CN111157880A - PCB integrated circuit board signal line LOSS testing arrangement - Google Patents
PCB integrated circuit board signal line LOSS testing arrangement Download PDFInfo
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- CN111157880A CN111157880A CN202010009371.1A CN202010009371A CN111157880A CN 111157880 A CN111157880 A CN 111157880A CN 202010009371 A CN202010009371 A CN 202010009371A CN 111157880 A CN111157880 A CN 111157880A
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- 238000012360 testing method Methods 0.000 title claims abstract description 73
- 239000000523 sample Substances 0.000 claims abstract description 57
- 239000011810 insulating material Substances 0.000 claims description 8
- 238000010586 diagram Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- ZHBBDTRJIVXKEX-UHFFFAOYSA-N 1-chloro-2-(3-chlorophenyl)benzene Chemical compound ClC1=CC=CC(C=2C(=CC=CC=2)Cl)=C1 ZHBBDTRJIVXKEX-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000005457 optimization Methods 0.000 description 2
- TVEXGJYMHHTVKP-UHFFFAOYSA-N 6-oxabicyclo[3.2.1]oct-3-en-7-one Chemical compound C1C2C(=O)OC1C=CC2 TVEXGJYMHHTVKP-UHFFFAOYSA-N 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The invention discloses a LOSS testing device for a signal line of a PCB (printed circuit board), which comprises a base, a cross beam, clamping arms and a clamping device, wherein a probe is arranged in the clamping device, the lower end of the probe extends out of the clamping device, the clamping device is arranged on the cross beam, the clamping arms are distributed on two sides of the clamping device, and the distance between the clamping arms on the two sides is equal to the width of the PCB; the base is arranged at the lower part of the cross beam, and the PCB is placed on the base; the improved hanging device is characterized in that hanging holes are formed in two ends of the cross beam, hanging rods corresponding to the hanging holes are arranged on two sides of the base, tension springs are arranged on the hanging rods, one ends of the tension springs are hung on the hanging rods, and the other ends of the tension springs are hung inside the hanging holes. According to the invention, the clamping device is arranged on the cross beam, the probe is arranged in the clamping device, the clamping arms are arranged on two sides of the clamping device, the PCB is clamped by the clamping arms, and meanwhile, the probe is kept in contact with the test point of the PCB by the tension spring, so that the accuracy of test data is ensured.
Description
Technical Field
The invention belongs to the technical field of board card testing, and particularly relates to a LOSS testing device for a signal line of a PCB board card.
Background
At present, the transmission rate of signal lines in a PCB card is higher and higher, so LOSS (LOSS) parameters of the signal lines of the card are more and more important. The loss reflects the quality of a transmission signal of the PCB board card, so research and development testers have higher and higher test requirements on the PCB board, the management and control of the PCB loss is a very important link in the product design stage, the PCB is the basis of the server, and in order to ensure the stable operation of the server, a large amount of tests need to be carried out on the PCB board card so as to ensure the qualified rate of the PCB.
The existing PNA (network analyzer, obtaining S parameters and used for testing the LOSS of a PCB (printed circuit board)) is used for testing the LOSS and is a four-port network, the LOSS corresponds to four test points correspondingly, the existing test probe generally uses a differential line, the differential line consists of two single-end lines, interfaces corresponding to four ports of the PNA are arranged on the probe, four lines correspond to the four interfaces on the PNA instrument, and then four probes contact the four test points on the PCB to test the LOSS. The contact strength of the probe and the PCB board card has great influence on the test result, and if the contact is not tight, the measured data may be inaccurate, so that the final test result is influenced.
Disclosure of Invention
The invention aims to overcome the defects in the prior art and provide a LOSS testing device for a signal line of a PCB (printed circuit board), wherein a clamping device is arranged on a cross beam, a probe is arranged in the clamping device, clamping arms are arranged on two sides of the clamping device, the PCB is clamped by the clamping arms, and meanwhile, the probe is kept in contact with a test point of the PCB by a tension spring, so that the accuracy of test data is ensured.
In order to achieve the purpose, the invention adopts the technical scheme that:
a LOSS testing device for signal lines of a PCB (printed circuit board) comprises a base, a cross beam, clamping arms and a clamping device, wherein probes are arranged in the clamping device, the lower ends of the probes extend out of the clamping device, the clamping device is installed on the cross beam, the clamping arms are distributed on two sides of the clamping device, the distance between the clamping arms on the two sides is equal to the width of the PCB, and the clamping effect of the clamping arms on the PCB is guaranteed; the base is arranged at the lower part of the cross beam, and the PCB is placed on the base, so that the stability of the PCB is ensured; the utility model discloses a PCB integrated circuit board, including crossbeam, base, peg, extension spring, bracing piece, the crossbeam both ends are equipped with the hanging hole, the base both sides are equipped with the peg corresponding with the hanging hole position, be equipped with the extension spring on the peg, extension spring one end is hung and is leaned on the peg, and the extension spring other end is hung and is leaned on inside the hanging hole, and the pulling force of extension spring makes the crossbeam possess decurrent pretightning force, has guaranteed the test point keep in touch on probe and the PCB integrated.
As a further preference of the technical scheme, the base is provided with a groove, the PCB is placed in the groove, and the groove limits the PCB, so that the PCB is prevented from shaking during testing, and the testing accuracy is ensured; the inside rubber pad that is equipped with of recess has avoided PCB integrated circuit board bottom wearing and tearing.
As a further optimization of the technical scheme, the clamping arm and the base are both made of insulating materials, so that the clamping arm and the base are prevented from influencing a test result.
As a further preferred option of the technical scheme, a first chute is formed in the cross beam, the clamping device is installed inside the first chute, a limiting ring for limiting the clamping device to move up and down is arranged on the clamping device, the limiting ring is arranged on two sides of the cross beam in a row, the clamping device slides inside the first chute to measure test points at different positions, and therefore the applicability of the testing device is improved.
As a further preferred option of the technical scheme, second chutes are symmetrically arranged on two sides of the first chute, the clamp arms are mounted inside the second chutes, threads are arranged on the upper portions of the clamp arms, fastening bolts matched with the threads are arranged on the clamp arms and used for fixing the clamp arms after adjustment, the fastening bolts are respectively arranged on two sides of the cross beam, and the fastening bolts are butterfly nuts, so that the clamp arms can be quickly adjusted and fixed; the arm lock is at the inside horizontal slip of second spout, is convenient for adjust the interval between the arm lock of both sides, and the PCB integrated circuit board test that is applicable to different specifications is used, and according to the contact dynamics requirement between PCB integrated circuit board and probe, adjusts the height of arm lock and utilizes the fastening bolt of crossbeam both sides to screw up, has guaranteed the stability of PCB integrated circuit board and probe contact.
As a further preferred option of the technical scheme, the lower end of the clamping arm is provided with a clamping ring, the clamping ring is made of insulating materials, a clamping groove is formed in the clamping ring, the two sides of the PCB are clamped in the clamping groove, and the clamping stability between the clamping arm and the PCB is further guaranteed.
As a further preferred option of the technical scheme, slide rails are arranged on two sides of the base, slide blocks are arranged inside the slide rails, threaded holes which are communicated with each other are formed in the slide blocks, the hanging rods are connected inside the threaded holes of the slide blocks in a threaded mode, the distance between the two sets of testing devices is adjusted according to the positions of the two sets of testing points on the PCB board card, the hanging rods are used for tightly pushing the inner wall of the slide rails to fix the PCB board card, and the PCB board card testing device is suitable for testing and using.
As a further optimization of the technical scheme, the clamping device comprises a first circular tube, a second circular tube connected to the lower end of the first circular tube, and a conical end cap arranged at the lower end of the second circular tube, the limiting ring is mounted on the first circular tube, the first circular tube and the second circular tube are both of a hollow tube structure, the conical end cap is in threaded connection with the lower end of the second circular tube, and the probe is arranged inside the first circular tube and the second circular tube; the conical end cap is detachably connected with the second circular tube through threads, so that the probe can be replaced after being worn or damaged.
As a further preferred aspect of the present technical solution, a core tube is arranged inside the second circular tube, a pinhole is arranged on the core tube, the probe is installed inside the pinhole, and a boss is arranged at the lower end inside the second circular tube; the upper end of the core pipe is provided with a plurality of wedge blocks, the lower end of the core pipe is provided with two holding arms, the upper ends of the holding arms are fixedly connected with the core pipe, the lower ends of the holding arms are free ends, and the lower ends of the holding arms are sleeved with holding rings; the boss is provided with a spring, and the upper end of the spring is fixedly connected with the core pipe; a through hole is formed in one side of the second circular tube, a button is arranged in the through hole, and a bevel edge corresponding to the wedge block is arranged on one side of the button; the lower end of the embracing ring is in contact with the inner wall of the conical end cap; the button is pressed, the bevel edge is contacted with the wedge block, the core pipe moves downwards under the action of the wedge block, and the embracing ring is kept still under the interference of the inner wall of the conical end cap, so that the lower end of the embracing arm extends out of the embracing ring, the free end of the lower part of the embracing arm is opened, the length of the probe extending out of the conical end cap is adjusted, and the contact effect of the probe and a PCB (printed circuit board) is ensured; after the button is released, the core tube moves upwards under the action of the elastic force of the spring, so that the lower end of the embracing arm is clamped again by the embracing ring, and the shaking of the probe is avoided.
As a further preferred aspect of the present technical solution, the probe is a telescopic probe, which ensures the reliability of the contact between the probe and the measurement point.
The invention has the beneficial effects that:
1) the clamping device is arranged on the cross beam, the probe is installed inside the clamping device, the clamping arms are arranged on two sides of the clamping device, the PCB is clamped by the clamping arms, meanwhile, the probe is kept in contact with the test point of the PCB by the tension spring, and the accuracy of test data is guaranteed.
2) The groove is formed in the base, the PCB is placed in the groove, and the groove limits the PCB, so that the PCB is prevented from shaking during testing, and the testing accuracy is guaranteed; the rubber pad is arranged in the groove, so that the bottom of the PCB is prevented from being abraded.
3) The clamping arm and the base are made of insulating materials, so that the clamping arm and the base are prevented from influencing a test result.
4) Be equipped with first spout on the crossbeam, clamping device installs inside first spout, and clamping device is last to be equipped with two sets of spacing rings, and the both sides of crossbeam are listed as to the spacing ring branch, and clamping device slides in first spout is inside, measures the test point of different positions, has improved testing arrangement's suitability.
5) Second chutes are symmetrically arranged on two sides of the first chute, the clamping arms are arranged in the second chutes, threads are arranged on the upper portions of the clamping arms, two groups of fastening bolts are arranged on the clamping arms and are respectively arranged on two sides of the cross beam, and the fastening bolts are butterfly nuts, so that the clamping arms can be quickly adjusted and fixed; the arm lock is at the inside horizontal slip of second spout, is convenient for adjust the interval between the arm lock of both sides, and the PCB integrated circuit board test that is applicable to different specifications is used, and according to the contact dynamics requirement between PCB integrated circuit board and probe, adjusts the height of arm lock and utilizes the fastening bolt of crossbeam both sides to screw up, has guaranteed the stability of PCB integrated circuit board and probe contact.
6) The lower end of the clamping arm is provided with a clamping ring, the clamping ring is made of insulating materials, a clamping groove is formed in the clamping ring, the two sides of the PCB are clamped inside the clamping groove, and the stability of clamping between the clamping arm and the PCB is further guaranteed.
7) The base both sides are equipped with the slide rail, and the inside slider that is equipped with of slide rail is equipped with the screw hole that link up on the slider, and peg threaded connection is inside the screw hole of slider, according to the position of two sets of test points on the PCB integrated circuit board, adjusts two sets of testing arrangement's interval to utilize the tight slide rail inner wall in peg top to fix, be applicable to the PCB integrated circuit board test of different models and use.
8) The clamping device comprises a first circular pipe, a second circular pipe connected to the lower end of the first circular pipe, and a conical end cap arranged at the lower end of the second circular pipe, wherein a limiting ring is arranged on the first circular pipe, the first circular pipe and the second circular pipe are both of a hollow pipe structure, the conical end cap is in threaded connection with the lower end of the second circular pipe, and a probe is arranged in the first circular pipe and the second circular pipe; the conical end cap is detachably connected with the second circular tube through threads, so that the probe can be replaced after being worn or damaged.
9) A core pipe is arranged inside the second round pipe, a pinhole is arranged on the core pipe, the probe is installed inside the pinhole, and a boss is arranged at the lower end of the inside of the second round pipe; the upper end of the core pipe is provided with a plurality of wedge blocks, the lower end of the core pipe is provided with two holding arms, the upper ends of the holding arms are fixedly connected with the core pipe, the lower ends of the holding arms are free ends, and the lower ends of the holding arms are sleeved with holding rings; the boss is provided with a spring, and the upper end of the spring is fixedly connected with the core pipe; one side of the second circular tube is provided with a through hole, a button is arranged in the through hole, and one side of the button is provided with a bevel edge corresponding to the wedge block; the lower end of the embracing ring is contacted with the inner wall of the conical end cap; the button is pressed, the bevel edge is contacted with the wedge block, the core pipe moves downwards under the action of the wedge block, and the embracing ring is kept still under the interference of the inner wall of the conical end cap, so that the lower end of the embracing arm extends out of the embracing ring, the free end of the lower part of the embracing arm is opened, the length of the probe extending out of the conical end cap is adjusted, and the contact effect of the probe and a PCB (printed circuit board) is ensured; after the button is released, the core tube moves upwards under the action of the elastic force of the spring, so that the lower end of the embracing arm is clamped again by the embracing ring, and the shaking of the probe is avoided.
10) The probe is a telescopic probe, so that the contact reliability of the probe and the measuring point is ensured.
Drawings
FIG. 1 is a schematic structural diagram of a LOSS testing device for signal lines of a PCB card.
FIG. 2 is an assembly schematic diagram of a clamping arm and a clamping device in the LOSS testing device for the signal line of the PCB card.
Fig. 3 is a schematic structural diagram of a base in the LOSS test device for the signal line of the PCB board card of the present invention.
Fig. 4 is a schematic diagram of a beam structure in a PCB board signal line LOSS test device of the present invention.
Fig. 5 is a schematic diagram of a clamp arm structure in the PCB board signal line LOSS test device of the present invention.
Fig. 6 is a schematic view of the internal structure of a clamping device in the LOSS test device for the signal line of the PCB board card of the present invention.
FIG. 7 is a schematic diagram of a core tube structure of a PCB board signal line LOSS testing device of the present invention.
Fig. 8 is an exploded view of a second circular tube and a core tube in the PCB board signal line LOSS test device of the present invention.
In the figure: 1. a base; 101. a groove; 102. a rubber pad; 103. a slide rail; 104. a slider; 105. a hanging rod; 2. a cross beam; 201. a first chute; 202. a second chute; 203. hanging holes; 3. clamping arms; 301. fastening a bolt; 302. a snap ring; 303. a card slot; 4. a clamping device; 401. a first circular tube; 402. a limiting ring; 403. a second circular tube; 404. a tapered end cap; 405. a core tube; 406. a wedge block; 407. a button; 408. a bevel edge; 409. a spring; 410. an arm-embracing; 411. a boss; 412. a pinhole; 413. encircling; 5. a probe; 6. a PCB board card; 7. a tension spring;
Detailed Description
The technical solutions in the embodiments of the present invention are clearly and completely described below with reference to fig. 1 to 8, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it is to be understood that the terms "longitudinal", "lateral", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on those shown in the drawings, are merely for convenience of description of the present invention, and do not indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the present invention.
As shown in fig. 1, a LOSS testing device for a signal line of a PCB board card comprises a base 1, a beam 2, clamping arms 3 and a clamping device 4, wherein a probe 5 is arranged inside the clamping device 4, the lower end of the probe 5 extends out of the clamping device 4, the clamping device 4 is installed on the beam 2, the clamping arms 3 are distributed on two sides of the clamping device 4, the distance between the clamping arms 3 on two sides is equal to the width of the PCB board card 6, and the clamping effect of the clamping arms 3 on the PCB board card 6 is ensured; the base 1 is arranged at the lower part of the cross beam 2, and the PCB 6 is placed on the base 1, so that the stability of the PCB 6 is ensured; 2 both ends of crossbeam are equipped with hanging hole 203, 1 both sides of base are equipped with the peg 105 corresponding with hanging hole 203 position, be equipped with extension spring 7 on the peg 105, 7 one ends of extension spring are hung and are leaned on peg 105, and the 7 other ends of extension spring are hung and are leaned on inside hanging hole 203, and the pulling force of extension spring 7 makes crossbeam 2 possess decurrent pretightning force, has guaranteed test point keep in touch on probe 5 and the PCB integrated circuit board 6 to the accuracy of test data has been guaranteed.
As shown in fig. 3, in this embodiment, a groove 101 is formed in the base 1, the PCB board 6 is placed inside the groove 101, and the groove 101 limits the PCB board 6, so that the PCB board 6 is prevented from shaking during testing, and the accuracy of the testing is ensured; a rubber pad 102 is arranged in the groove 101, so that the bottom of the PCB board card 6 is prevented from being abraded.
In this embodiment, the clamping arm 3 and the base 1 are both made of insulating materials, so that the clamping arm 3 and the base 1 are prevented from influencing the test result.
As shown in fig. 2 and 4, in this embodiment, the cross beam 2 is provided with a first sliding groove 201, the clamping device 4 is installed inside the first sliding groove 201, the clamping device 4 is provided with a limit ring 402 for limiting the clamping device 4 to move up and down, the limit ring 402 is arranged on two sides of the cross beam 2, the clamping device 4 slides inside the first sliding groove 201, test points at different positions are measured, and the applicability of the testing device is improved.
In this embodiment, the second sliding grooves 202 are symmetrically arranged on two sides of the first sliding groove 201, the clamping arm 3 is installed inside the second sliding groove 202, the upper portion of the clamping arm 3 is provided with a thread, the clamping arm 3 is provided with a fastening bolt 301 in thread fit for fixing the clamping arm 3 after adjustment, the fastening bolt 301 is arranged on two sides of the cross beam 2, and the fastening bolt 301 is a butterfly nut, so that the clamping arm 3 can be adjusted and fixed quickly; arm lock 3 is at the inside horizontal slip of second spout 202, is convenient for adjust the interval between both sides arm lock 3, and the test that is applicable to the PCB integrated circuit board 6 of different specifications is used, and according to the contact dynamics requirement between PCB integrated circuit board 6 and probe 5, adjusts arm lock 3's height and utilizes the fastening bolt 301 of 2 both sides of crossbeam to screw up, has guaranteed the stability of PCB integrated circuit board 6 with the contact of probe 5.
As shown in fig. 5, in this embodiment, the lower end of the clamping arm 3 is provided with a snap ring 302, the snap ring 302 is made of an insulating material, the snap ring 302 is provided with a clamping groove 303, and two sides of the PCB board card 6 are clamped inside the clamping groove 303, so that the clamping stability between the clamping arm 3 and the PCB board card 6 is further ensured.
As shown in fig. 1 and 3, in this embodiment, two sides of the base 1 are provided with slide rails 103, a slider 104 is arranged inside the slide rail 103, a through threaded hole is formed in the slider 104, the hanging rod 105 is in threaded connection with the inside of the threaded hole of the slider 104, the distance between the two sets of testing devices is adjusted according to the positions of the two sets of testing points on the PCB board 6, and the hanging rod 105 is used for tightly supporting the inner wall of the slide rail 103 for fixing, so that the testing device is suitable for testing PCB board 6 of different models.
As shown in fig. 6, in this embodiment, the clamping device 4 includes a first circular tube 401, a second circular tube 403 connected to a lower end of the first circular tube 401, and a tapered end cap 404 disposed at a lower end of the second circular tube 403, the limit ring 402 is mounted on the first circular tube 401, the first circular tube 401 and the second circular tube 403 are both of a hollow tube structure, the tapered end cap 404 is in threaded connection with a lower end of the second circular tube 403, and the probe 5 is disposed inside the first circular tube 401 and the second circular tube 403; the removable threaded connection of the tapered end cap 404 to the second tube 403 facilitates replacement of the probe 5 when worn or damaged.
As shown in fig. 7 and 8, in this embodiment, a core tube 405 is disposed inside the second circular tube 403, a pinhole 412 is disposed on the core tube 405, the probe 5 is mounted inside the pinhole 412, and a boss 411 is disposed at the lower end inside the second circular tube 403; the upper end of the core tube 405 is provided with a plurality of wedge blocks 406, the lower end of the core tube 405 is provided with two holding arms 410, the upper ends of the holding arms 410 are fixedly connected with the core tube 405, the lower ends of the holding arms 410 are free ends, and the lower ends of the holding arms 410 are sleeved with holding rings 413; a spring 409 is arranged on the boss 411, and the upper end of the spring 409 is fixedly connected with the core tube 405; a through hole is formed in one side of the second circular tube 403, a button 407 is arranged in the through hole, and an inclined edge 408 corresponding to the wedge 406 is arranged on one side of the button 407; the lower end of the embracing ring 413 is in contact with the inner wall of the conical end cap 404; the button 407 is pressed, the bevel edge 408 is in contact with the wedge block 406, the core tube 405 moves downwards under the action of the wedge block 406, the embracing ring 413 is kept still under the interference of the inner wall of the conical end cap 404, so that the lower end of the embracing arm 410 extends out of the embracing ring 413, the free end of the lower part of the embracing arm 410 is opened, the length of the probe 5 extending out of the conical end cap 404 is adjusted, and the contact effect of the probe 5 and the PCB card 6 is ensured; after the button 407 is released, the core tube 405 moves upwards under the action of the elastic force of the spring 409, so that the lower end of the arm 410 is clamped again by the hoop 413, and the probe 5 is prevented from shaking.
In this embodiment, the probe 5 is a retractable probe 5, which ensures the reliability of the contact between the probe 5 and the measuring point.
The foregoing is merely exemplary and illustrative of the present invention and various modifications, additions and substitutions may be made by those skilled in the art to the specific embodiments described without departing from the scope of the present invention as defined in the accompanying claims.
Claims (10)
1. A LOSS testing device for signal lines of PCB boards comprises a base, a cross beam, clamping arms and a clamping device, wherein probes are arranged in the clamping device, and the lower ends of the probes extend out of the clamping device; the base is arranged at the lower part of the cross beam, and the PCB is placed on the base; the improved hanging device is characterized in that hanging holes are formed in two ends of the cross beam, hanging rods corresponding to the hanging holes are arranged on two sides of the base, tension springs are arranged on the hanging rods, one ends of the tension springs are hung on the hanging rods, and the other ends of the tension springs are hung inside the hanging holes.
2. The LOSS testing device for the PCB board signal line according to claim 1, wherein a groove is formed in the base, the PCB board is placed in the groove, and a rubber pad is arranged in the groove.
3. The LOSS testing device for the signal lines of the PCB board card as recited in claim 1, wherein the clamping arms and the base are made of an insulating material.
4. The LOSS testing device for the PCB board signal line according to claim 1, wherein the beam is provided with a first sliding groove, the clamping device is installed in the first sliding groove, the clamping device is provided with a limiting ring for limiting the clamping device to move up and down, and the limiting ring is arranged on two sides of the beam.
5. The device for testing the LOSS of the signal line of the PCB board card according to claim 4, wherein the first sliding groove is symmetrically provided with second sliding grooves at two sides, the clamping arm is installed inside the second sliding grooves, the upper part of the clamping arm is provided with threads, the clamping arm is provided with fastening bolts matched with the threads and used for fixing the clamping arm after adjustment, the fastening bolts are respectively arranged at two sides of the cross beam, and the fastening bolts are butterfly nuts.
6. The LOSS testing device for the signal lines of the PCB board card as claimed in any one of claims 1 to 5, wherein a snap ring is arranged at the lower end of the clamp arm, the snap ring is made of insulating material, a clamping groove is arranged on the snap ring, and two sides of the PCB board card are clamped in the clamping groove.
7. The LOSS testing device for the PCB board card signal line according to claim 6, wherein slide rails are arranged on two sides of the base, slide blocks are arranged inside the slide rails, threaded holes are formed in the slide blocks, and the hanging rods are in threaded connection inside the threaded holes of the slide blocks.
8. The LOSS testing device for the PCB board signal line according to claim 4, wherein the clamping device comprises a first circular tube, a second circular tube connected to the lower end of the first circular tube, and a tapered end cap disposed at the lower end of the second circular tube, the limiting ring is mounted on the first circular tube, the first circular tube and the second circular tube are both of a hollow tube structure, the tapered end cap is in threaded connection with the lower end of the second circular tube, and the probe is disposed inside the first circular tube and the second circular tube.
9. The LOSS testing device for the PCB board signal line according to claim 8, wherein a core tube is arranged inside the second round tube, a pinhole is arranged on the core tube, the probe is installed inside the pinhole, and a boss is arranged at the lower end of the inside of the second round tube; the upper end of the core pipe is provided with a plurality of wedge blocks, the lower end of the core pipe is provided with two holding arms, the upper ends of the holding arms are fixedly connected with the core pipe, the lower ends of the holding arms are free ends, and the lower ends of the holding arms are sleeved with holding rings; the boss is provided with a spring, and the upper end of the spring is fixedly connected with the core pipe; a through hole is formed in one side of the second circular tube, a button is arranged in the through hole, and a bevel edge corresponding to the wedge block is arranged on one side of the button; the lower end of the embracing ring is in contact with the inner wall of the conical end cap.
10. The LOSS testing device for the signal lines of the PCB board card as recited in claim 1, wherein the probe is a pogo pin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010009371.1A CN111157880A (en) | 2020-01-06 | 2020-01-06 | PCB integrated circuit board signal line LOSS testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010009371.1A CN111157880A (en) | 2020-01-06 | 2020-01-06 | PCB integrated circuit board signal line LOSS testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111157880A true CN111157880A (en) | 2020-05-15 |
Family
ID=70561514
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010009371.1A Withdrawn CN111157880A (en) | 2020-01-06 | 2020-01-06 | PCB integrated circuit board signal line LOSS testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111157880A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111537864A (en) * | 2020-05-27 | 2020-08-14 | 浪潮电子信息产业股份有限公司 | PCB impedance test fixture |
| CN111735993A (en) * | 2020-08-21 | 2020-10-02 | 深圳市森美协尔科技有限公司 | Triaxial probe clamp for wafer |
| CN112363048A (en) * | 2020-11-23 | 2021-02-12 | 江西视晶光电有限公司 | Integrated circuit test needle bed |
| CN112834902A (en) * | 2020-12-31 | 2021-05-25 | 浙江水利水电学院 | Circuit board test fixture |
| CN113740637A (en) * | 2021-07-28 | 2021-12-03 | 苏州浪潮智能科技有限公司 | Cable test fixture |
| CN114034886A (en) * | 2021-09-23 | 2022-02-11 | 中国船舶重工集团公司第七0九研究所 | Test connector with self-adaptive adjustment of pin pitch |
-
2020
- 2020-01-06 CN CN202010009371.1A patent/CN111157880A/en not_active Withdrawn
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111537864A (en) * | 2020-05-27 | 2020-08-14 | 浪潮电子信息产业股份有限公司 | PCB impedance test fixture |
| CN111735993A (en) * | 2020-08-21 | 2020-10-02 | 深圳市森美协尔科技有限公司 | Triaxial probe clamp for wafer |
| CN112363048A (en) * | 2020-11-23 | 2021-02-12 | 江西视晶光电有限公司 | Integrated circuit test needle bed |
| CN112363048B (en) * | 2020-11-23 | 2024-01-23 | 优百顺集团有限公司 | Integrated circuit test needle bed |
| CN112834902A (en) * | 2020-12-31 | 2021-05-25 | 浙江水利水电学院 | Circuit board test fixture |
| CN113740637A (en) * | 2021-07-28 | 2021-12-03 | 苏州浪潮智能科技有限公司 | Cable test fixture |
| CN113740637B (en) * | 2021-07-28 | 2023-11-03 | 苏州浪潮智能科技有限公司 | Cable test fixture |
| CN114034886A (en) * | 2021-09-23 | 2022-02-11 | 中国船舶重工集团公司第七0九研究所 | Test connector with self-adaptive adjustment of pin pitch |
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Application publication date: 20200515 |
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