WO2014015594A1 - 用于检测液晶面板的点灯治具 - Google Patents

用于检测液晶面板的点灯治具 Download PDF

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Publication number
WO2014015594A1
WO2014015594A1 PCT/CN2012/085251 CN2012085251W WO2014015594A1 WO 2014015594 A1 WO2014015594 A1 WO 2014015594A1 CN 2012085251 W CN2012085251 W CN 2012085251W WO 2014015594 A1 WO2014015594 A1 WO 2014015594A1
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WO
WIPO (PCT)
Prior art keywords
support plate
adsorption
hole
plane
lighting fixture
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Application number
PCT/CN2012/085251
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English (en)
French (fr)
Inventor
王磊
崔子巍
薛静
吴昊
Original Assignee
北京京东方光电科技有限公司
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Application filed by 北京京东方光电科技有限公司 filed Critical 北京京东方光电科技有限公司
Priority to US14/129,340 priority Critical patent/US9666110B2/en
Publication of WO2014015594A1 publication Critical patent/WO2014015594A1/zh

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Definitions

  • Embodiments of the present invention relate to a lighting fixture for detecting a liquid crystal panel.
  • liquid crystal display devices of various sizes have been introduced, which requires liquid crystal panels of various sizes.
  • the LCD panel fails, the LCD panel should be analyzed.
  • the LCD panel should be lit with the lighting fixture, that is, the loading signal is confirmed by the lighting fixture.
  • the liquid crystal panel 500 is first placed on the lighting fixture; then the upper cover 610' of the lighting fixture is turned over by the hinge 620'. Come over, the probe 400 of the upper cover is brought into contact with the circuit test point of the liquid crystal panel, thereby completing the lighting.
  • the embodiment of the invention provides a lighting fixture for detecting a liquid crystal panel, which can realize lighting of different types of liquid crystal panels, and improves the versatility and efficiency of the lighting fixture.
  • an embodiment of the present invention provides a lighting fixture for detecting a liquid crystal panel, comprising: a bottom plate; a first support plate and a second support plate respectively located on the bottom plate and perpendicular to the bottom plate; a stage disposed between the first support plate and the second support plate and movable up and down in a direction perpendicular to the bottom plate, the adsorption stage having an adsorption surface for adsorbing the probe, and the probe is adsorbed
  • the adsorption position on the surface can be distributed according to the circuit test points of different tested liquid crystal panels. The position corresponds to the adjustment.
  • a third support plate may be further included, the third support plate is perpendicular to the bottom plate and perpendicularly intersects the first support plate and the second support plate, and the adsorption platform is disposed at the Between the first support plate, the second support plate and the third support plate.
  • a portion of the adsorption surface may be perpendicular to a plane of the bottom plate and perpendicular to a plane of the first support plate.
  • the adsorption stage may include a through hole penetrating from top to bottom, and the adsorption surface is all or part of an inner surface of the through hole.
  • the cross section of the through hole may be an I-shaped through hole, and an inner surface of the two inline portions parallel to each other of the I-shaped through holes is perpendicular to a plane of the bottom plate and a support plate is perpendicular to the plane;
  • the cross-section of the through hole may be a rectangular through hole, and the inner surfaces of the two long sides of the rectangular through hole are perpendicular to the plane of the bottom plate and perpendicular to the plane of the first support plate;
  • the cross-section of the through hole may also be an L-shaped or "shaped through hole, the inner surface of the lateral side of the L-shaped or “shaped through hole” is perpendicular to the plane of the bottom plate and perpendicular to the plane of the first support plate;
  • the through hole may be a through hole having a cross section and an inverted ⁇ shape, and an inner surface of the lateral side of the inverted T-shaped through hole is perpendicular to a plane of the bottom plate and perpendicular to a plane of the first support plate.
  • a side surface of the first support plate and/or the second support plate that is engaged with the adsorption stage is provided with a groove extending from the top to the bottom, the adsorption stage and the first support plate.
  • a side surface of the second support plate is coupled with a slider, and the suction stage is engaged between the first support plate and the second support plate by a slider snapping into the groove.
  • a side surface of the third supporting plate that is engaged with the adsorption table is provided with a top-down groove, and a side of the adsorption table that is engaged with the third support plate is provided with a slider.
  • the adsorption stage is engaged with the groove on the third support plate by a slider.
  • the adsorption stage is provided with a handle.
  • the adsorption stage is a magnetic adsorption stage
  • the probe is a magnetic probe that is magnetically attracted to the magnetic adsorption stage.
  • two upper and lower fixing holes are provided on a side of the adsorption stage that is engaged with the first support plate and/or the second support plate, and the first support plate and/or the second The side of the support plate is provided with fixing bolts, and the fixing bolts can be respectively engaged with the fixing holes.
  • the lighting fixture for detecting a liquid crystal panel provided by the embodiment of the present invention, when lighting the liquid crystal panel, placing the liquid crystal panel on the bottom plate, and passing the circuit test point of the liquid crystal panel through the first support plate and the second support plate.
  • the space between the two enters the adsorption stage, and the probe with the same number of circuit test points is adsorbed to the adsorption surface, and the position of the liquid crystal panel and the probe is adjusted to make the probe and the circuit test point of the liquid crystal panel to be detected.
  • the probe is in the test position; the adsorption stage is moved downward, and the probe is brought into contact with the circuit test point of the liquid crystal panel to realize lighting.
  • FIG. 1 is a schematic view showing the working principle of lighting a liquid crystal panel by a conventional lighting fixture
  • FIG. 2 is a schematic diagram of a lighting fixture for detecting a liquid crystal panel according to an embodiment of the present invention
  • Fig. 3 is a schematic exploded view of the lighting fixture shown in Fig. 2.
  • a lighting fixture for detecting a liquid crystal panel includes: a bottom plate; a first support plate and a second support plate respectively located on the bottom plate and perpendicular to the bottom plate; a suction stage disposed between the first support plate and the second support plate and movable up and down along a vertical direction of the bottom plate, the adsorption stage having an adsorption surface of the adsorption probe, and the probe on the adsorption surface
  • the adsorption position can be adjusted according to the distribution position of the circuit test points of the different liquid crystal panels to be detected, wherein the probe is connected to the circuit portion of the lighting fixture through the signal line.
  • connection manner between the first support plate and the second support plate may be a snap connection or other connection manner, as long as the adsorption table can be movably connected to the first support plate and the second support plate. It can move up and down along the vertical direction of the bottom plate.
  • the liquid crystal panel when the liquid crystal panel is lit, the liquid crystal panel is placed on the bottom plate, so that the circuit test point of the liquid crystal panel passes between the first support plate and the second support plate.
  • the space enters the bottom of the adsorption stage, and the probes having the same number of circuit test points are adsorbed to the adsorption surface, and the positions of the liquid crystal panel and the probe are adjusted, so that the adsorbed probes correspond to the circuit test points of the liquid crystal panel to be detected. That is, the probe is in the test position; the adsorption stage is moved downward, and the probe is brought into contact with the circuit test point of the liquid crystal panel to realize lighting.
  • the lighting fixture of the embodiment of the present invention When the lighting fixture of the embodiment of the present invention is used for lighting, it is only necessary to adjust the probes of the lighting fixture with the same number of circuit test points to the test position, and it is possible to light the different types of liquid crystal panels. Thus, the lighting fixture of the embodiment can realize lighting of different types of liquid crystal panels, thereby reducing the cost and improving the use efficiency.
  • the lighting fixture may further include a third supporting plate perpendicular to the bottom plate and perpendicularly intersecting the first supporting plate and the second supporting plate, the adsorption The stage is disposed between the first support plate, the second support plate and the third support plate.
  • connection manner of the adsorption platform disposed on the third support plate may be a snap connection or other suitable connection manner, as long as the adsorption platform can be movably connected to the third support plate and can be vertically along the bottom plate. Move up and down in the direction.
  • a part of the adsorption surface is perpendicular to a plane of the bottom plate and perpendicular to a plane of the first support plate.
  • the adsorption surface is perpendicular to the plane of the bottom plate and the first support
  • the portion perpendicular to the plane of the board is defined as the first adsorption surface.
  • the adsorption stage includes a through hole penetrating from top to bottom, and the adsorption surface is all or part of the inner surface of the through hole.
  • the first preferred mode the through hole has a cross section of an I-shaped through hole, and the inner surfaces of the two inline portions of the I-shaped through holes are perpendicular to the plane of the bottom plate and Vertical to the plane of the first support plate;
  • the adsorption surface is the entire inner surface of the I-shaped through hole, and the first adsorption surface is the inner surface of two parallel-shaped inline portions in the I-shaped through hole;
  • the adsorption surface is an inner surface of the I-shaped through-hole portion
  • the first adsorption surface is an inner surface of one or two parallel-shaped in-line portions of the I-shaped through holes.
  • the two inline portions of the I-shaped through holes preferably have the same structure, that is, the lengths are the same, and of course the lengths are different, such as one long and one short, which also belong to the protection range of the present invention.
  • the through hole has a rectangular through hole, and the inner surfaces of the two long sides of the rectangle are perpendicular to the plane of the bottom plate and perpendicular to the plane of the first support plate;
  • the adsorption surface is the entire inner surface of the rectangular through hole, and the first adsorption surface is the inner surface of the two long sides of the rectangular through hole;
  • the adsorption surface is a rectangular inner surface of the through hole portion, and the first adsorption surface is an inner surface of one or two long sides of the rectangular through hole.
  • the through hole has an L-shaped or "shaped through hole", and the inner surface of the lateral side of the L-shaped or “shaped through hole” is perpendicular to the plane of the bottom plate and perpendicular to the plane of the first support plate That is, the adsorption surface is an inner surface of an L-shaped or "shaped through hole, and the first adsorption surface is an inner surface of the lateral side of the L-shaped or "shaped through hole”.
  • the through hole has a cross section of an inverted T shape, and the inner surface of the lateral side of the inverted T-shaped through hole is perpendicular to a plane of the bottom plate and perpendicular to a plane of the first support plate;
  • the adsorption surface is the inner surface of the inverted T-shaped through hole
  • the first adsorption surface is the inner surface of the lateral side of the inverted T-shaped through hole
  • the shape of the through hole is not limited to the four preferred modes described above, and may be other shapes of through holes.
  • the cross-sectional shape of the through hole may be such that the first adsorption surface is perpendicular to the plane of the bottom plate and the first support The plane of the board is vertical. This is just an example.
  • a side of the first support plate and/or the second support plate opposite to the adsorption table is provided with a groove extending from the top to the bottom, the adsorption stage and the first support plate.
  • a side opposite to the second support plate is provided with a slider, and the adsorption table is engaged between the first support plate and the second support plate by the slider snapping into the groove.
  • the groove may be disposed only on the first support plate, or only on the second support plate, or on the first support plate and the second support plate, of course, opposite to the support plate provided with the groove
  • the side of the table is correspondingly provided with a slider.
  • a side surface of the third supporting plate opposite to the adsorption table is provided with a top-down groove, and a side of the suction table opposite to the third supporting plate is provided with a slider.
  • the adsorption stage is snapped into the groove by a slider to be attached to the third support plate.
  • the upper surface of the suction table is provided with a handle for easy grip.
  • the adsorption stage is a magnetic adsorption stage
  • the probe is a probe that magnetically attracts the magnetic adsorption stage.
  • the adsorption stage is a magnet adsorption stage
  • the probe is iron. Probe.
  • two upper and lower fixing holes are provided on a side of the adsorption table that is engaged with the first support plate and/or the second support plate, and the first support plate and/or the second support plate Fixing bolts are provided on the side, and the fixing bolts can be respectively inserted into the fixing holes.
  • FIGS. 2 and 3 illustrate a lighting fixture for detecting a liquid crystal panel including a bottom plate 100, a first support plate 210 perpendicular to the bottom plate 100 at one end of the bottom plate 100, and a first support plate 210 according to an embodiment of the present invention.
  • the second support plate 220 and the third support plate 230 wherein the first support plate 210 and the second support plate 220 are parallel to each other, and the third support plate 230 vertically intersects the first support plate 210 and the second support plate 220.
  • a suction platform is coupled between the first support plate 210, the second support plate 220 and the third support plate 230.
  • the adsorption stage 300 can move up and down along the first support plate 210, the second support plate 220, and the third support plate 230.
  • the adsorption stage 300 includes a cross section of the I-shaped cross section extending through the adsorption stage 300 from top to bottom.
  • the hole 310, the inner surface of the two mutually parallel "one"-shaped portions of the I-shaped through hole 310 is parallel to the plane of the third support plate 230.
  • the adsorption stage 300 is an adsorption stage made of a magnet material for adsorbing the probe, and the probe may be an iron probe which can be adsorbed on the inner surface of the I-shaped through hole 310, that is, the I-shaped through hole 310.
  • the surface is an adsorption surface for the adsorption probe, and the inner surfaces of the two mutually parallel "one" portions of the I-shaped through hole 310 are the first adsorption faces.
  • a side surface of the third supporting plate 230 that is engaged with the adsorption table 300 is provided with a groove 231 extending from the top to the bottom, and a side of the adsorption table that is engaged with the third supporting plate is provided with a sliding surface. Block, the adsorption table is snapped into the groove 231 through the slider to be snapped onto the third support plate.
  • the upper surface of the adsorption table is provided with a handle for easy grip.
  • the number and position of the circuit test points 510 of the liquid crystal panel 500 are viewed, and the liquid crystal panel 500 is placed on the bottom plate 100 such that the circuit test point 510 of the liquid crystal panel is located away from the third support plate of the I-shaped through hole 310.
  • the circuit test point 510 of the liquid crystal panel is three circuit test points on the left and right;
  • the number of probes is selected according to the circuit test point 510 of the liquid crystal panel, and the probe is fixed above the liquid crystal panel circuit test point; as shown in FIG. 2, the six probes move along the vertical portion of the I-shaped through hole 310.
  • the through hole of the I-shaped shape is away from the inline portion of the third support plate and is adsorbed on the inner surface thereof, and the six probes are located above the liquid crystal panel circuit test point 510, at which time the probe is in the test position;
  • the suction stage 300 is moved downward by the handle 320, and the probe 400 is brought into contact with the circuit test point 510 of the liquid crystal panel to realize lighting.
  • the number and the distribution position of the circuit test points of the different types of liquid crystal panels may be different.
  • the lighting fixture for detecting the liquid crystal panel of the present embodiment only the lighting of the embodiment is required.
  • the probes of the same number of test points as the circuit test points are adjusted from the initial position to the test position, and the probes are brought into contact with the circuit test points of the liquid crystal panel, so that different types of liquid crystal panels can be lit.
  • the lighting fixture of the embodiment can realize lighting of different types of liquid crystal panels, thereby reducing the cost and improving the use efficiency.
  • the side of the adsorption table 300 and the second support plate 220 may be provided with two upper and lower fixing holes, and the side of the second support plate 220 is provided with a fixing bolt 221 and a fixing bolt 221 Can be snapped into the fixing hole.
  • the distance between the suction table and the bottom plate is kept different by the fixing bolts 221 snapping into the different fixing holes.
  • the through hole may be, for example, a through hole having a rectangular cross section, the adsorption surface being all or part of the inner surface of the rectangular through hole, and the first adsorption surface being the inner surface of the long side of the rectangular through hole.
  • the adsorption stage is an adsorption stage made of a magnet material
  • the adsorption surface is the entire inner surface of the rectangular through hole
  • the first adsorption surface is the inner surface of the long side of the rectangular through hole.
  • the adsorption surface of the adsorbable probe may be formed on all or part of the inner surface of the rectangular through hole, and the adsorption surface includes a plane perpendicular to the plane of the bottom plate and the first support. The vertical part of the plane of the board, that is, the first adsorption surface.
  • the inner surface of one of the short sides of the rectangular through hole and the inner surface of the long side of the circuit test point near the liquid crystal panel is an adsorption surface, wherein the inner surface of the long side of the circuit test point of the rectangular through hole close to the liquid crystal panel It is the first adsorption surface; for example, the inner surfaces of the two long sides of the rectangular through hole are the adsorption surface, and at the same time, the first adsorption surface.
  • the through hole is an L-shaped or "shaped through hole
  • the adsorption surface is an L-shaped or “shaped inner surface of the through hole
  • the first adsorption surface is an L-shaped or "shaped through hole” The inner surface of the lateral side.
  • the through hole is an inverted T-shaped through hole having a cross section
  • the adsorption surface is an inner surface of the inverted T-shaped through hole
  • the first adsorption surface is an inner surface of the lateral side of the inverted T-shaped through hole.
  • the lighting fixture of the embodiment of the present invention When the lighting fixture of the embodiment of the present invention is used for lighting, it is only necessary to adjust the probes of the lighting fixture with the same number of circuit test points to the test position, thereby enabling lighting of different types of liquid crystal panels.
  • the lighting fixture of the embodiment of the invention can realize lighting of different types of liquid crystal panels, thereby reducing the cost and improving the use efficiency.

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Abstract

一种用于检测液晶面板（500）的点灯治具，包括：底板（100）；第一支撑板（210）和第二支撑板（220），分别位于所述底板（100）上并与底板（100）垂直；吸附台（300），设置在所述第一支撑板（210）和第二支撑板（220）之间，并可沿底板（100）垂直方向上下运动，所述吸附台（300）具有用于吸附探针（400）的吸附面，并且所述探针（400）在吸附面上的吸附位置可根据不同的被检测液晶面板（500）的电路测试点（510）的分布位置对应调整。该点灯治具，能够实现对不同型号的液晶面板（500）进行点灯，从而提高了点灯治具的通用性和使用效率。

Description

用于检测液晶面板的点灯治具
技术领域
本发明的实施例涉及一种用于检测液晶面板的点灯治具。
背景技术
目前， 为适应市场需要， 推出了各种不同尺寸的液晶显示装置， 这样就 需要各种不同尺寸的液晶面板。 在液晶面板出现故障的时候要对液晶面板进 行分析， 在分析的过程中需要使用点灯治具对液晶面板进行点灯， 即通过点 灯治具来进行加载信号确认。 如图 1 所示， 在使用传统的点灯治具对液晶面 板进行点灯的过程中， 首先将液晶面板 500放到点灯治具上； 然后将点灯治 具的上盖 610' 通过合页 620' 翻转过来， 使上盖的探针 400与液晶面板的电 路测试点相接触， 从而完成点灯。 由于不同尺寸的液晶面板的电路测试点的 分布位置、 个数不一样， 而且即使同一尺寸不同型号的液晶面板的电路测试 点的分布位置、 个数也不一样； 而传统的点灯治具的探针的位置是固定的， 不能够进行调节， 所以针对不同型号的液晶面板都会需要一个对应的点灯治 具， 这样就导致点灯治具的型号很多， 每一种型号的使用效率也较低。
发明内容
本发明的实施例提供了一种用于检测液晶面板的点灯治具， 能够实现对 不同型号的液晶面板进行点灯， 提高了点灯治具的通用性和使用效率。
为达到上述目的， 本发明的实施例提供了一种用于检测液晶面板的点灯 治具， 包括： 底板； 第一支撑板和第二支撑板， 分别位于所述底板上并与底 板垂直； 吸附台， 设置在所述第一支撑板和第二支撑板之间， 并可沿与底板 垂直的方向上下运动， 所述吸附台具有用于吸附探针的吸附面， 并且所述探 针在吸附面上的吸附位置可根据不同的被检测液晶面板的电路测试点的分布 位置对应调整。
在本发明的另一个实施例中， 还可以包括第三支撑板， 所述第三支撑板 与底板垂直且与所述第一支撑板和第二支撑板垂直相交， 所述吸附台设置在 所述第一支撑板、 第二支撑板和第三支撑板之间。
在本发明的又一个实施例中， 所述吸附面的一部分可以与底板所在平面 垂直且和第一支撑板所在平面垂直。
在本发明的再一个实施例中， 所述吸附台可以包括自上而下贯穿的通 孔， 所述吸附面是所述通孔的全部或部分内表面。
在本发明的再一个实施例中， 所述通孔的横截面可以为工字形的通孔， 所述工字形通孔相互平行的两个一字形部分的内表面与底板所在平面垂直且 和第一支撑板所在平面垂直；
或者所述通孔的横截面还可以为长方形的通孔， 所述长方形通孔两个长 边的内表面与底板所在平面垂直且和第一支撑板所在平面垂直；
或者所述通孔的横截面还可以为 L形或」形的通孔， 所述 L形或」形通 孔的横边的内表面与底板所在平面垂直且和第一支撑板所在平面垂直；
或者所述通孔是横截面还可以为倒 τ形的通孔， 所述倒 T形通孔的横边 的内表面与底板所在平面垂直且和第一支撑板所在平面垂直。
在本发明的再一个实施例中， 所述第一支撑板和 /或第二支撑板与吸附台 相接合的侧面设置有自上而下延伸的凹槽， 所述吸附台与第一支撑板和 /或第 二支撑板相接合的侧面设置有滑块， 所述吸附台通过滑块卡入所述凹槽接合 在所述第一支撑板和第二支撑板之间。
在本发明的再一个实施例中， 所述第三支撑板与吸附台相接合的侧面设 置有自上而下的凹槽， 所述吸附台与第三支撑板相接合的侧面设置有滑块， 所述吸附台通过滑块卡入所述凹槽接合在所述第三支撑板上。
在本发明的再一个实施例中， 所述吸附台上设置有把手。
在本发明的再一个实施例中， 所述吸附台是磁性吸附台， 所述探针是与 磁性吸附台磁性相吸的探针。 在本发明的再一个实施例中， 在所述吸附台与第一支撑板和 /或第二支撑 板相接合的侧面设置有上下两个固定孔， 所述第一支撑板和 /或第二支撑板的 侧面设置有固定螺栓， 所述固定螺栓可分别卡入固定孔。
本发明的实施例提供的用于检测液晶面板的点灯治具， 在对液晶面板进 行点灯时， 将液晶面板放置在底板上， 使液晶面板的电路测试点通过第一支 撑板和第二支撑板的之间的空间进入到吸附台下方， 将与电路测试点数量相 同的探针吸附到与吸附面上， 调整液晶面板和探针的位置， 使探针与被检测 的液晶面板的电路测试点对应， 即探针处于测试位置； 向下移动吸附台， 使 探针与液晶面板的电路测试点相接触， 实现点灯。
附图说明
为了更清楚地说明本发明实施例的技术方案， 下面将对实施例的附图作 简单地介绍， 显而易见地， 下面描述中的附图仅仅涉及本发明的一些实施例， 而非对本发明的限制。
图 1为现有点灯治具对液晶面板进行点灯的工作原理示意图；
图 2为本发明的一个实施例的用于检测液晶面板的点灯治具进行点灯的 示意图；
图 3为图 2所示的点灯治具的分解结构示意图。
具体实施方式
为使本发明实施例的目的、 技术方案和优点更加清楚， 下面将结合本发 明实施例的附图， 对本发明实施例的技术方案进行清楚、 完整地描述。 显然， 所描述的实施例是本发明的一部分实施例， 而不是全部的实施例。 基于所描 述的本发明的实施例， 本领域普通技术人员在无需创造性劳动的前提下所获 得的所有其他实施例， 都属于本发明保护的范围。
根据本发明的第一个实施例的用于检测液晶面板的点灯治具， 包括： 底 板； 第一支撑板和第二支撑板， 分别位于所述底板上并与底板垂直； 吸附台， 设置在所述第一支撑板和第二支撑板之间， 并可沿底板垂直方 向上下运动， 所述吸附台具有吸附探针的吸附面， 并且所述探针在吸附面上 的吸附位置可根据不同的被检测液晶面板的电路测试点的分布位置对应调 整， 其中， 探针通过信号线与点灯治具的电路部分连接。
吸附台设置在第一支撑板和第二支撑板之间的连接方式可以为卡合连 接， 也可以为其它连接方式， 只要可以实现吸附台活动连接在所述第一支撑 板和第二支撑板之间且可沿底板垂直方向上下运动即可。
本实施例的用于检测液晶面板的点灯治具， 在对液晶面板进行点灯时 , 将液晶面板放置在底板上， 使液晶面板的电路测试点通过第一支撑板和第二 支撑板的之间的空间进入到吸附台下方， 将与电路测试点数量相同的探针吸 附到吸附面上， 调整液晶面板和探针的位置， 使吸附的探针与被检测的液晶 面板的电路测试点对应， 即探针处于测试位置； 向下移动吸附台， 使探针与 液晶面板的电路测试点相接触， 实现点灯。 在使用本发明的实施例的点灯治 具进行点灯时， 只需将点灯治具的与电路测试点数量相同的探针调整到测试 位置， 就能够实现对不同型号液晶面板进行点灯。 这样本实施例的点灯治具 能够实现对不同型号的液晶面板进行点灯， 降低了成本， 提高了使用效率。
在本发明的第二个实施例中， 点灯治具还可以包括第三支撑板， 所述第 三支撑板与底板垂直且与所述第一支撑板和第二支撑板垂直相交， 所述吸附 台设置在所述第一支撑板， 第二支撑板和第三支撑板之间。
所述吸附台设置在所述第三支撑板的连接方式可以为卡合连接， 也可以 为其它合适的连接方式， 只要可以实现吸附台活动连接在所述第三支撑板上 且可沿底板垂直方向上下运动即可。
在本发明的第三个实施例中， 所述吸附面的一部分与底板所在平面垂直 且和第一支撑板所在平面垂直， 为描述方便， 将吸附面中与底板所在平面垂 直且和第一支撑板所在平面垂直的部分定义为第一吸附面。
在本发明的第四个实施例中， 吸附台包括自上而下贯穿的通孔， 所述吸 附面是所述通孔的全部或部分内表面。 在本发明的第五个实施例中， 第一种优选方式： 通孔的横截面为工字形 的通孔， 工字形通孔相互平行的两个一字形部分的内表面与底板所在平面垂 直且和第一支撑板所在平面垂直；
即， 吸附面是工字形的通孔全部内表面， 第一吸附面是工字形的通孔中 两个相互平行的一字形部分的内表面；
或吸附面是工字形的通孔部分内表面， 第一吸附面是工字形的通孔中一 个或两个相互平行的一字形部分的内表面。
需要说明的是， 所述工字形的通孔中两个一字形部分优选为相同的结 构， 即长度相同， 当然长度不相同， 比如一长一短， 也属于本发明的保护范 围。
第二种优选方式： 通孔的横截面为长方形的通孔， 所述长方形两个长边 的内表面与底板所在平面垂直且和第一支撑板所在平面垂直；
即， 吸附面是长方形的通孔全部内表面， 第一吸附面是长方形通孔的两 个长边的内表面；
或吸附面是长方形的通孔部分内表面， 第一吸附面是长方形通孔的一个 或两个长边的内表面。
第三种优选方式： 通孔的横截面为 L形或」形的通孔， 所述 L形或」形 通孔的横边的内表面与底板所在平面垂直且和第一支撑板所在平面垂直； 即吸附面是 L形或」形通孔的内表面， 第一吸附面是 L形或」形通孔的 横边的内表面。
第四种优选方式： 通孔的横截面为倒 T形的通孔， 所述倒 T形通孔的横 边的内表面与底板所在平面垂直且和第一支撑板所在平面垂直；
即吸附面是倒 T形通孔的内表面， 第一吸附面是倒 T形通孔横边的内表 面。
当然， 通孔的形状并不限于上述描述的四种优选的方式， 还可以为其他 形状的通孔， 通孔的横截面形状只要可以实现第一吸附面与底板所在平面垂 直且和第一支撑板所在平面垂直的即可， 本处只是举例说明。 在本发明的第六个实施例中， 所述第一支撑板和 /或第二支撑板与吸附台 相对的侧面设置有自上而下延伸的凹槽， 所述吸附台与第一支撑板和 /或第二 支撑板相对的侧面设置有滑块， 所述吸附台通过滑块卡入所述凹槽卡接在所 述第一支撑板和第二支撑板之间。
凹槽可以只设置在第一支撑板上， 或是只设置在第二支撑板上， 或是设 置在第一支撑板和第二支撑板上， 当然与设置有凹槽的支撑板相对的吸附台 侧面相应的设置有滑块。
在本发明的第七个实施例， 所述第三支撑板与吸附台相对的侧面设置有 自上而下的凹槽， 所述吸附台与第三支撑板相对的侧面设置有滑块， 所述吸 附台通过滑块卡入所述凹槽卡接在所述第三支撑板上。
在本发明的第八个实施例， 吸附台上表面设置有便于手握的把手。
在本发明的第九个实施例， 所述吸附台是磁性吸附台， 所述探针是与磁 性吸附台磁性相吸的探针， 比如， 吸附台是磁铁的吸附台， 探针是铁质探 针。
在本发明的第十个实施例， 在吸附台的与第一支撑板和 /或第二支撑板相 接合的侧面设置有上下两个固定孔， 第一支撑板和 /或第二支撑板的侧面设置 有固定螺栓， 固定螺栓可分别卡入固定孔。
上述是本发明的实施例中技术方案的描述， 当然， 本发明的实施例还可 以为技术方案的任意组合， 均在本发明的保护范围之内。
图 2和图 3示出了根据本发明的一个实施例的用于检测液晶面板的点灯 治具， 该点灯治具包括底板 100、在底板 100的一端与底板 100垂直的第一支 撑板 210、 第二支撑板 220和第三支撑板 230, 其中第一支撑板 210和第二支 撑板 220相互平行， 第三支撑板 230与第一支撑板 210和第二支撑板 220垂 直相交。
第一支撑板 210、 第二支撑板 220和第三支撑板 230之间卡接有吸附台
300,该吸附台 300可沿着第一支撑板 210、第二支撑板 220和第三支撑板 230 上下移动。 吸附台 300包括从上至下贯穿吸附台 300的横截面为工字形的通 孔 310, 该工字形的通孔 310的两个相互平行的 "一"字形部分的内表面与第 三支撑板 230所在平面平行。
吸附台 300是由磁铁材料制成的用于吸附探针的吸附台， 探针可以是铁 质探针， 其能吸附在工字形的通孔 310的内表面， 即工字形通孔 310的内表 面为用于吸附探针的吸附面， 工字形的通孔 310的两个相互平行的 "一" 字 形部分的内表面为第一吸附面。
进一步地， 如图 3所示， 第三支撑板 230与吸附台 300相卡接的侧面设 置有自上而下延伸的凹槽 231 , 吸附台与第三支撑板相卡接的侧面设置有滑 块， 吸附台通过滑块卡入凹槽 231以卡接在所述第三支撑板上。
进一步地， 如图 2 和图 3 所示， 吸附台上表面设置有便于手握的把手
320。
如图 2所示， 本实施例的点灯治具在进行点灯之前， 所有探针 400吸附 在工字形的通孔 310的靠近第三支撑板一端的一字形部分的内表面中， 此时 探针处于初始位置。 使用本实施例的点灯治具进行点灯的过程如下：
首先， 查看液晶面板 500的电路测试点 510的个数和位置， 并将液晶面 板 500放置在底板 100上， 使液晶面板的电路测试点 510位于工字形的通孔 310 的远离第三支撑板的一字形部分的下方； 如图 2 中所示， 液晶面板的电 路测试点 510是左右各 3个电路测试点；
其次， 根据液晶面板的电路测试点 510选择探针数量， 并将探针固定在 液晶面板电路测试点的上方； 如图 2 所示， 6个探针沿着工字形的通孔 310 竖直部分移动到工字形的通孔远离第三支撑板的一字形部分并吸附在其内表 面， 且 6个探针位于液晶面板电路测试点 510的上方， 此时， 探针处于测试 位置；
然后， 通过把手 320使吸附台 300向下运动， 使探针 400与液晶面板的 电路测试点 510接触， 实现点灯。
不同型号液晶面板的电路测试点的数量和分布位置可能不同， 在使用本 实施例的用于检测液晶面板的点灯治具进行点灯时， 只需将本实施例的点灯 治具的与电路测试点数量相同的探针从初始位置调整到测试位置， 并使探针 与液晶面板的电路测试点接触， 就能够实现对不同型号液晶面板进行点灯。 这样本实施例的点灯治具能够实现对不同型号的液晶面板进行点灯， 降低了 成本， 提高了使用效率。
进一步地， 如图 3所示， 在吸附台 300与第二支撑板 220相卡接的侧面 还可以设置有上下两个固定孔， 第二支撑板 220 的侧面设置有固定螺栓 221 , 固定螺栓 221 可分别卡入固定孔。 通过固定螺栓 221 卡入不同的固定 孔， 使吸附台与底板的距离保持不同。 在探针处于初始位置时， 固定螺栓 221 卡入上方的固定孔， 使吸附台与底板的距离较大； 在探针与液晶面板的 电路测试点接触后， 固定螺栓 221 卡入下方的固定孔， 使探针与液晶面板的 电路测试点保持接触， 且保证吸附台不会挤压液晶面板。
此外， 通孔例如还可以是横截面为长方形的通孔， 吸附面是长方形通孔 的全部或部分内表面， 第一吸附面是长方形通孔的长边的内表面。
例如， 在另一个实施例中， 吸附台是由磁铁材料制成的吸附台， 吸附面 是长方形通孔内表面的全部， 第一吸附面是长方形通孔长边的内表面。 探针 位于初始位置时， 探针吸附在长方形通孔的远离液晶面板的电路测试点的长 边的内表面处； 探针位于测试位置时， 探针吸附在长方形定位通孔的靠近液 晶面板的电路测试点的长边的内表面。
此外， 吸附台也可以不是由磁铁材料制成的吸附台时， 长方形通孔的全 部或部分内表面上可以形成可吸附探针的吸附面， 吸附面包括与底板所在平 面垂直且和第一支撑板所在平面垂直的部分， 即第一吸附面。 如长方形通孔 的一个任一个短边的内表面和靠近液晶面板的电路测试点的长边的内表面是 吸附面， 其中， 长方形通孔的靠近液晶面板的电路测试点的长边的内表面是 第一吸附面； 如长方形通孔的两个长边的内表面是吸附面， 同时又是第一吸 附面。
作为一种可选的方式， 通孔是横截面为 L形或」形的通孔， 吸附面是 L 形或」形通孔的内表面， 第一吸附面是 L形或」形通孔的横边的内表面。 探 针处于初始位置时， 探针吸附在 L形或」形通孔的竖边的内表面； 探针处于 测试位置时， 探针吸附在 L形或」形通孔的横边的内表面。
作为一种可选的方式， 通孔是横截面为倒 T形通孔， 吸附面是倒 T形通 孔的内表面， 第一吸附面是倒 T形通孔的横边的内表面。 探针处于初始位置 时， 探针吸附在倒 T形通孔的竖边的内表面； 探针处于测试位置时， 探针吸 附在倒 T形通孔的横边的内表面。
在使用本发明实施例的点灯治具进行点灯时， 只需将点灯治具的与电路 测试点数量相同的探针调整到测试位置， 就能够实现对不同型号液晶面板进 行点灯。 这样本发明实施例的点灯治具能够实现对不同型号的液晶面板进行 点灯， 降低了成本， 提高了使用效率。
以上所述仅是本发明的示范性实施方式， 而非用于限制本发明的保护范 围， 本发明的保护范围由所附的权利要求确定。

Claims

权利要求书
1、 一种用于检测液晶面板的点灯治具， 包括：
底板；
第一支撑板和第二支撑板， 分别位于所述底板上并与底板垂直； 吸附台， 设置在所述第一支撑板和第二支撑板之间， 并可沿与底板垂直 的方向上下运动， 所述吸附台具有用于吸附探针的吸附面， 所述探针在吸附 面上的吸附位置可才艮据不同的被检测液晶面板的电路测试点的分布位置对应 调整。
2、 根据权利要求 1所述的点灯治具， 还包括第三支撑板， 所述第三支撑 板与底板垂直且与所述第一支撑板和第二支撑板垂直相交， 所述吸附台设置 在所述第一支撑板、 第二支撑板和第三支撑板之间。
3、 根据权利要求 1或 2所述的点灯治具， 其中， 所述吸附面的一部分与 底板所在平面垂直且和第一支撑板所在平面垂直。
4、 根据权利要求 3所述的点灯治具， 其中， 所述吸附台包括自上而下贯 穿的通孔， 所述吸附面是所述通孔的全部或部分内表面。
5、 根据权利要求 4所述的点灯治具， 其中， 所述通孔是横截面为工字形 的通孔， 所述工字形通孔相互平行的两个一字形部分的内表面与底板所在平 面垂直且和第一支撑板所在平面垂直；
或者所述通孔是横截面为长方形的通孔， 所述长方形通孔两个长边的内 表面与底板所在平面垂直且和第一支撑板所在平面垂直；
或者所述通孔是横截面为 L形或」形的通孔， 所述 L形或」形通孔的横 边的内表面与底板所在平面垂直且和第一支撑板所在平面垂直；
或者所述通孔是横截面为倒 T形的通孔， 所述倒 T形通孔的横边的内表 面与底板所在平面垂直且和第一支撑板所在平面垂直。
6、 根据权利要求 4或 5所述的点灯治具， 其中， 所述第一支撑板和 /或第 二支撑板与吸附台相对的侧面设置有自上而下延伸的凹槽， 所述吸附台与第 一支撑板和 /或第二支撑板相对的侧面设置有滑块， 所述吸附台通过滑块卡入 所述凹槽以接合在所述第一支撑板和第二支撑板之间。
7、 根据权利要求 2-5中任一项所述的点灯治具， 其中， 所述第三支撑板 与吸附台相对的侧面设置有自上而下延伸的凹槽， 所述吸附台与第三支撑板 相对的侧面设置有滑块， 所述吸附台通过滑块卡入所述凹槽以接合在所述第 三支撑板上。
8、 根据权利要求 6或 7所述的点灯治具， 其中， 所述吸附台上设置有把 手。
9、 根据权利要求 6或 7所述的点灯治具， 其中， 所述吸附台是磁性吸附 台， 所述探针是与磁性吸附台磁性相吸的探针。
10、 根据权利要求 6或 7所述的点灯治具， 其中， 在所述吸附台与第一 支撑板和 /或第二支撑板相接合的侧面设置有上下两个固定孔， 所述第一支 撑板和 /或第二支撑板的侧面设置有固定螺栓， 所述固定螺栓可分别卡入固 定孔。
PCT/CN2012/085251 2012-07-26 2012-11-26 用于检测液晶面板的点灯治具 WO2014015594A1 (zh)

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