CN102288826A - Impedance probe head with two-in-one characteristic - Google Patents
Impedance probe head with two-in-one characteristic Download PDFInfo
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Abstract
The invention discloses an impedance probe head with a two-in-one characteristic. The probe head comprises a shell and an impedance circuit board arranged in the shell, wherein the impedance circuit board is provided with probe needles A, B and G extending out the shell; the probe needle A and the probe needle B are respectively connected with a differential signal line A and a differential signal line B; the differential signal line A and the differential signal line B are arranged on the impedance circuit board; the probe needle G is connected with a ground plane; differential impedance lines are formed by the differential signal line A, the differential signal line B and the ground plane; the differential signal line A and the differential signal line B are separated through the ground plane; a single-terminal impedance line is formed by random one of the differential signal line A and the differential signal line B with the ground plane together; a single-terminal impedance test probe head is formed by each one of the probe needle A and the probe needle B with the probe needle G together; a differential impedance test probe head is formed by the probe needle A, the probe needle B with the probe needle G together; and an SMA(Sub-Miniature-A)interface connected with the impedance circuit board is arranged on the shell. The probe head provided by the invention has a two-in-one function, so that the measurement efficiency is increased, the service life is prolonged, and the measurement accuracy is ensured.
Description
Technical field
The invention belongs to PCB industry circuit board impedance measurement field.Relate to a kind of impedance probe, specifically a kind of two-in-one characteristic impedance probe.
Can be used for time domain reflectometry (TDR) impedance measuring equipment, as the CITS500 of POLAR company, the CITS800 impedometer; Tyke DSA8200 numeral serial sampling oscilloscope.
Background technology
Characteristic impedance is meant high-frequency signal or electromagnetic wave in transmission course, the ratio of the capable wave voltage of any point and travelling wave current on the transmission line.The resistance that popular saying is subjected to when being high-frequency signal or electromagnetic wave propagation, it is an electrical impedance, Xc, the vector that inductance is anti-and.Usually characteristic impedance is divided into single-ended (Single ended) impedance and two kinds of patterns of difference (Differential) impedance at present.
Use two time domain reflectometry (TDR) impedance measuring equipments that resolution is different, the test result that when the same transmission lines of test, obtains.The reflection difference that two equipment changes transmission line impedance, one obviously and another is not obvious.The discontinuous resolution of TDR apparatus senses transmission line impedance depends primarily on the speed of the step signal rise time that TDR equipment sends, and the fast rise time can obtain high resolving power.And often the bandwidth with test macro is relevant the rise time of TDR equipment, and the test macro that bandwidth is high has faster rise time.
The TDR Test equipment principle: domain reflectometer is the most frequently used instrument of test printed board characteristic impedance.Lab investigation have the digital serial sampling oscilloscope of Imtech with the Analysis of characteristic impedance instrument, exemplary apparatus model: DSA8200 numeral serial sampling oscilloscope; DSA8200 numeral serial sampling oscilloscope major function is to provide kilomegabit transmitter and signal path calibrating and consistency check synthesis tool for communication, computing machine and consumer electronics.The TDR Test module of configuration has the 50GHZ bandwidth, the reflection rise time of 15ps, and the incident rise time of 12ps, the characteristics that noise is little, operating parameter is many, and professional requirement is high, is fit to the scientific research institutions laboratory and uses.New 80E10 and the long-range sampler system of releasing of the integrated independent two-channel 2-4 rice of 80E08TDR module reduced the anchor clamps influence to greatest extent.
Compare Tyke DSA8200 numeral serial sampling oscilloscope operation automation deficiency with CITS500.Characteristic impedance measuring equipment commonly used is the CITS series impedance measurement system of POLAR company on the PCB industry production line.Exemplary apparatus model: CITS500, CITS800.
CITS500 provides single-ended and the difference measurement function, and band is used for two passages that flexible probe connects.The CITS impedance test system uses very simple and convenient.Make all test assignments realize robotizations based on the powerful software of Windows, click mouse or step on that foot-switch is the whole process of may command.You only need to determine the position of little tape test probe, select a test file that comprises conventional PCB test impedance and tolerance, step on foot-switch then and get final product.Do not need as DSA8200, to carry out any adjusting, for example be provided with vertical gain value, pulse delay value and the time base value.
CITS800 can automatically perform a series of testing impedances, points out you to redefine the position of test probe in case of necessity.The CITS automatic data processing clear shows the characteristic impedance that becomes with distance, provides by/status of fail.
The characteristic impedance probe is that impedance measurement signal is delivered to the last leg of to be measured (DUT), the accuracy that its performance is measured the final decision characteristic impedance.
The core design of characteristic impedance probe is complete transmission measuring-signal, therefore requires impedance matching, and it is little to insert loss, postpones for a short time, and contact reliably.
Different DUT, resistance value are also different, and common DUT resistance value is 50 ohm of single-ended impedance at present, 100 ohm of differential impedances; Single-ended impedance value scope: 25-100 ohm, differential impedance value scope 50-200 ohm.
Strict testing impedance requires DUT resistance value and probe impedance value in full accord, and in fact the wide region of the resistance value of DUT makes probe designs can not accomplish that impedance mates fully.Generally speaking, according to measurement range, single-ended probe has 28,50, and 75 ohm of three kinds of probes can be selected, and difference detector has 50,100, can select for 150 ohm.The most frequently used probe is 50 ohm single-ended probes, 100 ohm of difference detectors.For example, the single-ended probe model of DSA8200 is that P8018, difference detector model are P80318.The single-ended probe model of CITS500 is IP-50, and the difference detector model is IP-100; Also promising memory control is made the specific model of the system of deciding through consultation, as the single-ended probe of IP-28, and 28 ohm of resistance values.
When design for Characteristic Impedance, realize single-ended 50 ohm separately, 100 ohm of difference, relatively easy, but realize single-ended then very difficult simultaneously with differential impedance value coupling.According to SI8000 impedance computation scheme as can be known, difference 100 ohmage cablings, the resistance value of its every single-ended cabling can not satisfy 50 ohm ± 1% error requirements about 52-54 ohm.Reason is that the interaction between the differential impedance cabling makes the differential impedance value less than two single-ended impedance value sums.Must eliminate the interaction between the differential impedance line, could satisfy simultaneously single-ended 50, the requirement that difference is 100 ohm.
The single-ended probe of POLAR company and difference detector are separately designs.Conventional single-ended probe is the IP-50 probe for example, and requiring the probe characteristic impedance is 50 ohm ± 1%, the even metapole of circuit.Conventional differential impedance probe is as the IP-100 probe, and requiring differential impedance is 100 ohm ± 1%, the even metapole of circuit.Difference detector IP-100 has a pair of differential signal line, and actual the use found: one of them constitutes single-ended impedance with ground level and pops one's head in to use this a pair of signal wire, can be used for measuring single-ended impedance.But problem is the single-ended impedance of two signal wires of this difference detector is not 50 ohm of standard, and the general little 2-5 ohm of single-ended impedance can not satisfy the accuracy requirement of single-ended impedance probe, and measuring result error is big.
Characteristic impedance is divided into two kinds of single-ended impedance and differential impedances again.The instrument of measurement characteristics impedance mainly contains the CITS series impedance instrument of POLAR company.As CITS500S, CITS800, CITS900 etc.This series instrument is supporting to have single-ended impedance probe and differential impedance to visit first two.Measure dissimilar impedance line plates and need switch different probes.The different probe of frequent switching need load and unload probe and cable, and its SMA interface is had tangible wearing and tearing, and the time is not long, will cause that the signal transmission is bad, causes measuring accuracy to descend.
If can realize single-ended impedance 50 ohm ± 1%, differential impedance is 100 ohm ± 1% target simultaneously, just can produce two-in-one probe.
Summary of the invention
Purpose of the present invention provides a kind of isolation two-in-one impedance probe.This probe is on the basis of differential impedance probe the differential impedance line have been implemented Isolated Shield, guarantee to keep independent transmission between differential signal, coupling is few to can ignoring, so differential impedance is the twice of its single-ended impedance, can satisfy and do the requirement that differential impedance is popped one's head in and single-ended impedance is popped one's head in respectively.Impedance probe of the present invention has concurrently single-ended and the differential impedance function, switches two kinds of processs of measurement during use and gets final product, and is convenient, need not to increase instrument channel.
The objective of the invention is to be achieved through the following technical solutions:
A kind of two-in-one characteristic impedance probe, it is characterized in that: this probe comprises shell and places the interior impedance circuit plate of shell, on the impedance circuit plate, be provided with the first probe A, the second probe B and the 3rd probe G that stretch out shell, the first probe A and the second probe B respectively with the impedance circuit plate on differential signal line A be connected with differential signal line B, the 3rd probe G is connected with ground level; Differential signal line A, differential signal line B and ground level constitute the differential impedance line; Isolate by ground level between differential signal line A and differential signal line B; Any one among differential signal line A and the differential signal line B all constitutes the single-ended impedance line jointly with ground level; Any one among the first probe A and the second probe B all constitutes the single-ended impedance test probe jointly with the 3rd probe G, and the first probe A, the second probe B and the 3rd probe G constitute the differential impedance test probe jointly; On shell, be provided with the SMA interface that is connected with the impedance circuit plate.
Among the present invention, the plane isolator between differential signal line A and the differential signal line B links to each other by through hole with the ground level at the back side, and through-hole spacing is not more than 10mm, diameter 0.1mm-1mm.Differential signal line A is identical with spacing between the differential signal line B on the impedance circuit plate.
Among the present invention, the material of the first probe A, the second probe B and the 3rd probe G is a copper, surface gold-plating, golden layer thickness 0.3-10um.
Because the differential impedance of a pair of differential lines of difference detector is 100 ohm ± 1%, but because there is not the signal shielding design, the resistance value of every single-ended cabling is subjected to the coupling influence of the single-ended cabling of another root, causes the single-ended impedance value to descend.Have only the coupling of shielding sort signal, could stop impedance to descend, therefore, signal shielding is the key that realizes two-in-one impedance probe.
The present invention has implemented Isolated Shield to the differential impedance line on the basis of differential impedance probe.The advantage of this shielding construction is to guarantee to keep independent transmission between differential signal, and coupling is few to ignoring.Like this, differential impedance is the twice of its single-ended impedance, just can satisfy the requirement of doing differential impedance probe and single-ended impedance probe respectively.
Compared with prior art, the present invention has adopted two-in-one impedance probe, and an impedance probe has concurrently single-ended and the differential impedance function, switches two kinds of processs of measurement during use and gets final product, and is convenient, need not to increase instrument channel, promoted efficiency of measurement; Need not switch probe and cable during the handover measurement pattern, prolong the serviceable life of probe and cable; The present invention reduces at interval the distortion that impedance point of discontinuity closely causes, guarantees measuring accuracy.
The present invention is simultaneously integrated single-ended impedance test function and differential impedance test function on same probe, with the TDR(time domain reflectometry) the testing impedance coordinative composition of equipments uses, and is applied to the characteristic impedance fields of measurement of printed circuit board circuit.
Description of drawings
Fig. 1 is a profile synoptic diagram of the present invention.
Fig. 2 is the first probe A and the scheme of installation of the second probe B on the impedance circuit plate among the present invention.
Fig. 3 is the schematic cross-section of Fig. 2.
Fig. 4 is the assembly drawing of the first probe A among the present invention, the second probe B and the 3rd probe G.
Embodiment
A kind of two-in-one characteristic impedance probe of the present invention is seen Fig. 1 to Fig. 4, and this probe comprises shell 1 and the impedance circuit plate 2 that places in the shell 1, is provided with the first probe A, the second probe B and the 3rd probe G that stretch out shell 1 on impedance circuit plate 2.The first probe A and the second probe B respectively with impedance circuit plate 2 on differential signal line A be connected with differential signal line B, the 3rd probe G is connected with ground level; Differential signal line A, differential signal line B and ground level constitute the differential impedance line; Isolate by ground level 4 between differential signal line A and differential signal line B; Any one among differential signal line A and the differential signal line B all constitutes the single-ended impedance line jointly with ground level; Any one among the first probe A and the second probe B all constitutes the single-ended impedance test probe jointly with the 3rd probe G, and the first probe A, the second probe B and the 3rd probe G constitute the differential impedance test probe jointly; On shell, be provided with two SMA interfaces 3 that are connected with the impedance circuit plate.
Plane isolator between differential signal line A and the differential signal line B links to each other by through hole 5 with the ground level at the back side, and through-hole spacing is not more than 10mm, diameter 0.1mm-1mm.Differential signal line A is identical with spacing between the differential signal line B on the impedance circuit plate.
Impedance design: design 2 50 ohm single-ended impedance line, structure is surperficial microstrip line, as shown in Figure 2.Impedance line A and impedance line B design resistance value are 50 ohm.
Shielding Design:, be provided with the ground level isolated vias between the B at A.Sectional view as shown in Figure 3.
Probe design: the probe assembly drawing as shown in Figure 4.Through actual test, probe only needs to install 1 grounded probe.The advantage of this design is that the probe contraposition is more convenient, and the result is also more stable; Reduced simultaneously between probe owing to the inaccurate probability that damages of contraposition.
The material of probe is extremely important, adopts gold-plated scheme can guarantee that probe uses for a long time.The material of the first probe A, the second probe B and the 3rd probe G is copper, surface gold-plating, golden layer thickness 0.3-10um.
The SMA Interface design: at A, the B passage is provided with the SMA interface.Two SMA interfaces are connected altogether with the impedance circuit plate of probe, insert loss 0-3db, representative value 2db, standing-wave ratio (SWR) 1.0-1.2, representative value 1.1 under the 18GHZ survey frequency.
Board design: realize a impedance circuit plate, dual platen, the electroplates in hole designs a pair of characteristic impedance line that ground screen is arranged.Both sides and middle shielding ground connect with through hole, and through hole of every 10mm, through hole bore cutter diameter 300um, are paved with whole coupon length (except the windowed regions), and the both sides grounding through hole distributes near impedance line one side.Constitute differential impedance over the ground by a pair of characteristic impedance line, the differential impedance value requires: 100 ± 1 ohm, need satisfy single characteristic impedance value requirement simultaneously: 50 ± 0.5 ohm.
Parameter is as follows: circuit board gross thickness 1.4mm.Differential signal pad acquiescence center distance 5.08mm.Signals layer: the unification of dual-mouth end signal line pad is of a size of 1.5*4mm, and the ground pads unification is of a size of 1.5*4mm.Single deck tape-recorder mouth end signal line pad is unified size 1.5*8mm.The ground pads unification is of a size of 1.5*8mm.Signal wire deflection angle 45 degree.
The probe assembling:
As shown in Figure 1, measuring sonde comprises shell 1, place the circuit board 2 in the shell 1, probe A, the B, the G that place 3,3 SMA interfaces on shell 1 interior circuit board to be parallel to each other are installed on the circuit board, needle point reaches outside the shell, A, B probe are installed on the signal face pad, and on the ground pad that is installed in circuit board of G probe, solder pad space length is set by the dimensional requirement of testing sample DUT.Two SMA interfaces are connected altogether with the impedance circuit plate of probe, insert loss 0-3db, representative value 2db, standing-wave ratio (SWR) 1.0-1.2, representative value 1.1 under the 18GHZ survey frequency.
The installing space of probe is provided with the spacing of testing sample DUT and changes.Representative value: A, B pin centre distance 5.08mm, A, G pin vertical centre spacing 2.54mm, horizontal center distance 2.54mm.Among Fig. 4, the G pin is represented the ground level pin, A, B pin representation signal pin.A, G pin constitute the single-ended impedance probe, A, and B, G pin constitute the differential impedance probe.When measuring differential impedance, with A, B, G pin insert corresponding position, hole measurement and get final product.During the measurement characteristics impedance.With A, the G pin inserts corresponding position, hole and measures, and B cushion room aside gets final product.
The present invention has adopted two-in-one impedance probe, and an impedance probe has concurrently single-ended and the differential impedance function, switches two kinds of processs of measurement during use and gets final product, and is convenient, need not to increase instrument channel.
Claims (5)
1. a two-in-one characteristic impedance is popped one's head in, it is characterized in that: this probe comprises shell (1) and places the interior impedance circuit plate (2) of shell (1), on impedance circuit plate (2), be provided with the first probe A, the second probe B and the 3rd probe G that stretch out shell (1), the first probe A and the second probe B respectively with impedance circuit plate (2) on differential signal line A be connected with differential signal line B, the 3rd probe G is connected with ground level; Differential signal line A, differential signal line B and ground level constitute the differential impedance line; Isolate by ground level (4) between differential signal line A and differential signal line B; Any one among differential signal line A and the differential signal line B all constitutes the single-ended impedance line jointly with ground level; Any one among the first probe A and the second probe B all constitutes the single-ended impedance test probe jointly with the 3rd probe G, and the first probe A, the second probe B and the 3rd probe G constitute the differential impedance test probe jointly; On shell (1), be provided with the SMA interface (3) that is connected with impedance circuit plate (2).
2. two-in-one characteristic impedance probe according to claim 1, it is characterized in that: the plane isolator between differential signal line A and the differential signal line B links to each other by through hole (5) with the ground level at the back side, through hole (3) spacing is not more than 10mm, diameter 0.1mm-1mm.
3. two-in-one characteristic impedance probe according to claim 1 is characterized in that: it is identical with spacing between the differential signal line B that impedance circuit plate (2) is gone up differential signal line A.
4. two-in-one characteristic impedance probe according to claim 1, it is characterized in that: the material of the first probe A, the second probe B and the 3rd probe G is a copper, surface gold-plating, golden layer thickness 0.3-10um.
5. two-in-one characteristic impedance probe according to claim 1, it is characterized in that: described SMA interface (3) is two, all is connected with impedance circuit plate (2).
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| CN 201110264802 CN102288826B (en) | 2011-09-08 | 2011-09-08 | Impedance probe head with two-in-one characteristic |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105911355A (en) * | 2016-05-31 | 2016-08-31 | 南京协辰电子科技有限公司 | Probe device for impedance detection |
| CN105938160A (en) * | 2016-06-23 | 2016-09-14 | 南京协辰电子科技有限公司 | Impedance test apparatus |
| CN108957059A (en) * | 2017-05-18 | 2018-12-07 | 罗德施瓦兹两合股份有限公司 | For detecting dynamic probes, dynamic measurement system and the method for dynamic data signal |
| CN110320488A (en) * | 2018-03-29 | 2019-10-11 | 罗德施瓦兹两合股份有限公司 | Test arrangement and test method |
| CN113252985A (en) * | 2021-07-16 | 2021-08-13 | 深圳市迅特通信技术股份有限公司 | Measuring device and measuring method for measuring impedance of high-speed signal line in optical module |
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| KR20040056103A (en) * | 2002-12-23 | 2004-06-30 | 삼성전기주식회사 | Probe divice for measuring differential impedance |
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| CN101672874A (en) * | 2009-09-23 | 2010-03-17 | 深圳市博敏电子有限公司 | Microstrip transmission line impedance parameter test method |
| CN202256606U (en) * | 2011-09-08 | 2012-05-30 | 南京工业职业技术学院 | Two-in-one characteristic impedance probe |
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| KR20040056103A (en) * | 2002-12-23 | 2004-06-30 | 삼성전기주식회사 | Probe divice for measuring differential impedance |
| JP2004257830A (en) * | 2003-02-25 | 2004-09-16 | Fujikura Ltd | Adaptor for measurement |
| CN101672874A (en) * | 2009-09-23 | 2010-03-17 | 深圳市博敏电子有限公司 | Microstrip transmission line impedance parameter test method |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105911355A (en) * | 2016-05-31 | 2016-08-31 | 南京协辰电子科技有限公司 | Probe device for impedance detection |
| CN105911355B (en) * | 2016-05-31 | 2018-11-09 | 南京协辰电子科技有限公司 | A kind of probe apparatus of impedance detection |
| CN105938160A (en) * | 2016-06-23 | 2016-09-14 | 南京协辰电子科技有限公司 | Impedance test apparatus |
| CN105938160B (en) * | 2016-06-23 | 2019-02-12 | 南京协辰电子科技有限公司 | Impedance test device |
| CN108957059A (en) * | 2017-05-18 | 2018-12-07 | 罗德施瓦兹两合股份有限公司 | For detecting dynamic probes, dynamic measurement system and the method for dynamic data signal |
| CN108957059B (en) * | 2017-05-18 | 2022-05-03 | 罗德施瓦兹两合股份有限公司 | Dynamic probe, dynamic measurement system and method for probing dynamic data signals |
| CN110320488A (en) * | 2018-03-29 | 2019-10-11 | 罗德施瓦兹两合股份有限公司 | Test arrangement and test method |
| CN113252985A (en) * | 2021-07-16 | 2021-08-13 | 深圳市迅特通信技术股份有限公司 | Measuring device and measuring method for measuring impedance of high-speed signal line in optical module |
| CN113252985B (en) * | 2021-07-16 | 2021-10-01 | 深圳市迅特通信技术股份有限公司 | Measuring device and measuring method for measuring impedance of high-speed signal line in optical module |
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| CN102288826B (en) | 2013-06-05 |
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