WO2015118713A1 - 半導体装置及び半導体装置の製造方法 - Google Patents
半導体装置及び半導体装置の製造方法 Download PDFInfo
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Definitions
- the technology disclosed in this specification relates to a semiconductor device.
- Patent Document 1 discloses an RC-IGBT in which a diode and an IGBT are formed on one semiconductor substrate.
- An n-type cathode layer is formed in a range exposed on the lower surface of the diode.
- An n-type buffer layer is formed on the upper side of the cathode layer.
- An n-type drift layer is formed on the upper side of the buffer layer.
- the n-type impurity concentration of the drift layer is lower than that of the buffer layer and the cathode layer.
- the buffer layer has an n-type impurity concentration lower than that of the cathode layer.
- Patent Document 1 a structure in which a high-concentration impurity region, a medium-concentration impurity region, and a low-concentration impurity region are arranged in this order from the surface side of the substrate is used in various semiconductor devices such as diodes and MOSFETs.
- the present specification provides a technique capable of further stabilizing characteristics in such a semiconductor device.
- the inventors of the present application are researching a technique for further increasing the impurity concentration of the high-concentration impurity region described above.
- this technique after a high concentration of impurities is implanted in the vicinity of the surface of the semiconductor substrate, the region in the vicinity of the surface is melted and then solidified again. Since the impurities diffuse throughout the melted region, the region solidified again becomes a region containing impurities at a high concentration.
- crystal defects formed by high-concentration impurity implantation can be efficiently eliminated. Therefore, it is possible to form a high concentration impurity region having a high impurity concentration and a low crystal defect density.
- impurities adhering to the surface of the semiconductor substrate before melting diffuse into the melted region.
- p-type impurities attached to the surface of the semiconductor substrate may diffuse into the melted region.
- the p-type impurity diffuses into the region where the n-type impurity concentration is low, and the region is p-type. It may become.
- the n-type impurity concentration at the boundary between the high concentration impurity region and the medium concentration impurity region is high.
- the n-type impurity concentration at the boundary is high, the high concentration impurity region and the medium concentration impurity region are not sufficiently separated. Then, under the influence of both the high concentration impurity region and the medium concentration impurity region, the efficiency of electron injection into the high concentration impurity region changes. This makes it difficult to control the characteristics of the semiconductor device.
- This semiconductor device has a first conductivity type region exposed on the surface of the semiconductor substrate.
- a maximum value N1, a minimum value N2, and a maximum value N3 are formed.
- the depth having the maximum value N1 is located closer to the surface than the depth having the minimum value N2.
- the depth having the maximum value N3 is located on the opposite side of the surface from the depth having the minimum value N2.
- a region having a first conductivity type impurity concentration N4 is present in the first conductivity type region located on the opposite side of the surface from the depth having the maximum value N3.
- the relationship of N1> N3> N2> N4 is satisfied, and the relationship of N3 / 10> N2 is satisfied.
- the distance a from the surface to the depth having the maximum value N1 is larger than twice the distance b from the depth having the maximum value N1 to the depth having the minimum value N2.
- said 1st conductivity type impurity means either an n-type or a p-type.
- concentration of the region having the concentration N4 does not have to be constant, and the concentration N4 of the region may change depending on the position within a range where the relationship of N2> N4 is satisfied.
- the distance a from the surface of the semiconductor substrate to the depth having the maximum value N1 is larger than twice the distance b from the depth having the maximum value N1 to the depth having the minimum value N2.
- Such an impurity distribution is called a box profile, and is a characteristic distribution obtained by a method of activating impurities by melting the semiconductor substrate described above.
- the region having the maximum value N1 corresponds to the high concentration region
- the region having the maximum value N3 corresponds to the medium concentration region
- the region having the concentration N4 corresponds to the low concentration region.
- the depth having the minimum value N2 corresponds to the boundary between the high concentration region and the medium concentration region.
- the minimum value N2 is higher than the concentration N4.
- the second conductivity type impurities of a conductivity type different from the first conductivity type (hereinafter referred to as the second conductivity type) are diffused in the depth of the minimum value N2 in the manufacturing process of the semiconductor device (that is, the melting process of the semiconductor substrate).
- this depth region is unlikely to be the second conductivity type. That is, in this semiconductor device, it is difficult to form the second conductivity type region at the boundary between the high concentration region and the medium concentration region.
- the relationship of N3 / 10> N2 is satisfied.
- the efficiency of electron injection into the high-concentration impurity region is determined by the impurity concentration of the high-concentration impurity region with little influence from the medium-concentration impurity region.
- this semiconductor device it is possible to suppress the formation of the second conductivity type region at the boundary and to suppress the influence of the medium concentration impurity region on the electron injection efficiency of the high concentration impurity region. can do. Therefore, the characteristics of this semiconductor device are stable during mass production.
- the present specification also provides a method of manufacturing a semiconductor device.
- the heat treatment step is performed after the first injection step
- the melting and solidifying step is performed after the second injection step
- the first injection step, the heat treatment step, the second injection step, and The steps of melting and solidifying may be performed in any order.
- the first conductivity type impurity is implanted at a relatively deep position in the first implantation step, and the first conductivity type impurity implanted in the first implantation step is activated in the heat treatment step. Thereby, an intermediate concentration region is formed.
- the first conductivity type impurity is implanted at a relatively shallow position in the second implantation step, and the first conductivity type impurity implanted in the second implantation step is activated in the melting and solidifying step. Thereby, a high concentration region is formed. A region where the first conductivity type impurity is not diffused is a low concentration region. According to this manufacturing method, a semiconductor device having a high concentration region, a medium concentration region, and a low concentration region can be manufactured.
- FIG. 1 is a longitudinal sectional view of a semiconductor device 10 of Example 1.
- FIG. 2 is a graph showing the n-type impurity concentration along the line AA in FIG.
- FIG. 6 is an explanatory diagram of a manufacturing process of the semiconductor device 10.
- FIG. 6 is an explanatory diagram of a manufacturing process of the semiconductor device 10.
- FIG. 6 is an explanatory diagram of a manufacturing process of the semiconductor device 10.
- FIG. 6 is an explanatory diagram of a manufacturing process of the semiconductor device 10.
- FIG. 6 is an explanatory diagram of a manufacturing process of the semiconductor device 10.
- FIG. 3 is a graph corresponding to FIG. 2 of the semiconductor device of Example 2.
- FIG. 3 is a graph corresponding to FIG. 2 of the semiconductor device of Comparative Example 1;
- the graph corresponding to FIG. 2 of the semiconductor device of the comparative example 3. 1 is a longitudinal sectional view of an RC-IGBT to which
- a depth having a concentration N5 of the first conductivity type impurity of 1/10 of the maximum value N1 may exist on the surface side of the depth having the maximum value N1. In this case, the distance c from the depth having the concentration N5 to the depth having the maximum value N1 may be greater than twice the distance b.
- a diode and an IGBT may be formed on a semiconductor substrate, and the first conductivity type region may be a cathode region of the diode.
- the depth having the maximum value N1 may exist within the range of 0.3 to 0.7 ⁇ m from the surface.
- the depth having the maximum value N3 may exist within the range of 0.5 to 3.0 ⁇ m from the surface.
- Example 1 A semiconductor device 10 of Example 1 shown in FIG. 1 includes a semiconductor substrate 12, an anode electrode 20 formed on the upper surface 12a of the semiconductor substrate 12, and a cathode electrode 22 formed on the lower surface 12b of the semiconductor substrate 12. Yes.
- a p-type anode region 30 and an n-type cathode region 38 are formed in the semiconductor substrate 12.
- the anode region 30 is formed in a range exposed on the upper surface 12 a of the semiconductor substrate 12 and is connected to the anode electrode 20.
- the cathode region 38 is formed in a range exposed on the lower surface 12 b of the semiconductor substrate 12 and is connected to the cathode electrode 22. That is, a diode is formed in the semiconductor substrate 12.
- FIG. 2 shows the concentration distribution of the n-type impurity along the line AA in FIG. 2 indicates the depth from the lower surface 12b of the semiconductor substrate 12, and the vertical axis designates the n-type impurity concentration by logarithm.
- the n-type impurity concentration gradually increases from the lower surface 12b of the semiconductor substrate 12 toward the deep side, and reaches a maximum value N1.
- the n-type impurity concentration rapidly decreases from the depth D1 of the maximum value N1 toward the deep side, and becomes a minimum value N2.
- the n-type impurity concentration increases from the depth D2 of the minimum value N2 toward the deep side, and reaches a maximum value N3.
- the n-type impurity concentration decreases from the depth D3 of the maximum value N3 toward the deep side, and becomes a concentration N4 at the depth D4. In a region deeper than the depth D4, the n-type impurity concentration is substantially constant at the concentration N4.
- the concentrations N1 to N4 satisfy the relationship of N1> N3> N2> N4.
- the minimum value N2 is a value smaller than one tenth of the maximum value N3. That is, N3 / 10> N2 is satisfied.
- the n-type impurity concentration Ns on the lower surface 12b of the semiconductor substrate 12 is a value larger than one tenth of the maximum value N1.
- the cathode region 38 located on the side shallower than the depth D2 (the lower surface 12b side) is referred to as a contact region 36, and the cathode region 38 between the depth D2 and the depth D4 is referred to as a buffer region 34.
- the cathode region 38 on the side deeper than D4 (upper surface 12a side) is referred to as a drift region 32.
- the n-type impurity concentration is gradually changed as compared with the above-described range of the distance b (the range between the depth D1 and the depth D2).
- n-type impurities are distributed in a Gaussian distribution.
- the buffer region 34 is a region formed by injecting an n-type impurity at a depth D3 and then diffusing and activating the n-type impurity by heat treatment.
- the diode When the diode is turned on (that is, when a forward voltage is applied to the diode), holes flow from the anode electrode 20 toward the cathode electrode 22 and electrons flow from the cathode electrode 22 toward the anode electrode 20.
- the contact region 36 has a high n-type impurity concentration, the contact resistance between the contact region 36 and the cathode electrode 22 is extremely low. For this reason, electrons are injected from the cathode electrode 22 into the contact region 36 with high injection efficiency. Further, since the crystal defect density of the contact region 36 is low, it is difficult for loss to occur in the contact region 36 when electrons and holes pass through the contact region 36. For this reason, the diode can operate with low loss.
- a depletion layer extends from the pn junction at the boundary between the anode region 30 and the drift region 32 toward the cathode electrode 22. Since the buffer region 34 has a relatively high n-type impurity concentration, the depletion layer stops in the buffer region 34. As a result, the depletion layer is prevented from reaching the contact region 36, and the breakdown voltage of the diode is ensured.
- the buffer region 34 is formed at a relatively deep position. More specifically, the depth D3 is formed to be 0.5 to 3.0 ⁇ m. For this reason, even if a scratch is generated on the lower surface 12 b, the scratch is difficult to reach the buffer region 34. This makes it difficult for the breakdown voltage of the diode to be reduced due to scratches.
- an n-type semiconductor substrate 12 shown in FIG. 3 is prepared.
- the entire semiconductor substrate 12 has an n-type impurity concentration equal to the above-described concentration N4.
- n-type impurities are implanted into the back surface of the semiconductor substrate 12.
- the implantation energy is adjusted so that the average stop position of the n-type impurity is located at a depth D3 from the lower surface 12b of the semiconductor substrate 12.
- the semiconductor substrate 12 is annealed by using a furnace or a laser annealing apparatus.
- annealing is performed so that the position of the depth D3 into which the n-type impurity is implanted in the buffer implantation process is sufficiently heated.
- the annealing is performed at a temperature at which the surface of the semiconductor substrate 12 does not melt.
- the n-type impurity implanted in the buffer implantation process is diffused and activated.
- a buffer region 34 is formed in the semiconductor substrate 12 as shown in FIG. That is, by performing the buffer annealing step, a buffer region 34 in which n-type impurities are distributed in a Gaussian distribution as shown in FIG.
- the maximum value N3 of the n-type impurity concentration is formed at the depth D3 after the buffer annealing step, as shown in FIG.
- a region having a lower n-type impurity concentration on the upper surface 12 a side than the buffer region 34 is a drift region 32.
- n-type impurities are implanted into the lower surface 12 b of the semiconductor substrate 12.
- the implantation energy is adjusted so that the n-type impurity average stop position is shallower than the buffer region 34.
- n-type impurities are implanted at a higher concentration than in the buffer implantation process. For this reason, high-density crystal defects are formed in the region that has received the n-type impurity implantation in the contact implantation step (that is, the region in the vicinity of the lower surface 12b).
- the semiconductor substrate 12 is annealed by laser annealing.
- the vicinity of the lower surface 12b is locally annealed by irradiating the lower surface 12b of the semiconductor substrate 12 with a laser.
- the laser annealing is performed in a short time so that a large amount of heat is not transferred to the buffer region 34.
- the laser annealing is performed so that the temperature is raised to a temperature at which the semiconductor layer near the lower surface 12b is melted.
- laser annealing is performed so that the region on the side deeper than the depth D2 (the upper surface 12a side) does not melt.
- the region 36 melted by laser annealing is then solidified and recrystallized.
- the n-type impurity implanted in the contact implantation process diffuses almost uniformly into the melted region 36. Therefore, when the region 36 is recrystallized, the region 36 becomes a contact region 36 containing an n-type impurity at a high concentration. That is, as shown in FIG. 7, the contact region 36 is formed in a range exposed on the lower surface 12 b of the semiconductor substrate 12.
- the n-type impurity diffuses substantially uniformly in the region 36.
- the n-type impurity hardly diffuses into the region that has not melted.
- the n-type impurity concentration does not change so much in the region between the lower surface 12b and the depth D1, and the n-type impurity concentration rapidly decreases from the depth D1 to the depth D2. Distribution is obtained. Accordingly, the distances a and b in the figure satisfy the relationship of a> 2b.
- the contact region 36 having a box distribution is formed by performing the contact annealing step.
- the contact region 36 Since the region to be melted is limited to a very shallow region, the thickness of the contact region 36 is reduced (depth D1 is 0.3 to 0.7 ⁇ m), and the peak concentration N1 of the contact region 36 is increased. In the process of melting and then solidifying the region 36, most of the crystal defects existing in the region 36 at a high density disappear. For this reason, the contact region 36 after recrystallization has few crystal defects. That is, by performing the contact annealing step, the contact region 36 having a high n-type impurity concentration (more specifically, a peak n-type impurity concentration N1) and a low crystal defect density is formed. The contact annealing process is performed so that an n-type impurity concentration N2 (see FIG. 2) satisfying the relationship of N3 / 10> N2> N4 is obtained after the contact annealing process.
- the anode region 30 is formed by implanting and activating p-type impurities into the upper surface 12a of the semiconductor substrate 12.
- the anode electrode 20 is formed on the upper surface 12 a of the semiconductor substrate 12.
- the cathode electrode 22 is formed on the lower surface 12 b of the semiconductor substrate 12.
- the contact region 36 having a high n-type impurity concentration and a low crystal defect density can be formed. Therefore, a low-loss diode can be formed.
- the n-type impurity in the buffer region 34 is activated by an annealing process (buffer annealing process) different from the contact annealing process for melting the surface. For this reason, the buffer region 34 can be formed at a deep position. Therefore, it is possible to suppress a decrease in breakdown voltage due to scratches on the lower surface 12b.
- the contact annealing step is performed so that the relationship of N2> N4 is satisfied.
- the region 36 is melted in the contact annealing step, p-type impurities diffuse into the 36. Therefore, if the n-type impurity concentration is extremely low at the depth D2, the p-type impurity concentration may exceed the n-type impurity concentration near the depth D2, and a p-type region may be formed near the depth D2.
- the contact annealing is performed so that the relationship of N2> N4 is satisfied (that is, the n-type impurity concentration N2 at the depth D2 is higher than the n-type impurity concentration N4 of the raw semiconductor substrate 12).
- a process is performed. For this reason, even if a very small amount of p-type impurity diffuses in the vicinity of the depth D2, the region in the vicinity of the depth D2 is difficult to become p-type. Therefore, the p-type region is prevented from being formed at the depth D2. For this reason, when the semiconductor device 10 is mass-produced by the method of the embodiment, the characteristics (particularly, VF) of the diode are stabilized.
- the diode is formed so that the relationship of N3 / 10> N2 is satisfied. This stabilizes the characteristics of the diode. That is, if the n-type impurity concentration N2 at the depth D1 is too high, the contact region 36 and the buffer region 34 function as a single region, and the n-type impurity concentration of the contact region 36 and the n-type impurity concentration of the buffer region 34 Impurity concentration affects each other's characteristics.
- the efficiency of electron injection from the cathode electrode 22 to the contact region 36 varies depending not only on the n-type impurity concentration of the contact region 36 but also on the n-type impurity concentration of the buffer region 34. It becomes like this. For this reason, it is difficult to accurately control the electron injection efficiency, and a large variation occurs in the electron injection efficiency during mass production of semiconductor devices.
- the method of the embodiment since the relationship of N3 / 10> N2 is satisfied, the electron injection efficiency is hardly affected by the buffer region 34. Therefore, according to the method of the embodiment, variations in electron injection efficiency into the contact region 36 of each semiconductor device hardly occur during mass production.
- the semiconductor device of Example 2 is manufactured by the same method as that of Example 1.
- the n-type impurity concentration Ns on the lower surface 12b may be lowered as in the second embodiment. Even in this case, the relationship of c> 2b is satisfied in a typical box profile.
- the box profile can be defined by the distance c and the distance b (when the n-type impurity concentration Ns on the lower surface 12b satisfies Ns> N1 / 10 as in the first embodiment). (As long as the distance a between the lower surface 12b and the depth D1 satisfies the relationship of a> 2b as in the first embodiment).
- the semiconductor device according to the second embodiment and the manufacturing method thereof can obtain substantially the same advantages as the semiconductor device according to the first embodiment.
- the semiconductor device of the comparative example also has a contact region, a buffer region, a drift region, an anode region, a cathode electrode, and an anode electrode as in the first and second embodiments.
- the impurity concentrations and dimensions of these regions are different, the basic functions of these regions are the same as those of the first and second embodiments. Therefore, below, the part which has commonality with Example 1, 2 is demonstrated using the same number as Example 1,2.
- all of the following comparative examples were carried out in experiments by the inventors of the present application and are not publicly known.
- FIG. 9 shows n-type impurity concentration distributions in the contact region 36, the buffer region 34, and the drift region 32 of the semiconductor device of Comparative Example 1.
- an n-type impurity is implanted to the depth D3 of the semiconductor substrate.
- an n-type impurity is implanted near the lower surface 12b of the semiconductor substrate 12 (for example, depth D1).
- the lower surface 12b of the semiconductor substrate 12 is melted by laser annealing.
- the region up to the depth D2 shown in FIG. 9 is melted.
- a contact region 36 is formed.
- the region near the depth D3 is heated by laser annealing although it does not melt.
- the n-type impurity is activated in the vicinity of the depth D3, and the buffer region 34 is formed in the vicinity of the depth D3.
- a semiconductor device in which n-type impurities are distributed as shown in FIG. 9 is obtained.
- the buffer region 34 is formed by the heat of laser annealing, it is necessary to form the buffer region 34 at a position close to the lower surface 12b (that is, the depth D3 needs to be shallow). For this reason, the buffer region 34 cannot be formed at a deep position. Therefore, the breakdown voltage of the semiconductor device of Comparative Example 1 tends to decrease when the lower surface 12b is scratched.
- the contact region 36 and the buffer region 34 are not sufficiently separated. For this reason, when the semiconductor device is mass-produced by this method, variations in the efficiency of electron injection into the contact region 36 tend to occur.
- FIG. 10 shows n-type impurity concentration distributions in the contact region 36, the buffer region 34, and the drift region 32 of the semiconductor device of Comparative Example 2.
- the manufacturing method of the semiconductor device of Comparative Example 2 is the same as that of Comparative Example 1.
- the n-type impurity implantation depth D3 for the buffer region 34 is deeper than that of the first comparative example.
- the semiconductor substrate 12 is melted to a position deeper than the comparative example 1 in order to activate the n-type impurity implanted at a depth D3 deeper than the comparative example 1. For this reason, as shown in FIG.
- the buffer region 34 is formed at a deeper position than Comparative Example 1, while the contact region 36 becomes wider, and the n-type of the contact region 36 is formed. Impurity concentration is low. For this reason, the semiconductor device of Comparative Example 2 has a problem that the contact resistance of the contact region 36 to the cathode electrode 22 is high. Also in the semiconductor device of Comparative Example 2, the minimum value N2 is high, and the contact region 36 and the buffer region 34 are not sufficiently separated.
- FIG. 11 shows n-type impurity concentration distributions in the contact region 36, the buffer region 34, and the drift region 32 of the semiconductor device of Comparative Example 3.
- an n-type impurity is implanted to a depth D3.
- the depth D3 of Comparative Example 3 is equivalent to the depth D3 of Example 1.
- the lower surface 12b of the semiconductor substrate 12 is melted by laser annealing.
- the depth D1 is heated by melting up to a depth close to the depth D1 (depth Da in FIG. 11).
- the impurity implanted to the depth D1 is diffused to form the buffer region 34.
- an n-type impurity is implanted to a depth near the lower surface 12 b of the semiconductor substrate 12.
- the lower surface 12b of the semiconductor substrate 12 is melted by laser annealing. That is, only a region shallower than the depth Da is melted, and n-type impurities are diffused into the melted region. Thereby, the contact region 36 is formed.
- a contact region 36 having a high n-type impurity concentration and a buffer region 34 formed at a deep position can be realized.
- the first laser annealing laser annealing that melts to the depth Da
- the first laser annealing laser annealing that melts to the depth Da
- the p-type impurity may diffuse into the region from the lower surface 12b to the depth Da.
- the p-type impurity concentration may exceed the n-type impurity concentration at the depth D2 having the minimum value N2 of the n-type impurity. That is, a p-type region may be formed between the contact region 36 and the buffer region 34.
- a p-type region is formed between the contact region 36 and the buffer region 34, and the characteristics of the diode are not stable during mass production.
- these steps are performed in the order of the buffer injection step, the buffer annealing step, the contact injection step, and the contact annealing step.
- the execution order of these steps may be changed. The order may be changed as long as the buffer annealing process is performed after the buffer process and the contact annealing process is performed after the contact implantation process.
- the semiconductor device in which only the diode is formed has been described.
- the above-described technique is applied to the diode portion of the RC-IGBT in which the diode and the IGBT are formed on a single semiconductor substrate.
- An example of the RC-IGBT is the configuration shown in FIG. In FIG. 12, reference numerals 20 to 22 and 30 to 36 correspond to the first embodiment.
- Reference number 51 is an emitter region
- reference number 52 is a body region
- reference number 53 is a collector region
- reference number 55 is a gate insulating film
- reference number 56 is a gate electrode.
- These constituent elements 51 to 56 and regions 32 and 34 form an IGBT.
- the anode electrode 20 also serves as an IGBT emitter electrode
- the cathode electrode 22 also serves as an IGBT collector electrode.
- the diode has been described.
- the above-described technique may be applied to the contact region between the source region and the source electrode of the FET (eg, MOSFET) and the contact region between the drain region and the drain electrode.
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Abstract
Description
本出願は、2014年2月10日に出願された日本特許出願特願2014-023873の関連出願であり、この日本特許出願に基づく優先権を主張するものであり、この日本特許出願に記載された全ての内容を、本明細書を構成するものとして援用する。
(特徴1)極大値N1を有する深さよりも表面側に、極大値N1の1/10の第1導電型不純物の濃度N5を有する深さが存在していてもよい。この場合、濃度N5を有する深さから極大値N1を有する深さまでの距離cが、距離bの2倍より大きくてもよい。
(特徴2)半導体基板にダイオードとIGBTが形成されており、第1導電型領域がダイオードのカソード領域であってもよい。
(特徴3)極大値N1を有する深さが表面から0.3~0.7μmの範囲内に存在してもよい。
(特徴4)極大値N3を有する深さが表面から0.5~3.0μmの範囲内に存在してもよい。
図1に示す実施例1の半導体装置10は、半導体基板12と、半導体基板12の上面12aに形成されたアノード電極20と、半導体基板12の下面12bに形成されたカソード電極22を有している。
次に、図4に示すように、半導体基板12の裏面に、n型不純物を注入する。ここでは、n型不純物の平均停止位置が、半導体基板12の下面12bから深さD3の位置となるように、注入エネルギーを調節する。
次に、炉またはレーザアニール装置を用いることによって、半導体基板12をアニールする。ここでは、バッファ注入工程でn型不純物が注入された深さD3の位置が十分に加熱されるようにアニールを行う。また、アニールは、半導体基板12の表面が溶融しない温度で行う。これによって、バッファ注入工程で注入されたn型不純物を拡散、活性化させる。これによって、図5に示すように、半導体基板12中にバッファ領域34が形成される。すなわち、バッファアニール工程を実施することで、図2に示すようにガウス分布状にn型不純物が分布するバッファ領域34が形成される。バッファ注入工程におけるn型不純物の平均停止深さが深さD3であるので、バッファアニール工程後に、図2に示すように深さD3にn型不純物濃度の極大値N3が形成される。また、バッファ領域34よりも上面12a側のn型不純物濃度が低い領域は、ドリフト領域32となる。
次に、図6に示すように、半導体基板12の下面12bに、n型不純物を注入する。ここでは、n型不純物の平均停止位置が、バッファ領域34よりも浅い位置となるように注入エネルギーを調節する。また、コンタクト注入工程では、バッファ注入工程よりも高い濃度でn型不純物を注入する。このため、コンタクト注入工程でn型不純物の注入を受けた領域(すなわち、下面12b近傍の領域)には、高密度の結晶欠陥が形成される。
次に、レーザアニールによって、半導体基板12をアニールする。ここでは、半導体基板12の下面12bにレーザを照射することによって、下面12b近傍を局所的にアニールする。より詳細には、レーザアニールは、バッファ領域34に多くの熱が伝わらないように、短時間で行われる。また、レーザアニールは、下面12b近傍の半導体層が溶融する温度まで昇温するように実施される。具体的には、深さD2よりも深い側(上面12a側)の領域が溶融しないように、レーザアニールが実施される。レーザアニールによって溶融した領域36は、その後、固化して再結晶化する。コンタクト注入工程で注入されたn型不純物は、溶融した領域36内に略均等に拡散する。このため、領域36が再結晶化すると、領域36は高濃度にn型不純物を含有するコンタクト領域36となる。すなわち、図7に示すように、半導体基板12の下面12bに露出する範囲に、コンタクト領域36が形成される。
実施例2の半導体装置では、図8に示すように、下面12bにおけるn型不純物濃度Nsが、実施例1に比べて低い。実施例2では、N1/10>Nsとなっている。このため、深さD1よりも浅い領域内に、N5=N1/10となるn型不純物濃度N5を有する深さD5が存在する。実施例2では、深さD5から深さD1までの距離cが、c>2bの関係を満たす。実施例2の半導体装置は、実施例1と同様の方法により製造される。半導体基板の表面を溶融させる方法によって比較的厚みが厚いコンタクト領域36を形成する際には、実施例2のように、下面12bにおけるn型不純物濃度Nsが低くなる場合がある。この場合でも、典型的なボックスプロファイルにおいては、c>2bの関係が満たされる。このように濃度Nsが低い場合には、距離cと距離bによってボックスプロファイルを定義することもできる(実施例1のように下面12bにおけるn型不純物濃度NsがNs>N1/10を満たす場合には、実施例1のように下面12bと深さD1の間の距離aがa>2bの関係を満たせばよい)。実施例2の半導体装置及びその製造方法でも、実施例1の半導体装置と略同じ利点が得られる。
図9は、比較例1の半導体装置のコンタクト領域36、バッファ領域34、ドリフト領域32のn型不純物濃度分布を示している。比較例1の半導体装置の製造方法では、まず、半導体基板の深さD3にn型不純物を注入する。次に、半導体基板12の下面12b近傍(例えば、深さD1)にn型不純物を注入する。次に、レーザアニールによって、半導体基板12の下面12bを溶融させる。このとき、図9に示す深さD2までの領域を溶融させる。これによって、コンタクト領域36が形成される。また、深さD3近傍の領域は、溶融しないものの、レーザアニールにより加熱される。このため、深さD3近傍においてn型不純物が活性化し、深さD3近傍にバッファ領域34が形成される。これによって、図9に示すようにn型不純物が分布する半導体装置が得られる。比較例1の方法では、レーザアニールの熱によってバッファ領域34を形成するため、バッファ領域34を下面12bに近い位置に形成する必要がある(すなわち、深さD3を浅くする必要がある)。このため、バッファ領域34を深い位置に形成することができない。したがって、比較例1の半導体装置は、下面12bにキズが生じたときに、耐圧が低下しやすい。また、深さD2におけるn型不純物濃度が高いため、コンタクト領域36とバッファ領域34が十分に分離されない。このため、この方法で半導体装置を量産した場合には、コンタクト領域36への電子の注入効率にばらつきが生じやすい。
図10は、比較例2の半導体装置のコンタクト領域36、バッファ領域34、ドリフト領域32のn型不純物濃度分布を示している。比較例2の半導体装置の製造方法は、比較例1と同様である。但し、バッファ領域34に対するn型不純物の注入深さD3が、比較例1よりも深い。また、レーザアニールでは、比較例1よりも深い深さD3に注入されたn型不純物を活性化させるために、比較例1よりも深い位置まで半導体基板12を溶融させる。このため、図10に示すように、比較例2の半導体装置では、バッファ領域34が比較例1よりも深い位置に形成されている一方で、コンタクト領域36が幅広となり、コンタクト領域36のn型不純物濃度が低くなっている。このため、比較例2の半導体装置では、コンタクト領域36のカソード電極22に対するコンタクト抵抗が高いという問題がある。また、比較例2の半導体装置でも、極小値N2が高く、コンタクト領域36とバッファ領域34が十分に分離されない。
図11は、比較例3の半導体装置のコンタクト領域36、バッファ領域34、ドリフト領域32のn型不純物濃度分布を示している。比較例3の半導体装置の製造方法では、まず、深さD3にn型不純物を注入する。比較例3の深さD3は、実施例1の深さD3と同等である。次に、半導体基板12の下面12bをレーザアニールによって溶融させる。ここでは、深さD3の領域は溶融させないものの、深さD1に近い深さ(図11の深さDa)までを溶融させることで、深さD1を加熱する。これによって、深さD1に注入された不純物を拡散させ、バッファ領域34を形成する。次に、半導体基板12の下面12b近傍の深さにn型不純物を注入する。次に、半導体基板12の下面12bをレーザアニールによって溶融させる。すなわち、深さDaよりも浅い領域のみを溶融させ、その溶融させた領域にn型不純物を拡散させる。これによって、コンタクト領域36を形成する。比較例3の方法によれば、図11に示すように、n型不純物濃度が高いコンタクト領域36と、深い位置に形成されたバッファ領域34を実現することができる。しかしながら、比較例3の方法では、半導体基板12の下面12bにp型不純物が意図せず付着している場合に、最初のレーザアニール(深さDaまで溶融させるレーザアニール)において溶融領域内にp型不純物が拡散する。これによって、図11に示すように、下面12bから深さDaまでの領域にp型不純物が拡散する場合がある。すると、n型不純物の極小値N2を有する深さD2において、p型不純物濃度がn型不純物濃度を上回る場合がある。すなわち、コンタクト領域36とバッファ領域34の間にp型領域が形成される場合がある。このように、比較例3の方法では、コンタクト領域36とバッファ領域34の間にp型領域が形成されるおそれがあり、量産時にダイオードの特性が安定しない。
本明細書または図面に説明した技術要素は、単独であるいは各種の組み合わせによって技術的有用性を発揮するものであり、出願時請求項記載の組み合わせに限定されるものではない。また、本明細書または図面に例示した技術は複数目的を同時に達成するものであり、そのうちの一つの目的を達成すること自体で技術的有用性を持つものである。
Claims (6)
- 半導体基板の表面に露出している第1導電型領域を有しており、
前記第1導電型領域における第1導電型不純物の濃度分布を前記半導体基板の厚み方向に沿って見たときに、極大値N1、極小値N2、極大値N3が形成されており、
前記極大値N1を有する深さが、前記極小値N2を有する深さよりも前記表面側に位置しており、
前記極大値N3を有する深さが、前記極小値N2を有する前記深さよりも前記表面の反対側に位置しており、
前記極大値N3を有する前記深さよりも前記表面の反対側に位置する前記第1導電型領域内に、第1導電型不純物の濃度N4を有する領域が存在し、
N1>N3>N2>N4の関係が満たされており、
N3/10>N2の関係が満たされており、
前記表面から前記極大値N1を有する深さまでの距離aが、前記極大値N1を有する深さから前記極小値N2を有する深さまでの距離bの2倍より大きい、
半導体装置。 - 前記極大値N1を有する前記深さよりも前記表面側に、前記極大値N1の1/10の第1導電型不純物の濃度N5を有する深さが存在しており、
前記濃度N5を有する深さから前記極大値N1を有する深さまでの距離cが、前記距離bの2倍より大きい、
請求項1の半導体装置。 - 前記半導体基板に、ダイオードが形成されており、
前記第1導電型領域がダイオードのカソード領域である請求項1または2の半導体装置。 - 前記半導体基板に、IGBTがさらに形成されている請求項3の半導体装置。
- 前記半導体基板に、MOSFETが形成されており、
前記第1導電型領域がMOSFETのソース領域またはドレイン領域である請求項1または2の半導体装置。 - 半導体装置を製造する方法であって、
第1導電型の半導体基板の表面に、第1導電型不純物を注入する第1注入工程と、
前記第1注入工程後に、前記半導体基板が溶融しない温度で前記半導体基板を熱処理する工程と、
前記半導体基板の前記表面に、前記第1注入工程よりも低いエネルギーで前記第1注入工程よりも高濃度に第1導電型不純物を注入する第2注入工程と、
第2注入工程後に、前記第1注入工程における第1導電型不純物の平均停止位置よりも前記表面側の領域を溶融させ、その後、固化させる工程、
を有する方法。
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