WO2014046238A1 - 半導体駆動装置 - Google Patents
半導体駆動装置 Download PDFInfo
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- WO2014046238A1 WO2014046238A1 PCT/JP2013/075468 JP2013075468W WO2014046238A1 WO 2014046238 A1 WO2014046238 A1 WO 2014046238A1 JP 2013075468 W JP2013075468 W JP 2013075468W WO 2014046238 A1 WO2014046238 A1 WO 2014046238A1
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- switching element
- mosfet
- overcurrent
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
- H02H9/02—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess current
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
- H03K17/0828—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in composite switches
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
- H03K17/161—Modifications for eliminating interference voltages or currents in field-effect transistor switches
- H03K17/162—Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
- H03K17/163—Soft switching
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/0003—Details of control, feedback or regulation circuits
- H02M1/0009—Devices or circuits for detecting current in a converter
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/32—Means for protecting converters other than automatic disconnection
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch
Definitions
- the present invention relates to a semiconductor drive device that turns off a switching element when an overcurrent flowing through the switching element such as an IGBT is detected.
- Patent Document 1 discloses a semiconductor protection circuit having a high-speed protection circuit that turns off an IGBT when an overcurrent flowing through the IGBT is detected by an overcurrent detection resistor.
- An object of the present invention is to provide a semiconductor drive device that can quickly cut off an overcurrent flowing through a switching element even when a current due to a feedback capacitor flows through a gate.
- the present invention provides: When an overcurrent flowing between the first main electrode and the second main electrode of the switching element is detected, the gate of the switching element is electrically connected to a predetermined reference potential to thereby connect the gate and the first main electrode.
- First control means for lowering a control voltage applied between the main electrode and the switching element to turn off the switching element;
- Detecting means for detecting a current caused by charging or discharging of a feedback capacitor between the gate and the second main electrode;
- a semiconductor drive device comprising: a second control unit that lowers a resistance value between the gate and the reference potential when the overcurrent and a current caused by charging or discharging the feedback capacitor are detected.
- the present invention provides: When an overcurrent flowing between the first main electrode and the second main electrode of the switching element is detected, the control voltage applied between the gate of the switching element and the first main electrode is reduced.
- First control means for turning off the switching element;
- Detecting means for detecting a current caused by charging or discharging of a feedback capacitor between the gate and the second main electrode;
- the present invention provides a semiconductor drive device comprising: a second control unit that increases a decrease rate of the control voltage when the overcurrent and a current generated by charging or discharging the feedback capacitor are detected.
- the overcurrent flowing to the switching element can be quickly cut off.
- FIG. 1 is a block diagram showing a configuration of a semiconductor drive device 10 according to an embodiment of the present invention.
- the semiconductor drive device 10 is a circuit that drives the switching element 20, and includes a gate drive circuit 30, a short circuit detection circuit 40, a soft shutdown circuit 50, a resistor R1, and a gate potential change circuit 60.
- the semiconductor drive device 10 may be configured by an integrated circuit or may be configured by discrete components.
- the switching element 20 is a semiconductor element that performs on / off operation, and is, for example, a voltage-controlled power element using an insulated gate such as an IGBT or a MOSFET.
- FIG. 1 illustrates an IGBT that is an example of the switching element 20.
- the gate (G) of the switching element 20 is a control electrode connected to a connection point a to which the gate driving circuit 30, the resistor R1, and the gate potential changing circuit 60 are connected, and is connected to the soft shutdown circuit 50 via the resistor R1. It is connected.
- the emitter (E) of the switching element 20 is a first main electrode connected to a predetermined reference potential (in the case of FIG. 1, ground (GND)) via the current path 71.
- the collector (C) of the switching element 20 is a second main electrode connected to the power supply voltage via another semiconductor switching element (not shown) on the current path 70 and a load.
- the switching element 20 may be an N-channel MOSFET.
- the gate (G) of the N-channel MOSFET is a control electrode connected to the connection point a, and is connected to the soft shutdown circuit 50 via the resistor R1.
- the source (S) of the N-channel MOSFET is a first main electrode connected to a predetermined reference potential (in the case of FIG. 1, ground (GND)) via the current path 71.
- the drain (D) of the N-channel MOSFET is a second main electrode connected to the power supply voltage via another semiconductor switching element (not shown) on the current path 70 or a load.
- the gate drive circuit 30 is a circuit that outputs a gate drive signal capable of switching on / off of the switching element 20 to the gate of the switching element 20.
- the gate drive circuit 30 is preferably connected between the gate of the switching element 20 and the resistor R1, for example, as shown in FIG. Further, the gate drive circuit 30 may be connected between the soft shutdown circuit 50 and the resistor R1, or may be a circuit including the soft shutdown circuit 50 itself.
- the short circuit detection circuit 40 is an overcurrent detection means for detecting an overcurrent OC flowing between the emitter and collector of the switching element 20.
- detecting the overcurrent OC for example, it is possible to detect the occurrence of a short-circuit fault (for example, a short-circuit fault of a semiconductor element or wiring) on the current path 70 connected to the collector of the switching element 20.
- the soft shutdown circuit 50 makes a first connection between the gate of the switching element 20 and the ground to lower the control voltage Vge and turn off the switching element 20. It is a control means. By making the control voltage Vge applied between the gate and emitter of the switching element 20 lower than the gate threshold voltage of the switching element 20, the switching element 20 can be turned off.
- the control voltage Vge is a potential difference between the gate of the switching element 20 and the first main electrode (emitter in the case of FIG. 1), and is also referred to as a gate voltage.
- the soft shutdown circuit 50 is a control unit that lowers the control voltage Vge by, for example, outputting a low-level signal that can extract (discharge) the gate charge of the switching element 20.
- the soft shutdown circuit 50 can lower the control voltage Vge by lowering the potential of the gate of the switching element 20 toward the side where the switching element 20 is turned off.
- the soft shutdown circuit 50 reduces, for example, the total resistance value R between the gate of the switching element 20 and the ground via a resistor R1 inserted in series between the gate of the switching element 20 and the ground.
- the control unit may lower the control voltage Vge.
- the resistor R1 is detection means (current detection unit) that detects a current Ires that flows when an overcurrent OC occurs in the feedback capacitance Cres that exists between the gate and the collector of the switching element 20.
- the current Ires is a current generated when the feedback capacitor Cres is charged or discharged.
- a potential difference ⁇ VR is generated at both ends of the resistor R1, and therefore the generation of the current Ires can be detected according to the magnitude of the potential difference ⁇ VR.
- the resistor R ⁇ b> 1 is an element connected in series to the gate of the switching element 20, and is inserted in series between the gate of the switching element 20 and the soft shutdown circuit 50. It is preferable.
- the gate potential changing circuit 60 When the overcurrent OC is detected by the short circuit detection circuit 40 and the current Ires is detected by the resistor R1, the gate potential changing circuit 60 is connected to the gate of the switching element 20 and a predetermined reference potential (in the case of FIG. 1, ground). This is a second control means for lowering the total resistance value R between them.
- the gate potential changing circuit 60 may be a second control unit that increases the decrease rate of the control voltage Vge when the overcurrent OC is detected by the short circuit detection circuit 40 and the current Ires is detected by the resistor R1.
- the gate potential changing circuit 60 may lower the total resistance value R by decreasing the potential of the gate of the switching element 20 toward the side where the switching element 20 is turned off, and may decrease the control voltage Vge. May be faster.
- the gate potential changing circuit 60 is preferably configured to lower the total resistance value R to a lower value than when the soft shutdown circuit 50 decreases the total resistance value R.
- the soft shutdown circuit 50 is connected to the gate of the switching element 20 via the resistor R1, whereas the gate potential changing circuit 60 is directly connected to the gate of the switching element 20 without passing through the resistor R1. It is connected. Therefore, the gate potential changing circuit 60 can change the gate potential of the switching element 20 with a lower impedance than when the soft shutdown circuit 50 decreases the total resistance value R.
- FIG. 2 and FIG. 3 are diagrams showing examples of waveforms at the time of short circuit and at the time of non-short circuit.
- Vce represents a collector-emitter voltage (collector voltage) of the switching element 20
- Ires represents a current flowing through the gate-collector feedback capacitance Cres of the switching element 20
- Ice represents a current (collector current) flowing between the collector and emitter of the switching element 20
- Vge represents a gate-emitter voltage (gate voltage) of the switching element 20
- t represents time.
- SCtype1 is a short-circuit mode in which the change in the collector voltage Vce is relatively small.
- the collector voltage Ice increases (that is, the overcurrent is reduced) while the change rate (dVce / dt) of the collector voltage Vce remains relatively small before and after the switching element 20 is turned on. Flowing).
- Ires that changes momentarily to a negative value represents not a current due to a short circuit but a charging current that flows through the feedback capacitor Cres when the switching element 20 is turned on.
- SCtype2 is a short-circuit mode in which the change in the collector voltage Vce is relatively large, for example, when the collector of the switching element 20 is short-circuited to the power supply voltage while the switching element 20 is on.
- the change rate (dVce / dt) of the collector voltage Vce increases rapidly immediately after the start of the short circuit, and the collector current Ice increases (that is, an overcurrent flows).
- the voltage Vge is raised by the current Ires flowing from the collector of the switching element 20 to the gate through the feedback capacitor Cres.
- the timing at which the current Ires flows may be slightly earlier than the timing at which an overcurrent is detected.
- the semiconductor drive device 10 in FIG. 1 detects the current Ires, it can automatically determine whether the short-circuit mode is the SCtype1 or SCtype2. For this reason, the switching element 20 can be promptly protected from overcurrent regardless of whether the short-circuit mode is SCtype1 or SCtype2.
- the overcurrent OC is detected by the short circuit detection circuit 40. Therefore, since the switching element 20 is quickly turned off by the soft shutdown circuit 50, the overcurrent OC can be quickly cut off, and the time during which the overcurrent OC flows can be shortened. In this case, since the potential difference ⁇ VR is less than the predetermined threshold value, the current Ires is not detected. For this reason, the gate potential changing circuit 60 does not function when the short circuit mode is SCtype1. That is, the total resistance value R between the gate of the switching element 20 and the ground is not lowered (the decrease rate of the control voltage Vge is not increased).
- the soft shutdown circuit 50 performs an operation of turning off the switching element 20 by reducing the control voltage Vge. Further, in this case, the overcurrent OC is detected by the short circuit detection circuit 40, and the potential difference ⁇ VR detected by the resistor R1 becomes equal to or greater than a predetermined threshold due to the current Ires flowing. Therefore, the gate potential changing circuit 60 performs an operation of reducing the total resistance value R between the gate of the switching element 20 and the ground (or increasing the decrease rate of the control voltage Vge). Thereby, since the switching element 20 is quickly turned off, the overcurrent OC can be quickly cut off, and the time during which the overcurrent OC flows can be shortened.
- the gate potential changing circuit 60 does not function. Therefore, the speed at which the switching element 20 is turned off can be kept suppressed by the soft shutdown circuit 50, and an increase in the off surge of the switching element 20 can be suppressed.
- FIG. 4 is a circuit diagram showing a configuration of a semiconductor drive device 11 which is a specific example of the semiconductor drive device 10 of FIG. Description of the same configuration as that of FIG. 1 is omitted or simplified.
- the semiconductor drive device 11 is a circuit for driving the IGBT 21 and includes a gate drive circuit 30, a short circuit detection circuit 40, a soft shutdown circuit 50, a resistor R1, and a gate potential change circuit 60.
- the short circuit detection circuit 40 is an overcurrent detection means for detecting an overcurrent OC flowing between the emitter and collector of the IGBT 21.
- the short circuit detection circuit 40 detects an overcurrent OC by detecting a current flowing through a resistor R5 inserted in series between the sense emitter (current detection terminal) of the IGBT and the ground.
- the short circuit detection circuit 40 has a resistor R5 and an NPN bipolar transistor 41 having a base connected between the sense emitter of the IGBT 21 and the resistor R5.
- the NPN bipolar transistor 41 is connected to the emitter connected to the ground and the gate of the P-channel type MOSFET 62 of the gate potential changing circuit 60.
- the soft shutdown circuit 50 controls the IGBT 21 to be turned off by reducing the control voltage Vge by conducting between the gate of the IGBT 21 and the ground. It is.
- the soft shutdown circuit 50 includes a control circuit 51, an N-channel MOSFET 52, and a resistor R4.
- the control circuit 51 is a control unit that turns on the MOSFET 52 when the overcurrent OC is detected by the resistor R5.
- the MOSFET 52 is turned on, the gate of the IGBT 21 is connected to the ground via the resistor R1 and the resistor R4. As a result, the control voltage Vge decreases, and the IGBT 21 can be turned off.
- the resistor R1 is detection means (current detection unit) that detects the current Ires that flows when the overcurrent OC occurs in the feedback capacitor Cres that exists between the gate and the collector of the IGBT 21.
- the gate potential changing circuit 60 is a control unit that lowers and changes the gate potential of the switching element 20 by reducing the total resistance value R between the ground and the gate of the IGBT 21.
- the gate potential changing circuit 60 includes, for example, a PNP bipolar transistor 61, a P-channel type MOSFET 62, a resistor R2, and a resistor R3.
- the transistor 61 is a first semiconductor element that lowers the total resistance value R by applying a potential difference ⁇ VR generated when the current Ires flows through the resistance R1. By reducing the total resistance value R, the gate of the IGBT 21 is provided. The potential is changed. The transistor 61 is turned on so that the difference between the gate potential of the IGBT 21 and the ground, which is the emitter-side reference potential, approaches zero, so that the gate charge of the IGBT 21 can be discharged to the ground.
- the MOSFET 62 is a second semiconductor element that allows the transistor 61 to lower the total resistance value R by detecting the overcurrent OC, and controls that the potential difference ⁇ VR is applied between the base and the emitter of the transistor 61. Is.
- the MOSFET 62 is turned on by detecting the overcurrent OC by the short circuit detection circuit 40, thereby enabling the transistor 61 to be turned on, and allowing the transistor 61 to reduce the total resistance value R.
- the transistor 61 is an element connected to both ends a and b of the resistor R1
- the MOSFET 62 is an element inserted between the connection point b on one end side of the resistor R1 and the base of the transistor 61.
- the base that is the control electrode of the transistor 61 is connected to the source of the MOSFET 62
- the emitter that is the first main electrode of the transistor 61 is connected to the connection point a between the gate of the IGBT 21 and the resistor R 1.
- the collector that is the second main electrode is connected to the ground.
- the gate that is the control electrode of the MOSFET 62 is connected to the collector of the transistor 41 of the short circuit detection circuit 40, the source that is the first main electrode of the MOSFET 62 is connected to the base of the transistor 61, and the second main electrode of the MOSFET 62 is A certain drain is connected to the connection point b.
- the connection point b is a point between the resistance R4 and the resistance R1 of the soft shutdown circuit 50.
- the resistance value of the resistor R1 is such that the potential difference ⁇ VR between both ends a and b of the resistor R1 is less than the diode forward voltage between the base and the emitter of the transistor 61 when SCtype1, and the potential difference ⁇ Vr is the diode when SCtype2 It may be set to a value that is greater than or equal to the forward voltage.
- the resistor R2 is an element that prevents the transistor 61 from being turned on by mistake. Without the resistor R2, when the transistor 41 and the MOSFET 62 are turned off, the base-emitter voltage of the transistor 61 is high because the impedance between the base-emitter of the transistor 61 is high. At this time, if the potential of the emitter of the transistor 61 (the gate of the IGBT 21) rises, a potential difference corresponding to the forward voltage Vf of the diode is generated between the base and emitter of the transistor 61, so that the transistor 61 may be erroneously turned on. . By adding the resistor R2, the impedance between the base and the emitter of the transistor 61 can be lowered, so that erroneous turn-on of the transistor 61 can be prevented.
- the resistor R3 is an element that prevents the MOSFET 62 from being turned on by mistake. If the impedance between the gate and the source of the MOSFET 62 is high due to the absence of the resistor R3, a potential difference occurs between the gate and the source of the MOSFET 62, and the MOSFET 62 may be erroneously turned on. By adding the resistor R3, the impedance between the gate and the source of the MOSFET 62 can be lowered, and the MOSFET 62 can be prevented from being erroneously turned on.
- the resistor R3 may be set to a larger resistance value than the resistor R2 so that the transistor 61 is not turned on only by turning on the transistor 41.
- the PNP bipolar transistor 61 may be replaced with a P-channel type MOSFET.
- the P-channel MOSFET has a gate connected to the source of the MOSFET 62, a source that is the first main electrode connected to the gate of the IGBT 21, and a drain that is the second main electrode connected to the ground. And have.
- the cathode side of the parasitic diode between the source and drain of the MOSFET 62 is located on the base or gate side of the transistor 61. This is because, when the parasitic diode is in the reverse direction, if the soft shutdown circuit 50 performs a soft shutdown with SCtype1, current flows through the parasitic diode in the reverse direction, and the transistor 61 may be erroneously turned on. Therefore, the MOSFET 62 may be an N-channel MOSFET as long as the forward direction of the parasitic diode coincides with the illustrated direction and the output signal of the short circuit detection circuit 40 is inverted.
- Table 1 shows the state of each element of the semiconductor drive device 11.
- S1 represents the on / off state of the transistor 41
- S2 represents the on / off state of the MOSFET 62
- S3 represents the on / off state of the transistor 61
- S4 represents the on / off state of the MOSFET 52. Represents a state.
- SCtype1 a soft shutdown is performed by turning on the transistor 52.
- SCtype2 in addition to the soft shutdown being performed when the transistor 52 is turned on, the transistor 61 is turned on, whereby the charge of the gate of the IGBT 21 is extracted with low impedance.
- the transistor 41 when the voltage SE across the resistor R5 rises during a short circuit, the transistor 41 is turned on, so that the MOSFET 62 is also turned on.
- the transistor 61 When the current Ires flows from the collector of the IGBT 21 to the gate while the MOSFET 62 is on, the transistor 61 is turned on, so that the gate charge of the IGBT 21 can be discharged with low impedance. That is, the transistor 61 is not turned on when SCtype1 and is turned on only when SCtype2.
- the resistor R3 is set to a larger resistance value than the resistor R2 so that the transistor 61 is not turned on only by turning on the transistor 41.
- SCtype1 when the MOSFET 62 is turned on, a voltage divided by the resistors R2 and R3 is applied to the base of the transistor 61, so that the transistor 61 is not erroneously turned on.
- SCtype2 when the MOSFET 62 is turned on, the transistor 61 is turned on by the potential difference ⁇ VR generated at both ends of the resistor R1.
- FIG. 5 is a circuit diagram showing a configuration of a semiconductor drive device 12 which is a modification of the semiconductor drive device 10 of FIG.
- the semiconductor drive device 12 is obtained by replacing the resistor R1 of the semiconductor drive device 11 of FIG. 4 with a diode D1.
- the description of the same configuration as that of FIGS. 1 and 4 is omitted or simplified.
- the diode D1 is detection means (current detection unit) that detects a current Ires that flows when an overcurrent OC occurs in the feedback capacitor Cres that exists between the gate and the collector of the IGBT 21.
- the current Ires is a current generated when the feedback capacitor Cres is charged or discharged. Since the current Ires flows, a potential difference ⁇ VR corresponding to the forward voltage of the diode D1 is generated at both ends of the diode D1, so that the generation of the current Ires can be detected according to the magnitude of the potential difference ⁇ VR.
- the diode D1 is an element having an anode connected in series to the gate of the switching element and a cathode connected to the resistor R4 of the soft shutdown circuit 50, as illustrated in FIG.
- the diode D1 is preferably an element having a forward voltage that does not turn on the transistor 61 in SCtype1 and turns on the transistor 61 in SCtype2.
- the PNP bipolar transistor 61 may be replaced with a P-channel MOSFET as in the semiconductor drive device 11 of FIG.
- the description of the operation of the semiconductor drive device 12 is the same as that of the semiconductor drive device 11 of FIG.
- FIG. 6 is a block diagram showing a configuration of a semiconductor drive device 13 which is a specific example of the semiconductor drive device 10 of FIG.
- the semiconductor drive device 10 in FIG. 1 is a circuit that drives and protects an IGBT or N-channel type MOSFET, whereas the semiconductor drive device 13 in FIG. 6 is a circuit that drives and protects a P-channel type MOSFET 22. .
- the description of the same configuration as that of FIGS. 1, 4 and 5 is omitted or simplified.
- the gate (G) of the MOSFET 22 is a control electrode connected to a connection point a where the gate driving circuit 30, the resistor R1, and the gate potential changing circuit 60 are connected, and is connected to the soft shutdown circuit 50 via the resistor R1. ing.
- the source (S) of the MOSFET 22 is a first main electrode connected to a predetermined reference potential (in the case of FIG. 6, the power supply voltage (VB)) via the current path 73.
- the drain (D) of the MOSFET 22 is a second main electrode connected to the ground via another semiconductor switching element (not shown) on the current path 72 and a load.
- the short circuit detection circuit 40 is an overcurrent detection means for detecting an overcurrent OC flowing between the source and drain of the MOSFET 22. By detecting the overcurrent OC, it is possible to detect the occurrence of a short-circuit fault (for example, a short-circuit fault in a semiconductor element or wiring) on the current path 72 connected to the drain of the MOSFET 22.
- a short-circuit fault for example, a short-circuit fault in a semiconductor element or wiring
- the short-circuit detection circuit 40 may detect the overcurrent OC by detecting a current flowing through a resistor (not shown) inserted in series between the source of the MOSFET 22 and the power supply voltage VB, for example.
- a resistor not shown
- the short circuit detection circuit 40 for example, a circuit in which the polarity is reversed with respect to the configuration shown in FIG.
- the soft shutdown circuit 50 conducts between the gate of the MOSFET 22 and the power supply voltage VB to reduce the control voltage Vgs and turn off the MOSFET 22. It is.
- the MOSFET 22 can be turned off by making the control voltage Vgs applied between the gate and the source of the MOSFET 22 lower than the gate threshold voltage of the MOSFET 22.
- the control voltage Vgs is a potential difference between the gate of the MOSFET 22 and the first main electrode (source in the case of FIG. 6), and is also referred to as a gate voltage.
- the soft shutdown circuit 50 is a control unit that lowers the control voltage Vgs by outputting a high-level signal that can inject (charge) the gate of the MOSFET 22, for example.
- the soft shutdown circuit 50 can lower the control voltage Vgs by increasing the potential of the gate of the MOSFET 22 to the side where the MOSFET 22 is turned off.
- the soft shutdown circuit 50 reduces, for example, the total resistance value R between the gate of the MOSFET 22 and the power supply voltage VB via a resistor R1 inserted in series between the gate of the MOSFET 22 and the power supply voltage VB.
- the control unit may lower the control voltage Vgs.
- the soft shutdown circuit 50 for example, a circuit in which the polarity is reversed with respect to the configuration shown in FIG.
- the resistor R1 is detection means (current detection unit) that detects a current Ires that flows when an overcurrent OC occurs in the feedback capacitance Cres that exists between the gate and drain of the MOSFET 22.
- the current Ires is a current generated when the feedback capacitor Cres is charged or discharged. Since the current Ires flows from the gate to the drain, a potential difference ⁇ VR is generated at both ends of the resistor R1, and therefore the generation of the current Ires can be detected according to the magnitude of the potential difference ⁇ VR.
- This resistor R1 may also be replaced with a diode as described above.
- the gate potential changing circuit 60 When the overcurrent OC is detected by the short circuit detection circuit 40 and the current Ires is detected by the resistor R1, the gate potential changing circuit 60 is connected to the gate of the MOSFET 22 and a predetermined reference potential (in the case of FIG. 6, the power supply voltage VB). This is a second control means for lowering the total resistance value R between them.
- the gate potential changing circuit 60 may be a second control unit that increases the decrease rate of the control voltage Vgs when the overcurrent OC is detected by the short circuit detection circuit 40 and the current Ires is detected by the resistor R1.
- the gate potential changing circuit 60 may lower the total resistance value R by increasing the potential of the gate of the MOSFET 22 toward the side where the MOSFET 22 is turned off, or may increase the decrease rate of the control voltage Vgs. Good.
- the gate potential changing circuit 60 is a control unit that raises and changes the potential of the gate of the MOSFET 22 by reducing the total resistance value R between the power supply voltage VB and the gate of the MOSFET 22.
- the gate potential changing circuit 60 includes an NPN bipolar transistor 66 and a P-channel type MOSFET 67. Similarly to FIG. 4, resistors R2 and R3 may be provided.
- the transistor 66 is a first semiconductor element that lowers the total resistance value R by applying a potential difference ⁇ VR generated by the current Ires, and changes the gate potential of the MOSFET 22 by reducing the total resistance value R. is there.
- the transistor 66 is turned on so that the difference between the gate potential of the MOSFET 22 and the power supply voltage VB, which is the reference potential on the source side, approaches zero, whereby the gate of the MOSFET 22 can be charged with the charge supplied from the power supply voltage VB.
- the MOSFET 67 is a second semiconductor element that permits the transistor 66 to lower the total resistance value R by detecting the overcurrent OC, and controls the application of the potential difference ⁇ VR to the transistor 66.
- the MOSFET 67 is turned on when the overcurrent OC is detected by the short circuit detection circuit 40, thereby enabling the transistor 66 to be turned on, and allowing the transistor 66 to reduce the total resistance value R.
- the transistor 66 is an element connected to both ends a and b of the resistor R1
- the MOSFET 67 is an element inserted between the connection point b on one end side of the resistor R1 and the base of the transistor 66.
- the base that is the control electrode of the transistor 66 is connected to the drain of the MOSFET 67
- the emitter that is the first main electrode of the transistor 66 is connected to the connection point a between the gate of the MOSFET 22 and the resistor R 1.
- the collector which is the second main electrode is connected to the power supply voltage VB.
- the gate that is the control electrode of the MOSFET 67 is connected to the short-circuit detection circuit 40, the drain that is the second main electrode of the MOSFET 67 is connected to the base of the transistor 66, and the source that is the first main electrode of the MOSFET 67 is connected Connected to point b.
- the connection point b is a point between the soft shutdown circuit 50 and the resistor R1.
- the NPN bipolar transistor 66 may be replaced with an N-channel MOSFET.
- the N-channel MOSFET has a gate connected to the drain of the MOSFET 67, a source as the first main electrode connected to the gate of the MOSFET 22, and a second main electrode connected to the power supply voltage VB. And a certain drain.
- the MOSFET 67 may be an N-channel MOSFET if the forward direction of the parasitic diode is made coincident with the illustrated direction and the output signal of the short circuit detection circuit 40 is inverted.
- the semiconductor drive device has been described by way of the embodiment, but the present invention is not limited to the above embodiment.
- Various modifications and improvements, such as combinations and substitutions with part or all of other example embodiments, are possible within the scope of the present invention.
- overcurrent is detected by an overcurrent detection resistor (for example, resistor R5 in FIG. 4).
- the overcurrent may be detected by a diode or other overcurrent detection means. Also good.
- the gate potential changing circuit 60 may increase the speed at which the soft shutdown circuit 50 decreases the control voltage when the overcurrent OC and the current Ires are detected.
- the switching element driven and protected by the semiconductor driving device according to the present invention may be an upper arm element or a lower arm element constituting a push-pull circuit.
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Abstract
Description
スイッチング素子の第1の主電極と第2の主電極との間に流れる過電流が検出されたとき、前記スイッチング素子のゲートと所定の基準電位との間を導通させて前記ゲートと前記第1の主電極との間に印加される制御電圧を低下させ、前記スイッチング素子をオフさせる第1の制御手段と、
前記ゲートと前記第2の主電極との間の帰還容量の充電又は放電に伴い生ずる電流を検出する検出手段と、
前記過電流及び前記帰還容量の充電又は放電に伴い生ずる電流が検出されたとき、前記ゲートと前記基準電位との間の抵抗値を低くする第2の制御手段とを備える、半導体駆動装置を提供するものである。
スイッチング素子の第1の主電極と第2の主電極との間に流れる過電流が検出されたとき、前記スイッチング素子のゲートと前記第1の主電極との間に印加される制御電圧を低下させ、前記スイッチング素子をオフさせる第1の制御手段と、
前記ゲートと前記第2の主電極との間の帰還容量の充電又は放電に伴い生ずる電流を検出する検出手段と、
前記過電流及び前記帰還容量の充電又は放電に伴い生ずる電流が検出されたとき、前記制御電圧の減少速度を速くする第2の制御手段とを備える、半導体駆動装置を提供するものである。
図1は、本発明の一実施形態である半導体駆動装置10の構成を示したブロック図である。半導体駆動装置10は、スイッチング素子20を駆動する回路であって、ゲート駆動回路30と、短絡検出回路40と、ソフトシャットダウン回路50と、抵抗R1と、ゲート電位変更回路60とを備えるものである。半導体駆動装置10は、集積回路によって構成されてもよいし、ディスクリート部品によって構成されてもよい。
図4は、図1の半導体駆動装置10の一具体例である半導体駆動装置11の構成を示した回路図である。図1の構成と同様の構成についての説明は省略又は簡略する。
表1は、半導体駆動装置11の各素子の状態を示した図である。S1は、トランジスタ41のオン/オフの状態を表し、S2は、MOSFET62のオン/オフの状態を表し、S3は、トランジスタ61のオン/オフの状態を表し、S4は、MOSFET52のオン/オフの状態を表す。
図5は、図1の半導体駆動装置10の一変形例である半導体駆動装置12の構成を示した回路図である。半導体駆動装置12は、図4の半導体駆動装置11の抵抗R1をダイオードD1に置き換えたものである。図1,図4の構成と同様の構成についての説明は省略又は簡略する。
図6は、図1の半導体駆動装置10の一具体例である半導体駆動装置13の構成を示したブロック図である。図1の半導体駆動装置10は、IGBT又はNチャネル型のMOSFETを駆動及び保護する回路であるのに対し、図6の半導体駆動装置13は、Pチャネル型のMOSFET22を駆動及び保護する回路である。図1,図4,図5の構成と同様の構成についての説明は省略又は簡略する。
20 スイッチング素子
21 IGBT
22 MOSFET
30 ゲート駆動回路
40 短絡検出回路
50 ソフトシャットダウン回路
60 ゲート電位変更回路
70,71,72,73 電流経路
Ires 帰還容量の充電又は放電に伴い生ずる電流
Cres 帰還容量
Claims (6)
- スイッチング素子の第1の主電極と第2の主電極との間に流れる過電流が検出されたとき、前記スイッチング素子のゲートと所定の基準電位との間を導通させて前記ゲートと前記第1の主電極との間に印加される制御電圧を低下させ、前記スイッチング素子をオフさせる第1の制御手段と、
前記ゲートと前記第2の主電極との間の帰還容量の充電又は放電に伴い生ずる電流を検出する検出手段と、
前記過電流及び前記帰還容量の充電又は放電に伴い生ずる電流が検出されたとき、前記ゲートと前記基準電位との間の抵抗値を低くする第2の制御手段とを備える、半導体駆動装置。 - 前記第2の制御手段は、
前記抵抗値を前記帰還容量の充電又は放電に伴い生ずる電流の検出によって低くする第1の半導体素子と、
前記第1の半導体素子が前記抵抗値を低くすることを前記過電流の検出によって許可する第2の半導体素子とを有する、請求項1に記載の半導体駆動装置。 - 前記第1の半導体素子は、前記帰還容量の充電又は放電に伴い生ずる電流により生ずる電位差が印加されることによって前記抵抗値を低くする素子であり、
前記第2の半導体素子は、前記電位差が前記第1の半導体素子に印加されることを制御する素子である、請求項2に記載の半導体駆動装置。 - 前記電位差は、前記ゲートに接続される素子によって生ずる電圧である、請求項3に記載の半導体駆動装置。
- 前記第1の半導体素子は、前記素子の両端に接続される素子であり、
前記第2の半導体素子は、前記素子の一端と前記第1の半導体素子との間に挿入される素子である、請求項4に記載の半導体駆動装置。 - スイッチング素子の第1の主電極と第2の主電極との間に流れる過電流が検出されたとき、前記スイッチング素子のゲートと前記第1の主電極との間に印加される制御電圧を低下させ、前記スイッチング素子をオフさせる第1の制御手段と、
前記ゲートと前記第2の主電極との間の帰還容量の充電又は放電に伴い生ずる電流を検出する検出手段と、
前記過電流及び前記帰還容量の充電又は放電に伴い生ずる電流が検出されたとき、前記制御電圧の減少速度を速くする第2の制御手段とを備える、半導体駆動装置。
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DE112013004659.8T DE112013004659B4 (de) | 2012-09-24 | 2013-09-20 | Halbleiteransteuerungsvorrichtung |
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JP6365278B2 (ja) * | 2014-12-09 | 2018-08-01 | 株式会社デンソー | 電力変換装置 |
WO2017141545A1 (ja) * | 2016-02-17 | 2017-08-24 | 富士電機株式会社 | 半導体素子の過電流保護装置 |
US10071634B2 (en) * | 2016-03-22 | 2018-09-11 | Ford Global Technologies, Llc | Dynamic IGBT gate drive to reduce switching loss |
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JP6787044B2 (ja) * | 2016-10-29 | 2020-11-18 | 富士電機株式会社 | スイッチング電源装置 |
JPWO2018110230A1 (ja) * | 2016-12-15 | 2019-10-24 | 三洋電機株式会社 | 半導体スイッチの制御装置、電源システム |
DE102017214211A1 (de) * | 2017-08-15 | 2019-02-21 | Robert Bosch Gmbh | Schaltung zur Ansteuerung eines Leistungshalbleitertransistors |
JP6992696B2 (ja) * | 2018-07-26 | 2022-01-13 | オムロン株式会社 | スイッチ回路及び電力変換装置 |
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CN111371080B (zh) * | 2018-12-25 | 2022-08-30 | 上海睿驱微电子科技有限公司 | 一种具有过流限制功能的设备及其构建方法 |
JP7259570B2 (ja) * | 2019-06-10 | 2023-04-18 | 富士電機株式会社 | 駆動装置およびスイッチ装置 |
CN114303309A (zh) * | 2019-09-12 | 2022-04-08 | 欧姆龙株式会社 | 过流保护电路及开关电路 |
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