US20180090041A1 - Panel testing unit, array substrate and liquid crystal display device - Google Patents

Panel testing unit, array substrate and liquid crystal display device Download PDF

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Publication number
US20180090041A1
US20180090041A1 US15/126,585 US201615126585A US2018090041A1 US 20180090041 A1 US20180090041 A1 US 20180090041A1 US 201615126585 A US201615126585 A US 201615126585A US 2018090041 A1 US2018090041 A1 US 2018090041A1
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United States
Prior art keywords
line
shorting
signal line
diode
testing unit
Prior art date
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Abandoned
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US15/126,585
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English (en)
Inventor
Qiming GAN
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Assigned to SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. reassignment SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: GAN, Qiming
Publication of US20180090041A1 publication Critical patent/US20180090041A1/en
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0292—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using a specific configuration of the conducting means connecting the protective devices, e.g. ESD buses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/105—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B99/00—Subject matter not provided for in other groups of this subclass
    • H10B99/16—Subject matter not provided for in other groups of this subclass comprising memory cells having diodes

Definitions

  • the present invention relates to a liquid crystal display technology, and particularly to a panel testing unit, an array substrate including the panel testing unit, and a liquid crystal display device including the panel array substrate.
  • the main structure of a thin film transistor liquid crystal display includes a liquid crystal panel and a backlight module, the liquid crystal panel includes an array substrate, a color film substrate and a liquid crystal cell disposed therebetween.
  • the panel testing unit of the processing of the RGB liquid crystal display generally includes three (R/G/B) shorting bars 111 , 112 , 113 , connected to three pixel signal lines 211 , 212 , 213 by guide leads, respectively, for lighting bright white/pure, red/pure, green/pure blue pictures in the stage of the liquid crystal cell test, to check the display quality of the panel, thereby determining whether there is open circuit or defect on the pixel signal line.
  • the connection between the shorting line (test line) and the signal line is cut by laser cutting.
  • An objective of the present invention is to solve the technical problems of increased processes, decreased productivity, and higher production costs in the manufacturing process of the existing liquid crystal display.
  • the present invention provides a panel testing unit, including: at least a shorting bar set, each shorting bar set including at least a shorting line; at least a signal line set, each signal line set including at least a signal line. Any one of the signal lines is connected to a corresponding one of the shorting lines through a diode.
  • the shorting bar set includes at least a first shorting bar set and/or at least a second shorting bar set.
  • the signal line set includes at least a first signal line set and/or at least a second signal line set.
  • the first shorting bar set includes a first shorting line, a second shorting line and a third shorting line.
  • the first signal line set includes: an R pixel signal line, connected to the first shorting line through a diode; an anode of the diode connected to the first shorting line, a cathode of the diode connected to the R pixel signal line; a G pixel signal line, connected to the second shorting line through a diode; an anode of the diode connected to second shorting line, a cathode of the diode connected to the G pixel signal line; and a B pixel signal line, connected to the third shorting line through a diode; an anode of the diode connected to third shorting line, a cathode of the diode connected to the B pixel signal line.
  • the second shorting bar set includes a fourth shorting line and a fifth shorting line.
  • the second signal line set includes: an odd signal line, connected to the fourth shorting line through a diode; an anode of the diode connected to the fourth shorting line, a cathode of the diode connected to the odd signal line; and an even signal line, connected to the fifth shorting line through a diode; an anode of the diode connected to the fifth shorting line, a cathode of the diode connected to the even signal line.
  • the diode is a Schottky diode.
  • the present invention provides an array substrate, including: a display area, with a liquid crystal and at least a data line set disposed therein; and a non-display area, disposed around the display area, with at least one panel testing unit mentioned above.
  • the data line set includes: an R pixel data line, connected to the R pixel signal line; a G pixel data line, connected to the G pixel signal line; and a B pixel data line, connected to the B pixel signal line.
  • the data line set includes: an odd data line, connected to the odd signal line; and an even data line, connected to the even signal line.
  • the present invention provides a liquid crystal display device, including the aforementioned array substrate.
  • the advantage of the present invention is that it provides a novel technical scheme, an unidirectional diode is disposed between the signal line and the shorting line (test line), after the test is finished, a laser cutting process is not necessary, a processing of a next step can be performed directly, thus the processing cost is reduced, and the productivity is increased.
  • FIG. 1 illustrates a structural diagram of an RGB panel testing unit of the prior art
  • FIG. 2 illustrates a structural diagram of a panel testing unit according to an embodiment of the present invention
  • FIG. 3 illustrates an entire structural diagram of an array substrate according to an embodiment of the present invention
  • FIG. 4 illustrates a partly enlarged view of the first shorting bar set and the pixel data line set in FIG. 3 ;
  • FIG. 5 illustrates a partly enlarged view of the second shorting bar set and the odd and even data line set in FIG. 3 ;
  • FIG. 6 illustrates a structural diagram of a liquid crystal display device according to an embodiment of the present invention.
  • the embodiment provides a panel testing unit 100 , including: at least a shorting bar set 1 , each shorting bar set includes at least a shorting line; at least a signal line set 2 , each signal line set includes at least a signal line; wherein, any signal line is connected to a shorting line corresponding to the signal line through an unidirectional diode 3 , an anode of the diode 3 is connected to the shorting line, a cathode of the diode 3 is connected to the signal line.
  • the diode 3 is a Schottky diode.
  • the shorting bar set 1 includes at least a first shorting bar set 11 and at least a second shorting bar set 12 .
  • the signal line set 2 includes at least a first signal line set 21 and at least a second signal line set 22 .
  • the shorting bar set 1 includes at least a first shorting bar set 11 or at least a second shorting bar set 12 .
  • the signal line set 2 includes at least a first signal line set 21 or at least a second signal line set 22 .
  • the first shorting bar set 11 includes a first shorting line 111 , a second shorting line 112 and a third shorting line 113 .
  • the first signal line set 21 includes: an R pixel signal line 211 , connected to first shorting line 111 through a diode 311 ; an anode of the diode 311 connected to first shorting line 111 , a cathode of the diode 311 connected to the R pixel signal line 211 ; a G pixel signal line 212 , connected to second shorting line 112 through a diode 312 ; an anode of the diode 312 connected to the second shorting line 112 , a cathode of the diode 312 connected to the G pixel signal line 212 ; and a B pixel signal line 213 , connected to third shorting line 113 through a diode 313 ; an anode of the diode 313 connected to third shorting line 113 , a cathode
  • the second shorting bar set 12 includes a fourth shorting line 124 and a fifth shorting line 125 .
  • the second signal line set 22 includes: an odd signal line 224 , connected to fourth shorting line 124 through a diode 324 ; an anode of the diode 324 connected to a fourth shorting line 124 , a cathode of the diode 324 connected to odd signal line 224 ; and an even signal line 225 , connected to fifth shorting line 125 through a diode 325 ; an anode of the diode 325 connected to fifth shorting line 125 , a cathode of the diode 325 connected to the even signal line 225 .
  • the embodiment provides an array substrate 200 , including a display area 4 and a non-display area 5 , the display area 4 having a liquid crystal and a plurality of data line sets disposed therein, such as a pixel data line set 41 , an odd and even data line set 42 ; a non-display area 5 disposed around the display area 4 , having a plurality of the panel testing units 100 disposed therein.
  • the shorting bar set 1 includes a first shorting bar set 11 and a second shorting bar set 12 , the pixel data line set 41 connected to first signal line set 21 , the odd and even data line set 42 connected to the second shorting bar set 12 . As shown in FIG.
  • the pixel data line set 41 includes: an R pixel data line 411 , connected to the R pixel signal line 211 ; a G pixel data line 412 , connected to the G pixel signal line 212 ; and a B pixel data line 413 , connected to the B pixel signal line 213 .
  • the odd and even data line set 42 includes: an odd data line 424 , connected to the odd signal line 224 ; and an even data line 425 , connected to the even signal line 225 .
  • the R pixel data line 411 is connected to the first shorting line 111 , through the R pixel signal line 211 connected to the first shorting line 111 , inputting a test signal through a test signal point on the first shorting line 111 , the diode is turned on at this moment, red color can be lit below the display area, it is tested below the pure red color whether there is a strange pixel point or uneven brightness (Mura), and whether there is a short circuit on the trace (fanout trace) of the test wiring, and other lighting test conditions. Similarly, pure blue, pure green, pure white (three colors lit at the same time) can also be lit, to check if there is a short circuit, or a defective point existing.
  • the embodiment provides a liquid crystal display device 300 , including the aforementioned array substrate 200 and other components should be of the display.
  • the technical scheme of the present invention uses the characteristic of the unidirectional diode, it can be optional to turn on/off the signal path between the signal line and the shorting line, without the need of laser cutting to cut the test line, an additional laser cutting step can be avoided, thus the process time of the liquid crystal display panel can be decreased, and the productivity of the liquid crystal display panel can be increased.
  • the present invention can prevent the step of laser cutting from affecting the liquid crystal display panel, and increase the product yield of the liquid crystal display panel.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Nonlinear Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
US15/126,585 2016-05-06 2016-06-13 Panel testing unit, array substrate and liquid crystal display device Abandoned US20180090041A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN201610298412.7A CN105759472A (zh) 2016-05-06 2016-05-06 面板检测单元、阵列基板及液晶显示装置
CN201610298412.7 2016-05-06
PCT/CN2016/085594 WO2017190403A1 (zh) 2016-05-06 2016-06-13 面板检测单元、阵列基板及液晶显示装置

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CN (1) CN105759472A (zh)
WO (1) WO2017190403A1 (zh)

Families Citing this family (4)

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Publication number Priority date Publication date Assignee Title
CN106783869B (zh) * 2016-09-07 2019-11-22 武汉华星光电技术有限公司 薄膜晶体管阵列基板及其制造方法
CN106128345A (zh) * 2016-09-12 2016-11-16 昆山国显光电有限公司 测试电路、阵列基板、显示面板及测试方法
CN107331337A (zh) * 2017-07-31 2017-11-07 京东方科技集团股份有限公司 阵列基板及其测试装置、方法以及显示装置
CN109256073A (zh) * 2018-11-09 2019-01-22 惠科股份有限公司 一种显示面板检测结构及显示设备

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4666252A (en) * 1984-06-29 1987-05-19 Energy Conversion Devices, Inc. High yield liquid crystal display and method of making same
US5936687A (en) * 1997-09-25 1999-08-10 Samsung Electronics Co., Ltd. Liquid crystal display having an electrostatic discharge protection circuit and a method for testing display quality using the circuit
US20020126230A1 (en) * 2000-05-08 2002-09-12 Tomohiro Amano Liquid crystal display device and testing method therefor
US20040046920A1 (en) * 2002-09-10 2004-03-11 Hitachi Displays, Ltd. Liquid crystal display device
US20050146349A1 (en) * 2004-01-02 2005-07-07 Ming-Sheng Lai [testing apparatus for flat-panel display]
US20080106835A1 (en) * 2006-11-08 2008-05-08 Chunghwa Picture Tubes, Ltd. Active device array substrate having electrostatic discharge protection capability
US20130099816A1 (en) * 2010-06-28 2013-04-25 Sharp Kabushiki Kaisha Active matrix substrate, display device, and method for testing the active matrix substrate or the display device
US20130265069A1 (en) * 2012-04-10 2013-10-10 Shenzhen China Star Optoelectronics Technology Co. Ltd. Liquid Crystal Panel, Liquid Crystal Module, and Method Of Determining Reason Behind Bad Display

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI312087B (en) * 2005-08-26 2009-07-11 Au Optronics Corporatio Test circuit for flat panel display device
CN101241281B (zh) * 2007-02-07 2010-09-15 中华映管股份有限公司 主动元件阵列基板
CN101303499B (zh) * 2008-07-02 2011-07-06 友达光电股份有限公司 液晶显示面板装置及其测试方法
CN101609635B (zh) * 2009-07-24 2011-06-15 友达光电（苏州）有限公司 液晶面板测试模组及液晶面板失效模式分析方法
KR101614900B1 (ko) * 2009-10-27 2016-04-25 삼성디스플레이 주식회사 표시 패널
CN102621721B (zh) * 2012-04-10 2015-04-15 深圳市华星光电技术有限公司 液晶面板、液晶模组及厘清其画面不良的原因的方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4666252A (en) * 1984-06-29 1987-05-19 Energy Conversion Devices, Inc. High yield liquid crystal display and method of making same
US5936687A (en) * 1997-09-25 1999-08-10 Samsung Electronics Co., Ltd. Liquid crystal display having an electrostatic discharge protection circuit and a method for testing display quality using the circuit
US20020126230A1 (en) * 2000-05-08 2002-09-12 Tomohiro Amano Liquid crystal display device and testing method therefor
US20040046920A1 (en) * 2002-09-10 2004-03-11 Hitachi Displays, Ltd. Liquid crystal display device
US20050146349A1 (en) * 2004-01-02 2005-07-07 Ming-Sheng Lai [testing apparatus for flat-panel display]
US20080106835A1 (en) * 2006-11-08 2008-05-08 Chunghwa Picture Tubes, Ltd. Active device array substrate having electrostatic discharge protection capability
US20130099816A1 (en) * 2010-06-28 2013-04-25 Sharp Kabushiki Kaisha Active matrix substrate, display device, and method for testing the active matrix substrate or the display device
US20130265069A1 (en) * 2012-04-10 2013-10-10 Shenzhen China Star Optoelectronics Technology Co. Ltd. Liquid Crystal Panel, Liquid Crystal Module, and Method Of Determining Reason Behind Bad Display

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WO2017190403A1 (zh) 2017-11-09

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Owner name: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO.

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:GAN, QIMING;REEL/FRAME:039806/0255

Effective date: 20160607

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION