CN105938160A - Impedance test apparatus - Google Patents
Impedance test apparatus Download PDFInfo
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- CN105938160A CN105938160A CN201610463590.0A CN201610463590A CN105938160A CN 105938160 A CN105938160 A CN 105938160A CN 201610463590 A CN201610463590 A CN 201610463590A CN 105938160 A CN105938160 A CN 105938160A
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- probe
- impedance
- impedance test
- test
- test device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention provides an impedance test apparatus. The impedance test apparatus comprises a switching installation mechanism and at least three probes, wherein the probes are grounding probes or signal probes, the probes are installed on the switching installation mechanism, and a part of or all of the probes are driven by the switching installation mechanism to realize switching between test positions and non-test positions; and every time the switching installation mechanism drives two selected probes to reach the test positions in a combination mode of one signal probe and one another signal probe or in a combination mode of one signal probe and one grounding probe, and other non-selected probes are switched to the non-test positions. According to the impedance test apparatus, when the two selected probes are used for an impedance test, the non-selected probes are away from a circuit board to be tested so as to prevent contact with other positions of the circuit board to be tested, no interference is caused to the test, the accuracy of a test result is guaranteed, and at the same time, a measurement instrument is prevented from damage caused by a short circuit.
Description
Technical field
The present invention relates to testing impedance technical field, be specifically related to a kind of impedance test device.
Background technology
Along with the continuous progress of communication technology, traffic rate is more and more higher, and increasing user is to PCB
Plate cabling proposes impedance control and the requirement of signal frequency.Testing impedance generally includes single-ended impedance test
Testing with differential impedance, wherein single-ended impedance test is typically surveyed by single-ended impedance probe assembly
Examination, differential impedance test is typically tested by differential impedance probe assembly.Described single-ended impedance
Probe assembly generally includes a signal probe and a grounded probe, described differential impedance probe assembly
Generally include two signal probes.
Need to switch different impedance probe assemblies owing to carrying out different testing impedances, therefore, existing
Impedance test device generally include four probes, respectively three signal probes and a grounded probe,
Two of which signal probe constitutes differential probe assembly, a signal probe and a grounded probe and constitutes
Single-ended probe assembly.Although the existing single-ended probe assembly of this impedance test device can carry out single-ended resistance
Anti-test, has again differential probe assembly can carry out differential impedance test, but two kinds of spies when test
Easily interfering with each other between needle assembly, affect test result, and the probe comprised is more, use cost is high.
Chinese patent literature CN102288826B discloses a kind of impedance probe head with two-in-one characteristic, including outside
Shell and the impedance circuit plate being placed in shell, impedance circuit plate be provided with stretch out shell the first probe,
Second probe and the 3rd probe, the first probe and the second probe respectively with two differences on impedance circuit plate
Sub-signal line connects, and for signal probe, the 3rd probe is connected with ground level, for grounded probe, and first
In probe and the second probe any one all collectively forms single-ended impedance test probe with the 3rd probe,
First probe, the second probe and the 3rd probe collectively form differential impedance test probe.The prior art
Although be integrated with single-ended impedance test function and differential impedance test function on same probe simultaneously,
But when one of them of use the first probe and the second probe is visited with the 3rd probe composition single-ended impedance test
When head carries out single-ended impedance test, that probe not used is due to same with by two probes of use
Be in test position, thus easily with the contacting elsewhere of impedance circuit plate, test is interfered,
Affect test result, even cause short circuit, cause measuring instrument to be damaged；When use the first probe,
When the differential impedance test probe that two probes and the 3rd probe collectively form is to carry out differential impedance test,
Have only to the first probe and the second probe the two differential signal probe can complete differential impedance test,
If using the 3rd probe, then need to make the 3rd probe keep ground connection；But, in the prior art,
The relative position relation of three probes remains constant, so using the first probe and the second probe
Contact when carrying out differential impedance test with the correspondence position on circuit board, the 3rd probe and the second probe,
3rd probe is in test position together, still easily with the contacting elsewhere, to test of impedance circuit plate
Interfere, affect test result, even cause short circuit, cause measuring instrument to be damaged.
Summary of the invention
Therefore, the technical problem to be solved in the present invention be to overcome of the prior art have three and with
The impedance test device of upper probe, when using two of which pin to carry out a kind of testing impedance, is not used
That probe easily testing impedance is interfered, affect test result, even cause short circuit cause survey
The defect that measuring appratus damages, thus provide a kind of when using two of which pin to carry out a kind of testing impedance,
Testing impedance generation will not be interfered by that probe not used, test result is relatively accurate, Bu Huizao
Become short circuit has three and the impedance test device of above probe.
A kind of impedance test device of the present invention, including:
Switching installing mechanism；
At least three probe, described probe is grounded probe or signal probe, and described probe is installed on institute
State on switching installing mechanism, and part or all of described probe is driven by described switching installing mechanism, and
Can switch between test position and non-test position；And described switching installing mechanism drives selected every time
Probe described in two is with signal probe described in one and the compound mode of another described signal probe or with described in one
The compound mode of grounded probe described in signal probe and arrives described test position, remaining non-selected institute
State probe and switch to described non-test position.
Described probe by the way of straight line reciprocates in described test position and described non-test position
Between switch.
Described switching installing mechanism includes:
Mounting seat；
Travel(l)ing rest, the most described mounting seat be vertically arranged and can the most described mounting seat vertically
Move back and forth；Its lower end is provided with described probe；
Power set, are arranged between described mounting seat and described travel(l)ing rest, drive described activity to prop up
Frame moves relative to described mounting seat.
Described power set include making the most described mounting seat of described travel(l)ing rest move up or down
Controlled force device；And biasing force is applied on described travel(l)ing rest order about described travel(l)ing rest to separately
The bias piece that one direction is moved.
Described controlled force device is calutron.
Described calutron include being arranged on the coil on one of described travel(l)ing rest and described mounting seat or
Magnechuck, and the ferromagnetic component being arranged on another.
The described biasing force of described bias piece is the active force tending to described test position.
Described biasing force is executed by the compression spring being arranged between described travel(l)ing rest and described mounting seat
Add.
Described mounting seat has fixed support, and described fixed support is provided with the shifting to described travel(l)ing rest
Dynamic the first guide frame carrying out guiding.
Described fixed support is tubular structure, and the upper end edge hole depth direction straight line of described travel(l)ing rest comes and goes
Being inserted in movably in the spacing hole of described tubular structure, described first guide frame is described solid for being located at
Keyway arrangements between fixed rack and described travel(l)ing rest.
Three probes are installed on described switching installing mechanism, the respectively first probe, the second probe and
3rd probe, described first probe is grounded probe, and described second probe and described 3rd probe are
Signal probe.
Described first probe, described second probe and described 3rd probe is coplanar in same vertical plane sets
Put；
Described second probe is arranged between described first probe and described 3rd probe, and is positioned to survey
Examination position；Described first probe, described 3rd probe respectively can be in test position and non-test positions
Between switch.
The needle point of described first probe, the needle point of described 3rd probe all tilt near described second probe
Needle point arrange.
Described second probe is relative to the distance between described first probe, described 3rd probe adjustably
It is arranged on described switching installing mechanism.
Described impedance test device also includes:
Driving means, is used for driving described second probe to slide；
Second guide frame, is arranged on described switching installing mechanism, guides described second probe close
Described first probe, slide away from described 3rd probe or near described 3rd probe, away from described the
One probe slides.
Relative distance between part or all of described probe is adjustably arranged on described switching installing mechanism
On.
Described probe includes probe inner wire and the screen layer being coated on outside described probe inner wire, described
Screen layer is provided with conductive elastic component；
It is in the described conductive elastic component on probe described in selected the two of test position at respective elastic force
Effect under respectively with same described conductor structure be in close contact.
Technical solution of the present invention, has the advantage that
1. the impedance test device that the present invention provides, including: switching installing mechanism；At least three probe,
Described probe is grounded probe or signal probe, and described probe is installed on described switching installing mechanism,
And part or all of described probe is driven by described switching installing mechanism, and can be in test position and non-survey
Examination switches between position；And described switching installing mechanism drives probe described in selected two with described in one every time
Signal probe and the compound mode of signal probe another described or connect described in signal probe described in one and
The compound mode of ground probe arrives described test position, and remaining non-selected described probe switches to described non-
Test position.Above-mentioned impedance test device, when needs carry out testing impedance with selected two probes,
Have only to make selected two probes be in test position, non-selected probe is switched to non-test position, i.e.
May be implemented in use selected two probes when carrying out testing impedance, non-selected probe is away from circuit board under test
And then avoid and the contacting elsewhere of circuit board under test, test will not be produced and interfere, it is ensured that test
The accuracy of result, prevents from causing short circuit to make measuring instrument damage simultaneously.
2. the impedance test device that the present invention provides, described switching installing mechanism includes: mounting seat；Live
Dynamic support, the most described mounting seat is vertically arranged and can the most described mounting seat the most back and forth move
Dynamic；Its lower end is provided with described probe；Power set, are arranged on described mounting seat and prop up with described activity
Between frame, described travel(l)ing rest is driven to move relative to described mounting seat.Above-mentioned switching installing mechanism is logical
Cross power set and control to be installed on probe the cutting between test position and non-test position of travel(l)ing rest
Changing, simple in construction, easy to operate, switching state is stable.
3. the impedance test device that the present invention provides, described biasing force is by being arranged on described travel(l)ing rest
And the compression spring between described mounting seat applies.Compression spring can apply while described biasing force,
Have the cushioning effect to probe concurrently when probe test, prevent between probe with circuit board contact really up to the mark and
Damage circuit board.
4. the impedance test device that the present invention provides, described mounting seat has fixed support, described fixing
Support is provided with the first guide frame that the movement to described travel(l)ing rest guides.First Guiding machine
Structure can reciprocate at vertical direction straight line with boot activity support.
5. the impedance test device that the present invention provides, described switching installing mechanism is provided with three probes,
Being respectively the first probe, the second probe and the 3rd probe, described first probe is grounded probe, described
Second probe and described 3rd probe are signal probe.Three probes are set in impedance test device,
Wherein one is grounded probe, and two other is signal probe, by probe at test position with non-
Switch between test position, it is achieved constitute single when grounded probe and signal probe are in test position
During terminal impedance test, an other signal probe；In like manner, it is in test position when two signal probes
When constituting differential impedance test, grounded probe is in non-switching position and avoids and circuit board to be tested
Contact, it is ensured that test result.The impedance test device of the present invention can realize just only arranging three probes
Single-ended impedance test can be completed and differential impedance tests two kinds of tests, compared to four ability of existing needs
Can realize single-ended impedance test and differential impedance tests two kinds of tests, the impedance test device of the present invention can
To reduce number of probes, cost-effective, and the interference of non-test probe when avoiding testing, it is ensured that test
The accuracy of result prevents Damage by Short Circuit measuring instrument simultaneously.
6. the impedance test device that the present invention provides, the needle point of described first probe, described 3rd probe
Needle point all tilt near described second probe needle point arrange.So so that the first probe and
The differential impedance that single-ended impedance test, the second probe and the 3rd probe that two probes are constituted is constituted tests this
Two kinds of testing impedances can realize the detection in minimum spacing, improves detection range.
7. the present invention provide impedance test device, described second probe relative to described first probe,
Distance between described 3rd probe is adjustably arranged on described switching installing mechanism.So make structure
Become the spacing between the first probe and second probe of single-ended impedance test, constitute differential impedance test
Spacing between second probe and the 3rd probe can be with the size of position to be measured spacing on circuit board
Flexible, not only increases testing impedance scope, also makes testing impedance more flexible more convenient.
8. the impedance test device that the present invention provides, described probe includes probe inner wire and is coated on institute
Stating the screen layer outside probe inner wire, described screen layer is provided with conductive elastic component；It is in test position
Described conductive elastic component on probe described in selected two put under the effect of respective elastic force respectively with
Same described conductor structure is in close contact.The impedance test device of the present invention, by described conductor structure,
And conductive elastic component is set at the screen layer of probe, described conductive elastic component is at the work of its own resilient
Can keep in moment being in close contact with conductor structure with lower, make to be in selected two probes of test position
Screen layer between realize good electric connection by conductor structure, can be prevented effectively from high-frequency signal lose
Very, it is ensured that the accuracy of impedance test results.
Accompanying drawing explanation
In order to be illustrated more clearly that the specific embodiment of the invention or technical scheme of the prior art, under
The accompanying drawing used required in detailed description of the invention or description of the prior art will be briefly described by face,
It should be evident that the accompanying drawing in describing below is some embodiments of the present invention, general for this area
From the point of view of logical technical staff, on the premise of not paying creative work, it is also possible to obtain according to these accompanying drawings
Obtain other accompanying drawing.
The front view of the impedance test device provided in the first embodiment that Fig. 1 is the present invention；
Fig. 2 is the front view of another state of the impedance test device shown in Fig. 1；
Fig. 3 be the impedance test device shown in Fig. 1 wherein probe being in test position with lead
The side view cutaway drawing of body form touch；
Fig. 4 is that the first probe of the impedance test device shown in Fig. 1, the second probe connect with conductor structure
The front sectional view touched；
Description of reference numerals:
1-mounting seat, 2-fixed support, 21-spacing hole, 3-travel(l)ing rest, 4-calutron, 5-presses
Power spring, 6-the first guide frame, 61-keyway arrangements, 7-driving means, 8-probe inner wire, 9-
Screen layer, 10-the first probe, 20-the second probe, 30-the 3rd probe, 100-conductive elastic component,
200-conductor structure.
Detailed description of the invention
Below in conjunction with accompanying drawing, technical scheme is clearly and completely described, it is clear that
Described embodiment is a part of embodiment of the present invention rather than whole embodiments.Based on this
Embodiment in bright, those of ordinary skill in the art are obtained under not making creative work premise
Every other embodiment, broadly fall into the scope of protection of the invention.
In describing the invention, it should be noted that term " first ", " second ", " the 3rd "
It is only used for describing purpose, and it is not intended that indicate or hint relative importance.
In describing the invention, it should be noted that unless otherwise clearly defined and limited, art
Language " is installed ", " connection " should be interpreted broadly, and connects for example, it may be fixing, it is also possible to be
Removably connect, or be integrally connected；Can be to be mechanically connected, it is also possible to be electrical connection；Can be
It is directly connected to, it is also possible to be indirectly connected with by intermediary, can be the connection of two element internals.
For the ordinary skill in the art, above-mentioned term can be understood in the present invention with concrete condition
Concrete meaning.
As long as additionally, technical characteristic involved in invention described below difference embodiment that
The conflict of not constituting between this just can be combined with each other.
As depicted in figs. 1 and 2, a kind of impedance test device of the present embodiment, including:
Switching installing mechanism；
At least three probe, described probe is grounded probe or signal probe, and described probe is installed on institute
State on switching installing mechanism, and part or all of described probe is driven by described switching installing mechanism, and
Can switch between test position and non-test position；And described switching installing mechanism drives selected every time
Probe described in two is with signal probe described in one and the compound mode of another described signal probe or with described in one
The compound mode of grounded probe described in signal probe and arrives described test position, remaining non-selected institute
State probe and switch to described non-test position.
Above-mentioned impedance test device, when needs carry out testing impedance with selected two probes, it is only necessary to
Make selected two probes be in test position, non-selected probe is switched to non-test position, can realize
When using selected two probes to carry out testing impedance, non-selected probe away from circuit board under test and then is kept away
Exempt from and the contacting elsewhere of circuit board under test, test will not be produced and interfere, it is ensured that test result
Accuracy, prevents from causing short circuit to make measuring instrument damage simultaneously.
The concrete switch forms between described test position and described non-test position of described probe can
Multiple to have, in the present embodiment, described probe by the way of straight line reciprocates in described test
Switch between position and described non-test position.
The specific constructive form of described switching installing mechanism can have multiple, as a kind of concrete enforcement
Mode, described switching installing mechanism includes:
Mounting seat 1；
Travel(l)ing rest 3, the most described mounting seat 1 be vertically arranged and can the most described mounting seat 1 along vertically
Direction moves back and forth；Its lower end is provided with described probe；
Power set, are arranged between described mounting seat 1 and described travel(l)ing rest 3, drive described work
Dynamic support 3 moves relative to described mounting seat 1.
Above-mentioned switching installing mechanism, is controlled the probe being installed on travel(l)ing rest 3 and is surveying by power set
Switching between examination position and non-test position, simple in construction, easy to operate, switching state is stable.
The concrete form of described power set can have multiple, in the present embodiment, and described power set
Including the controlled active force dress making the described the most described mounting seat of travel(l)ing rest 31 move up or down
Put；And biasing force is applied on described travel(l)ing rest 3 order about described travel(l)ing rest 3 and moves to other direction
Dynamic bias piece.
As a kind of specific embodiment, described controlled force device is calutron 4.
The concrete form of described calutron 4 can have multiple, and such as, described calutron 4 includes
It is arranged on the coil in one of described travel(l)ing rest 3 and described mounting seat 1 or magnechuck, and arranges
Ferromagnetic component on another.Produce and described ferromagnetism when described coil or magnechuck energising
The magnetic attraction that parts attract each other, makes described travel(l)ing rest 3 near described mounting seat 1, away from described
The direction of test position is moved.
Further, the described biasing force of described bias piece is the active force tending to described test position.
As a kind of specific embodiment, described biasing force by be arranged on described travel(l)ing rest 3 with
Compression spring 5 between described mounting seat 1 applies.Compression spring 5 can apply described biasing force
Meanwhile, have the cushioning effect to probe when probe test concurrently, prevent contacting between probe with circuit board
Really up to the mark and damage circuit board.
Described biasing force is by being arranged on the pressure bullet between described travel(l)ing rest 3 and described mounting seat 1
Spring 5 applies.
As a kind of specific embodiment, described mounting seat 1 has fixed support 2, and described fixing is propped up
Frame 2 is provided with the first guide frame 6 that the movement to described travel(l)ing rest 3 guides.First guides
Mechanism 6 can reciprocate at vertical direction straight line with boot activity support 3.
Specifically, in the present embodiment, described fixed support 2 is tubular structure, described travel(l)ing rest 3
Upper end edge hole depth direction straight line be inserted in reciprocating in the spacing hole 21 of described tubular structure, institute
Stating the first guide frame 6 is the keyway knot being located between described fixed support 2 and described travel(l)ing rest 3
Structure 61.
The specific constructive form of described keyway arrangements 61 can have multiple, such as, can be to be located at movable
The structure that the spline of frame 3/ fixed support 2 coordinates with the spline being located at fixed support 2/ travel(l)ing rest 3
Form, it is also possible to for being located at the flat key of travel(l)ing rest 3/ fixed support 2 with to be located at fixed support 2/ movable
The version of the flat key slot fit of support 3, it is also possible to for being located at travel(l)ing rest 3/ fixed support 2
The version etc. that guide rail coordinates with the guide-track groove being located at fixed support 2/ travel(l)ing rest 3.In this enforcement
In example, described keyway arrangements 61 is the spline being located at travel(l)ing rest 3 and the spline being located at fixed support 2
The version of slot fit.
In the present embodiment, described coil or magnechuck are arranged on described fixed support 2, described
Ferromagnetic component is arranged on described travel(l)ing rest 3.Described compression spring 5 one end is connected to described work
Dynamic support 3, the other end is connected to described fixed support 2.
As the embodiment of a kind of improvement, the relative distance between part or all of described probe is adjustable
Be arranged on described switching installing mechanism.So make constitute single-ended impedance test grounded probe and
Spacing between two signal probes that spacing between signal probe, composition differential impedance are tested all may be used
With the flexible in size regulation of position to be measured spacing on circuit board, to not only increase testing impedance scope,
Also make testing impedance more flexible more convenient.
On switching installing mechanism, at least three probes can be installed, as the embodiment of a kind of improvement,
In the present embodiment, described switching installing mechanism is provided with three probes, the respectively first probe 10,
Second probe 20 and the 3rd probe 30, described first probe 10 is grounded probe, described second probe
20 and described 3rd probe 30 be signal probe.Three probes are set in impedance test device, its
In one be grounded probe, two other is signal probe, by probe in test position and non-survey
Examination switches between position, it is achieved constitute single-ended when grounded probe and signal probe are in test position
During testing impedance, an other signal probe；In like manner, it is in test position structure when two signal probes
When becoming differential impedance test, grounded probe is in non-switching position and avoids connecing with circuit board to be tested
Touch, it is ensured that test result.The impedance test device of the present embodiment can realize just only arranging three probes
Single-ended impedance test can be completed and differential impedance tests two kinds of tests, compared to four ability of existing needs
Single-ended impedance test can be realized and differential impedance tests two kinds of tests, the impedance test device of the present embodiment
Number of probes can be reduced, cost-effective, and the interference of non-test probe when avoiding testing, it is ensured that survey
The accuracy of test result prevents Damage by Short Circuit measuring instrument simultaneously.
Each probe can also non-coplanar be arranged in coplanar setting, as the embodiment of a kind of improvement,
In the present embodiment, described first probe 10, described second probe 20 and described 3rd probe 30 exist
Coplanar setting in same vertical plane, described second probe 20 is arranged at described first probe 10 and described
Between 3rd probe 30, and it is positioned test position；Described first probe 10, described 3rd probe
30 can switch respectively between test position and non-test position.Wherein, Fig. 1 show the second spy
Pin 20 and the 3rd probe 30 are in test position, and the first probe 10 is in the state of non-test position；
Fig. 2 show before testing, and the first probe 10 or the 3rd probe 30 are not the most switched to non-
The state of test position.
As the embodiment of a kind of improvement, the needle point of described first probe 10, described 3rd probe 30
Needle point all tilt near described second probe 20 needle point arrange.So so that the first probe 10
Single-ended impedance test, the second probe 20 and the difference of the 3rd probe 30 composition constituted with the second probe 20
Divide testing impedance both testing impedances can realize the test in minimum spacing, improve test scope.
As the embodiment of a kind of improvement, described second probe 20 relative to described first probe 10,
Distance between described 3rd probe 30 is adjustably arranged on described switching installing mechanism.So make
Constitute the spacing between the first probe 10 and second probe 20 of single-ended impedance test, constitute difference resistance
Spacing between second probe 20 and the 3rd probe 30 of anti-test can be with treating location on circuit board
Put the flexible in size regulation of place's spacing, not only increase testing impedance scope, also make testing impedance more
The most convenient.
Realize the second probe 20 adjustable relative to the distance between the first probe the 10, the 3rd probe 30
Mode can have multiple, and as a kind of specific embodiment, described impedance test device also includes:
Driving means 7, is used for driving described second probe 20 to slide；
Second guide frame, is arranged on described switching installing mechanism, guides described second probe 20 to lean on
The most described first probe 10, slide away from described 3rd probe 30 or near described 3rd probe 30,
Slide away from described first probe 10.
In the present embodiment,
The described fixed support 2 being correspondingly arranged with described second probe 20 is sliding support；
Described sliding support one end is connected with described driving means 7 and in the position near described mounting seat 1
The place of putting is formed with chute, and the other end is provided with described second probe 20, can be in described driving means 7
Described second probe 20 of lower drive is driven to slide；
Described second guide frame is slide rail, is set in parallel in described mounting seat 1, with described chute
Coordinate and guide described second probe 20 along a direction being parallel to described mounting seat 1 near described first
Probe 10, slide away from described 3rd probe 30 or near described 3rd probe 30, away from described the
One probe 10 slides.
Specifically, in the present embodiment, described driving means 7 includes motor and leading screw, leading screw one end
Being connected with motor, the other end is threadeded with sliding support.
As the embodiment of a kind of improvement, as shown in Figure 3 and Figure 4, in described probe includes probe
Conductor 8 and the screen layer 9 being coated on outside described probe inner wire 8, described screen layer 9 is provided with conduction
Flexible member 100；
It is in the described conductive elastic component 100 on probe described in selected the two of test position respective
It is in close contact with same described conductor structure 200 respectively under the effect of elastic force.
Wherein, Fig. 4 show be in selected first probe 10 of test position and the second probe 20 with
The state that same conductor structure 200 is in close contact.
The impedance test device of the present embodiment, by described conductor structure 200, and the screen layer at probe
9 arrange conductive elastic component 100, described conductive elastic component 100 under the effect of its own resilient with lead
Body structure 200 can keep in the moment being in close contact, and makes to be in the screen of selected two probes of test position
Cover and realize good electric connection by conductor structure 200 between layer 9, high-frequency signal can be prevented effectively from
Distortion, it is ensured that the accuracy of impedance test results.
Obviously, above-described embodiment is only for clearly demonstrating example, and not to embodiment party
The restriction of formula.For those of ordinary skill in the field, the most also may be used
To make other changes in different forms.Here without also all of embodiment being given
With exhaustive.And the obvious change thus extended out or variation are still in the guarantor of the invention
Protect among scope.
Claims (17)
1. an impedance test device, it is characterised in that including:
Switching installing mechanism；
At least three probe, described probe is grounded probe or signal probe, and described probe is installed on institute
State on switching installing mechanism, and part or all of described probe is driven by described switching installing mechanism, and
Can switch between test position and non-test position；And described switching installing mechanism drives selected every time
Probe described in two is with signal probe described in one and the compound mode of another described signal probe or with described in one
The compound mode of grounded probe described in signal probe and arrives described test position, remaining non-selected institute
State probe and switch to described non-test position.
Impedance test device the most according to claim 1, it is characterised in that described probe passes through
The mode that straight line reciprocates switches between described test position and described non-test position.
Impedance test device the most according to claim 2, it is characterised in that described switching is installed
Mechanism includes:
Mounting seat (1)；
Travel(l)ing rest (3), the most described mounting seat (1) is vertically arranged and can the most described mounting seat (1)
Vertically move back and forth；Its lower end is provided with described probe；
Power set, are arranged between described mounting seat (1) and described travel(l)ing rest (3), drive
Described travel(l)ing rest (3) moves relative to described mounting seat (1).
Impedance test device the most according to claim 3, it is characterised in that described power set
Including the controlled work making described travel(l)ing rest (3) the most described mounting seat (1) move up or down
Use power apparatus；And biasing force is applied on described travel(l)ing rest (3) order about described travel(l)ing rest (3)
The bias piece moved to other direction.
Impedance test device the most according to claim 4, it is characterised in that described controlled effect
Power apparatus is calutron (4).
Impedance test device the most according to claim 5, it is characterised in that described calutron
(4) include being arranged on the coil on one of described travel(l)ing rest (3) and described mounting seat (1) or electricity
Magnetic-disc, and the ferromagnetic component being arranged on another.
7. according to the impedance test device according to any one of claim 4-6, it is characterised in that institute
The described biasing force stating bias piece is the active force tending to described test position.
Impedance test device the most according to claim 7, it is characterised in that described biasing force leads to
Cross the compression spring (5) being arranged between described travel(l)ing rest (3) and described mounting seat (1) to apply.
9. according to the impedance test device according to any one of claim 3-8, it is characterised in that institute
Stating mounting seat (1) and have fixed support (2), described fixed support (2) is provided with described activity
The movement of support (3) carries out the first guide frame (6) guided.
Impedance test device the most according to claim 9, it is characterised in that described fixed support
(2) being tubular structure, the upper end edge hole depth direction straight line of described travel(l)ing rest (3) reciprocates ground
Being inserted in the spacing hole (21) of described tubular structure, described first guide frame (6) is for being located at
State the keyway arrangements (61) between fixed support (2) and described travel(l)ing rest (3).
11. according to the impedance test device according to any one of claim 1-10, it is characterised in that
Three probes, the respectively first probe (10), the second probe (20) are installed on described switching installing mechanism
With the 3rd probe (30), described first probe (10) is grounded probe, described second probe (20)
It is signal probe with described 3rd probe (30).
12. impedance test devices according to claim 11, it is characterised in that
Described first probe (10), described second probe (20) and described 3rd probe (30) are same
Coplanar setting in one vertical plane；
Described second probe (20) is arranged at described first probe (10) and described 3rd probe (30)
Between, and it is positioned test position；Described first probe (10), described 3rd probe (30) are divided equally
Can not switch between test position and non-test position.
13. impedance test devices according to claim 12, it is characterised in that described first visits
The needle point of pin (10), the needle point of described 3rd probe (30) all tilt near described second probe (20)
Needle point arrange.
14. according to the impedance test device according to any one of claim 11-13, it is characterised in that
Described second probe (20) is relative between described first probe (10), described 3rd probe (30)
Distance be adjustably arranged on described switching installing mechanism.
15. impedance test devices according to claim 14, it is characterised in that described impedance is surveyed
Electricity testing device also includes:
Driving means (7), is used for driving described second probe (20) to slide；
Second guide frame, is arranged on described switching installing mechanism, guides described second probe (20)
Near described first probe (10), slide away from described 3rd probe (30) or visit near the described 3rd
Pin (30), away from described first probe (10) slide.
16. according to the impedance test device according to any one of claim 1-10, it is characterised in that
Relative distance between part or all of described probe is adjustably arranged on described switching installing mechanism.
17. according to the impedance test device according to any one of claim 1-16, it is characterised in that
Described probe includes probe inner wire (8) and is coated on described probe inner wire (8) screen outward
Covering layer (9), described screen layer (9) is provided with conductive elastic component (100)；
The described conductive elastic component (100) being on probe described in selected the two of test position is each
Elastic force effect under respectively with same described conductor structure (200) be in close contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610463590.0A CN105938160B (en) | 2016-06-23 | 2016-06-23 | Impedance test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610463590.0A CN105938160B (en) | 2016-06-23 | 2016-06-23 | Impedance test device |
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| Publication Number | Publication Date |
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| CN105938160A true CN105938160A (en) | 2016-09-14 |
| CN105938160B CN105938160B (en) | 2019-02-12 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201610463590.0A Active CN105938160B (en) | 2016-06-23 | 2016-06-23 | Impedance test device |
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| CN107219398A (en) * | 2017-05-02 | 2017-09-29 | 广东长盈精密技术有限公司 | resistance testing device |
| CN107315099A (en) * | 2017-08-01 | 2017-11-03 | 南京协辰电子科技有限公司 | Probe switching device and PCB testing impedance machines |
| CN107909951A (en) * | 2017-11-14 | 2018-04-13 | 合肥鑫晟光电科技有限公司 | A kind of panel tester |
| CN108089037A (en) * | 2016-11-11 | 2018-05-29 | 弗兰克公司 | Magnetic coupling is grounded reference probe |
| CN108427043A (en) * | 2017-02-13 | 2018-08-21 | 华邦电子股份有限公司 | Rotary type tower test equipment and its rotary type tower test method |
| CN109581007A (en) * | 2018-12-27 | 2019-04-05 | 南京协辰电子科技有限公司 | Double probe system and printed circuit board detection device |
| CN109633273A (en) * | 2018-11-30 | 2019-04-16 | 上海无线电设备研究所 | One kind being used for open-cell load impedance test macro and its method |
| CN109916554A (en) * | 2019-02-22 | 2019-06-21 | 武汉飞帛丝科技有限公司 | A kind of hand-held pressure sensing performance detection apparatus |
| CN110320488A (en) * | 2018-03-29 | 2019-10-11 | 罗德施瓦兹两合股份有限公司 | Test arrangement and test method |
| CN110716119A (en) * | 2018-07-11 | 2020-01-21 | 深南电路股份有限公司 | Circuit board electrical property testing arrangement |
| CN111579125A (en) * | 2020-06-10 | 2020-08-25 | 江苏安科瑞电器制造有限公司 | Bus duct temperature measuring device capable of adjusting probe spacing |
| CN112611916A (en) * | 2019-10-04 | 2021-04-06 | 旺矽科技股份有限公司 | Adjustable probe device for testing impedance of circuit board |
| CN115015603A (en) * | 2022-05-20 | 2022-09-06 | 迪赛康科技(深圳)有限公司 | Bandwidth 40G interval adjustable differential probe |
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| CN110716119A (en) * | 2018-07-11 | 2020-01-21 | 深南电路股份有限公司 | Circuit board electrical property testing arrangement |
| CN109633273B (en) * | 2018-11-30 | 2021-06-04 | 上海无线电设备研究所 | Open-hole load impedance test system and method |
| CN109633273A (en) * | 2018-11-30 | 2019-04-16 | 上海无线电设备研究所 | One kind being used for open-cell load impedance test macro and its method |
| CN109581007A (en) * | 2018-12-27 | 2019-04-05 | 南京协辰电子科技有限公司 | Double probe system and printed circuit board detection device |
| CN109916554A (en) * | 2019-02-22 | 2019-06-21 | 武汉飞帛丝科技有限公司 | A kind of hand-held pressure sensing performance detection apparatus |
| CN112611916A (en) * | 2019-10-04 | 2021-04-06 | 旺矽科技股份有限公司 | Adjustable probe device for testing impedance of circuit board |
| CN112611916B (en) * | 2019-10-04 | 2024-09-03 | 旺矽科技股份有限公司 | Adjustable probe device for testing impedance of circuit board |
| CN111579125A (en) * | 2020-06-10 | 2020-08-25 | 江苏安科瑞电器制造有限公司 | Bus duct temperature measuring device capable of adjusting probe spacing |
| CN115015603A (en) * | 2022-05-20 | 2022-09-06 | 迪赛康科技(深圳)有限公司 | Bandwidth 40G interval adjustable differential probe |
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