WO2015133212A1 - Appareil de mesure de tension et procédé de mesure de tension - Google Patents

Appareil de mesure de tension et procédé de mesure de tension Download PDF

Info

Publication number
WO2015133212A1
WO2015133212A1 PCT/JP2015/052743 JP2015052743W WO2015133212A1 WO 2015133212 A1 WO2015133212 A1 WO 2015133212A1 JP 2015052743 W JP2015052743 W JP 2015052743W WO 2015133212 A1 WO2015133212 A1 WO 2015133212A1
Authority
WO
WIPO (PCT)
Prior art keywords
voltage
phase
absolute value
probe
measuring
Prior art date
Application number
PCT/JP2015/052743
Other languages
English (en)
Japanese (ja)
Inventor
裕幸 徳崎
紘 今井
圭記 松浦
真央 荻本
Original Assignee
オムロン株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by オムロン株式会社 filed Critical オムロン株式会社
Publication of WO2015133212A1 publication Critical patent/WO2015133212A1/fr

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents

Definitions

  • the present invention relates to a voltage measuring apparatus and a voltage measuring method for measuring an alternating voltage flowing through a conductor in an insulating-coated wiring without contacting the wiring conductor.
  • a non-contact voltage measuring device is used for this kind of voltage measurement.
  • This voltage measuring device is a device that measures an alternating voltage flowing through a conductor in a wiring covered with insulation without contacting the conductor of the wiring, and is disclosed in Patent Document 1, for example.
  • FIG. 8 is a schematic circuit diagram showing the configuration of the voltage measuring apparatus 101.
  • the voltage measurement apparatus 101 includes a detection probe 111 that functions as a detection electrode.
  • the detection probe 111 covers at least a part of the surface of the insulation coating of the electric wire 112 to be measured for voltage.
  • a coupling capacitor CL is formed between the conductor of the electric wire 112 and the detection probe 111.
  • a detection impedance Z S is connected between the detection probe 111 and GND, and a voltage is generated at both ends of the detection impedance Z S by an AC voltage V L flowing through the conductor of the electric wire 112. This voltage is output as the output value V out of the detection probe 111.
  • the output value V out is detected impedance Z S side of the voltage of the conductors of the voltage V L binding and detecting the impedance Z S capacitance C L and at divided voltage of the wire 112.
  • FIG. 9 shows a non-contact voltage measuring device 102 (hereinafter simply referred to as voltage measuring device 102) in which the detection impedance Z S is composed of capacitors C 1 and C 2 in the voltage measuring device 101 shown in FIG. It is a schematic circuit diagram which shows the structure of these.
  • capacitors C 1 and C 2 have one end connected to the detection probe 111 and the other end connected to GND via the changeover switch 114.
  • the changeover switch 114 switches so that one of the capacitors C 1 and C 2 is electrically connected to the detection probe 111.
  • the voltage measuring apparatus 102 by using the changeover switch 114, a voltage is applied to the capacitor C 1, and the voltage applied to the capacitor C 2, respectively, are measured as the output value V out1 and V out2.
  • the voltage V L is calculated from the measured output values V out1 and V out2 in the following procedure.
  • the absolute value of the AC voltage (voltage V L ) of the electric wire 112 can be measured.
  • the resistance of the covering of the electric wire 112 corresponding to a conductor-probe resistance RL described later
  • the phase of the AC voltage of the electric wire 112 is accurately measured by the resistance of the covering. Can not do it.
  • the measured phase is deviated from the original phase due to the presence of the resistance of the covering of the electric wire 112. Become.
  • the detection sensitivity of the absolute value of the AC voltage of the electric wire 112 decreases, The absolute value of the AC voltage of the electric wire 112 cannot be measured accurately. That is, in the measurement of the phase of the AC voltage of the electric wire 112, it is necessary to set the detection impedance so that the combined capacitance of the detection probe 111 (detection electrode) and the detection impedance can be regarded as a pure capacitance component. When set, the detection sensitivity of the absolute value of the AC voltage of the electric wire 112 is lowered.
  • an object of the present invention is to provide a voltage measuring apparatus and a voltage measuring method capable of accurately measuring the absolute value of the AC voltage of the electric wire and the phase of the AC voltage of the electric wire with a simple configuration.
  • a voltage measuring apparatus is a voltage measuring apparatus that measures the absolute value and phase of an alternating voltage flowing through a conductor of a wire in a non-contact manner with the conductor.
  • the absolute value and phase of the AC voltage of the electric wire can be accurately measured with a simple configuration.
  • FIG. 2A is a circuit diagram showing the first and second states of the non-contact voltage measuring device shown in FIG. 1
  • FIG. 2B is a circuit diagram of the non-contact voltage measuring device shown in FIG. It is a circuit diagram which shows a 3rd state. It is a figure which shows the equivalent circuit of the non-contact voltage measuring apparatus shown in FIG.
  • FIG. 2 is an explanatory diagram illustrating a state in which a coupling capacitance and a conductor-probe resistance are generated between the conductor of the electric wire illustrated in FIG. 1 and a detection probe.
  • 1 is a graph showing the relationship between the coupling capacity and the AC voltage of the electric wire in the configuration shown in FIG.
  • FIG. 3 is a graph showing the relationship between the conductor-probe resistance and the phase delay amount of the AC voltage of the electric wire when the value of the capacitor C3 is changed in the non-contact voltage measuring apparatus shown in FIG.
  • FIG. 3 is a circuit diagram showing an example in which one variable capacitor is provided as an impedance element instead of two capacitors in the voltage absolute value measurement circuit shown in FIG.
  • It is a schematic circuit diagram which shows the structure of the conventional non-contact voltage measuring apparatus.
  • FIG. 8 is comprised with two capacitors.
  • FIG. 1 is a schematic circuit diagram showing a configuration of a non-contact voltage measuring device (hereinafter simply referred to as a voltage measuring device) 1.
  • the conductor 13 of the electric wire 12 to be subjected to voltage measurement is covered with an insulating layer 14, and the voltage measuring apparatus 1 measures the AC voltage (absolute value) and phase flowing through the conductor 13 without contacting the conductor 13. .
  • the voltage measuring apparatus 1 includes a detection probe (probe) 11, detection capacitors C 1 to C 3 , a changeover switch (switching unit) 15, a detection resistor (first impedance element) R S and a calculation unit. 17 is provided.
  • the detection probe 11 includes an electrode that can be attached so as to surround the outer peripheral surface of the covering layer 14 of the electric wire 12.
  • One end of each of the capacitors C 1 to C 3 is connected to the detection probe 11, and the other end is connected to the detection resistor R S via the changeover switch 15.
  • the changeover switch 15 switches so that any one of the capacitors C 1 to C 3 is electrically connected to the detection probe 11.
  • One end of the detection resistor RS is connected to the changeover switch 15 and the other end is connected to GND (GND of the voltage measuring device 1).
  • a detection voltage output point 16 is provided between the changeover switch 15 and the detection resistor RS .
  • the computing unit 17 obtains the absolute value and phase of the AC voltage flowing through the electric wire 12 based on the voltage obtained from the detection voltage output point 16.
  • the detection probe 11 is switched to the detection probe 11 in the first state in which the capacitor (impedance setting unit) C 1 and the detection resistor RS are connected in series to the detection probe 11 by switching the changeover switch 15.
  • a second state in which the capacitor (impedance setting unit) C 2 and the detection resistor R S are connected in series, and the detection probe 11, a capacitor (second impedance element) C 3 and the detection resistor R S is A third state connected in series occurs.
  • the first state and the second state constitute a voltage absolute value measurement circuit 18 that measures the absolute value of the voltage of the electric wire 12 ((a) of FIG. 2).
  • the third state constitutes the phase measurement circuit 19 that measures the phase of the voltage of the electric wire 12 ((b) of FIG. 2).
  • the changeover switch 15 is switched so that either one of the capacitors C 1 and C 2 is electrically connected to the detection probe 11 in the first state, and is connected in parallel in the second state.
  • the capacitors C 1 and C 2 may be switched so as to be electrically connected to the detection probe 11.
  • FIG. 3 is a diagram showing an equivalent circuit of the voltage measuring apparatus 1 shown in FIG.
  • FIG. 4 is an explanatory diagram illustrating a state in which a coupling capacitance C L and a conductor-probe resistance R L are generated between the conductor 13 of the electric wire 12 and the detection probe 11.
  • FIG. 3 shows the voltage measuring apparatus 1 shown in FIG. 1 as an equivalent circuit.
  • a coupling capacitor C L and a conductor-probe resistance R L are connected in parallel between the conductor 13 of the electric wire 12 and the capacitors C 1 to C 3 .
  • the coupling capacitance C L is proportional to the size (electrode area) of the detection probe 11. Therefore, as the detection probe 11 is small, the value of the coupling capacitance C L is small. Value of the coupling capacitance C L is, for example, several pF ⁇ number 10 pF.
  • the voltage measuring device 1 When the voltage measuring device 1 is in the first state, the voltage V L of the conductor 13 of the electric wire 12 is divided between the detection resistor R S , the capacitor C 1, and the coupling capacitance C L. On the other hand, when the voltage measuring device 1 is in the second state, the voltage V L of the conductor 13 of the electric wire 12 is divided between the detection resistor R S , the capacitor C 2, and the coupling capacitance C L.
  • the calculating part 17 calculates
  • Vout which is the voltage (voltage of the both ends of detection resistance RS ) of the detection voltage output point 16.
  • the calculation unit 17 calculates the absolute value of the voltage V L according to the above-described equations (1) and (2).
  • the detection impedance Z S is replaced with the detection resistor R 1 .
  • measurement sensitivity is higher by increasing the coupling capacitance C L.
  • To increase the coupling capacitance C L may be, for example, increasing the area of the electrodes of the detection probe 11.
  • Magnitude of the coupling capacitance C L may be, for example more than 10 pF.
  • the voltage V L is expressed by the following mathematical formula.
  • the voltage measuring apparatus 1 when the voltage measuring apparatus 1 is in the following state (A), the current flowing through the detection resistor R S is I 1 , the generated voltage is V out1 , and the voltage measuring apparatus 1 is in the following state (B). Sometimes the current flowing through the detection resistor R S is I 2 , and the generated voltage is V out2 .
  • the capacitor C 1 is a state of being connected in series between the coupling capacitor C L and the detection resistor R S
  • state (B) the capacitor C 2 is the detection resistor and the coupling capacitor C L This is a state of being connected in series with RS .
  • the voltage measuring device 1 When the voltage measuring device 1 is in the third state, the voltage V L of the conductor 13 of the electric wire 12 is divided between the detection resistor R S , the capacitor C 3, and the coupling capacitance C L.
  • the calculating part 17 calculates
  • Vout which is the voltage (voltage of the both ends of detection resistance RS ) of the detection voltage output point 16.
  • the calculation unit 17 measures the time of the AC voltage of the electric wire 12 such as a peak, a bottom, or a zero cross point.
  • the coupling capacitance C L does not function as a pure capacitance due to the presence of the conductor-probe resistance R L. For this reason, the phase of the AC voltage of the electric wire 12 is slightly delayed from 90 ° and cannot be measured accurately.
  • the voltage measuring device 1 the coupling capacitance C L, the phase measurement circuit 19 including the inter-conductor probe resistance R L and a capacitor C 3, so that it can be regarded as a pure capacitance component, minute capacitance capacitor C 3 It is said.
  • phase measurement circuit 19 be regarded as a circuit equivalent to a capacitor of approximately 1PF (capacitance component) Can do. That is, the phase measurement circuit 19 is a circuit having a capacitor with high impedance and a detection resistance R S (for example, 100 k ⁇ ) having a small resistance value, and can be fixed in a state where the phase is advanced by 90 °.
  • the phase measurement circuit 19 is a graph showing the capacitor C 3 is 1PF, 10 pF, the relationship between the phase delay of the AC voltage between the conductors probe resistance R L and the wire 12 in each case of 100pF.
  • the conductor-probe resistance RL was 10 G ⁇ (conductor-probe resistance RL generated by the normal coating layer 14 of the electric wire 12), it could be almost zero.
  • the voltage absolute value measuring circuit 18 that is used when measuring the absolute value of the AC voltage of the electric wire 12 sharing the single detection probe 11 and the phase of the AC voltage of the electric wire 12 are used. And a phase measurement circuit 19 used when measuring the above, and these can be switched and used. Thereby, the measurement of the absolute value of the alternating voltage of the electric wire 12 and the measurement of the phase of the alternating voltage of the electric wire 12 can each be performed correctly.
  • the conductor-probe resistance RL cannot be ignored in the phase measurement, and the phase can be accurately determined. It cannot be measured.
  • the capacitor C 2 of the voltage absolute value measuring circuit 18 is replaced with a capacitor having a very small capacity (capacitance value of the capacitor C 3 ), and the voltage absolute value measuring circuit 18 is shared for measuring the absolute value and phase of the AC voltage of the electric wire 12.
  • the capacitor C 2 since the capacitor C 2 has a very small capacity, the absolute value of the AC voltage of the electric wire 12 is measured based on the voltage at the detection voltage output point 16 obtained by switching the capacitors C 1 and C 2 with the changeover switch 15. Difficult to do.
  • the voltage absolute value measurement circuit 18 includes capacitors C 1 , C 2 , and C 3 as impedance elements for setting impedance.
  • the impedance element is not limited to the capacitors C 1 , C 2 , and C 3 , and may be any element that can switch the impedance.
  • the impedance element may be two resistors or two inductors (coils) instead of the capacitors C 1 and C 2 .
  • the impedance element may be one variable capacitance diode or one variable capacitor instead of the capacitors C 1 and C 2 .
  • FIG. 7 shows an example of a voltage absolute value measurement circuit 18 provided with a variable capacitor Cv as an impedance element instead of the capacitors C 1 and C 2 .
  • the switch 15 may be a switch including a relay, an SSR (solid state relay), an FET transistor, an analog switch, or the like.
  • the capacitance switching circuit including the capacitors C 1 , C 2 , C 3 and the switch 15 may be replaced with, for example, a variable capacitance circuit or a variable impedance circuit.
  • the voltage measuring device of the present invention is a voltage measuring device that measures the absolute value and phase of an alternating voltage flowing through a conductor of an electric wire without contact with the conductor, and a coupling capacitance is formed between the conductor and the conductor.
  • One probe a voltage absolute value measuring circuit that obtains a voltage for measuring the absolute value of the AC voltage from the voltage induced in the probe, and the same probe.
  • a phase measurement circuit that obtains a voltage for measuring the phase of the AC voltage from the voltage induced by.
  • the voltage measuring device includes a voltage absolute value measurement circuit that acquires a voltage for measuring the absolute value of the AC voltage of the electric wire, and a voltage for measuring the phase of the AC voltage of the electric wire. And a phase measurement circuit to obtain. Therefore, the voltage absolute value measurement circuit is set to be suitable for obtaining the voltage for measuring the absolute value of the AC voltage of the electric wire, and the phase measurement circuit is a voltage for measuring the phase of the AC voltage of the electric wire. It can be set to be suitable for acquiring. Therefore, it is possible to accurately measure the absolute value and phase of the AC voltage flowing through the conductor of the electric wire.
  • the voltage absolute value measurement circuit and the phase measurement circuit include the same probe, a plurality of probes are unnecessary, and a compact configuration can be achieved.
  • the voltage measurement method of the present invention is a voltage measurement method for measuring the absolute value and phase of an alternating voltage flowing through a conductor of an electric wire without contact with the conductor, and a coupling capacitance is formed between the conductor and the conductor. And a step of obtaining a voltage for measuring an absolute value of the AC voltage from a voltage induced in the probe by a voltage absolute value measurement circuit including the probe, and And a step of acquiring a voltage for measuring a phase of the AC voltage from a voltage induced in the probe by a phase measurement circuit including a probe.
  • the voltage absolute value measurement circuit and the phase measurement circuit may be formed by switching impedance values between the voltage absolute value measurement circuit and the phase measurement circuit.
  • an optimal impedance value can be set with a voltage absolute value measurement circuit and a phase measurement circuit, and the absolute value and phase of the alternating voltage which flows through the conductor of an electric wire can be measured correctly.
  • the voltage absolute value measuring circuit can change an impedance value, and one end is connected to the probe and the other end of the impedance setting unit is connected to the impedance setting unit.
  • the phase measurement circuit includes a second impedance element connected in parallel with the impedance setting unit, and the impedance setting unit stage or the second impedance element with respect to the first impedance element. It is good also as a structure provided with the switch part which switches so that an impedance element of may be electrically connected.
  • the first impedance element is shared by the voltage absolute value measurement circuit and the phase measurement circuit in addition to the probe, a more compact configuration can be achieved.
  • the second impedance element may be a capacitor.
  • the phase measurement circuit can be easily configured using a general-purpose capacitor.
  • the present invention can be used, for example, as an apparatus for measuring an AC voltage flowing through a conductor without contacting the conductor of a distribution board wiring.
  • Non-contact voltage measuring device (voltage measuring device) 11 Detection probe (probe) 12 Electric wire 13 Conductor 14 Coating layer 15 Changeover switch (switching part) 16 Detection Voltage Output Point 17 Calculation Unit 18 Voltage Absolute Value Measurement Circuit 19 Phase Measurement Circuit R s Detection Resistance (First Impedance Element) R L Conductor-probe resistance C 1 capacitor (impedance setting section) C 2 capacitor (impedance setting unit) C 3 capacitor (second impedance element) C L coupling capacity V L voltage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

La présente invention concerne un appareil de mesure de tension (1) qui comprend : une sonde de détection (11) ; un circuit de mesure de valeur absolue de tension (18) qui acquiert une tension destinée à mesurer une valeur absolue d'une tension de courant alternatif à partir d'une tension induite au moyen de la sonde de détection (11) ; et un circuit de mesure de phase (19) qui acquiert une tension destinée à mesurer une phase de la tension de courant alternatif à partir de la tension induite au moyen de la même sonde de détection (11).
PCT/JP2015/052743 2014-03-04 2015-01-30 Appareil de mesure de tension et procédé de mesure de tension WO2015133212A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014-042048 2014-03-04
JP2014042048A JP2015169440A (ja) 2014-03-04 2014-03-04 電圧測定装置および電圧測定方法

Publications (1)

Publication Number Publication Date
WO2015133212A1 true WO2015133212A1 (fr) 2015-09-11

Family

ID=54055022

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2015/052743 WO2015133212A1 (fr) 2014-03-04 2015-01-30 Appareil de mesure de tension et procédé de mesure de tension

Country Status (2)

Country Link
JP (1) JP2015169440A (fr)
WO (1) WO2015133212A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6989346B2 (ja) * 2017-10-26 2022-01-05 大崎電気工業株式会社 電圧測定装置
WO2020027026A1 (fr) * 2018-07-30 2020-02-06 日本電産株式会社 Dispositif de mesure et procédé de mesure
JP7172282B2 (ja) 2018-08-24 2022-11-16 日本電信電話株式会社 コモンモード電圧測定装置およびコモンモード電圧測定方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11511253A (ja) * 1995-08-15 1999-09-28 シーメンス アクチエンゲゼルシヤフト 高圧開閉装置における電気的擾乱に対する測定システム
US20030067295A1 (en) * 2001-10-05 2003-04-10 Bierer Walter S. Voltage detector with improved accuracy
JP2005140506A (ja) * 2003-11-04 2005-06-02 Yokogawa Electric Corp 非接触電圧測定装置
JP2006084380A (ja) * 2004-09-17 2006-03-30 Yokogawa Electric Corp 非接触電圧測定装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11511253A (ja) * 1995-08-15 1999-09-28 シーメンス アクチエンゲゼルシヤフト 高圧開閉装置における電気的擾乱に対する測定システム
US20030067295A1 (en) * 2001-10-05 2003-04-10 Bierer Walter S. Voltage detector with improved accuracy
JP2005140506A (ja) * 2003-11-04 2005-06-02 Yokogawa Electric Corp 非接触電圧測定装置
JP2006084380A (ja) * 2004-09-17 2006-03-30 Yokogawa Electric Corp 非接触電圧測定装置

Also Published As

Publication number Publication date
JP2015169440A (ja) 2015-09-28

Similar Documents

Publication Publication Date Title
WO2015083618A1 (fr) Dispositif de mesure de tension sans contact et procédé associé
JP5847339B1 (ja) 非接触型交流電圧測定装置
JP5951005B2 (ja) 電束に関する異なる二つの値によって対象物の電位を非接触式に検出するための方法並びに装置
WO2015137017A1 (fr) Dispositif de mesure de tension sans contact
JP5737750B2 (ja) 交流電力測定装置
WO2014027422A1 (fr) Dispositif de mesure de puissance à courant alternatif (ca) et procédé de mesure de puissance à courant alternatif (ca)
JP2012225896A (ja) 交流電力測定装置
JP2003028900A (ja) 非接触電圧測定方法およびその装置
JP2002055126A (ja) 非接触式電圧測定方法および装置
WO2020095471A1 (fr) Dispositif de mesure de l'impédance
CN106030738B (zh) 用于监控用于三相交流电网的电容式套管的方法和装置
WO2015133212A1 (fr) Appareil de mesure de tension et procédé de mesure de tension
JP6372164B2 (ja) 電圧計測装置および電圧計測方法
WO2015178051A1 (fr) Dispositif de mesure de tension et procédé de mesure de tension
JP6553875B2 (ja) 電気特性測定装置
EP3206041A1 (fr) Procédé et système de surveillance de douilles de transformateurs
JP4251961B2 (ja) 非接触電圧測定装置
JP6128921B2 (ja) 非停電絶縁診断装置及び非停電絶縁診断方法
JP6354332B2 (ja) 電圧計測装置および電圧計測方法
JP6362414B2 (ja) 電流センサおよび測定装置
JP2014182060A5 (fr)
JP2004177310A (ja) 誘電正接測定器およびそれを用いた非接触電圧測定装置
JP4866998B2 (ja) 電子装置の測定装置
JP5716249B2 (ja) 測定システムのためのアダプタ・コンポーネント
JPH0862267A (ja) 絶縁体の誘電正接測定方法及び電力ケーブルの絶縁劣化診断方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 15758191

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 15758191

Country of ref document: EP

Kind code of ref document: A1