TWI802732B - Grain quality distinguishing device - Google Patents
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Description
本發明關於將米、麥、豆、玉米等穀粒的外觀品級加以判別之穀粒品級判別裝置。尤其,本發明關於下述穀粒品級判別裝置:具備可避免光源顯映在樣品盤的底部之照明機構,且以良好精度判別前述樣品盤所載置之穀粒的外觀品級。 The present invention relates to a grain grade discriminating device for discriminating the appearance grades of grains such as rice, wheat, beans, and corn. In particular, the present invention relates to a grain grade judging device that has an illumination mechanism that prevents light from being reflected on the bottom of the sample tray, and that can judge the appearance grade of the grains placed on the sample tray with good accuracy.
往昔,普知有以下裝置:將光照射至穀粒,使前述光穿透前述穀粒及/或在前述穀粒反射,而基於來自前述穀粒之穿透光及/或反射光來判別前述穀粒的外觀品級(參照專利文獻1、2)。
In the past, the following devices have been widely known: irradiating light to grains, causing the light to penetrate the grains and/or reflect on the grains, and discriminate the light based on the transmitted light and/or reflected light from the grains. Appearance grades of grains (see
專利文獻1記載一種包含拍攝機構的裝置,具備上部拍攝照明單元、下部照明單元、將配置在此等之間之判別對象即任意數的穀粒加以載置之托盤,且從上部拍攝照明單元的上部發光部將光照射至前述托盤所載置之穀粒並利用上部拍攝照明單元拍攝其反射光、或從下部照明單元的下部發光部將光照射至前述
穀粒並利用上部拍攝照明單元拍攝其穿透光,取得來自前述穀粒之反射光或穿透光所成之影像資料。
又,專利文獻2記載有一種裝置,具備:基底構件;旋轉構件,在前述基底構件內配設成可旋轉,且在一側方具有光源;以及罩蓋構件,安裝在前述基底構件上而與該基底構件一起構成外框,並位在前述旋轉構件的上方,具有將載置穀粒之樣品盤加以承接之開口部;且將載置有複數穀粒之樣品盤設置在前述罩蓋構件的開口部,並藉由前述光源自斜下方將光照射至前述樣品盤的透明底面,自斜下方使光穿透前述樣品盤所載置之複數穀粒。
In addition,
依據上述專利文獻1所記載之裝置,則可利用將藉由拍攝機構取得之來自穀粒之反射光或穿透光所成之影像資料、及穀粒檢查用的基準影像資料加以比較,來判別前述穀粒的外觀品級。
According to the device described in the above-mentioned
又,依據上述專利文獻2所記載之裝置,則可從樣品盤的上方利用操作者的目視等來觀察穀粒內有無陰影而偵測胴裂米等。
Moreover, according to the device described in the above-mentioned
然而,專利文獻1所記載之裝置,係在下部發光部上將托盤加以載置之裝置,會有以下問題:前述下部發光部顯映在前述托盤的底部,對於由前述拍攝機構所取得之穀粒的影像資料造成影響,因此無法以良好精度判別穀粒的外觀品級。
However, the device described in
另一方面,專利文獻2所記載之裝置,將光源配設在樣品盤的下部側方,且從斜下方將光照射至前述樣品盤的底面,但於未將前述光源往前述樣品盤的側方拉遠配設之情形下,會有以下問題:前述光源顯映在前述樣品盤的底部,對於來自樣品盤的上方之操作者的目視等所行之穀粒觀察造成影響,因此無法正確偵測胴裂米等。
On the other hand, in the device described in
專利文獻1:日本特開2015-7606號公報 Patent Document 1: Japanese Patent Laid-Open No. 2015-7606
專利文獻2:日本特開2014-173884號公報 Patent Document 2: Japanese Patent Laid-Open No. 2014-173884
於是,本發明之目的係提供一種穀粒品級判別裝置,可利用避免光源顯映在透明樣品盤的底部,而以良好精度判別前述樣品盤所載置之穀粒的外觀品級。 Therefore, the object of the present invention is to provide a grain grade judging device, which can judge the appearance grade of the grains placed on the above-mentioned sample pan with good accuracy by avoiding the light source from being reflected on the bottom of the transparent sample pan.
為了達成上述目的,本發明的一實施形態係一種穀粒品級判別裝置,將光照射至具有透明底面之樣品盤所載置之穀粒,使光穿透前述穀粒,並基於來自前述穀粒的穿透光來判別前述穀粒的外觀品級,其特徵為,在前述樣品盤的下方配設具有光源之照明機構, 前述照明機構將間接光照射至前述樣品盤所載置之穀粒。 In order to achieve the above object, one embodiment of the present invention is a grain grade discrimination device, which irradiates light to the grains placed on a sample tray with a transparent bottom, so that the light penetrates the grains, and based on the The penetrating light of grains is used to judge the appearance grade of the aforementioned grains, which is characterized in that a lighting mechanism with a light source is arranged under the aforementioned sample plate, The aforementioned lighting mechanism irradiates indirect light to the grains placed on the aforementioned sample tray.
本發明的一實施形態宜如下。 One embodiment of the present invention is preferably as follows.
前述照明機構具有配設在前述樣品盤的斜下方之光源區塊,且前述光源配設在前述光源區塊的內側,前述照明機構使來自前述光源的光在前述光源區塊的內側反射,並作為間接光而從斜下方照射至前述樣品盤所載置之穀粒。 The lighting mechanism has a light source block arranged obliquely below the sample tray, and the light source is arranged inside the light source block, and the lighting mechanism reflects light from the light source on the inside of the light source block, and The grains placed on the sample pan were irradiated from obliquely below as indirect light.
本發明的一實施形態宜如下。 One embodiment of the present invention is preferably as follows.
前述光源區塊具備:固定部,固定前述光源;導光部,位在前述固定部的上部,且往前述樣品盤的中心側延伸,而將自前述光源朝往前述樣品盤的底部之直接光(直射光)加以遮擋並使其反射;以及反射部,位在前述固定部的下部,使來自前述光源之直接光、或來自前述導光部之反射光反射;且前述照明機構使來自前述光源的光在前述光源區塊的前述各部的內側面反射,並作為間接光而從斜下方照射至前述樣品盤所載置之穀粒。 The aforementioned light source block is provided with: a fixing part, which fixes the aforementioned light source; a light guide part, which is located on the upper part of the aforementioned fixing part, and extends toward the center side of the aforementioned sample tray, and directs the direct light from the aforementioned light source toward the bottom of the aforementioned sample tray. (direct light) to block and reflect it; and the reflecting part, located at the lower part of the aforementioned fixing part, reflects the direct light from the aforementioned light source or the reflected light from the aforementioned light guide part; and the aforementioned lighting mechanism makes the light from the aforementioned light source The light is reflected on the inner surfaces of the respective parts of the light source block, and is irradiated as indirect light to the grains placed on the sample tray from obliquely below.
本發明的一實施形態宜如下。 One embodiment of the present invention is preferably as follows.
在前述樣品盤的下方將成為背景之黑色反射板加以配設,且另一方面,將前述照明機構配設成鄰接於前述黑色反射板的外方,並將前述光源區塊的前述各部的內側面設成白色。 A black reflector serving as the background is arranged under the sample tray, and on the other hand, the lighting mechanism is arranged adjacent to the outside of the black reflector, and the inside of each part of the light source block is placed The sides are set to white.
本發明的一實施形態宜如下。 One embodiment of the present invention is preferably as follows.
前述照明機構係在前述樣品盤的斜下方配設複數個,將來自前述光源的光作為間接光而從複數方向照射至前述樣品盤所載置之穀粒。 The said illuminating means is arrange|positioned plurally at the oblique bottom of the said sample tray, and the light from the said light source is irradiated to the grain mounted on the said sample tray from a plurality of directions as indirect light.
本發明的一實施形態宜如下。 One embodiment of the present invention is preferably as follows.
前述穀粒品級判別裝置,將光照射至具有透明底面之樣品盤所載置之穀粒,使光穿透前述穀粒及/或在前述穀粒反射,並基於來自前述穀粒之穿透光及/或反射光來判別前述穀粒的外觀品級,其中,在前述樣品盤的斜上方配設具有上部光源之上部照明機構,前述上部照明機構具備:固定部,固定前述上部光源;下側遮光部,位在前述上部光源的下方,將自前述上部光源朝往前述樣品盤之直接光加以遮擋並使其往上方反射;上側遮光部,位在前述上部光源的上方,且將自前述上部光源朝往上方之直接光、及在前述下側遮光部反射之反射光加以遮擋並使其往下方反射;且前述上部照明機構使來自前述上部光源的光在前述各遮光部反射,並作為間接光而從斜上方照射至前述樣品盤所載置之穀粒。 The aforementioned grain grade discriminating device irradiates light onto the grains placed on the sample tray with a transparent bottom surface, makes the light penetrate the aforementioned grains and/or reflect on the aforementioned grains, and based on the penetration from the aforementioned grains Light and/or reflected light are used to judge the appearance grade of the above-mentioned grains, wherein, an upper lighting mechanism with an upper light source is arranged obliquely above the aforementioned sample tray, and the aforementioned upper lighting mechanism has: a fixing part for fixing the aforementioned upper light source; The side light-shielding part is located under the upper light source, and blocks the direct light from the upper light source toward the sample plate and makes it reflect upward; the upper side light-shielding part is located above the upper light source, and The direct light from the upper light source facing upward and the reflected light reflected by the lower light shielding part are blocked and reflected downward; Indirect light is irradiated from obliquely above to the grains placed on the sample tray.
本發明的一實施形態宜如下。 One embodiment of the present invention is preferably as follows.
前述上部照明機構係在一筒體的內面設置複數個,將來自前述上部光源之光作為間接光而從複數方向照射至前述樣品盤所載置之穀粒。 The above-mentioned upper lighting mechanism is provided with multiple ones on the inner surface of a cylindrical body, and the light from the above-mentioned upper light source is used as indirect light to irradiate the grains placed on the above-mentioned sample tray from multiple directions.
本發明的一實施形態宜如下。 One embodiment of the present invention is preferably as follows.
將前述各遮光部設成黑色,且另一方面,前述筒體的內面之中,將比前述上側遮光部更下方設成白色、比前述上側遮光部更上方設成黑色。 Each of the light-shielding parts is made black, and on the other hand, the inner surface of the cylindrical body is white below the upper side light-shielding part and black above the upper side light-shielding part.
本發明的一實施形態宜如下。 One embodiment of the present invention is preferably as follows.
在係前述上側遮光部的上方、且係前述筒體的內部配設:黑色遮光板,具有圓形之開口,且具有將來自前述穀粒之穿透光及/或反射光的光量加以調整之光圈功能。 Above the above-mentioned upper side light-shielding part, and inside the above-mentioned cylindrical body, a black light-shielding plate has a circular opening, and has a function to adjust the amount of transmitted light and/or reflected light from the aforementioned grains. Aperture function.
本發明的一實施形態之穀粒品級判別裝置,因為照明機構將來自光源的光作為間接光而從斜下方照射至樣品盤所載置之穀粒,所以可以避免光源顯映在前述樣品盤的底部。 In the grain grade discriminating device according to one embodiment of the present invention, since the illumination mechanism irradiates the light from the light source as indirect light to the grains placed on the sample tray from obliquely below, it is possible to prevent the light source from being reflected on the sample tray. bottom of.
因此,依據本發明的一實施形態之穀粒品級判別裝置,則可基於來自穀粒之穿透光而以良好精度判別樣品盤所載置之穀粒的外觀品級。 Therefore, according to the grain grade discriminating device of one embodiment of the present invention, based on the transmitted light from the grain, the appearance grade of the grain placed on the sample tray can be discriminated with good accuracy.
又,本發明的一實施形態的穀粒品級判別裝置,因為照明機構將來自光源的光作為間接光而從斜下方照射至樣品盤所載置之穀粒,所以不須為了避免光源顯映在前述樣品盤的底部而將前述照明機構從前述樣品盤的中心往側方拉遠配設。 In addition, in the grain grade discriminating device according to one embodiment of the present invention, since the lighting mechanism irradiates the grains placed on the sample tray from obliquely below with the light from the light source as indirect light, it is not necessary to avoid the reflection of the light source. On the bottom of the sample tray, the illumination mechanism is arranged sideways away from the center of the sample tray.
因此,依據本發明的一實施形態的穀粒品級判別裝置,則可防止為了避免光源顯映在樣品盤的底部而使裝置大型化。 Therefore, according to the grain grade discrimination|determination apparatus which concerns on one Embodiment of this invention, it can prevent that an apparatus enlarges in order to prevent a light source from being reflected on the bottom of a sample pan.
本發明的一實施形態之穀粒品級判別裝置,因為前述照明機構具有配設在前述樣品盤的斜下方之光源區塊,且前述光源配設在前述光源區塊的內側,前述照明機構將來自前述光源的光在前述光源區塊的內側反射,並作為間接光而從斜下方照射至前述樣品盤所載置之穀粒,所以前述照明機構可藉由簡單的構成將來自前述光源的光定為間接光。 In the grain grade discriminating device according to an embodiment of the present invention, since the lighting mechanism has a light source block arranged obliquely below the sample tray, and the light source is arranged inside the light source block, the lighting mechanism will The light from the light source is reflected on the inside of the light source block, and is irradiated obliquely from below to the grains placed on the sample tray as indirect light. Therefore, the lighting mechanism can transmit the light from the light source with a simple configuration. Defined as indirect light.
此外,本發明的一實施形態之穀粒品級判別裝置,因為將來自光源的光從斜下方照射至樣品盤所載置之穀粒,所以適宜偵測胴裂粒等。 In addition, the grain grade discriminating device according to one embodiment of the present invention is suitable for detecting cracked grains and the like because the light from the light source is irradiated obliquely downward to the grains placed on the sample tray.
本發明的一實施形態之穀粒品級判別裝置只要定為前述光源區塊具備:固定部,固定前述光源;導光部,位在前述固定部的上部,且往前述樣品盤的中心側延伸,而將自前述光源朝往前述樣品盤的底部之直接光(直射光)加以遮擋並使其反射;以及反射部,位在前述固定部的下部,使來自前述光源之直接光或來自前述導光部之反射光反射;且前述照明機構將來自前述光源的光在前述光源區塊的前述各部的內側面反射,並作為間接光而從斜下方照射至前述樣品盤所載置之穀粒,則可藉由前述導光部來縮小前述光源顯映在前述樣品盤的底部之範圍,所以可使裝置小型化。 The grain grade discriminating device of one embodiment of the present invention only needs to determine that the light source block has: a fixing part for fixing the light source; a light guide part located on the upper part of the fixing part and extending toward the center side of the sample tray , to block and reflect the direct light (direct light) from the aforementioned light source towards the bottom of the aforementioned sample plate; The reflected light of the light part is reflected; and the aforementioned lighting mechanism reflects the light from the aforementioned light source on the inner surface of each of the aforementioned parts of the aforementioned light source block, and irradiates the grains placed on the aforementioned sample tray from obliquely below as indirect light, Then, the range where the light source is reflected on the bottom of the sample plate can be narrowed by the light guide part, so the device can be miniaturized.
又,本發明的一實施形態之穀粒品級判別裝置,因為前述照明機構可將來自前述光源的光的大部份導光至前述光源區塊的前述反射部,所以可達成有效利用光。 In addition, in the grain grade discriminating device according to one embodiment of the present invention, since the lighting mechanism can guide most of the light from the light source to the reflection portion of the light source block, effective use of light can be achieved.
本發明的一實施形態之穀粒品級判別裝置只要定為在前述樣品盤的下方將成為背景之黑色反射板加以配設,且另一方面,將前述照明機構配設成鄰接於前述黑色反射板的外方,並將前述光源區塊的前述各部的內側面設成白色,則可藉由前述光源區塊的前述各部的白色的內側面而有效使前述光源的光反射,進行有效應用。又,自前述照明機構入射至成為背景之前述黑色反射板之光的大半部分係成為間接光,因此可避免來自前述黑色反射板之反射導致前述光源顯映在前述樣品盤的底部。 In the grain grade discrimination device according to one embodiment of the present invention, a black reflector serving as a background is arranged under the sample pan, and on the other hand, the illuminating mechanism is arranged adjacent to the black reflector. The outside of the board, and the inner surfaces of the aforementioned parts of the light source block are set to white, then the light of the aforementioned light source can be effectively reflected by the white inner surfaces of the aforementioned parts of the light source block for effective application. In addition, most of the light incident from the illuminating unit to the black reflection plate as the background is indirect light, so that reflection from the black reflection plate can prevent the light source from being reflected on the bottom of the sample plate.
本發明的一實施形態之穀粒品級判別裝置只要定為前述照明機構係在前述樣品盤的斜下方配設複數個,將來自前述光源的光作為間接光而從複數方向照射至前述樣品盤所載置之穀粒,則可無論穀粒的朝向如何而以良好精度偵測胴裂粒等。 In the grain grade discrimination device according to one embodiment of the present invention, as long as the illumination means are arranged in plural at the obliquely below the sample pan, the light from the light source is irradiated to the sample pan from plural directions as indirect light. The placed grains can detect cracked grains, etc. with good accuracy regardless of the orientation of the grains.
本發明的一實施形態之穀粒品級判別裝置只要定為上部照明機構使來自上部光源之光在下側遮光部及上側遮光部反射,並作為間接光而從斜上方照射至樣品盤所載置之穀粒,則可避免前述上部光源顯映在前述樣品盤。 In the grain grade discrimination device according to one embodiment of the present invention, the upper illuminating mechanism should reflect the light from the upper light source on the lower light shielding part and the upper light shielding part, and irradiate it as indirect light from obliquely above to the sample plate placed on it. grains, it can avoid the aforementioned upper light source from being reflected on the aforementioned sample plate.
因此,依據本發明的一實施形態之穀粒品級判別裝置,則可基於來自穀粒之穿透光及/或反射光而以良好精度判別樣品盤所載置之穀粒的外觀品級。 Therefore, according to the grain grade discriminating device of one embodiment of the present invention, the appearance grade of the grains placed on the sample tray can be discriminated with good accuracy based on the transmitted light and/or reflected light from the grains.
又,本發明的一實施形態之穀粒品級判別裝置只要定為上部照明機構將來自上部光源之光在各遮光部反射,並作為間接光而從斜上方照射至樣品盤所載 置之穀粒,則不須為了避免上部光源顯映在樣品盤的底部而將前述上部照明機構從前述樣品盤的中心往側方拉遠配設。 In addition, in the grain grade discriminating device according to one embodiment of the present invention, as long as the upper lighting mechanism reflects the light from the upper light source on each light-shielding part, and irradiates it as indirect light from obliquely above to the sample tray. If the grain is placed, it is not necessary to arrange the above-mentioned upper lighting mechanism from the center of the sample tray to the side in order to avoid the upper light source from being reflected on the bottom of the sample tray.
因此,依據本發明的一實施形態之穀粒品級判別裝置,則可防止為了避免光源顯映在樣品盤的底部而使裝置大型化。 Therefore, according to the grain grade discrimination device of one embodiment of the present invention, it is possible to prevent the size of the device from being reflected on the bottom of the sample pan in order to avoid the light source.
本發明的一實施形態之穀粒品級判別裝置只要定為前述上部照明機構係在筒體的內面設置複數個,將來自前述上部光源之光作為間接光而從複數方向照射至前述樣品盤所載置之穀粒,則可無論穀粒的朝向如何而以良好精度判別外觀品級。 The grain grade discriminating device according to one embodiment of the present invention is provided that the above-mentioned upper lighting mechanism is provided in plural on the inner surface of the cylinder, and the light from the above-mentioned upper light source is irradiated to the above-mentioned sample tray from a plurality of directions as indirect light. The placed grains can be used to judge the appearance grade with good accuracy regardless of the orientation of the grains.
本發明的一實施形態之穀粒品級判別裝置只要定為前述各遮光部係設成黑色,且另一方面,前述筒體的內面之中,將比前述上側遮光部更下方設成白色、比前述上側遮光部更上方設成黑色,則可藉由前述筒體之比前述上側遮光部更下方之白色的內面而有效應用前述各上部光源的光。又,本發明係從前述筒體的上方來將前述樣品盤所載置之穀粒的影像加以取得等,但因為藉由比前述上側遮光部更上方之黑色的內面來避免前述各上部光源的光繞進前述筒體的上方,所以可取得前述穀粒的鮮明影像。 In the grain grade discriminating device according to one embodiment of the present invention, it is only necessary that each of the light-shielding parts is set in black, and on the other hand, among the inner surfaces of the cylinder body, the lower part than the upper side light-shielding part is set in white. If the upper side of the upper side light shielding part is set to be black, the light of each of the aforementioned upper light sources can be effectively used by the white inner surface of the aforementioned cylindrical body below the aforementioned upper side light shielding part. Also, the present invention acquires the images of the grains placed on the sample tray from above the cylinder body, but because the black inner surface above the upper side light-shielding part prevents the above-mentioned upper light sources from being blurred. The light goes around the top of the aforementioned cylinder so that a sharp image of the aforementioned grains can be obtained.
本發明的一實施形態之穀粒品級判別裝置只要在係前述上側遮光部的上方、且係前述筒體的內部配設:黑色遮光板,具有圓形的開口,且具有將來自前述穀粒之穿透光及/或反射光的光量加以調整之光圈功能;則可於從前述筒體的上方將前述樣品盤所載置之穀粒的影像加以取得等之際,取得前述穀粒的鮮明影像。又,可利用變更前述黑色遮光板的前述開口的大小,而調整能取得 前述樣品盤所載置之穀粒的影像之範圍,因此有效避免前述光源或前述上部光源顯映在前述樣品盤的底部。 The grain grade discriminating device of one embodiment of the present invention is provided above the above-mentioned upper side light-shielding part and inside the above-mentioned cylindrical body: a black light-shielding plate has a circular opening, and has The aperture function to adjust the amount of transmitted light and/or reflected light; when the image of the grains placed on the sample plate is obtained from the top of the cylinder, the sharpness of the grains can be obtained. image. And, can utilize the size of the aforementioned opening of changing aforementioned black light-shielding plate, and adjustment can obtain. The scope of the image of the grains placed on the aforementioned sample tray effectively prevents the aforementioned light source or the aforementioned upper light source from being reflected on the bottom of the aforementioned sample tray.
藉由本發明,提供一種穀粒品級判別裝置,可利用避免光源顯映在透明樣品盤的底部,而以良好精度判別前述樣品盤所載置之穀粒的外觀品級。 According to the present invention, a grain grade judging device is provided, which can judge the appearance grade of the grains placed on the above-mentioned sample pan with high precision by avoiding the light source from being reflected on the bottom of the transparent sample pan.
1:穀粒品級判別裝置 1: Grain grade discrimination device
2:下部照明用收納部 2: Storage part for lower lighting
20:下部照明機構 20: Lower lighting mechanism
21:下部光源(LED) 21: Lower light source (LED)
22:光源區塊 22: Light source block
221:固定部 221: fixed part
222:導光部 222: Light guide part
223:反射部 223: Reflection Department
23:黑色反射板(背景) 23: Black reflector (background)
24:開口部 24: Opening
3:上部照明用筒體 3: Cylinder for upper lighting
30:上部照明機構 30: Upper lighting mechanism
31:上部光源(LED) 31: Upper light source (LED)
32:下側遮光區塊 32: Lower side shading block
321:固定部 321: fixed part
322:下側遮光部 322: lower side shading part
33:上側遮光區塊 33: Upper side shading block
331:上側遮光部 331: upper side shading part
34:蓋體 34: cover body
35:開口 35: opening
4:透明盆 4: transparent basin
5:影像取得機構(感測器) 5: Image acquisition mechanism (sensor)
101:穀粒品級判別裝置 101: Grain grade discrimination device
A-A:剖面線(表示圖3之剖面位置及觀察方向) A-A: section line (indicating the section position and viewing direction in Figure 3)
B-B:剖面線(表示圖5之剖面位置及觀察方向) B-B: section line (indicates the section position and viewing direction of Figure 5)
圖1係穀粒品級判別裝置的概略說明圖。 Fig. 1 is a schematic explanatory diagram of a grain grade discrimination device.
圖2係下部照明機構的說明圖。 Fig. 2 is an explanatory diagram of the lower lighting mechanism.
圖3係圖2的A-A剖視圖。 Fig. 3 is a sectional view of A-A of Fig. 2 .
圖4係上部照明機構的說明圖。 Fig. 4 is an explanatory diagram of the upper lighting mechanism.
圖5係圖4的B-B剖視圖。 Fig. 5 is a B-B sectional view of Fig. 4 .
圖6係下部照明機構的其它例的說明圖。 Fig. 6 is an explanatory diagram of another example of the lower lighting mechanism.
圖7係其它穀粒品級判別裝置的概略說明圖。 Fig. 7 is a schematic explanatory diagram of another grain grade discriminating device.
圖8係圖1之穀粒品級判別裝置的變形例的概略說明圖。 Fig. 8 is a schematic explanatory diagram of a modified example of the grain grade discriminating device of Fig. 1 .
基於圖式說明本發明的實施形態。 Embodiments of the present invention will be described based on the drawings.
圖1顯示本發明的實施形態中之穀粒品級判別裝置的概略說明圖。 Fig. 1 shows a schematic explanatory diagram of a grain grade discriminating device in an embodiment of the present invention.
圖1所示之穀粒品級判別裝置1具備下部照明用收納部2與上部照明用筒體3。
The grain grade discrimination|
前述下部照明用收納部2具有俯視下矩形狀之空間,且沿著側面而收納下部照明機構20。在此,顯示將二組下部照明機構20加以收納之例。
The lower
前述下部照明用收納部2的上部中央設有圓形的開口部24,且在前述開口部24上載置以透明材料形成之圓形的透明盆4。又,在係前述下部照明用收納部2的底部、且係前述透明盆4的下方將成為背景之黑色反射板23加以配設。
A
前述下部照明機構20配設在前述透明盆(具有透明底面之樣品盤)4的斜下方,且從斜下方將光照射至前述透明盆4所載置之穀粒。
The
前述下部照明機構20,如同後述圖8所示,亦可配設在前述透明盆4的正下。此情形下,將前述下部照明機構20定為利用與前述黑色反射板23成為同色之構件來構成,並發揮作為背景之功能之構成。
The aforementioned
前述上部照明用筒體3,係圓筒形狀,且在前述下部照明用收納部2的上部配設成係與前述開口部24呈同心狀。
The upper illuminating
前述上部照明用筒體3的內面設有上部照明機構30。在此,顯示圓周方向上設有四組(省略一組圖示)的上部照明機構30。
An
前述上部照明用筒體3之中,上部係由蓋體34所封閉,經由前述蓋體34的中央所設之開口35,而藉由照相機等影像取得機構(感測器)5來取得前述透明盆4上所載置之穀粒的影像資料。
Among the above-mentioned upper illuminating
前述上部照明機構30,配設在前述透明盆4的斜上方,從斜上方將光照射至前述透明盆4所載置之穀粒。
The above-mentioned
圖2係下部照明機構的說明圖,且顯示光源區塊。圖3顯示圖2的A-A剖視圖。 Fig. 2 is an explanatory diagram of the lower lighting mechanism, and shows a light source block. FIG. 3 shows a sectional view along line A-A of FIG. 2 .
前述下部照明機構20具有下部光源21與長條狀的光源區塊22。
The aforementioned
前述光源區塊22具有:固定部221,固定前述下部光源21;以及導光部222,位在前述固定部221的上部前端,且往前述透明盆4的中心側延伸,而將自前述下部光源21朝往前述透明盆4的底部之直接光(直射光)加以遮擋並使其朝往下方反射。
The aforementioned
又,前述光源區塊22具有:反射部223,位在前述固定部221的下部,且上表面朝往前述透明盆4的中心側而向下方傾斜,使來自前述下部光源21之直接光或來自前述導光部222之反射光反射。
Also, the aforementioned
前述下部照明機構20,使來自前述下部光源21之光在前述光源區塊22的前述各部反射,並自前述反射部223或經由前述黑色反射板23而作為間接光從斜下方照射至前述透明盆4所載置之穀粒。
The
前述下部照明機構20,可藉由前述導光部222而縮小前述下部光源21顯映在透明盆4的底部之範圍,因此有助於使裝置小型化。
The aforementioned
又,前述下部照明機構20,可將來自前述下部光源21之光的大部分導光至前述光源區塊22的前述反射部223,因此可達成有效利用光。
In addition, the
在此,前述光源區塊22之中,將前述固定部221、前述導光部222、及前述反射部223各部的內側面設成白色。
Here, in the
又,前述下部照明機構20,配設成鄰接於係前述下部照明用收納部2的底部、且係前述黑色反射板23的外方。
Moreover, the said
前述下部照明機構20,可藉由前述光源區塊22的前述各部之白色的內側面,而有效使前述下部光源21的光反射,進行有效應用。
The aforementioned
又,因為自前述下部照明機構20入射至前述黑色反射板23之光的大部分成為間接光,所以可避免來自前述黑色反射板23之反射導致前述下部光源21顯映在前述透明盆4的底部。
Also, because most of the light incident from the
前述下部照明機構20,只要具有一個以上的下部光源21即可,於具有複數下部光源21之情形下,則呈直線狀固定在前述光源區塊22的長邊方向即可。
The above-mentioned
又,前述下部光源21使用LED(發光二極體)光源,但亦可使用LED光源以外的光源。
Moreover, although the LED (light emitting diode) light source was used for the said lower
此外,前述下部照明機構20,將來自前述下部光源21之光從斜下方照射至透明盆4所載置之穀粒,因此適宜偵測胴裂粒等。
In addition, the aforementioned
圖4顯示上部照明機構的說明圖。圖5顯示圖4之B-B剖視圖。 Fig. 4 shows an explanatory view of the upper lighting mechanism. Fig. 5 shows a B-B sectional view of Fig. 4 .
前述上部照明機構30具備:上部光源31;下側遮光區塊32,固定在前述上部照明用筒體3的內面;以及上側遮光區塊33。
The
前述下側遮光區塊32具備:固定部321,固定前述上部光源31;以及下側遮光部322,呈L字狀設在前述固定部321的下部,且將自前述上部光源31朝往前述透明盆4之直接光加以遮擋並使其往上方反射。
The above-mentioned lower side light-shielding
前述下側遮光區塊32,在前述固定部321固定在前述上部照明用筒體3的內面。
The lower
前述上側遮光區塊33具備:上側遮光部331,設置成載置或固定在係前述上部光源31的上方、且係前述下側遮光區塊32的前述固定部321上,將自前述上部光源31朝往上方之直接光(直射光)、及在前述下側遮光部322反射之反射光加以遮擋並使其朝下方反射。
The above-mentioned upper side light-shielding
在此,前述上側遮光區塊33係使用定為在中央具有圓形的開口之一個環狀構件並係對於四個上部照明機構30而言共通者,但亦可使用係對於各上部照明機構30而言個別獨立者。
Here, the above-mentioned upper side light-shielding
前述上部照明機構30,使來自前述上部光源31的光在前述下側遮光區塊32及前述上側遮光區塊33的各遮光部322、331反射,並作為間接光而從斜上方照射至前述透明盆4所載置之穀粒,因此可避免前述上部光源31顯映在前述透明盆4的底部。
The
在此,將前述下側遮光區塊32及前述上側遮光區塊33設成黑色。
Here, the lower side light-shielding
又,前述上部照明用筒體3的內面之中,將比前述上側遮光區塊33(上側遮光部331)的下表面更下方設成白色,比前述上側遮光區塊33(上側遮光部331)的下表面更上方設成黑色。
Moreover, among the inner surfaces of the above-mentioned upper illuminating
前述上部照明機構30,可藉由前述上部照明用筒體3之比前述上側遮光區塊33的下表面更下方的白色的內面而有效應用前述各上部光源31的光。
The
又,雖然從前述上部照明用筒體3的上方經由前述蓋體34的中央所設之開口35而藉由照相機等影像取得機構5來取得前述透明盆4上所載置之穀粒的影像資料,但因為藉由比前述上側遮光區塊33的下表面更上方的黑色的內面來避免前述各上部光源31的光繞進前述上部照明用筒體3的上方,所以可取得前述穀粒的鮮明的影像資料。
Again, though the
此外,前述上部照明用筒體3使用圓筒形狀者,但亦可使用例如四角筒形狀等角筒形狀者。
In addition, although the
又,前述上部光源31使用LED(發光二極體)光源,但亦可使用LED光源以外的光源。
In addition, although LED (light emitting diode) light sources are used for the above-mentioned upper
說明本發明的實施形態中之穀粒品級判別裝置的作用。 The action of the grain grade discriminating device in the embodiment of the present invention will be described.
首先,將載置穀粒之透明盆4定為位在下部照明用收納部2的上部中央所設之開口部24上。
First, the
其次,在下部照明機構20及/或上部照明機構30,分別點亮下部光源21及/或上部光源31的LED,並將光照射至前述透明盆4所載置之前述穀粒,使光穿透前述穀粒及/或在前述穀粒反射。
Next, in the
而且,經由前述上部照明用筒體3之設在蓋體34的開口35,藉由影像取得機構5來取得前述透明盆4所載置之前述穀粒的穿透影像及/或反射影像。
And, through the
前述穀粒品級判別裝置1,藉由未圖示之微電腦,而基於前述取得之穿透影像而抽取外形形狀、面積、長度、寬度等形狀資訊、色彩(顏色資訊(R、G、B)、乳白色等)、胴裂等光學資訊,又基於前述取得之反射影像而抽取外形形狀、面積、長度、寬度等形狀資訊,然後基於前述抽取之形狀資訊、光學資訊來判別前述穀粒的外觀品級。
The aforementioned grain
前述下部照明機構20,因為將來自前述下部光源21的光作為間接光而從斜下方照射至前述透明盆4所載置之穀粒,所以可避免前述下部光源21顯映在前述透明盆4的底部。
The
又,前述上部照明機構30,因為將來自前述上部光源31的光作為間接光而從斜上方照射至前述透明盆4所載置之穀粒,所以可避免前述上部光源31顯映在前述透明盆4的底部。
Also, the above-mentioned
因此,依據前述穀粒品級判別裝置1,則可基於來自穀粒的穿透光及/或反射光而以良好精度判別前述透明盆4所載置之穀粒的外觀品級。
Therefore, according to the aforementioned grain
前述穀粒品級判別裝置1之中,因為前述下部照明機構20將來自前述下部光源21的光作為間接光而從斜下方照射至前述透明盆4所載置之穀粒,所以無須為了避免前述下部光源21顯映在前述透明盆4的底部而將前述下部照明機構20從前述透明盆4的中心往側方拉遠配設。
In the aforementioned grain
又,前述穀粒品級判別裝置1之中,因為前述上部照明機構30將來自前述上部光源31的光作為間接光而從斜上方照射至前述透明盆4所載置之穀粒,所以無須為了避免前述上部光源31顯映在前述透明盆4的底部而將前述上部照明機構30從前述透明盆4的中心往側方拉遠配置。
Also, in the above-mentioned grain
因此,依據前述穀粒品級判別裝置1,則可防止為了避免下部光源21及上部光源31顯映在透明盆4的底部而使裝置大型化。
Therefore, according to the said grain grade discrimination|
此外,前述穀粒品級判別裝置1,可在係前述上側遮光區塊33的上方、且係前述上部照明用筒體3的內部配設:黑色遮光板,具有圓形的開口,且具有將來自前述穀粒的穿透光及/或反射光的光量加以調整之未圖示之光圈功能。
In addition, the above-mentioned grain
前述穀粒品級判別裝置1只要在前述上部照明用筒體3的內部配設具有光圈功能之前述黑色遮光板,則於經由前述上部照明用筒體3之設在蓋體34的開口35而藉由影像取得機構5來取得前述透明盆4所載置之前述穀粒的穿透影像及/或反射影像之際,可取得前述穀粒的鮮明的影像。又,可利用變更具有光圈功能之前述黑色遮光板的前述開口的大小,而調整能將前述透明盆4所載置之穀粒的影像加以取得之範圍,因此有效於避免前述下部光源21或前述上部光源31顯映在前述透明盆4的底部。
As long as the above-mentioned grain
上述本發明的實施形態之中,以前述穀粒品級判別裝置1在前述下部照明用收納部2收納二組下部照明機構20之情形為例,但只要至少收納一組下部照明機構20即可。又,於前述下部照明用收納部2以90度等間隔收納四組下部照明機構20之情形下,若依序點亮四組前述下部照明機構20的光源而取得各穿透影像、或同時點亮四組前述下部照明機構20的光源而取得穿透影像,則可無論穀粒的朝向如何而以良好精度偵測胴裂粒等。
Among the above-mentioned embodiments of the present invention, the situation in which the aforementioned grain
圖6係下部照明機構的其它例的說明圖、且顯示光源區塊的剖視圖。 FIG. 6 is an explanatory diagram of another example of the lower lighting mechanism, and shows a cross-sectional view of a light source block.
圖6所示之下部照明機構20之中,光源區塊22的反射部223的上表面係與下部照明用收納部2的底部約略平行,此點係與圖2及圖3所示之下部照明機構20不同。
In the
圖6所示之下部照明機構20亦與圖2及圖3所示之下部照明機構20同樣,將來自下部光源21的光在前述光源區塊22的內側反射,並經由前述反射部223或黑色反射板23而作為間接光而從斜下方照射至透明盆4所載置之穀粒。
The
圖7顯示本發明其它實施形態中之穀粒品級判別裝置的概略說明圖。 Fig. 7 shows a schematic explanatory diagram of a grain grade discriminating device in another embodiment of the present invention.
圖7所示之穀粒品級判別裝置101具備下部照明用收納部2,且僅具備下部照明機構20,並不具備上部照明用筒體,此點係與圖1所示之穀粒品級判別裝置1不同。
The grain
圖7所示之穀粒品級判別裝置101係與日本特開2014-173884號公報所記載之裝置同樣合宜使用於目視所行之胴裂米等的檢查。
The grain
圖7所示之穀粒品級判別裝置101,亦將來自下部光源21的光作為間接光而從斜下方照射至透明盆4所載置之穀粒,因此可避免前述下部光源21顯映在前述透明盆4的底部,且可基於來自穀粒的穿透光而以良好精度判別前述穀粒的外觀品級。
The grain
圖8顯示圖1所示之穀粒品級判別裝置的變形例的概略說明圖。 Fig. 8 is a schematic explanatory diagram showing a modified example of the grain grade discriminating device shown in Fig. 1 .
圖8所示之穀粒品級判別裝置1之中,下部照明機構20係配設在透明盆4的正下,此點係與圖1所示之穀粒品級判別裝置不同。此情形下,前述下部照明機構20構成為:在內側將下部光源21加以固定之例如圓形的杯型的光源區塊22係呈顛倒狀收納在下部照明用收納部2,並將前述光源區塊22的外側面設成黑色而發揮作為背景之功能。前述下部照明用收納部2亦可定為具有俯視下圓形的空間。
Among the grain
圖8所示之穀粒品級判別裝置1之中,前述下部照明機構20使來自前述下部光源21的光在前述光源區塊22及前述下部照明用收納部2的內側面反射,並作為間接光而從下方照射至前述透明盆4所載置之穀粒。
In the grain
圖8所示之穀粒品級判別裝置1亦可避免前述下部光源21顯映在前述透明盆4的底部,因此可基於來自穀粒的穿透光而以良好精度判別前述穀粒的外觀品級。
The grain
此外,圖8所示之例之中,省略上部照明機構30,但亦可定為與圖1所示之穀粒品級判別裝置同樣在上部照明用筒體3的內面具備上部照明機構30。
In addition, in the example shown in FIG. 8 , the
又,圖8所示之穀粒品級判別裝置1亦可定為與圖7所示之穀粒品級判別裝置101同樣不具備上部照明用筒體3之構成。
Also, the grain
本發明的實施形態中之穀粒品級判別裝置,不限於判別米粒的外觀品級,可使用於判別各式各樣穀粒的外觀品級。 The grain grade discriminating device in the embodiment of the present invention is not limited to discriminating the appearance grade of rice grains, but can be used to discriminate the appearance grades of various grains.
本發明不限於上述實施形態,當可於不脫離發明範圍下合宜變更其構成。 The present invention is not limited to the above-mentioned embodiments, and its configuration can be appropriately changed without departing from the scope of the invention.
本發明之穀粒品級判別裝置,可利用避免光源顯映在透明樣品盤的底部,而以良好精度判別前述樣品盤所載置之穀粒的外觀品級,實用性優異。 The grain grade judging device of the present invention can judge the appearance grade of the grains placed on the sample tray with good accuracy by avoiding the light source being reflected on the bottom of the transparent sample tray, and has excellent practicability.
1:穀粒品級判別裝置 1: Grain grade discrimination device
2:下部照明用收納部 2: Storage part for lower lighting
20:下部照明機構 20: Lower lighting mechanism
23:黑色反射板(背景) 23: Black reflector (background)
24:開口部 24: Opening
3:上部照明用筒體 3: Cylinder for upper lighting
30:上部照明機構 30: Upper lighting mechanism
34:蓋體 34: cover body
35:開口 35: opening
4:透明盆 4: transparent basin
5:影像取得機構(感測器) 5: Image acquisition mechanism (sensor)
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW539853B (en) * | 2001-09-10 | 2003-07-01 | Yamagataken | Grain quality judging sample container, grain quality judger, grain quality judging system, grain image reading device, sample arraying jig for the grain image reading device, sample arraying method, and sample arrayer for the grain image reading device |
JP2014173884A (en) * | 2013-03-06 | 2014-09-22 | Satake Corp | Grain fluoroscope |
JP2015007606A (en) * | 2013-05-27 | 2015-01-15 | 株式会社ケット科学研究所 | Application program and storage medium for allowing operation panel information terminal to function as rice particle visual inspection means, as well as rice particle discrimination system by combination of imaging means and operation panel information terminal, and application program and storage medium for rice particle discrimination system |
TW201629473A (en) * | 2014-12-19 | 2016-08-16 | 佐竹股份有限公司 | Grain grading device |
TW201636601A (en) * | 2015-04-06 | 2016-10-16 | 佐竹股份有限公司 | Grain grading device and method of receiving light from grain in grain grading device |
JP2018084496A (en) * | 2016-11-24 | 2018-05-31 | 第一実業ビスウィル株式会社 | Visual inspection device |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10300679A (en) * | 1997-04-22 | 1998-11-13 | Satake Eng Co Ltd | Photodetector in granular object color-screening device |
JP2003057611A (en) * | 2001-08-13 | 2003-02-26 | San Contact Lens:Kk | Contact lens inspection device |
JP2007078581A (en) * | 2005-09-15 | 2007-03-29 | Shinko Seiki Co Ltd | Illumination device for visual inspection |
JP2008203093A (en) * | 2007-02-20 | 2008-09-04 | Mitsutoyo Corp | Illumination device and image measurement apparatus |
JP2009217222A (en) * | 2008-03-06 | 2009-09-24 | Takashi Goto | Observation base with reflection type transmissive illumination auxiliary device |
CN102714266B (en) * | 2011-01-14 | 2016-03-16 | 松下知识产权经营株式会社 | Illumination light source |
JP5973521B2 (en) * | 2014-10-15 | 2016-08-23 | 株式会社クボタ | Optical grain evaluation system |
EP3211469B1 (en) * | 2015-03-31 | 2019-09-25 | Olympus Corporation | Observation device and observation method |
-
2018
- 2018-08-09 JP JP2018150179A patent/JP6981381B2/en active Active
-
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- 2019-08-01 BR BR112021002386-0A patent/BR112021002386A2/en active Search and Examination
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- 2019-08-01 CN CN201980052351.8A patent/CN112534244A/en active Pending
- 2019-08-06 TW TW108127818A patent/TWI802732B/en active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW539853B (en) * | 2001-09-10 | 2003-07-01 | Yamagataken | Grain quality judging sample container, grain quality judger, grain quality judging system, grain image reading device, sample arraying jig for the grain image reading device, sample arraying method, and sample arrayer for the grain image reading device |
JP2014173884A (en) * | 2013-03-06 | 2014-09-22 | Satake Corp | Grain fluoroscope |
JP2015007606A (en) * | 2013-05-27 | 2015-01-15 | 株式会社ケット科学研究所 | Application program and storage medium for allowing operation panel information terminal to function as rice particle visual inspection means, as well as rice particle discrimination system by combination of imaging means and operation panel information terminal, and application program and storage medium for rice particle discrimination system |
TW201629473A (en) * | 2014-12-19 | 2016-08-16 | 佐竹股份有限公司 | Grain grading device |
TW201636601A (en) * | 2015-04-06 | 2016-10-16 | 佐竹股份有限公司 | Grain grading device and method of receiving light from grain in grain grading device |
JP2018084496A (en) * | 2016-11-24 | 2018-05-31 | 第一実業ビスウィル株式会社 | Visual inspection device |
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