CN111537864A - PCB impedance test fixture - Google Patents

PCB impedance test fixture Download PDF

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Publication number
CN111537864A
CN111537864A CN202010461841.8A CN202010461841A CN111537864A CN 111537864 A CN111537864 A CN 111537864A CN 202010461841 A CN202010461841 A CN 202010461841A CN 111537864 A CN111537864 A CN 111537864A
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CN
China
Prior art keywords
pcb
cross beam
tester
clamping
mounting
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Pending
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CN202010461841.8A
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Chinese (zh)
Inventor
刘安阳
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Inspur Electronic Information Industry Co Ltd
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Inspur Electronic Information Industry Co Ltd
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Priority to CN202010461841.8A priority Critical patent/CN111537864A/en
Publication of CN111537864A publication Critical patent/CN111537864A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention discloses a PCB impedance test fixture, which comprises a mounting seat for positioning and mounting a PCB, clamping longitudinal beams vertically erected at two sides of the surface of the mounting seat and used for clamping two side edges of the PCB, a cross beam horizontally connected between the clamping longitudinal beams at two sides, and a tester connected to the cross beam, naturally hung under the action of gravity and used for performing impedance test on the surface of the PCB. Therefore, a tester can firstly install the PCB in the installation seat, after the installation position is adjusted according to the position of the test point on the PCB, the two side edges of the PCB are clamped and fixed by utilizing the clamping longitudinal beams, and finally, the test point on the PCB is subjected to impedance test through the probe in the tester naturally falling on the cross beam. In the whole test process, a tester is not required to carry out handheld operation on the tester or the PCB and the like, and a probe on the tester is always vertical to the surface of the PCB, so that the transmission distortion of test signals can be avoided, and the accuracy of test results is improved.

Description

PCB impedance test fixture
Technical Field
The invention relates to the technical field of PCBs, in particular to a PCB impedance test fixture.
Background
With the development of the electronic technology in China, more and more electronic devices have been widely used.
Servers are important components in electronic devices, and are devices that provide computing services. Since the server needs to respond to and process the service request, the server generally has the capability of assuming and securing the service. The server is divided into a file server, a database server, an application server, a WEB server and the like according to different service types provided by the server. The main components of the server include a processor, a hard disk, a memory, a system bus, etc., similar to a general computer architecture.
In the big data era, a large number of IT devices are centrally located in a data center. These data centers include various types of servers, storage, switches, and a large number of cabinets and other infrastructure. Each type of IT equipment is composed of various hardware boards, such as a computing module, a memory module, a chassis, a fan module, and the like.
At present, the transmission rate of signal lines in the PCB card is higher and higher, so that the impedance parameters of the signal lines of the card are more and more important. The loss reflects the quality of a transmission signal of the PCB, so that research and development testers have higher and higher test requirements on the PCB, and therefore, the management and control of the PCB loss is a very important link in the product design stage. The PCB is the basis of the server, and in order to ensure the stable operation of the server, a large amount of tests need to be carried out on the PCB board card so as to ensure the qualification rate of the PCB. However, the wear of the probe caused by a large number of tests, and the probe is extremely easy to damage due to careless maintenance and irregular use at ordinary times.
When the impedance test is carried out on the PCB, the probe is required to be vertical to the PCB, so that the signal transmission is ensured not to be distorted, the accuracy of a test result is improved, and meanwhile, the probe can be prevented from being damaged. However, in the prior art, a tester manually holds the tester to perform impedance testing on the PCB, and tries to align the vertical position of the probe with the vertical position only by hand feeling, so that it is difficult to ensure the vertical relationship between the probe and the PCB, and the probe is easily damaged, resulting in transmission distortion of test signals and low accuracy of test results.
Therefore, how to ensure that the probe keeps a vertical relation with the PCB during the impedance test, avoid the transmission distortion of the test signal, and improve the accuracy of the test result is a technical problem faced by those skilled in the art.
Disclosure of Invention
The invention aims to provide a PCB impedance test fixture, which can ensure that a probe and a PCB are in a vertical relation in an impedance test process, avoid transmission distortion of test signals and improve the accuracy of test results.
In order to solve the technical problem, the invention provides a PCB impedance test fixture which comprises a mounting seat used for positioning and mounting a PCB, clamping longitudinal beams vertically erected at two sides of the surface of the mounting seat and used for clamping two side edges of the PCB, a cross beam horizontally connected between the clamping longitudinal beams at two sides, and a tester connected to the cross beam, naturally hung under the action of gravity and used for carrying out impedance test on the surface of the PCB.
Preferably, both ends of the cross beam are installed on the corresponding clamping longitudinal beams in a floating mode, and a pre-tightening spring used for enabling the cross beam to keep a pressing pre-tightening force is connected between the two ends of the cross beam and the surface of the installation seat.
Preferably, hanging holes are formed in the edges of the two ends of the cross beam, and hanging rods corresponding to the hanging holes are arranged on the outer walls of the two sides of the mounting seat; one end of the pre-tightening spring is connected in the hanging hole, the other end of the pre-tightening spring is connected on the hanging rod, and the elastic direction of the pre-tightening spring is vertical.
Preferably, first adjusting holes are formed in the two ends of the cross beam, and the top end of the clamping longitudinal beam is slidably inserted into the first adjusting holes.
Preferably, each the outer surface of the clamping longitudinal beam is provided with a thread, and a locking nut which is in threaded connection with the clamping longitudinal beam and used for adjusting the connection height of the cross beam and the clamping longitudinal beam is sleeved on the top end of the clamping longitudinal beam.
Preferably, a second adjusting hole is formed in the middle of the cross beam, a clamping sleeve is sleeved on the outer surface of the tester, the tester penetrates into the second adjusting hole, and the clamping sleeve simultaneously clamps the top surface and the bottom surface of the second adjusting hole.
Preferably, the first adjusting hole and the second adjusting hole are both long sliding holes extending along the length direction of the cross beam.
Preferably, the surface of the mounting seat is provided with a mounting groove for positioning and mounting the PCB, and the surface of the mounting groove is provided with an elastic gasket for reducing the abrasion of the PCB.
Preferably, mounting cylinders are arranged on two sides of the surface of the mounting groove, and the bottom end of each clamping longitudinal beam is inserted into the corresponding mounting cylinder; the circumferential side wall of each mounting cylinder has elasticity so as to improve the clamping force on the side edge of the PCB.
Preferably, each of the mounting cylinders is movably disposed on a surface of the mounting groove, and a moving direction of each of the mounting cylinders is perpendicular to a length direction of the cross beam.
The PCB impedance test fixture provided by the invention mainly comprises a mounting seat, a clamping longitudinal beam, a cross beam and a tester. The mounting base is a bottom layer structure of the test fixture, is mainly used for mounting and bearing other parts, and is used for positioning and clamping a PCB to be tested, so that a test place is provided for testers. The clamping longitudinal beam is vertically arranged on two sides of the surface of the mounting seat, and is mainly used for clamping two side edges of the PCB after the PCB is mounted on the mounting seat, so that the PCB is fixed, the PCB is prevented from shaking in the test process, and the test result is prevented from being influenced. The two ends of the cross beam are respectively connected to the clamping longitudinal beams on the two sides, the whole body is located above the mounting seat, and the cross beam is always kept in a horizontal state. The tester is connected on the crossbeam, and its bottom is provided with the probe to hang down naturally from the crossbeam under the effect of gravity, mainly used after the location clamping of PCB board is accomplished, keeps vertical contact with the surperficial test point position of PCB board. Therefore, when the PCB is subjected to impedance test through the PCB impedance test fixture provided by the invention, a tester can firstly install the PCB in the installation seat, after the installation position is adjusted according to the position of the test point on the PCB, the two side edges of the PCB are clamped and fixed by the clamping longitudinal beams, and finally, the test point on the PCB is subjected to impedance test through the probe in the tester naturally falling on the cross beam. In the whole test process, a tester is not required to carry out handheld operation on the tester or the PCB and the like, and a probe on the tester is always vertical to the surface of the PCB, so that the transmission distortion of test signals can be avoided, and the accuracy of test results is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic overall structure diagram of an embodiment of the present invention.
Wherein, in fig. 1:
the device comprises a mounting seat-1, a clamping longitudinal beam-2, a cross beam-3, a tester-4, a pre-tightening spring-5, a locking nut-6 and a clamping sleeve-7;
the device comprises a hanging rod-101, a mounting groove-102, an elastic gasket-103, a mounting cylinder-104, a hanging hole-301, a first adjusting hole-302, a second adjusting hole-303 and a probe-401.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic overall structure diagram of an embodiment of the present invention.
In an embodiment provided by the invention, the PCB impedance testing jig mainly comprises a mounting base 1, a clamping longitudinal beam 2, a cross beam 3 and a tester 4.
The mounting base 1 is a bottom layer structure of the test fixture, is mainly used for mounting and bearing other parts, and is used for positioning and clamping a PCB to be tested, so that a test place is provided for testers.
The clamping longitudinal beam 2 is vertically erected on two sides of the surface of the mounting seat 1, is mainly used for clamping two side edges of the PCB after the PCB is mounted on the mounting seat 1, and is fixed, so that the PCB is prevented from shaking in the test process, and the test result is prevented from being influenced.
The two ends of the cross beam 3 are respectively connected to the clamping longitudinal beams 2 on the two sides, the whole body is located above the mounting seat 1, and the cross beam 3 is always kept in a horizontal state. The tester 4 is connected on the beam 3, the bottom end of the tester is provided with a probe 401, and the tester naturally hangs down from the beam 3 under the action of gravity, and the tester is mainly used for keeping vertical contact with the surface test point position of the PCB after the positioning and clamping of the PCB are completed.
So, when carrying out the impedance test to the PCB board through the PCB impedance test fixture that this embodiment provided, the tester can install the PCB board in mount pad 1 at first, after having adjusted the mounted position according to the test point position on the PCB board, utilize to press from both sides tight longeron 2 with the both sides side of PCB board tight fixed, carry out the impedance test through the probe 401 in the tester 4 that naturally droops on the crossbeam 3 to the test point on the PCB board at last. In the whole test process, the tester 4 or the PCB and the like do not need to be held by hands by testers, and the probe 401 on the tester 4 is always vertical to the surface of the PCB, so that the transmission distortion of test signals can be avoided, and the accuracy of test results is improved.
Considering that when the probe 401 is used to perform an impedance test on the PCB, a certain pre-tightening force needs to be applied to the probe 401 on the basis of keeping the probe 401 perpendicular to the surface of the PCB, so that the probe 401 is kept in close contact with a test point on the PCB, and therefore, a pre-tightening spring 5 is additionally provided in this embodiment. Meanwhile, both ends of the cross beam 3 can be floatingly mounted on the corresponding clamping longitudinal beams 2, that is, both ends of the cross beam 3 can slide on the clamping longitudinal beams 2, and since the clamping longitudinal beams 2 are vertically erected on the surface of the mounting seat 1, the cross beam 3 is still kept in a horizontal state when floating, and only the height is changed.
Correspondingly, the both ends of pretension spring 5 are connected respectively at the both ends of crossbeam 3 and the surface of mount pad 1 to pretension spring 5's elastic deformation direction keeps vertical, and pretension spring 5 keeps tensile state simultaneously, so sets up, in the testing process, keeps the elastic force of inside shrink all the time in pretension spring 5, and the reaction is on crossbeam 3, to the pulling force that transversely produces vertical pulldown promptly, thereby makes crossbeam 3 keep certain pretension that pushes down. Because the tester 4 is connected to the beam 3, the probe 401 at the bottom end of the tester 4 can be kept in close contact with the test point on the surface of the PCB board under the elastic force of the pre-tightening spring 5.
Furthermore, in order to facilitate the installation of the pre-tightening spring 5 in the jig, the hanging holes 301 are formed in the edge positions of the two ends of the cross beam 3, and the hanging rods 101 are additionally arranged at the positions, vertically opposite to the hanging holes 301, on the outer walls of the two sides of the installation seat 1. Specifically, the hanging rod 101 extends outwards for a certain length along the horizontal direction, the top end of the pre-tightening spring 5 is connected in the hanging hole 301, and the bottom end of the pre-tightening spring is connected to the rod body of the hanging rod 101. Meanwhile, the hanging rod 101 is opposite to the hanging hole 301 in the vertical direction, so that the positions of the top end and the bottom end of the pre-tightening spring 5 are opposite to each other, namely, the pre-tightening spring 5 is kept in a vertical state, and the elastic direction of the pre-tightening spring 5 is vertical.
In addition, for making things convenient for crossbeam 3 and the connection between the tight longeron 2 of clamp, first regulation hole 302 has all been seted up in this embodiment in the both ends position department of crossbeam 3, will press from both sides the top of pressing from both sides tight longeron 2 and insert perpendicularly and establish in this first regulation hole 302 simultaneously, realize being connected with crossbeam 3 through the shaft hole cooperation that presss from both sides tight longeron 2 and first regulation hole 302.
Similarly, in order to facilitate the connection between the tester 4 and the cross beam 3, the second adjusting hole 303 is further formed in the middle of the cross beam 3 in the embodiment, and the bottom end of the tester 4 is vertically inserted into the second adjusting hole 303, so that the probe 401 at the bottom end of the tester 4 extends out of the second adjusting hole 303 and keeps vertical under the action of gravity. In order to prevent the tester 4 from accidentally sliding down from the second adjusting hole 303, in this embodiment, a clamping sleeve 7 is further sleeved on the outer surface of the tester 4, the clamping sleeve 7 is in an i-shaped ring shape, the inner ring of the clamping sleeve 7 is tightly sleeved on the outer surface of the tester 4, the diameter of the outer ring of the clamping sleeve is larger than that of the second adjusting hole 303, the top of the clamping sleeve 7 is clamped on the top surface of the second adjusting hole 303, the bottom of the clamping sleeve 7 is clamped on the bottom surface of the second adjusting hole 303, and therefore the tester 4 is fixed on the second adjusting hole 303 by the clamping effect of the clamping sleeve 7 on the second adjusting hole 303.
Further, in consideration of the difference in thickness (height) of different PCBs, the mounting position of the cross beam 3 on the clamping longitudinal beams 2 needs to be fixed again after the cross beam 3 is adjusted to be properly floated, and therefore, in the present embodiment, a lock nut 6 is additionally provided, and threads are provided on the outer surface of each clamping longitudinal beam 2. Specifically, the threads may be disposed on the top of each clamping longitudinal beam 2, and the lock nut 6 is sleeved on the top of the clamping longitudinal beam 2 and is in threaded connection with the threads, so that the cross beam 3 is fixed at the corresponding position on the clamping longitudinal beam 2 by screwing and rotating the lock nut 6 on the threads.
Moreover, considering that the width dimensions of different PCBs may be different, the position of the test point on the surface of the PCB may be changed in the width direction, and for this, the first adjusting hole 302 and the second adjusting hole 303 are improved in this embodiment, and the first adjusting hole 302 and the second adjusting hole 303 are both designed as long sliding holes extending along the length direction of the beam 3. With the arrangement, each clamping longitudinal beam 2 can conveniently slide and adjust in the second adjusting hole 303 along the length direction thereof, and then the adjusted position is fixed through the locking nut 6. Meanwhile, the tester 4 can realize the movement of the probe 401 in the width direction of the PCB (generally, the width direction of the mounting seat 11) through the sliding adjustment of the clamping sleeve 7 in the second adjusting hole 303.
In addition, in order to facilitate the installation of the PCB, the surface of the mounting base 1 is further provided with an installation groove 102, and considering that the PCB is generally rectangular plate-shaped, the installation groove 102 may be a rectangular groove. Meanwhile, considering that the surface and the bottom surface of the PCB are both provided with a plurality of circuit structures and electronic components, in order to prevent the bottom surface structure of the PCB from being damaged, the elastic gasket 103 is further paved on the surface of the mounting groove 102 in the embodiment, so that the abrasion to the bottom surface of the PCB is reduced by the soft material of the elastic gasket 103, and the probe 401 can be abutted to the test point more tightly.
Further, in order to improve the clamping degree of the clamping longitudinal beams 2 to the PCB, in this embodiment, mounting cylinders 104 are further disposed at two sides of the surface of the mounting groove 102, and the bottom ends of the clamping longitudinal beams 2 are respectively inserted into the corresponding mounting cylinders 104. Simultaneously, the circumference lateral wall of each installation section of thick bamboo 104 all has elasticity, for example rubber material etc. so on the one hand usable installation section of thick bamboo 104 structure improves the installation stability of each tight longeron 2 of clamp on mount pad 1, prevents the condition that slope, toppling over from appearing, and the elastic deformation improvement of on the other hand usable installation section of thick bamboo 104 lateral wall is to the tight degree of clamp of PCB board both sides side, improves the clamping stability to the PCB board.
Furthermore, each mounting tube 104 can also move on the bottom surface of the mounting groove 102, and the moving direction thereof is the length direction of the mounting base 1 (also the length direction of the PCB board), i.e. perpendicular to the length direction of the beam 3. Meanwhile, the mounting positions of the hanging rods 101 on the side walls of the two sides of the mounting base 1 can also be adjusted in the same direction. So set up, through the length direction motion of peg 101 and installation section of thick bamboo 104 on mount pad 1, can drive pretension spring 5, press from both sides tight longeron 2 and crossbeam 3 and tester 4 and together move along the length direction of PCB board, and then can make probe 401 accomplish the test to a plurality of test points that length direction distributes on the PCB board surface in proper order.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (10)

1. The utility model provides a PCB impedance test fixture, its characterized in that, including mount pad (1) that is used for the location installation PCB board, vertically stand and locate the surperficial both sides position of mount pad (1) is used for pressing from both sides tight longeron (2), horizontal connection in both sides of PCB board press from both sides crossbeam (3) between tight longeron (2), and connect on crossbeam (3) and hang down naturally under the action of gravity, be used for right the surface of PCB board carries out impedance test's tester (4).
2. The PCB impedance testing jig of claim 1, wherein both ends of the cross beam (3) are installed on the corresponding clamping longitudinal beams (2) in a floating manner, and a pre-tightening spring (5) used for keeping the cross beam (3) in a pressing pre-tightening force is connected between both ends of the cross beam (3) and the surface of the installation seat (1).
3. The PCB impedance testing jig of claim 2, wherein hanging holes (301) are formed in the edges of two ends of the cross beam (3), and hanging rods (101) corresponding to the hanging holes (301) are arranged on the outer walls of two sides of the mounting seat (1); one end of the pre-tightening spring (5) is connected to the hanging hole (301), the other end of the pre-tightening spring is connected to the hanging rod (101), and the elastic force direction of the pre-tightening spring (5) is vertical.
4. The PCB impedance testing jig according to claim 3, wherein first adjusting holes (302) are formed in both end portions of the cross beam (3), and the top end of the clamping longitudinal beam (2) is slidably inserted into the first adjusting holes (302).
5. The PCB impedance testing jig of claim 4, characterized in that the outer surface of each clamping longitudinal beam (2) is provided with a thread, and the top end of the clamping longitudinal beam (2) is sleeved with a locking nut (6) which is in threaded connection with the clamping longitudinal beam and is used for adjusting the connection height of the cross beam (3) and the clamping longitudinal beam (2).
6. The PCB impedance testing jig of claim 5, wherein a second adjusting hole (303) is formed in the middle of the cross beam (3), a clamping sleeve (7) is sleeved on the outer surface of the tester (4), the tester (4) penetrates into the second adjusting hole (303), and the clamping sleeve (7) simultaneously clamps the top surface and the bottom surface of the second adjusting hole (303).
7. The PCB impedance testing jig of claim 6, wherein the first adjusting hole (302) and the second adjusting hole (303) are both long sliding holes extending along the length direction of the cross beam (3).
8. The PCB impedance testing jig of any one of claims 1 to 7, wherein a mounting groove (102) for positioning and mounting the PCB is opened on the surface of the mounting seat (1), and an elastic gasket (103) for reducing the abrasion of the PCB is arranged on the surface of the mounting groove (102).
9. The PCB impedance test fixture according to claim 8, wherein mounting cylinders (104) are arranged on both sides of the surface of the mounting groove (102), and the bottom end of each clamping longitudinal beam (2) is respectively inserted into the corresponding mounting cylinder (104); the circumferential side wall of each mounting cylinder (104) is elastic so as to improve clamping force on the side edge of the PCB.
10. The PCB impedance testing jig of claim 9, wherein each mounting cylinder (104) is movably arranged on the surface of the mounting groove (102), and the moving direction of each mounting cylinder (104) is perpendicular to the length direction of the cross beam (3).
CN202010461841.8A 2020-05-27 2020-05-27 PCB impedance test fixture Pending CN111537864A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113740637A (en) * 2021-07-28 2021-12-03 苏州浪潮智能科技有限公司 Cable test fixture

Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN203433087U (en) * 2013-07-02 2014-02-12 苏州倍加福防爆电气有限公司 PCB board test device
CN203535082U (en) * 2013-10-29 2014-04-09 中芯国际集成电路制造(北京)有限公司 Cantilever probe device
CN204028112U (en) * 2014-08-08 2014-12-17 中国海洋石油总公司 A kind of lock pin test pen
CN104678181A (en) * 2015-03-23 2015-06-03 攀钢集团研究院有限公司 Method for measuring resistivity of steel rail
CN106093539A (en) * 2016-05-27 2016-11-09 国网山东省电力公司定陶县供电公司 Multi-functional test pencil
CN106249006A (en) * 2016-09-30 2016-12-21 乐依文半导体(东莞)有限公司 Test fixture and single back-shaped probe of tail thereof
CN107942098A (en) * 2016-10-13 2018-04-20 天津华迈科技有限公司 A kind of circuit board detecting fixing device
CN207798896U (en) * 2018-01-30 2018-08-31 深圳智锐通科技有限公司 A kind of VRM voltage modules test fixture
CN208125816U (en) * 2018-04-27 2018-11-20 张家港康得新光电材料有限公司 A kind of impedance measurement jig
CN208689090U (en) * 2018-07-18 2019-04-02 绵阳市长力科技有限公司 A kind of probe test platform of adjustable distance
CN209041802U (en) * 2018-11-13 2019-06-28 苏州恒则成精密橡塑有限公司 It is a kind of to enhance elastic rubber circle for nested mandrel
CN209086279U (en) * 2018-09-27 2019-07-09 深圳赛意法微电子有限公司 On-line testing fixture
CN210347716U (en) * 2019-07-11 2020-04-17 苏州中科芯联智能科技有限公司 Impedance test fixture suitable for rigid printed circuit board PCBA mainboard
CN210347715U (en) * 2019-07-10 2020-04-17 烟台前海电子工程有限公司 PCB fixing device convenient to PCB detects
CN111157880A (en) * 2020-01-06 2020-05-15 苏州浪潮智能科技有限公司 PCB integrated circuit board signal line LOSS testing arrangement
CN210572411U (en) * 2019-09-09 2020-05-19 昆山市千鹤电子有限公司 PCB fixing device convenient to PCB detects

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN203433087U (en) * 2013-07-02 2014-02-12 苏州倍加福防爆电气有限公司 PCB board test device
CN203535082U (en) * 2013-10-29 2014-04-09 中芯国际集成电路制造(北京)有限公司 Cantilever probe device
CN204028112U (en) * 2014-08-08 2014-12-17 中国海洋石油总公司 A kind of lock pin test pen
CN104678181A (en) * 2015-03-23 2015-06-03 攀钢集团研究院有限公司 Method for measuring resistivity of steel rail
CN106093539A (en) * 2016-05-27 2016-11-09 国网山东省电力公司定陶县供电公司 Multi-functional test pencil
CN106249006A (en) * 2016-09-30 2016-12-21 乐依文半导体(东莞)有限公司 Test fixture and single back-shaped probe of tail thereof
CN107942098A (en) * 2016-10-13 2018-04-20 天津华迈科技有限公司 A kind of circuit board detecting fixing device
CN207798896U (en) * 2018-01-30 2018-08-31 深圳智锐通科技有限公司 A kind of VRM voltage modules test fixture
CN208125816U (en) * 2018-04-27 2018-11-20 张家港康得新光电材料有限公司 A kind of impedance measurement jig
CN208689090U (en) * 2018-07-18 2019-04-02 绵阳市长力科技有限公司 A kind of probe test platform of adjustable distance
CN209086279U (en) * 2018-09-27 2019-07-09 深圳赛意法微电子有限公司 On-line testing fixture
CN209041802U (en) * 2018-11-13 2019-06-28 苏州恒则成精密橡塑有限公司 It is a kind of to enhance elastic rubber circle for nested mandrel
CN210347715U (en) * 2019-07-10 2020-04-17 烟台前海电子工程有限公司 PCB fixing device convenient to PCB detects
CN210347716U (en) * 2019-07-11 2020-04-17 苏州中科芯联智能科技有限公司 Impedance test fixture suitable for rigid printed circuit board PCBA mainboard
CN210572411U (en) * 2019-09-09 2020-05-19 昆山市千鹤电子有限公司 PCB fixing device convenient to PCB detects
CN111157880A (en) * 2020-01-06 2020-05-15 苏州浪潮智能科技有限公司 PCB integrated circuit board signal line LOSS testing arrangement

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113740637A (en) * 2021-07-28 2021-12-03 苏州浪潮智能科技有限公司 Cable test fixture
CN113740637B (en) * 2021-07-28 2023-11-03 苏州浪潮智能科技有限公司 Cable test fixture

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