WO2019138863A1 - 有機デバイス用電極基板材料 - Google Patents
有機デバイス用電極基板材料 Download PDFInfo
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- WO2019138863A1 WO2019138863A1 PCT/JP2018/047578 JP2018047578W WO2019138863A1 WO 2019138863 A1 WO2019138863 A1 WO 2019138863A1 JP 2018047578 W JP2018047578 W JP 2018047578W WO 2019138863 A1 WO2019138863 A1 WO 2019138863A1
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/26—Light sources with substantially two-dimensional radiating surfaces characterised by the composition or arrangement of the conductive material used as an electrode
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/26—Light sources with substantially two-dimensional radiating surfaces characterised by the composition or arrangement of the conductive material used as an electrode
- H05B33/28—Light sources with substantially two-dimensional radiating surfaces characterised by the composition or arrangement of the conductive material used as an electrode of translucent electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Definitions
- the present disclosure relates to electrode substrate materials for organic devices.
- organic electroluminescent (EL) elements have attracted attention as light sources of next-generation lighting devices.
- the organic EL element is provided with an organic light emitting layer between the anode and the cathode, and in the organic light emitting layer, holes and electrons are recombined, and light is emitted by the energy generated at this time.
- organic solar cells of the perovskite type and dye sensitization type are attracting attention as next-generation solar cell devices.
- An organic solar cell is provided with a photoelectric conversion layer between an anode and a cathode, and generates electricity by extracting electrons and holes excited by incident sunlight from the anode and the cathode.
- an electrode substrate material that can form an organic functional layer such as an organic light emitting layer and a photoelectric conversion layer, and can take out or take light is required.
- the electrode substrate material is required to have smoothness capable of forming an organic functional layer so as not to cause pinholes and the like, and in particular, to be free from steps and protrusions.
- the organic EL element and the organic solar cell are required to have a large area. In order to make the large area organic EL element emit light uniformly, it is important to be able to supply power to the entire surface of the device. In a large-area organic solar cell, it is important to efficiently transport excited electrons and holes in the device. Therefore, low surface resistance is required for the electrode substrate material.
- organic EL elements and organic solar cells are produced by the roll-to-roll process in order to improve productivity, and are also required to be able to be used after being molded on a curved surface, so high flexibility is also required for electrode substrate materials. Be
- an electrode substrate material for an organic device in which indium tin oxide (ITO) is laminated on a glass substrate, or an electrode substrate material for an organic device in which indium tin oxide (ITO) is laminated on a gas barrier film for example, , Patent Document 1.
- the electrode substrate material for organic devices which laminated indium tin oxide (ITO) on the glass substrate does not have flexibility, it can not be bent and it can not manufacture by roll-to-roll. Furthermore, in order to adapt to the coating process, it takes time to perform pretreatment for securing wettability.
- ITO indium tin oxide
- An electrode substrate material for an organic device in which indium tin oxide (ITO) is laminated on a gas barrier film or the like has a considerably high surface resistance as compared with a metal such as silver, aluminum or copper. Although it is possible to further bend, when the radius of curvature of bending is reduced, the ITO layer is cracked and the surface resistance is increased.
- ITO indium tin oxide
- the mesh-shaped wiring portion becomes a step.
- the metal deposition film is cracked and the surface resistance is increased, so that sufficient flexibility can not be obtained.
- An object of the present disclosure is to enable realization of an electrode substrate material for an organic device having high smoothness, low surface resistance, and high flexibility.
- One aspect of the electrode substrate material for organic devices of the present disclosure comprises a conductor layer made of a patterned metal foil and a planarizing layer provided around the conductor layer, and in the first surface, the conductor layer The surface is exposed from the planarizing layer, and the surface of the conductor layer and the surface of the planarizing layer form a continuous flat surface.
- the conductor layer forms a pattern having a line width of 20 ⁇ m or more and 200 ⁇ m or less, and the density of the conductor layer per unit area in the first surface is 15% or less it can.
- the planarization layer can include a gas barrier layer and a transparent resin layer, and the surface of the gas barrier layer and the exposed surface of the conductive layer can form a continuous smooth surface.
- the gas barrier layer includes at least one of a layer containing aluminum and oxygen as main components, and a layer containing silicon and at least one of nitrogen, oxygen and carbon as main components. Can be 20 nm or more.
- the planarization layer can have a transmittance of 85% or more for light with a wavelength of 400 nm to 800 nm.
- the transparent resin layer is made of polyethylene terephthalate (PET), polypropylene (PP), polyethylene (PE), polystyrene (PS), polycarbonate (PC), acrylic, polyvinyl chloride (PVC) And one or more selected from fluorine resin, indium tin oxide (ITO), and polyethylenedioxythiophene / polystyrene sulfonic acid (PEDOT / PSS).
- the conductor layer can be an aluminum foil having a thickness of 6 ⁇ m or more and 30 ⁇ m or less.
- the conductor layer may include a base pattern and a peripheral pattern which is provided outside the base pattern and can be connected to an external device.
- the surface of the conductor layer in the second surface opposite to the first surface, may be exposed from the planarization layer, and in the second surface, the conductor The surface of the layer may be covered by a planarization layer.
- the electrode substrate material for organic devices of the present disclosure high smoothness, low surface resistance and high flexibility can be realized.
- FIG. 3 is a cross-sectional view taken along line III-III in FIG. It is a top view which shows the modification of the pattern of a conductor layer. It is sectional drawing which shows the modification of the surface electrode material for organic EL elements. It is sectional drawing which shows the modification of the surface electrode material for organic EL elements. It is sectional drawing which shows the modification of the surface electrode material for organic EL elements. It is sectional drawing which shows the modification of the surface electrode material for organic EL elements. It is sectional drawing which shows the modification of the surface electrode material for organic EL elements. It is sectional drawing which shows the modification of the surface electrode material for organic EL elements.
- the electrode substrate material for organic devices of the present embodiment has a conductor layer 101 and a flattening layer 104, and can be used as an anode (front electrode) 202 of the organic EL element 200 as shown in FIG.
- the light emitting layer 201 is provided between the anode 202 and the cathode 203.
- the light generated in the light emitting layer 201 is output from the anode 202 side.
- the light emitting layer 201 includes the hole injection layer, the hole transport layer, the electron injection layer, the electron transport layer, the charge confinement layer, and the like in addition to the organic light emitting layer. It means the whole layer formed by vapor deposition or application between them.
- the electrode substrate material 100 for an organic device includes a conductor layer 101 made of patterned metal foil, and a planarization layer 104 provided around the conductor layer 101. Is equipped. In the first surface 111, the surface of the conductor layer 101 is exposed from the planarization layer 104, and the surface of the conductor layer 101 and the surface of the planarization layer 104 form a continuous flat surface. Therefore, the organic functional layer and the like can be easily formed on the first surface.
- the electrode substrate material for an organic device of the present embodiment is composed of the conductor layer 101 whose surface is a metal foil and the planarization layer 102, and there is no ITO layer, so that the coating property can be easily improved. Therefore, when manufacturing an organic device by the apply
- the conductor layer 101 of this embodiment is made of a metal foil patterned in a predetermined shape.
- the conductor layer 101 made of metal foil is different from the conductor layer made of a metal vapor deposition film or the like, and is hardly broken even when bent, so that sufficient flexibility can be realized.
- the conductor layer 101 abuts on the light emitting layer 201 of the organic EL element, and applies a voltage to the light emitting layer 201.
- the metal foil used as the conductor layer 101 is not particularly limited, and may be, for example, an aluminum foil, a copper foil, a gold foil, or a silver foil. Among them, aluminum foil which is light in weight, hard to cause deep oxidation, and has high light reflectivity is preferable.
- the metal foil used as the conductor layer 101 may have a metal thin film made of at least one of nickel, copper, silver, platinum, gold and the like formed on the surface by plating or evaporation.
- the pattern of the conductor layer 101 can be designed according to the characteristics required for the electrode substrate material 100 for an organic device.
- a known front electrode pattern adopted as an electrode of an organic device such as lattice, mesh, spiral, stripe, meander, and other irregular shapes can be adopted.
- the pattern of the conductor layer 101 can include not only the base pattern 121 serving as one electrode of the organic device but also the peripheral pattern 122 provided on the outer side of the base pattern 121, as shown in FIG.
- the peripheral pattern 122 is a second peripheral pattern for connecting the first peripheral pattern 122A connecting the substrate pattern and the terminal 124, the electrode 123 provided on the surface opposite to the substrate pattern 121 of the organic device, and the terminal 124.
- the terminal 124 can be connected to an external device or the like.
- the peripheral pattern 122 can be directly connected to an external device or the like without using the terminal 124.
- the external device can be, for example, a power supply unit that supplies power to the organic device.
- the thickness of the conductor layer 101 is not particularly limited, but is preferably 6 ⁇ m or more from the viewpoint of securing the flexibility and the viewpoint of reducing the surface resistance. Moreover, from a viewpoint of improving light transmittance, 30 micrometers or less are preferable.
- the line width of the conductor layer 101 is not particularly limited, but is preferably 20 ⁇ m or more from the viewpoint of reducing the surface resistance, and is preferably 200 ⁇ m or less from the viewpoint of reducing the light emission unevenness. From the viewpoint of securing light transmittance, the density of the conductor layer per unit area in the first surface 111 is preferably 15% or less.
- planarized layer is provided around the conductor layer 101 so as to fill the opening of the patterned conductor layer 101. In at least the first surface 111, the planarization layer 102 does not cover the conductor layer 101, and the surface of the conductor layer 101 is exposed.
- the surface of the conductor layer 101 and the surface of the planarization layer 102 form a continuous flat surface.
- the surface of the conductor layer 101 and the surface of the planarizing layer 102 are continuous surfaces without steps at their boundary portions, and the entire first surface 111 is flat. Since the first surface 111 is such a continuous flat surface, the uniform light emitting layer 201 can be formed on the surface of the electrode substrate material for an organic device of the present embodiment.
- the first surface 111 may be in close contact with the entire surface of the light emitting layer 201, but the difference in level at the boundary between the surface of the conductor layer 101 and the surface of the planarization layer 102 is preferably 300 nm or less.
- the planarizing layer 102 may be transparent as viewed by eye, but preferably has a transmittance of 85% or more at a wavelength of 400 nm to 800 nm. By setting the transmittance of the planarizing layer in this range, the light emission efficiency can also be improved.
- the composition is not limited as long as the planarization layer 102 can be transparent.
- transparent resins such as polyethylene terephthalate (PET), polypropylene (PP), polyethylene (PE), polystyrene (PS), polycarbonate (PC), acrylic, polyvinyl chloride (PVC), and fluorine resin can be used. These resins can be used alone or in combination of two or more.
- transparent conductive materials such as indium tin oxide (ITO) or polyethylenedioxythiophene / polystyrene sulfonic acid (PEDOT / PSS) can also be used.
- the planarization layer 102 may be a single layer or a plurality of layers. By forming the planarization layer 102 into a plurality of layers having different refractive indices, light diffusion can be controlled, total reflection can be reduced, and light extraction efficiency can be improved.
- the planarization layer 102 may cover the conductor layer 101.
- the second surface 112 is preferably a flat surface from the viewpoint of light extraction, but may have unevenness.
- FIG. 6 it is possible to have a configuration in which unevenness corresponding to the pattern of the conductor layer 101 is present on the second surface 112.
- the thickness of the planarization layer 102 is the same as the thickness of the conductor layer 101 when the conductor layer 101 is exposed also on the second surface 112.
- it may be thicker than the conductor layer 101, but it is preferably 60 ⁇ m or less from the viewpoint of flexibility and light transparency.
- the transparent support 105 can be bonded to the second surface 112 side. By bonding the transparent support 105, the strength of the surface electrode material 100 for an organic EL element can be increased.
- the transparent support 105 is not particularly limited, and examples thereof include polyethylene terephthalate (PET), polypropylene (PP), polyethylene (PE), polystyrene (PS), polycarbonate (PC), acrylic, polyvinyl chloride (PVC), glass and the like. can do.
- the transparent support can also be a layer having an antireflective function.
- a black protective layer 106 can be provided on the second surface 112 side so as to hide the conductor layer 101.
- the black protective layer 106 can be provided on the back surface of the conductor layer 101, it becomes difficult to see the pattern of the conductor layer 101 when the organic device is viewed from the front side, and the design is improved. Note that both the transparent support 105 and the protective layer 106 can be provided.
- the protective layer 106 can be formed, for example, by using a black dry film resist used in an etching process described later, and using the dry film resist remaining after exposure and development without removing after etching.
- the surface resistance can be made lower and the flexibility can be enhanced as compared with the conventional electrode substrate material for an organic device.
- the planarization layer 102 can also be configured to include the gas barrier layer 103 and the transparent resin layer 104.
- the organic light emitting layer and the photoelectric conversion layer of the organic device are weak to water vapor, and even a slight amount of water vapor is deteriorated. For this reason, the organic light emitting layer and the photoelectric conversion layer are sealed with glass, metal, a gas barrier film or the like. However, the prevention of water vapor on the electrode substrate side may not be sufficient. When the electrode substrate material has the water vapor barrier property 103, the water vapor does not easily enter from the electrode substrate side, and the deterioration of the organic functional layer can be suppressed.
- the gas barrier layer 103 may be formed of any material as long as it has high transparency and water vapor barrier properties.
- an atomic deposition method can form a layer containing aluminum and oxygen as main components.
- a layer containing silicon, nitrogen, oxygen and carbon as main components can be formed by a chemical vapor deposition (CVD) method.
- the gas barrier layer 103 is not limited to one layer, and may be a laminate of a plurality of layers.
- the thickness of the gas barrier layer 103 is preferably 20 nm or more from the viewpoint of preventing water vapor.
- the surface of the conductor layer 101 and the surface of the gas barrier layer 103 can form a continuous flat surface.
- the difference in level at the boundary between the surface of the conductor layer 101 and the surface of the gas barrier layer 103 is preferably 300 nm or less. Note that the thickness of the transparent resin layer 104 can be thinner than the thickness of the conductor layer 101.
- the electrode substrate material 100 for an organic device of the present embodiment can be formed, for example, as follows.
- a metal foil 302 to be a conductor layer is laminated on a substrate 301 having a smooth surface and having poor adhesion to resin and metal.
- the base material having poor adhesion refers to a base material having the ability to be easily separated even when resin or metal contacts.
- the substrate may be formed of a material which itself has low adhesion, or may be provided with a low adhesion coating layer on the surface.
- a substrate one or more of polyethylene terephthalate (PET), polypropylene (PP), polyethylene (PE), polystyrene (PS), polycarbonate (PC), acrylic and polyvinyl chloride (PVC), etc. are used as able to.
- the metal foil 302 is made of the material and thickness capable of forming the conductor layer 101 described above. From the viewpoint of improving the adhesion between the light emitting layer 201 and the conductor layer 101 formed of the metal foil 302, the surface to be bonded to the base material 301 of the metal foil 302 is preferably smooth, and specifically the arithmetic average roughness It is preferable that (Ra) is 50 nm or less.
- (Ra) is 50 nm or less.
- stacked on the surface of the base material 301 is patternized, and the conductor layer 101 is formed.
- the patterning of the metal foil 302 can be performed, for example, by a known method such as wet etching or dry etching.
- the pattern formed by etching can adopt the known electrode pattern adopted as the electrode of the organic device as described above.
- a pattern having a base pattern 121 and a peripheral pattern 122 as shown in FIG. 4 can also be used.
- a transparent material is applied to form a planarization layer 102.
- the transparent material may be a material as described above, and in the case of a material having fluidity at normal temperature, coating can be performed using, for example, a coater.
- the material having fluidity at normal temperature is, for example, a resin having fluidity by dissolving in a solvent, a resin having fluidity at a specific temperature condition, a resin having fluidity at normal temperature and curable by heat or light, etc. And so on.
- the base material 301 is peeled off. It becomes possible to peel easily by making a base material hard to adhere.
- the conductor layer 101 is exposed without being covered by the planarization layer 102 on the first surface formed by peeling the base material 301.
- the first surface is a surface to which the surface state of the base material 301 has been transferred. By using the substrate 301 having a smooth surface, a smooth first surface can be obtained.
- the transparent support 105 can also be bonded together.
- the planarization layer 102 can also be configured to include the gas barrier layer 103 and the transparent resin layer 104.
- the gas barrier layer 103 covers both the portion from which the metal foil 302 is removed and the portion from which the metal foil 302 remains on the surface of the substrate 301 after the conductor layer 101 is formed.
- the gas barrier layer 103 can be formed of a material having a high water vapor barrier property.
- a layer mainly composed of aluminum and oxygen eg, a layer composed of Al 2 O 3 or the like
- silicon is formed by a chemical vapor deposition (CVD) method.
- a layer containing, as a main component, at least one of nitrogen, oxygen, and carbon may be formed. Moreover, the laminated body which combined these layers can also be formed.
- a transparent material is applied on the surface of the gas barrier layer 103 to form a transparent resin layer 104.
- FIG. 10B shows an example in which the transparent resin layer 104 completely fills the recess, the recess may not be completely filled.
- the transparent resin layer 104 can completely cover the gas barrier layer 103.
- a first surface which is a flat surface in which the surface of the conductor layer 101 and the surface of the gas barrier layer 103 are continuous is exposed.
- the manufacturing method of the electrode substrate material for organic devices is not limited to such a method, and it may be formed by another method as long as the first surface can be made flat.
- the electrode substrate material for an organic device of the present disclosure will be described in more detail using examples.
- the following examples are illustrative and are not intended to limit the present invention.
- Evaluation of the smoothness of the electrode substrate material for organic devices is made by observing the surface asperity shape with a field of view of 2.2 mm ⁇ 2.2 mm using Nikon Corporation high-resolution non-contact three-dimensional surface shape measurement system BW-D500 The maximum height Sz in the plane was measured.
- the maximum height Rz defined in JIS-B 0601-2001 is a value calculated by expanding in three dimensions so as to be applicable to the entire observed surface.
- a sample having a smoothness of Sz 200 nm or less was regarded as good ( ⁇ ), and a sample having a smoothness exceeding 200 nm was regarded as defective (x).
- the evaluation of the water vapor barrier property of the electrode substrate material for organic devices is the water vapor permeability defined by JIS K 7129-7: 2016. The sample was placed on the deposited metallic calcium and calculated by calculating from the area of the corroded calcium after 100 hours under an environment of 40 ° C. and 90%.
- the surface resistance of the electrode substrate material for organic devices is measured by using a resistance meter (RD701 DIGITALMULTIMETER, manufactured by Sanwa Denki Keiki Co., Ltd.) to measure the resistance between two corner points on the diagonal of a 50 mm ⁇ 50 mm sample. I asked for. A surface resistance of 10 ⁇ / cm or less was regarded as good ( ⁇ ), and a surface resistance exceeding 10 ⁇ / cm 2 was regarded as defective ( ⁇ ).
- RD701 DIGITALMULTIMETER manufactured by Sanwa Denki Keiki Co., Ltd.
- Example 1 Apply a poorly adhering adhesive to one surface (main surface) of an aluminum foil (1N30, manufactured by Toyo Aluminum Co., Ltd., made by Toyo Aluminum Co., Ltd.) having a thickness of 3 cm ⁇ 3 cm and a thickness of 15 ⁇ m (arithmetic mean roughness Ra: 7 nm) After drying, a substrate was attached to the coated surface on the side of the adhesive and aged at 50 ° C. for 4 days. The substrate was a 38 ⁇ m thick PET film (manufactured by Teijin Films Solutions Ltd.).
- an alkaline development type dry film resist with a thickness of 15 ⁇ m is attached to the back surface of the aluminum foil, exposed to ultraviolet light (UV) using a mesh-shaped photomask, and developed. Etching was performed using an iron (II) aqueous solution to form a conductor layer.
- the conductor layer had a line width of 75 ⁇ m, a grid of 1500 ⁇ m in pitch, and a wiring density of 10%.
- a SiN film is formed to a thickness of 150 nm using plasma CVD on both the removed portion and the remaining portion of the aluminum foil by etching, and then an Al 2 O 3 film is formed to a thickness of 20 nm by atomic deposition.
- a gas barrier layer was formed.
- an epoxy resin having an average value of 90% of transmittance at a wavelength of 400 to 800 nm is applied so that the film thickness from the surface on which the gas barrier layer is formed is 20 ⁇ m. It applied so that the unevenness
- a commercially available antireflective film with a thickness of 30 ⁇ m was attached as a transparent support, and dried at 100 ° C. After this, the base material was peeled off to obtain an electrode substrate material for an organic device.
- the smoothness of the obtained electrode substrate material for an organic device is Rz 127 nm, the water vapor barrier property is 10 ⁇ 5 g / m 2 / day or less, and the surface resistance is 0.02 ⁇ / cm 2, and after bending test The surface resistance did not change.
- An organic EL light-emitting device was formed in which the target sample was used as an anode.
- the formation of the device was performed as follows. First, polyethylenedioxythiophene-polystyrene sulfonate (PEDOT / PSS, manufactured by sigma aldrich) was spin-coated on a target sample using a spin coater (Miniasa Inc., SpinCoater MS-A150) at 3000 rpm and dried in the air.
- PEDOT / PSS polyethylenedioxythiophene-polystyrene sulfonate
- a voltage of 7 V is applied to the obtained element to cause light emission, and the luminance with respect to the current and voltage is measured using a luminance meter (color luminance meter CS-200 manufactured by Konica Minolta), and the luminance per 1 A is determined as the luminous efficiency. As a result, it was 0.9 cd / A.
- electrode substrate materials for organic devices at a wavelength of 254 nm and illuminance of 10.0 mW / cm 2 for 1 minute, 5 minutes, and 10 minutes.
- UV ozone cleaning was performed, and each was evaluated by the wetting tension test method defined in JIS-K-6768-1999, 63 mN / m for 1 minute, 73 mN / m for 5 minutes, and 73 mN / m for 10 minutes. there were.
- Example 2 The same process as in Example 1 was performed except that the aluminum foil was a copper foil having a thickness of 15 ⁇ m (purity 99.96%) and the epoxy resin was an acrylic resin.
- the smoothness of the obtained electrode substrate material for an organic device is Rz 72 nm, the water vapor barrier property is 10 -5 g / m 2 / day or less, the surface resistance is 0.01 ⁇ / cm 2 , and after bending test Surface resistance did not change.
- an organic EL light emitting device having the target sample as an anode was formed in the same manner as in Example 1, and the luminous efficiency was measured, to be 1.4 cd / A.
- the wetting tension after UV ozone cleaning was evaluated in the same manner as in Example 1, it was 67 mN / m at 1 minute, 73 mN / m at 5 minutes, and 73 mN / m at 10 minutes.
- Example 3 The process of Example 1 was repeated except that the line width of the conductive layer was 100 ⁇ m, the pitch was 2000 ⁇ m, and the wiring density was 9%.
- the smoothness of the obtained electrode substrate material for an organic device is Rz 158 nm, the water vapor barrier property is 10 -5 g / m 2 / day or less, the surface resistance is 0.01 ⁇ / cm 2 , and after bending test Surface resistance did not change.
- an organic EL light emitting element was formed in which the target sample was used as an anode in the same manner as in Example 1, and the luminous efficiency was measured, to be 1.0 cd / A.
- the wetting tension after UV ozone cleaning was evaluated in the same manner as in Example 1, it was 63 mN / m at 1 minute, 73 mN / m at 5 minutes, and 73 mN / m at 10 minutes.
- Example 4 An electrode substrate material for an organic device was obtained in the same manner as in Example 1 except that the gas barrier layer was not formed, that is, the portion from which the aluminum foil was removed by etching and the surface having the conductor layer were directly filled with the epoxy resin.
- the smoothness of the obtained electrode substrate material for an organic device was Rz 127 nm, the surface resistance was 0.02 ⁇ / cm 2 , and the surface resistance after the bending test did not change.
- the water vapor barrier property was 5.68 g / m 2 / day.
- Example 2 an organic EL light-emitting device was formed using the target sample as an anode, and the luminous efficiency was measured, to be 0.9 cd / A.
- the wetting tension after UV ozone cleaning was evaluated in the same manner as in Example 1, it was 68 mN / m at 1 minute, 68 mN / m at 5 minutes, and 73 mN / m at 10 minutes.
- Example 5 An epoxy resin is directly filled in the area where the gas barrier layer is not formed, that is, the portion where the aluminum foil is removed by etching and the surface where the conductor layer is present, and the transparent support is 75 ⁇ m thick and has a water vapor transmission rate of 4 ⁇ 10 -4 g /
- An electrode substrate material for an organic device was obtained in the same manner as in Example 1 except that a commercially available gas barrier film of m 2 / day was used.
- the smoothness of the obtained electrode substrate material for an organic device was Rz 142 nm, the surface resistance was 0.02 ⁇ / cm 2 , and the surface resistance after the bending test did not change.
- the water vapor barrier property was 3 ⁇ 10 ⁇ 2 g / m 2 / day.
- Example 2 an organic EL light-emitting device was formed using the target sample as an anode, and the luminous efficiency was measured, which was 0.5 cd / A.
- the wetting tension after UV ozone cleaning was evaluated in the same manner as in Example 1, it was 66 mN / m at 1 minute, 73 mN / m at 5 minutes, and 73 mN / m at 10 minutes.
- An electrode substrate material for an organic device was obtained by laminating indium tin oxide (ITO) with a film thickness of 155 nm on a glass substrate by a sputtering method.
- ITO indium tin oxide
- the smoothness of the obtained electrode substrate material for an organic device was Rz: 17 nm, the water vapor barrier property was 10 ⁇ 5 g / m 2 / day or less, but the surface resistance was 0.68 ⁇ / cm 2 , Even if it was slightly bent, the glass substrate broke.
- an organic EL light-emitting device was formed in which the target sample was used as an anode in the same manner as in Example 1, and the luminous efficiency was measured, to be 5.2 cd / A.
- the wetting tension after UV ozone cleaning was evaluated in the same manner as in Example 1, it was 48 mN / m at 1 minute, 61 mN / m at 5 minutes, and 67 mN / m at 10 minutes.
- Electrode substrate for organic devices by depositing indium tin oxide (ITO) with a film thickness of 120 nm by sputtering on a commercially available gas barrier film with a thickness of 75 ⁇ m and a water vapor transmission rate of 4 ⁇ 10 -4 g / m 2 / day I got the material.
- ITO indium tin oxide
- the obtained electrode substrate material for organic devices had a smoothness of Rz: 58 nm, a water vapor barrier property of 1 ⁇ 10 ⁇ 4 g / m 2 / day, and a surface resistance of 9.40 ⁇ / cm 2 . After the bending test, the resistance increased sharply to 2296.00 ⁇ / cm 2 .
- Example 1 an organic EL light emitting element was formed in which the target sample was an anode, but no light was emitted.
- the wetting tension after UV ozone cleaning was evaluated in the same manner as in Example 1, it was 52 mN / m at 1 minute, 58 mN / m at 5 minutes, and 62 mN / m at 10 minutes.
- the crystallinity of the ITO film formed on the film was poor, and the surface resistance increased. Although it can be bent because it is a film, when it was bent with a small radius of curvature, the ITO film was cracked and resistance increased. In addition, a long pretreatment time was required to improve the wetting tension.
- a commercially available acrylic adhesive is applied to one surface (main surface) of an aluminum foil (1N30 manufactured by Toyo Aluminum Co., Ltd., made by Toyo Aluminum Co., Ltd.) of 3 cm ⁇ 3 cm and a thickness of 15 ⁇ m (Ra: 7 nm).
- a commercially available gas barrier film having a thickness of 75 ⁇ m and a water vapor transmission rate of 4 ⁇ 10 ⁇ 4 g / m 2 / day was laminated to the above.
- a commercially available dry film is attached to the back of the aluminum foil, exposed and developed under UV conditions using a mesh-shaped photomask, and the portion where the dry film is not left is an aqueous solution of iron (II) chloride Thin lines were formed by etching, and the dry film was peeled off with a sodium hydroxide aqueous solution to obtain a front electrode material for an organic EL element.
- the water vapor barrier property of the obtained electrode substrate material for organic devices was 4 ⁇ 10 -4 g / m 2 / day, but the surface resistance was 0.04 ⁇ / cm 2 , and the resistance value after the bending test changed Although it did not do, smoothness was Rz: 1621 nm.
- Example 1 an organic EL light emitting device was formed in which the target sample was an anode, but no light was emitted.
- the wetting tension after UV ozone cleaning was evaluated in the same manner as in Example 1, it was 70 mN / m at 1 minute, 73 mN / m at 5 minutes, and 73 mN / m at 10 minutes.
- the conductor layer is formed of aluminum foil, there is no problem in surface resistance and flexibility, etc. However, since the planarization layer is not formed, a level difference is generated and the smoothness is poor.
- Aluminum was vapor-deposited on a commercially available gas barrier film having a thickness of 75 ⁇ m and a water vapor transmission rate of 4 ⁇ 10 ⁇ 4 g / m 2 / day to form an aluminum vapor-deposited film having a thickness of 300 nm.
- a commercially available dry film is attached to the surface of the aluminum deposition film, exposed by UV using a mesh-shaped photomask, developed, and the portion where the dry film is not left is etched using an aqueous solution of iron (II) chloride Done and patterned. Thereafter, the dry film was peeled using a sodium hydroxide aqueous solution to obtain an electrode substrate material for an organic device.
- the water vapor barrier property of the obtained electrode substrate material for organic devices was 4 ⁇ 10 ⁇ 4 g / m 2 / day, and the surface resistance was 0.42 ⁇ / cm 2, but the resistance value after bending test was 12.6 ⁇ In addition to having increased to / cm 2 , the smoothness was Rz: 343 nm.
- Example 1 an organic EL light emitting device was formed in which the target sample was an anode, but no light was emitted.
- the wetting tension after UV ozone cleaning was evaluated in the same manner as in Example 1, it was 50 mN / m at 1 minute, 73 mN / m at 5 minutes, and 73 mN / m at 10 minutes.
- the conductor layer was formed of an aluminum vapor deposition film, the conductor layer was cracked after 50 bending tests, and the surface resistance increased. Moreover, since the level
- Table 1 summarizes the results of each example and comparative example.
- the electrode substrate material for an organic device of the present disclosure can realize high smoothness, gas barrier properties, light transmittance, low surface resistance and high flexibility, and shorten the time for pretreatment in the coating process, and can use the electrode for an organic device. It is useful as a material.
- Electrode substrate material 101 for organic devices conductive layer 102 planarizing layer 103 gas barrier layer 104 transparent resin layer 105 transparent support 106 protective layer 111 first surface 112 second surface 121 base pattern 122 peripheral pattern 122 A first peripheral pattern 122 B Second Peripheral Pattern 123 Electrode 124 Terminal 200 Organic EL Element 201 Light Emitting Layer 202 Electrode 203 Electrode 301 Base Material 302 Metal Foil
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Abstract
Description
本実施形態の導体層101は、所定形状にパターン化された金属箔からなる。金属箔からなる導体層101は、金属蒸着膜等からなる導体層と異なり、折り曲げても断線しにくいために、十分なフレキシブル性を実現することができる。導体層101は、有機デバイス用電極基板材料100が有機デバイスの電極202として用いられた際に、有機EL素子の発光層201と当接し、発光層201に電圧を印加する。
平坦化層102は、パターン化された導体層101の開口部を埋めるように、導体層101の周囲に設けられている。少なくとも第1の面111において、平坦化層102は導体層101を覆っておらず、導体層101の表面が露出している。
本実施形態の有機デバイス用電極基板材料100は、例えば以下のようにして形成することができる。
有機デバイス用電極基板材料の平滑性の評価は株式会社ニコン製超高分解能非接触三次元表面形状計測システムBW-D500を用いて2.2mm×2.2mmの視野で表面の凹凸形状を観察し、面内の最大高さSzを測定した。JIS-B0601-2001で定義されている最大高さRzを、観察された表面全体に対して適用できるように三次元に拡張して算出された値である。平滑性がSz200nm以下のものを良好(〇)、200nmを超えるものを不良(×)とした。
有機デバイス用電極基板材料の水蒸気バリア性の評価は、JIS K 7129-7:2016で定義される水蒸気透過度である。蒸着した金属カルシウム上に試料を設置し、40℃90%の環境下で100時間経過後、腐食したカルシウムの面積から計算することによって算出した。
有機デバイス用電極基板材料の表面抵抗は、50mm×50mmの試料の対角線上にある2つの角点の間の抵抗値を抵抗計(三和電気計器株式会社製、RD701 DIGITALMULTIMETER)を用いて測定して求めた。表面抵抗が10Ω/cm以下のものを良好(〇)、10Ω/cm2を超えるものを不良(×)とした。
対象試料の屈曲試験前後の表面抵抗を測定し、表面抵抗の低下率を求めた。屈曲試験は、塗膜屈曲試験機を用いて、10mmφのマンドレルで50回行った。表面抵抗の低下率が5%以下のものをフレキシブル性が良好(〇)、5%を超えるものを不良(×)とした。
3cm×3cmで厚さ15μm(算術平均粗さRa:7nm)のアルミニウム箔(東洋アルミニウム株式会社製、1N30)の一方の表面(主面)に難付着性の接着剤を塗布し、100℃で乾燥させた後、この接着剤側の塗布面に基材を貼り合わせ、50℃で4日間エージングした。基材は厚さ38μmのPETフィルム(帝人フィルムソリューションズ株式会社製)とした。
アルミニウム箔を厚さが15μmの銅箔(純度99.96%)とし、エポキシ樹脂をアクリル樹脂とした以外は実施例1と同様にした。
導電層の線幅を100μmとし、ピッチが2000μmで配線密度を9%とした以外は実施例1と同様にした。
また、実施例1と同様に対象試料を陽極とする有機EL発光素子を形成し、発光効率を測定したところ、1.0cd/Aであった。実施例1と同様にUVオゾン洗浄後のぬれ張力を評価したところ、1分では63mN/m、5分では73mN/m、10分では73mN/mであった。
ガスバリア層を形成せず、すなわちアルミニウム箔がエッチングにより除去された部分及び導体層のある面に直接エポキシ樹脂を充填した以外は実施例1と同様にして有機デバイス用電極基板材料を得た。
ガスバリア層を形成せず、すなわちアルミニウム箔がエッチングにより除去された部分及び導体層のある面に直接エポキシ樹脂を充填し、透明支持体を厚さ75μmで水蒸気透過率が4×10-4g/m2/dayの市販のガスバリアフィルムとした以外は実施例1と同様にして有機デバイス用電極基板材料を得た。
ガラス基板上にインジウムスズオキサイト(ITO)をスパッタ法で155nmの膜厚で積層させることによって有機デバイス用電極基板材料を得た。
厚さ75μmで水蒸気透過率が4×10-4g/m2/dayの市販のガスバリアフィルムにインジウムスズオキサイト(ITO)をスパッタ法により120nmの膜厚で積層させることによって有機デバイス用電極基板材料を得た。
3cm×3cmで厚さ15μm(Ra:7nm)のアルミニウム箔(東洋アルミニウム株式会社製、1N30)の一方の表面(主面)に市販のアクリル系接着剤を塗布し、この接着剤側の塗布面に厚さ75μmで水蒸気透過率が4×10-4g/m2/dayの市販のガスバリアフィルムを貼り合せた。
厚さ75μmで水蒸気透過率が4×10-4g/m2/dayの市販のガスバリアフィルムにアルミニウムを蒸着して、厚さが300nmのアルミニウム蒸着膜を形成した。次に、アルミニウム蒸着膜の表面に市販のドライフィルムを貼り合わせ、メッシュ形状フォトマスクを用いてUVにより露光、現像し、ドライフィルムが残っていない部分を塩化鉄(II)水溶液を用いてエッチングを行い、パターン化した。この後、水酸化ナトリウム水溶液を用いてドライフィルムを剥離することによって有機デバイス用電極基板材料を得た。
101 導体層
102 平坦化層
103 ガスバリア層
104 透明樹脂層
105 透明支持体
106 保護層
111 第1の面
112 第2の面
121 基盤パターン
122 周辺パターン
122A 第1の周辺パターン
122B 第2の周辺パターン
123 電極
124 端子
200 有機EL素子
201 発光層
202 電極
203 電極
301 基材
302 金属箔
Claims (10)
- パターン化された金属箔からなる導体層と、
前記導体層の周囲に設けられた平坦化層とを備え、
第1の面において、前記導体層の表面は前記平坦化層から露出し、且つ前記導体層の表面と、前記平坦化層の表面とは、連続した平坦面を形成している、有機デバイス用電極基板材料。 - 前記導体層は、線幅が20μm以上、200μm以下のパターンを形成し、前記第1の面における単位面積当たりの前記導体層の密度は15%以下である、請求項1に記載の有機デバイス用電極基板材料。
- 前記平坦化層は、ガスバリア層と透明樹脂層とを含み、
前記ガスバリア層の表面と前記導体層の露出した表面とは連続した平滑面を形成している、請求項1又は2に記載の有機デバイス用電極基板材料。 - 前記ガスバリア層は、アルミニウム及び酸素を主成分とする層並びにシリコンと、窒素、酸素及び炭素の少なくとも1つとを主成分とする層の少なくとも一方を含み、厚さが20nm以上である、請求項3に記載の有機デバイス用電極基板材料。
- 前記平坦化層は、波長400nm~800nmの光の透過率が85%以上である、請求項1~4のいずれか1項に記載の有機デバイス用電極基板材料。
- 前記平坦化層は、ポリエチレンテレフタレート(PET)、ポリプロピレン(PP)、ポリエチレン(PE)、ポリスチレン(PS)、ポリカーボネート(PC)、アクリル、ポリ塩化ビニル(PVC)、フッ素樹脂、インジウムスズオキサイド(ITO)、及びポリエチレンジオキシチオフェン/ポリスチレンスルホン酸(PEDOT/PSS)のうちの1種又は2種以上である、請求項5に記載の有機デバイス用電極基板材料。
- 前記導体層は、基盤パターンと、基盤パターンの外側に設けられ、外部装置と接続可能な周辺パターンとを含む、請求項1~6のいずれか1項に記載の有機デバイス用電極基板材料。
- 前記導体層は、厚さ6μm以上、30μm以下のアルミニウム箔である、請求項1~7のいずれか1項に記載の有機デバイス用電極基板材料。
- 前記第1の面と反対側の第2の面において、前記導体層の表面は前記平坦化層から露出している、請求項1~8のいずれか1項に記載の有機デバイス用電極基板材料。
- 前記第1の面と反対側の第2の面において、前記導体層の表面は前記平坦化層に覆われている、請求項1~9のいずれか1項に記載の有機デバイス用電極基板材料。
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JP2019564615A JP7284711B2 (ja) | 2018-01-09 | 2018-12-25 | 有機デバイス用電極基板材料 |
CN201880085709.2A CN111587610A (zh) | 2018-01-09 | 2018-12-25 | 有机装置用电极基板材料 |
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WO2020090831A1 (ja) * | 2018-10-30 | 2020-05-07 | 住友化学株式会社 | 電子デバイスの製造方法 |
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JP2013501342A (ja) * | 2009-08-06 | 2013-01-10 | ネーデルランデ オルガニサティー ヴール トゥーヘパストナツールウェテンスハペライク オンデルズーク テーエヌオー | 光電気装置の製造方法 |
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TW201937512A (zh) | 2019-09-16 |
TWI804558B (zh) | 2023-06-11 |
JP7284711B2 (ja) | 2023-05-31 |
JPWO2019138863A1 (ja) | 2020-12-24 |
KR20200098664A (ko) | 2020-08-20 |
CN111587610A (zh) | 2020-08-25 |
KR102341557B1 (ko) | 2021-12-20 |
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