CN105938160B - Impedance test device - Google Patents
Impedance test device Download PDFInfo
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- CN105938160B CN105938160B CN201610463590.0A CN201610463590A CN105938160B CN 105938160 B CN105938160 B CN 105938160B CN 201610463590 A CN201610463590 A CN 201610463590A CN 105938160 B CN105938160 B CN 105938160B
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- probe
- impedance
- test
- test device
- movable support
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
Abstract
Impedance test device provided by the invention, comprising: switching installing mechanism；At least three probes, the probe are grounded probe or signal probe, and the probe is installed on the switching installing mechanism, and partly or entirely the probe is driven by the switching installing mechanism, and can be switched between test position and non-test position；And the switching installing mechanism drive selected two probes with the combination of a signal probe and another signal probe or with the combination of a signal probe and the grounded probe arrival test position every time, remaining is non-to be chosen the probe and switches to the non-test position.Above-mentioned impedance test device, when may be implemented in using selected two probes progress testing impedance, non- selected probe is far from circuit board under test and then avoids contacting elsewhere with circuit board under test, interference will not be generated to test, guarantee the accuracy of test result, while preventing from causing short circuit and damaging measuring instrument.
Description
Technical field
The present invention relates to testing impedance technical fields, and in particular to a kind of impedance test device.
Background technique
With being constantly progressive for the communication technology, traffic rate is higher and higher, and more and more users propose pcb board cabling
The requirement of impedance control and signal frequency.Testing impedance generally includes single-ended impedance test and differential impedance test, wherein single-ended
Testing impedance is generally tested by single-ended impedance probe assembly, and differential impedance test generally passes through differential impedance probe groups
Part is tested.The single-ended impedance probe assembly generally includes a signal probe and a grounded probe, the difference
Impedance probe component generally includes two signal probes.
Since the testing impedance for carrying out different needs to switch different impedance probe components, existing testing impedance
Device generally includes four probes, respectively three signal probes and a grounded probe, and it is poor that two of them signal probe is constituted
Divide probe assembly, a signal probe and a grounded probe constitute single-ended probe assembly.Although this impedance test device was both
There is single-ended probe assembly that can carry out single-ended impedance test, and have differential probe component that can carry out differential impedance test, still
It is easily interfered with each other between two kinds of probe assemblies in test, influences test result, and the probe for including is more, use cost is high.
Chinese patent literature CN102288826B discloses a kind of impedance probe head with two-in-one characteristic, including shell and is placed in outer
Impedance circuit plate in shell, impedance circuit plate are equipped with the first probe, the second probe and the third probe for stretching out shell, and first visits
Needle and the second probe are connect with two differential signal lines on impedance circuit plate respectively, are signal probe, third probe and Horizon
Face connection is grounded probe, and any one in the first probe and the second probe collectively forms single-ended impedance with third probe
Test probe, the first probe, the second probe and third probe collectively form differential impedance test probe.Although the prior art exists
Single-ended impedance test function and differential impedance test function are integrated with simultaneously on the same probe, but when using the first probe and the
One of them of two probes pops one's head in when carrying out single-ended impedance test, not used with the composition single-ended impedance test of third probe
That probe is due to being in test position together with two probes are used, thus easily contacted elsewhere with impedance circuit plate,
Test is interfered, influences test result, or even cause short circuit, measuring instrument is caused to be damaged；When use the first probe, second
Differential impedance that probe and third probe collectively form test probe is come when carrying out differential impedance test, it is only necessary to the first probe and
Differential impedance test can be completed in the two differential signal probes of second probe, if needing to make third using third probe
Probe keeps ground connection；But in the prior art, the relative positional relationship of three probes remains constant, so making
It is contacted with the first probe and the second probe with the corresponding position on circuit board when carrying out differential impedance test, third probe and second
Probe, third probe be in test position together, still easily contacts with impedance circuit plate, interferes test elsewhere,
Test result is influenced, or even causes short circuit, measuring instrument is caused to be damaged.
Summary of the invention
Therefore, the technical problem to be solved in the present invention is that overcome tool in the prior art there are three and the above probe resistance
Anti- test device when carrying out a kind of testing impedance using two of them needle, not by that used by probe easily to testing impedance into
Row is interfered, and test result is influenced, or even the defect for causing short circuit that measuring instrument is caused to be damaged, to provide a kind of when using wherein
When two needles carry out a kind of testing impedance, not by that used by probe will not to testing impedance generate interference, test result compared with
Accurately, not will cause short circuit tool there are three and the above probe impedance test device.
A kind of impedance test device of the invention, comprising:
Switch installing mechanism；
At least three probes, the probe are grounded probe or signal probe, and the probe is installed on the switching installation
In mechanism, and partly or entirely the probe is driven by the switching installing mechanism, and can be in test position and non-test position
Between switch；And the switching installing mechanism drives selected two probes with a signal probe and another letter every time
The combination of number probe reaches the test position with the combination of a signal probe and a grounded probe,
Remaining is non-to be chosen the probe and switches to the non-test position.
The probe switches between the test position and the non-test position in such a way that straight line moves back and forth.
The switching installing mechanism includes:
Mounting base；
Movable support, the relatively described mounting base be vertically arranged and can the relatively described mounting base move back and forth along the vertical direction；
Its lower end is equipped with the probe；
Power device is arranged between the mounting base and the movable support, drives the movable support relatively described
Mounting base is mobile.
The power device includes the controllable effect for moving up or down the relatively described mounting base of the movable support
Power device；And biasing force is applied to the bias piece for driving the movable support mobile to other direction on the movable support.
The controllable force device is calutron.
The calutron includes the coil or magnechuck being arranged on one of the movable support and the mounting base,
And the ferromagnetic component on another is set.
The biasing force of the bias piece is the active force for tending to the test position.
The biasing force passes through the compression spring being arranged between the movable support and the mounting base and applies.
The mounting base has fixed bracket, and the fixed bracket, which is provided with, is oriented to the movement of the movable support
The first guide frame.
The fixed bracket is tubular structure, and the upper end edge hole depth direction straight line of the movable support plugs with moving back and forth
In in the limit hole of the tubular structure, first guide frame is between the fixed bracket and the movable support
Keyway arrangements.
Three probes, respectively the first probe, the second probe and third probe, institute are installed on the switching installing mechanism
Stating the first probe is grounded probe, and second probe and the third probe are signal probe.
First probe, second probe and the third probe are coplanar in same vertical plane；
Second probe is set between first probe and the third probe, and is positioned at test position；Institute
Stating the first probe, the third probe can switch between test position and non-test position respectively.
The needle point of first probe, the third probe needle point tilt the needle point close to second probe and set
It sets.
Second probe is adjustably arranged in described relative to the distance between first probe, the third probe
Switch on installing mechanism.
The impedance test device further include:
Driving device, for driving second probe to slide；
Second guide frame is set on the switching installing mechanism, and second probe is guided to visit close to described first
Needle is slided far from third probe sliding or close to the third probe, far from first probe.
Relative distance between the part or all of probe is adjustably arranged on the switching installing mechanism.
The probe includes probe inner conductor and the shielded layer that is coated on outside the probe inner conductor, is set on the shielded layer
There is conductive elastic component；
The conductive elastic component on selected two probes in test position is under the action of respective elastic force
It is in close contact respectively with the same conductor structure.
Technical solution of the present invention has the advantages that
1. impedance test device provided by the invention, comprising: switching installing mechanism；At least three probes, the probe are
Grounded probe or signal probe, the probe are installed on the switching installing mechanism, and the part or all of probe is by institute
Switching installing mechanism driving is stated, and can be switched between test position and non-test position；And the switching installing mechanism is each
Drive selected two probes with a signal probe with the combination of another signal probe or with a signal
The combination of probe and a grounded probe reaches the test position, remaining is non-be chosen the probe switch to it is described non-
Test position.Above-mentioned impedance test device, when needing to carry out testing impedance with selected two probes, it is only necessary to make selected two to visit
Needle is in test position, and non-selected probe is switched to non-test position, can be realized and is carrying out impedance using selected two probes
When test, non-selected probe is far from circuit board under test and then avoids contacting elsewhere with circuit board under test, will not be to survey
The raw interference of test manufacture, guarantees the accuracy of test result, while preventing from causing short circuit and damaging measuring instrument.
2. impedance test device provided by the invention, the switching installing mechanism includes: mounting base；Movable support, relatively
The mounting base be vertically arranged and can the relatively described mounting base move back and forth along the vertical direction；Its lower end is equipped with the probe；
Power device is arranged between the mounting base and the movable support, and the relatively described mounting base of the movable support is driven to move
It is dynamic.Above-mentioned switching installing mechanism is installed on the probe of movable support in test position and non-test position by power device control
Switching between setting, structure is simple, easy to operate, and switching state is stablized.
3. impedance test device provided by the invention, the biasing force is by being arranged in the movable support and the installation
Compression spring between seat applies.Compression spring can have both in probe test to probe while applying the biasing force
Buffer function, prevent the contact between probe and circuit board really up to the mark and damage circuit board.
4. impedance test device provided by the invention, the mounting base has fixed bracket, and the fixed bracket is provided with
The first guide frame that the movement of the movable support is oriented to.First guiding mechanism can be with boot activity bracket vertical
Direction straight line moves back and forth.
5. impedance test device provided by the invention, three probes are installed on the switching installing mechanism, respectively
One probe, the second probe and third probe, first probe are grounded probe, and second probe and the third probe are equal
For signal probe.Three probes are set in impedance test device, wherein one is grounded probe, other two is signal spy
Needle is realized by switching between test position and non-test position to probe when grounded probe is in signal probe
When test position constitutes single-ended impedance test, an other signal probe；Similarly, when two signal probes are in test position structure
When testing at differential impedance, grounded probe is in non-switching position and avoids and circuit board contacts to be tested, guarantee test knot
Fruit.Only three probes of setting, which may be implemented, in impedance test device of the invention can complete single-ended impedance test and differential impedance
Two kinds of tests are tested, need four to be just able to achieve two kinds of tests of single-ended impedance test and differential impedance test compared to existing, this
The impedance test device of invention can reduce number of probes, save the cost, and when avoiding test non-test probe interference, guarantee
The accuracy of test result prevents Damage by Short Circuit measuring instrument simultaneously.
6. impedance test device provided by the invention, the needle point of first probe, the third probe needle point incline
Lean to the needle point setting of nearly second probe.The single-ended impedance that the first probe and the second probe can be made to constitute in this way is surveyed
The differential impedance that examination, the second probe and third probe are constituted, which tests both testing impedances, can realize inspection in minimum spacing
It surveys, improves detection range.
7. impedance test device provided by the invention, second probe is visited relative to first probe, the third
The distance between needle is adjustably arranged on the switching installing mechanism.Make the first probe for constituting single-ended impedance test in this way
And second spacing between probe, the spacing that constitutes between the second probe and third probe of differential impedance test can be with electricity
The flexible in size of spacing is adjusted at position to be measured on the plate of road, is not only increased testing impedance range, is also made testing impedance cleverer
Work is more convenient.
8. impedance test device provided by the invention, the probe includes that probe inner conductor and being coated in the probe is led
External shielded layer, the shielded layer are equipped with conductive elastic component；Institute on selected two probes in test position
Conductive elastic component is stated to be in close contact with the same conductor structure respectively under the action of respective elastic force.Impedance of the invention
Conductive elastic component is arranged by the conductor structure, and in the shielded layer of probe in test device, and the conductive elastic component exists
It can keep being in close contact constantly with conductor structure under the action of own resilient, make selected two probes in test position
Good electric connection is realized by conductor structure between shielded layer, it is possible to prevente effectively from high-frequency signal is distorted, guarantees testing impedance
As a result accuracy.
Detailed description of the invention
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution in the prior art
Embodiment or attached drawing needed to be used in the description of the prior art be briefly described, it should be apparent that, it is described below
Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor
It puts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is the main view of the impedance test device provided in the first embodiment of the invention；
Fig. 2 is the main view of another state of impedance test device shown in FIG. 1；
Fig. 3 is that a wherein probe in test position for impedance test device shown in FIG. 1 is contacted with conductor structure
Side view cutaway drawing；
Fig. 4 is the main view section view that the first probe, the second probe of impedance test device shown in FIG. 1 are contacted with conductor structure
Figure；
Description of symbols:
1- mounting base, the fixed bracket of 2-, 21- limit hole, 3- movable support, 4- calutron, 5- compression spring, 6- first
Guide frame, 61- keyway arrangements, 7- driving device, 8- probe inner conductor, 9- shielded layer, the first probe of 10-, 20- second are visited
Needle, 30- third probe, 100- conductive elastic component, 200- conductor structure.
Specific embodiment
Technical solution of the present invention is clearly and completely described below in conjunction with attached drawing, it is clear that described implementation
Example is a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, ordinary skill
Personnel's every other embodiment obtained without making creative work, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that term " first ", " second ", " third " are used for description purposes only,
It is not understood to indicate or imply relative importance.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation " " connects
Connect " it shall be understood in a broad sense, for example, it may be being fixedly connected, it may be a detachable connection, or be integrally connected；It can be machine
Tool connection, is also possible to be electrically connected；It can be and be directly connected to, can also be indirectly connected with by intermediary, can be two members
Connection inside part.For the ordinary skill in the art, above-mentioned term can be understood in the present invention with concrete condition
Concrete meaning.
As long as in addition, the non-structure each other of technical characteristic involved in invention described below different embodiments
It can be combined with each other at conflict.
As depicted in figs. 1 and 2, a kind of impedance test device of the present embodiment, comprising:
Switch installing mechanism；
At least three probes, the probe are grounded probe or signal probe, and the probe is installed on the switching installation
In mechanism, and partly or entirely the probe is driven by the switching installing mechanism, and can be in test position and non-test position
Between switch；And the switching installing mechanism drives selected two probes with a signal probe and another letter every time
The combination of number probe reaches the test position with the combination of a signal probe and a grounded probe,
Remaining is non-to be chosen the probe and switches to the non-test position.
Above-mentioned impedance test device, when needing to carry out testing impedance with selected two probes, it is only necessary to make selected two to visit
Needle is in test position, and non-selected probe is switched to non-test position, can be realized and is carrying out impedance using selected two probes
When test, non-selected probe is far from circuit board under test and then avoids contacting elsewhere with circuit board under test, will not be to survey
The raw interference of test manufacture, guarantees the accuracy of test result, while preventing from causing short circuit and damaging measuring instrument.
The specific switch forms between the test position and the non-test position of the probe can there are many,
In the present embodiment, the probe is in such a way that straight line moves back and forth between the test position and the non-test position
Switching.
It is described switching installing mechanism specific constructive form can there are many, it is described as a kind of specific embodiment
Switching installing mechanism includes:
Mounting base 1；
Movable support 3, the relatively described mounting base 1 are vertically arranged and can the reciprocal shiftings along the vertical direction of the relatively described mounting base 1
It is dynamic；Its lower end is equipped with the probe；
Power device is arranged between the mounting base 1 and the movable support 3, drives the opposite institute of the movable support 3
It is mobile to state mounting base 1.
Above-mentioned switching installing mechanism, by power device control be installed on the probe of movable support 3 test position with it is non-
Switching between test position, structure is simple, easy to operate, and switching state is stablized.
The concrete form of the power device can there are many, in the present embodiment, the power device include make it is described
The controllable force device that the relatively described mounting base 1 of movable support 3 moves up or down；And biasing force is applied to the activity
The bias piece that the movable support 3 is mobile to other direction is driven on bracket 3.
As a kind of specific embodiment, the controllable force device is calutron 4.
The concrete form of the calutron 4 can there are many, for example, the calutron 4 include be arranged in the work
Coil or magnechuck on dynamic one of bracket 3 and the mounting base 1, and the ferromagnetic component being arranged on another.It is described
It is generated when coil or magnechuck are powered and magnetic attraction that the ferromagnetic component attracts each other, makes the movable support 3 to leaning on
The nearly mounting base 1, the direction far from the test position are mobile.
Further, the biasing force of the bias piece is the active force for tending to the test position.
As a kind of specific embodiment, the biasing force is by setting in the movable support 3 and the mounting base 1
Between compression spring 5 apply.Compression spring 5 can have both in probe test to probe while applying the biasing force
Buffer function, prevent the contact between probe and circuit board really up to the mark and damage circuit board.
The biasing force passes through the compression spring 5 being arranged between the movable support 3 and the mounting base 1 and applies.
As a kind of specific embodiment, the mounting base 1 has a fixed bracket 2, and the fixed bracket 2 is provided with pair
The first guide frame 6 that the movement of the movable support 3 is oriented to.First guiding mechanism 6 can be with boot activity bracket 3 perpendicular
Histogram is moved back and forth to straight line.
Specifically, in the present embodiment, the fixed bracket 2 is tubular structure, the upper end edge hole depth of the movable support 3
Direction straight line is inserted in the limit hole 21 of the tubular structure with moving back and forth, and first guide frame 6 is set on described
Keyway arrangements 61 between fixed bracket 2 and the movable support 3.
The specific constructive form of the keyway arrangements 61 can there are many, such as can be for set on the fixed branch of movable support 3/
The structure type of the spline of frame 2 and the spline cooperation for being set to fixed 2/ movable support 3 of bracket, or be set to movable support
The structure type of the flat key of 3/ fixed bracket 2 and the flat key slot cooperation for being set to fixed 2/ movable support 3 of bracket, can also for set on
The structure type etc. of the guide rail of the fixed bracket 2 of movable support 3/ and the guide-track groove cooperation for being set to fixed 2/ movable support 3 of bracket.?
In the present embodiment, the keyway arrangements 61 are the spline and the knot for the spline cooperation for being set to fixed bracket 2 set on movable support 3
Configuration formula.
In the present embodiment, the coil or magnechuck are set on the fixed bracket 2, and the ferromagnetic component is set
It is placed on the movable support 3.Described 5 one end of compression spring is connected to the movable support 3, and the other end is connected to the fixation
Bracket 2.
As an improvement embodiment, institute is adjustably arranged in the relative distance between the part or all of probe
It states on switching installing mechanism.To constitute the spacing between the grounded probe and signal probe of single-ended impedance test in this way, constitute
Spacing between two signal probes of differential impedance test can be with the flexible in size of spacing at position to be measured on circuit board
It adjusts, not only increases testing impedance range, also make testing impedance more flexible more convenient.
Switching installing mechanism at least three probes can be installed, as an improvement embodiment, in the present embodiment
In, three probes are installed on the switching installing mechanism, respectively the first probe 10, the second probe 20 and third probe 30,
First probe 10 is grounded probe, and second probe 20 and the third probe 30 are signal probe.It is surveyed in impedance
Trial assembly centers three probes, wherein one is grounded probe, other two is signal probe, by testing position to probe
It sets and is switched between non-test position, realize and constitute single-ended impedance survey when grounded probe and signal probe are in test position
When examination, an other signal probe；Similarly, when two signal probes, which are in test position, constitutes differential impedance test, ground connection
Probe is in non-switching position and avoids and circuit board contacts to be tested, guarantee test result.The testing impedance of the present embodiment
Only three probes of setting, which may be implemented, in device can complete two kinds of tests of single-ended impedance test and differential impedance test, compared to
It is existing to need four to be just able to achieve two kinds of tests of single-ended impedance test and differential impedance test, the impedance test device of the present embodiment
The interference of non-test probe, guarantees that the accuracy of test result is same when can reduce number of probes, save the cost, and avoid testing
When prevent Damage by Short Circuit measuring instrument.
Each probe can be coplanar with and also it is non-coplanar be arranged, as an improvement embodiment, in this implementation
In example, first probe 10, second probe 20 and the third probe 30 are coplanar in same vertical plane, described
Second probe 20 is set between first probe 10 and the third probe 30, and is positioned at test position；Described first
Probe 10, the third probe 30 can switch between test position and non-test position respectively.Wherein, Fig. 1 show
Two probes 20 and third probe 30 are in test position, and the first probe 10 is in the state of non-test position；Fig. 2 show progress
Before test, the first probe 10 or third probe 30 are switched to the state of non-test position not yet.
As an improvement embodiment, the needle point of first probe 10, the third probe 30 needle point incline
Lean to the needle point setting of nearly second probe 20.The single-ended resistance that the first probe 10 and the second probe 20 can be made to constitute in this way
The differential impedance that anti-test, the second probe 20 and third probe 30 are constituted, which tests both testing impedances, to be realized between minimum
Away from test, improve test scope.
As an improvement embodiment, second probe 20 relative to first probe 10, the third visit
The distance between needle 30 is adjustably arranged on the switching installing mechanism.Make the first spy for constituting single-ended impedance test in this way
Spacing between needle 10 and the second probe 20, the spacing between the second probe 20 and third probe 30 of composition differential impedance test
It can be adjusted with the flexible in size of spacing at position to be measured on circuit board, not only increase testing impedance range, also to hinder
Anti- test is more flexible more convenient.
It is more to realize that the second probe 20 can have relative to the adjustable mode of the distance between the first probe 10, third probe 30
Kind, as a kind of specific embodiment, the impedance test device further include:
Driving device 7, for driving second probe 20 to slide；
Second guide frame is set on the switching installing mechanism, guides second probe 20 close to described first
Probe 10 is slided far from the third probe 30 sliding or close to the third probe 30, far from first probe 10.
In the present embodiment,
It is sliding support with the fixed bracket 2 that second probe 20 is correspondingly arranged；
Described sliding support one end connect with the driving device 7 and is formed at the position close to the mounting base 1
Sliding slot, the other end are equipped with second probe 20, can drive second probe 20 sliding under the driving of the driving device 7
It is dynamic；
Second guide frame is sliding rail, is arranged in parallel in the mounting base 1, is cooperated described in guidance with the sliding slot
Second probe 20 is parallel to the direction of the mounting base 1 along one close to first probe 10, the separate third probe 30
Sliding is slided close to the third probe 30, far from first probe 10.
Specifically, in the present embodiment, the driving device 7 includes motor and lead screw, and lead screw one end is connected to motor, separately
One end is threadedly coupled with sliding support.
As an improvement embodiment, as shown in Figure 3 and Figure 4, the probe includes probe inner conductor 8 and being coated on
Shielded layer 9 outside the probe inner conductor 8, the shielded layer 9 are equipped with conductive elastic component 100；
Effect of the conductive elastic component 100 being chosen on two probes in test position in respective elastic force
It is lower to be in close contact respectively with the same conductor structure 200.
Wherein, Fig. 4, which is shown, is chosen the first probe 10 and the second probe 20 and same conductor structure in test position
200 states being in close contact.
Conduction is arranged by the conductor structure 200, and in the shielded layer 9 of probe in the impedance test device of the present embodiment
Elastic element 100, the conductive elastic component 100 can keep constantly tight with conductor structure 200 under the action of own resilient
Contiguity touching makes to realize good be electrically connected by conductor structure 200 between the shielded layer 9 of selected two probes in test position
It is logical, it is possible to prevente effectively from high-frequency signal is distorted, guarantee the accuracy of impedance test results.
Obviously, the above embodiments are merely examples for clarifying the description, and does not limit the embodiments.It is right
For those of ordinary skill in the art, can also make on the basis of the above description it is other it is various forms of variation or
It changes.There is no necessity and possibility to exhaust all the enbodiments.And it is extended from this it is obvious variation or
It changes still within the protection scope of the invention.
Claims (15)
1. a kind of impedance test device characterized by comprising
Switch installing mechanism, including mounting base (1), movable support (3) and power device；The relatively described installation of movable support (3)
Seat (1) be vertically arranged and can the relatively described mounting base (1) move back and forth along the vertical direction；Power device is arranged in the mounting base
(1) between the movable support (3), drive the movable support (3) mobile relative to the mounting base (1)；
At least three probes, the probe are grounded probe or signal probe, and the probe is installed on the switching installing mechanism
On, and partly or entirely the probe is driven by the switching installing mechanism, and can be between test position and non-test position
Switching；And the switching installing mechanism drives selected two probes to visit with a signal probe and another signal every time
The combination of needle reaches the test position with the combination of a signal probe and a grounded probe, remaining
It is non-to be chosen the probe and switch to the non-test position；The probe is installed on the movable support (3) lower end, and by straight
The mode that line moves back and forth switches between the test position and the non-test position.
2. impedance test device according to claim 1, which is characterized in that the power device includes making the activity branch
The controllable force device that the relatively described mounting base (1) of frame (3) moves up or down；And biasing force is applied to the activity
The bias piece for driving the movable support (3) to move on bracket (3) downward or upward.
3. impedance test device according to claim 2, which is characterized in that the controllable force device is calutron
(4)。
4. impedance test device according to claim 3, which is characterized in that the calutron (4) includes being arranged in institute
The coil or magnechuck on one of movable support (3) and the mounting base (1) are stated, and the ferromagnetism portion being arranged on another
Part.
5. the impedance test device according to any one of claim 2-4, which is characterized in that the bias piece it is described partially
Pressure is the active force for tending to the test position.
6. impedance test device according to claim 5, which is characterized in that the biasing force is by being arranged in the activity
Compression spring (5) between bracket (3) and the mounting base (1) applies.
7. impedance test device described in any one of -4 according to claim 1, which is characterized in that the mounting base (1) has
Fixed bracket (2), the fixed bracket (2) are provided with the first guiding knot being oriented to the movement of the movable support (3)
Structure (6).
8. impedance test device according to claim 7, which is characterized in that the fixed bracket (2) is tubular structure, institute
The upper end edge hole depth direction straight line for stating movable support (3) is inserted in the limit hole (21) of the tubular structure with moving back and forth,
First guide frame (6) is the keyway arrangements (61) between the fixed bracket (2) and the movable support (3).
9. impedance test device described in any one of -4 according to claim 1, which is characterized in that on the switching installing mechanism
Three probes, respectively the first probe (10), the second probe (20) and third probe (30), first probe (10) are installed
For grounded probe, second probe (20) and the third probe (30) are signal probe.
10. impedance test device according to claim 9, which is characterized in that
First probe (10), second probe (20) and the third probe (30) is coplanar in same vertical plane sets
It sets；
Second probe (20) is set between first probe (10) and the third probe (30), and is positioned at test
Position；First probe (10), the third probe (30) can switch between test position and non-test position respectively.
11. impedance test device according to claim 10, which is characterized in that the needle point of first probe (10), institute
The needle point for stating third probe (30) tilts the needle point setting of close second probe (20).
12. impedance test device according to claim 9, which is characterized in that second probe (20) is relative to described
The distance between first probe (10), described third probe (30) are adjustably arranged on the switching installing mechanism.
13. impedance test device according to claim 12, which is characterized in that the impedance test device further include:
Driving device (7), for driving second probe (20) to slide；
Second guide frame is set on the switching installing mechanism, and second probe (20) is guided to visit close to described first
Needle (10) is slided far from the third probe (30) sliding or close to the third probe (30), far from first probe (10)
It is dynamic.
14. impedance test device described in any one of -4 according to claim 1, which is characterized in that the part or all of spy
Relative distance between needle is adjustably arranged on the switching installing mechanism.
15. impedance test device described in any one of -4 according to claim 1, which is characterized in that
The probe includes probe inner conductor (8) and is coated on the shielded layer (9) of the probe inner conductor (8) outside, the shielding
Layer (9) is equipped with conductive elastic component (100)；
The conductive elastic component (100) on selected two probes in test position is under the action of respective elastic force
It is in close contact respectively with same conductor structure (200).
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| CN201610463590.0A CN105938160B (en) | 2016-06-23 | 2016-06-23 | Impedance test device |
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| CN201610463590.0A CN105938160B (en) | 2016-06-23 | 2016-06-23 | Impedance test device |
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| CN105938160A CN105938160A (en) | 2016-09-14 |
| CN105938160B true CN105938160B (en) | 2019-02-12 |
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| CN201610463590.0A Active CN105938160B (en) | 2016-06-23 | 2016-06-23 | Impedance test device |
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| US9933459B1 (en) * | 2016-11-11 | 2018-04-03 | Fluke Corporation | Magnetically coupled ground reference probe |
| CN108427043B (en) * | 2017-02-13 | 2020-07-03 | 华邦电子股份有限公司 | Turret type test equipment and turret type test method thereof |
| CN107219398B (en) * | 2017-05-02 | 2019-12-10 | 广东长盈精密技术有限公司 | Resistance testing device |
| CN107315099B (en) * | 2017-08-01 | 2020-01-03 | 南京协辰电子科技有限公司 | Probe switching device and PCB impedance test machine |
| CN107909951A (en) * | 2017-11-14 | 2018-04-13 | 合肥鑫晟光电科技有限公司 | A kind of panel tester |
| EP3546975A1 (en) * | 2018-03-29 | 2019-10-02 | Rohde & Schwarz GmbH & Co. KG | Test arrangement and test method for characterizing a differential probe |
| CN109633273B (en) * | 2018-11-30 | 2021-06-04 | 上海无线电设备研究所 | Open-hole load impedance test system and method |
| CN109581007A (en) * | 2018-12-27 | 2019-04-05 | 南京协辰电子科技有限公司 | Double probe system and printed circuit board detection device |
| CN109916554B (en) * | 2019-02-22 | 2021-08-20 | 武汉飞帛丝科技有限公司 | Handheld pressure sensing performance detection equipment |
| CN115015603A (en) * | 2022-05-20 | 2022-09-06 | 迪赛康科技(深圳)有限公司 | Bandwidth 40G interval adjustable differential probe |
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| CN105938160A (en) | 2016-09-14 |
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