CN109581007A - Double probe system and printed circuit board detection device - Google Patents
Double probe system and printed circuit board detection device Download PDFInfo
- Publication number
- CN109581007A CN109581007A CN201811614915.6A CN201811614915A CN109581007A CN 109581007 A CN109581007 A CN 109581007A CN 201811614915 A CN201811614915 A CN 201811614915A CN 109581007 A CN109581007 A CN 109581007A
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- double
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- 239000000523 sample Substances 0.000 title claims abstract description 168
- 238000001514 detection method Methods 0.000 title claims abstract description 39
- 230000007246 mechanism Effects 0.000 claims abstract description 31
- 230000001360 synchronised effect Effects 0.000 claims abstract description 31
- 239000000758 substrate Substances 0.000 claims description 16
- 230000000712 assembly Effects 0.000 claims description 5
- 238000000429 assembly Methods 0.000 claims description 5
- 238000000034 method Methods 0.000 abstract description 6
- 230000008569 process Effects 0.000 abstract description 5
- 230000033001 locomotion Effects 0.000 description 6
- 230000005611 electricity Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Abstract
The present invention provides a kind of double probe system and printed circuit board detection devices, including fixed bracket, the spacing adjusting mechanism for being fixed on support bracket fastened probe driving mechanism and being driven by probe driving mechanism, spacing adjusting mechanism includes linear drives component, guide assembly, the first probe assembly and the second probe assembly, and at least one of the first probe assembly and the second probe assembly are the movable probe component to reciprocatingly slide under linear drives Component driver along guide assembly.Double probe system provided by the invention and printed circuit board detection device, movable probe component can move under the drive of linear drives component along guide assembly, to be adjusted to the relative position between fixed probe assembly and movable probe component, it may be implemented to visit thorn to the synchronous of probe double in printed circuit board detection process, the detection of more printed circuit boards can both may be implemented by only moving single printed circuit board detection device, and greatly improve detection efficiency.
Description
Technical field
The invention belongs to the technical fields of the processing detection device of printed circuit board, are to be related to a kind of pair more specifically
Probe system and printed circuit board detection device.
Background technique
Printed circuit board detection device generally comprises multiple detection systems and cooperates, and driving is single on each probe system
Probe completes detection movement, to guarantee the efficiency of detection.When the circuit board for internal coil carries out inductance value detection, need
Will simultaneously to two o'clock simultaneously carry out spying measurement, and in the printed circuit board of same specification the relative position of measured point and put away from
It is identical.
In the prior art, the probe system for generalling use traditional list detects the circuit board of internal coil, is carrying out
It is matched when detection by two probe systems, so that spy thorn operation is realized, in the electricity of the internal coil to the more specifications of high-volume
When road plate is detected, detection efficiency is lower.
Summary of the invention
The purpose of the present invention is to provide a kind of double probe system and printed circuit board detection devices, to solve the prior art
Middle efficiency lower technical problem when being detected there are circuit board of the Single probe system to the internal coil of the more specifications of high-volume.
To achieve the above object, the technical solution adopted by the present invention is that: provide a kind of double probe system, comprising: fixed branch
Frame, the spacing adjusting mechanism for being fixed on the support bracket fastened probe driving mechanism and being driven by the probe driving mechanism,
The spacing adjusting mechanism includes linear drives component, guide assembly, the first probe assembly and the second probe assembly, and described first
At least one of probe assembly and second probe assembly are the guide assembly described in the linear drives Component driver lower edge
The movable probe component to reciprocatingly slide.
Further, first probe assembly is the fixation probe assembly for being fixed on the side wall of the guide assembly, institute
Stating the second probe assembly is the movable probe component, and the movable probe component is connected with the linear drives component.Into
One step, the linear drives component includes linear motor, fixed link and feeler arm, and the both ends of the fixed link are both secured to institute
State on guide assembly, the linear motor be set to the fixed link on and along the fixed link move along a straight line, the feeler arm with
The linear motor is fixedly connected.
Further, the guide assembly includes substrate and the first guide rail set on the base plate bottom, and described first leads
The length direction of rail is consistent with the length direction of the fixed link.
Further, the two sides of the substrate offer strip hole, and the feeler arm passes through the strip hole and the work
Dynamic probe assembly is fixedly connected.
Further, the bottom of the feeler arm is fixedly connected with the first sliding block, offers on first sliding block and institute
State the first sliding groove of the first guide rail cooperation.
Further, the movable probe component includes that sequentially connected height connects with the fixed probe assembly
Part, spacing adjustment part and probe, the height connector are fixedly connected with feeler arm or substrate, the spacing adjustment part adjustment two
Spacing between a probe.
Further, the probe driving mechanism includes angular adjustment component and height adjustment assembly, the angular adjustment
Component is fixedly connected with the fixed bracket, and the height adjustment assembly is fixed on the angular adjustment component, and the height
Degree adjusts component and drives the spacing adjusting mechanism mobile.
Further, the angular adjustment component includes rotating electric machine, motor fixing plate and pillar group, the rotating electric machine
It is fixedly connected on the motor fixing plate and with the fixed bracket, the pillar group and the fixed company of the motor fixing plate
It connects.
Further, the height adjustment assembly includes stationary backplate, height adjustment motor and driving section, the pillar group
It is fixedly connected with the stationary backplate, and the height adjustment motor is fixed in the stationary backplate, the driving section connection
The height adjustment motor and the spacing adjusting mechanism.
Further, the driving section includes driving wheel, driven wheel and synchronous belt, and the driving wheel is set to the height tune
Save motor output end, the driven wheel be set to the guide assembly side, and driving wheel described in the synchronous band connection and
The driven wheel is arranged with synchronized links part on the synchronous belt, and the synchronized links part is fixedly connected with the guide assembly.
Further, the center of the driven wheel is equipped with adjustment bar, offers and the adjustment bar in the stationary backplate
The adjustment hole being slidably connected.
Further, the height adjustment assembly further includes the second guide rail set on the stationary backplate inner sidewall, described
It is fixed with the second sliding block on the outside of guide assembly, offers on second sliding block and is slided with the second of second guide rail cooperation
Slot.
The invention also discloses a kind of printed circuit board detection devices, including double probe system described in any bar as above.
Double probe system provided by the invention and the beneficial effect of printed circuit board detection device are: with prior art phase
Than double probe system of the present invention and printed circuit board detection device, by fixed bracket and printed circuit board detection device
Other component is connected, and movable probe component can move under the drive of linear drives component along guide assembly, thus right
Relative position between first probe assembly and the second probe assembly is adjusted, and may be implemented to printed circuit board detection process
In the synchronous of double probes visit thorn, more printed circuit boards can both may be implemented by only moving single printed circuit board detection device
Detection, greatly improve detection efficiency.
Detailed description of the invention
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description is only of the invention some
Embodiment for those of ordinary skill in the art without any creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is the schematic perspective view of double probe system provided in an embodiment of the present invention；
Fig. 2 is the schematic perspective view of spacing adjusting mechanism used by the embodiment of the present invention；
Fig. 3 is the schematic perspective view of another angle of spacing adjusting mechanism used by Fig. 2；
Fig. 4 is support bracket fastened schematic perspective view used by the embodiment of the present invention；
Fig. 5 is the schematic perspective view of angular adjustment component used by the embodiment of the present invention；
Fig. 6 is the schematic perspective view of height adjustment assembly used by the embodiment of the present invention；
Fig. 7 is the schematic perspective view of another angle of height adjustment assembly used by Fig. 6, and wherein driven wheel is not
Show；
Fig. 8 is the partial enlargement diagram of the part A in Fig. 7.
Wherein, each appended drawing reference in figure:
1, fixed bracket；2, probe driving mechanism；3, spacing adjusting mechanism；21, angular adjustment component；22, height adjustment
Component；211, rotating electric machine；212, motor fixing plate；213, pillar group；221, stationary backplate；222, height adjustment motor；
223, driving section；224, the second sliding block；225, second sliding slot；2231, driving wheel；2232, driven wheel；2233, synchronous belt；
2234, synchronized links part；2235, bar is adjusted；2236, adjustment hole；31, linear drives component；32, guide assembly；33, fixed to visit
Needle assemblies；34, movable probe component；311, linear motor；312, fixed link；313, feeler arm；321, substrate；322, it first leads
Rail；3211, strip hole；3131, the first sliding block；331, height connector；332, spacing adjustment part；333, probe；341, height
Connector；342, spacing adjustment part；343, probe；344, L shape connecting plate；3421, connecting plate；3422, adjusting block；3423,
Push plate.
Specific embodiment
In order to which technical problems, technical solutions and advantages to be solved are more clearly understood, tie below
Accompanying drawings and embodiments are closed, the present invention will be described in further detail.It should be appreciated that specific embodiment described herein is only
To explain the present invention, it is not intended to limit the present invention.
It should be noted that it can be directly another when element is referred to as " being fixed on " or " being set to " another element
On one element or indirectly on another element.When an element is known as " being connected to " another element, it can
To be directly to another element or be indirectly connected on another element.
It is to be appreciated that term " length ", " width ", "upper", "lower", "front", "rear", "left", "right", "vertical",
The orientation or positional relationship of the instructions such as "horizontal", "top", "bottom" "inner", "outside" is that orientation based on the figure or position are closed
System, is merely for convenience of description of the present invention and simplification of the description, rather than the device or element of indication or suggestion meaning must have
Specific orientation is constructed and operated in a specific orientation, therefore is not considered as limiting the invention.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include one or more of the features.In the description of the present invention, the meaning of " plurality " is two or more,
Unless otherwise specifically defined.
Also referring to Fig. 1 to Fig. 3, now double probe system provided by the invention is illustrated.The double probe system,
Including fixed bracket 1, it is fixed on the probe driving mechanism 2 of the fixed bracket 1 and is driven by the probe driving mechanism 2
Spacing adjusting mechanism 3, the spacing adjusting mechanism 3 include linear drives component 31, guide assembly 32, the first probe assembly and the
Two probe assemblies, at least one of first probe assembly and second probe assembly are in the linear drives component 31
The movable probe component 34 that guide assembly 32 described in driving lower edge reciprocatingly slides.
Double probe system provided by the invention is set by fixed bracket 1 and printed circuit board detection compared with prior art
Standby upper other component is connected, and movable probe component 34 can be under the drive of linear drives component 31 along guide assembly 32
It is mobile, to be adjusted to the relative position between the first probe assembly and the second probe assembly, may be implemented to printing electricity
The synchronous of double probes visits thorn in the plate (not shown) detection process of road, can be by only having moved single printed circuit board detection device both
The detection that more printed circuit boards may be implemented, greatly improves detection efficiency.
Specifically, the first probe assembly and the second probe assembly can one of them be the movable probe that can be reciprocatingly slided
Component 34, or only one of which is movable probe component 34.First probe assembly and the second probe assembly are work
When dynamic probe assembly 34, then needs linear drives component 31 while driving the movement of the first probe assembly and the second probe assembly.
Further, a kind of specific implementation also referring to Fig. 1 to Fig. 4, as double probe system provided by the invention
Mode, first probe assembly are the fixation probe assembly 33 for being fixed on the side wall of the guide assembly 32, and described second visits
Needle assemblies are the movable probe component 34, and the movable probe component 33 is connected with the linear drives component 31.Specifically
, the fixed probe assembly 33 is fixed on the side wall of the guide assembly 32, the movable probe component 34 and the straight line
Driving assembly 31 is connected, and the movable probe component 34 slides on the guide assembly 32.Movable probe component 34 can
To be moved under the drive of linear drives component 31 along guide assembly 32, thus to fixed probe assembly 33 and movable probe group
Relative position between part 34 is adjusted, and may be implemented to visit thorn to the synchronous of probe double in printed circuit board detection process.
Further, a kind of specific implementation also referring to Fig. 1 to Fig. 4, as double probe system provided by the invention
Mode, the linear drives component 31 include linear motor 311, fixed link 312 and feeler arm 313, the two of the fixed link 312
End is both secured on the guide assembly 32, and the linear motor 311 is set in the fixed link 312 and along the fixed link
312 linear motions, the feeler arm 313 are fixedly connected with the linear motor 311.Specifically, linear drives component 31 is used for
Movable probe component 34 is driven to move linearly along guide assembly 32, so as to adjust movable probe component 34 and fixed probe assembly
Spacing between 33.Side or the opposite sides of linear motor 311, one end of feeler arm 313 and straight line is arranged in feeler arm 313
Motor 311 is fixedly connected, and the other end is connected with movable probe component 34, ensure that movable probe component 34 can be with straight-line electric
Machine 311 is moved along the length direction of guide assembly 32 together.
Further, Fig. 1 to Fig. 5 is please referred to, as a kind of specific embodiment of double probe system provided by the invention,
The guide assembly 32 includes substrate 321 and the first guide rail 322 set on 321 bottom of substrate, first guide rail 322
Length direction is consistent with the length direction of the fixed link 312.Specifically, linear motor 311 is moved along 312 straight line of fixed link
It is dynamic, and the driving direction of the length direction of fixed link 312 and the first guide rail 322 is consistent, i.e., linear motor 311 is along the first guide rail
322 length direction is mobile.First guide rail 322 is fixed at the bottom of substrate 321,313 phase of the first guide rail 322 and feeler arm
Cooperation guarantees the stability that movable probe component 34 moves for being connected with movable probe component 34.
Further, refering to fig. 1 to Fig. 3, as a kind of specific embodiment of double probe system provided by the invention, institute
The two sides for stating substrate 321 offer strip hole 3211, and the feeler arm 313 passes through the strip hole 3211 and the movable probe
Component 34 is fixedly connected.Specifically, strip hole 3211 is provided with the opposite sides of substrate 321, the length direction of strip hole 3211
It is consistent with the length direction of the first guide rail 322, and the width of strip hole 3211 is slightly larger than the thickness of feeler arm 313, so that
Feeler arm 313 can pass through substrate 321 and be connected with movable probe component 34.Wherein, the quantity and feeler arm of strip hole 3211
313 quantity all can be one or two, and the quantity of strip hole 3211 is consistent with the quantity of feeler arm 313.
Further, it please refers to Fig.1 to Fig.3, as a kind of specific embodiment of double probe system provided by the invention,
The bottom of the feeler arm 313 is fixedly connected with the first sliding block 3131, offers on first sliding block 3131 and described first
The first sliding groove (not shown) that guide rail 322 cooperates.Specifically, the first sliding block 3131 is connected between feeler arm 313, the first sliding block
3131 and feeler arm 313 combine and movable probe component 34 be supported, thus guarantee movable probe component 34 move it is steady
It is qualitative.The side that the first sliding block 3131 deviates from movable probe component 34, and first sliding groove and the first guide rail is arranged in first sliding groove
322 match.
Further, it please refers to Fig.1 to Fig.3, as a kind of specific embodiment of double probe system provided by the invention,
The movable probe component 34 and the fixed probe assembly 33 include sequentially connected height connector 331 or 341, spacing
Adjustment part 332 or 342 and probe 333 or 343, the height connector 331 or 341 and feeler arm 313 or the fixed company of substrate 321
It connects, the spacing adjustment part 332 or 342 adjusts the spacing between two probes 333 or 343.Specifically, height connector
331 are fixedly connected with feeler arm 313 or are fixedly connected with the substrate 321 of guide assembly 32, wherein movable probe component 34
The direction that spacing adjustment part 332 or 342 is arranged is opposite with the direction of spacing adjustment of fixed probe assembly 33, i.e. movable probe group
The direction that the spacing adjustment part 332 or 342 of part 34 is arranged with the direction that the spacing of fixed probe assembly 33 adjusts be it is opposite, both
The position restriction of movable probe component 34 and fixed probe assembly 33 may be implemented.
Preferably, referring to Fig. 2, spacing adjustment part 332 or 342 in include connecting plate 3421, adjusting block 3422 and push plate,
Probe 333 or 343 is fixed in push plate, and link block is fixedly connected with height connector 331, and adjusting block 3422 is fixed on connecting plate
It is abutted against on 3421 and with push plate, and the position of adjusting block 3422 is adjustable, so that the movement of push plate is driven, to realize spy
The movement of needle 333 or 343.
Preferably, it please refers to Fig.1 to Fig.3, for fixed probe assembly 33, height connector 331 and spacing adjustment part 332
Between be fixedly connected, the height of spacing adjustment part 332 cannot adjust.For movable probe component 34,341 He of height connector
L shape connecting plate 344 is additionally provided between spacing adjustment part 342, and the shape of height connector 331 is also L shape, height connects
It is fixedly connected between part 331 and L shape connecting plate 344 by bolt (not shown), and by adjusting 331 bottom of height connector
Adjustable 331 bottom of height connector of the length of bolt between 344 bottom of L shape connecting plate and L shape connecting plate 344
Spacing between bottom realizes that the height of spacing adjustment part 342 is adjusted, to reach to probe 343 relative to printing electricity
The fine tuning of height between the plate of road.
Further, refering to fig. 1, as a kind of specific embodiment of double probe system provided by the invention, the spy
Needle drive mechanism 2 includes angular adjustment component 21 and height adjustment assembly 22, and the angular adjustment component 21 is propped up with the fixation
Frame 1 is fixedly connected, and the height adjustment assembly 22 is fixed on the angular adjustment component 21, and the height adjustment assembly 22
Drive the spacing adjusting mechanism 3 mobile.Specifically, angular adjustment component 21 is connected with fixed bracket 1, angular adjustment component
21 height adjustment assemblies 22 for being able to drive lower section realize rotation；Height adjustment assembly 22 is connected under angular adjustment component 21
Side, spacing adjusting mechanism 3 are set to the lower section of height adjustment assembly 22, and can be realized moving up and down for angular adjustment component 21.
Angular adjustment component 21, height adjustment assembly 22 and spacing adjusting mechanism 3 combine realization to fixed probe assembly 33 and activity
The adjustment of rotation, the height adjustment and spacing of probe assembly 34.
Further, referring to Fig. 5, a kind of specific embodiment as double probe system provided by the invention, described
Angular adjustment component 21 includes rotating electric machine 211, motor fixing plate 212 and pillar group 213, and the rotating electric machine 211 is set to institute
It states on motor fixing plate 212 and is fixedly connected with the fixed bracket 1, the pillar group 213 and the motor fixing plate 212 are solid
Fixed connection.Specifically, rotating electric machine 211 is for driving rotation, the shaft end of the output shaft of rotating electric machine 211 and height adjustment assembly
22 are connected, and motor fixing plate 212 combines with fixed bracket 1 and rotating electric machine 211 is fixed, pillar group 213 and motor
Fixed plate 212 is fixed, and can assist in output shaft and height adjustment assembly 22 is fixed.
Further, Fig. 6 and Fig. 7 is please referred to, as a kind of specific embodiment of double probe system provided by the invention,
The height adjustment assembly 22 includes stationary backplate 221, height adjustment motor 222 and driving section 223,213 He of pillar group
The stationary backplate 221 is fixedly connected, and the height adjustment motor 222 is fixed in the stationary backplate 221, the transmission
Portion 223 connects the height adjustment motor 222 and the spacing adjusting mechanism 3.Specifically, height adjustment assembly 22 includes height
The rotation that motor 222 is used to drive driving section 223 is adjusted, stationary backplate 221 is for fixing and supporting 222 He of height adjustment motor
Driving section 223, driving section 223 are fixedly connected with guide assembly 32, are adjusted by height of the driving section 223 to guide assembly 32
It is whole.The both ends of pillar group 213 are separately connected stationary backplate 221 and motor fixing plate 212, to realize 21 He of angular adjustment component
Being fixedly connected between height adjustment assembly 22.
Preferably, rotating electric machine 211 and height adjustment motor 222 are all made of stepper motor, can pass through stepper motor pair
Stroke is controlled, to easily realize the small control of the rotation angle and height to probe 343 or 333, guarantees double visit
The precision of needle system control.
Further, Fig. 6 and Fig. 7 is please referred to, as a kind of specific embodiment of double probe system provided by the invention,
The driving section 223 includes driving wheel 2231, driven wheel 2232 and synchronous belt 2233, and the driving wheel 2231 is set to the height
The output end of motor 222 is adjusted, the driven wheel 2232 is set to the side of the guide assembly 32, and the synchronous belt 2233 connects
The driving wheel 2231 and the driven wheel 2232 are connect, synchronized links part 2234 is arranged on the synchronous belt 2233, it is described same
Step connector 2234 is fixedly connected with the guide assembly 32.Specifically, height adjustment motor 222 is arranged in driving wheel 2231
The shaft end of output shaft can export the rotation of height adjustment motor 222, pass through synchronization between driving wheel 2231 and driven wheel 2232
Band 2233 is connected, and several raised line (not shown) being uniformly arranged are provided on synchronous belt 2233, and synchronized links part 2234 is arranged
On synchronous belt 2233, moving up and down for synchronized links part 2234 is driven by the transmission of synchronous belt 2233, wherein synchronized links
Part 2234 is equipped with groove (not shown) and matches with raised line, realizes moving up and down for guide assembly 32 afterwards.Certainly, according to reality
Border situation and specific requirements, in other embodiments of the invention, driving member can also be real by multiple pitch wheels
It is existing, but its control precision is not high, does not limit uniquely herein.
Further, referring to Fig. 8, a kind of specific embodiment as double probe system provided by the invention, described
The center of driven wheel 2232 is equipped with adjustment bar 2235, offers in the stationary backplate 221 and slides company with the adjustment bar 2235
The adjustment hole 2236 connect.Specifically, adjustment hole 2236 can be strip hole 3211, and adjusting bar 2235 can be in strip hole 3211
Interior sliding and fixation, to realize the position of driven wheel 2232 by adjusting the relative distance between bar 2235 and adjustment hole 2236
Adjustment, to be adjusted to the rate of tension of synchronous belt 2233.Certainly, according to the actual situation and specific requirements, of the invention
In other embodiments, adjustment hole 2236 can not also be strip hole 3211, and several fixation holes are uniformly arranged on synchronous belt 2233
(not shown), and fixation hole and adjustment bar 2235 match, and are connected by adjusting bar 2235 with the fixation hole of different height, from
And realize the adjusting of 2233 rate of tension of synchronous belt, it does not limit uniquely herein.
Further, Fig. 6 and Fig. 7 is please referred to, as a kind of specific embodiment of double probe system provided by the invention,
The height adjustment assembly 22 further includes the second guide rail (not shown) set on 221 inner sidewall of stationary backplate, the guide rail
The outside of component 32 is fixed with the second sliding block 224, and second with second guide rail cooperation is offered on second sliding block 224
Sliding slot 225.Specifically, the size for the second sliding slot 225 being arranged on the second sliding block 224 is matched with the second guide rail, guarantee second
Sliding block 224 can be moved along the second guide rail, and the second sliding block 224 is fixedly connected with guide assembly 32, and the setting of the second guide rail exists
In stationary backplate 221, and the length direction of the second guide rail is consistent with the length direction of synchronous belt 2233, to pass through the second guide rail
The weight for undertaking guide assembly 32 is combined with the second sliding block 224, guarantee guide assembly 32 stablizes movement.
Printed circuit board detection device provided by the invention, using the double probe system in any of the above-described embodiment.
Printed circuit board detection device provided by the invention passes through fixed bracket 1 and printed circuit compared with prior art
Other component on plate detection device is connected, and probe driving mechanism 2 can be to fixed probe assembly 33 and movable probe component
34 position, movable probe component 34 can move under the drive of linear drives component 31 along guide assembly 32, thus right
Relative position between fixed probe assembly 33 and movable probe component 34 is adjusted, and may be implemented to detect printed circuit board
The synchronous of double probes visits thorn in the process, more printing electricity can both may be implemented by only moving single printed circuit board detection device
The detection of road plate, greatly improves detection efficiency.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (14)
1. double probe system, it is characterised in that: including the probe actuation machine fixed bracket (1), be fixed on the fixed bracket (1)
Structure (2) and the spacing adjusting mechanism (3) driven by the probe driving mechanism (2), the spacing adjusting mechanism (3) include straight
Line driving assembly (31), guide assembly (32), the first probe assembly and the second probe assembly, first probe assembly and described
At least one of second probe assembly is to drive guide assembly (32) described in lower edge back and forth sliding in the linear drives component (31)
Dynamic movable probe component (34).
2. double probe system according to claim 1, it is characterised in that: first probe assembly is to be fixed on described lead
The fixation probe assembly (33) of the side wall of rail assembly (32), second probe assembly are the movable probe component (34), institute
Movable probe component (34) is stated to be connected with the linear drives component (31).
3. double probe system as claimed in claim 2, it is characterised in that: the linear drives component (31) includes linear motor
(311), the both ends of fixed link (312) and feeler arm (313), the fixed link (312) are both secured to the guide assembly (32)
On, the linear motor (311) is set on the fixed link (312) and moves along a straight line along the fixed link (312), the probe
Arm (313) is fixedly connected with the linear motor (311).
4. double probe system as claimed in claim 3, it is characterised in that: the guide assembly (32) include substrate (321) and
The first guide rail (322) set on the substrate (321) bottom, the length direction of first guide rail (322) and the fixed link
(312) length direction is consistent.
5. double probe system as claimed in claim 4, it is characterised in that: the two sides of the substrate (321) offer strip hole
(3211), the feeler arm (313) passes through the strip hole (3211) and is fixedly connected with the movable probe component (34).
6. double probe system as claimed in claim 4, it is characterised in that: the bottom of the feeler arm (313) is fixedly connected with
First sliding block (3131) offers the first sliding groove with first guide rail (322) cooperation on first sliding block (3131).
7. double probe system as claimed in claim 3, it is characterised in that: the movable probe component (34) and the fixed spy
Needle assemblies (33) include sequentially connected height connector (331 or 341), spacing adjustment part (332 or 342) and probe (333
Or 343), the height connector (331 or 341) is fixedly connected with feeler arm (313) or substrate (321), the spacing adjustment
Part (332 or 342) adjusts the spacing between two probes (333 and 343).
8. double probe system as described in claim 1, it is characterised in that: the probe driving mechanism (2) includes angular adjustment
Component (21) and height adjustment assembly (22), the angular adjustment component (21) is fixedly connected with the fixed bracket (1), described
Between height adjustment assembly (22) is fixed on the angular adjustment component (21), and the height adjustment assembly (22) drive is described
It is mobile away from adjustment mechanism (3).
9. double probe system as claimed in claim 8, it is characterised in that: the angular adjustment component (21) includes rotating electric machine
(211), motor fixing plate (212) and pillar group (213), the rotating electric machine (211) are set on the motor fixing plate (212)
And be fixedly connected with the fixed bracket (1), the pillar group (213) is fixedly connected with the motor fixing plate (212).
10. double probe system as claimed in claim 9, it is characterised in that: the height adjustment assembly (22) includes fixed back
Plate (221), height adjustment motor (222) and driving section (223), the pillar group (213) and the stationary backplate (221) are fixed
Connection, and the height adjustment motor (222) is fixed on the stationary backplate (221), described in driving section (223) connection
Height adjustment motor (222) and the spacing adjusting mechanism (3).
11. double probe system as claimed in claim 10, it is characterised in that: the driving section (223) includes driving wheel
(2231), driven wheel (2232) and synchronous belt (2233), the driving wheel (2231) are set to the height adjustment motor (222)
Output end, the driven wheel (2232) are set to the side of the guide assembly (32), and described in the synchronous belt (2233) connection
Driving wheel (2231) and the driven wheel (2232) are arranged with synchronized links part (2234) on the synchronous belt (2233), described
Synchronized links part (2234) is fixedly connected with the guide assembly (32).
12. double probe system as claimed in claim 11, it is characterised in that: the center of the driven wheel (2232) is equipped with adjustment
Bar (2235), offers on the stationary backplate (221) and adjustment hole (2236) that adjustment bar (2235) is slidably connected.
13. double probe system as claimed in claim 10, it is characterised in that: the height adjustment assembly (22) further includes being set to
Second guide rail of stationary backplate (221) inner sidewall is fixed with the second sliding block (224) on the outside of the guide assembly (32),
The second sliding slot (225) with second guide rail cooperation is offered on second sliding block (224).
14. printed circuit board detection device, it is characterised in that: including the described in any item double probe systems of such as claim 1 to 13
System.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811614915.6A CN109581007A (en) | 2018-12-27 | 2018-12-27 | Double probe system and printed circuit board detection device |
| PCT/CN2019/081805 WO2020133791A1 (en) | 2018-12-27 | 2019-04-08 | Double probe system and printed circuit board detecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811614915.6A CN109581007A (en) | 2018-12-27 | 2018-12-27 | Double probe system and printed circuit board detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109581007A true CN109581007A (en) | 2019-04-05 |
Family
ID=65933168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811614915.6A Pending CN109581007A (en) | 2018-12-27 | 2018-12-27 | Double probe system and printed circuit board detection device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN109581007A (en) |
| WO (1) | WO2020133791A1 (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109946489A (en) * | 2019-04-16 | 2019-06-28 | 业成科技（成都）有限公司 | Probe detection device |
| WO2020133791A1 (en) * | 2018-12-27 | 2020-07-02 | 南京协辰电子科技有限公司 | Double probe system and printed circuit board detecting device |
| CN112213448A (en) * | 2020-10-09 | 2021-01-12 | 东莞市冠菱精密设备有限公司 | IQC supplied materials detects multi-functional equipment |
| CN112977975A (en) * | 2021-04-20 | 2021-06-18 | 东莞市冠菱精密设备有限公司 | Measuring value device for braid electronic element |
| CN113341183A (en) * | 2021-07-15 | 2021-09-03 | 祥腾(深圳)智能装备有限公司 | LCR intelligent probe module |
| CN115201664A (en) * | 2022-07-29 | 2022-10-18 | 河北圣昊光电科技有限公司 | Chip detection device and chip testing machine with same |
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Also Published As
| Publication number | Publication date |
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| WO2020133791A1 (en) | 2020-07-02 |
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