WO2016138744A1 - 检测显示面板表面平坦度的装置及方法 - Google Patents

检测显示面板表面平坦度的装置及方法 Download PDF

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Publication number
WO2016138744A1
WO2016138744A1 PCT/CN2015/087336 CN2015087336W WO2016138744A1 WO 2016138744 A1 WO2016138744 A1 WO 2016138744A1 CN 2015087336 W CN2015087336 W CN 2015087336W WO 2016138744 A1 WO2016138744 A1 WO 2016138744A1
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Prior art keywords
display panel
flatness
detecting
detection
acquisition unit
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PCT/CN2015/087336
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English (en)
French (fr)
Inventor
徐德智
段献学
陈程
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京东方科技集团股份有限公司
合肥京东方光电科技有限公司
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Priority to US14/912,951 priority Critical patent/US9964403B2/en
Publication of WO2016138744A1 publication Critical patent/WO2016138744A1/zh

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0412—Digitisers structurally integrated in a display
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/13338—Input devices, e.g. touch panels
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
    • G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
    • G06F2203/04103—Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10148—Varying focus
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30121—CRT, LCD or plasma display

Definitions

  • the present invention relates to the field of display technologies, and in particular, to a device for detecting the flatness of a surface of a display panel, and a method for detecting the flatness of a surface of the display panel.
  • the display panel includes an array substrate and a counter substrate opposite to the cassette.
  • a structure of a thin film transistor, a pixel electrode, a signal line, and the like on the array substrate and to prepare a color film, a black matrix, or the like on the counter substrate.
  • a spacer is disposed on the array substrate (or the counter substrate), and the sealant is coated on the edge, the array substrate and the counter substrate are aligned, and the liquid crystal is injected to complete the preparation of the display panel.
  • the processes of deposition, glue coating, exposure, development, etching, etc. are sequentially performed.
  • the flatness of the surface of the display panel is likely to cause the exposure to be misaligned, which may affect the shape and accuracy of the touch electrode. Therefore, for the On-Cell type touch display panel, it is more necessary to detect the flatness of the surface of the display panel after the array substrate and the counter substrate to the front of the box before forming the touch electrode, so as to avoid the poor flatness affecting the subsequent The formation of a touch electrode.
  • the flatness of the surface of the display panel is generally detected by using a probe across the surface of the display panel.
  • the probe is in contact with the display panel, and there is friction between the two, so that scratches are easily generated on the display panel, and contaminants such as powder/particles are generated, thereby causing damage and display of the display panel. Panel cleanliness damage.
  • the present invention aims to solve at least one of the technical problems existing in the prior art.
  • an apparatus and method for detecting the flatness of a surface of a display panel which does not need to contact the display panel during the process of detecting the flatness of the surface of the display panel, and can avoid damage and contamination of the display panel.
  • an aspect of the present invention provides an apparatus for detecting a flatness of a surface of a display panel, comprising: a carrier base, an image acquisition unit, and a data processing unit; wherein the carrier base is used to carry a display panel
  • the image acquisition unit moves in a detection plane parallel to the bearing surface of the bearing base for guiding the preset detection points in the surface of the display panel facing the image acquisition unit in a direction perpendicular to the bearing surface of the bearing base Focusing on to obtain a focal length at the completion of focusing, and transmitting focal length data indicating a focal length to the data processing unit;
  • the data processing unit is configured to calculate each detection point according to the focal length data sent by the image collecting unit
  • the flatness of the surface of the display panel facing the image acquisition unit is determined according to the distance from the detection plane.
  • each detection point is evenly distributed on the surface of the display panel facing the image acquisition unit.
  • the data processing unit is further configured to generate a contour map of the display panel facing the surface of the image acquisition unit according to the distance of each detection point relative to the detection plane; the apparatus for detecting the surface flatness of the display panel further includes a monitor, Used to display a contour map generated by the data processing unit.
  • the image acquisition unit includes a first acquisition module and a second acquisition module; the first acquisition module is configured to collect an image of all areas of the surface of the display panel that face the image acquisition unit; the second collection module It is used to capture the pattern at each detection point and focus on the pattern.
  • the data processing unit is further configured to identify a preset marker point in the image acquired by the first acquisition module to establish a basic coordinate system and an accurate coordinate system; the basic coordinate system is used to identify the display Whether the panel is offset from a normal position for detecting surface flatness; the precise coordinate system is for determining an image-oriented unit facing the display panel The coordinates of each point on the surface.
  • the second acquisition module performs a zoom range of 10 to 100 times for each detection point.
  • the second acquisition module comprises a lens and a plurality of focusing components, each focusing component having a different zoomable range.
  • the present invention also provides a method of detecting flatness of a surface of a display panel, comprising:
  • step S1 the carrier base is horizontally set.
  • the method further comprises the step S0 before detecting step S1: detecting the levelness of the bearing base, and correcting when the level of the bearing base exceeds a preset range.
  • the method further comprises, after step S1 and before step S2, step S2a: collecting an image of all areas of the surface of the display panel facing the image acquisition unit, and identifying the preset marker points in the image, Establishing a base coordinate system for identifying whether the display panel is offset from a normal position for detecting surface flatness; and an accurate coordinate system for determining an image facing the display panel The coordinates of each point on the surface of the acquisition unit.
  • the method for detecting the flatness of the surface of the display panel further comprises after step S3:
  • the display panel includes an array substrate and a counter substrate with a pair of boxes, and a touch electrode for implementing a touch function; the touch electrodes are disposed on the pair of cassette substrates, and the touch The electrode and the array substrate are respectively located on two sides of the pair of the substrate; before the forming the touch electrode on the pair of the substrate, performing any of the foregoing methods for detecting the flatness of the surface of the display panel, and The surface of the detected display panel is the surface of the counter substrate.
  • each detection point on the surface facing the image acquisition unit of the display panel placed on the carrier base is focused, and the corresponding detection is calculated according to the focal length at the completion of focusing.
  • the distance from the point to the detection plane determines the flatness of the surface of the display panel facing the image acquisition unit.
  • the plurality of detection points on the surface of the display panel facing the image acquisition unit are focused, and the distance between each detection point and the detection plane is calculated according to the focal length at the completion of the focus. Thereby determining the flatness of the surface of the display panel.
  • the invention can detect the flatness of the surface of the display panel without contacting the display panel, and avoid damage and pollution to the display panel.
  • FIG. 1 is a schematic diagram of an apparatus for detecting the flatness of a surface of a display panel according to an embodiment of the present invention
  • FIG. 2 is a schematic diagram of an image acquisition unit in accordance with one embodiment of the present invention.
  • FIG. 3 is a flow chart of a method of detecting surface flatness of a display panel, in accordance with one embodiment of the present invention.
  • FIG. 4 is a schematic diagram of a display panel detected by a detecting method according to an embodiment of the present invention.
  • FIG. 5 is a flow chart of a method of detecting surface flatness of a display panel in accordance with other embodiments of the present invention.
  • 10 bearing base station; 11: image collecting unit; 12: data processing unit; 13: monitor; 20: display panel; 110: first acquisition module; 111: second acquisition module; 200: array substrate; 201: pair Box substrate; 202: touch electrode; 1110: lens; 1111, 1112: focus component.
  • FIG. 1 is a schematic diagram of an apparatus for detecting the flatness of a surface of a display panel according to an embodiment of the present invention.
  • the apparatus for detecting the flatness of the surface of the display panel includes a carrier base 10, an image acquisition unit 11, and a data processing unit 12.
  • the carrier base 10 is used to carry the display panel 20.
  • the image acquisition unit 11 moves in a detection plane parallel to the bearing surface of the carrier base 10 for focusing on a direction perpendicular to the bearing surface for each detection point preset in the surface of the display panel 20 facing the image acquisition unit 11.
  • the data processing unit 12 is configured to calculate a distance of each detection point relative to the detection plane according to the focal length data sent by the image acquisition unit 11, and determine the surface of the display panel 20 facing the image acquisition unit 11 according to the determination. flatness.
  • the detection point and the image acquisition unit can be calculated according to the focal length at the completion of the focus.
  • the bearing surface for carrying the display panel 20 with the bearing base 10 is flat. Moving the image acquisition unit 11 in the detection plane of the row to reach a position corresponding to a plurality of detection points on the surface of the display panel 20 facing the image acquisition unit 11, respectively, thereby focusing in a direction perpendicular to the bearing surface, The focal length at which the focus of each corresponding detection point is completed is obtained.
  • the distance between the plurality of detection points and the plane in which the image acquisition unit 11 is located ie, the detection plane
  • the relative flatness between the plurality of detection points on the display panel 20 can be determined, thereby reflecting the display panel 20 (special It is the flatness of the area where the multiple detection points are located.
  • the data processing unit 12 is further configured to generate an contour map of the display panel 20 facing the surface of the image capturing unit 11 according to the distance of each detection point with respect to the detection plane.
  • the apparatus for detecting the flatness of the surface of the display panel may further include a monitor 13 for displaying the contour map generated by the data processing unit 12. Such an arrangement makes it easy for the worker to visually observe the flatness of the surface of the display panel 20.
  • the means for detecting the flatness of the surface of the display panel may not include the monitor 13, but may have an interface connected to the external monitor through the transmission signal line to exchange data.
  • the image acquisition unit 11 may include a first acquisition module 110 and a second acquisition module 111.
  • the first acquisition module 110 is configured to collect all surfaces including the display panel 20 facing the image collection unit 11.
  • An image of the area; the second acquisition module 111 is configured to capture a pattern (such as a color filter, etc.) at each detection point, and complete focusing on the pattern.
  • the first collection module 110 and the second collection module 111 may be cameras.
  • the data processing unit 12 identifies a preset partial marker point (Mark) in the image to establish a basic coordinate system.
  • the base coordinate system may include only one axis (e.g., the x-axis) that is primarily used to identify whether the position of the display panel 20 placed on the carrier base 10 is accurate.
  • the identification process is specifically as follows: after establishing the basic coordinate system, identifying an edge of the display panel 20, determining whether an angle between an edge of the display panel 20 and the x-axis is a preset value, or being within a preset range; If yes, the display panel 20 is illustrated.
  • the display panel 20 is accurately placed at the corresponding position on the bearing base 10; otherwise, if it is not, the display panel 20 is not accurately placed at the corresponding position on the bearing base 10, and the position of the display panel 20 needs to be adjusted. It is placed exactly at the corresponding position on the carrier abutment 20.
  • the data processing unit 12 After confirming that the display panel 20 is accurately placed on the corresponding position on the carrier base 10, according to the image of the display panel 20 acquired by the first acquisition module 110, the data processing unit 12 continues to identify the remaining identification points in the image, and A fine coordinate system is established based on the identified identification points.
  • the fine coordinate system may include two axes (such as an x-axis and a y-axis) to determine the coordinates of each point on the surface of the display panel 20 facing the image acquisition unit 11.
  • the detection point may be selected on the surface of the display panel 20 facing the image acquisition unit 11. , that is, determine the coordinates of each detection point that needs to be focused.
  • the more the number of selected detection points the more uniform the distribution of the detection points on the surface of the display panel 20, and the more accurate the final detection result is obtained; the fewer the selected detection points, the detection points are on the surface of the display panel 20.
  • the number of selected detection points may be equal to the number of pixels on the display panel, so that the final obtained detection result has the highest accuracy.
  • the time required for such detection is longer and less efficient. Therefore, in practice, an appropriate number of detection points can be selected on the surface of the display panel 20 in a compromised manner, and the plurality of detection points are evenly distributed on the surface of the display panel 20.
  • the surface to be tested of the display panel may be divided into a plurality of regions having a specific size, each region selecting one detection point, and each detection point represents an area in which it is located.
  • the surface to be tested of the display panel may be divided into a plurality of identical rectangular regions, and the center point of each rectangle is selected as a detection point.
  • the flatness of the region with respect to other regions on the surface of the display panel 20 is obtained by detecting the flatness of each of the detection points with respect to other regions of the surface of the display panel 20.
  • the manner of dividing the area described above is only an example, and the area may be divided in other ways.
  • the second collection module 111 may be used to focus the plurality of detection points at positions respectively corresponding to the plurality of detection points (the second collection module 111 focuses on each detection point) And the bearing surface of the bearing base 10
  • the distance between the two acquisition modules is equal to the detection plane of the bearing surface of the carrier base 10, so that the focal length when the plurality of detection points are in focus is obtained.
  • Data, and calculating a distance between the plurality of detection points and the detection plane according to the focal length data is determined according to the distance between the plurality of detection points and the detection plane (in this example, the plane in which the second acquisition module 111 is located).
  • the flatness of the surface of the display panel 20 facing the image acquisition unit 11 when the distance between the plurality of detection points and the detection plane is distributed in a small interval, indicating that the height difference of the region where the plurality of detection points are located is small, the flatness of the surface of the display panel 20 facing the image acquisition unit 11 Preferably, when the interval between the plurality of detection points and the detection plane is large, the height difference of the area where the plurality of detection points are located is large, and the surface of the display panel 20 facing the surface of the image acquisition unit 11 The flatness is poor.
  • the size of the pattern of the color filter and the like collected by the second acquisition module 111 is generally on the order of micrometers.
  • the second collection module 111 is The zoomable range in which each detection point on the display panel 20 is in focus is set to be 10 to 100 times.
  • the second collection module 111 may include a lens and a focusing component having a larger zoom range. Of course, it also includes a lens and a plurality of focusing components having different zoomable ranges.
  • the second acquisition module 111 may include a lens 1110 and a focus component 1111, 1112, wherein the focus range of the focus component 1111 may be 25 times, and the zoom range of the focus component 1112 may be 50 times.
  • the focusing component 1111 is combined with the lens 1110, a zoom of 25 times can be achieved
  • the focusing component 1112 is combined with the lens 1110, a zoom of 50 times can be achieved.
  • the focusing component of the second collecting module 111 may be a laser autofocus system, and the focusing process may specifically be as follows. First, the laser is emitted to the detection point, and the focusing mechanism is driven to move up and down by the driving mechanism. In this process, the lens captures an image of the detected point quickly (eg, at 60 frames per second). Then, the clearest image is found in the captured image, that is, the focus of one detection point is completed, wherein the focal length when capturing the clearest image is the focal length required for detection.
  • each detection point on the surface of the display panel 20 facing the image acquisition unit 11 placed on the carrier base 10 is focused, and the distance between each detection point and the detection plane is calculated according to the focal length at the completion of focusing, thereby determining the display panel 20
  • the flatness of the surface facing the image pickup unit 11. Compared with the prior art, the embodiment can realize the detection of the surface flatness without contacting the display panel 20, and the damage and pollution to the display panel 20 are avoided.
  • the present invention also provides a method of detecting the flatness of the surface of a display panel.
  • 3 is a flow chart of a method of detecting the flatness of a surface of a display panel, in accordance with one embodiment of the present invention. As shown in FIG. 3, in the embodiment, the method for detecting the flatness of the surface of the display panel includes the following steps S1 to S3.
  • step S2 the image acquisition unit is sequentially placed at a position corresponding to each detection point in a direction perpendicular to the bearing surface, thereby performing corresponding detection points. Focus to obtain the focus data when the focus is completed.
  • the distance of each detection point on the display panel with respect to the detection plane is calculated based on the focal length data indicating the focal length at the completion of focusing, and the flatness of the surface of the display panel is determined accordingly.
  • step S3 if the distances of the detection points with respect to the detection plane are distributed within a small interval, it indicates that the flatness of the surface of the display panel facing the image acquisition unit is better. On the other hand, if the interval in which the distances of the detection points with respect to the detection plane are distributed is large, it indicates that the flatness of the surface of the display panel facing the image acquisition unit is poor.
  • FIG. 5 is a flow chart of a method of detecting surface flatness of a display panel in accordance with other embodiments of the present invention.
  • the same steps as those of FIG. 3 in the embodiment shown in FIG. 5 are denoted by the same reference numerals, and the description thereof will be omitted.
  • the method may further include:
  • S0 Detecting the levelness of the bearing base, and performing correction when the level of the bearing base exceeds a preset range.
  • the detection of the level can be specifically achieved by a level.
  • the method may further include:
  • S2a collecting an image of all areas of the surface of the display panel facing the image capturing unit, and identifying preset marking points in the image, establishing a basic coordinate system and an accurate coordinate system; the basic coordinate system is used to identify the Whether the display panel is offset from a normal position for detecting surface flatness; the precise coordinate system is used to determine coordinates of each point on the surface of the display panel facing the image acquisition unit.
  • the process of establishing the basic coordinate system and the precise coordinate system and the use thereof are described in detail in the above embodiment of the apparatus for detecting the flatness of the surface of the display panel, and are not described herein again.
  • the method for detecting the flatness of the surface of the panel may further include: after calculating the distance of each detection point relative to the detection plane in step S3:
  • step S4 the worker can intuitively observe the flatness of the surface of the display panel.
  • the detected display panel 20 includes an array substrate 200 and a counter substrate 201 opposite the same, and a touch electrode 202 for implementing touch.
  • the touch electrodes 202 are disposed on the opposite substrate 201, and the touch electrodes 202 and the array substrate 200 are respectively located on opposite sides of the pair of the substrate 201.
  • the flatness of the surface of the display panel 20 is detected, and the surface of the detected display panel 20 is the counter substrate 201. surface.
  • the array substrate 200 and the counter substrate 201 are first prepared, and then the array substrate 200 and the counter substrate 201 are paired.
  • the flatness of the display panel behind the cartridge is detected to make the flatness of the surface of the display panel meet the requirements when the touch electrode 202 is prepared.
  • the touch electrode 202 is formed on the surface having the flatness conforming to the requirements.
  • each of the detection points and the detection plane is calculated by focusing on a plurality of detection points on the surface of the display panel facing the image acquisition unit, and according to the focal length at the completion of focusing.
  • the distance to determine the flatness of the surface of the display panel facing the image acquisition unit is calculated.

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Abstract

一种检测显示面板(20)表面平坦度的装置及方法，所述装置包括：承载基台(10)，用于承载显示面板(20)；图像采集单元(11)，在与承载基台(10)的承载面平行的检测平面内移动，用于针对显示面板(20)面向图像采集单元(11)的表面中预设的各检测点在垂直于承载基台(10)的承载面的方向上进行对焦，并将焦距发送给数据处理单元(12)；数据处理单元(12)，用于根据焦距计算各检测点相对于检测平面的距离，并确定所述显示面板(20)的表面平坦度。

Description

检测显示面板表面平坦度的装置及方法 技术领域
本发明涉及显示技术领域，具体地，涉及一种检测显示面板表面平坦度的装置，以及一种检测显示面板表面平坦度的方法。
背景技术
显示面板包括阵列基板和与其对盒的对盒基板。在一般的显示基板的制备过程中，需要首先在阵列基板上制备薄膜晶体管、像素电极、信号线等结构，以及，在对盒基板上制备彩膜、黑矩阵等结构。而后，在阵列基板(或对盒基板)上设置隔垫物，并在边缘处涂布封框胶，将阵列基板与对盒基板对盒，并注入液晶，从而完成显示面板的制备。
在上述制备过程中，由于各个隔垫物高度不一致、边缘的各区域所涂布的封框胶的厚度不一致、以及阵列基板与对盒基板的对盒过程存在偏差等因素，对盒完成后的显示面板容易出现平坦度较差的情况。因此，在上述显示面板制备完成后，需要检测显示面板表面的平坦度。
特别是对于On-Cell型的触控显示面板而言，在其制备过程中，在将阵列基板与对盒基板对盒后，还需要依次进行沉积、涂胶、曝光、显影、刻蚀等工艺，以在对盒基板的一侧制备触控电极，以实现触控操作。在曝光过程中，显示面板表面的平坦度较差容易造成曝光无法对准的情况，从而会影响触控电极的形状和精度。因此，对于On-Cell型触控显示面板，更需要在形成触控电极前，检测阵列基板与对盒基板对盒后的显示面板的表面的平坦度，以避免较差的平坦度影响后续的触控电极的形成。
现有技术中，一般使用探针划过显示面板的表面，来检测显示面板的表面的平坦度。但上述检测方法中，探针与显示面板接触，且二者之间存在摩擦，这样就容易在显示面板上产生划痕，以及产生粉末/颗粒等污染物，从而导致显示面板的损坏及对显示面板清洁度的 破坏。
发明内容
本发明旨在至少解决现有技术中存在的技术问题之一。提出了一种检测显示面板表面平坦度的装置及方法，其在检测显示面板表面的平坦度的过程中无需接触显示面板，可以避免对显示面板的损坏和污染。
为实现本发明的目的，本发明的一个方面提供一种检测显示面板表面平坦度的装置，其包括承载基台、图像采集单元和数据处理单元；其中，所述承载基台用于承载显示面板；所述图像采集单元在与承载基台的承载面平行的检测平面内移动，用于针对显示面板面向图像采集单元的表面中预设的各检测点在垂直于承载基台的承载面的方向上进行对焦，以获得对焦完成时的焦距，并将表示焦距的焦距数据发送给所述数据处理单元；所述数据处理单元用于根据所述图像采集单元发送来的焦距数据，计算各检测点相对于所述检测平面的距离，并据此确定所述显示面板面向图像采集单元的表面的平坦度。
优选地，各检测点在所述显示面板的面向图像采集单元的表面上均匀分布。
优选地，所述数据处理单元还用于根据各检测点相对于检测平面的距离生成显示面板面向图像采集单元的表面的等高图；所述检测显示面板表面平坦度的装置还包括监视器，用于显示所述数据处理单元生成的等高图。
优选地，所述图像采集单元包括第一采集模块和第二采集模块；所述第一采集模块用于采集包含显示面板的面向图像采集单元的表面的所有区域的图像；所述第二采集模块用于捕捉各检测点处的图案，并对所述图案对焦。
优选地，所述数据处理单元还用于在所述第一采集模块采集的图像中识别预设的标记点，以建立基础坐标系和精确坐标系；所述基础坐标系用于识别所述显示面板是否偏移用于检测表面平坦度的正常位置；所述精确坐标系用于确定所述显示面板的面向图像采集单元 的表面上的每个点的坐标。
优选地，所述第二采集模块对各检测点进行对焦的可变焦范围为10至100倍。
优选地，所述第二采集模块包括镜头和多个对焦组件，各对焦组件具有不同的可变焦范围。
作为另一方面，本发明还提供一种检测显示面板表面的平坦度的方法，其包括：
S1，将显示面板置于承载基台的承载面上；
S2，使用图像采集单元在与承载基台的承载面平行的检测平面内移动，针对显示面板面向图像采集单元的表面中预设的各检测点在垂直于承载基台的承载面的方向上进行对焦，以获得对焦完成时的焦距；
S3，根据表示对焦完成时的焦距的焦距数据，计算显示面板上的各检测点相对于所述检测平面的距离，并据此确定所述显示面板表面的平坦度。
优选地，在步骤S1中，所述承载基台水平设置。
优选地，所述方法在进行步骤S1前还包括步骤S0：检测所述承载基台的水平度，并在所述承载基台的水平度超出预设范围时进行校正。
优选地，所述方法在步骤S1之后且在步骤S2之前还包括步骤S2a：采集包含显示面板的面向图像采集单元的表面的所有区域的图像，并在该图像中识别预设的标记点，以建立基础坐标系和精确坐标系；所述基础坐标系用于识别所述显示面板是否偏移用于检测表面平坦度的正常位置；并且所述精确坐标系用于确定所述显示面板的面向图像采集单元的表面上的每个点的坐标。
优选地，所述检测显示面板表面平坦度的方法在步骤S3之后还包括：
S4，根据各检测点相对于所述检测平面的距离生成所述显示面板面向图像采集单元的表面的等高图，并在监视器上显示所述等高图。
优选地，所述显示面板包括阵列基板和与其对盒的对盒基板，以及用于实现触控功能的触控电极；所述触控电极设置在所述对盒基板上，且所述触控电极与阵列基板分别位于所述对盒基板的两侧；在将所述触控电极形成在所述对盒基板上之前，执行前述任意的检测所述显示面板表面的平坦度的方法，且所检测的显示面板的表面为对盒基板的表面。
本发明具有以下有益效果：
在本发明提供的检测显示面板表面平坦度的装置中，通过对放置于承载基台上的显示面板的面向图像采集单元的表面上的各检测点对焦，并根据对焦完成时的焦距计算相应检测点与检测平面的距离，从而确定显示面板的面向图像采集单元的表面的平坦度。与现有技术相比，本发明无需与显示面板接触就能检测显示面板表面的平坦度，避免了对显示面板的损坏和污染。
在本发明提供的检测显示面板表面平坦度的方法中，通过对显示面板的面向图像采集单元的表面上的多个检测点对焦，并根据对焦完成时的焦距计算各检测点与检测平面的距离，从而确定显示面板的表面的平坦度。与现有技术相比，本发明无需与显示面板接触就能检测显示面板表面的平坦度，避免了对显示面板的损坏和污染。
附图说明
附图是用来提供对本发明的进一步理解，并且构成说明书的一部分，与下面的具体实施例一起用于解释本发明，但并不构成对本发明的限制。在附图中：
图1为根据本发明一个实施例的检测显示面板表面平坦度的装置的示意图；
图2为根据本发明一个实施例的图像采集单元的示意图；
图3为根据本发明一个实施例的检测显示面板表面平坦度的方法的流程图；
图4为根据本发明一个实施例的检测方法所检测的显示面板的示意图；以及
图5为根据本发明其他实施例的检测显示面板表面平坦度的方法的流程图。
附图标记：
10：承载基台；11：图像采集单元；12：数据处理单元；13：监视器；20：显示面板；110：第一采集模块；111：第二采集模块；200：阵列基板；201：对盒基板；202：触控电极；1110：镜头；1111、1112：对焦组件。
具体实施方式
以下结合附图对本发明的具体实施例进行详细说明。应当理解的是，此处所描述的具体实施例仅用于说明和解释本发明，并不用于限制本发明。
本发明提供一种检测显示面板表面平坦度的装置的实施例，图1为根据本发明一个实施例的检测显示面板表面平坦度的装置的示意图。如图1所示，在本实施例中，检测显示面板表面平坦度的装置包括承载基台10、图像采集单元11和数据处理单元12。承载基台10用于承载显示面板20。图像采集单元11在与承载基台10的承载面平行的检测平面内移动，用于针对显示面板20面向图像采集单元11的表面中预设的各检测点在垂直于承载面的方向上进行对焦，以获得对焦完成时的焦距，并将表示焦距的焦距数据发送给所述数据处理单元12。由于检测平面为与承载基台10的承载面平行的平面，并且图像采集单元11在执行对焦时所处的各位置始终位于该平面内，因此保证图像采集单元11与承载基台10之间的距离恒定。数据处理单元12用于根据所述图像采集单元11发送来的焦距数据，计算各检测点相对于所述检测平面的距离，并据此确定所述显示面板20的面向图像采集单元11的表面的平坦度。
在图像采集单元11对放置在承载基台10上的显示面板20的面向图像采集单元11的表面上的某个检测点对焦时，根据对焦完成时的焦距可以计算出该检测点与图像采集单元11所在的检测平面之间的距离。由此，在与承载基台10的用于承载显示面板20的承载面平 行的检测平面内移动图像采集单元11，使其分别到达与显示面板20的面向图像采集单元11的表面上的多个检测点对应的位置处，从而在垂直于承载面的方向上进行对焦，获得对各个对应的检测点对焦完成时的焦距。根据表示对该多个检测点对焦完成时的焦距的焦距数据，可以确定该多个检测点与图像采集单元11所在平面(即检测平面)之间的距离。进一步地，根据该多个检测点与图像采集单元11所在的检测平面之间的距离，可以确定显示面板20上的该多个检测点之间的相对平坦度，从而可以反映显示面板20(特别是该多个检测点所在区域)的平坦度。
在本实施例中，所述数据处理单元12还用于根据各检测点相对于所述检测平面的距离生成显示面板20面向图像采集单元11的表面的等高图。并且如图1所示，所述检测显示面板表面平坦度的装置还可以包括监视器13，所述监视器13用于显示所述数据处理单元12生成的等高图。这样设置可以便于工作人员直观地观察显示面板20表面的平坦度。在其他实施例中，检测显示面板表面平坦度的装置可以不包括监视器13，而可以具有通过传输信号线与外部监视器相连以交换数据的接口。
如图2所示，所述图像采集单元11可以包括第一采集模块110和第二采集模块111；所述第一采集模块110用于采集包含显示面板20的面向图像采集单元11的表面的所有区域的图像；所述第二采集模块111用于捕捉各检测点处的图案(如彩色滤光片等)，并完成对所述图案的对焦。所述第一采集模块110和第二采集模块111可以为摄像头。
具体地，首先，根据第一采集模块110所采集的显示面板20的图像，数据处理单元12在图像中识别出预先设置的部分标识点(Mark)，建立一个基础坐标系。该基础坐标系可以仅包括一个轴(如x轴)，其主要用于识别显示面板20在承载基台10上所放置的位置是否准确。该识别过程具体如下：在建立上述基础坐标系之后，识别显示面板20的边缘，确定显示面板20的边缘与该x轴之间的角度是否为预设值，或者，处于预设范围之内；若是，则说明显示面板20 被准确地放置在承载基台10上的相应位置；反之，若否，则说明显示面板20未被准确地放置在承载基台10上的相应位置，这时就需要调整显示面板20的位置，使其准确地处于承载基台20上的相应位置。
在确认显示面板20被准确地放置在承载基台10上的相应位置后，根据第一采集模块110所采集的显示面板20的图像，数据处理单元12在图像中继续识别其余的标识点，并根据识别的标识点，建立一个精细坐标系。该精细坐标系可以包括两个轴(如x轴和y轴)，以便确定显示面板20的面向图像采集单元11的表面上每个点的坐标。
在建立精细坐标系以对显示面板20的面向图像采集单元11的表面上的每个点在二维平面中唯一地定位之后，可以在显示面板20的面向图像采集单元11的表面上选择检测点，即确定所需要进行对焦的各检测点的坐标。一般地，所选择的检测点的数量越多，检测点在显示面板20表面上的分布越均匀，最终获得的检测结果越准确；所选择的检测点越少，检测点在显示面板20表面上的分布均匀性越差，最终获得的检测结果的偏差越差，准确性越低。在只考虑检测结果的准确性的情况下，所选择的检测点的数量可以等于显示面板上的像素数，这样最终获得的检测结果的准确性最高。但可以理解，这样检测所需的时间较长，效率较低。因此，在实际中，可以折中地在显示面板20表面上选择合适数量的检测点，且使该多个检测点在所述显示面板20的表面上均匀分布。在这种情况下，可以将显示面板的待测表面划分为具有特定尺寸的多个区域，每个区域选择一个检测点，每个检测点代表其所在的区域。例如，可以将显示面板的待测表面划分为多个相同的矩形区域，并选取每个矩形的中心点作为检测点。通过检测每个检测点相对于显示面板20表面的其他区域的平坦度，获得该区域相对于显示面板20表面上其他区域的平坦度。上述划分区域的方式仅是示例，还可以采用其他方式划分区域。
在确定检测点的数量和坐标后，可以使用第二采集模块111在与多个检测点分别对应的位置处对该多个检测点进行对焦(第二采集模块111在对各个检测点进行对焦时，其与承载基台10的承载面之 间的距离相等，即第二采集模块111在对各个检测点对焦时的位置均处于平行于承载基台10的承载面的检测平面内)，从而获得对该多个检测点对焦完成时的焦距数据，并根据该焦距数据计算出该多个检测点与检测平面之间的距离。进一步地，根据多个检测点与检测平面(在本示例中，为第二采集模块111所在平面)之间的距离，确定显示面板20的面向图像采集单元11的表面的平坦度。例如，在多个检测点与检测平面之间的距离分布在一个较小的区间时，表明多个检测点所在区域的高度差较小，显示面板20的面向图像采集单元11的表面的平坦度较好；反之，当多个检测点与检测平面之间的距离所分布的区间较大时，表明多个检测点所在区域的高度差较大，显示面板20的面向图像采集单元11的表面的平坦度较差。
第二采集模块111所采集的所述彩色滤光片等图案的尺寸一般为微米级，为实现对该微米级的图案的捕捉和对焦，在本实施例中，所述第二采集模块111对所述显示面板20上各检测点对焦的可变焦范围被设置为10至100倍。
具体地，所述第二采集模块111可以包括镜头和一个具有较大变焦范围的对焦组件。当然，也包括镜头和多个对焦组件，该多个对焦组件具有不同的可变焦范围。例如，如图2所示，第二采集模块111可以包括镜头1110和对焦组件1111、1112，其中对焦组件1111的可变焦范围可以为25倍，对焦组件1112的可变焦范围可以为50倍。在此情况下，当对焦组件1111与镜头1110组合时，即可实现25倍的变焦，当对焦组件1112与镜头1110组合时，即可实现50倍的变焦。
进一步地，第二采集模块111的对焦组件可以为激光自动对焦系统，其对焦过程具体可以如下。首先，向检测点发射激光，并利用以驱动机构驱动对焦组件不断上下运动。在该过程中，镜头快速(例如，以每秒60帧)地捕捉检测点的图像。而后，在所捕捉的图像中找出最清晰的图像，即完成对一个检测点的对焦，其中，捕捉到该最清晰的图像时的焦距即为检测所需的焦距。
在本发明实施例提供的检测显示面板表面平坦度的装置中，通 过对放置于承载基台10上的显示面板20的面向图像采集单元11的表面上的各检测点对焦，并根据对焦完成时的焦距计算各检测点与检测平面的距离，从而确定显示面板20的面向图像采集单元11的表面的平坦度。与现有技术相比，本实施例无需与显示面板20接触就能实现表面平坦度的检测，避免了对显示面板20的损坏和污染。
本发明还提供一种检测显示面板表面的平坦度的方法。图3为根据本发明一个实施例的检测显示面板表面平坦度的方法的流程图。如图3所示，在本实施例中，所述检测显示面板表面平坦度的方法包括以下步骤S1～S3。
S1，将显示面板置于承载基台的承载面上。
S2，获得对焦完成时的焦距。
使用图像采集单元在与承载基台的承载面平行的检测平面内移动，针对显示面板面向图像采集单元的表面中预设的各检测点在垂直于承载面的方向上进行对焦，以获得对焦完成时的焦距。
在设置了所需要检测的检测点的数量及其坐标之后，在步骤S2中，使图像采集单元依次处于在垂直于承载面的方向上与各检测点对应的位置，从而对相应的检测点进行对焦，以获得对焦完成时的焦距数据。
S3，计算各检测点相对于检测平面的距离，以确定显示面板表面的平坦度。
根据表示对焦完成时的焦距的焦距数据，计算显示面板上的各检测点相对于所述检测平面的距离，并据此确定所述显示面板表面的平坦度。
具体地，步骤S3中，若各检测点相对于检测平面的距离在一个较小的区间内分布，则表明显示面板的面向图像采集单元的表面的平坦度较好。反之，若各检测点相对于检测平面的距离所分布的区间较大，则表明显示面板的面向图像采集单元的表面的平坦度较差。
图5为根据本发明其他实施例的检测显示面板表面平坦度的方法的流程图。图5所示的实施例中与图3相同的步骤以相同的附图标记表示，并省略对其的描述。
在一个示例中，为了保证步骤S1中的承载基台水平，在进行步骤S1前，还可以包括：
S0、检测所述承载基台的水平度，并在所述承载基台的水平度超出预设范围时，进行校正。该水平度的检测具体可以通过水平仪实现。
在一个示例中，在步骤S1之后且在步骤S2之前，还可以包括：
S2a、采集包含显示面板的面向图像采集单元的表面的所有区域的图像，并在该图像中识别预设的标记点，建立基础坐标系和精确坐标系；所述基础坐标系用于识别所述显示面板是否偏移用于检测表面平坦度的正常位置；所述精确坐标系用于确定所述显示面板的面向图像采集单元的表面上每个点的坐标。所述基础坐标系和精确坐标系的建立过程及其用途在上述检测显示面板表面平坦度的装置的实施例中已有了详细描述，在此不再赘述。
在一个示例中，所述检测显示面板表面平坦度的方法在步骤S3中计算出各检测点相对于检测平面的距离之后还可以包括：
S4，根据各检测点相对于检测平面的距离生成显示面板面向图像采集单元的表面的等高图，并在监视器上显示所述等高图。
通过步骤S4，工作人员可以直观地观察显示面板的表面的平坦度。
在一个实施例中，如图4所示，所检测的显示面板20包括阵列基板200和与其对盒的对盒基板201，以及用于实现触控的触控电极202。所述触控电极202设置在所述对盒基板201上，且所述触控电极202与阵列基板200分别位于所述对盒基板201的两侧。本实施例中，在将所述触控电极202形成在所述对盒基板201上之前，检测所述显示面板20表面的平坦度，且所检测的显示面板20的表面为对盒基板201的表面。具体地，在制备显示面板20时，首先制备阵列基板200和对盒基板201，而后将阵列基板200和对盒基板201对盒。随后，检测对盒后的显示面板的平坦度，以在制备触控电极202时，使显示面板的表面的平坦度符合要求。最后，在表面平坦度符合要求的显示面板上(即，在已与阵列基板200对盒的对盒基板201的表面 平坦度符合要求的表面上)，形成触控电极202。
在本发明实施例提供的检测显示面板表面平坦度的方法中，通过对显示面板的面向图像采集单元的表面上的多个检测点对焦，并根据对焦完成时的焦距计算各检测点与检测平面的距离，从而确定显示面板的面向图像采集单元的表面的平坦度。与现有技术相比，本实施例无需与显示面板接触就能实现表面平坦度的检测，避免了对显示面板的损坏和污染。
可以理解的是，以上实施例仅仅是为了说明本发明的原理而采用的示例性实施例，然而本发明并不局限于此。对于本领域内的普通技术人员而言，在不脱离本发明的精神和实质的情况下，可以做出各种变型和改进，这些变型和改进也视为本发明的保护范围。

Claims (13)

  1. 一种检测显示面板表面平坦度的装置，包括：
    承载基台，用于承载显示面板；
    图像采集单元，在与承载基台的承载面平行的检测平面内移动，用于针对显示面板面向图像采集单元的表面中预设的各检测点在垂直于承载基台的承载面的方向上进行对焦，以获得对焦完成时的焦距，并将表示焦距的焦距数据发送给数据处理单元；
    数据处理单元，用于根据所述图像采集单元发送来的焦距数据，计算各检测点相对于所述检测平面的距离，并据此确定所述显示面板面向图像采集单元的表面的平坦度。
  2. 根据权利要求1所述的检测显示面板表面平坦度的装置，其中，各检测点在所述显示面板的面向图像采集单元的表面上均匀分布。
  3. 根据权利要求1所述的检测显示面板表面平坦度的装置，其中
    所述数据处理单元还用于根据各检测点相对于所述检测平面的距离生成显示面板面向图像采集单元的表面的等高图；并且
    所述检测显示面板表面平坦度的装置还包括监视器，用于显示所述数据处理单元生成的等高图。
  4. 根据权利要求1所述的检测显示面板表面平坦度的装置，其中，所述图像采集单元包括第一采集模块和第二采集模块；
    所述第一采集模块用于采集包含显示面板的面向图像采集单元的表面的所有区域的图像；
    所述第二采集模块用于捕捉各检测点处的图案，并对所述图案对焦。
  5. 根据权利要求4所述的检测显示面板表面平坦度的装置，其中，所述数据处理单元还用于在所述第一采集模块采集的图像中识别预设的标记点，以建立基础坐标系和精确坐标系；
    所述基础坐标系用于识别所述显示面板是否偏移用于检测表面平坦度的正常位置；并且
    所述精确坐标系用于确定所述显示面板的面向图像采集单元的表面上的每个点的坐标。
  6. 根据权利要求4所述的检测显示面板表面平坦度的装置，其中，所述第二采集模块对各检测点进行对焦的可变焦范围为10至100倍。
  7. 根据权利要求6所述的检测显示面板表面平坦度的装置，其特征在于，所述第二采集模块包括镜头和多个对焦组件，各对焦组件具有不同的可变焦范围。
  8. 一种检测显示面板表面的平坦度的方法，包括：
    S1，将显示面板置于承载基台的承载面上；
    S2，使用图像采集单元在与承载基台的承载面平行的检测平面内移动，针对显示面板面向图像采集单元的表面中预设的各检测点在垂直于承载基台的承载面的方向上进行对焦，以获得对焦完成时的焦距；以及
    S3，根据表示对焦完成时的焦距的焦距数据，计算显示面板上的各检测点相对于所述检测平面的距离，并据此确定所述显示面板表面的平坦度。
  9. 根据权利要求8所述的检测显示面板表面平坦度的方法，其中，所述承载基台水平设置。
  10. 根据权利要求9所述的检测显示面板表面平坦度的方法， 在步骤S1前还包括步骤S0：检测所述承载基台的水平度，并在所述承载基台的水平度超出预设范围时进行校正。
  11. 根据权利要求8所述的检测显示面板表面平坦度的方法，在步骤S1之后且在步骤S2之前还包括步骤S2a：采集包含显示面板的面向图像采集单元的表面的所有区域的图像，并在该图像中识别预设的标记点，以建立基础坐标系和精确坐标系；
    所述基础坐标系用于识别所述显示面板是否偏移用于检测表面平坦度的正常位置；并且
    所述精确坐标系用于确定所述显示面板的面向图像采集单元的表面上的每个点的坐标。
  12. 根据权利要求8所述的检测显示面板表面平坦度的方法，在步骤S3之后还包括：
    S4，根据各检测点相对于所述检测平面的距离生成所述显示面板面向图像采集单元的表面的等高图，并在监视器上显示所述等高图。
  13. 根据权利要求8至12中任意一项所述的检测显示面板表面平坦度的方法，其中，所述显示面板包括阵列基板和与其对盒的对盒基板，以及用于实现触控功能的触控电极；
    所述触控电极设置在所述对盒基板上，且所述触控电极与阵列基板分别位于所述对盒基板的两侧；
    在将所述触控电极形成在所述对盒基板上之前，执行如权利要求8至12中任意一项所述的检测所述显示面板表面的平坦度的方法，且所检测的显示面板的表面为对盒基板的表面。
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CN110956631A (zh) * 2020-01-02 2020-04-03 北京机科国创轻量化科学研究院有限公司 一种复合材料预制体织造过程自动压针装置及方法
CN110956631B (zh) * 2020-01-02 2023-10-10 北京机科国创轻量化科学研究院有限公司 一种复合材料预制体织造过程自动压针装置及方法

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