inner surface of the upper illumination tube 3 at the fixing portion 321.
　前記上側遮光ブロック３３は、前記上部光源３１の上方であって前記下側遮光ブロック３２の前記固定部３２１上に載置又は固定して設けられ、前記上部光源３１から上方へ向かう直接光（直射光）及び前記下側遮光部３２２で反射した反射光を遮り下方へ反射させる上側遮光部３３１を有する。
　ここでは、前記上側遮光ブロック３３は、中央に円形状の開口を有する１個のリング状部材とし、４個の上部照明機構３０に共通のものを用いるが、各上部照明機構３０に個別のものを用いることもできる。 The upper light-blocking block 33 is mounted or fixed on the fixing portion 321 of the lower light-blocking block 32 above the upper light source 31, and is provided with direct light (direct light) directed upward from the upper light source 31. (Light) and the light reflected by the lower light-shielding portion 322.
Here, the upper light-blocking block 33 is a single ring-shaped member having a circular opening at the center, and a common one is used for the four upper lighting mechanisms 30. Can also be used.
　前記上部照明機構３０は、前記上部光源３１からの光を前記下側遮光ブロック３２及び前記上側遮光ブロック３３の各遮光部３２２，３３１で反射させ、前記透明カルトン４に載置された穀粒に対し間接光として斜め上方から照射するので、前記透明カルトン４の底部への前記上部光源３１の映り込みを防ぐことができる。 The upper illumination mechanism 30 reflects the light from the upper light source 31 on the lower light-shielding block 32 and the light-shielding portions 322 and 331 of the upper light-shielding block 33, and applies the light to the kernel placed on the transparent carton 4. On the other hand, since the indirect light is emitted from obliquely above, reflection of the upper light source 31 on the bottom of the transparent carton 4 can be prevented.
　ここで、前記下側遮光ブロック３２及び前記上側遮光ブロック３３は黒色とされる。
　また、前記上部照明用筒体３の内面は、前記上側遮光ブロック３３（上側遮光部３３１）の下面よりも下方が白色、前記上側遮光ブロック３３（上側遮光部３３１）の下面よりも上方が黒色とされる。 Here, the lower light shielding block 32 and the upper light shielding block 33 are black.
The inner surface of the upper illumination tube 3 is white below the lower surface of the upper light-blocking block 33 (upper light-shielding portion 331), and black above the lower surface of the upper light-shielding block 33 (upper light-shielding portion 331). It is said.
　前記上部照明機構３０は、前記上部照明用筒体３の前記上側遮光ブロック３３の下面より下方の白色の内面によって前記各上部光源３１の光を有効に活用することができる。
　また、前記上部照明用筒体３の上方からは、前記蓋体３４の中央に設けられる開口３５を通してカメラ等の画像取得手段５により前記透明カルトン４上に載置される穀粒の画像データを取得することとなるが、前記上側遮光ブロック３３の下面より上方の黒色の内面によって前記上部照明用筒体３の上方への前記各上部光源３１の光の回り込みを防止することができるため、前記穀粒の鮮明な画像データを取得することができる。 The upper illumination mechanism 30 can effectively utilize the light of each of the upper light sources 31 by the white inner surface below the lower surface of the upper light-blocking block 33 of the upper illumination tube 3.
Also, from above the upper illumination tube 3, image data of grains placed on the transparent carton 4 by an image acquisition means 5 such as a camera through an opening 35 provided at the center of the lid 34. However, since the black inner surface above the lower surface of the upper light-blocking block 33 can prevent the light of each of the upper light sources 31 from flowing above the upper illumination tube 3, Clear image data of the grain can be obtained.
　なお、前記上部照明用筒体３には円筒形状のものを用いることとしたが、例えば四角筒形状など、角筒形状のものを用いることもできる。
　また、前記上部光源３１にはＬＥＤ（発光ダイオード）光源を用いるが、ＬＥＤ光源以外の光源を用いることもできる。 In addition, although the cylindrical thing was used for the said cylindrical body 3 for upper illuminations, the thing of a square tube shape, such as a square tube shape, can also be used, for example.
Although an LED (light emitting diode) light source is used as the upper light source 31, a light source other than the LED light source can be used.
　本発明の実施の形態における穀粒品位判別装置の作用について説明する。
　まず、下部照明用収納部２の上部中央に設けられる開口部２４上に位置するよう穀粒が載置された透明カルトン４をセットする。
　次に、下部照明機構２０及び／又は上部照明機構３０において、それぞれ下部光源２１及び／又は上部光源３１のＬＥＤを点灯し、前記透明カルトン４に載置された前記穀粒に対し光を照射し、前記穀粒に光を透過及び／又は反射させる。
　そして、前記上部照明用筒体３の蓋体３４に設けられる開口３５を通して、画像取得手段５により前記透明カルトン４に載置される前記穀粒の透過画像及び／又は反射画像を取得する。 The operation of the grain quality determination device according to the embodiment of the present invention will be described.
First, the transparent carton 4 on which grains are placed is set so as to be positioned on the opening 24 provided at the upper center of the lower lighting storage unit 2.
Next, in the lower illumination mechanism 20 and / or the upper illumination mechanism 30, the LEDs of the lower light source 21 and / or the upper light source 31 are turned on, respectively, and light is applied to the grains placed on the transparent carton 4. Transmitting and / or reflecting light to the grain;
Then, through the opening 35 provided in the lid 34 of the upper illumination tube 3, a transmission image and / or a reflection image of the kernel placed on the transparent carton 4 is acquired by the image acquisition unit 5.
　前記穀粒品位判別装置１は、図示しないマイクロコンピュータにより、前記取得した透過画像に基づいて外形形状・面積・長さ・幅等の形状情報や色彩（カラー情報（Ｒ・Ｇ・Ｂ）、乳白色等）・胴割等の光学情報を抽出し、また、前記取得した反射画像に基づいて外形形状・面積・長さ・幅等の形状情報を抽出し、そして、前記抽出した形状情報や光学情報に基づいて前記穀粒の外観品位を判別する。 The grain quality discriminating apparatus 1 uses a microcomputer (not shown) based on the acquired transmission image to obtain shape information such as external shape, area, length, width, and the like (color information (R, G, B), milky white). Etc.), extracting optical information such as body splitting, and extracting shape information such as external shape, area, length, width, etc. based on the acquired reflection image, and extracting the extracted shape information and optical information. The appearance quality of the grain is determined based on
　前記下部照明機構２０は、前記下部光源２１からの光を前記透明カルトン４に載置された穀粒に対し間接光として斜め下方から照射するので、前記透明カルトン４の底部への前記下部光源２１の映り込みを防ぐことができる。
　また、前記上部照明機構３０は、前記上部光源３１からの光を前記透明カルトン４に載置された穀粒に対し間接光として斜め上方から照射するので、前記透明カルトン４の底部への前記上部光源３１の映り込みを防ぐことができる。
　したがって、前記穀粒品位判別装置１によれば、穀粒からの透過光及び／又は反射光に基づいて前記透明カルトン４に載置される穀粒の外観品位を精度良く判別することができる。 Since the lower illumination mechanism 20 irradiates the light from the lower light source 21 to the grains placed on the transparent carton 4 as indirect light from obliquely below, the lower light source 21 on the bottom of the transparent carton 4 Can be prevented from being reflected.
In addition, since the upper illumination mechanism 30 irradiates the light from the upper light source 31 to the grains placed on the transparent carton 4 as indirect light from obliquely above, the upper part of the transparent carton 4 The reflection of the light source 31 can be prevented.
Therefore, according to the grain quality determination device 1, the appearance quality of the grain placed on the transparent carton 4 can be accurately determined based on the transmitted light and / or the reflected light from the grain.
　前記穀粒品位判別装置１は、前記下部照明機構２０が前記下部光源２１からの光を前記透明カルトン４に載置された穀粒に対し間接光として斜め下方から照射するので、前記透明カルトン４の底部への前記下部光源２１の映り込みを防ぐために前記下部照明機構２０を前記透明カルトン４の中心から側方へ遠ざけて配設する必要がない。
　また、前記穀粒品位判別装置１は、前記上部照明機構３０が前記上部光源３１からの光を前記透明カルトン４に載置された穀粒に対し間接光として斜め上方から照射するので、前記透明カルトン４の底部への前記上部光源３１の映り込みを防ぐために前記上部照明機構３０を前記透明カルトン４の中心から側方へ遠ざけて配設する必要がない。
　したがって、前記穀粒品位判別装置１によれば、透明カルトン４の底部への下部光源２１及び上部光源３１の映り込みを防ぐために装置が大型化することを防止できる。 Since the lower lighting mechanism 20 irradiates the light from the lower light source 21 to the kernels placed on the transparent carton 4 as indirect light from obliquely below, the grain quality determination device 1 It is not necessary to dispose the lower illumination mechanism 20 away from the center of the transparent carton 4 to the side in order to prevent the lower light source 21 from being reflected on the bottom of the transparent light.
Further, in the grain quality determination device 1, the upper illumination mechanism 30 irradiates the light from the upper light source 31 to the grains placed on the transparent carton 4 as indirect light from obliquely above, so that the transparent It is not necessary to dispose the upper illumination mechanism 30 away from the center of the transparent carton 4 to the side in order to prevent the upper light source 31 from being reflected on the bottom of the carton 4.
Therefore, according to the grain quality determination device 1, it is possible to prevent the size of the device from increasing in size in order to prevent the lower light source 21 and the upper light source 31 from being reflected on the bottom of the transparent carton 4.
　なお、前記穀粒品位判別装置１は、前記上側遮光ブロック３３の上方であって前記上部照明用筒体３の内部に、円形状の開口を有し前記穀粒からの透過光及び／又は反射光の光量を調整する図示しない絞り機能を有する黒色遮光板を配設することもできる。
　前記穀粒品位判別装置１において、前記上部照明用筒体３の内部に絞り機能を有する前記黒色遮光板を配設することとすれば、前記上部照明用筒体３の蓋体３４に設けられる開口３５を通して、画像取得手段５により前記透明カルトン４に載置される前記穀粒の透過画像及び／又は反射画像を取得する際、前記穀粒の鮮明な画像を取得することができる。また、絞り機能を有する前記黒色遮光板の前記開口の大きさを変更することで、前記透明カルトン４に載置された穀粒の画像取得できる範囲を調整することができるので、前記下部光源２１又は前記上部光源３１の前記透明カルトン４の底部への映り込みを防止する上で有効である。 In addition, the grain quality determination device 1 has a circular opening above the upper light-blocking block 33 and inside the upper illumination cylinder 3 and has a circular opening and transmits and / or reflects light from the grain. A black light shielding plate having an aperture function (not shown) for adjusting the amount of light can be provided.
In the grain quality discriminating apparatus 1, if the black light-shielding plate having a diaphragm function is provided inside the upper illumination tube 3, the black light shielding plate is provided on the lid 34 of the upper illumination tube 3. When acquiring the transmission image and / or the reflection image of the kernel placed on the transparent carton 4 by the image acquiring unit 5 through the opening 35, a clear image of the kernel can be acquired. Further, by changing the size of the opening of the black light-shielding plate having the aperture function, the range in which an image of the kernel placed on the transparent carton 4 can be obtained can be adjusted. Alternatively, this is effective in preventing the reflection of the upper light source 31 on the bottom of the transparent carton 4.
　上記本発明の実施の形態では、前記穀粒品位判別装置１は、前記下部照明用収納部２に２組の下部照明機構２０が収納される場合を例としたが、少なくとも１組の下部照明機構２０が収納されるものであればよい。また、前記下部照明用収納部２に４組の下部照明機構２０を９０度の等間隔で収納する場合には、４組の前記下部照明機構２０の光源を順次点灯して各透過画像を取得し、又は４組の前記下部照明機構２０の光源を同時に点灯して透過画像を取得することとすれば、穀粒の向きに関係なく胴割れ粒等を精度よく検出することができる。 In the above-described embodiment of the present invention, the grain quality discriminating apparatus 1 has been described as an example in which the two lower illumination mechanisms 20 are accommodated in the lower illumination storage unit 2. What is necessary is just to accommodate the mechanism 20. When four lower illumination mechanisms 20 are stored in the lower illumination storage unit 2 at regular intervals of 90 degrees, the light sources of the four lower illumination mechanisms 20 are sequentially turned on to acquire each transmission image. Alternatively, if the four light sources of the lower illumination mechanism 20 are simultaneously turned on to acquire a transmission image, it is possible to accurately detect cracked grains and the like regardless of the orientation of grains.
　図６は下部照明機構の他の例の説明図であって光源ブロックの断面図を示す。
　図６に示す下部照明機構２０は、光源ブロック２２の反射部２２３の上面が下部照明用収納部２の底部に略平行とされる点で、図２及び図３に示す下部照明機構２０と相違する。
　図６に示す下部照明機構２０も、図２及び図３に示す下部照明機構２０と同様に、下部光源２１からの光を前記光源ブロック２２の内側で反射させ、前記反射部２２３から又は黒色反射板２３を介して透明カルトン４に載置された穀粒に対し間接光として斜め下方から照射する。 FIG. 6 is an explanatory view of another example of the lower illumination mechanism, and shows a cross-sectional view of a light source block.
The lower illumination mechanism 20 shown in FIG. 6 differs from the lower illumination mechanism 20 shown in FIGS. 2 and 3 in that the upper surface of the reflector 223 of the light source block 22 is substantially parallel to the bottom of the lower illumination storage unit 2. I do.
The lower illumination mechanism 20 shown in FIG. 6 also reflects light from the lower light source 21 inside the light source block 22 and emits light from the reflection portion 223 or black reflection similarly to the lower illumination mechanism 20 shown in FIGS. Grains placed on the transparent carton 4 are radiated from below obliquely through the plate 23 as indirect light.
　図７は本発明の他の実施の形態における穀粒品位判別装置の概略説明図を示す。
　図７に示す穀粒品位判別装置１０１は、下部照明用収納部２を備え、下部照明機構２０のみを備えるものであり、上部照明用筒体を備えない点で、図１に示す穀粒品位判別装置１と相違する。
　図７に示す穀粒品位判別装置１０１は、特開２０１４－１７３８８４号公報に記載される装置と同様に、目視による胴割れ米等の検査に使用して好適である。 FIG. 7 is a schematic explanatory diagram of a grain quality determination device according to another embodiment of the present invention.
The grain quality discriminating apparatus 101 shown in FIG. 7 includes the lower lighting storage unit 2 and only the lower lighting mechanism 20, and does not include the upper lighting cylinder. This is different from the determination device 1.
The grain quality discriminating apparatus 101 shown in FIG. 7 is suitable for use in visually inspecting cracked rice and the like, similarly to the apparatus described in JP-A-2014-173884.
　図７に示す穀粒品位判別装置１０１も、下部光源２１からの光を透明カルトン４に載置された穀粒に対し間接光として斜め下方から照射するので、前記透明カルトン４の底部への前記下部光源２１の映り込みを防ぐことができ、穀粒からの透過光に基づいて前記穀粒の外観品位を精度良く判別することができる。 The grain quality determination device 101 shown in FIG. 7 also irradiates the light from the lower light source 21 to the kernels placed on the transparent carton 4 as indirect light from obliquely below, so that the grain to the bottom of the transparent carton 4 The reflection of the lower light source 21 can be prevented, and the appearance quality of the kernel can be accurately determined based on the transmitted light from the kernel.
　図８は図１に示す穀粒品位判別装置の変形例の概略説明図を示す。
　図８に示す穀粒品位判別装置１は、下部照明機構２０を透明カルトン４の真下に配設する点で、図１に示す穀粒品位判別装置と相違する。この場合、前記下部照明機構２０は、下部光源２１が内側に固定される例えば円形状のカップ型の光源ブロック２２を下部照明用収納部２に逆さ状に収納し、前記光源ブロック２２の外側面を黒色としてバックグラウンドとしての機能を果たせる構成とする。前記下部照明用収納部２は、平面視円形状の空間を有するものとしてもよい。 FIG. 8 is a schematic explanatory diagram of a modified example of the grain quality determination device shown in FIG.
The grain quality discriminating apparatus 1 shown in FIG. 8 differs from the grain quality discriminating apparatus shown in FIG. 1 in that the lower illumination mechanism 20 is disposed directly below the transparent carton 4. In this case, the lower illumination mechanism 20 stores, for example, a circular cup-shaped light source block 22 to which the lower light source 21 is fixed inside in the lower illumination storage unit 2 upside down. Is black and can function as a background. The storage section 2 for lower illumination may have a circular space in plan view.
　図８に示す穀粒品位判別装置１では、前記下部照明機構２０は前記下部光源２１からの光を前記光源ブロック２２及び前記下部照明用収納部２の内側面で反射させ、前記透明カルトン４に載置された穀粒に対し間接光として下方から照射する。
　図８に示す穀粒品位判別装置１も、前記透明カルトン４の底部への前記下部光源２１の映り込みを防ぐことができるため、穀粒からの透過光に基づいて前記穀粒の外観品位を精度良く判別することができる。 In the grain quality determination device 1 shown in FIG. 8, the lower illumination mechanism 20 reflects light from the lower light source 21 on the light source block 22 and the inner side surface of the lower illumination storage unit 2, The mounted grains are irradiated from below as indirect light.
The grain quality determination device 1 shown in FIG. 8 can also prevent the lower light source 21 from reflecting on the bottom of the transparent carton 4, so that the appearance quality of the grain can be reduced based on the transmitted light from the grain. It is possible to determine with high accuracy.
　なお、図８に示す例では上部照明機構３０を省略したが、図１に示す穀粒品位判別装置と同様に、上部照明用筒体３の内面に上部照明機構３０を備えるものとすることもできる。
　また、図８に示す穀粒品位判別装置１も、図７に示す穀粒品位判別装置１０１と同様に、上部照明用筒体３を備えない構成とすることもできる。 Although the upper illumination mechanism 30 is omitted in the example illustrated in FIG. 8, the upper illumination mechanism 30 may be provided on the inner surface of the upper illumination cylinder 3, similarly to the grain quality determination device illustrated in FIG. 1. it can.
Further, the grain quality determination device 1 shown in FIG. 8 may be configured not to include the upper illumination tubular body 3, similarly to the grain quality determination device 101 shown in FIG.
　本発明の実施の形態における穀粒品位判別装置は、米粒の外観品位の判別に限るものでなく、あらゆる穀粒の外観品位の判別に使用することができる。 The grain quality discriminating apparatus according to the embodiment of the present invention is not limited to discriminating the appearance quality of rice grains, but can be used for discriminating the appearance quality of all grains.
　本発明は、上記実施の形態に限るものでなく、発明の範囲を逸脱しない限りにおいてその構成を適宜変更できることはいうまでもない。 The present invention is not limited to the above-described embodiment, and it goes without saying that its configuration can be appropriately changed without departing from the scope of the invention.
　本発明の穀粒品位判別装置は、透明な試料皿の底部への光源の映り込みを防ぐことで、前記試料皿に載置される穀粒の外観品位を精度良く判別することができるものであり、実用性に優れる。 The grain quality determination device of the present invention can accurately determine the appearance quality of the grains placed on the sample dish by preventing the reflection of the light source on the bottom of the transparent sample dish. Yes, excellent in practicality.
１　　　穀粒品位判別装置
２　　　下部照明用収納部
２０　　　下部照明機構
２１　　　下部光源（ＬＥＤ）
２２　　　光源ブロック
２２１　　　固定部
２２２　　　導光部
２２３　　　反射部
２３　　　黒色反射板（バックグラウンド）
２４　　　開口部
３　　　上部照明用筒体
３０　　　上部照明機構
３１　　　上部光源（ＬＥＤ）
３２　　　下側遮光ブロック
３２１　　　固定部
３２２　　　下側遮光部
３３　　　上側遮光ブロック
３３１　　　上側遮光部
３４　　　蓋体
３５　　　開口
４　　　透明カルトン
５　　　画像取得手段（センサ）
１０１　　　穀粒品位判別装置 DESCRIPTION OF SYMBOLS 1 Grain quality discrimination apparatus 2 Bottom lighting storage unit 20 Bottom lighting mechanism 21 Bottom light source (LED)
22 light source block 221 fixing part 222 light guiding part 223 reflecting part 23 black reflector (background)
24 Opening 3 Upper illumination tube 30 Upper illumination mechanism 31 Upper light source (LED)
32 Lower shading block 321 Fixed part 322 Lower shading part 33 Upper shading block 331 Upper shading part 34 Cover 35 Opening 4 Transparent carton 5 Image acquisition means (sensor)
101 Grain quality discriminator

Claims (9)

  1. 　透明な底面を有する試料皿に載置された穀粒に対し光を照射し、前記穀粒に光を透過させ、前記穀粒からの透過光に基づいて前記穀粒の外観品位を判別する穀粒品位判別装置であって、
    　前記試料皿の下方には光源を有する照明機構を配設し、
    　前記照明機構は、前記試料皿に載置された穀粒に対し間接光を照射することを特徴とする穀粒品位判別装置。     A grain that irradiates light to a grain placed on a sample dish having a transparent bottom surface, transmits light to the grain, and determines the appearance quality of the grain based on transmitted light from the grain. A grain quality determination device,
    An illumination mechanism having a light source is arranged below the sample dish,
    The grain quality discriminating apparatus, wherein the illumination mechanism irradiates the grain placed on the sample dish with indirect light.
  2. 　前記照明機構は前記試料皿の斜め下方に配設される光源ブロックを有し、前記光源は前記光源ブロックの内側に配設されてなり、
    　前記照明機構は、前記光源からの光を前記光源ブロックの内側で反射させ、前記試料皿に載置された穀粒に対し間接光として斜め下方から照射する請求項１記載の穀粒品位判別装置。     The illumination mechanism has a light source block disposed diagonally below the sample dish, and the light source is disposed inside the light source block,
    2. The grain quality discriminating apparatus according to claim 1, wherein the lighting mechanism reflects light from the light source inside the light source block and irradiates the kernel placed on the sample dish as indirect light from obliquely below. .
  3. 　前記光源ブロックは、前記光源が固定される固定部、前記固定部の上部に位置し前記試料皿の中心側へ延出して前記光源から前記試料皿の底部に向かう直接光を遮り反射させる導光部、前記固定部の下部に位置し前記光源からの直接光又は前記導光部からの反射光を反射させる反射部を有し、
    　前記照明機構は、前記光源からの光を前記光源ブロックの前記各部の内側面で反射させ、前記試料皿に載置された穀粒に対し間接光として斜め下方から照射する請求項２記載の穀粒品位判別装置。     The light source block includes a fixed portion to which the light source is fixed, a light guide positioned above the fixed portion, extending toward the center of the sample dish, and blocking and reflecting direct light from the light source toward the bottom of the sample dish. Part, having a reflecting portion that is located below the fixed portion and reflects direct light from the light source or reflected light from the light guide portion,
    The grain according to claim 2, wherein the illumination mechanism reflects light from the light source on inner surfaces of the respective portions of the light source block, and irradiates the grain placed on the sample dish as indirect light from obliquely below. Grain quality determination device.
  4. 　前記試料皿の下方にバックグラウンドとなる黒色反射板が配設される一方で、前記照明機構は、前記黒色反射板の外方に隣接して配設されてなり、前記光源ブロックの前記各部の内側面は白色とされる請求項３記載の穀粒品位判別装置。 While a black reflector serving as a background is provided below the sample dish, the illumination mechanism is provided adjacent to the outside of the black reflector, and each of the light source blocks has a light source. 4. The grain quality determination device according to claim 3, wherein the inner surface is white.
  5. 　前記照明機構は、前記試料皿の斜め下方に複数配設されてなり、前記光源からの光を前記試料皿に載置された穀粒に対し間接光として複数の方向から照射する請求項１乃至４のいずれかに記載の穀粒品位判別装置。 A plurality of the illumination mechanisms are arranged diagonally below the sample dish, and irradiate light from the light source to grains placed on the sample dish as indirect light from a plurality of directions. 5. The grain quality determination device according to any one of 4.
  6. 　前記穀粒品位判別装置は、透明な底面を有する試料皿に載置された穀粒に対し光を照射し、前記穀粒に光を透過及び／又は反射させ、前記穀粒からの透過光及び／又は反射光に基づいて、前記穀粒の外観品位を判別する穀粒品位判別装置であって、
    　前記試料皿の斜め上方に上部光源を有する上部照明機構を配設し、
    　前記上部照明機構は、前記上部光源が固定される固定部、前記上部光源の下方に位置し前記上部光源から前記試料皿に向かう直接光を遮り上方へ反射させる下側遮光部、前記上部光源の上方に位置し前記上部光源から上方へ向かう直接光及び前記下側遮光部で反射した反射光を遮り下方へ反射させる上側遮光部を有し、
    　前記上部照明機構は、前記上部光源からの光を前記各遮光部で反射させ、前記試料皿に載置された穀粒に対し間接光として斜め上方から照射する請求項１乃至５のいずれかに記載の穀粒品位判別装置。     The grain quality determination device irradiates light to a grain placed on a sample dish having a transparent bottom surface, transmits and / or reflects light to the grain, and transmits light and light from the grain. / Or a grain quality determination device that determines the appearance quality of the grain based on reflected light,
    Disposing an upper illumination mechanism having an upper light source diagonally above the sample dish,
    The upper illumination mechanism is a fixed portion to which the upper light source is fixed, a lower light-shielding portion that is located below the upper light source and blocks direct light from the upper light source toward the sample dish and reflects upward, An upper light-shielding portion that is located above and has an upper light-shielding portion that intercepts the direct light heading upward from the upper light source and the reflected light reflected by the lower light-shielding portion and reflects the light downward,
    The said upper illumination mechanism reflects the light from the said upper light source in each said light-shielding part, and irradiates the kernel mounted on the said sample dish as an indirect light from diagonally upward. A grain quality discriminating apparatus as described.
  7. 　前記上部照明機構は、筒体の内面に複数設けられ、前記上部光源からの光を前記試料皿に載置された穀粒に対し間接光として複数の方向から照射する請求項６記載の穀粒品位判別装置。 7. The kernel according to claim 6, wherein the upper illumination mechanism is provided on a plurality of inner surfaces of the cylindrical body, and irradiates light from the upper light source to the kernel placed on the sample dish as indirect light from a plurality of directions. 8. Quality determination device.
  8. 　前記各遮光部は黒色とされる一方で、前記筒体の内面は前記上側遮光部より下方が白色、前記上側遮光部より上方が黒色とされる請求項７記載の穀粒品位判別装置。 The grain quality discriminating device according to claim 7, wherein each of the light-shielding portions is black, while the inner surface of the cylindrical body is white below the upper light-shielding portion and black above the upper light-shielding portion.
  9. 　前記上側遮光部の上方であって前記筒体の内部に、円形状の開口を有し前記穀粒からの透過光及び／又は反射光の光量を調整する黒色遮光板を配設する請求項７又は８記載の穀粒品位判別装置。 8. A black light-shielding plate having a circular opening and adjusting the amount of transmitted light and / or reflected light from the grain is disposed above the upper light-shielding portion and inside the cylindrical body. Or a grain quality discriminating apparatus according to 8.
PCT/JP2019/030239 2018-08-09 2019-08-01 Grain quality determination device WO2020031847A1 (en)

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