WO2020133791A1

WO2020133791A1 - Double probe system and printed circuit board detecting device

Info

Publication number: WO2020133791A1
Application number: PCT/CN2019/081805
Authority: WO
Inventors: 李景涛
Original assignee: 南京协辰电子科技有限公司
Priority date: 2018-12-27
Filing date: 2019-04-08
Publication date: 2020-07-02
Also published as: CN109581007A

Abstract

Provided are a double probe system and a printed circuit board detecting device, comprising a fixed bracket (1), a probe driving mechanism (2) fixed on the fixed bracket (1), and a spacing adjustment mechanism (3) driven by the probe driving mechanism (2), wherein, the spacing adjustment mechanism (3) comprises a linear driving assembly (31), a rail assembly (32), a first probe assembly and a second probe assembly, at least one of the first probe assembly and the second probe assembly is a movable probe assembly (34) that slides back and forth along the rail assembly (32) driven by the linear driving assembly (31). In the double probe system and the printed circuit board detecting device, the movable probe assembly (34) can move along the rail assembly (32) driven by the linear driving assembly (31), so as to adjust the relative position between the fixed probe assembly (33) and the movable probe assembly (34), simultaneous probing of the double probe during the detecting of the printed circuit board can be achieved, the detection of multiple printed circuit boards can be achieved by only moving a single printed circuit board detecting device, greatly improving the detection efficiency.

Description

Double probe system and printed circuit board inspection equipment

Technical field

The invention belongs to the technical field of processing and testing equipment for printed circuit boards, and more specifically, to a dual-probe system and printed circuit board testing equipment.

Background technique

Printed circuit board inspection equipment generally includes multiple detection systems working together, each probe system drives a single probe to complete the detection action, thereby ensuring the efficiency of detection. When testing the inductance of a circuit board with a built-in coil, it is necessary to simultaneously perform puncture detection on two points at the same time, and the relative position and point distance of the measured points in the printed circuit board of the same specification are exactly the same.

In the prior art, the traditional single probe system is generally used to detect the circuit board of the built-in coil. During the detection, the two probe systems cooperate to realize the probe operation. When the circuit board is tested, the detection efficiency is low.

Summary of the invention

The purpose of the present invention is to provide a dual-probe system and a printed circuit board inspection device to solve the technology of low efficiency when there is a single-probe system to inspect a large number of multi-specification circuit boards with built-in coils in the prior art problem.

In order to achieve the above object, the technical solution adopted by the present invention is to provide a dual probe system, including: a fixed bracket, a probe driving mechanism fixed to the fixed bracket, and a spacing adjustment mechanism driven by the probe driving mechanism , The spacing adjustment mechanism includes a linear drive assembly, a rail assembly, a first probe assembly and a second probe assembly, at least one of the first probe assembly and the second probe assembly is in the straight line The drive assembly drives a movable probe assembly that slides back and forth along the guide rail assembly.

Further, the first probe assembly is a fixed probe assembly fixed to the side wall of the rail assembly, the second probe assembly is the movable probe assembly, the movable probe assembly and the The linear drive components are connected. Further, the linear drive assembly includes a linear motor, a fixed rod and a probe arm, both ends of the fixed rod are fixed on the guide rail assembly, and the linear motor is provided on the fixed rod and extends along the The fixed rod moves linearly, and the probe arm is fixedly connected to the linear motor.

Further, the guide rail assembly includes a base plate and a first guide rail provided at the bottom of the base plate, and a length direction of the first guide rail is consistent with a length direction of the fixing rod.

Further, elongated holes are provided on both sides of the base plate, and the probe arm passes through the elongated holes and is fixedly connected to the movable probe assembly.

Further, a first slider is fixedly connected to the bottom of the probe arm, and a first sliding groove matched with the first guide rail is opened on the first slider.

Further, the movable probe assembly and the fixed probe assembly each include a height connection piece, a pitch adjustment piece and a probe connected in sequence, the height connection piece is fixedly connected to the probe arm or the base plate, and the pitch adjustment Adjust the distance between the two probes.

Further, the probe driving mechanism includes an angle adjustment assembly and a height adjustment assembly, the angle adjustment assembly is fixedly connected to the fixing bracket, the height adjustment assembly is fixed on the angle adjustment assembly, and the height adjustment The assembly drives the spacing adjustment mechanism to move.

Further, the angle adjustment assembly includes a rotating electric machine, a motor fixing plate and a pillar set, the rotating electric machine is provided on the motor fixing plate and fixedly connected to the fixing bracket, the pillar set and the motor fixing plate Fixed connection.

Further, the height adjustment assembly includes a fixed backplane, a height adjustment motor and a transmission part, the pillar group and the fixed backplane are fixedly connected, and the height adjustment motor is fixed on the fixed backplane, the The transmission part connects the height adjustment motor and the spacing adjustment mechanism.

Further, the transmission part includes a driving wheel, a driven wheel and a timing belt, the driving wheel is provided at the output end of the height adjustment motor, the driven wheel is provided at one side of the guide rail assembly, and the synchronization A belt connects the driving wheel and the driven wheel, and a synchronous connecting piece is sleeved on the synchronous belt, and the synchronous connecting piece is fixedly connected with the guide rail assembly.

Further, an adjustment lever is provided at the center of the driven wheel, and an adjustment hole slidingly connected with the adjustment lever is opened in the fixed backplane.

Further, the height adjustment assembly further includes a second guide rail provided on the inner side wall of the fixed backplane, a second slider is fixed on the outer side of the guide rail assembly, and the second slider is provided with The second chute with two guide rails.

The invention also discloses a printed circuit board inspection device, including the dual probe system as described in any one of the above.

The beneficial effects of the dual-probe system and printed circuit board detection equipment provided by the present invention are: compared with the prior art, the dual-probe system and printed circuit board detection equipment of the present invention are detected by the fixed bracket and the printed circuit board The other components on the device are connected, and the movable probe assembly can be moved along the guide rail assembly under the drive of the linear drive assembly, thereby adjusting the relative position between the first probe assembly and the second probe assembly. Simultaneous probing of dual probes in the printed circuit board inspection process can realize the detection of multiple printed circuit boards by moving only a single printed circuit board inspection equipment, which greatly improves the inspection efficiency.

BRIEF DESCRIPTION

In order to more clearly explain the technical solutions in the embodiments of the present invention, the drawings required in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings in the following description are only for the invention. In some embodiments, for those of ordinary skill in the art, without paying creative labor, other drawings may be obtained based on these drawings.

FIG. 1 is a schematic diagram of a three-dimensional structure of a dual-probe system provided by an embodiment of the present invention;

2 is a three-dimensional structural schematic diagram of a spacing adjustment mechanism used in an embodiment of the present invention;

3 is a schematic perspective structural view of another angle adjustment mechanism used in FIG. 2;

4 is a three-dimensional schematic diagram of a fixed bracket used in an embodiment of the present invention;

5 is a three-dimensional structural schematic diagram of an angle adjustment component used in an embodiment of the present invention;

6 is a three-dimensional structural schematic diagram of a height adjustment component used in an embodiment of the present invention;

7 is a schematic perspective structural view of another angle adjustment component used in FIG. 6, wherein the driven wheel is not shown;

FIG. 8 is a partially enlarged schematic view of part A in FIG. 7.

Among them, the reference signs in the figure:

1. Fixed bracket; 2. Probe drive mechanism; 3. Spacing adjustment mechanism; 21. Angle adjustment component; 22. Height adjustment component; 211, rotating motor; 212, motor fixing plate; 213, pillar group; 221, fixed back Plate; 222, height adjustment motor; 223, transmission part; 224, second slider; 225, second chute; 2231, driving wheel; 2232, driven wheel; 2233, timing belt; 2234, synchronous connection; 2235, Adjustment rod; 2236, adjustment hole; 31, linear drive assembly; 32, rail assembly; 33, fixed probe assembly; 34, movable probe assembly; 311, linear motor; 312, fixed rod; 313, probe arm; 321 , Substrate; 322, first guide rail; 3211, elongated hole; 3131, first slider; 331, height connector; 332, spacing adjustment member; 333, probe; 341, height connection member; 342, spacing adjustment member 343, probe; 344, "L" shaped connecting plate; 3421, connecting plate; 3422, adjusting block; 3423, push plate.

detailed description

In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clear, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not intended to limit the present invention.

It should be noted that when an element is referred to as being “fixed” or “disposed on” another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.

It should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top" , "Bottom", "Inner", "Outer" and other indications are based on the orientation or positional relationship shown in the drawings, only to facilitate the description of the present invention and simplify the description, not to indicate or imply the device Or elements must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present invention.

In addition, the terms "first" and "second" are used for description purposes only, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise specifically limited.

Please refer to FIG. 1 to FIG. 3 together to describe the dual-probe system provided by the present invention. The dual-probe system includes a fixed bracket 1, a probe driving mechanism 2 fixed to the fixed bracket 1, and a spacing adjustment mechanism 3 driven by the probe driving mechanism 2, the spacing adjustment mechanism 3 includes a linear drive An assembly 31, a rail assembly 32, a first probe assembly and a second probe assembly, at least one of the first probe assembly and the second probe assembly is driven by the linear drive assembly 31 The movable probe assembly 34 that slides the guide rail assembly 32 back and forth.

Compared with the prior art, the dual-probe system provided by the present invention is connected to other components on the printed circuit board inspection equipment through the fixed bracket 1, and the movable probe assembly 34 can be driven along by the linear drive assembly 31 The rail assembly 32 moves to adjust the relative position between the first probe assembly and the second probe assembly, which can realize the simultaneous probe of the double probes during the detection process of the printed circuit board (not shown). By moving only a single printed circuit board inspection device, multiple printed circuit board inspections can be achieved, greatly improving the inspection efficiency.

Specifically, one of the first probe assembly and the second probe assembly may be the movable probe assembly 34 that can slide back and forth, or only one of them may be the movable probe assembly 34. When both the first probe assembly and the second probe assembly are movable probe assemblies 34, the linear drive assembly 31 needs to simultaneously drive the movement of the first probe assembly and the second probe assembly.

Further, please refer to FIGS. 1 to 4 together, as a specific embodiment of the dual-probe system provided by the present invention, the first probe assembly is a fixed probe fixed to the side wall of the rail assembly 32 For the needle assembly 33, the second probe assembly is the movable probe assembly 34, and the movable probe assembly 33 is connected to the linear drive assembly 31. Specifically, the fixed probe assembly 33 is fixed to the side wall of the guide rail assembly 32, the movable probe assembly 34 is connected to the linear drive assembly 31, and the movable probe assembly 34 is located on the guide rail The assembly 32 slides. The movable probe assembly 34 can be moved along the guide rail assembly 32 under the driving of the linear drive assembly 31, thereby adjusting the relative position between the fixed probe assembly 33 and the movable probe assembly 34, which can realize the detection of the printed circuit board Simultaneous probing of dual probes during the process.

Further, please refer to FIGS. 1 to 4 together. As a specific embodiment of the dual-probe system provided by the present invention, the linear drive assembly 31 includes a linear motor 311, a fixed rod 312, and a probe arm 313. Both ends of the fixing rod 312 are fixed to the guide rail assembly 32, the linear motor 311 is mounted on the fixing rod 312 and moves linearly along the fixing rod 312, the probe arm 313 and the straight line The motor 311 is fixedly connected. Specifically, the linear drive assembly 31 is used to drive the movable probe assembly 34 to move linearly along the guide rail assembly 32, thereby adjusting the spacing between the movable probe assembly 34 and the fixed probe assembly 33. The probe arm 313 is disposed on one side or opposite sides of the linear motor 311, one end of the probe arm 313 is fixedly connected to the linear motor 311, and the other end is connected to the movable probe assembly 34, ensuring that the movable probe assembly 34 can be connected to The linear motor 311 moves along the longitudinal direction of the rail assembly 32 together.

Further, please refer to FIGS. 1 to 5. As a specific embodiment of the dual-probe system provided by the present invention, the guide rail assembly 32 includes a base plate 321 and a first guide rail 322 provided at the bottom of the base plate 321. The longitudinal direction of the first guide rail 322 is consistent with the longitudinal direction of the fixed rod 312. Specifically, the linear motor 311 moves linearly along the fixed rod 312, and the length direction of the fixed rod 312 is consistent with the driving direction of the first guide rail 322, that is, the linear motor 311 moves along the longitudinal direction of the first guide rail 322. The first guide rail 322 is fixedly disposed at the bottom of the base plate 321, and the first guide rail 322 and the probe arm 313 cooperate to connect with the movable probe assembly 34 to ensure the stability of the movement of the movable probe assembly 34.

Further, referring to FIGS. 1 to 3, as a specific embodiment of the dual-probe system provided by the present invention, elongated holes 3211 are provided on both sides of the substrate 321, and the probe arm 313 passes through the The long hole 3211 is fixedly connected to the movable probe assembly 34. Specifically, the elongated holes 3211 are opened on opposite sides of the substrate 321, the longitudinal direction of the elongated holes 3211 is consistent with the longitudinal direction of the first guide rail 322, and the width of the elongated holes 3211 is slightly larger than the thickness of the probe arm 313, thereby The probe arm 313 can be connected to the movable probe assembly 34 through the base plate 321. The number of the elongated holes 3211 and the number of the probe arms 313 may be one or two, and the number of the elongated holes 3211 and the number of the probe arms 313 are the same.

Further, please refer to FIG. 1 to FIG. 3, as a specific embodiment of the dual-probe system provided by the present invention, the bottom of the probe arm 313 is fixedly connected with a first slider 3131, the first slider The 3131 is provided with a first sliding groove (not shown) that cooperates with the first guide rail 322. Specifically, the first slider 3131 is connected between the probe arms 313, and the first slider 3131 and the probe arm 313 combine to support the movable probe assembly 34, thereby ensuring the stability of the movement of the movable probe assembly 34. The first sliding groove is disposed on a side of the first slider 3131 facing away from the movable probe assembly 34, and the first sliding groove cooperates with the first guide rail 322.

Further, please refer to FIG. 1 to FIG. 3, as a specific embodiment of the dual probe system provided by the present invention, the movable probe assembly 34 and the fixed probe assembly 33 each include a height connection piece connected in

sequence

331 or 341, the

spacing adjusting member

332 or 342 and the

probe

333 or 343, the

height connecting member

331 or 341 is fixedly connected to the probe arm 313 or the substrate 321, and the

spacing adjusting member

332 or 342 adjusts the two probes The spacing between

pins

333 or 343. Specifically, the height connecting member 331 is fixedly connected to the probe arm 313 or fixedly connected to the base plate 321 of the guide rail assembly 32, wherein the direction in which the

pitch adjusting member

332 or 342 of the movable probe assembly 34 is set and the pitch of the fixed probe assembly 33 The direction of adjustment is opposite, that is, the direction of the

spacing adjustment member

332 or 342 of the movable probe assembly 34 is opposite to the direction of the pitch adjustment of the fixed probe assembly 33, both the movable probe assembly 34 and the fixed probe assembly 33 can be realized The location is limited.

Preferably, please refer to FIG. 2, the

spacing adjusting member

332 or 342 includes a connecting plate 3421, an adjusting block 3422 and a push plate, the

probe

333 or 343 is fixed on the pushing plate, the connecting block is fixedly connected with the height connecting piece 331, the adjusting block 3422 is fixed on the connecting plate 3421 and is in contact with the push plate, and the position of the adjustment block 3422 can be adjusted, thereby driving the movement of the push plate, thereby realizing the movement of the

probe

333 or 343.

Preferably, please refer to FIGS. 1 to 3. For the fixed probe assembly 33, the height connecting member 331 and the distance adjusting member 332 are fixedly connected, and the height of the distance adjusting member 332 cannot be adjusted. For the movable probe assembly 34, an "L" shaped connecting plate 344 is further provided between the height connecting piece 341 and the spacing adjusting piece 342, and the shape of the height connecting piece 331 is also "L" shaped, and the height connecting pieces 331 and "L" The connection plates 344 are fixedly connected by bolts (not shown), and the height of the bottom of the connection piece 331 and the "L" can be adjusted by adjusting the length of the bolt between the bottom of the connection piece 331 and the bottom of the "L" connection plate 344 The spacing between the bottoms of the "shaped connecting plates 344" enables the height of the spacing adjustment member 342 to be adjusted, thereby achieving fine adjustment of the height of the probe 343 relative to the printed circuit board.

Further, referring to FIG. 1, as a specific embodiment of the dual-probe system provided by the present invention, the probe driving mechanism 2 includes an angle adjustment assembly 21 and a height adjustment assembly 22, and the angle adjustment assembly 21 and the The fixing bracket 1 is fixedly connected, the height adjustment component 22 is fixed on the angle adjustment component 21, and the height adjustment component 22 drives the spacing adjustment mechanism 3 to move. Specifically, the angle adjustment assembly 21 is connected to the fixed bracket 1, the angle adjustment assembly 21 can drive the height adjustment assembly 22 below to rotate; the height adjustment assembly 22 is connected below the angle adjustment assembly 21, and the spacing adjustment mechanism 3 is provided in the height adjustment Below the assembly 22, and can move the angle adjustment assembly 21 up and down. The angle adjustment assembly 21, the height adjustment assembly 22 and the spacing adjustment mechanism 3 are combined to realize the rotation, height adjustment and spacing adjustment of the fixed probe assembly 33 and the movable probe assembly 34.

Further, referring to FIG. 5, as a specific embodiment of the dual-probe system provided by the present invention, the angle adjustment assembly 21 includes a rotary motor 211, a motor fixing plate 212, and a pillar group 213. The rotary motor 211 is provided with On the motor fixing plate 212 and fixedly connected with the fixing bracket 1, the pillar group 213 is fixedly connected with the motor fixing plate 212. Specifically, the rotary electric machine 211 is used to drive rotation, the shaft end of the output shaft of the rotary electric machine 211 is connected to the height adjustment assembly 22, the motor fixing plate 212 is combined with the fixed bracket 1 to fix the rotary electric machine 211, the pillar group 213 and the motor The fixing plate 212 is fixed, which can assist the output shaft to fix the height adjustment assembly 22.

Further, please refer to FIGS. 6 and 7. As a specific embodiment of the dual-probe system provided by the present invention, the height adjustment assembly 22 includes a fixed back plate 221, a height adjustment motor 222 and a transmission part 223. The pillar group 213 and the fixed back plate 221 are fixedly connected, and the height adjustment motor 222 is fixed on the fixed back plate 221, and the transmission portion 223 connects the height adjustment motor 222 and the spacing adjustment mechanism 3. Specifically, the height adjustment assembly 22 includes a height adjustment motor 222 for driving the rotation of the transmission part 223, and a fixed back plate 221 is used to fix and support the height adjustment motor 222 and the transmission part 223. The transmission part 223 is fixedly connected to the rail assembly 32 by The transmission part 223 adjusts the height of the rail assembly 32. The two ends of the pillar group 213 are respectively connected and fixed to the back plate 221 and the motor fixing plate 212, so as to achieve a fixed connection between the angle adjustment assembly 21 and the height adjustment assembly 22.

Preferably, both the rotating motor 211 and the height adjusting motor 222 adopt stepping motors, which can control the stroke by the stepping motor, thereby conveniently achieving minute control of the rotation angle and height of the

probes

343 or 333, and ensuring double probes The accuracy of system control.

Further, please refer to FIGS. 6 and 7, as a specific embodiment of the dual-probe system provided by the present invention, the transmission part 223 includes a driving wheel 2231, a driven wheel 2232 and a timing belt 2233, and the driving wheel 2231 Located at the output end of the height adjustment motor 222, the driven wheel 2232 is disposed at one side of the rail assembly 32, and the timing belt 2233 connects the driving wheel 2231 and the driven wheel 2232, the synchronization A synchronization connector 2234 is sleeved on the belt 2233, and the synchronization connector 2234 is fixedly connected to the rail assembly 32. Specifically, the driving wheel 2231 is provided at the shaft end of the output shaft of the height adjustment motor 222, and the rotation energy of the height adjustment motor 222 is output. The driving wheel 2231 and the driven wheel 2232 are connected by a synchronous belt 2233, which is provided on the synchronous belt 2233 There are a number of evenly arranged convex strips (not shown), and the synchronous connecting piece 2234 is sleeved on the synchronous belt 2233, and the synchronous connecting piece 2234 is driven to move up and down by the transmission of the synchronous belt 2233, wherein the synchronous connecting piece 2234 is provided with a groove (Not shown in the figure) cooperate with the convex strips to realize the up and down movement of the guide rail assembly 32. Of course, according to actual conditions and specific requirements, in other embodiments of the present invention, the transmission member may also be implemented by a plurality of gears that mesh with each other, but its control accuracy is not high, and is not limited here.

Further, please refer to FIG. 8, as a specific embodiment of the dual-probe system provided by the present invention, an adjustment lever 2235 is provided in the center of the driven wheel 2232, and the adjustment is provided on the fixed back plate 221 The adjustment hole 2236 of the rod 2235 is slidingly connected. Specifically, the adjustment hole 2236 may be an elongated hole 3211, and the adjustment rod 2235 may slide and be fixed in the elongated hole 3211, thereby adjusting the position of the driven wheel 2232 through the relative distance between the adjustment rod 2235 and the adjustment hole 2236, Thus, the tension of the timing belt 2233 is adjusted. Of course, according to actual conditions and specific requirements, in other embodiments of the present invention, the adjustment hole 2236 may not be a long hole 3211, and a plurality of fixing holes (not shown) are evenly provided on the timing belt 2233, and the fixing holes and The adjusting rod 2235 cooperates, and is connected to the fixing holes of different heights through the adjusting rod 2235, thereby adjusting the tension of the timing belt 2233, which is not limited here.

Further, please refer to FIG. 6 and FIG. 7, as a specific embodiment of the dual-probe system provided by the present invention, the height adjustment assembly 22 further includes a second guide rail provided on the inner side wall of the fixed backplane 221 ( (Not shown in the figure), a second slide 224 is fixed on the outer side of the guide rail assembly 32, and a second slide groove 225 that cooperates with the second guide rail is opened on the second slide 224. Specifically, the size of the second sliding groove 225 provided on the second sliding block 224 matches with the second guide rail to ensure that the second sliding block 224 can move along the second rail, and the second sliding block 224 and the rail assembly 32 are fixedly connected , And the second guide rail is provided on the fixed back plate 221, and the length direction of the second guide rail is the same as the length direction of the timing belt 2233, so that the weight of the guide rail assembly 32 is borne by the combination of the second guide rail and the second slider 224, ensuring Stable movement of the rail assembly 32.

The printed circuit board inspection equipment provided by the present invention adopts the dual probe system in any of the above embodiments.

Compared with the prior art, the printed circuit board testing equipment provided by the present invention is connected to other components on the printed circuit board testing equipment through the fixing bracket 1, and the probe driving mechanism 2 can fix the fixed probe assembly 33 and the mobile The position of the probe assembly 34, the movable probe assembly 34 can be moved along the guide rail assembly 32 under the driving of the linear drive assembly 31, so as to adjust the relative position between the fixed probe assembly 33 and the movable probe assembly 34. Simultaneous probing of the dual probes during the printed circuit board inspection process can be achieved by moving only a single printed circuit board inspection device to achieve the detection of multiple printed circuit boards, greatly improving the inspection efficiency.

The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modification, equivalent replacement and improvement made within the spirit and principle of the present invention should be included in the protection of the present invention Within range.

Claims

The dual-probe system is characterized by comprising a fixed bracket (1), a probe driving mechanism (2) fixed to the fixed bracket (1), and a spacing adjustment mechanism (2) driven by the probe driving mechanism (2) 3), the spacing adjustment mechanism (3) includes a linear drive assembly (31), a rail assembly (32), a first probe assembly and a second probe assembly, the first probe assembly and the second probe At least one of the needle assemblies is a movable probe assembly (34) that slides back and forth along the guide rail assembly (32) under the drive of the linear drive assembly (31).
The dual-probe system according to claim 1, wherein the first probe assembly is a fixed probe assembly (33) fixed to the side wall of the rail assembly (32), and the second probe The needle assembly is the movable probe assembly (34), and the movable probe assembly (34) is connected to the linear drive assembly (31).
The dual-probe system according to claim 2, characterized in that the linear drive assembly (31) includes a linear motor (311), a fixed rod (312) and a probe arm (313), and the fixed rod (312) ) Both ends are fixed on the guide rail assembly (32), the linear motor (311) is set on the fixed rod (312) and moves linearly along the fixed rod (312), the probe arm (313) is fixedly connected with the linear motor (311).
The dual-probe system according to claim 3, wherein the guide rail assembly (32) includes a base plate (321) and a first guide rail (322) provided at the bottom of the base plate (321), the first The longitudinal direction of the guide rail (322) is consistent with the longitudinal direction of the fixed rod (312).
The dual-probe system according to claim 4, wherein the substrate (321) is provided with elongated holes (3211) on both sides thereof, and the probe arm (313) passes through the elongated holes ( 3211) fixedly connected with the movable probe assembly (34).
The dual-probe system according to claim 4, characterized in that: a first slider (3131) is fixedly connected to the bottom of the probe arm (313), and the first slider (3131) is provided with a A first chute matched with the first guide rail (322).
The dual-probe system according to claim 3, characterized in that: the movable probe assembly (34) and the fixed probe assembly (33) each include a height connection piece (331 or 341) and a pitch that are sequentially connected An adjusting member (332 or 342) and a probe (333 or 343), the height connecting member (331 or 341) is fixedly connected with the probe arm (313) or the base plate (321), and the spacing adjusting member (332 or 342) ) Adjust the spacing between the two probes (333 and 343).
The dual-probe system according to claim 1, characterized in that the probe drive mechanism (2) includes an angle adjustment assembly (21) and a height adjustment assembly (22), the angle adjustment assembly (21) and all The fixing bracket (1) is fixedly connected, the height adjustment assembly (22) is fixed on the angle adjustment assembly (21), and the height adjustment assembly (22) drives the spacing adjustment mechanism (3) to move.
The dual-probe system according to claim 8, characterized in that the angle adjustment assembly (21) includes a rotating electric machine (211), a motor fixing plate (212), and a pillar set (213), and the rotating electric machine (211) ) Is provided on the motor fixing plate (212) and fixedly connected with the fixing bracket (1), and the pillar group (213) is fixedly connected with the motor fixing plate (212).
The dual-probe system according to claim 9, characterized in that the height adjustment assembly (22) includes a fixed backplane (221), a height adjustment motor (222) and a transmission part (223), and the pillar group ( 213) and the fixed backplane (221) are fixedly connected, and the height adjustment motor (222) is fixed on the fixed backplane (221), and the transmission part (223) is connected to the height adjustment motor (222) ) And the spacing adjustment mechanism (3).
The dual-probe system according to claim 10, wherein the transmission part (223) includes a driving wheel (2231), a driven wheel (2232), and a timing belt (2233), and the driving wheel (2231) is provided At the output end of the height adjustment motor (222), the driven wheel (2232) is provided on one side of the rail assembly (32), and the timing belt (2233) is connected to the driving wheel (2231) and The driven wheel (2232) and the synchronous belt (2233) are sleeved with a synchronous connector (2234), and the synchronous connector (2234) is fixedly connected to the guide rail assembly (32).
The dual-probe system according to claim 11, characterized in that: an adjustment lever (2235) is provided at the center of the driven wheel (2232), and the adjustment lever ( 2235) Sliding connection adjustment hole (2236).
The dual-probe system according to claim 10, wherein the height adjustment assembly (22) further includes a second guide rail provided on the inner side wall of the fixed backplane (221), and the guide rail assembly (32) A second sliding block (224) is fixed on the outside of the second sliding block (224), and a second sliding groove (225) that cooperates with the second guide rail is opened on the second sliding block (224).
The printed circuit board inspection equipment is characterized by comprising the dual probe system according to any one of claims 1 to 13.