WO2013167567A1 - Verfahren zum herstellen eines bauelementträgers, einer elektronischen anordnung und einer strahlungsanordnung und bauelementträger, elektronische anordnung und strahlungsanordnung - Google Patents
Verfahren zum herstellen eines bauelementträgers, einer elektronischen anordnung und einer strahlungsanordnung und bauelementträger, elektronische anordnung und strahlungsanordnung Download PDFInfo
- Publication number
- WO2013167567A1 WO2013167567A1 PCT/EP2013/059445 EP2013059445W WO2013167567A1 WO 2013167567 A1 WO2013167567 A1 WO 2013167567A1 EP 2013059445 W EP2013059445 W EP 2013059445W WO 2013167567 A1 WO2013167567 A1 WO 2013167567A1
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- WIPO (PCT)
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- contact
- component carrier
- electronic component
- lead frame
- contact element
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4821—Flat leads, e.g. lead frames with or without insulating supports
- H01L21/4828—Etching
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49568—Lead-frames or other flat leads specifically adapted to facilitate heat dissipation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
- H01L33/644—Heat extraction or cooling elements in intimate contact or integrated with parts of the device other than the semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
- H01L2224/48471—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area being a ball bond, i.e. wedge-to-ball, reverse stitch
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48475—Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball
- H01L2224/48476—Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area
- H01L2224/48477—Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding)
- H01L2224/48478—Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball
- H01L2224/48479—Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball on the semiconductor or solid-state body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12044—OLED
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0066—Processes relating to semiconductor body packages relating to arrangements for conducting electric current to or from the semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0075—Processes relating to semiconductor body packages relating to heat extraction or cooling elements
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49121—Beam lead frame or beam lead device
Definitions
- the invention relates to a method for producing a component carrier for an electronic component, in which a leadframe section is provided.
- Lead frame section has an electrically conductive
- the lead frame portion further includes a first contact portion for forming a first contact portion
- At least the receiving area and the second contact portion are electrically conductive with each other
- the invention relates to a method for producing an electronic device having, for example, the component carrier, and a method for
- Radiation arrangement comprising, for example, the component carrier, and / or the electronic device, the
- the component carrier for example, has the component carrier.
- German priority application DE 10 2012 207 519.4 which expressly forms part of the disclosure of the present
- Component carrier an electronic device and a
- To component carrier such as housing, for example
- Radiation arrangements such as LEDs
- LEDs are often required that the LEDs are easy to contact, that the heat generated in the LED's during operation can be removed quickly and effectively and that the entire radiation arrangement of LED and component carrier is simple and inexpensive to produce.
- conventional component carriers are among others
- One of the electrical contacts can have such a large area
- An LED for example a thin-film LED and / or a vertical LED (emission direction and / or power line perpendicular to
- Layer structure can be attached to the electrical contact so that it is fixed to the electrical contact and at the same time the electrical contact is given over the physical contact.
- Another contact of the LED can be contacted with the other electrical contact of the component carrier, for example by means of a
- the ceramic body electrically isolates the electrical contact to which the electronic component is attached and dissipates the heat from the electronic component. To further dissipate the heat from the component carrier can on a side opposite the electronic component side of the ceramic
- Support body to be formed on the support body metallization.
- the metallization can also serve for example for producing a solder joint.
- the component carrier with the ceramic carrier body can be placed on a printed circuit board, for example on an FR4 printed circuit board, so that the Carrier body between the electronic component and the circuit board is located. Which through the ceramic
- Support body extending therethrough electrical contacts are connected to tracks of the circuit board.
- the metallization is connected to thermal lines that extend through the circuit board and that can be connected to a heat sink.
- PCB contributes to a good, simple and easy
- the component carrier an electrically conductive, for example metal
- ladder frame section having to use ladder frame section. This is particularly easy and inexpensive to produce.
- the leadframe portion may be part of a leadframe and the component support may be fabricated in a component carrier assembly by all
- the lead frame section contacts the electronic component electrically and there is an electrical
- Heat sink to be electrically coupled in many applications is used to attach the
- Component carrier used for example a metal core circuit board, wherein the metal core of the circuit board of the electrical contacts of the circuit board by means of a
- Metal core circuit board may serve as a heat sink and / or an additional heat sink may be provided which is thermally coupled to the metal core.
- an electronic component may be used, for example a horizontal LED
- FR4 printed circuit board Connecting the component carrier to the heat sink a FR4 printed circuit board can be used.
- a method for producing a component carrier a method for producing an electronic arrangement and / or a
- Component carrier, an electronic device and / or a radiation arrangement provided that can be produced in a simple and cost-effective manner and / or enable a simple and cost-effective manner, a good electrical and thermal coupling of an electronic component with a circuit board and / or a heat sink.
- a method for manufacturing a component carrier for an electronic component is provided. This is a
- Ladder frame portion which is an electrical having conductive material.
- the lead frame portion further includes a first contact portion for forming a first electrical contact element, a second contact portion for forming a second electrical contact element, and a receiving area for receiving the electronic component. At least the receiving area and the second contact portion are electrically conductively connected to each other. At least on one
- Lead frame portion is formed a thermally conductive and electrically insulating intermediate member for dissipating heat from the receiving area and for electrically insulating the receiving area. At least on a side facing away from the receiving area of the intermediate element is a thermal contact for thermal contacting of
- Receiving area and the formation of the thermal contact s on the intermediate element help to be able to produce the component carrier easily and inexpensively, to dissipate heat generated during operation of the electronic component quickly and effectively and the component carrier in a simple and cost-effective manner with a good
- the electronic arrangement can be very good behavior
- the printed circuit board may be, for example, an FR1, FR2, FR3, FR4, FR5, CEM1, CEM2, CEM3, CEM4 or CEM5 printed circuit board.
- the component carrier may for example also be referred to as a housing, QFN housing or QFN carrier.
- the Leadframe portion may also be referred to as a QFN leadframe, for example.
- the component carrier with the electronic component can also be used as electronic
- the electronic component is, for example, a semiconductor chip and / or a light-emitting or light
- the heat sink may, for example, comprise aluminum.
- the component carrier can be coupled, for example, via the printed circuit board or directly to the heat sink.
- the component carrier can serve, for example, for receiving an electronic component.
- the component carrier with the electronic component can be as electronic
- the component positions with the electronic component can be referred to as a radiation arrangement if the electronic component has a radiation source, for example a light-emitting component.
- the lead frame portion comprises the electrically conductive material and / or may be formed of the electrically conductive material.
- the electrically conductive material comprises, for example, a metal, for example copper, for example CuW or CuMo, copper alloys, brass, nickel and / or iron, for example FeNi, and / or is formed therefrom.
- the leadframe portion is part of a leadframe having a plurality of leadframe portions connected to each other, each of which
- Lead frame sections may be formed, for example, for forming a de component carrier.
- the leadframe may extend over a plurality of component carriers, wherein the plurality of component carriers may be formed and / or fabricated simultaneously, thereby producing a component carrier assembly.
- the lead frame and / or the lead frame sections may for example be formed flat, which, for example means that the lead frame or each of the
- Lead frame sections compared with its length and its width has a relatively small thickness. Editing the leadframe section and thus the
- Fabrication of the component carrier may be representative of the processing of the leadframe and thus representative of the manufacture of the component carrier assembly.
- all the leadframe portions of the leadframe can be processed simultaneously in the same operations as with respect to the one leadframe portion
- Component carrier composite are separated, inter alia, the compounds of the leadframe sections
- the first contact element serves for contacting a first contact of the electronic component.
- the Contact element serves for contacting a second contact of the electronic component.
- the first and the second contact portion may, for example, side by side
- the receiving area may be formed between the two contact portions.
- Be arranged receiving portion which is formed between the first and the second contact portion.
- the intermediate element has, for example, a thickness between 1 and 1000 ⁇ m, for example between 10 and 200 ⁇ m, for example between 20 and 80 ⁇ m.
- the intermediate element has, for example, a thermal conductivity of between 0.1 and 100 W / mK, for example between 0.5 and 20 W / mK, for example between 1 and 5 W / mK.
- the intermediate element can already be structured on the
- Ladder frame section are applied.
- the material of the intermediate element by means of screen printing,
- the intermediate element can be applied flat to the leadframe section and then patterned.
- that can be
- Intermediate be applied as an intermediate layer, for example by means of printing, printing, casting or
- Laminating and for example by means of laser ablation or etching or mechanically, for example by milling or scratching, removed and structured in this way.
- the solderable thermal contact has, for example, a thickness between 0.1 and 100 ⁇ m, for example between 1 and 10 ⁇ m, for example about 5 ⁇ m.
- the thermal contact points are, for example, a thickness between 0.1 and 100 ⁇ m, for example between 1 and 10 ⁇ m, for example about 5 ⁇ m.
- a high thermal conductivity for example between 100 and 1000 W / mK, for example between 200 and 500 W / mK, for example between 250 and 400 W / mK.
- the thermal contact is like this, for example
- the thermal contact has, for example, metal,
- the thermal contact can be applied, for example, in a contact layer and then be patterned or applied structured.
- the thermal contact can be formed and / or structured for example with the aid of a photolithographic process and / or an etching process and / or the
- Thermal contact can be applied in a galvanic process.
- the intermediate element has, for example, a dielectric and / or, for example, an organic and / or a
- Dielectric ceramic particles and / or a ceramic particles having carrier mass are ceramic
- the carrier composition comprises epoxy resin, silicone and / or acrylic resin.
- the ceramic has alumina, quartz,
- the ⁇ is a ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇
- the metal on for example, the
- the first contact element and the second contact element from the
- the Contact element is physically separated from the second contact element.
- the first and the second contact element may be formed before and after the application of the intermediate element and / or separated from each other.
- the receiving region is for example after the formation or separation of the two contact elements in physical contact with the second contact element.
- the first contact element is physically separated from the second contact element by means of an etching process. This can contribute to a simple formation of the contact elements.
- Lead frame section formed an intermediate region for receiving the intermediate element.
- the intermediate area is optional and possibly before the application of the
- Intermediate element is formed and can before, during or after the formation and / or separation of the first and second
- the intermediate region can for example have a recess in the leadframe section or the intermediate region can have a taper at which the leadframe section has a smaller one Has thickness than at the first and / or second contact element.
- the ⁇ is a ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇
- the intermediate region can be formed in the same etching process in which the first and the second contact element are formed and / or separated from one another.
- the ⁇ is a ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇
- Intermediate layer or the thermal contact can be formed from the contact layer.
- the first and the second contact element are at least partially embedded in a molding material.
- the fact that the first and the second contact element are embedded in a molding material in this context means that the first and the second contact element at least partially of the
- the molding material may for example be a potting compound or a spray mass.
- the molding material may for example be an inorganic material, for example a
- Composite material for example epoxy resin, and / or
- Silicone have a silicone hybrid and / or a silicone-epoxy hybrid.
- the first and the second contact element may, for example, before or after the formation of the Intermediate area are embedded in the molding material.
- the first and the second contact element can, for example, before or after the formation of the intermediate element and / or before or after the formation of the thermal contact in the
- the molding material can serve, for example, the first and the second
- Form material serve to at least partially isolate the two electrical contacts to the outside.
- the ⁇ is a ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇
- Forming material used as an intermediate element For example, the molding material and the intermediate element can be formed in one step and / or from the same
- the molding material may form the intermediate element. This can help to form the intermediate element in a particularly simple and cost-effective manner.
- the ⁇ is a ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇
- Shaped molding material such that it has a receiving recess in which at least partially the first
- a method for producing an electronic device in which a component carrier is produced, for example, according to the method explained above and in which the electronic component is placed on the receiving region of the electronic component
- Component carrier is applied.
- a first electrical contact of the electronic component is contacted with the first contact element and a second electrical
- the first and / or the second electrical contact for example by means of bonding with the corresponding first and second contact element
- the electronic component is
- a light-emitting component for example, a light-emitting component
- an LED or OLED for example, an LED or OLED, or a light
- absorbent component for example a solar cell.
- Device is formed, for example, if the electronic component is a vertical LED, the contacting of the second contact with the second
- a method for producing a radiation arrangement in which an electronic arrangement is produced, for example, according to the method or methods explained above, wherein a radiation source is used as the electronic component.
- the radiation source is, for example, a light-emitting component, for example an OLED or an LED, for example a thin-film LED and / or, for example, a horizontal or vertical LED.
- Component carrier provided for receiving and contacting an electronic component.
- Component carrier has a lead frame section, a
- Lead frame portion has a first contact element, a second contact element and a receiving area.
- the first contact element is used to contact a first
- the receiving area serves to receive the electronic component.
- the second contact element serves to contact a second one Electrode of the electronic component.
- the receiving area and the second contact element are electrically conductive
- the intermediate element is used for
- the thermal contact is used for thermal contacting of the electronic component, for example via the intermediate element and the
- the thermal contact is arranged on a side remote from the receiving area side of the intermediate element on the intermediate element.
- the component carrier is
- the component carrier is
- component carrier and the electronic component are, for example, fastened together as described above and contacted with each other.
- Radiation arrangement comprising the component carrier and the electronic component, wherein the
- Component carrier, the electronic device and / or the radiation arrangement are transmitted.
- the differences achieved by the different methods and / or method steps Embodiments of the component carrier, the electronic device and / or the radiation arrangement constitute separate aspects of the invention. Embodiments of the invention are illustrated in the figures and are explained in more detail below.
- FIG. 1 shows an exemplary embodiment of electronic arrangements on a printed circuit board and a heat sink
- FIG. 1 shows another embodiment of electronic
- FIG. 3 shows a blank of an embodiment of a
- FIG. 4 shows the leadframe section in a first state during a first exemplary embodiment of a method for producing a component carrier
- FIG. 5 shows the leadframe section in a second state during the first exemplary embodiment of the method for producing a component carrier
- FIG. 6 shows the leadframe section in a third state during the first exemplary embodiment of the method for producing a component carrier
- FIG. 7 shows the leadframe section in a fourth state during the first exemplary embodiment of the method for producing a component carrier
- FIG. 8 shows the leadframe section in a first state during a second embodiment of the invention
- FIG. 9 shows the leadframe section in a second state during the second embodiment of FIG
- FIG. 10 shows the leadframe section in a third state during the second embodiment of FIG.
- FIG. 12 shows the leadframe section in a fifth state during the second embodiment of FIG.
- FIG. 13 shows the leadframe section in a first state during a third exemplary embodiment of the method for producing a component carrier
- FIG. 14 shows the leadframe section in a second state during the third embodiment of FIG
- FIG. 15 shows the leadframe section in a third state during the third embodiment of FIG
- FIG. 16 shows the leadframe section in a fourth state during the third embodiment of FIG
- FIG. 17 shows the leadframe section in a fifth state during the third embodiment of FIG.
- FIG. 18 shows the leadframe section in a sixth state during the third embodiment of FIG
- FIG. 2 shows the leadframe section in a first state during a fourth exemplary embodiment of the method for producing a component carrier.
- FIG. 20 shows the leadframe section in a second state during the fourth exemplary embodiment of FIG
- FIG. 21 shows the leadframe section in a third state during the fourth exemplary embodiment of FIG
- FIG. 22 shows the leadframe section in a fourth state during the fourth exemplary embodiment of FIG
- FIG. 23 shows the leadframe section in a fifth state during the fourth embodiment of FIG.
- FIG. 24 shows the leadframe section in a sixth state during the fourth exemplary embodiment of FIG
- FIG. 25 shows the leadframe section in a first state during a fifth embodiment of the invention
- FIG. 26 shows the leadframe section in a second state during the fifth exemplary embodiment of FIG
- FIG. 27 shows the leadframe section in a third state during the fifth exemplary embodiment of the method for producing a component carrier
- FIG. 28 shows the leadframe section in a fourth state during the fifth exemplary embodiment of the method for producing a component carrier
- FIG. 29 shows the leadframe section in a fifth state during the fifth exemplary embodiment of the method for producing a component carrier.
- a light emitting device may, in various embodiments, be a light emitting diode
- LED Light emitting diode
- OLED organic light emitting diode
- the light emitting device may be part of an integrated circuit in various embodiments. Furthermore, a plurality of light-emitting components may be provided, for example housed in a common housing.
- FIG. 1 shows two electronic arrangements 10 which are arranged on a printed circuit board 14. Alternatively, more or less electronic devices 10 may be arranged. A housing of the electronic devices 10 may also be referred to as a QFN package.
- Arrangements 10 may each have a component carrier and / or the component carrier may be the housing of the
- Arrangement 10 may be, for example, a semiconductor chip and / or for example a light-emitting component or a light-absorbing component, for example a
- the printed circuit board 14 is, for example, a FR4 circuit board or a FR5 circuit board. Alternatively, the printed circuit board 14 may be a metal core printed circuit board.
- the printed circuit board 14 has, for example, glass fiber mats which are embedded in a resin, for example epoxy resin.
- the printed circuit board 14 aluminum, copper, Al-SiC and / or AISi.
- the printed circuit board 14 has on its side facing the electronic assemblies 10 side
- the first interconnects 12 have, for example, copper or are formed from it.
- the electronic devices 10 are electrically connected to the first tracks 12 of the circuit board 14.
- the electronic devices 10 are connected to the first interconnects 12 via solder connections.
- the first interconnects 12 are partly for electrical contact and partly for thermal
- Thermal lines 16 extend through the printed circuit board 14. The thermal lines 16 are connected via some of the first tracks 12 to the electrical devices 10 for dissipating heat from the electronic devices 10. The thermal lines 16 are facing
- the thermal lines 16 serve to heat from the
- the printed circuit board 14 On its side remote from the electronic arrangements 10, the printed circuit board 14 has electrically conductive second printed conductors 20.
- the second interconnects 20 comprise copper or are formed therefrom.
- Conductor tracks 12, 20 have, for example, aluminum, copper, nickel, platinum, gold, silver and / or TiW.
- the printed circuit board 14 is thermally and mechanically coupled to a heat sink 18, for example via the second
- Conductor tracks 20 may be fixed to the second conductor tracks 20 on the heat sink 18 via a thermally and / or electrically conductive adhesive 22.
- the heat sink 18 has, for example, aluminum, nickel, iron or copper and / or, for example, alloys based on copper, nickel, iron and / or aluminum.
- FIG. 2 shows a further exemplary embodiment, in which the electrical arrangements 10 are coupled to the printed circuit board 14 and / or the heat sink 18.
- the printed circuit board 14 and the heat sink 18 may be formed according to the embodiment shown in Figure 1.
- the electronic devices 10 can be connected directly to the heat sink 18 or it can be dispensed with the heat sink 18, so that the circuit board 14 additionally assumes the function of a heat sink.
- the electronic assemblies 10 in this embodiment are radiation assemblies that are light
- the emitting components that emit electromagnetic radiation 24 have have.
- the emitting components that emit electromagnetic radiation 24 have have.
- the emitting components that emit electromagnetic radiation 24 have have.
- the electromagnetic radiation 24 in the direction away from the circuit board 14 and the heat sink 18, for example, parallel to a surface normal, which is perpendicular to the circuit board 14.
- Radiation 24 is for example light, for example UV light, infrared light and / or light in the visible range.
- FIG. 3 shows a blank for a leadframe section 30.
- the leadframe section 30 is a part of a leadframe, not fully illustrated, which has a plurality of corresponding leadframe sections 30. The manufacturing methods explained below are
- Lead frame portion 30 are representative of
- Lead frame sections 30 of the lead frame are connected to Lead frame.
- Lead frame sections 30 can thus be processed in the lead frame in the composite.
- the lead frame and in particular the lead frame section 30 are used in all of the manufacturing methods explained below as base and / or
- the leadframe can also act as a QFN leadframe
- the leadframe portion 30 includes, for example, a metal, such as copper, and / or is formed therefrom.
- the lead frame portion 30 has a high electrical
- the lead frame portion 30 has a high thermal conductivity. Furthermore, the
- Lead frame section 30 optionally be coated.
- Lead frame portion 30 has, for example, a thickness of 10 to 1000 pm, for example 100 to 500 pm,
- Lead frame section 30 serves as a carrier body for one of the component carriers.
- the lead frame thus has carrier body for a plurality of component carriers.
- the lead frame portion 30 has a first one
- the sections 32, 34, 26 and the receiving area 38 initially represent unprocessed sections or areas of the printed circuit board section 30 and serve for
- FIG. 4 shows a first state of the leadframe section 30 during the first exemplary embodiment of the method for producing the component carrier. Starting from the blank of the leadframe section 30 shown in FIG. 3, to achieve the state shown in FIG.
- Lead frame portion 30 at least one etching process
- a two-sided etching process is performed in which the blank of the leadframe portion 30 is etched from both sides.
- an etch stop material is applied to both sides of the lead frame portion 30, and subsequently, the lead frame portion 30 is etched from both sides, for example, in one operation.
- Lead frame portion 30 physically separated from each other, but may be connected together in the composite of the lead frame via adjacent, not shown, lead frame sections 30.
- the second contact element 44 is physically coupled to the receiving region 38 and is formed, for example, in one piece with the receiving region 38.
- Lead frame portion 30, an intermediate portion 48 is formed, which has a recess in the lead frame portion 30. Further, optionally at a transition from the second
- the intermediate region 48 and / or the further recess have a depth which corresponds, for example, to half the thickness of the leadframe section 30, the depth being, for example, up to 100 ⁇ m, for example up to 50 ⁇ m, for example up to 30 ⁇ m, of half the thickness of the leadframe section 30 may differ.
- the intermediate region 48 may be formed, for example, by drilling, grinding and / or embossing in the etching process
- Lead frame portion 30 are formed.
- FIG. 5 shows a second state of the
- the intermediate element 50 is, for example, a dielectric and / or has
- the intermediate element 50 has a carrier mass in which particles are embedded.
- the carrier material has
- a polymer such as epoxy resin
- alumina for example, alumina, quartz, aluminum nitride,
- the intermediate element 50 serves to electrically isolate the receiving region 38 and / or to remove heat from the receiving region 38.
- the intermediate element 50 can be introduced, for example, by means of dispensing or doctoring into the intermediate region 48. If necessary, the intermediate element 50 may be dried and / or hardened after being introduced into the intermediate region 48.
- the intermediate element 50 may for example have a thickness that corresponds to a depth of the intermediate region 48 and / or have a thickness that is half the thickness of the
- Lead frame portion 30 corresponds.
- FIG. 6 shows a third state of
- Form material 54 embedded lead frame portion 30 may be referred to as a component carrier. The in the
- Molding material 54 embedded lead frame can as
- Component carrier composite are called.
- the molding material 54 is formed, for example, by molding, for example transfer, or by overmolding the leadframe section with the molding material 54.
- the lead frame may include all
- Lead frame sections 30, each with two contact elements 44, 42 are inserted into a cast or molded body and then encapsulated with the liquid molding material 54 or
- the molding material 54 can be dried or cured.
- Shaped body is formed so that in the mold material 54, a receiving recess 56 is formed.
- Receiving recess 56 at least the receiving area 38 is exposed. Furthermore, in the receiving recess 56, the first and second contact elements 42, 44 may be at least partially exposed. In addition, the two contact elements 42, 44 on their side remote from the receiving recess 56 sides at least partially free of mold material 54th
- the intermediate region 48 can be kept free of molding material 54 during the formation of the molding material 54 and the
- Form material 54 are introduced into the intermediate region 48.
- thermal contact 52 is formed.
- the thermal contact 52 for example, as explained in more detail below, for example, with reference to Figures 12 and / or 17, are applied flat on the intermediate element 50 and / or the component carrier and below
- the thermal contact 52 are applied to the intermediate element 50.
- the thermal contact 52 is suitable for example to enter into a solder joint and can
- the thermal contact 52 has, for example, a metal, for example copper,
- the thermal contact 52 serves to thermally to the intermediate element 50 to contact. In addition, the thermal contact 52 serves to dissipate heat from the intermediate element 50.
- the thermal contact 52 constitutes a metallization of the intermediate element 50,
- FIG. 7 shows a fourth state of the component carrier during the first exemplary embodiment of the method for producing the component carrier, in which an electronic component 60 is applied to the receiving region 38.
- the component carrier with the electronic component 60 can also be referred to as an electronic device 10 or as an electronic component.
- the component carrier can serve as a housing for the electronic component.
- Electronic component 60 is for example a
- emissive component is, for example, an OLED or an LED, for example a vertically emitting OLED or LED, in which a preferred direction of the emitted
- electromagnetic radiation is perpendicular to layers of the layer structure of the LED.
- the electronic component 60 has, for example, on its side facing away from the lead frame section 30 side, a first electrical contact 62 and on a the
- first electrical contact 62 and the second electrical contact 66 at least one, for example a plurality of optical layers is formed.
- optically functional for example, are optically functional
- Device 60 is connected via a first bonding contact 70, an electrical line 72 and a second bonding contact 74 with the first electrical contact element 42 of the
- electrical contact 66 is in physical contact with the receiving area 38 of the leadframe portion 30
- Receiving portion 38 and thus the second electrical contact 66 of the electronic component 60 are electrically coupled to the second contact element 44.
- Receiving portion 38 of the leadframe portion 30 for both the mechanical and for the electrical coupling of the electronic component 60 to the circuit board portion 30. During operation of the electronic component 60, heat may be generated by the leadframe portion 30 in the
- Recording area 38 is recorded.
- the heat can be dissipated via the intermediate element 50 to the thermal contact 52.
- the intermediate element 50 forms an electrical insulation of the receiving region 38 of the thermal contact 52 and thus an electrical insulation of the thermal contact 52 of the electronic component 60th
- the electronic component 60 is arranged in the receiving recess 56 of the molding material 54.
- the receiving recess 56 may otherwise be filled, for example, with a filling material, for example with a light-scattering material.
- the electronic component 60 in the receiving recess 56 in a filling material in a filling material
- leadframe sections 30 from the leadframe or the component carrier from the Component carrier composite are separated, for example by means of cutting or sawing.
- FIGS. 8 to 12 show different states of the leadframe section 30 and of the component carrier during a second exemplary embodiment of the method for
- FIG. 8 shows a first state of the leadframe section 30 or of the component carrier during the second
- Component carrier in which starting from the
- the intermediate region 48 may be formed by means of an etching process, for example a flat etching in which
- Lead frame portion 30 are formed.
- the intermediate region 48 can be made, for example by means of milling,
- a depth of the intermediate region 48 may, for example, be between 10 and 100 ⁇ m, for example between 20 and 60 ⁇ m, for example between 30 and 50 ⁇ m, for example approximately 40 ⁇ m
- FIG. 9 shows a second state of the component carrier during the second exemplary embodiment of the method for producing the component carrier, in which the
- Leadframe portion 30 has been subjected to an etching process from both sides, for example according to the explained on 4 sided etching process for making the contact elements 42, 44.
- the lead frame portion 30 has after the two-sided etching process due to the explained with reference to Figure 8 etching process at the receiving area 38th and at the intermediate region 48 has a smaller thickness than in the region of the first and second contact elements 42, 44th
- FIG. 10 shows a third state of
- Lead frame portion 30 is embedded in the mold material 54, for example, as explained in more detail with reference to Figure 6.
- the molding material 54 is also formed adjacent to the intermediate region 48, so that the intermediate region 48 is covered or filled with molding material 54.
- the molding material 54 thereby forms the intermediate element 50.
- the intermediate element 50 is formed by the molding material 54.
- a thickness of the intermediate element 50 corresponds approximately to a depth of the intermediate region 48 shown in FIG.
- Figure 11 shows a fourth state of
- an additional layer 80 is applied, in such a way that the two contact elements 42, 44 and the intermediate element 50 remain free from the additional layer 80.
- the additional layer 80 may also be referred to as a solder mask and / or for a lift-off method or the like. be used.
- FIG. 12 shows a fifth state of the leadframe 30 or of the component carrier during the second
- Component carrier in which on a side remote from the receiving area 38 side of the leadframe portion 30 on the first contact element 42, a first layer contact 82nd
- Layer contact 82, the second layer contact 84 and / or the thermal contact 52 are, for example, surface by means of a galvanic process on the additional layer 80 and the
- Additional layer 80 is removed with the layer elements of the galvanic layer thereon, so that the first layer contact 82, the second layer contact 84 and / or the thermal contact 52 are formed.
- the layer contacts 82, 84 and / or the thermal contact 52 may alternatively also with
- the electronic component 60 is on the
- Lead frame portion 30 is applied and on the
- Lead frame portion 30 contacted, for example, as explained in more detail with reference to Figure 7.
- Component carrier composite are separated, for example by means of cutting or sawing.
- molding material 54 has, for example, a particularly high
- Figure 13 shows a first state of
- Lead frame section 30 is subjected to a two-sided etching process, for example, as explained in more detail with reference to Figure 4.
- a two-sided etching process for example, as explained in more detail with reference to Figure 4.
- Lead frame portion 30 is formed.
- FIG. 14 shows a second state of the
- FIG. 15 shows a third state of
- the intermediate layer 86 can be applied, for example, flat on the component carrier, for example by spin coating, printing, printing, casting or knife coating and / or by
- the intermediate layer 86 comprises the material of the intermediate element 50.
- the intermediate layer 86 may for example be made as thin as possible and / or For example, have a thickness of 1 to 50 pm, for example from 20 to 40 pm, for example about 38 pm.
- FIG. 16 shows a fourth state of FIG
- the intermediate layer 86 structured.
- the intermediate layer 86 may, for example, by means of laser ablation, etching and / or
- the intermediate layer 86 can also be applied in structured fashion to the component carrier, for example by screen printing or stencil printing or in one
- Jet printing for example a
- FIG. 17 shows a fifth state of FIG
- a contact layer 88 is formed on a side facing away from the receiving portion 38 side of the component carrier.
- the contact layer 88 extends over the intermediate layer 86, the surface
- the contact layer 88 may be, for example, a metal, such as copper
- the contact layer 88 may be, for example, a
- FIG. 18 shows a sixth state of FIG.
- Thermal contact 52 are formed.
- the contact layer 88 may, for example, by means of a photolithographic
- the structure of the contact layer 88 may be formed by means of a photomask on the
- FIG. 19 shows a first state of the
- the intermediate region 48 is formed on the side of the leadframe section opposite the receiving region 38 in the leadframe section 30.
- the intermediate region 48 is formed, for example, by means of etching.
- the intermediate region 48 can be formed, for example, as explained in more detail with reference to FIG.
- the intermediate region 48 can be formed with a small depth of, for example, between 10 and 100 ⁇ m, for example between 20 and 50 ⁇ m, for example of about 40 ⁇ m.
- Figure 20 shows a second state of
- the intermediate element 50 is introduced.
- the intermediate element 50 is introduced into the intermediate region 48, for example by means of doctoring or dispensing.
- the intermediate element 50 is introduced, for example, as explained in more detail with reference to Figure 5 in the intermediate region 48.
- the intermediate element 50 may comprise, for example, materials such as those shown in connection with FIG. 1
- intermediate element 50 may be liquid in the
- Intermediate 48 are introduced and / or cured there thermally or optically.
- Figure 21 shows a third state of
- Contact layer 88 is applied flat.
- the contact layer 88 may, for example, according to the one shown in FIG.
- Contact layer 88 may be formed and / or formed.
- the contact layer 88 may, for example, have a thickness of 1 to 10, for example 5 microns.
- Figure 22 shows a fourth state of
- Lead frame portion 30 is subjected to the two-sided etching process with the intermediate element 50 and the contact layer 88, for example, as with reference to Figure 4 closer
- the two-sided etching process makes the first contact element 42 with the first layer contact 82, the second contact element 44 with the second layer contact 84, and the intermediate element 50 with the thermal contact 52
- first contact element 42 with the first layer contact 82, the second contact element 44 with the second layer contact 84 and the intermediate element 50 with the thermal contact 52 by a on or Two-sided mechanical processing are formed, for example, if the performing the etching process
- Figure 23 shows a fifth state of
- the forming of the molding material 54 takes place, for example, as with reference to Figure 6 in more detail
- the molding material 54 is formed such that the first layer contact 82, the second layer contact 84 and the thermal contact 52 remain free of molding material.
- Figure 24 shows a sixth state of
- Lead frame portion 30 is contacted, for example, as explained in more detail with reference to Figure 7.
- the intermediate element 50 can be made particularly thin, resulting in a particularly good dissipation of heat via the intermediate element 50
- the component carrier can contribute. Furthermore, the component carrier,
- the housing for example the QFN housing, formed flat on its side remote from the electronic component 60 side, which can contribute to a simple arrangement of the component carrier, for example, on the circuit board 14.
- Figures 25 to 29 show different states of the
- Figure 25 shows a first state of
- Lead frame section 30 according to Figure 3, the intermediate member 50 on the receiving area 30 facing away from the
- Lead frame portion 30 is formed.
- Intermediate element 50 is already structured, for example, by means of stencil printing, screen printing or by means of an inkjet printing process (jetting) applied to the lead frame section 30.
- the intermediate element 50 can be applied as an intermediate layer 86 and then structured as explained in more detail with reference to FIG. 16, so that subsequently the intermediate element 50 is formed.
- Figure 26 shows a second state of
- Lead frame portion 30 and the intermediate member 50 is applied flat contact layer 88, for example, as explained in more detail with reference to Figure 17.
- Figure 27 shows a third state of
- Lead frame portion 30 is subjected to the two-sided etching process with the contact layer 88 and the intermediate element 50, for example, as with reference to Figure 4 in more detail
- the first contact element 42 with the first layer contact 82, the second contact element 44 with the second layer contact 84, the intermediate element 50 and the thermal contact 52 are formed.
- the first contact element 42 with the first layer contact 82, the second contact element 44 with the second layer contact 84 and the intermediate element 50 with the thermal contact 52 are formed by a one- or two-sided mechanical processing, for example, if performing the etching process is unfavorable.
- the conductor frame section 30 has a greater thickness in the region of the thermal contact 52, the intermediate element 50 and the receiving region 38 than in the region of the first and / or second contact element 42, 44.
- FIG. 28 shows a fourth state of FIG
- Lead frame portion 30 is embedded in the mold material 54.
- the molding material 54 is formed, for example, as explained in more detail with reference to Figure 6.
- the molding material 54 has the receiving recess 56.
- the molding material 54 has the receiving recess 56.
- Forming material 54 formed such that the first and the second layer contact 82, 84 and the thermal contact 52 are free of molding material 54.
- the component carrier has a stepped structure on its side applied by the receiving area 38. In particular, the
- Component carrier in the intermediate portion 36 has a greater thickness than in the first and second contact portions 32, 34.
- the gradation is shown exaggerated in Figure 28 for clarity.
- the gradation can also be made significantly smaller relative to the dimensions of the component carrier. This can be achieved, for example, by making the intermediate layer 50 as thin as possible.
- FIG. 29 shows a fifth state of FIG.
- the fifth exemplary embodiment of the method for producing the component carrier can be carried out, for example, with only a single etching process. The invention is not indicated on the
- the molding material 54 may be formed in all embodiments by means of transfer-compression or in ection-molding. Basically, for all embodiments that a small thickness of the intermediate element 50 contributes to a good heat dissipation. The small thickness of the
- Intermediate element 50 can be achieved for example by a small depth of the recess of the intermediate region 48 or by a small thickness of the intermediate layer 86.
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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KR20147034446A KR20150014486A (ko) | 2012-05-07 | 2013-05-07 | 컴포넌트 캐리어, 전자 어레인지먼트 및 방사 어레인지먼트를 생성하기 위한 방법, 및 컴포넌트 캐리어, 전자 어레인지먼트 및 방사 어레인지먼트 |
US14/398,557 US20150108531A1 (en) | 2012-05-07 | 2013-05-07 | Method of producing a component carrier, an electronic arrangement and a radiation arrangement, and component carrier, electronic arrangement and radiation arrangement |
CN201380024094.XA CN104272480B (zh) | 2012-05-07 | 2013-05-07 | 用于制造器件载体、电子装置和辐射装置的方法以及器件载体、电子装置和辐射装置 |
JP2015510784A JP2015518663A (ja) | 2012-05-07 | 2013-05-07 | 素子担体、電子装置および放射装置の製造方法および素子担体、電子装置および放射装置 |
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DE201210207519 DE102012207519A1 (de) | 2012-05-07 | 2012-05-07 | Verfahren zum herstellen eines bauelementträgers, einer elektronischen anordnung und einer strahlungsanordnung und bauelementträger, elektronische anordnung und strahlungsanordnung |
DE102012207519.4 | 2012-05-07 |
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WO2013167567A1 true WO2013167567A1 (de) | 2013-11-14 |
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US (1) | US20150108531A1 (de) |
JP (1) | JP2015518663A (de) |
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CN (1) | CN104272480B (de) |
DE (1) | DE102012207519A1 (de) |
WO (1) | WO2013167567A1 (de) |
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TWI543413B (zh) * | 2013-11-20 | 2016-07-21 | 隆達電子股份有限公司 | 發光二極體封裝支架及發光二極體封裝結構 |
DE102013113190A1 (de) * | 2013-11-28 | 2015-05-28 | Osram Oled Gmbh | Elektronisches Bauteil |
DE102013225552A1 (de) * | 2013-12-11 | 2015-06-11 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement |
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- 2012-05-07 DE DE201210207519 patent/DE102012207519A1/de not_active Ceased
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2013
- 2013-05-07 KR KR20147034446A patent/KR20150014486A/ko active Search and Examination
- 2013-05-07 CN CN201380024094.XA patent/CN104272480B/zh active Active
- 2013-05-07 JP JP2015510784A patent/JP2015518663A/ja active Pending
- 2013-05-07 US US14/398,557 patent/US20150108531A1/en not_active Abandoned
- 2013-05-07 WO PCT/EP2013/059445 patent/WO2013167567A1/de active Application Filing
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Publication number | Priority date | Publication date | Assignee | Title |
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US9530951B2 (en) | 2013-04-15 | 2016-12-27 | Osram Opto Semiconductor Gmbh | Optoelectronic device |
US9899586B2 (en) | 2013-04-15 | 2018-02-20 | Osram Opto Semiconductors Gmbh | Optoelectronic device |
Also Published As
Publication number | Publication date |
---|---|
KR20150014486A (ko) | 2015-02-06 |
CN104272480B (zh) | 2018-05-18 |
US20150108531A1 (en) | 2015-04-23 |
CN104272480A (zh) | 2015-01-07 |
JP2015518663A (ja) | 2015-07-02 |
DE102012207519A1 (de) | 2013-11-07 |
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