CN219201843U

CN219201843U - Device for testing and checking circuit board

Info

Publication number: CN219201843U
Application number: CN202320364610.4U
Authority: CN
Inventors: 曾庆锋; 张洪凌; 杨绿竹; 朱利平; 代发友
Original assignee: Huizhou Shengmei Electronics Co ltd
Current assignee: Huizhou Shengmei Electronics Co ltd
Priority date: 2023-03-01
Filing date: 2023-03-01
Publication date: 2023-06-16
Anticipated expiration: 2033-03-01

Abstract

The utility model relates to a test and inspection device for a circuit board, which comprises: base, testboard, lifter plate, limiting plate and testboard, interval sets up from top to bottom through lifter plate and base, the lifter plate drives the probe on the testboard and passes spacing hole and do the direction motion that is close to or keep away from the testboard, like this, when carrying out the circuit board test, place the circuit board on the testboard, when lifter plate drives testboard and probe and moves down and pass spacing hole, the lateral wall activity butt in outside surface and the spacing hole of testboard can play the effect of spacing direction, thereby the probe on the testboard can accurately contact with the circuit board after continuing to move down, can detect the circuit board well. When the transverse position or the longitudinal position of the test board changes, the test board cannot pass through the limiting hole, so that the problem that the probe on the test board cannot be aligned with the circuit board accurately can be avoided, and the accuracy of circuit board detection is improved.

Description

Device for testing and checking circuit board

Technical Field

The utility model relates to the technical field of circuit board detection, in particular to a testing and checking device for a circuit board.

Background

The PCB board, chinese name printed circuit board, also called printed circuit board, the circuit board is as the support body of important electronic components, is the carrier of electronic components electrical interconnection.

In order to ensure that the output circuit board is qualified, defect inspection is required to be carried out on the circuit board in the production process, the circuit board with abnormal functions is prevented from flowing into subsequent procedures, a test tool is required to be used for detection, the design principle of the test tool is that a test needle bed is used for simulating the whole machine to be connected with the circuit board, when the tested circuit board is pressed onto the test tool, an input end, an output end, a power end and a ground end on the tool are connected onto the circuit board, the circuit board can work normally, the circuit board can output corresponding signals to the output load on the tool according to the control function of the circuit board during the test, and a tester can judge whether the circuit board works normally or not according to the output signals.

When the existing circuit board detection device detects, the pressed probe cannot be well aligned with a bonding pad on the circuit board, the detection efficiency is affected, and the large-scale test requirement cannot be met.

Disclosure of Invention

Based on this, it is necessary to provide a test and inspection device for a wiring board.

The technical scheme for solving the technical problems is as follows: a circuit board test verification device, comprising: the device comprises a base, a test bench, a lifting plate, a limiting plate and a test plate;

the lifting plate and the base are arranged at intervals up and down, and the lifting plate moves along the direction approaching to or away from the base;

the test bench is arranged on the base, the limiting plate and the test bench are arranged at intervals up and down, and the limiting plate is provided with limiting holes;

the test board is arranged on one face of the lifting board, which faces the test board, a plurality of probes are arranged on one face of the test board, which faces the test board, the test board movably penetrates through the limiting hole, the outer side surface of the test board is movably abutted to the side wall of the limiting hole, and each probe is used for being movably abutted to a circuit board placed on the test board.

In one embodiment, support columns are arranged on the base at intervals, a first end of each support column is connected with the base, and a second end of each support column is connected with the limiting plate.

In one embodiment, guide posts are arranged on the base at intervals, guide holes are formed in the lifting plate, the lifting plate is sleeved on the guide posts through the guide holes, and the outer side surfaces of the guide posts are movably abutted to the side walls of the guide holes.

In one embodiment, the limiting plate is provided with an abutting block, and the abutting block is movably abutted with the lifting plate.

In one embodiment, a buffer layer is provided on a side of the abutment block facing the lifter plate.

In one embodiment, the buffer layer is a silicone layer.

In one embodiment, a sliding groove is formed in the base, a sliding block is arranged on the test bench, and the sliding block is arranged in the sliding groove in a sliding mode.

In one embodiment, a limiting column is arranged on the base, and one side of the test bench is movably abutted with the limiting column.

The beneficial effects of the utility model are as follows: according to the circuit board testing and checking device, the lifting plate and the base are arranged at intervals up and down, and the lifting plate drives the probes on the testing plate to move in the direction of approaching or separating from the testing table through the limiting holes, so that when the circuit board is tested, the circuit board is placed on the testing table, and when the lifting plate drives the testing plate and the probes to move downwards through the limiting holes, the outer side surface of the testing plate is movably abutted with the side wall of the limiting holes, so that the limiting and guiding effects can be achieved, and the probes on the testing plate can accurately contact with the circuit board after moving downwards, and can be well detected. When the transverse position or the longitudinal position of the test board changes, the test board cannot pass through the limiting hole, so that the problem that the probe on the test board cannot be aligned with the circuit board accurately can be avoided, and the accuracy of circuit board detection is improved.

Drawings

FIG. 1 is a schematic diagram of a circuit board test verification device according to one embodiment;

fig. 2 is a schematic structural view of a limiting plate according to an embodiment.

In the drawing, 10, a circuit board test and inspection device; 100. a base; 200. a test bench; 300. a lifting plate; 310. a guide post; 400. a limiting plate; 401. a limiting hole; 410. a support column; 420. an abutment block; 500. a test board; 510. and (3) a probe.

Detailed Description

It should be noted that, without conflict, the embodiments of the present utility model and features of the embodiments may be combined with each other. The technical solution of the present utility model will be further described below with reference to the accompanying drawings of the embodiments of the present utility model, and the present utility model is not limited to the following specific embodiments.

It should be understood that the same or similar reference numerals in the drawings of the embodiments correspond to the same or similar components. In the description of the present utility model, it should be understood that, if there are terms such as "upper", "lower", "front", "rear", "left", "right", "top", "bottom", etc., that indicate an azimuth or a positional relationship based on the directions or the positional relationships shown in the drawings, it is only for convenience of describing the present utility model and simplifying the description, but not for indicating or suggesting that the apparatus or element to be referred to must have a specific azimuth, be constructed and operated in a specific azimuth, so that the terms describing the positional relationship in the drawings are merely for exemplary illustration and should not be construed as limitations of the present patent, and that the specific meanings of the terms described above may be understood by those skilled in the art according to specific circumstances.

In one embodiment, as shown in fig. 1 and 2, a test verification device 10 for a circuit board, comprises: base 100, test bench 200, lifting plate 300, limiting plate 400 and test plate 500; the lifting plate 300 is arranged at an up-down interval with the base 100, and the lifting plate 300 moves along a direction approaching or separating from the base 100; the test bench 200 is arranged on the base 100, the limiting plate 400 and the test bench 200 are arranged at intervals up and down, and the limiting plate 400 is provided with a limiting hole 401; the test board 500 is disposed on a surface of the lifting board 300 facing the test board 200, a plurality of probes 510 are disposed on a surface of the test board 500 facing the test board 200, the test board 500 movably penetrates through the limiting hole 401, the outer side surface of the test board 500 is movably abutted to the side wall of the limiting hole 401, and each probe 510 is used for movably abutted to a circuit board placed on the test board 200.

In this embodiment, the lifting plate 300 is disposed at an upper and lower interval with the base 100, the width of the test plate 500 is matched with the width of the limiting hole 401, the lifting plate 300 drives the probe 510 on the test plate 500 to move in a direction of approaching or separating from the test board 200 through the limiting hole 401, so that the probe 510 on the test plate 500 can be driven to contact with a circuit board placed on the test board 200 for testing, when the circuit board is tested, the circuit board is placed on the test board 200, the lifting plate 300 drives the test plate 500 and the probe 510 to move downwards to pass through the limiting hole 401, and the outer side surface of the test plate 500 is movably abutted with the side wall of the limiting hole 401, so that the effect of limiting guide can be achieved, and the probe 510 on the test plate 500 can be accurately contacted with the circuit board after continuing to move downwards, so that the circuit board can be well detected. When the transverse position or the longitudinal position of the test board 500 changes, the test board 500 cannot pass through the limiting hole 401, so that the problem that the probe 510 on the test board 500 cannot be aligned with the circuit board accurately can be avoided, and the accuracy of circuit board detection is improved.

It should be noted that, the lifting plate 300 drives the probe 510 on the test plate 500 to move in a direction approaching or moving away from the test table 200 through the limiting hole 401, and the probe 510 on the test plate 500 can be driven by a driver, for example, the driver is an air cylinder, and the air cylinder is installed above the base 100 through an external fixing structure, so that the reciprocating movement of the probe 510 on the test plate 500 can be realized.

To fix the limiting plate 400 to the base 100, in one embodiment, as shown in fig. 1, support columns 410 are disposed on the base 100 at intervals, a first end of the support columns 410 is connected to the base 100, and a second end of the support columns 410 is connected to the limiting plate 400. Specifically, the number of the support columns 410 is set to be plural, each support column 410 is divided into two groups, the two groups of support columns 410 are arranged at intervals, the test bench 200 is located between the two groups of support columns 410, one group of support columns 410 is connected with the first end of the limiting plate 400, the other group of support columns 410 is connected with the second end of the limiting plate 400, so that the limiting plate 400 can be fixed on the base 100, and the limiting hole 401 is located above the test bench 200.

In an embodiment, the side wall of the limiting hole 401 is provided with a guide block, the test board 500 is provided with a guide groove, the guide block is aligned with the guide groove, and the guide block is movably abutted to the side wall of the guide groove, so that the effect of limiting and guiding can be further achieved, and the probe 510 on the test board 500 can be accurately contacted with the circuit board after moving downwards, and the circuit board can be better detected.

In order to enable the lifting plate 300 to be lifted smoothly. In one embodiment, as shown in fig. 1, guide posts 310 are disposed on the base 100 at intervals, guide holes are formed in the lifting plate 300, the lifting plate 300 is sleeved on the guide posts 310 through the guide holes, and the outer side surfaces of the guide posts 310 are movably abutted to the side walls of the guide holes. Specifically, the number of the guide posts 310 is set to be multiple, each guide post 310 is divided into two groups, the two groups of guide posts 310 are arranged at intervals, the test bench 200 and the limiting plate 400 are located between the two groups of guide posts 310, guide holes are correspondingly formed in two ends of the lifting plate 300, the guide posts 310 are inserted into the guide holes, and the outer side surfaces of the guide posts 310 are movably abutted to the side walls of the guide holes, so that when the lifting plate 300 is driven to move downwards, the lifting plate 300 can stably drive the test plate 500 and the probes 510 to move downwards.

To avoid excessive abutment of the probe 510 with the circuit board. In one embodiment, as shown in fig. 2, the limiting plate 400 is provided with an abutment block 420, and the abutment block 420 is movably abutted against the lifting plate 300. Specifically, the limiting plate 400 is provided with the abutting blocks 420 on the surface facing the lifting plate 300, the limiting plate 400 is movably abutted with the abutting blocks 420, the downward moving distance of the limiting plate 400 can be limited, excessive abutting of the probes 510 and the circuit board placed on the test bench 200 can be avoided, the effect of protecting the probes 510 can be achieved, the number of the abutting blocks 420 is two, the two abutting blocks 420 are distributed on two ends of the limiting plate 400 at intervals, and the limiting plate 400 can be stably supported.

In one embodiment, the abutting block 420 is provided with a buffer layer on a side facing the lifting plate 300. Specifically, through setting up the buffer layer, can avoid limiting plate 400 direct with butt piece 420 contact, can play the effect of buffering, can avoid the impact force that moves down to cause the damage to limiting plate 400, play the effect of protection limiting plate 400. Further, the buffer layer is a silica gel layer, and the silica gel has good elasticity and can play a role in buffering well.

To better place the circuit board on the test station 200. In one embodiment, the base 100 is provided with a sliding slot, and the test bench 200 is provided with a sliding block, and the sliding block is slidably disposed in the sliding slot. Specifically, the sliding direction of the test board 200 on the base 100 is perpendicular to the lifting direction of the lifting board 300, so that the circuit board needs to be detected, the test board 200 is far away from the limiting board 400 by sliding the test board 200, the circuit board can be better placed on the test board 200, and then the test board 200 is moved to enable the circuit board to be located below the limiting board 400, that is, the circuit board is aligned with the limiting hole 401, so that the circuit board can be taken and placed conveniently.

In one embodiment, the base 100 is provided with a limiting post, and one side of the test bench 200 is movably abutted against the limiting post. Specifically, by providing the limit post, the limit post is abutted with the test board 200, the sliding position of the test board 200 can be defined, and alignment of the test board 200 and the limit board 400 can be facilitated, i.e., the circuit board on the test board 200 can be aligned with the limit hole 401 on the limit board 400.

It is to be understood that the above examples of the present utility model are provided by way of illustration only and not by way of limitation of the embodiments of the present utility model. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the utility model are desired to be protected by the following claims.

Claims

1. A test and inspection apparatus for a circuit board, comprising: the device comprises a base, a test bench, a lifting plate, a limiting plate and a test plate;

2. The device for testing and inspecting circuit boards according to claim 1, wherein the base is provided with supporting columns at intervals, a first end of each supporting column is connected with the base, and a second end of each supporting column is connected with the limiting plate.

3. The device for testing and inspecting circuit boards according to claim 1, wherein guide posts are arranged on the base at intervals, guide holes are formed in the lifting plate, the lifting plate is sleeved on the guide posts through the guide holes, and the outer side surfaces of the guide posts are movably abutted with the side walls of the guide holes.

4. The device for testing and inspecting circuit boards according to claim 3, wherein the limiting plate is provided with an abutting block, and the abutting block is movably abutted with the lifting plate.

5. The test and inspection device for circuit boards according to claim 4, wherein a buffer layer is provided on a face of the abutting block facing the lifting plate.

6. The device of claim 5, wherein the buffer layer is a silicone layer.

7. The device for testing and inspecting circuit boards according to claim 1, wherein the base is provided with a chute, the test board is provided with a slide block, and the slide block is slidably disposed in the chute.

8. The device for testing and inspecting circuit boards according to claim 7, wherein the base is provided with a limiting post, and one side of the test bench is movably abutted against the limiting post.