201226947 六、發明說明： 【發明所屬之技術領域】 [0001] 本發明涉及電路板技術領域，特別涉及一種用於電路板 ' 電測之測試裝置及採用其進行電路板測試之方法。 【先前彳支術·】 [0002] 印刷電路板因具有裝配密度高等優點而得到廣泛應用。 關於高密度互連電路板之應用請參見文獻Takahashi， 〇 〇 A. O〇ki， N. Nagai， A. Akahoshi， Η· Mukoh， A. Wajima, M. Res. Lab, High density multiiayer printed circuit boafd for HIΤΛ€ M-880 , iggg201226947 VI. Description of the Invention: [Technical Field] The present invention relates to the field of circuit board technology, and in particular, to a test device for a circuit board 'electrical measurement and a method for performing the same on the circuit board. [Previous 彳 · · · [0002] Printed circuit boards are widely used due to their high assembly density. For applications on high-density interconnect boards, see the literature Takahashi, 〇〇A. O〇ki, N. Nagai, A. Akahoshi, Η· Mukoh, A. Wajima, M. Res. Lab, High density multiiayer printed circuit boafd For HIΤΛ€ M-880 , iggg
Trans, on Components, Packaging， and Manufacturing Technology， 1992， 15(4): 418-425。 [0003]碳墨（Carbon)技術係一種不可上錫之表面處理’因其流 程簡單，並具有高抗腐钱、高对磨性和低成本等特點， 目前已得到手機板廠商越來越多之重視，吊以替代金面 .：! ! !· ； ：· 0: 來降低生產成本，並達到其增層之目之。於形成有碳墨 層之後，需要對寫路板表面之碳墨層電阻進行檢測，以 保證形成之碳墨層能夠滿足需要。現有技術中，通常於 電路板中設置一對距離確定之碳墨測試點來完成對電路 板之碳墨層電阻之測試。然而，對於不同之電路板產品 ，其設置之碳墨測試點之位置不同。於進行碳墨測試點 之檢測時，則需要根據不同之電路板製作不同之測試治 具’增加電路板之製作成本。 【發明内容】 [0004]有鑑於此，提供一種能夠方便地應用於不同之電路板之 099145389 表單編號A0101 第5頁/共29頁 0992078216-0 201226947 石炭墨點之測試之電路板測試裝置及電路板測試方法貫屬 必要。 [0005] 一種電路板測試裝置，用於對電路板上之碳墨點進行測 試，所述電路板測試裝置包括一個承載裝置、一個測試 治具及一個測試機，所述承載裝置包括一個工作臺及設 置於所述工作臺並可以相對工作臺移動之一個定位板， 所述定位板包括板體、多個定位塊及多個定位銷，所述 板體内開設有第一滑槽，所述定位塊可相對板體滑動地 收容於所述第一滑槽内，所述每個定位銷配合於對應之 定位塊内，所述定位銷同時用於定位電路板。所述測試 治具與定位板相對，所述測試治具與定位板相對之表面 上設置有與電路板之碳墨點相對應之探針。所述測試機 與測試治具相互電連接，用於對測試治具接觸之電路板 進行測試。 [0006] 一種電路板之測試方法，用於對電路板之碳墨點進行測 試，包括步驟：提供待測試之電路板及所述之電路板測 試治具；調整定位板於工作臺上之位置，並使得一個定 位塊之定位銷與測試治具之一個探針相對；藉由於第一 滑槽内移動定位塊，使得電路板内之定位孔與定位塊之 定位銷相配合，將電路板定位於定位板上；以及使得測 試治具之探針與電路板上之碳墨點相接觸，測試機對所 述碳墨點進行測試。 [0007] 相較於先前技術，本技術方案提供之電路板測試裝置， 於用於定位電路板之定位板上設置有第一滑槽以及與多 個可以於第一滑槽内移動之定位塊，這樣，對於不同之 u9yi4〇c}89 表單編號Α0101 第6頁/共29頁 0992078216-0 201226947 規料 要減各定位塊於第—滑和之位置，實 現對不同 > 貝 具測試—路板進行定位，便可則㈣相同之測試治 法，可不化電路板。本技街方案提供之電路板測試方 免對Ζ以方便地實現對不同之電路板之碳墨點測試。避 ;不同之電路板採用不同之測試治具，從而降低電 路板生產成本。 【實施方式】 [0008] Ο [0009] [0010] ϋ [0011] 099145389 下面、、·。合實施例和多個附圖對本技術方案提供之電路板 檢泪！裝置作進一步之詳細說明。 "月參閱圖1 ’本技術方案實施例提供之電路板測試裝置10 己括承栽裝置100、測試裝置200及控制器300。 承栽裝置100用於承載測試裝置200並承載和定位待測試 之電路板。本實施例中，承載裝置1〇〇包括工作臺11〇、 定位板120、位置調節裝置13〇及支撐塊丨40。工作臺110 用於承栽定位板12〇、位置調節.裝置130及支推塊140。 工作臺110具有承載面〗11，承載面111為肀面。 請—併參閱圖2至圖4，定位板12〇用於定位進行電測之電 路板。定位板120包括板體丨21、多個定位塊122、多個 定位銷124及多個固定件125。板體121為長方形之平板 狀，其固疋於所述承戴面111。板體121具有遠離承載面 111之第一表面1211。自第一表面κι!向板體121内部開 設有沿著板體121長度方向延伸第一滑槽1212和第二滑槽 1213。第一滑槽1212和第二滑槽1213相立平行設置。第 一滑槽1212和第二滑槽1213之橫截面之形狀為倒Τ型。 第一滑槽1212和第二滑槽1213之橫截面靠近第一表面 表單編號Α0101 第7頁/共29頁 0992078216-0 201226947 1211處之一段寬度較小，遠離第一表面1211處之一段寬 度較大。本實施例中以第一滑槽121 2之結構為例來進行 就明。自第一表面1211向板體121内部，第一滑槽1212 包括相互連通之第一階槽體1214和第二階槽體1215，第 一階槽體1214之寬度小於第二階槽體1215之寬度，於垂 直於第一表面1211之方向上，第一階槽體1214和第二階 槽體1215之中線重合。第二滑槽1213之結構和尺寸與第 一滑槽1212之結構和尺寸相同’於垂直於第一表面an 之方向上，第二滑槽1213包括相互連通之第三階槽體 121 6和第四階槽體1217，第三階槽體1216靠近第一表面 1211，第三階槽體1216之寬度小於第四階槽體1217之寬 度。 [0012] 定位塊122之形狀均與第一滑槽1212和第二滑槽1213之 形狀相對應。多個定位塊122之形狀相同，均呈“凸，，字 形。定位塊122包括相互連接之卡合部122】及突起部 1 222。卡合部1221之形狀與第一滑槽121 2之第二階槽體 121 5及第二滑槽121 3之第四階槽體121 7之形狀相配合， 對應收容於第一滑槽1212之第二階槽體121 5或者第二滑 槽121 3之第四階槽體1217内。卡合部1221之厚度應略小 於第二階槽體1215之高度。突起部1 222之形狀與第一滑 槽1212之第一階槽體1214及第二滑槽1213之第三階槽體 1216之形狀相配合，突起部1222對應收容於第一滑槽 121 2之第一階槽體1214及第二滑槽121 3之第三階槽體 1216。優選地，突起部1222之厚度應等於第一階槽體 1214或者第三階槽體121 6之高度。突起部1 222具有遠離 099145389Trans, on Components, Packaging, and Manufacturing Technology, 1992, 15(4): 418-425. [0003] Carbon ink technology is a surface treatment that cannot be tinned. Because of its simple process, high anti-corrosion, high grindability and low cost, it has gained more and more mobile phone board manufacturers. Pay attention to the sling to replace the gold surface.:! ! !· ; :· 0: to reduce production costs and achieve the purpose of its growth. After the carbon ink layer is formed, it is necessary to detect the carbon ink layer resistance of the surface of the writing board to ensure that the formed carbon ink layer can meet the needs. In the prior art, a pair of distance-determined carbon ink test points are usually placed in a circuit board to complete the test of the carbon ink layer resistance of the circuit board. However, for different board products, the location of the carbon ink test points is different. When testing carbon ink test points, it is necessary to make different test fixtures according to different circuit boards' to increase the manufacturing cost of the circuit board. SUMMARY OF THE INVENTION [0004] In view of this, there is provided a circuit board testing device and circuit capable of being conveniently applied to different circuit boards. 099145389 Form No. A0101 Page 5/29 pages 0992078216-0 201226947 Testing of the carbonaceous ink dots Board testing methods are necessary. [0005] A circuit board testing device for testing carbon ink dots on a circuit board, the circuit board testing device comprising a carrying device, a test fixture and a testing machine, the carrying device comprising a workbench And a positioning plate disposed on the working table and movable relative to the working table, the positioning plate includes a plate body, a plurality of positioning blocks and a plurality of positioning pins, wherein the plate body is provided with a first sliding slot, The positioning block is slidably received in the first sliding slot with respect to the plate body, and each of the positioning pins is fitted into a corresponding positioning block, and the positioning pin is simultaneously used for positioning the circuit board. The test fixture is opposite to the positioning plate, and the test fixture is provided on the surface opposite to the positioning plate with a probe corresponding to the carbon ink dot of the circuit board. The test machine and the test fixture are electrically connected to each other for testing the circuit board in contact with the test fixture. [0006] A method for testing a circuit board for testing a carbon dot of a circuit board, comprising the steps of: providing a circuit board to be tested and the circuit board test fixture; and adjusting a position of the positioning board on the worktable And positioning the positioning pin of one positioning block opposite to the probe of the test fixture; by moving the positioning block in the first sliding slot, the positioning hole in the circuit board cooperates with the positioning pin of the positioning block to position the circuit board On the positioning plate; and the probe of the test fixture is brought into contact with the carbon ink dots on the circuit board, and the test machine tests the carbon ink dots. [0007] Compared with the prior art, the circuit board testing device provided by the technical solution is provided with a first sliding slot and a plurality of positioning blocks movable in the first sliding slot on the positioning plate for positioning the circuit board. In this way, for different u9yi4〇c}89 Form No. 1010101 Page 6/Total 29 Page 0992078216-0 201226947 The specification is to reduce the position of each positioning block in the first-slip and realize the different>Beet test-road If the board is positioned, then (4) the same test method can be used, and the board can be omitted. The board tester provided by the Tech Street solution is designed to facilitate the implementation of carbon dot testing on different boards. Avoid; different circuit boards use different test fixtures to reduce the production cost of the circuit board. [Embodiment] [0008] [0009] [0010] 099145389 Next, .... The circuit board provided by the technical solution is combined with the embodiment and a plurality of drawings to detect tears! The device is further described in detail. "Month Referring to Figure 1 'The circuit board test apparatus 10 provided by the embodiment of the present technical solution includes the load bearing apparatus 100, the test apparatus 200, and the controller 300. The planting device 100 is used to carry the test device 200 and to carry and position the circuit board to be tested. In this embodiment, the carrying device 1A includes a table 11A, a positioning plate 120, a position adjusting device 13A, and a supporting block 40. The table 110 is used to load the positioning plate 12, the position adjustment device 130 and the support block 140. The table 110 has a bearing surface 11 and the bearing surface 111 is a kneading surface. Please - and referring to Figures 2 to 4, the positioning plate 12 is used to position the circuit board for electrical measurement. The positioning plate 120 includes a plate body 21, a plurality of positioning blocks 122, a plurality of positioning pins 124, and a plurality of fixing members 125. The plate body 121 has a rectangular plate shape and is fixed to the wearing surface 111. The plate body 121 has a first surface 1211 that is away from the bearing surface 111. The first chute 1212 and the second chute 1213 extend in the longitudinal direction of the plate body 121 from the first surface κι! to the inside of the plate body 121. The first chute 1212 and the second chute 1213 are disposed in parallel. The cross section of the first chute 1212 and the second chute 1213 has a shape of a collapsed shape. The cross section of the first chute 1212 and the second chute 1213 is close to the first surface. Form No. Α0101. Page 7/29 pages 0992078216-0 201226947 1211 One section of the section is smaller in width, and the width of one section away from the first surface 1211 is smaller. Big. In the present embodiment, the structure of the first chute 1212 is taken as an example. The first chute 1212 includes a first-stage groove body 1214 and a second-stage groove body 1215 that communicate with each other from the first surface 1211 toward the inside of the plate body 121. The width of the first-stage groove body 1214 is smaller than that of the second-stage groove body 1215. The width is perpendicular to the first surface 1211, and the lines of the first-order groove body 1214 and the second-stage groove body 1215 coincide. The second chute 1213 has the same structure and size as the first chute 1212 in the direction perpendicular to the first surface an, and the second chute 1213 includes a third-order trough 121 6 and the first communicating with each other. The fourth-order groove body 1217 has a third-order groove body 1216 adjacent to the first surface 1211. The width of the third-stage groove body 1216 is smaller than the width of the fourth-stage groove body 1217. [0012] The shape of the positioning block 122 corresponds to the shapes of the first chute 1212 and the second chute 1213. The plurality of positioning blocks 122 have the same shape and are both convex and convex. The positioning block 122 includes the engaging portions 122 connected to each other and the protruding portion 1 222. The shape of the engaging portion 1221 and the first sliding groove 121 2 The second-order groove body 121 5 and the fourth-stage groove body 121 7 of the second sliding groove 121 3 are matched to each other, corresponding to the second-stage groove body 121 5 or the second sliding groove 121 3 of the first sliding groove 1212. The thickness of the engaging portion 1221 should be slightly smaller than the height of the second-stage groove body 1215. The shape of the protrusion portion 222 and the first-stage groove body 1214 and the second chute of the first chute 1212. The shape of the third-order groove body 1216 of 1213 is matched, and the protrusion portion 1222 is corresponding to the first-stage groove body 1214 of the first sliding groove 1212 and the third-stage groove body 1216 of the second sliding groove 1213. Preferably, The thickness of the protrusion 1222 should be equal to the height of the first-stage groove body 1214 or the third-stage groove body 121 6 . The protrusion portion 1 222 has a distance away from 099145389
表單編號AOifH 第8頁/共29頁 0992078216-0 201226947Form Number AOifH Page 8 of 29 0992078216-0 201226947
[0013] Ο 卡合部1221之上表面1 223，上表面1 223為平面。本實施 例中，自上表面1223向定位塊122之内部形成有定位孔 1224和固定孔1225。定位孔1224為圓形盲孔，每個定位 孔1 224用於對應收容一個定位銷124。固定孔1 225用於 與固定件125相互配合，以將定位塊122定位於第一滑槽 1212或者第二滑槽1213内。固定孔1 225為階梯孔，自上 表面1223每個固定孔1225包括相互連通並同軸設置之第 一孔段1226和第二孔段1227，第一孔段1226之孔徑大於 第二孔段1 227之孔徑。第二孔段1227之内壁形成有内螺 紋。 ':' ... ...... .... 定位銷124大致為圓柱形，其直徑與定位孔1224之孔徑相 等。定位銷124具有定位凸起，所述定位凸起用於與待檢 測之電路板之定位孔相配合，以使得電路板定位。固定 件125可以為螺栓，其包括相互連接之頭部1251和桿體 1252。頭部1251之直徑大於固定孔1225<第二孔段 1227之孔徑，且小於或者等於第一孔段1 226之孔徑。桿 體1252之直徑與虛定暮1225之第二孔段1227之之直徑相 等’桿體1252之外壁設置有與第二孔段1227之内螺紋相 配合之外螺紋。頭部1251之高度應小於第一孔段1226之 高度’桿體1252之長度應略大於第二孔段1 227之高度， 當固定件125配合於固定孔1225時，應保證固定件125不 超出上表面1223。藉由旋轉固定件125，使得固定件125 之桿體1252之一端從固定孔1225之底部露出，與第一滑 槽1212或第二滑槽1213之底壁接觸，使得定位塊122之 卡合部1221抵靠於第一滑槽1212之第二階槽體1215或第 099145389 表單編號Α0101 第9頁/共29頁 0992078216-0 201226947 二滑槽1213之第四階槽體1217之頂壁，以將定位塊122 固定。 [0014] 位置調節裝置130用於調整定位板120之於垂直於定位板 120之延伸方向上之位置，以使得電路板測試裝置可以測 試不同之電路板上之碳墨點。本實施例中，位置調節裝 置130設置於定位板120之寬度方向之相對兩側》位置調 節裝置130包括兩個限位塊131及兩個調整結構132。兩 個限位塊131固定設置於定位板120長度方向之相對兩側 。兩個限位塊131沿定位板120之寬度方向延伸，並且， /η i .} 兩個限位塊131固定於承載面111時，保證兩個限位塊 131之間之距離與定位板120之長度相等，且相互平行設 置’以確保定位板120可以限位於兩個限位塊131之間。 兩個調整結構132也分別設置於定位板120長度方向之相 對兩侧。每個調整結構132包括第一固定塊1321、第二固 定塊1322及螺桿1323。第一固定塊1321固定於定位板 s ? 12〇 ’第二固定塊1322固定:於未載面111，螺桿1 323之延 伸方向垂直於第一滑槽121 2之'延伸方向，第一固定塊 1321和第二固定塊1 322中均開設有於螺桿1 323配合之螺 孔，螺桿1323配合於第一固定塊1321和第二固定塊1322 之螺孔内’從而藉由轉動螺桿1323，可以使得定位板120 於承載面111上產生移動，從而調整定位板12〇於垂直於 第一滑槽1 21 2方向上之位置。並且，由於兩個調整結構 132和兩個限位塊131 ’從而可以保證定位板120於移動 後’於其延伸方向上之位置不發生改變。 [0015] 支撑塊140設置於定位板120寬度方向上之兩側，每個支 099145389 表單編號A0101 第10頁/共29頁 0992078216-0 201226947 [0016] Ο [0017][0013] The upper surface 1 223 of the Ο engaging portion 1221 has a flat surface. In the present embodiment, a positioning hole 1224 and a fixing hole 1225 are formed from the upper surface 1223 to the inside of the positioning block 122. The positioning holes 1224 are circular blind holes, and each of the positioning holes 1 224 is for receiving a positioning pin 124 correspondingly. The fixing hole 1 225 is for cooperating with the fixing member 125 to position the positioning block 122 in the first sliding slot 1212 or the second sliding slot 1213. The fixing holes 1 225 are stepped holes, and each fixing hole 1225 from the upper surface 1223 includes a first hole segment 1226 and a second hole segment 1227 which are coaxially arranged and coaxially disposed, and the first hole segment 1226 has a larger hole diameter than the second hole segment 1 227 The aperture. The inner wall of the second hole section 1227 is formed with an inner thread. ':' ......... The positioning pin 124 is substantially cylindrical and has a diameter equal to the diameter of the positioning hole 1224. The locating pin 124 has a locating projection for mating with a locating hole of the circuit board to be inspected to position the circuit board. The fixture 125 can be a bolt that includes a head 1251 and a stem 1252 that are interconnected. The diameter of the head 1251 is larger than the aperture of the fixed hole 1225 < the second hole segment 1227 and less than or equal to the aperture of the first hole segment 1 226. The diameter of the rod 1252 is equal to the diameter of the second bore 1227 of the dummy bore 1225. The outer wall of the stem 1252 is provided with a thread that cooperates with the internal thread of the second bore 1227. The height of the head portion 1251 should be smaller than the height of the first hole portion 1226. The length of the rod body 1252 should be slightly larger than the height of the second hole portion 1 227. When the fixing member 125 is fitted to the fixing hole 1225, the fixing member 125 should be ensured not to exceed Upper surface 1223. By rotating the fixing member 125, one end of the rod body 1252 of the fixing member 125 is exposed from the bottom of the fixing hole 1225, and is in contact with the bottom wall of the first sliding slot 1212 or the second sliding slot 1213, so that the engaging portion of the positioning block 122 is engaged. 1221 is abutted against the second-order slot body 1215 of the first chute 1212 or the 099145389 form number Α0101, page 9 / 29 pages 0992078216-0 201226947, the top wall of the fourth-order slot body 1217 of the second chute 1213, The positioning block 122 is fixed. [0014] The position adjusting device 130 is for adjusting the position of the positioning plate 120 in a direction perpendicular to the extending direction of the positioning plate 120, so that the circuit board testing device can test the carbon ink dots on different circuit boards. In this embodiment, the position adjusting device 130 is disposed on opposite sides of the width direction of the positioning plate 120. The position adjusting device 130 includes two limiting blocks 131 and two adjusting structures 132. The two limiting blocks 131 are fixedly disposed on opposite sides of the longitudinal direction of the positioning plate 120. The two limiting blocks 131 extend along the width direction of the positioning plate 120, and when the two limiting blocks 131 are fixed to the bearing surface 111, the distance between the two limiting blocks 131 and the positioning plate 120 are ensured. The lengths are equal and are arranged in parallel with each other to ensure that the positioning plate 120 can be limited between the two limiting blocks 131. The two adjustment structures 132 are also disposed on opposite sides of the longitudinal direction of the positioning plate 120, respectively. Each adjustment structure 132 includes a first fixed block 1321, a second fixed block 1322, and a screw 1323. The first fixing block 1321 is fixed to the positioning plate s 12 〇 'the second fixing block 1322 is fixed: on the unloaded surface 111, the extending direction of the screw 1 323 is perpendicular to the 'extending direction of the first sliding slot 121 2 , the first fixed block 1321 and the second fixing block 1 322 are respectively provided with screw holes which are matched with the screw 1 323. The screw 1323 is fitted into the screw holes of the first fixing block 1321 and the second fixing block 1322, so that by rotating the screw 1323, it can be made The positioning plate 120 is moved on the bearing surface 111 to adjust the position of the positioning plate 12 in a direction perpendicular to the first chute 1 21 2 . Moreover, due to the two adjustment structures 132 and the two limiting blocks 131', it is possible to ensure that the position of the positioning plate 120 after its movement in its extending direction does not change. [0015] The support block 140 is disposed on both sides of the positioning plate 120 in the width direction, each branch 099145389 Form No. A0101 Page 10 / Total 29 Page 0992078216-0 201226947 [0016] Ο [0017]
撐塊140固定於承載面111上，每個支撐塊140之厚度與 定位板120之厚度大致相同，支撐塊140用於於測試之電 路板之面積較大時，電路板部分超出定位板120時，支撐 塊140可以支撐超出定位板12〇之部分電路板，以保證測 試之電路板平整。 測試裝置200設置於承載面lu之上方。測試裝置2〇{)用 於對定位板120上定位之電路板進行測試。測試裝置2〇〇 包括承載架210、測試機220、測試治具230、第一驅動 裝置240、第二驅動裝置25()、第一安裝板26〇及第二安 裝板270。 承載架210安裝於工作臺11〇之承載面丨丨丨上。承載架21〇 包括兩個支撐架體211及連接於兩個支撐架體211之間之 承載架體212。承載架體212平行於與承栽面in，並且 位於定位板120之一侧《承載架體212之延伸方向與第一 潸槽1212和第二滑槽1213之延伸方向相同◊於承載架體 212遠離承载面111之p侧，泠著承載架體212之延伸方 向形成有兩相互平行詨置之滑轨213。 [0018]第〆驅動裝置240用於驅動測試機220及測試治具230沿 著滑軌213移動。第一驅動裝置240包括相互機械連接之 第，驅動器241和絲桿242。第一驅動器241設置於承載 架體212之一端，絲桿242設置於兩滑軌213之間，並平 行於兩滑軌213。 [〇〇19]第〆安裝板260平行於承載面111設置，其配合安裝於承 載架體212上。第一安裝板260與承載架體212相對之表 099145389 表單編號A0101 第11頁/共29頁 0992078216-0 201226947 面上形成有與承載架體212之滑執213相配合之兩個滑押 (圖未示）及與絲桿242相配合之螺紋孔（圖未示）月。: 個滑軌213分別與兩個滑槽相配合，絲桿242配合 螺紋孔内。當第-驅動器241驅動絲桿如轉動時 242帶動與其配合之第—安裝板沿著滑轨213移動、，干 即產生平行於第—滑槽1212之移動。 [0020] [0021] [0022] 099145389 第二安裝板270垂直於承載面ln設置，並位於承栽架體 212鄰近定位板12〇之一側。第二安裝板27()與第〜安裝 板⑽相互固定設置’第二安裝板27G固定於第—安裝板 2 6 0靠近定位板12 〇之一端。'、 本實施例中’第二驅動裝置25Q為氣缸。第二驅動襄置 250設置於第二安裝板270靠近定位板12〇之一側，第二 驅動裝置250包括缸體251及驅動桿252，缸體251及驅動 才千252之延伸方向均垂直於承載面I"。驅動桿gw從缸 體251内延伸出，缸體251與供氣裝置(圖未示）相互連 通’從而可以驅動桿252可以沿著缸體251產生移動。本 實施例中，第二堪動裝置2右遠進一步設置有緩衝器253 ，緩衝器253用於調整驅動桿252每次移動時之位移。 測試機220固定安裝於第一安裝板260遠離承載架體212 之一侧。測試治具2 3 0與測試機2 2 0相互電連接。測試治 具230安裝於第二驅動裝置250之驅動桿252，測試治具 230與定位板120相對。請參閱圖5，於測試治具230與定 位板12 0相對之表面上設置有與待測試之電路板上之碳墨 點相對應之測試探針231。於第一驅動裝置240之驅動下 ’測試治具2 3 0可以產生平行於第一滑槽1212方向上之移 表單煸號Α0101 第12頁/共29頁 0992078216-0 201226947 動，於第二驅動裝置250之驅動下，測試治具230可以產 生靠近或者遠離定位板120方向之移動。 [0023] 控制器300與第一驅動裝置240、第二驅動裝置250及測 試機220相互電連接，其用於控制第一驅動裝置240和第 二驅動裝置250驅動測試治具230產生移動，並控制測試 機220藉由測試治具230對電路板進行測試。 [0024] 本實施例中，於控制器300上方還設置有報警裝置310， 報警裝置310與控制器300相互信號連接，報警裝置310 具有多個不同顏色之信號燈。報警裝置310根據電路板測 試裝置10之不同之工作情況而使得對應之信號燈亮起， 從而表明電路板測試裝置10之工作狀態。 [0025] 請一併參閱圖6及圖7，本技術方案還提供採用所述電路 板測試裝置10對電路板進行測試之方法，所述測試方法 包括如下步驟： [0026] 第一步，提供所述之電路板測試裝置10及待檢測之電路 板20。 [0027] 請參閱圖6，電路板20開設有至少兩個對位孔21，其中一 個對位孔21為基準對位孔。電路板20至少形成有一對碳 墨點22。 [0028] 第二步，調整定位板120於工作臺110上之位置，並使得 一個定位塊122之定位銷124與測試治具230之一個探針 231相對。 [0029] 先藉由位置調節裝置130調整定位板120之位置，並設定 099145389 表單編號A0101 第13頁/共29頁 0992078216-0 201226947 多個定位塊122中之一個為基準定位塊，使得一個探針 23丨與第一滑槽121 2之基準定位塊之定位銷丨24於垂直於 第-滑槽121 2之方向上相對應。然後，藉由於第一滑槽 1 21 2内滑動所述基準定位塊，使得所述基準定位塊之定 位銷與一個探針231相互正對，將所述基準定位塊固定於 第—滑槽1212内。 [0030] [0031] [0032] [0033] 第三步，將電路板2 0定位於定位板120上。 將電路板20之基準對位孔配合於所述基準定位銷内，並 藉由於第一滑槽1212和第二滑槽1213内滑動定位塊122 ’調整其他之定位塊1 2 2之參:覃，使得電路板2 〇内之其他 對位孔21與其他定位塊122之定位銷124相配合，從而使 得電路板20定位於定位板120。 第四步，採用測試治具230對電路板20上之礙墨點22進行 測試。 由於探針231之設置於碳墨點22之設置相對應。控制器 300根據不同之電路板20之資訊，根據預定之程式，控制 第一驅動裝置240驅動測試治具230移動，使得測試探針 231與碳墨點22相對應，並控制第二驅動裝置250驅動測 試治具230相電路板20移動，使得測試探針231與碳墨點 22接觸，從而對碳墨點22進行測試。測試完成後’控制 器300控制第二驅動裝置250驅動測試治具230遠離電路 板20。 另外，由於第二驅動裝置250還包括有緩衝器253 ’對於 不同厚度之電路板’可以藉由調節緩衝器253，控制測試 099145389 表單編號A0101 第14頁/共29頁 0992078216-0 [0034] 201226947 [0035] Ο [0036] [0037] ❹ [0038] [0039] [0040] [0041] [0042] [0043] 治具230下降之位移，從而滿足測試不同厚度之電路板。 本技術方案提供之電路板測試裝置，於用於定位電路板 之定位板上設置有第一滑槽、第二滑槽以及與多個可以 於第一滑槽和第二滑槽内移動之定位塊，這樣，對於不 同之電路板，只需要調整各定位塊於第一滑槽和第二滑 槽内之位置，實現對不同之電路板進行定位，便可以採 用相同之測試治具測試不同之電路板。本技術方案提供 之電路板測試方法，可以方便地實現對不同之電路板之 碳墨點測試。避免了對於不同之電路板採用不同之測試 治具，從而降低了電路板生產成本。 准，以上所述者僅為本發明之較佳實.施方式，自不能以 此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士 援依本發明之精神所作之等效修飾或變化，皆應涵蓋於 以下申請專利範圍内。 【圖式簡單說明】 圖1係本技術方案實施例提供之電蹲板測試裝置之立體圖 〇 / ' 1 ... 圖2係本技術方案實施例提供之定位板之分解示意圖。 圖3係圖2沿ΙΙΙ-ΠΙ線之剖視圖。 圖4係圖2沿IV-IV線之剖視囷。 圖5係本技術方案實施例提供之測試治具之仰視圖。 圖6係本技術方案提供之待檢測之電路板之示意圖。 圖7係本技術方案實施例提供之電路板測試裝置檢測電路 099145389 表單編號Α0101 第15頁/共29頁 0992078216-0 201226947 板時之示意圖。 【主要元件符號說明】 [0044] 電路板測試裝置：10 [0045] 電路板：20 [0046] 對位孔：21 [0047] 碳墨點：22 [0048] 承載裝置：100 [0049] 工作臺：110 [0050] 承載面：111 [0051}定位板：120 [0052] 板體：121 [0053] 第一表面：1 211 [0054] 第一滑槽：1212 [0055] 第二滑槽：1213 [0056] 第一階槽體：1214 [0057] 第二階槽體：1215 [0058] 第三階槽體：1 21 6 [0059] 第四階槽體：1217 [0060] 定位塊：122 [0061] 卡合部：1221 099145389 表單編號A0101 第16頁/共29頁 0992078216-0 201226947 [0062]突起部：1222 [0063] 定位孔：1224 [0064] 固定孔：1 2 2 5 [0065] 定位銷：124 [0066] 固定件：125 [0067] 頭部：1251 [0068] 桿體：1252 [0069] 位置調節裝置：130 [0070] 限位塊：131 [0071] 調整結構：132 [0072] 第一固定塊：1321 [0073] 第二固定塊：1322 [0074] 〇 螺桿：1323 [0075] 支撐塊：140 [0076] 測試裝置：200 [0077] 承載架：210 [0078] 支撐架體：211 [0079] 承載架體：212 [0080] 滑轨：213 099145389 表單編號A0101 第17頁/共29頁 0992078216-0 201226947 [0081] 測試機· 2 2 0 [0082] 測試治具：230 [0083] 探針：231 [0084] 第一驅動裝置 ：240 [0085] 第一驅動器： 241 [0086] 絲桿：242 [0087] 第二驅動裝置 ：250 [0088] 缸體：251 [0089] 驅動桿：252 [0090] 緩衝器：253 [0091] 第一安裝板： 260 [0092] 第二安裝板： 270 [0093] 控制器：300 [0094] 報警裝置：310 099145389 表單編號A0101 第18頁/共29頁 0992078216-0The support block 140 is fixed on the bearing surface 111. The thickness of each support block 140 is substantially the same as the thickness of the positioning plate 120. When the support block 140 is used for testing the circuit board, the circuit board portion is beyond the positioning plate 120. The support block 140 can support a portion of the circuit board beyond the positioning plate 12〇 to ensure that the tested circuit board is flat. The test device 200 is disposed above the carrying surface lu. The test device 2〇{) is used to test the circuit board positioned on the positioning plate 120. The test apparatus 2A includes a carrier 210, a testing machine 220, a test fixture 230, a first driving device 240, a second driving device 25(), a first mounting board 26A, and a second mounting board 270. The carrier 210 is mounted on the carrying surface of the table 11 . The carrier 21A includes two support frames 211 and a carrier body 212 connected between the two support frames 211. The carrier body 212 is parallel to the bearing surface in and is located on one side of the positioning plate 120. The extending direction of the carrier body 212 is the same as the extending direction of the first groove 1212 and the second sliding groove 1213. Aside from the p-side of the bearing surface 111, two sliding rails 213 are disposed parallel to each other along the extending direction of the carrier body 212. The second driving device 240 is configured to drive the testing machine 220 and the test fixture 230 to move along the slide rail 213. The first drive unit 240 includes a mechanically coupled body, a driver 241 and a lead screw 242. The first driver 241 is disposed at one end of the carrier body 212, and the lead screw 242 is disposed between the two sliding rails 213 and is parallel to the two sliding rails 213. [〇〇19] The second mounting plate 260 is disposed in parallel with the bearing surface 111, and is fitted to the carrier body 212 in cooperation. The first mounting plate 260 is opposite to the carrier body 212. Table 099145389 Form No. A0101 Page 11/29 pages 0992078216-0 201226947 The surface is formed with two slidings matched with the sliding 213 of the carrier body 212 (Fig. Not shown) and threaded holes (not shown) that match the lead screw 242. The slide rails 213 are respectively matched with the two chutes, and the screw rod 242 is engaged with the threaded holes. When the first actuator 241 drives the lead screw to rotate, the second mounting plate is moved along the slide rail 213, and the dry motion is parallel to the first chute 1212. [0022] [0022] 099145389 The second mounting plate 270 is disposed perpendicular to the bearing surface ln and is located on one side of the carrier body 212 adjacent to the positioning plate 12〇. The second mounting plate 27() and the first mounting plate (10) are fixedly disposed to each other. The second mounting plate 27G is fixed to the first mounting plate 260 at one end of the positioning plate 12. In the present embodiment, the second driving device 25Q is a cylinder. The second driving device 250 is disposed on one side of the second mounting plate 270 near the positioning plate 12, and the second driving device 250 includes a cylinder 251 and a driving rod 252. The extending direction of the cylinder 251 and the driving member 252 are perpendicular to Bearing surface I". The drive lever gw extends from the cylinder 251, and the cylinder 251 communicates with the air supply means (not shown) so that the drive lever 252 can move along the cylinder 251. In the present embodiment, the second accelerating device 2 is further provided with a buffer 253 for adjusting the displacement of the driving rod 252 each time it moves. The testing machine 220 is fixedly mounted on one side of the first mounting plate 260 away from the carrier body 212. The test fixture 203 is electrically connected to the test machine 2 2 0. The test fixture 230 is mounted to the drive rod 252 of the second drive unit 250, and the test fixture 230 is opposed to the positioning plate 120. Referring to FIG. 5, a test probe 231 corresponding to the carbon ink dot on the circuit board to be tested is disposed on the surface of the test fixture 230 opposite to the positioning plate 120. Under the driving of the first driving device 240, the test fixture 2 3 0 can be generated in parallel with the direction of the first chute 1212. The form number Α 0101 page 12 / 29 pages 0992078216-0 201226947 movement, in the second drive Driven by the device 250, the test fixture 230 can be moved in a direction toward or away from the positioning plate 120. [0023] The controller 300 is electrically connected to the first driving device 240, the second driving device 250, and the testing machine 220 for controlling the first driving device 240 and the second driving device 250 to drive the test fixture 230 to generate movement, and The control tester 220 tests the board by the test fixture 230. [0024] In this embodiment, an alarm device 310 is further disposed above the controller 300. The alarm device 310 and the controller 300 are mutually signal-connected, and the alarm device 310 has a plurality of signal lights of different colors. The alarm device 310 causes the corresponding signal to illuminate according to the different operating conditions of the circuit board test device 10, thereby indicating the operational state of the circuit board test device 10. [0025] Please refer to FIG. 6 and FIG. 7 together. The technical solution also provides a method for testing a circuit board by using the circuit board testing device 10, and the testing method includes the following steps: [0026] The first step is to provide The circuit board testing device 10 and the circuit board 20 to be tested. Referring to FIG. 6, the circuit board 20 is provided with at least two alignment holes 21, and one of the alignment holes 21 is a reference alignment hole. The circuit board 20 is formed with at least a pair of carbon dots 22. [0028] In the second step, the position of the positioning plate 120 on the table 110 is adjusted, and the positioning pin 124 of one positioning block 122 is opposed to one of the probes 231 of the test fixture 230. [0029] First, the position of the positioning plate 120 is adjusted by the position adjusting device 130, and 099145389 is formed. Form No. A0101 Page 13/29 pages 0992078216-0 201226947 One of the plurality of positioning blocks 122 is a reference positioning block, so that a probe The pin 23丨 corresponds to the positioning pin 24 of the reference positioning block of the first chute 1212 in a direction perpendicular to the first chute 121 2 . Then, the reference positioning block is fixed to the first chute 1212 by sliding the reference positioning block in the first chute 1 21 2 such that the positioning pin of the reference positioning block and the probe 231 are opposite each other. Inside. [0033] [0033] In the third step, the circuit board 20 is positioned on the positioning board 120. The reference alignment hole of the circuit board 20 is fitted into the reference positioning pin, and the other positioning block 1 2 2 is adjusted by the first sliding slot 1212 and the sliding positioning block 122' in the second sliding slot 1213: The other alignment holes 21 in the circuit board 2 are matched with the positioning pins 124 of the other positioning blocks 122, so that the circuit board 20 is positioned on the positioning board 120. In the fourth step, the test fixture 230 is used to test the ink-blocking point 22 on the circuit board 20. The setting of the probe 231 to the carbon dot 22 corresponds to the setting. The controller 300 controls the first driving device 240 to drive the test fixture 230 to move according to a predetermined program according to a predetermined program, so that the test probe 231 corresponds to the carbon ink dot 22, and controls the second driving device 250. The test fixture 230 phase circuit board 20 is moved such that the test probe 231 is in contact with the carbon ink dots 22 to test the carbon ink dots 22. After the test is completed, the controller 300 controls the second driving device 250 to drive the test fixture 230 away from the circuit board 20. In addition, since the second driving device 250 further includes a buffer 253 'for different thickness of the circuit board' can be adjusted by the buffer 253, the control test 099145389 Form No. A0101 Page 14 / Total 29 Page 0992078216-0 [0034] 201226947 [0035] [0037] [0040] [0043] [0043] The fixture 230 is lowered in displacement to satisfy the test of boards of different thicknesses. The circuit board testing device provided by the technical solution is provided with a first sliding slot, a second sliding slot and a plurality of positioning positions movable in the first sliding slot and the second sliding slot on the positioning plate for positioning the circuit board. Block, in this way, for different circuit boards, only the position of each positioning block in the first sliding slot and the second sliding slot needs to be adjusted, so that different circuit boards can be positioned, and the same test fixture can be used to test differently. Circuit board. The circuit board test method provided by the technical solution can conveniently realize the carbon dot test of different circuit boards. It avoids the use of different test fixtures for different boards, which reduces board production costs. The above is only the preferred embodiment of the present invention, and the scope of the patent application in this case cannot be limited thereby. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of an electric slab test apparatus provided by an embodiment of the present technical solution 〇 / ' 1 ... FIG. 2 is an exploded view of a positioning plate provided by an embodiment of the present technical solution. Figure 3 is a cross-sectional view of Figure 2 taken along the ΙΙΙ-ΠΙ line. Figure 4 is a cross-sectional view taken along line IV-IV of Figure 2. FIG. 5 is a bottom view of a test fixture provided by an embodiment of the present technical solution. FIG. 6 is a schematic diagram of a circuit board to be detected provided by the technical solution. 7 is a circuit board test device detection circuit provided by an embodiment of the present technical solution. 099145389 Form No. 1010101 Page 15 of 29 0992078216-0 201226947 Schematic diagram of the board time. [Main component symbol description] [0044] Circuit board test device: 10 [0045] Circuit board: 20 [0046] Registration hole: 21 [0047] Carbon ink dot: 22 [0048] Carrier: 100 [0049] Workbench : 110 [0050] bearing surface: 111 [0051} positioning plate: 120 [0052] plate body: 121 [0053] first surface: 1 211 [0054] first chute: 1212 [0055] second chute: 1213 [0056] First-order trough body: 1214 [0057] Second-order trough body: 1215 [0058] Third-order trough body: 1 21 6 [0059] Fourth-order trough body: 1217 [0060] Positioning block: 122 [ 0061] Engagement: 1221 099145389 Form No. A0101 Page 16 / Total 29 Page 0992078216-0 201226947 [0062] Protrusion: 1222 [0063] Positioning hole: 1224 [0064] Fixing hole: 1 2 2 5 [0065] Positioning Pin: 124 [0066] Fixing member: 125 [0067] Head: 1251 [0068] Rod: 1252 [0069] Position adjusting device: 130 [0070] Limit block: 131 [0071] Adjustment structure: 132 [0072] First fixed block: 1321 [0073] Second fixed block: 1322 [0074] 〇 Screw: 1323 [0075] Support block: 140 [0076] Test device: 200 [0077] Carrier: 210 [0078] Support frame 211 [0079] Carrier frame: 212 [0080] Slide rail: 213 099145389 Form number A0101 Page 17 / Total 29 page 0992078216-0 201226947 [0081] Test machine · 2 2 0 [0082] Test fixture: 230 [0083] Probe: 231 [0084] First drive: 240 [0085] First drive: 241 [0086] Screw: 242 [0087] Second drive: 250 [0088] Cylinder: 251 [0089] Drive rod : 252 [0090] Buffer: 253 [0091] First mounting plate: 260 [0092] Second mounting plate: 270 [0093] Controller: 300 [0094] Alarm device: 310 099145389 Form number A0101 Page 18 of 29 pages 0992078216-0