WO2017190403A1 - 面板检测单元、阵列基板及液晶显示装置 - Google Patents

面板检测单元、阵列基板及液晶显示装置 Download PDF

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Publication number
WO2017190403A1
WO2017190403A1 PCT/CN2016/085594 CN2016085594W WO2017190403A1 WO 2017190403 A1 WO2017190403 A1 WO 2017190403A1 CN 2016085594 W CN2016085594 W CN 2016085594W WO 2017190403 A1 WO2017190403 A1 WO 2017190403A1
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Prior art keywords
short
signal line
line
circuit
diode
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PCT/CN2016/085594
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English (en)
French (fr)
Inventor
甘启明
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Priority to US15/126,585 priority Critical patent/US20180090041A1/en
Publication of WO2017190403A1 publication Critical patent/WO2017190403A1/zh
Anticipated expiration legal-status Critical
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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B99/00—Subject matter not provided for in other groups of this subclass
    • H10B99/16—Subject matter not provided for in other groups of this subclass comprising memory cells having diodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/611—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using diodes as protective elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/921—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs characterised by the configuration of the interconnections connecting the protective arrangements, e.g. ESD buses
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix

Definitions

  • the present invention relates to a liquid crystal display technology, and more particularly to a panel detecting unit, an array substrate including the panel detecting unit, and a liquid crystal display device including the panel array substrate.
  • the main structure of the thin film transistor liquid crystal display includes a liquid crystal panel and a backlight module, and the liquid crystal panel includes an array substrate, a color filter substrate, and a liquid crystal cell disposed therebetween.
  • a signal line corresponding to the monochrome data line is disposed on the array substrate, and the liquid crystal cell detects (cell In the case of test, the detection signal is input through a pin/pin corresponding to each signal line, and the signal line having the same detection signal is short-circuited with the same short-circuit line.
  • the panel detecting unit in the RGB liquid crystal display processing process generally includes three (R/G/B) short-circuit lines (shorting). Bar) 111, 112, 113, respectively connected to three pixel signal lines 211, 212, 213 by wires, in the liquid crystal cell detection (cell The test) stage is used to illuminate the white/pure red/pure green/pure blue screen to check the display quality of the panel to determine whether the pixel signal line has an open circuit or a defect. After the test is completed, the short circuit is cut by the laser (test Wire) connection to signal line (laser) Cut).
  • the object of the present invention is to solve the technical problems of the prior art liquid crystal display production process, such as more processes, lower production efficiency, and higher production cost.
  • the present invention provides a panel detecting unit, comprising: at least one short-circuit line group, each short-circuit line group including at least one short-circuit line; at least one signal line group, each signal line group including at least one signal line; Wherein, any signal line is connected to a short-circuit line corresponding to the signal line through a diode.
  • the short-circuit line group includes at least one first short-circuit line group and/or at least one second short-circuit line group.
  • the signal line group includes at least one first signal line group and/or at least one second signal line group.
  • the first short circuit group includes a first short circuit, a second short circuit, and a third short circuit.
  • the first signal line group includes: an R pixel signal line connected to the first short circuit through a diode; the diode positive electrode is connected to the first short circuit, and the negative electrode is connected to the R pixel signal line; a G pixel signal line connected to the second short circuit through a diode; the diode positive electrode is connected to the second short circuit line, the negative electrode is connected to the G pixel signal line; and a B pixel signal line is connected through a diode To the third short-circuit line; the diode positive electrode is connected to the third short-circuit line, and the negative electrode thereof is connected to the B-pixel signal line.
  • the second short circuit group includes a fourth short circuit and a fifth short circuit.
  • the second signal line group includes: an Odd signal line connected to the fourth short circuit line through a diode; the diode positive electrode is connected to the fourth short circuit line, and the negative electrode is connected to the Odd signal line; And an Even signal line connected to the fifth short-circuit line through a diode; the diode positive electrode is connected to the fifth short-circuit line, and the negative electrode is connected to the Even signal line.
  • the diode is a Schottky diode.
  • the present invention provides an array substrate, comprising: a display area having a liquid crystal and at least one data line group; and a non-display area disposed around the display area, at least A panel detecting unit as described above.
  • the data line group includes: an R pixel data line connected to the R pixel signal line; a G pixel data line connected to the G pixel signal line; and a B pixel data line connected to the B pixel signal line.
  • the data line group includes: an Odd data line connected to the Odd signal line; and an Even data line connected to the Even signal line.
  • the present invention provides a liquid crystal display device comprising the above array substrate.
  • the invention has the advantages that the invention proposes a new technical solution, that a single-pass diode is installed between the signal line and the short-circuit line (test line), and after the test is completed, the laser cutting process is not required, directly
  • the next step can be processed to reduce processing costs and increase production efficiency.
  • FIG. 1 is a schematic structural view of an RGB panel detecting unit in the prior art
  • FIG. 2 is a schematic structural diagram of a panel detecting unit according to an embodiment of the present invention.
  • FIG. 3 is a schematic view showing the overall structure of an array substrate according to an embodiment of the present invention.
  • FIG. 4 is a partial enlarged view of the first short-circuit line group and the pixel data line group in FIG. 3;
  • Figure 5 is a partial enlarged view of the second short-circuit line group and the parity data line group in Figure 3;
  • FIG. 6 is a schematic structural view of a liquid crystal display device according to an embodiment of the invention.
  • R pixel data line 411, R pixel data line, 412, G pixel data line, 413, B pixel data line;
  • the embodiment provides a panel detecting unit 100, including: at least one short-circuit group 1, each short-circuit group includes at least one short-circuit line; at least one signal line group 2, and each signal line group includes At least one signal line; wherein any one of the signal lines is connected to a short-circuit line corresponding to the signal line through a diode-connected diode 3, the anode of the diode 3 is connected to the short-circuit line, and the cathode of the diode 3 is connected to the Signal line.
  • Diode 3 is a Schottky diode.
  • the short-circuit group 1 includes at least one first short-circuit group 11 and at least one second short-circuit group 12; the signal line group 2 includes at least one first signal line group 21 and at least one second signal line group 22 .
  • the short-circuit group 1 includes at least one first short-circuit group 11 or at least one second short-circuit group 12; the signal line group 2 includes at least one first signal line group 21 or at least one second signal line group 22 .
  • the first short circuit group 11 includes a first short circuit 111, a second short circuit 112, and a third short circuit 113.
  • the first signal line group 21 includes: an R pixel signal line 211 connected to the first short circuit line 111 through a diode 311; the diode positive electrode is connected to the first short circuit line 111, and the negative electrode is connected to the R pixel signal line 211;
  • the pixel signal line 212 is connected to the second short-circuit line 112 through a diode 312; the diode 312 is positively connected to the second short-circuit line 112, its negative terminal is connected to the G-pixel signal line 212; and a B-pixel signal line 213 is passed through a diode.
  • 313 is connected to the third short-circuit line 113; the diode 313 is positively connected to the third short-circuit line 113, and its negative electrode is connected to the B-pixel signal line 313.
  • the second short circuit group 12 includes a fourth short circuit 124 and a fifth short circuit 125.
  • the second signal line group 22 includes: an Odd signal line 224 connected to the fourth short circuit line 124 through a diode 324; the diode 324 is positively connected to the fourth short circuit line 124, the negative terminal is connected to the Odd signal line 224; and an Even
  • the signal line 225 is connected to the fifth short-circuit line 125 through a diode 325; the diode 325 is positively connected to the fifth short-circuit line 125, and its negative terminal is connected to the Even signal line 225.
  • the present embodiment provides an array substrate 200 including a display area 4 and a non-display area 5.
  • the display area 4 is provided with a liquid crystal and a plurality of data line groups, such as a pixel data line group 41.
  • the parity data line group 42; the non-display area 5 is disposed around the display area 4, and a plurality of the above-described panel detecting units 100 are disposed therein.
  • the short-circuit group 1 includes a first short-circuit group 11 and a second short-circuit group 12, the pixel data line group 41 is connected to the first signal line group 21, and the parity data line group 42 is connected to the second short. Route group 12.
  • the pixel data line group 41 includes: an R pixel data line 411, connected to the R pixel signal line 211; a G pixel data line 412, connected to the G pixel signal line 212; And a B pixel data line 413 connected to the B pixel signal line 213.
  • the parity data line group 42 includes an Odd data line 424 connected to the Odd signal line 224, and an Even data line 425 connected to the Even signal line 225.
  • the R pixel data line 411 is connected to the first short circuit line 111 through the R pixel signal line 211, and a detection signal is analog input through a detection signal point on the first short circuit line 111.
  • a detection signal is analog input through a detection signal point on the first short circuit line 111.
  • Lights red in the display area detects whether there is abnormal image point or uneven brightness (Mura) under pure red, detects whether there is a short circuit in the trace of the detection line (fanout trace), and other lighting detection conditions. .
  • it can also illuminate pure blue, pure green, and pure white (three colors are lit at the same time) to check whether there is a short circuit and whether there is a dead pixel.
  • the present embodiment provides a liquid crystal display device 300 including the array substrate 200 described above and other necessary components in the display.
  • the unidirectional conduction characteristic of the diode can selectively open/close the signal path between the signal line and the short-circuit line, and the test line is not required to be cut by the laser, and the additional laser can be avoided.
  • the cutting step can shorten the processing time of the liquid crystal display panel and improve the production efficiency of the liquid crystal display panel.
  • the present invention can avoid the influence of the laser cutting step on the liquid crystal display panel, and can improve the product yield of the liquid crystal display panel.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

一种面板检测单元（100）、包含面板检测单元（100）的阵列基板以及包含阵列基板的液晶显示装置。面板检测单元（100）包括至少一短路线组（1），每一短路线组（1）包括至少一短路线；至少一信号线组（2），每一信号线组（2）包括至少一信号线；其中，任一信号线通过一二极管（3）连接至与信号线相应的一短路线。在信号线与短路线之间安装一个单向导通的二极管（3），在完成测试后，无需再进行激光切割的制程，直接可以进行下一步的加工处理，从而减少加工成本，提高生产效率。

Description

面板检测单元、阵列基板及液晶显示装置 技术领域
本发明涉及一种液晶显示器技术，特别涉及一种面板检测单元、一种包含该面板检测单元的阵列基板以及一种包含该面板阵列基板的液晶显示装置。
 背景技术
薄膜晶体管液晶显示器（TFT-LCD）的主体结构包括液晶面板和背光模组，液晶面板包括阵列基板、彩膜基板以及设置在其间的液晶盒。
在显示器的制作过程中，LCD光板在绑定IC前，需要对液晶盒进行点灯检测，筛选出不良产品，防止其进入下一步的工序，以减少后续制程的浪费。阵列基板上设置有与单色数据线一一对应的信号线，液晶盒检测（cell test）时，通过与每条信号线对应的引针/引线（pin）输入检测信号，检测信号相同的信号线与同一条短路线短接。
现有技术中，在RGB液晶显示器加工工艺中的面板检测单元，如图1所示，一般包括三条（R/G/B）短路线（shorting bar）111、112、113，分别通过引线连接至三条像素信号线211、212、213，在液晶盒检测（cell test）阶段用来点亮白色/纯红/纯绿/纯蓝画面，以检查面板的显示质量，从而判断像素信号线是否有断路或缺陷，在完成测试后，利用激光切断该短路线（测试线）与信号线的连接（laser cut）。
由于通过上述液晶显示面板的测试线路在检测液晶显示面板之后，需利用激光来切断测试线，因而必须有一道激光切割的制程。制程较多，就会降低液晶显示面板的生产效率；激光切割过程中有可能切坏面板，从而影响产品的良率；而生产效率的降低、产品良率降低都会提高液晶面板的生产成本。因此，在生产实践中，如何能尽可能地减少工艺中的制程，从而提高生产效率和降低生产成本是每个研发人员必须要考虑的问题。
 技术问题
本发明的目的在于，解决现有的液晶显示器生产工艺中所存在的制程较多、生产效率较低、生产成本较高等技术问题。
 技术解决方案
为实现上述目的，本发明提供一种面板检测单元，包括：至少一短路线组，每一短路线组包括至少一短路线；至少一信号线组，每一信号线组包括至少一信号线；其中，任一信号线通过一二极管连接至与该信号线相应的一短路线。
其中，所述短路线组包括至少一第一短路线组和/或至少一第二短路线组。
其中，所述信号线组包括至少一第一信号线组和/或至少一第二信号线组。
其中，所述第一短路线组包括一第一短路线、一第二短路线以及一第三短路线。
其中，所述第一信号线组包括：一R像素信号线，通过一二极管连接至所述第一短路线；该二极管正极连接至第一短路线，其负极连接至所述R像素信号线；一G像素信号线，通过一二极管连接至所述第二短路线；该二极管正极连接至第二短路线，其负极连接至所述G像素信号线；以及一B像素信号线，通过一二极管连接至所述第三短路线；该二极管正极连接至第三短路线，其负极连接至所述B像素信号线。
其中，所述第二短路线组包括一第四短路线以及一第五短路线。
其中，所述第二信号线组包括：一Odd信号线，通过一二极管连接至所述第四短路线；该二极管正极连接至所述第四短路线，其负极连接至所述Odd信号线；以及一Even信号线，通过一二极管连接至所述第五短路线；该二极管正极连接至所述第五短路线，其负极连接至所述Even信号线。
其中，所述二极管为肖特基二极管。
为实现上述目的，本发明提供一种阵列基板，包括：一显示区，其内设有液晶以及至少一数据线组；以及一非显示区，设置于所述显示区周围，其内设有至少一上述的面板检测单元。
其中，所述数据线组包括：一R像素数据线，连接至所述R像素信号线；一G像素数据线，连接至所述G像素信号线；以及一B像素数据线，连接至所述B像素信号线。
其中，所述数据线组包括：一Odd数据线，连接至所述Odd信号线；以及一Even数据线，连接至所述Even信号线。
为实现上述目的，本发明提供一种液晶显示装置，包括上述的阵列基板。
 有益效果
本发明的优点在于，本发明提出一种新的技术方案，在信号线与短路线（测试线）之间安装一个单向导通的二极管，在完成测试后，无需再进行激光切割的制程，直接可以进行下一步的加工处理，从而减少加工成本，提高生产效率。
 附图说明
图1所示为现有技术中一RGB面板检测单元的结构示意图；
图2所示为本发明一实施例中面板检测单元的结构示意图；
图3所示为本发明一实施例中一阵列基板的整体结构示意图；
图4所示为图3中第一短路线组与像素数据线组的局部放大图；
图5所示为图3中第二短路线组与奇偶数据线组的局部放大图；
图6所示为本发明一实施例中一液晶显示装置的结构示意图。
图中主要部件标识如下：
1、短路线组，2、信号线组，3、二极管，4、显示区，5、非显示区；
11、第一短路线组，12、第二短路线组，13、第三短路线；
21、第一信号线组，22、第二信号线组；
41、像素数据线组，42、奇偶数据线组；
100、面板检测单元，200、阵列基板，300、液晶显示装置；
111、第一短路线，112、第二短路线，113、第三短路线；
124、第四短路线，125、第五短路线；
211、R像素信号线，212、G像素信号线，213、B像素信号线；
224、Odd信号线，225、Even信号线；
311、二极管，312、二极管，313、二极管；
411、R像素数据线，412、G像素数据线，413、B像素数据线；
424、Odd数据线，425、Even数据线。
 本发明的最佳实施方式
以下参考说明书附图介绍本发明的一个优选实施例，证明本发明可以实施，这些实施例可以向本领域中的技术人员完整介绍本发明，使其技术内容更加清楚和便于理解。本发明可以通过许多不同形式的实施例来得以体现，本发明的保护范围并非仅限于文中提到的实施例。
在附图中，结构相同的部件以相同数字标号表示，各处结构或功能相似的组件以相似数字标号表示。附图所示的每一组件的尺寸和厚度是任意示出的，本发明并没有限定每个组件的尺寸和厚度。为了使图示更清晰，附图中有些地方适当夸大了部件的厚度。
当一个组件被描述为“安装至”或“连接至”另一组件时，二者可以理解为直接“安装”或“连接”，或者一个组件通过一中间组件间接“安装至”、或“连接至”另一个组件。
如图2所示，本实施例提供一种面板检测单元100，包括：至少一短路线组1，每一短路线组包括至少一短路线；至少一信号线组2，每一信号线组包括至少一信号线；其中，任一信号线通过一单向导通的二极管3连接至与该信号线相应的一短路线，二极管3的阳极连接至所述短路线，二极管3的阴极连接至所述信号线。二极管3为肖特基二极管。
本实施例中，短路线组1包括至少一第一短路线组11和至少一第二短路线组12；信号线组2包括至少一第一信号线组21和至少一第二信号线组22。其他实施例中，短路线组1包括至少一第一短路线组11或至少一第二短路线组12；信号线组2包括至少一第一信号线组21或至少一第二信号线组22。
第一短路线组11包括一第一短路线111、一第二短路线112以及一第三短路线113。第一信号线组21包括：一R像素信号线211，通过一二极管311连接至第一短路线111；该二极管正极连接至第一短路线111，其负极连接至R像素信号线211；一G像素信号线212，通过一二极管312连接至第二短路线112；该二极管312正极连接至第二短路线112，其负极连接至G像素信号线212；以及一B像素信号线213，通过一二极管313连接至第三短路线113；该二极管313正极连接至第三短路线113，其负极连接至B像素信号线313。
第二短路线组12包括一第四短路线124以及一第五短路线125。第二信号线组22包括：一Odd信号线224，通过一二极管324连接至第四短路线124；该二极管324正极连接至第四短路线124，其负极连接至Odd信号线224；以及一Even信号线225，通过一二极管325连接至第五短路线125；该二极管325正极连接至第五短路线125，其负极连接至Even信号线225。
如图3-5所示，本实施例提供一种阵列基板200，包括一显示区4及一非显示区5，显示区4内设有液晶及多个数据线组，如像素数据线组41、奇偶数据线组42；非显示区5设置于显示区4周围，其内设有多个上述的面板检测单元100。本实施例中，短路线组1包括一第一短路线组11和一第二短路线组12，像素数据线组41连接至第一信号线组21，奇偶数据线组42连接至第二短路线组12。如图4所示，像素数据线组41包括：一R像素数据线411，连接至R像素信号线211；一G像素数据线412，连接至G像素信号线212； 以及一B像素数据线413，连接至B像素信号线213。如图5所示，奇偶数据线组42包括：一Odd数据线424，连接至Odd信号线224；以及一Even数据线425，连接至Even信号线225。
在本实施例中，R像素数据线411通过R像素信号线211连接至第一短路线111，通过第一短路线111上的一检测信号点模拟输入一检测信号，此时二极管导通，可以在显示区点亮红色，在纯红色下检测是否存在异常像点或亮度不均匀的现象（Mura），检测所述检测线路的走线（fanout走线）是否存在短路现象，以及其他点灯检测情况。同理，也可以点亮纯蓝色、纯绿色、纯白（三色同时点亮），以检查是否存在短路现象、是否存在坏点。
由于所有的二极管都是单向导通，即使所有短路线保留在测试后的液晶面板上，也不会影响液晶面板的正常使用，因此短路线不必被切断。在点灯检测之后，无需进行激光切割的制程，直接可以进行下一步的加工处理，从而减少加工成本，提高生产效率。
如图6所示，本实施例提供一种液晶显示装置300，包括上述的阵列基板200及显示器中应有的其他必要部件。
综上可知，本发明的技术方案中利用二极管的单向导通的特性，可以选择性地开/关信号线与短路线之间的信号路径，无需通过激光来切断测试线，可以避免额外的激光切断步骤，因而可缩短液晶显示面板的制程时间，提高液晶显示面板的生产效率。另一方面，本发明可以避免激光切断步骤对液晶显示面板的影响，可以提升液晶显示面板的产品良率。
以上所述仅是本发明的优选实施方式，应当指出，对于本技术领域的普通技术人员，在不脱离本发明原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也应视为本发明的保护范围。

Claims (12)

  1. 一种面板检测单元，包括：
    至少一短路线组，每一短路线组包括至少一短路线；
    至少一信号线组，每一信号线组包括至少一信号线；
    其中，任一信号线通过一二极管连接至与该信号线相应的一短路线。
  2. 如权利要求1所述的面板检测单元，其中，所述短路线组包括至少一第一短路线组和/或至少一第二短路线组；
  3. 如权利要求1所述的面板检测单元，其中，所述信号线组包括至少一第一信号线组和/或至少一第二信号线组。
  4. 如权利要求2所述的面板检测单元，其中，所述第一短路线组包括一第一短路线、一第二短路线以及一第三短路线。
  5. 如权利要求3所述的面板检测单元，其中，所述第一信号线组包括：
    一R像素信号线，通过一二极管连接至所述第一短路线；该二极管正极连接至第一短路线，其负极连接至所述R像素信号线；
    一G像素信号线，通过一二极管连接至所述第二短路线；该二极管正极连接至第二短路线，其负极连接至所述G像素信号线；以及
    一B像素信号线，通过一二极管连接至所述第三短路线；该二极管正极连接至第三短路线，其负极连接至所述B像素信号线。
  6. 如权利要求2所述的面板检测单元，其中，所述第二短路线组包括一第四短路线以及一第五短路线。
  7. 如权利要求3所述的面板检测单元，其中，所述第二信号线组包括：
    一Odd信号线，通过一二极管连接至所述第四短路线；该二极管正极连接至所述第四短路线，其负极连接至所述Odd信号线；以及
    一Even信号线，通过一二极管连接至所述第五短路线；该二极管正极连接至所述第五短路线，其负极连接至所述Even信号线。
  8. 如权利要求1或5或7所述的面板检测单元，其中，所述二极管为肖特基二极管。
  9. 一种阵列基板，包括：
    一显示区，其内设有液晶以及至少一数据线组；以及
    一非显示区，设置于所述显示区周围，其内设有至少一如权利要求1-6中任一项所述的面板检测单元。
  10. 如权利要求9所述的阵列基板，其中，所述数据线组包括：
    一R像素数据线，连接至所述R像素信号线；
    一G像素数据线，连接至所述G像素信号线；以及
    一B像素数据线，连接至所述B像素信号线。
  11. 如权利要求9所述的阵列基板，其中，所述数据线组包括：
    一Odd数据线，连接至所述Odd信号线；以及
    一Even数据线，连接至所述Even信号线。
  12. 一种液晶显示装置，包括如权利要求9或10或11所述的阵列基板。
PCT/CN2016/085594 2016-05-06 2016-06-13 面板检测单元、阵列基板及液晶显示装置 Ceased WO2017190403A1 (zh)

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