CN105759472A - 面板检测单元、阵列基板及液晶显示装置 - Google Patents
面板检测单元、阵列基板及液晶显示装置 Download PDFInfo
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Abstract
本发明涉及一种面板检测单元、一种包含该面板检测单元的阵列基板以及一种包含该阵列基板的液晶显示装置。所述面板检测单元,包括至少一短路线组,每一短路线组包括至少一短路线;至少一信号线组,每一信号线组包括至少一信号线;其中,任一信号线通过一二极管连接至与该信号线相应的一短路线。本发明提出一种新的技术方案,在信号线与短路线(测试线)之间安装一个单向导通的二极管,在完成测试后,无需再进行激光切割的制程,直接可以进行下一步的加工处理,从而减少加工成本,提高生产效率。
Description
技术领域
本发明涉及一种液晶显示器技术,特别涉及一种面板检测单元、一种包含该面板检测单元的阵列基板以及一种包含该面板阵列基板的液晶显示装置。
背景技术
薄膜晶体管液晶显示器(TFT-LCD)的主体结构包括液晶面板和背光模组,液晶面板包括阵列基板、彩膜基板以及设置在其间的液晶盒。
在显示器的制作过程中,LCD光板在绑定IC前,需要对液晶盒进行点灯检测,筛选出不良产品,防止其进入下一步的工序,以减少后续制程的浪费。阵列基板上设置有与单色数据线一一对应的信号线,液晶盒检测(celltest)时,通过与每条信号线对应的引针/引线(pin)输入检测信号,检测信号相同的信号线与同一条短路线短接。
现有技术中,在RGB液晶显示器加工工艺中的面板检测单元,如图1所示,一般包括三条(R/G/B)短路线(shortingbar)111、112、113,分别通过引线连接至三条像素信号线211、212、213,在液晶盒检测(celltest)阶段用来点亮白色/纯红/纯绿/纯蓝画面,以检查面板的显示质量,从而判断像素信号线是否有断路或缺陷,在完成测试后,利用激光切断该短路线(测试线)与信号线的连接(lasercut)。
由于通过上述液晶显示面板的测试线路在检测液晶显示面板之后,需利用激光来切断测试线,因而必须有一道激光切割的制程。制程较多,就会降低液晶显示面板的生产效率;激光切割过程中有可能切坏面板,从而影响产品的良率;而生产效率的降低、产品良率降低都会提高液晶面板的生产成本。因此,在生产实践中,如何能尽可能地减少工艺中的制程,从而提高生产效率和降低生产成本是每个研发人员必须要考虑的问题。
发明内容
本发明的目的在于,解决现有的液晶显示器生产工艺中所存在的制程较多、生产效率较低、生产成本较高等技术问题。
为实现上述目的,本发明提供一种面板检测单元,包括:至少一短路线组,每一短路线组包括至少一短路线;至少一信号线组,每一信号线组包括至少一信号线;其中,任一信号线通过一二极管连接至与该信号线相应的一短路线。所述短路线组包括至少一第一短路线组和/或至少一第二短路线组;所述信号线组包括至少一第一信号线组和/或至少一第二信号线组。
进一步地,所述第一短路线组包括一第一短路线、一第二短路线以及一第三短路线。所述第一信号线组包括:一R像素信号线,通过一二极管连接至所述第一短路线;该二极管正极连接至第一短路线,其负极连接至所述R像素信号线;一G像素信号线,通过一二极管连接至所述第二短路线;该二极管正极连接至第二短路线,其负极连接至所述G像素信号线;以及一B像素信号线,通过一二极管连接至所述第三短路线;该二极管正极连接至第三短路线,其负极连接至所述B像素信号线。
进一步地,所述第二短路线组包括一第四短路线以及一第五短路线。所述第二信号线组包括:一Odd信号线,通过一二极管连接至所述第四短路线;该二极管正极连接至所述第四短路线,其负极连接至所述Odd信号线;以及一Even信号线,通过一二极管连接至所述第五短路线;该二极管正极连接至所述第五短路线,其负极连接至所述Even信号线。
进一步地,所述二极管为肖特基二极管。
为实现上述目的,本发明提供一种阵列基板,包括:一显示区,其内设有液晶以及至少一数据线组;以及一非显示区,设置于所述显示区周围,其内设有至少一上述的面板检测单元。所述数据线组包括:一R像素数据线,连接至所述R像素信号线;一G像素数据线,连接至所述G像素信号线;一B像素数据线,连接至所述B像素信号线;一Odd数据线,连接至所述Odd信号线;以及一Even数据线,连接至所述Even信号线。
为实现上述目的,本发明提供一种液晶显示装置,包括上述的阵列基板。
本发明的优点在于,本发明提出一种新的技术方案,在信号线与短路线(测试线)之间安装一个单向导通的二极管,在完成测试后,无需再进行激光切割的制程,直接可以进行下一步的加工处理,从而减少加工成本,提高生产效率。
附图说明
图1所示为现有技术中一RGB面板检测单元的结构示意图;
图2所示为本发明一实施例中面板检测单元的结构示意图;
图3所示为本发明一实施例中一阵列基板的整体结构示意图;
图4所示为图3中第一短路线组与像素数据线组的局部放大图;
图5所示为图3中第二短路线组与奇偶数据线组的局部放大图;
图6所示为本发明一实施例中一液晶显示装置的结构示意图。
图中主要部件标识如下:
1、短路线组,2、信号线组,3、二极管,4、显示区,5、非显示区;
11、第一短路线组,12、第二短路线组,13、第三短路线;
21、第一信号线组,22、第二信号线组;
41、像素数据线组,42、奇偶数据线组;
100、面板检测单元,200、阵列基板,300、液晶显示装置;
111、第一短路线,112、第二短路线,113、第三短路线;
124、第四短路线,125、第五短路线;
211、R像素信号线,212、G像素信号线,213、B像素信号线;
224、Odd信号线,225、Even信号线;
311、二极管,312、二极管,313、二极管;
411、R像素数据线,412、G像素数据线,413、B像素数据线;
424、Odd数据线,425、Even数据线。
具体实施方式
以下参考说明书附图介绍本发明的一个优选实施例,证明本发明可以实施,这些实施例可以向本领域中的技术人员完整介绍本发明,使其技术内容更加清楚和便于理解。本发明可以通过许多不同形式的实施例来得以体现,本发明的保护范围并非仅限于文中提到的实施例。
在附图中,结构相同的部件以相同数字标号表示,各处结构或功能相似的组件以相似数字标号表示。附图所示的每一组件的尺寸和厚度是任意示出的,本发明并没有限定每个组件的尺寸和厚度。为了使图示更清晰,附图中有些地方适当夸大了部件的厚度。
当一个组件被描述为“安装至”或“连接至”另一组件时,二者可以理解为直接“安装”或“连接”,或者一个组件通过一中间组件间接“安装至”、或“连接至”另一个组件。
如图2所示,本实施例提供一种面板检测单元100,包括:至少一短路线组1,每一短路线组包括至少一短路线;至少一信号线组2,每一信号线组包括至少一信号线;其中,任一信号线通过一单向导通的二极管3连接至与该信号线相应的一短路线,二极管3的阳极连接至所述短路线,二极管3的阴极连接至所述信号线。二极管3为肖特基二极管。
本实施例中,短路线组1包括至少一第一短路线组11和至少一第二短路线组12;信号线组2包括至少一第一信号线组21和至少一第二信号线组22。其他实施例中,短路线组1包括至少一第一短路线组11或至少一第二短路线组12;信号线组2包括至少一第一信号线组21或至少一第二信号线组22。
第一短路线组11包括一第一短路线111、一第二短路线112以及一第三短路线113。第一信号线组21包括:一R像素信号线211,通过一二极管311连接至第一短路线111;该二极管正极连接至第一短路线111,其负极连接至R像素信号线211;一G像素信号线212,通过一二极管312连接至第二短路线112;该二极管312正极连接至第二短路线112,其负极连接至G像素信号线212;以及一B像素信号线213,通过一二极管313连接至第三短路线113;该二极管313正极连接至第三短路线113,其负极连接至B像素信号线313。
第二短路线组12包括一第四短路线124以及一第五短路线125。第二信号线组22包括:一Odd信号线224,通过一二极管324连接至第四短路线124;该二极管324正极连接至第四短路线124,其负极连接至Odd信号线224;以及一Even信号线225,通过一二极管325连接至第五短路线125;该二极管325正极连接至第五短路线125,其负极连接至Even信号线225。
如图3-5所示,本实施例提供一种阵列基板200,包括一显示区4及一非显示区5,显示区4内设有液晶及多个数据线组,如像素数据线组41、奇偶数据线组42;非显示区5设置于显示区4周围,其内设有多个上述的面板检测单元100。本实施例中,短路线组1包括一第一短路线组11和一第二短路线组12,像素数据线组41连接至第一信号线组21,奇偶数据线组42连接至第二短路线组12。如图4所示,像素数据线组41包括:一R像素数据线411,连接至R像素信号线211;一G像素数据线412,连接至G像素信号线212;以及一B像素数据线413,连接至B像素信号线213。如图5所示,奇偶数据线组42包括:一Odd数据线424,连接至Odd信号线224;以及一Even数据线425,连接至Even信号线225。
在本实施例中,R像素数据线411通过R像素信号线211连接至第一短路线111,通过第一短路线111上的一检测信号点模拟输入一检测信号,此时二极管导通,可以在显示区点亮红色,在纯红色下检测是否存在异常像点或亮度不均匀的现象(Mura),检测所述检测线路的走线(fanout走线)是否存在短路现象,以及其他点灯检测情况。同理,也可以点亮纯蓝色、纯绿色、纯白(三色同时点亮),以检查是否存在短路现象、是否存在坏点。
由于所有的二极管都是单向导通,即使所有短路线保留在测试后的液晶面板上,也不会影响液晶面板的正常使用,因此短路线不必被切断。在点灯检测之后,无需进行激光切割的制程,直接可以进行下一步的加工处理,从而减少加工成本,提高生产效率。
如图6所示,本实施例提供一种液晶显示装置300,包括上述的阵列基板200及显示器中应有的其他必要部件。
综上可知,本发明的技术方案中利用二极管的单向导通的特性,可以选择性地开/关信号线与短路线之间的信号路径,无需通过激光来切断测试线,可以避免额外的激光切断步骤,因而可缩短液晶显示面板的制程时间,提高液晶显示面板的生产效率。另一方面,本发明可以避免激光切断步骤对液晶显示面板的影响,可以提升液晶显示面板的产品良率。
以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员,在不脱离本发明原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。
Claims (10)
1.一种面板检测单元,其特征在于,包括:
至少一短路线组,每一短路线组包括至少一短路线;
至少一信号线组,每一信号线组包括至少一信号线;
其中,任一信号线通过一二极管连接至与该信号线相应的一短路线。
2.如权利要求1所述的面板检测单元,其特征在于,所述短路线组包括至少一第一短路线组和/或至少一第二短路线组;所述信号线组包括至少一第一信号线组和/或至少一第二信号线组。
3.如权利要求2所述的面板检测单元,其特征在于,所述第一短路线组包括一第一短路线、一第二短路线以及一第三短路线。
4.如权利要求3所述的面板检测单元,其特征在于,所述第一信号线组包括:
一R像素信号线,通过一二极管连接至所述第一短路线;该二极管正极连接至第一短路线,其负极连接至所述R像素信号线;
一G像素信号线,通过一二极管连接至所述第二短路线;该二极管正极连接至第二短路线,其负极连接至所述G像素信号线;以及
一B像素信号线,通过一二极管连接至所述第三短路线;该二极管正极连接至第三短路线,其负极连接至所述B像素信号线。
5.如权利要求2所述的面板检测单元,其特征在于,所述第二短路线组包括一第四短路线以及一第五短路线。
6.如权利要求5所述的面板检测单元,其特征在于,所述第二信号线组包括:
一Odd信号线,通过一二极管连接至所述第四短路线;该二极管正极连接至所述第四短路线,其负极连接至所述Odd信号线;以及
一Even信号线,通过一二极管连接至所述第五短路线;该二极管正极连接至所述第五短路线,其负极连接至所述Even信号线。
7.如权利要求1或4或6所述的面板检测单元,其特征在于,所述二极管为肖特基二极管。
8.一种阵列基板,包括:
一显示区,其内设有液晶以及至少一数据线组;以及
一非显示区,设置于所述显示区周围,其内设有至少一如权利要求1-6中任一项所述的面板检测单元。
9.如权利要求8所述的阵列基板,其特征在于,所述数据线组包括:
一R像素数据线,连接至所述R像素信号线;
一G像素数据线,连接至所述G像素信号线;
一B像素数据线,连接至所述B像素信号线;
一Odd数据线,连接至所述Odd信号线;以及
一Even数据线,连接至所述Even信号线。
10.一种液晶显示装置,包括如权利要求8或9所述的阵列基板。
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US15/126,585 US20180090041A1 (en) | 2016-05-06 | 2016-06-13 | Panel testing unit, array substrate and liquid crystal display device |
PCT/CN2016/085594 WO2017190403A1 (zh) | 2016-05-06 | 2016-06-13 | 面板检测单元、阵列基板及液晶显示装置 |
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