CN207067200U - Probe switching device and PCB testing impedance machines - Google Patents
Probe switching device and PCB testing impedance machines Download PDFInfo
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- CN207067200U CN207067200U CN201720954329.0U CN201720954329U CN207067200U CN 207067200 U CN207067200 U CN 207067200U CN 201720954329 U CN201720954329 U CN 201720954329U CN 207067200 U CN207067200 U CN 207067200U
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Abstract
The utility model provides a kind of probe switching device and PCB testing impedance machines, and the probe switching device includes：Supporter (10)；First probe portion, relative support body (10) are movably arranged, and the first probe portion has at least two first test positions, the first probe portion can between at least two first test positions mobile handoff；At least two second probe portions, relative support body (10) is movably arranged, each second probe portion has the second test position coordinated with the first probe portion and avoids the avoidance position that the first probe portion and remaining second probe portion coordinate, and the second probe portion in the second test position and can avoid mobile handoff between position.The utility model effectively solve the problems, such as in the prior art switch probe when need change probe assembly dismounting it is cumbersome, measuring accuracy is low, can be achieved automatic test.
Description
Technical field
It the utility model is related to PCB technical field of measurement and test, and in particular to a kind of probe switching device and PCB testing impedances
Machine.
Background technology
At present, PCB testing impedances machine includes probe assembly, and probe assembly includes probe base and is fixed on probe base and uses
Spacing between a pair of probes of test PCB difference, a pair of probes is fixed, and high-frequency resistance test is needed two spies
Pin short circuit (turns on probe circuit), and short circuit is carried out by short circuit copper sheet between two probes.Test after difference, it is necessary to hand
It is dynamic to disassemble the probe assembly on test machine, change for testing single-ended probe assembly.When probe assembly needs switching,
All it is manually to disassemble whole probe assembly, dismounting is cumbersome, reduces testing efficiency, it is necessary to make more probes, cost
It is higher, and replacing can frequently wear and cause rigging position inaccurate, so as to cause measuring accuracy to reduce.
Utility model content
Main purpose of the present utility model is to provide a kind of probe switching device and PCB testing impedance machines, existing to solve
Have and dismantle the problem of cumbersome, measuring accuracy is low when probe assembly is changed in technology.
To achieve the above object, the utility model provides a kind of probe switching device, including：Supporter；First probe
Portion, relative support body are movably arranged, and the first probe portion has at least two first test positions, and the first probe portion can be at least
Mobile handoff between two the first test positions；At least two second probe portions, relative support body are movably arranged, and each second
Probe portion has the second test position coordinated with the first probe portion and avoids the first probe portion matches somebody with somebody with remaining second probe portion
The avoidance position of conjunction, the second probe portion can the second test position and avoid position between mobile handoff.
Further, probe switching device also includes the first driving for being arranged on supporter and being connected with the first probe portion
Mechanism, the first drive mechanism drive the first probe portion to be switched between at least two first test positions.
Further, the first drive mechanism drives the first probe portion to move linearly in the horizontal direction.
Further, probe switching device also includes the connection being connected between the first drive mechanism and the first probe portion
Portion, the first drive mechanism drive the first probe portion to move by the way that drive connection portion is mobile in the horizontal direction.
Further, the first drive mechanism is linear electric motors, and connecting portion is fixed in the output end of linear electric motors, or,
First drive mechanism is cylinder, and connecting portion is fixed on the piston rod of cylinder, or, the first drive mechanism includes motor and ball
Leading screw, the output shaft of motor and the screw rod of ball-screw are connected, and connecting portion is fixed on the nut of ball-screw.
Further, the first drive mechanism is fixed on the upper surface of supporter, one end of connecting portion and the first drive mechanism
Connection, the other end of connecting portion are connected through supporter with the first probe portion of the lower section positioned at supporter.
Further, the first probe portion includes the first probe base and the first probe, and the first probe base is fixed on connecting portion,
First probe is arranged on the first probe base.
Further, probe switching device also includes the second drive mechanism being connected with each second probe portion, and second drives
Motivation structure drives each second probe portion to be switched between the second test position and avoidance position.
Further, the second drive mechanism drives the second probe portion vertically to move, and avoids position higher than the second inspection
Location is put and the first test position.
Further, the second drive mechanism is the switching part being fixed on connecting portion, and switching part has climbing structure, is being cut
Change in the moving process in portion, climbing structure jacks up the second probe portion so that the second probe portion switches to avoidance from the second test position
Position.
Further, the number in the second probe portion be two, two the second probe portions with the first probe portion coordinate with
Test two kinds of different pieces of informations.
Further, switching part have two be obliquely installed relative to vertical direction and inclined-plane that its incline direction is opposite and
The plane being connected between two inclined-planes, two inclined-planes formed climbing structures and respectively with the voussoir in two the second probe portions
Inclined-plane is coordinated to coordinate.
Further, probe switching device also includes one-to-one with least two second probe portions at least two installations
Support, mounting bracket are relatively fixed setting with supporter, and the second probe portion can be movably disposed relative to mounting bracket.
Further, the second probe portion includes the second probe base, the second probe, guide rod and voussoir, the second probe and leads
It is each attached to bar on the second probe base, mounting bracket has the pilot hole coordinated with guide rod, and switching part, which has, supplies guide rod
The elongated hole worn, moving direction extension of the elongated hole along switching part, guide rod sequentially passes through and leads away from second probe base one end
Voussoir is provided with after to hole and elongated hole, voussoir is supported on the outside of elongated hole.
Further, the second probe portion also includes applying pressure to the second probe base so that the reset that the second probe base resets
Part.
Further, return unit for suit on the guide bar and the spring between the second probe base and mounting bracket.
Further, probe switching device also includes the displacement transducer for being used to detect the moving displacement in the first probe portion,
In detection, the first drive mechanism adjusts the spacing between one in the first probe portion and at least two second probe portions to examine
Survey the data of different spacing.
Further, displacement transducer is laser sensor.
The utility model also provides a kind of PCB testing impedances machine, including：Probe switching device, probe switching device are upper
The probe switching device stated.
Technical solutions of the utility model, have the following advantages that：First probe locations are at least two first test positions
First the first test position when, first the second probe portion in the first probe portion and at least two second probe portions coordinates
Detected, remaining second probe portion, which is in, avoids position；After having detected, the first probe portion is moved to second first
Test position, the second probe portion coordinates with second the second probe portion to be detected, and remaining second probe portion, which is in, avoids position
Put；The detection process of first probe portion other positions is same as described above, is no longer described in detail herein.Said structure need not be dismantled
Probe portion, it is only necessary to move back and forth the first probe portion and the second probe portion, it is possible to switching is realized, it is effective to improve test
Effect, and then avoid because frequently replacing probe generation abrasion causes the low situation of measuring accuracy, so as to improve measuring accuracy.
Brief description of the drawings
, below will be right in order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art
The required accompanying drawing used is briefly described in embodiment or description of the prior art, it should be apparent that, describe below
In accompanying drawing be some embodiments of the present utility model, for those of ordinary skill in the art, do not paying creativeness
On the premise of work, other accompanying drawings can also be obtained according to these accompanying drawings.In the accompanying drawings：
Fig. 1 shows the dimensional structure diagram of the embodiment according to probe switching device of the present utility model；
Fig. 2 shows the schematic diagram of another angle of Fig. 1 probe switching device；
Fig. 3 shows the dimensional structure diagram of the switching part of Fig. 2 probe switching device；
Fig. 4 shows the dimensional structure diagram of the connecting portion of Fig. 2 probe switching device；
Fig. 5 shows dimensional structure diagram of Fig. 1 probe switching device with displacement transducer and rotating disk；
Fig. 6 shows the schematic front view of Fig. 5 probe switching device.
Wherein, the reference in above-mentioned accompanying drawing is：
10th, supporter；20th, linear electric motors；31st, the first probe base；32nd, the first probe；41st, the second probe base；42nd, second
Probe；43rd, guide rod；44th, voussoir；45th, return unit；50th, switching part；51st, inclined-plane；52nd, plane；53rd, elongated hole；60th, connecting portion；
70th, mounting bracket；80th, displacement transducer；90th, rotating disk.
Embodiment
The technical solution of the utility model is clearly and completely described below in conjunction with accompanying drawing, it is clear that described
Embodiment is the utility model part of the embodiment, rather than whole embodiments.Based on the embodiment in the utility model, sheet
The every other embodiment that field those of ordinary skill is obtained under the premise of creative work is not made, belongs to this practicality
Novel protected scope.
As shown in figure 1, the probe switching device of the present embodiment includes：Supporter 10, the first probe portion and at least two
Two probe portions, the first probe portion relative support body 10 are movably arranged, and the first probe portion has at least two first test positions,
First probe portion can between at least two first test positions mobile handoff；Each second probe portion relative support body 10 is removable
Dynamic to set, each second probe portion has the second test position coordinated with the first probe portion and avoids the first probe portion and remaining
The second probe portion coordinate avoidance position, the second probe portion can the second test position and avoid position between mobile handoff.
Using the probe switching device of the present embodiment, the first probe locations at least two first test positions first
During individual first test position, the first probe portion coordinates with first the second probe portion at least two second probe portions to be examined
Survey, remaining second probe portion, which is in, avoids position；After having detected, the first probe portion is moved to second the first detecting position
Put, the second probe portion coordinates with second the second probe portion to be detected, and remaining second probe portion, which is in, avoids position；First
The detection process of probe portion other positions is same as described above, is no longer described in detail herein.Said structure need not dismantle probe portion,
Only need to move back and forth the first probe portion and the second probe portion, it is possible to switching is realized, it is effective to improve test effect, enter
And avoid causes the low situation of measuring accuracy due to frequently changing probe generation abrasion, so as to improve measuring accuracy.It is also, above-mentioned
Structure avoids the situation using multipair probe in the prior art, and then can reduce probe using the multiple form of a correspondence
Number so that visit testing cost substantially reduce.
In the present embodiment, probe switching device also includes for being arranged on supporter 10 and being connected with the first probe portion
One drive mechanism, the first drive mechanism drive the first probe portion to be switched between at least two first test positions.Pass through
First drive mechanism drives the movement of the first probe portion, and realization is automatically controlled and switched so that testing efficiency and precision greatly improve.
First drive mechanism drives the first probe portion to move linearly in the horizontal direction, and multiple test positions in the first probe portion are located at one
It is simple in construction on straight line, it is easy to remove.
In the present embodiment, probe switching device also includes the company being connected between the first drive mechanism and the first probe portion
Socket part 60, the first drive mechanism drive the first probe portion to move by the way that drive connection portion 60 is mobile in the horizontal direction.Connecting portion 60
Play a part of connecting the first drive mechanism and the first probe portion, connection is easy.Certainly, the first drive mechanism can also directly with
First probe portion connects.
In the present embodiment, the first drive mechanism is linear electric motors 20, and connecting portion 60 is fixed on the output of linear electric motors 20
On end.Probe can carry out stepless switching by motor, greatly improve measuring accuracy.Certainly, the first drive mechanism also may be used
So that using structures such as cylinder, hydraulic cylinder, rack-and-pinion, worm and gears, when the first drive mechanism is cylinder, connecting portion is fixed on gas
On the piston rod of cylinder.It is appreciated that in other embodiments, the first drive mechanism can also include motor and ball-screw, electricity
The output shaft of machine and the screw rod of ball-screw are connected, and connecting portion is fixed on the nut of ball-screw.
In the present embodiment, as shown in Figure 1 and Figure 4, the first drive mechanism is fixed on the upper surface of supporter 10, connecting portion
60 one end is connected with the first drive mechanism, and the other end of connecting portion 60 is through supporter 10 and positioned at the lower section of supporter 10
First probe portion connects.Structure, characteristics of compact layout can so be simplified.Specifically, connecting portion is contiguous block.
In the present embodiment, the first probe portion includes the first probe base 31 and the first probe 32, and the first probe base 31 is fixed
On connecting portion 60, the first probe 32 is arranged on the first probe base 31.
In the present embodiment, probe switching device also includes the second drive mechanism being connected with each second probe portion, the
Two drive mechanisms drive each second probe portion to be switched between the second test position and avoidance position.Pass through the second driving
Mechanism drives the movement of the second probe portion, and realization is automatically controlled and switched, effective to improve testing efficiency and precision.
In the present embodiment, the second drive mechanism drives the second probe portion vertically to move, and avoids position higher than the
Two test positions and the first test position.It is simple in construction, it is easy to remove.Specifically, the second drive mechanism is to be fixed on connecting portion
Switching part 50 on 60, switching part 50 has climbing structure, and in the moving process of switching part 50, climbing structure jacks up second and visited
Pin portion avoids position so that the second probe portion switches to from the second test position.Linear electric motors 20 can both drive the first probe portion
Switching position, the second probe portion switching position, the movement in the first probe portion and the movement in the second probe portion can also be driven simultaneously
A motor is shared, simplifies the overall structure of probe switching device, substantially reduces cost.
In the present embodiment, the number in the second probe portion is two, and two the second probe portions are not matched somebody with somebody with the first probe portion
Close to test two kinds of different pieces of informations.Because error of measurement timesharing needs two probes all connecting cables, when surveying single-ended in two probes only
There is a probe connecting cable, therefore, high frequency cable is connected in a second probe portion and the first probe portion, another second spy
Cable is not connected in pin portion, oneself between two the second probe portions is then realized by motor driving the first probe portion movement
Dynamic switching, and then realize and survey the single-ended and switching of difference.
As shown in Figures 2 and 3, there are switching part 50 two to be obliquely installed relative to vertical direction and its incline direction is opposite
Inclined-plane 51 and the plane 52 that is connected between two inclined-planes 51, two inclined-planes 51 formed climbing structures and respectively with two second
Cooperation inclined-plane on the voussoir 44 in probe portion coordinates.Voussoir 44 when a second probe portion and an inclined-plane on switching part 50
During cooperation, voussoir 44 and the plane on switching part 50 in another the second probe portion coordinate, during switching part 50 moves,
The voussoir 44 in one the second probe portion is slided at plane from an inclined-plane, and the voussoir 44 in another the second probe portion slides to from plane
On another inclined-plane of switching part 50.Coordinate the automatic switchover that probe can be achieved by switching part 50 and voussoir, it is simple in construction,
It is easy to operate.Certainly, switching part is it can also be provided that following structure：Switching part has spaced two planes and is connected to
Two inclined-planes between two planes, two inclined-planes are obliquely installed relative to vertical direction and its incline direction is on the contrary, switching part
Structure be also not limited to this.
Specifically, switching part 50 is switch boards, and switch boards include two swash plates being oppositely arranged and are connected to two swash plates
Between flat board, two swash plates are upwardly and outwardly obliquely installed relative to the center line of flat board.Certainly, the cooperation of switch boards and voussoir
Mode can also be substituted by other mechanisms such as cam, connecting rod.
In the present embodiment, as shown in figure 1, probe switching device also includes corresponding with least two second probe portions
At least two mounting brackets 70, mounting bracket 70 and supporter 10 be relatively fixed setting, and the second probe portion can be relative to installation
Support 70 is movably disposed.Setting for mounting bracket 70 can be in order to simplify the structure of supporter, while also allow for installation the
Two probe portions.Specifically, mounting bracket 70 is L-shaped.
In the present embodiment, as shown in Figure 1 to Figure 3, the second probe portion includes the second probe base 41, the second probe 42, led
To bar 43 and voussoir 44, the second probe 42 and guide rod 43 are each attached on the second probe base 41, and mounting bracket 70 has with leading
The pilot hole coordinated to bar 43, switching part 50 have the elongated hole 53 worn for guide rod 43, shifting of the elongated hole 53 along switching part 50
Dynamic direction extension, guide rod 43 sequentially pass through pilot hole and elongated hole 53 away from the one end of the second probe base 41 after be provided with voussoir 44,
Voussoir 44 is supported on the outside of elongated hole 53.Guide rod is vertically arranged, and guide rod coordinates with pilot hole plays a part of guiding.Cutting
During the portion of changing moves horizontally, guide rod changes in the position of elongated hole.
In the present embodiment, the second probe portion also includes applying pressure to the second probe base 41 so that the second probe base 41 is multiple
The return unit 45 of position.Return unit 45 can ensure that the second probe portion is in the stability of test position, ensure measuring accuracy.Specifically
Ground, return unit 45 are to be sleeved on the spring on guide rod 43 and between the second probe base 41 and mounting bracket 70.Spring makes
With conveniently, cost is cheap.It is of course also possible to use other elastic devices replace spring.
In the present embodiment, supporter 10 is support disk, and disc structure is simple, also allows for installing other portions such as motor
Part.Specifically, mounting bracket 70 is arranged on the lower surface of supporter 10.
In the present embodiment, the second probe is provided with short-contact metal piece, during test the second probe by short-contact metal piece with
First probe short circuit.Short-contact metal piece is preferably short circuit copper sheet.
In the present embodiment, probe switching device also includes the displacement sensing for being used to detect the moving displacement in the first probe portion
Device 80, in detection, the first drive mechanism adjusts the spacing between one in the first probe portion and at least two second probe portions
To detect the data of different spacing.Moved by motor drive connection block, and then drive the first probe 32 to move, in the first probe
32 and first the second probe coordinate when being detected, motor adjusts the spacing between the first probe and first probe, displacement
Sensor can detect the moving displacement of the first probe 32, and then test the data of different spacing, and different spacing are surveyed so as to realize
Data when need not change probe.As shown in Figure 5 and Figure 6, probe switching device also includes being arranged on the rotation above support disk
Rotating disk 90, rotating disk 90 are supported on support disk by multiple pillars, and displacement transducer 80 is fixed on the following table of rotating disk 90
On face, motor and part contiguous block are between support disk and rotating disk.Specifically, displacement transducer 80 is laser sensing
Device.It is of course also possible to use other displacement transducers replace laser sensor.
Probe unit is substantially using manual or fixed probe spacing test mode, manual test in the prior art
When, the pressure on pcb board is different so that test result is unstable, measuring accuracy is low, poor repeatability, testing efficiency every time for probe
Lowly；During using fixed probe spacing test, need to change because probe spacing is fixed, during the pcb board impedance for surveying different spacing
Probe so that testing efficiency can not improve, and due to needing the probe of a large amount of different spacing of making, greatly improve impedance survey
The cost of examination.Therefore, compared with prior art in manual test or the test of fixed probe spacing, probe switching of the present utility model
Device can test the PCB impedances (containing difference and single-ended) of any spacing, realize stepless speed changing adjustment, it substantially has advantages below：
1st, automaticity is high, without carrying out probe replacing according to different probe spacing, directly by devices such as motors when extremely short
The interior adjustment for completing the spacing between two probes；2nd, the stepless changing of the spacing between two probes, can no longer make
The probe groups of different spacing, because the price of probe groups is higher, substantial amounts of side view cost can be saved；3rd, PLC or software are passed through
The fine adjustment of spacing between control probe can greatly improve the accuracy and measuring accuracy of test；4th, due to automation
Degree is high, can greatly promote the reliability, repeatability and testing efficiency of test result.
The course of work of the probe switching device in the present embodiment is illustrated below in conjunction with Fig. 1 to Fig. 3, for ease of
Description, replace the first probe and probe A with probe B and probe C replaces two the second probes and is described, motor drive connection block
Mobile, switch boards and contiguous block move together so that probe B is close to probe A or probe C.When probe B is close to probe A, due to
The lower plane of the effect voussoir of spring and the upper horizontal plane contact with switch boards, make probe A and probe B needle point in same level
On face, simultaneously because the effect on the inclined-plane of switch boards moves up probe C by voussoir so that probe C needle point is higher than spy
Pin A and probe B horizontal plane, can now carry out pcb board testing impedance with probe A and probe B, regulation probe A and probe B it
Between spacing, test the data of different spacing.Conversely, when probe B is close to probe C, PCB can be carried out with probe B and probe C
Plate testing impedance, the spacing between probe B and probe C is adjusted, test the data of different spacing.In this way, it is achieved that probe hinders
The automatic stepless switching of anti-test so that testing efficiency greatly improves, and need not prepare multigroup probe groups so that probe test
Cost substantially reduces.
The utility model also provides a kind of PCB testing impedances machine, and it includes：Probe switching device, probe switching device are
Above-mentioned probe switching device.
, it is necessary to explanation in description of the present utility model, term " " center ", " on ", " under ", it is "left", "right", " perpendicular
Directly ", the orientation of the instruction such as " level ", " interior ", " outer " or position relationship are based on orientation shown in the drawings or position relationship, are only
Described for the ease of description the utility model and simplifying, rather than instruction or imply signified device or element must have it is specific
Orientation, with specific azimuth configuration and operation, therefore it is not intended that to limitation of the present utility model.In addition, term " the
One ", " second ", " the 3rd " are only used for describing purpose, and it is not intended that instruction or hint relative importance.
Obviously, above-described embodiment is only intended to clearly illustrate example, and is not the restriction to embodiment.It is right
For those of ordinary skill in the art, can also make on the basis of the above description it is other it is various forms of change or
Change.There is no necessity and possibility to exhaust all the enbodiments.And the obvious change thus extended out or
Among the protection domain that variation is created still in the utility model.
Claims (19)
- A kind of 1. probe switching device, it is characterised in that including：Supporter (10)；First probe portion, relatively described supporter (10) are movably arranged, and the first probe portion has at least two first inspections Location is put, the first probe portion can between at least two first test position mobile handoff；At least two second probe portions, relatively described supporter (10) are movably arranged, each second probe portion have with it is described The second test position and avoid what the first probe portion coordinated with remaining described second probe portion that first probe portion coordinates Position is avoided, the second probe portion can be in second test position and the mobile handoff between avoiding position.
- 2. probe switching device according to claim 1, it is characterised in that the probe switching device also includes being arranged on The first drive mechanism being connected on the supporter (10) and with the first probe portion, described in first drive mechanism driving First probe portion switches between at least two first test positions.
- 3. probe switching device according to claim 2, it is characterised in that the first drive mechanism driving described first Probe portion moves linearly in the horizontal direction.
- 4. probe switching device according to claim 3, it is characterised in that the probe switching device also includes being connected to Connecting portion (60) between first drive mechanism and the first probe portion, first drive mechanism pass through described in driving Connecting portion (60) is mobile in the horizontal direction to drive the first probe portion movement.
- 5. probe switching device according to claim 4, it is characterised in that first drive mechanism is linear electric motors (20), the connecting portion (60) is fixed in the output end of the linear electric motors (20), or, first drive mechanism is gas Cylinder, the connecting portion (60) are fixed on the piston rod of the cylinder, or, first drive mechanism includes motor and ball Leading screw, the output shaft of the motor are connected with the screw rod of the ball-screw, and the connecting portion (60) is fixed on the ball wire On the nut of thick stick.
- 6. probe switching device according to claim 4, it is characterised in that first drive mechanism is fixed on the branch The upper surface of support body (10), one end of the connecting portion (60) are connected with first drive mechanism, the connecting portion (60) The other end is connected through the supporter (10) with the first probe portion of the lower section positioned at the supporter (10).
- 7. probe switching device according to claim 4, it is characterised in that the first probe portion includes the first probe base (31) it is fixed on the first probe (32), first probe base (31) on the connecting portion (60), first probe (32) On first probe base (31).
- 8. probe switching device according to claim 4, it is characterised in that the probe switching device also include with it is each Second drive mechanism of the second probe portion connection, each second probe portion of the second drive mechanism driving is described Switched between second test position and the avoidance position.
- 9. probe switching device according to claim 8, it is characterised in that the second drive mechanism driving described second Probe portion vertically moves, and the avoidance position is higher than second test position and first test position.
- 10. probe switching device according to claim 9, it is characterised in that second drive mechanism is is fixed on The switching part (50) on connecting portion (60) is stated, the switching part (50) has climbing structure, the movement in the switching part (50) During, the climbing structure jacks up the second probe portion so that the second probe portion switches from second test position To the avoidance position.
- 11. probe switching device according to claim 10, it is characterised in that the number in the second probe portion is two Individual, two second probe portions do not coordinate with the first probe portion to test two kinds of different pieces of informations.
- 12. probe switching device according to claim 11, it is characterised in that the switching part (50) has two relatively In the inclined-plane (51) that vertical direction is obliquely installed and its incline direction is opposite and it is connected to flat between two inclined-planes (51) Face (52), two inclined-planes (51) formed the climbing structure and respectively with the voussoir (44) in two the second probe portions Cooperation inclined-plane coordinate.
- 13. probe switching device according to claim 10, it is characterised in that the probe switching device also include with extremely Few two one-to-one at least two mounting brackets (70) in the second probe portion, the mounting bracket (70) and the support Body (10) is relatively fixed setting, and the second probe portion can be movably disposed relative to the mounting bracket (70).
- 14. probe switching device according to claim 13, it is characterised in that the second probe portion includes the second probe Seat (41), the second probe (42), guide rod (43) and voussoir (44), second probe (42) and the guide rod (43) are solid It is scheduled on second probe base (41), the mounting bracket (70) has the pilot hole coordinated with the guide rod (43), institute Stating switching part (50) has the elongated hole (53) worn for the guide rod (43), and the elongated hole (53) is along the switching part (50) Moving direction extension, remote described second probe base (41) one end of the guide rod (43) sequentially pass through the pilot hole with The elongated hole (53) is provided with the voussoir (44) afterwards, and the voussoir (44) is supported on the outside of the elongated hole (53).
- 15. probe switching device according to claim 14, it is characterised in that the second probe portion is also included to described Second probe base (41) applies pressure so that the return unit (45) that second probe base (41) resets.
- 16. probe switching device according to claim 15, it is characterised in that the return unit (45) is described to be sleeved on Spring on guide rod (43) and between second probe base (41) and the mounting bracket (70).
- 17. probe switching device according to claim 2, it is characterised in that the probe switching device also includes being used for The displacement transducer (80) of the moving displacement in the first probe portion is detected, described in the first drive mechanism regulation described in detection Spacing between first probe portion and one at least two second probe portions is to detect the data of different spacing.
- 18. probe switching device according to claim 17, it is characterised in that institute's displacement sensors (80) are laser Sensor.
- A kind of 19. PCB testing impedances machine, it is characterised in that including：Probe switching device, the probe switching device are right It is required that the probe switching device any one of 1 to 18.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720954329.0U CN207067200U (en) | 2017-08-01 | 2017-08-01 | Probe switching device and PCB testing impedance machines |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720954329.0U CN207067200U (en) | 2017-08-01 | 2017-08-01 | Probe switching device and PCB testing impedance machines |
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| Publication Number | Publication Date |
|---|---|
| CN207067200U true CN207067200U (en) | 2018-03-02 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720954329.0U Withdrawn - After Issue CN207067200U (en) | 2017-08-01 | 2017-08-01 | Probe switching device and PCB testing impedance machines |
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| Country | Link |
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| CN (1) | CN207067200U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107315099A (en) * | 2017-08-01 | 2017-11-03 | 南京协辰电子科技有限公司 | Probe switching device and PCB testing impedance machines |
| CN113625012A (en) * | 2021-08-06 | 2021-11-09 | 深圳市鸿发鑫科技有限公司 | Detection equipment with irregular part fixing device |
-
2017
- 2017-08-01 CN CN201720954329.0U patent/CN207067200U/en not_active Withdrawn - After Issue
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107315099A (en) * | 2017-08-01 | 2017-11-03 | 南京协辰电子科技有限公司 | Probe switching device and PCB testing impedance machines |
| WO2019024360A1 (en) * | 2017-08-01 | 2019-02-07 | 南京协辰电子科技有限公司 | Probe changing device and pcb impedance tester |
| CN113625012A (en) * | 2021-08-06 | 2021-11-09 | 深圳市鸿发鑫科技有限公司 | Detection equipment with irregular part fixing device |
| CN113625012B (en) * | 2021-08-06 | 2024-05-10 | 深圳市鸿发鑫科技有限公司 | Detection equipment with irregular part fixing device |
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