WO2017168608A1 - Dispositif de mesure de tension sans contact et procédé de mesure de tension sans contact - Google Patents

Dispositif de mesure de tension sans contact et procédé de mesure de tension sans contact Download PDF

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Publication number
WO2017168608A1
WO2017168608A1 PCT/JP2016/060315 JP2016060315W WO2017168608A1 WO 2017168608 A1 WO2017168608 A1 WO 2017168608A1 JP 2016060315 W JP2016060315 W JP 2016060315W WO 2017168608 A1 WO2017168608 A1 WO 2017168608A1
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Prior art keywords
voltage
capacitance
measurement
probe
capacitor
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PCT/JP2016/060315
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English (en)
Japanese (ja)
Inventor
渡邊　一希
古田　太
実 金子
賀仁 成田
明広 今村
一基 多田
Original Assignee
株式会社日立システムズ
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Application filed by 株式会社日立システムズ filed Critical 株式会社日立システムズ
Priority to PCT/JP2016/060315 priority Critical patent/WO2017168608A1/fr
Priority to JP2018507919A priority patent/JPWO2017168608A1/ja
Publication of WO2017168608A1 publication Critical patent/WO2017168608A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/04—Voltage dividers
    • G01R15/06—Voltage dividers having reactive components, e.g. capacitive transformer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof

Definitions

  • the present invention relates to a technique for measuring a voltage in an insulation-coated cable or the like, and in particular, is effective when applied to a non-contact voltage measuring apparatus and a non-contact voltage measuring method for measuring a voltage in a non-contact manner with respect to a conductor in the cable.
  • Non-Patent Document 1 describes a surface potential sensor using an electrostatic induction phenomenon as a technique for measuring a voltage / potential without contact with an object.
  • the electrostatic field intensity from the charged object is periodically changed by the vibrating electrode.
  • the induced charge generated in the detection electrode is periodically changed, and the displacement current flowing from the detection electrode to the ground electrode is converted into an AC voltage signal to obtain the charged potential of the charged object.
  • Non-Patent Document 2 describes a vibration capacity type surface potential meter.
  • the capacitance generated between the sensor electrode in the probe and the surface to be measured is changed by a tuning fork in the probe to induce a signal in which the surface potential is AC-modulated in the sensor electrode. Then, this is input to an integral type high voltage generator to generate a high potential and fed back to the probe. It is described that the error of the measured value due to the distance between the probe and the measured surface is reduced by raising the potential of the probe body to the same potential as the measured surface and canceling the capacitance.
  • Patent Document 1 describes a non-contact voltage measuring device that measures a voltage in an insulation-coated cable or the like in a non-contact manner with respect to a conductor in the cable.
  • the voltage to be measured is derived based on the voltage detected at the detection point set on the electric circuit that obtains the voltage induced in the probe by the coupling capacitance between the probe and the conductor.
  • the potential at the detection point and the electric potential at the electric field shield are made equal while maintaining a state in which no current flows from the detection point to the electric field shield.
  • the leakage current does not flow through the parasitic capacitance generated between the detection point and the electric field shield, so that the parasitic capacitance can be ignored and the voltage at the detection point can be detected with high accuracy.
  • Non-Patent Document 2 it is necessary to adjust the potential of the probe itself to the level of the measurement target. Therefore, depending on the object to be measured, a high potential must be generated on the probe and measurement device side, which causes a problem that the circuit load increases.
  • a non-contact voltage measuring apparatus is a non-contact voltage measuring apparatus that measures a voltage of a measurement object made of an insulating-coated conductor in a non-contact manner from above the insulating coating, Based on the first probe and the second probe to be mounted on the measurement object, and the first measurement voltage and the second measurement voltage measured by the first probe and the second probe, And a measurement unit that obtains and outputs a voltage.
  • the first probe and the second probe are formed with a first capacitor and a second capacitor having different capacitance values, respectively, and the measurement unit is configured to transmit the first probe and the second probe.
  • a voltage evaluation unit that evaluates the first measurement voltage and the second measurement voltage measured by the probe; the first measurement voltage and the second measurement voltage that are evaluated by the voltage evaluation unit; And an arithmetic unit that calculates the voltage of the measurement target based on the first capacitance and the capacitance value of the second capacitance.
  • the representative embodiment of the present invention it is possible to measure the voltage in a non-contact manner without depending on the condition of the measurement target. Further, not only the AC voltage but also the DC voltage can be measured with high accuracy. Further, the voltage on the measuring device side can be reduced.
  • FIG. 1 is a diagram showing an outline of a configuration example of a non-contact voltage measuring apparatus according to Embodiment 1 of the present invention.
  • the non-contact voltage measuring device 1 includes a probe pair 10 and a measuring unit 20, for example.
  • the probe pair 10 is a member including, for example, a plurality of probes 11 (indicated by two probes A (11a) and B (11b) in the example of FIG. 1) connected to the measurement unit 20 with cables. .
  • the user mounts the probe pair 10 on a cable to be measured and measures the voltage.
  • “mounting” means attaching the measurement surface of the probe pair 10 so as to be in contact with the measurement target, such as placing the probe pair 10 on the measurement target, pinching the measurement target, or winding the measurement target.
  • each probe 11 is previously formed with a capacitance having a different value by an electrode and a dielectric (not shown).
  • a coupling capacitance is formed between each probe 11 and the conductor to be measured, and the voltage of the measuring object is measured by the capacitive coupling method.
  • it is necessary to keep the relative positional relationship of the probe A (11a) and the probe B (11b) with respect to the measurement object constant when the probe pair 10 is mounted on the measurement object.
  • each probe 11 is fixed to a member of the probe pair 10 and integrated as the probe pair 10. That is, the positions of the probe A (11a) and the probe B (11b) are fixed with respect to the probe pair 10, and the relative positions are also fixed between them. Thereby, the relative positional relationship of the probe A (11a) and the probe B (11b) with respect to the measurement object, that is, the measurement conditions can be maintained constant. And it is possible to measure the voltage by switching between the probe A (11a) and the probe B (11b) in one measurement under the same measurement conditions. Further, the measurer does not need to attach the probe A (11a) and the probe B (11b) individually to the measurement object, and can attach the probe A (11a) and the probe B (11b) as a whole with a single operation on the probe pair 10.
  • the shape and structure of the probe pair 10 are not particularly limited.
  • it may have a shape that the measurer presses against the measuring device, or may have a shape such as a clip or a clothespin that sandwiches and fixes a measurement object such as a cable. .
  • the measurement unit 20 is a portable device configured by, for example, a CPU (Central Processing Unit) or an integrated circuit, and obtains and outputs a voltage to be measured based on the content measured by the probe pair 10. It is not necessary for all the components to be integrally formed, and a part of the components may be configured by another device or an information processing apparatus, and these may be linked.
  • the measurement unit 20 includes, for example, a reference capacitor 21 (indicated by two reference capacitors A (21a) and B (21b) in the example of FIG. 1), a voltage evaluation unit 22, a calculation unit 23, a display unit 24, and the like. It has each part.
  • Each reference capacity 21 is a capacity of a different value, and is a reference capacity used for calculating the voltage to be measured based on the voltage measured by the corresponding probe 11, as will be described later. Further, the voltage measured by the probe 11 is divided by the pair of the coupling capacitance formed between the probe 11 and the measurement target, thereby reducing the voltage on the measurement unit 20 side.
  • the voltage evaluation unit 22 evaluates the voltage divided by the pair of the reference capacitance 21 and the coupling capacitance formed between each probe 11 and the measurement target for the voltage to be measured. Based on the evaluation result of the voltage evaluation unit 22 and the known capacity in the non-contact voltage measuring device 1, that is, the capacity formed in each probe 11 and the value of each reference capacity 21, the calculation unit 23 is a measurement target. Is calculated and output.
  • the display unit 24 includes a display device such as a liquid crystal display (not shown), for example, and lays out the result output from the calculation unit 23 for display and displays the result on the display device.
  • FIG. 2 is a diagram illustrating a method for measuring a voltage by the capacitive coupling method in the present embodiment.
  • an example in which an insulation-coated cable is used as a measurement object 2 is schematically shown by a cross-sectional shape of the cable.
  • a black portion of the cable is an insulation coating, and shows a state where the probe pair 10 is mounted on the insulation coating of the cable.
  • a coupling capacitance C X whose value is unknown is formed in the portion of the insulation coating between the probe 11 and the conductor of the measuring object 2.
  • the reference capacitance A (21a) and the reference capacitor B (21b), respectively, the value is C A and C B are known, connected to the capacitor in series with C Y and C Z formed in each probe 11 It has been shown.
  • each probe 11 and the measurement target 2 are connected. with estimates the C X formed, it calculates the voltage V X of the measurement object 2.
  • V 1A and V 2A are voltages divided by a capacitance pair of C XY that is the coupling capacitance on the probe A (11a) side and C A that is the reference capacitance A (21a) for V X to be measured.
  • V 2B as shown
  • V 2A and V 2B which are partial pressures to be evaluated by the measurement unit 20 are left
  • the relationship (1) becomes (V X ⁇ V 2A ):
  • V 2A C A : C XY
  • the relationship (2) can be expressed as (V X ⁇ V 2B ):
  • V 2B C B : C XZ .
  • C XY is expressed by the following equation.
  • V X is expressed by the following equation.
  • Equation 2 C XY in Equation 2 is expressed by the following equation.
  • C X can be obtained by the following series of equations.
  • V X can be obtained from the following formulas from Formula 3 and Formula 5.
  • the computing unit 23 can calculate the value of V X (and C X according to Equation 5) using Equation 6.
  • the reference capacitance A (21a) and the reference capacitor B (21b), respectively are assumed to have a capacitance different values C A and C B, above by the same volume It is also possible to simplify the calculation.
  • the capacitive coupling is performed using the probe pair 11 including the probes 11 in which capacitances having different conditions are formed in advance.
  • the voltage is measured in a contactless manner.
  • the voltages (V 2A and V 2B in the example of FIG. 2) divided by the two capacity pairs (C XY and C A and C XZ and C B in the example of FIG. 2) are evaluated and based on this calculating the voltage V X of the measured Te.
  • the voltage reduction on the measurement unit 20 side can be realized by the capacity division.
  • the capacity division using the reference capacitor 21 is not necessarily performed.
  • the voltage V X to be measured can be calculated in a non-contact manner.
  • the voltage V X to be measured is an alternating current (AC) voltage can be measured without any problem.
  • the voltage to be measured is a direct current (DC) voltage
  • the charge escapes from the coupling capacitance, and it is difficult to measure the correct value in a state where “burning” occurs.
  • the non-contact voltage measuring apparatus 1 refreshes the vibrating unit by changing (vibrating) the capacitance value of the reference capacitance on the measuring unit 20 side.
  • FIG. 3 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the second embodiment of the present invention. Since the configuration of the non-contact voltage measuring apparatus 1 is basically the same as that shown in FIG. 2 of the first embodiment, only the differences will be described, and the others will be omitted.
  • the two reference capacitors 21 of the measurement unit 20 are represented by two of the variable capacitors 25 (in the example of FIG. 3, variable capacitors A (25a) and B (25b)). Replaced). Moreover, it has the vibration control part 26 which vibrates the capacitance value of each variable capacity
  • FIG. 3 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the second embodiment of the present invention. Since the configuration of the non-contact voltage measuring apparatus 1 is basically the same as that shown in FIG. 2 of the first embodiment, only the differences will be described, and the others will be omitted.
  • the two reference capacitors 21 of the measurement unit 20 are represented by two of the variable capacitor
  • variable capacitor 25 and the vibration control unit 26 that is, a method for evaluating the DC voltage by vibrating the capacitance value of the variable capacitor 25
  • a known technique can be used as appropriate. Specifically, for example, pp. Of “Basics of Electrical and Electronic Measurement-From Error to Uncertainty” (Hiroo Yamazaki, The Institute of Electrical Engineers of Japan, 2005/03, hereinafter referred to as “references”). Means for measuring voltage with high impedance, such as described in 114, can be used.
  • FIG. 4 is a diagram showing an outline of an example of means for measuring voltage with high impedance.
  • 4A shows an example of a basic form
  • FIG. 4B shows an example of a circuit when incorporated in feedback control.
  • the measurement potential portion is isolated by a capacitor to maintain a high impedance.
  • the capacitance is vibrated by the vibrator, and an oscillating voltage having an amplitude proportional to the voltage to be measured (electric field strength) is taken out via a capacitor (AC coupling).
  • AC coupling a capacitor
  • a DC voltage proportional to the voltage to be measured (electric field strength) is taken out.
  • FIG. 5 is a diagram showing an outline of an example of means for realizing the vibration capacity in a solid state.
  • FIG. 5A shows a basic form
  • FIG. 5B shows an example of a circuit when incorporated in feedback control.
  • the vibration voltage is generated by replacing the mechanical vibration capacity in the above-described example of FIG. 4 with a solid variable capacitance diode. Considering that the diode is non-linear except near zero voltage and that the capacitance itself changes with an electric field, it is desirable to incorporate the feedback control as shown in FIG.
  • V 2A DC voltage
  • V 2B DC voltage
  • the reference capacitor on the measuring unit 20 side is configured as the variable capacitor 25, and the circuit is vibrated physically or electrically. Let me refresh. As a result, it is possible to eliminate the influence of the leakage current and evaluate the voltage (V 2A , V 2B ) divided by the capacity pair with high impedance, and not only the alternating current (AC) voltage but also the direct current (DC) voltage. Can also be measured with high accuracy.
  • the reference potential when evaluating the voltages (V 2A , V 2B ) divided by the capacity pair is the ground or the like according to the measurement object 2.
  • the voltage difference between two arbitrary points in the measuring object 2 is measured in the actual measurement.
  • FIG. 6 is a diagram showing an outline of a configuration example of the non-contact voltage measuring apparatus according to the third embodiment of the present invention.
  • this basic configuration two sets (two sets) of the probe pair 10 and the measurement unit 20 shown in FIG. 2 of the first embodiment are provided in parallel, and these reference potentials are shared. Is.
  • Capacitances (C Y , C Z , and C ′ Y , C ′ Z ) formed in the probe pair 10 and the probe pair 10 ′ have different capacitance values depending on dielectrics having different thicknesses (or dielectric constants). It is formed to have.
  • the capacitors (C A , C B , and C ′ A , C ′ B ) formed in the reference capacitor 21 and the reference capacitor 21 ′ are also formed to have different capacitance values.
  • the difference calculation unit 27 calculates the difference between the obtained V X and V ′ X.
  • the display unit 24 displays the value calculated by the difference calculation unit 27 as a final display value.
  • FIG. 6 two sets of the probe pair 10 and the measurement unit 20 shown in FIG. 2 of the above-described first embodiment are provided, but FIG. 3 of the second embodiment.
  • the present invention can be applied to the configuration of the probe pair 10 and the measurement unit 20 shown in FIG.
  • the non-contact voltage measuring apparatus 1 which is Embodiment 3 of this invention, it is set as the structure which measures a voltage between two arbitrary points of the measuring object 2, and uses the difference. Thereby, it is not necessary to make the reference potential depend on the measurement object 2, and it is possible to efficiently perform non-contact voltage measurement on a wider range of measurement objects 2.
  • the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the invention. Needless to say.
  • the above-described embodiment has been described in detail for easy understanding of the present invention, and is not necessarily limited to the one having all the configurations described.
  • a part of the configuration of one embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of one embodiment. .
  • the present invention can be used for a non-contact voltage measuring device and a non-contact voltage measuring method for measuring a voltage in a non-contact manner with respect to a conductor in a cable.
  • Non-contact voltage measuring device 10, 10 '... probe pair, 11a, 11'a ... probe A, 11b, 11'b ... probe B, 20 ... Measurement unit, 21a, 21'a ... Reference capacitance A, 21b, 21'b ... Reference capacitance B, 22, 22 '... Voltage evaluation unit, 23, 23' ... Calculation unit, 24 ... Display unit, 25a ... Variable Capacity A, 25b ... Variable capacity B, 26 ... Vibration control section, 27 ... Difference calculation section

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)

Abstract

L'invention concerne un dispositif de mesure de tension sans contact (1) pour mesurer sans contact la tension d'un objet de mesure (2), le dispositif de mesure de tension sans contact (1) comportant une sonde A (11a) et une sonde B (11b) montées sur l'objet de mesure (2), et une unité de mesure (20) pour déterminer la tension de l'objet de mesure (2) et délivrer la tension déterminée sur la base d'une première tension mesurée et d'une seconde tension mesurée mesurées par la sonde A (11a) et la sonde B (11b) ; un CY et un CZ ayant des valeurs de capacité différentes sont respectivement formés dans la sonde A (11a) et la sonde B (11b) ; et l'unité de mesure (20) comprend une unité d'évaluation de tension (22) pour évaluer la première tension mesurée et la seconde tension mesurée mesurées par la sonde A (11a) et la sonde B (11b), et une unité de calcul (23) pour calculer la tension de l'objet de mesure (2) sur la base de la première tension mesurée et de la seconde tension mesurée évaluées par l'unité d'évaluation de tension (22) et des valeurs de capacité du CY et du CZ.
PCT/JP2016/060315 2016-03-30 2016-03-30 Dispositif de mesure de tension sans contact et procédé de mesure de tension sans contact WO2017168608A1 (fr)

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PCT/JP2016/060315 WO2017168608A1 (fr) 2016-03-30 2016-03-30 Dispositif de mesure de tension sans contact et procédé de mesure de tension sans contact
JP2018507919A JPWO2017168608A1 (ja) 2016-03-30 2016-03-30 非接触電圧測定装置および非接触電圧測定方法

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111562427A (zh) * 2020-05-25 2020-08-21 北京全路通信信号研究设计院集团有限公司 一种非接触式任意波形交变电压测量装置
WO2021048975A1 (fr) * 2019-09-12 2021-03-18 イイダ電子株式会社 Dispositif de mesure de tension sans contact
CN113358913A (zh) * 2021-06-11 2021-09-07 南方电网数字电网研究院有限公司 电压检测装置和方法
CN114487557A (zh) * 2022-04-02 2022-05-13 南方电网数字电网研究院有限公司 非侵入式电压测量装置
WO2022172312A1 (fr) * 2021-02-09 2022-08-18 三菱電機株式会社 Dispositif de mesure de tension sans contact et procédé de mesure de tension sans contact
EP4343340A1 (fr) * 2022-09-26 2024-03-27 Honeywell International Inc. Systèmes, procédés et appareils de détection de tension sans contact

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JPS62113072A (ja) * 1985-11-12 1987-05-23 Murata Mfg Co Ltd 表面電位検出装置
JPH0328776A (ja) * 1989-03-01 1991-02-06 Toyota Central Res & Dev Lab Inc 静電気特性評価装置
JPH04113274A (ja) * 1990-09-04 1992-04-14 Toshiba Corp 電圧検出装置
JP2003028900A (ja) * 2001-07-11 2003-01-29 Yokogawa Electric Corp 非接触電圧測定方法およびその装置
JP2006084380A (ja) * 2004-09-17 2006-03-30 Yokogawa Electric Corp 非接触電圧測定装置
JP2006242855A (ja) * 2005-03-04 2006-09-14 Nippon Telegraph & Telephone East Corp 非接触型電圧検出方法及び非接触型電圧検出装置
JP2007195137A (ja) * 2005-12-20 2007-08-02 Hioki Ee Corp 可変容量回路、電圧測定装置および電力測定装置
JP2014514557A (ja) * 2011-04-14 2014-06-19 シーメンス アクチエンゲゼルシヤフト 電束に関する異なる二つの値によって対象物の電位を非接触式に検出するための方法並びに装置

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55177664U (fr) * 1979-06-06 1980-12-19
JPS62113072A (ja) * 1985-11-12 1987-05-23 Murata Mfg Co Ltd 表面電位検出装置
JPH0328776A (ja) * 1989-03-01 1991-02-06 Toyota Central Res & Dev Lab Inc 静電気特性評価装置
JPH04113274A (ja) * 1990-09-04 1992-04-14 Toshiba Corp 電圧検出装置
JP2003028900A (ja) * 2001-07-11 2003-01-29 Yokogawa Electric Corp 非接触電圧測定方法およびその装置
JP2006084380A (ja) * 2004-09-17 2006-03-30 Yokogawa Electric Corp 非接触電圧測定装置
JP2006242855A (ja) * 2005-03-04 2006-09-14 Nippon Telegraph & Telephone East Corp 非接触型電圧検出方法及び非接触型電圧検出装置
JP2007195137A (ja) * 2005-12-20 2007-08-02 Hioki Ee Corp 可変容量回路、電圧測定装置および電力測定装置
JP2014514557A (ja) * 2011-04-14 2014-06-19 シーメンス アクチエンゲゼルシヤフト 電束に関する異なる二つの値によって対象物の電位を非接触式に検出するための方法並びに装置

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021048975A1 (fr) * 2019-09-12 2021-03-18 イイダ電子株式会社 Dispositif de mesure de tension sans contact
JPWO2021048975A1 (ja) * 2019-09-12 2021-11-11 イイダ電子株式会社 非接触型電圧計測装置
JP7117804B2 (ja) 2019-09-12 2022-08-15 イイダ電子株式会社 非接触型電圧計測装置
CN111562427A (zh) * 2020-05-25 2020-08-21 北京全路通信信号研究设计院集团有限公司 一种非接触式任意波形交变电压测量装置
CN111562427B (zh) * 2020-05-25 2022-09-09 北京全路通信信号研究设计院集团有限公司 一种非接触式任意波形交变电压测量装置
WO2022172312A1 (fr) * 2021-02-09 2022-08-18 三菱電機株式会社 Dispositif de mesure de tension sans contact et procédé de mesure de tension sans contact
JP7237264B1 (ja) * 2021-02-09 2023-03-10 三菱電機株式会社 非接触電圧測定装置および非接触電圧測定方法
CN113358913A (zh) * 2021-06-11 2021-09-07 南方电网数字电网研究院有限公司 电压检测装置和方法
CN113358913B (zh) * 2021-06-11 2022-03-08 南方电网数字电网研究院有限公司 电压检测装置和方法
CN114487557A (zh) * 2022-04-02 2022-05-13 南方电网数字电网研究院有限公司 非侵入式电压测量装置
EP4343340A1 (fr) * 2022-09-26 2024-03-27 Honeywell International Inc. Systèmes, procédés et appareils de détection de tension sans contact

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