CN209086279U - On-line testing fixture - Google Patents
On-line testing fixture Download PDFInfo
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- CN209086279U CN209086279U CN201821585955.8U CN201821585955U CN209086279U CN 209086279 U CN209086279 U CN 209086279U CN 201821585955 U CN201821585955 U CN 201821585955U CN 209086279 U CN209086279 U CN 209086279U
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- guide rail
- circuit board
- component
- carrier
- probe assembly
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Abstract
The utility model discloses on-line testing fixtures, for testing the component on circuit board；On-line testing fixture includes the bearing assembly for placing circuit board and the probe assembly for being electrically connected with the leg of component；Bearing assembly includes guide assembly and carrier, and probe assembly is connected to carrier, and guide assembly is for guiding carrier opposing circuit board mobile, so that probe assembly is abutted or separated with the leg of component.Guide carrier opposing circuit board mobile by guide assembly, carrier movement is so that probe assembly connected to it is abutted with the leg of component on circuit board, on-line testing can be carried out to the component to be connected to the test device of probe assembly, after the completion of test, carrier movement is so that probe assembly connected to it is separated with the leg of component on circuit board；It is tested without time-consuming and laborious remove the component from circuit board, avoids and damage circuit board or component when taking component from circuit board；Test is more convenient, safe.
Description
Technical field
The utility model relates to electrical detection technique more particularly to on-line testing fixtures.
Background technique
Some components on circuit board are sometimes for being detected.Such as the circuit for detecting semiconductor product performance
Plate has used a large amount of relay, and the requirement for such relay is more harsh, it is desirable that fast response time, contact voltage drop
Within 0.2 Ω；Relay Aging is the main factor for causing semiconductor product test equipment unstable, it is therefore desirable to this
A little relays are detected.
Existing detection means usually requires time-consuming and laborious remove component from circuit board and tests, and having very much can
Circuit board or component can be damaged when removing component from circuit board.
Utility model content
For overcome the deficiencies in the prior art, the purpose of this utility model is to provide on-line testing fixture, expense is not needed
When component removed from circuit board arduously test, avoid and damage circuit board or first device when taking component from circuit board
Part；Test is more convenient, safe.
The purpose of this utility model adopts the following technical scheme that realization:
On-line testing fixture, for testing the component on circuit board；The on-line testing fixture includes for placing
State the bearing assembly of circuit board and for the probe assembly with the electric connection of the leg of the component；
The bearing assembly includes guide assembly and carrier, and the probe assembly is connected to the carrier, the guide rail group
Part for guiding the carrier mobile relative to the circuit board so that the probe assembly abutted with the leg of the component or
Separation.
In some embodiments, the probe assembly is removably connected to the carrier.
In some embodiments, the probe assembly includes interconnecting piece, needle plate portion and several probes, and the needle plate portion is vertical
In the interconnecting piece, the interconnecting piece with the carrier for removably connecting；Several probes are consolidated by the needle plate portion
It is fixed, so that several probes are perpendicular to the circuit board.
In some embodiments, the on-line testing fixture includes the more than one probe assembly, each probe assembly
Several probes have different arrangement modes, to be matched with the leg arrangement mode of different components.
In some embodiments, the probe is equipped with recess portion close to one end of the circuit board.
In some embodiments, the guide assembly includes the first guide rail perpendicular to the circuit board, and the carrier exists
It is moved on first guide rail along the first axle perpendicular to the circuit board, so that the weldering of the probe assembly and the component
Foot abuts or separation.
In some embodiments, the carrier includes lock piece, for the carrier to be locked in first guide rail.
In some embodiments, the bearing assembly further includes second guide rail vertical with first guide rail, and described
One guide rail is slidably connected to second guide rail；
First guide rail moves on second guide rail, so that probe assembly edge is parallel to the circuit board
Second axis is mobile.
In some embodiments, the bearing assembly further includes third guide rail and the 4th guide rail, the third guide rail and
Four guide rails are arranged in parallel in the both ends of second guide rail, and the both ends of second guide rail are respectively slidably connected to third and lead
Rail and the 4th guide rail；
Second guide rail moves on the third guide rail and the 4th guide rail, so that the probe assembly is along being parallel to
The third axis of the circuit board is mobile, and the third axis and second axis are vertical.
In some embodiments, the bearing assembly further includes the first support frame and the second support frame, the third guide rail
It is fixed on first support frame, the 4th guide rail is fixed on second support frame；First support frame and second
Support is equipped with limiting unit, the limiting unit be used to for the circuit board being limited to first support frame and the second support frame it
Between.
Compared with prior art, the beneficial effect of the utility model embodiment is: guiding carrier opposite by guide assembly
Circuit board is mobile, and carrier movement is so that probe assembly connected to it is abutted with the leg of component on circuit board, to connect
On-line testing can be carried out to the component in the test device of probe assembly, after the completion of test, carrier movement with it so that connect
The probe assembly connect is separated with the leg of component on circuit board；The component is removed from circuit board without time-consuming and laborious
It is tested, avoids and damage circuit board or component when taking component from circuit board；Test is more convenient, safe.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of on-line testing fixture provided by the embodiment of the utility model；
Fig. 2 is the structural schematic diagram that on-line testing fixture tests component on circuit board in Fig. 1；
Fig. 3 is the partial enlargement diagram of part A in Fig. 2；
Fig. 4 is the structural schematic diagram of another angle of on-line testing fixture in Fig. 2；
Fig. 5 is probe assembly and the dismountable structural schematic diagram of carrier；
Fig. 6 is the structural schematic diagram of probe assembly in Fig. 5.
In figure: 100, bearing assembly；110, guide assembly；111, the first guide rail；112, the second guide rail；113, third is led
Rail；114, the 4th guide rail；115, the first support frame；116, the second support frame；117, limiting unit；101, carrier；102, first is sliding
Block；103, fixing piece；1031, the first fixed plate；1032, the second fixed plate；104, the second sliding block；105, third sliding block；200,
Probe assembly；210, interconnecting piece；220, needle plate portion；230, probe；231, recess portion；11, circuit board；12, component；13, leg.
Specific embodiment
In the following, being described further in conjunction with attached drawing and specific embodiment to the utility model, it should be noted that
Under the premise of not colliding, it can be formed in any combination between various embodiments described below or between each technical characteristic new
Embodiment.
Such as the structural schematic diagram that Fig. 1 is on-line testing fixture.The on-line testing fixture is illustrated in figure 2 for testing circuit
The structural schematic diagram of component 12 on plate 11, Fig. 3 are the partial enlarged view of circle part A in Fig. 2, and Fig. 4 is on-line testing folder
Has the structural schematic diagram of another angle of component 12 for testing on circuit board 11.
As Figure 1-Figure 4, on-line testing fixture includes bearing assembly 100 for placing circuit board 11 and is used for and member
The probe assembly 200 that the leg 13 of device 12 is electrically connected.
Wherein, bearing assembly 100 includes guide assembly 110 and carrier 101, and probe assembly 200 is connected to carrier 101.It leads
Rail assembly 110 is for guiding 101 opposing circuit board 11 of carrier mobile, so that probe assembly 200 and the leg 13 of component 12 support
It connects or separates.
In some possible embodiments, guide assembly 110 or carrier 101 are operated so that carrier 101 it is at least opposite with lead
The partial movement of rail assembly 110, to drive the probe assembly 200 connecting with carrier 101 mobile.As shown in Figures 2 and 3, it visits
Head assembly 200 can be abutted or be separated with the leg 13 of component 12 in certain position.
In some possible embodiments, probe assembly 200 is electrically connected at a test device (not shown), thus the survey
Trial assembly is set leg 13 corresponding to the component 12 and is electrically connected；Test device can test the component 12, without
It needs time-consuming and laborious to remove the component 12 from circuit board 11.Illustratively, component 12 is relay.
In some possible embodiments, as shown in figure 5, probe assembly 200 is removably connected to carrier 101, thus
So that bearing assembly 100 can be connect with a variety of probe assemblies 200, to test different types of component 12.
In some possible embodiments, if as shown in fig. 6, probe assembly 200 include interconnecting piece 210, needle plate portion 220 and
Dry probe 230, needle plate portion 220 are vertically connected at interconnecting piece 210, and interconnecting piece 210 with carrier 101 for removably connecting.Show
Example property, interconnecting piece 210 and needle plate portion 220 be made of insulating material, and can be the one made of techniques such as to be molded
Formula structure, interconnecting piece 210 are equipped with screw hole (not shown), and interconnecting piece 210 is removably connected to carrier 101 by screw.It should
Several probes 230 are fixed by needle plate portion 220, so that several probes 230 are perpendicular to circuit board 11.
In some possible embodiments, on-line testing fixture includes more than one probe assembly 200, each probe assembly
200 several probes 230 have different arrangement modes, to be matched with 13 arrangement mode of leg of different components 12.It is surveying
When the different component 12 of 13 arrangement mode of test weld foot, corresponding probe assembly 200 is selected according to the arrangement mode of leg 13.Example
Such as, when component 12 is relay, possible there are five the legs 13 for being divided into two rows of arrangements, it is therefore desirable to which five rows are two rows of spies
Needle 230 is fixed in needle plate portion 220；It may be the leg 13 of a column there are three row when component 12 is metal-oxide-semiconductor, it is therefore desirable to
Three rows are that the probe 230 of a row is fixed in needle plate portion 220.
In some possible embodiments, several probes 230 are also removably installed in needle plate portion 220, and can also change
Become installation site.For example, several jacks and the cooperation fixation of probe 230 can be set in needle plate portion 220.In this way, probe assembly 200
Probe 230 can be placed in the arrangement mode for changing probe 230 in different jacks according to testing requirement.Therefore, it pops one's head in
Component 200 can be matched from a variety of different components 12, to test a variety of different components 12.Furthermore it is also possible to just
In replacement probe 230.
In some possible embodiments, probe 230 is equipped with recess portion 231 close to one end of circuit board 11, can be better
It is matched with the structure of leg 13, increases the reliability of electrical connection, to guarantee the accuracy that component 12 is tested.
In some possible embodiments, shown in as shown in Figure 1, Figure 2, Fig. 4 and Fig. 5, guide assembly 110 includes perpendicular to circuit
First guide rail 111 of plate 11, carrier 101 move on the first guide rail 111 along the first axle Z perpendicular to circuit board 11, so as to visit
Head assembly 200 is abutted or is separated with the leg 13 of component 12；Can also avoid play needle and leg 13 collision, damage bullet needle or
Leg 13.Illustrative carrier 101 is the sliding block cooperated with the first guide rail 111.
In some possible embodiments, carrier 101 includes lock piece (not shown), for carrier 101 to be locked in the
On one guide rail 111.Illustratively, lock piece includes set screw；Carrier 101 is locked in the first guide rail by the set screw
On 111.So as to avoid carrier 101 from driving the shake of probe assembly 200 or movement, so that the probe of probe assembly 200
230 can not reliably be electrically connected with leg 13, to reduce the accuracy of the test of component 12.
In some possible embodiments, bearing assembly 100 further includes second guide rail 112 vertical with the first guide rail 111,
First guide rail 111 is slidably connected to the second guide rail 112.First guide rail 111 moves on the second guide rail 112, so that probe
Component 200 is moved along the second axis X for being parallel to circuit board 11.
In some possible embodiments, bearing assembly 100 further includes the first sliding block 102, and the first guide rail 111 is connected to
One sliding block 102, and the first guide rail 111 is vertical with the second guide rail 112.First sliding block 102 is on the second guide rail 112 along perpendicular to the
The second axis X of one axis Z is mobile, to drive the first guide rail 111, carrier 101 and probe assembly 200 to move along the second axis X.To real
Having showed probe assembly 200 can move along the direction of two axis, by moving along the second axis X, convenient for the position of probe assembly 200
Set the leg 13 for corresponding to the component 12 of different location on circuit board 11；By moving along first axle Z, so that probe assembly
200 bullet needle is abutted or is separated with leg 13, to avoid playing the collision of needle and leg 13, damage plays needle or leg 13.
In some possible embodiments, as shown in Figure 1, bearing assembly 100 further includes a fixing piece 103.Fixing piece 103
Including perpendicular the first fixed plate 1031 and the second fixed plate 1032, the first fixed plate 1031 is connected to the first sliding block 102, the
Two fixed plates 1032 are connected to the first guide rail 111.So that the direction that the first sliding block 102 moves on the second guide rail 112, i.e., second
The direction of axis X and the first guide rail 111 are perpendicular.
In some possible embodiments, bearing assembly 100 further includes third guide rail 113 and the 4th guide rail 114, and third is led
Rail 113 and the 4th guide rail 114 are arranged in parallel in the both ends of the second guide rail 112, and the both ends of the second guide rail 112 respectively slidably connect
It is connected to third guide rail 113 and the 4th guide rail 114.Second guide rail 112 moves on third guide rail 113 and the 4th guide rail 114, so that
Probe assembly 200 is moved along the third axis Y for being parallel to circuit board 11, and third axis Y and the second axis X are vertical.To realize spy
Head assembly 200 can be moved along the direction of three axis, by moving along the second axis X, third axis Y, convenient for probe assembly 200
Position corresponds to the leg 13 of the component 12 of different location on circuit board 11；By moving along first axle Z, so that probe group
The bullet needle of part 200 is abutted or is separated with leg 13, to avoid playing the collision of needle and leg 13, damage plays needle or leg 13.
In some possible embodiments, bearing assembly 100 further includes the second sliding block 104 and third sliding block 105；Second is sliding
Block 104 is connected to one end of the second guide rail 112, and third sliding block 105 is connected to the other end of the second guide rail 112.Second sliding block 104
It is moved on third guide rail 113 along third axis Y and third sliding block 105 moves on the 4th guide rail 114 along third axis Y, with reality
Existing second guide rail 112 moves on third guide rail 113 and the 4th guide rail 114, with drive the first sliding block 102, the first guide rail 111,
Carrier 101 and probe assembly 200 are moved along third axis Y；Third axis Y and first axle Z and the second axis X are vertical.
In some possible embodiments, as depicted in figs. 1 and 2, bearing assembly 100 further includes 115 He of the first support frame
Second support frame 116, third guide rail 113 are fixed on the first support frame 115, and the 4th guide rail 114 is fixed on the second support frame 116.
To in the space that the side of bearing assembly 100 constitutes for placing circuit board 11.
In some possible embodiments, the first support frame 115 and the second support frame 116 are equipped with limiting unit 117, limitation
Portion 117 is for circuit board 11 to be limited between the first support frame 115 and the second support frame 116.Illustratively, limiting unit 117
The groove on supporting leg to be located at the first support frame 115 and the second support frame 116；Circuit board 11 is inserted into from groove, and is limited
System movement, so as to increase the reliability that the probe 230 of probe assembly 200 is electrically connected with leg 13, to guarantee component
The accuracy of 12 tests.
In some possible embodiments, when testing certain relay, circuit board 11 is first corresponded into leg 13
Side be fixed on the first support frame 115 and the second support frame 116 towards probe assembly 200；Selection and the relay leg
The corresponding probe assembly 200 of 13 arrangement mode is connected on carrier 101, and the probe assembly of selection 200 is connected to test
Device；Then by probe assembly 200 along the second axis X and/or third axis Y motion so that each probe 230 of probe assembly 200 with
13 position of corresponding leg of relay is corresponding；Probe assembly 200 is moved along first axle Z later, so that probe 230 is connected to
Corresponding leg 13, so that test device can test the component 12.
On-line testing fixture provided by the embodiment of the utility model guides 101 opposing circuit of carrier by guide assembly 110
Plate 11 is mobile, and carrier 101 is mobile so that the leg 13 of probe assembly 200 connected to it and component 12 on circuit board 11 supports
It connects, so that on-line testing can be carried out to the component 12 by being connected to the test device of probe assembly 200, after the completion of test, carries
Body 101 is mobile so that probe assembly 200 connected to it is separated with the leg 13 of component 12 on circuit board 11；Without taking
When the component 12 removed from circuit board 11 arduously test, avoid and damage electricity when taking component 12 from circuit board 11
Road plate 11 or component 12；Test is more convenient, safe.
Above embodiment is only preferred embodiments of the present invention, cannot be protected with this to limit the utility model
Range, the variation of any unsubstantiality that those skilled in the art is done on the basis of the utility model and replacement belong to
In the utility model range claimed.
Claims (10)
1. on-line testing fixture, it is characterised in that: for testing the component on circuit board；The on-line testing fixture includes using
In the bearing assembly for placing the circuit board and for the probe assembly with the electric connection of the leg of the component；
The bearing assembly includes guide assembly and carrier, and the probe assembly is connected to the carrier, and the guide assembly is used
In guiding the carrier mobile relative to the circuit board, so that the probe assembly abuts or divides with the leg of the component
From.
2. on-line testing fixture as described in claim 1, it is characterised in that: the probe assembly is removably connected to described
Carrier.
3. on-line testing fixture as claimed in claim 2, it is characterised in that: the probe assembly includes interconnecting piece, needle plate portion
With several probes, the needle plate portion is perpendicular to the interconnecting piece, and the interconnecting piece with the carrier for removably connecting；Institute
It states several probes to be fixed by the needle plate portion, so that several probes are perpendicular to the circuit board.
4. on-line testing fixture as claimed in claim 3, it is characterised in that: the on-line testing fixture includes more than one
Several probes of the probe assembly, each probe assembly have different arrangement modes, to be matched with different components
Leg arrangement mode.
5. on-line testing fixture as claimed in claim 3, it is characterised in that: the probe is set close to one end of the circuit board
There is recess portion.
6. on-line testing fixture according to any one of claims 1 to 5, it is characterised in that: the guide assembly includes vertical
In the first guide rail of the circuit board, the carrier is moved on first guide rail along the first axle perpendicular to the circuit board
It is dynamic, so that the probe assembly is abutted or is separated with the leg of the component.
7. on-line testing fixture as claimed in claim 6, it is characterised in that: the carrier includes lock piece, and being used for will be described
Carrier is locked on first guide rail.
8. on-line testing fixture as claimed in claim 6, it is characterised in that: the bearing assembly further includes leading with described first
The second vertical guide rail of rail, first guide rail are slidably connected to second guide rail；
First guide rail moves on second guide rail, so that probe assembly edge is parallel to the second of the circuit board
Axis is mobile.
9. on-line testing fixture as claimed in claim 8, it is characterised in that: the bearing assembly further includes third guide rail and
Four guide rails, the third guide rail and the 4th guide rail are arranged in parallel in the both ends of second guide rail, the both ends of second guide rail
Respectively slidably it is connected to third guide rail and the 4th guide rail；
Second guide rail moves on the third guide rail and the 4th guide rail, so that the probe assembly is described along being parallel to
The third axis of circuit board is mobile, and the third axis and second axis are vertical.
10. on-line testing fixture as claimed in claim 9, it is characterised in that: the bearing assembly further includes the first support frame
With the second support frame, the third guide rail is fixed on first support frame, and the 4th guide rail is fixed on second support
Frame；First support frame and the second support frame are equipped with limiting unit, and the limiting unit is used to the circuit board being limited to institute
It states between the first support frame and the second support frame.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821585955.8U CN209086279U (en) | 2018-09-27 | 2018-09-27 | On-line testing fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821585955.8U CN209086279U (en) | 2018-09-27 | 2018-09-27 | On-line testing fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209086279U true CN209086279U (en) | 2019-07-09 |
Family
ID=67117785
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821585955.8U Active CN209086279U (en) | 2018-09-27 | 2018-09-27 | On-line testing fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209086279U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111537864A (en) * | 2020-05-27 | 2020-08-14 | 浪潮电子信息产业股份有限公司 | PCB impedance test fixture |
-
2018
- 2018-09-27 CN CN201821585955.8U patent/CN209086279U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111537864A (en) * | 2020-05-27 | 2020-08-14 | 浪潮电子信息产业股份有限公司 | PCB impedance test fixture |
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