WO2013105455A1 - 粘着シートおよび電子部品の製造方法 - Google Patents
粘着シートおよび電子部品の製造方法 Download PDFInfo
- Publication number
- WO2013105455A1 WO2013105455A1 PCT/JP2012/083954 JP2012083954W WO2013105455A1 WO 2013105455 A1 WO2013105455 A1 WO 2013105455A1 JP 2012083954 W JP2012083954 W JP 2012083954W WO 2013105455 A1 WO2013105455 A1 WO 2013105455A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- adhesive sheet
- sensitive adhesive
- pressure
- meth
- acrylate
- Prior art date
Links
- 239000000853 adhesive Substances 0.000 title claims abstract description 45
- 230000001070 adhesive effect Effects 0.000 title claims abstract description 45
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 238000000034 method Methods 0.000 title description 28
- 235000007586 terpenes Nutrition 0.000 claims abstract description 28
- 150000003505 terpenes Chemical class 0.000 claims abstract description 26
- 239000005011 phenolic resin Substances 0.000 claims abstract description 25
- 239000011347 resin Substances 0.000 claims abstract description 23
- 229920005989 resin Polymers 0.000 claims abstract description 23
- 150000001875 compounds Chemical class 0.000 claims abstract description 21
- 239000012948 isocyanate Substances 0.000 claims abstract description 19
- 239000003795 chemical substances by application Substances 0.000 claims abstract description 17
- 150000002513 isocyanates Chemical class 0.000 claims abstract description 16
- 229920003067 (meth)acrylic acid ester copolymer Polymers 0.000 claims abstract description 15
- 239000003999 initiator Substances 0.000 claims abstract description 14
- 238000010030 laminating Methods 0.000 claims abstract description 4
- 239000004820 Pressure-sensitive adhesive Substances 0.000 claims description 53
- 239000004065 semiconductor Substances 0.000 claims description 30
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 24
- 239000000758 substrate Substances 0.000 claims description 21
- 239000010410 layer Substances 0.000 claims description 15
- 238000005984 hydrogenation reaction Methods 0.000 claims description 14
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 239000003505 polymerization initiator Substances 0.000 claims 1
- 239000012790 adhesive layer Substances 0.000 abstract description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 42
- -1 vinyl compound Chemical class 0.000 description 31
- 239000000178 monomer Substances 0.000 description 16
- 235000012431 wafers Nutrition 0.000 description 16
- 238000001723 curing Methods 0.000 description 14
- GRWFGVWFFZKLTI-IUCAKERBSA-N (-)-α-pinene Chemical compound CC1=CC[C@@H]2C(C)(C)[C@H]1C2 GRWFGVWFFZKLTI-IUCAKERBSA-N 0.000 description 10
- 239000000463 material Substances 0.000 description 10
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 9
- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical compound C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 8
- 238000002156 mixing Methods 0.000 description 8
- 238000011109 contamination Methods 0.000 description 7
- 239000005056 polyisocyanate Substances 0.000 description 7
- 229920001228 polyisocyanate Polymers 0.000 description 7
- 239000005057 Hexamethylene diisocyanate Substances 0.000 description 6
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 6
- 150000001805 chlorine compounds Chemical group 0.000 description 6
- 229920001577 copolymer Polymers 0.000 description 6
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 6
- XMGQYMWWDOXHJM-UHFFFAOYSA-N limonene Chemical compound CC(=C)C1CCC(C)=CC1 XMGQYMWWDOXHJM-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 244000028419 Styrax benzoin Species 0.000 description 5
- 235000000126 Styrax benzoin Nutrition 0.000 description 5
- 235000008411 Sumatra benzointree Nutrition 0.000 description 5
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 5
- MVNCAPSFBDBCGF-UHFFFAOYSA-N alpha-pinene Natural products CC1=CCC23C1CC2C3(C)C MVNCAPSFBDBCGF-UHFFFAOYSA-N 0.000 description 5
- 229960002130 benzoin Drugs 0.000 description 5
- 235000019382 gum benzoic Nutrition 0.000 description 5
- 229920000554 ionomer Polymers 0.000 description 5
- 230000014759 maintenance of location Effects 0.000 description 5
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 5
- 229910052753 mercury Inorganic materials 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- GRWFGVWFFZKLTI-UHFFFAOYSA-N rac-alpha-Pinene Natural products CC1=CCC2C(C)(C)C1C2 GRWFGVWFFZKLTI-UHFFFAOYSA-N 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 5
- 239000013638 trimer Substances 0.000 description 5
- UAHWPYUMFXYFJY-UHFFFAOYSA-N beta-myrcene Chemical compound CC(C)=CCCC(=C)C=C UAHWPYUMFXYFJY-UHFFFAOYSA-N 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000005520 cutting process Methods 0.000 description 4
- YHQGMYUVUMAZJR-UHFFFAOYSA-N α-terpinene Chemical compound CC(C)C1=CC=C(C)CC1 YHQGMYUVUMAZJR-UHFFFAOYSA-N 0.000 description 4
- PCKZAVNWRLEHIP-UHFFFAOYSA-N 2-hydroxy-1-[4-[[4-(2-hydroxy-2-methylpropanoyl)phenyl]methyl]phenyl]-2-methylpropan-1-one Chemical compound C1=CC(C(=O)C(C)(O)C)=CC=C1CC1=CC=C(C(=O)C(C)(C)O)C=C1 PCKZAVNWRLEHIP-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- XCPQUQHBVVXMRQ-UHFFFAOYSA-N alpha-Fenchene Natural products C1CC2C(=C)CC1C2(C)C XCPQUQHBVVXMRQ-UHFFFAOYSA-N 0.000 description 3
- 239000002216 antistatic agent Substances 0.000 description 3
- 238000010894 electron beam technology Methods 0.000 description 3
- UHESRSKEBRADOO-UHFFFAOYSA-N ethyl carbamate;prop-2-enoic acid Chemical compound OC(=O)C=C.CCOC(N)=O UHESRSKEBRADOO-UHFFFAOYSA-N 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 3
- WTARULDDTDQWMU-RKDXNWHRSA-N (+)-β-pinene Chemical compound C1[C@H]2C(C)(C)[C@@H]1CCC2=C WTARULDDTDQWMU-RKDXNWHRSA-N 0.000 description 2
- WTARULDDTDQWMU-IUCAKERBSA-N (-)-Nopinene Natural products C1[C@@H]2C(C)(C)[C@H]1CCC2=C WTARULDDTDQWMU-IUCAKERBSA-N 0.000 description 2
- GQVMHMFBVWSSPF-SOYUKNQTSA-N (4E,6E)-2,6-dimethylocta-2,4,6-triene Chemical compound C\C=C(/C)\C=C\C=C(C)C GQVMHMFBVWSSPF-SOYUKNQTSA-N 0.000 description 2
- BRKORVYTKKLNKX-UHFFFAOYSA-N 2,4-di(propan-2-yl)thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C(C)C)=CC(C(C)C)=C3SC2=C1 BRKORVYTKKLNKX-UHFFFAOYSA-N 0.000 description 2
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 2
- 125000000954 2-hydroxyethyl group Chemical group [H]C([*])([H])C([H])([H])O[H] 0.000 description 2
- NJWGQARXZDRHCD-UHFFFAOYSA-N 2-methylanthraquinone Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC=C3C(=O)C2=C1 NJWGQARXZDRHCD-UHFFFAOYSA-N 0.000 description 2
- UPMLOUAZCHDJJD-UHFFFAOYSA-N 4,4'-Diphenylmethane Diisocyanate Chemical compound C1=CC(N=C=O)=CC=C1CC1=CC=C(N=C=O)C=C1 UPMLOUAZCHDJJD-UHFFFAOYSA-N 0.000 description 2
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 2
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 2
- 241001050985 Disco Species 0.000 description 2
- WEEGYLXZBRQIMU-UHFFFAOYSA-N Eucalyptol Chemical compound C1CC2CCC1(C)OC2(C)C WEEGYLXZBRQIMU-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- 239000005058 Isophorone diisocyanate Substances 0.000 description 2
- WSTYNZDAOAEEKG-UHFFFAOYSA-N Mayol Natural products CC1=C(O)C(=O)C=C2C(CCC3(C4CC(C(CC4(CCC33C)C)=O)C)C)(C)C3=CC=C21 WSTYNZDAOAEEKG-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- WTARULDDTDQWMU-UHFFFAOYSA-N Pseudopinene Natural products C1C2C(C)(C)C1CCC2=C WTARULDDTDQWMU-UHFFFAOYSA-N 0.000 description 2
- MOYAFQVGZZPNRA-UHFFFAOYSA-N Terpinolene Chemical compound CC(C)=C1CCC(C)=CC1 MOYAFQVGZZPNRA-UHFFFAOYSA-N 0.000 description 2
- DAKWPKUUDNSNPN-UHFFFAOYSA-N Trimethylolpropane triacrylate Chemical compound C=CC(=O)OCC(CC)(COC(=O)C=C)COC(=O)C=C DAKWPKUUDNSNPN-UHFFFAOYSA-N 0.000 description 2
- HVVWZTWDBSEWIH-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(CO)(COC(=O)C=C)COC(=O)C=C HVVWZTWDBSEWIH-UHFFFAOYSA-N 0.000 description 2
- INXWLSDYDXPENO-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-[[3-prop-2-enoyloxy-2,2-bis(prop-2-enoyloxymethyl)propoxy]methyl]propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(COC(=O)C=C)(CO)COCC(COC(=O)C=C)(COC(=O)C=C)COC(=O)C=C INXWLSDYDXPENO-UHFFFAOYSA-N 0.000 description 2
- 150000008062 acetophenones Chemical class 0.000 description 2
- 125000002723 alicyclic group Chemical group 0.000 description 2
- 125000001931 aliphatic group Chemical group 0.000 description 2
- VYBREYKSZAROCT-UHFFFAOYSA-N alpha-myrcene Natural products CC(=C)CCCC(=C)C=C VYBREYKSZAROCT-UHFFFAOYSA-N 0.000 description 2
- 125000003368 amide group Chemical group 0.000 description 2
- 125000003277 amino group Chemical group 0.000 description 2
- 150000004056 anthraquinones Chemical class 0.000 description 2
- 125000003118 aryl group Chemical group 0.000 description 2
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 2
- 229930006722 beta-pinene Natural products 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- CRPUJAZIXJMDBK-UHFFFAOYSA-N camphene Chemical compound C1CC2C(=C)C(C)(C)C1C2 CRPUJAZIXJMDBK-UHFFFAOYSA-N 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- YCIMNLLNPGFGHC-UHFFFAOYSA-N catechol Chemical compound OC1=CC=CC=C1O YCIMNLLNPGFGHC-UHFFFAOYSA-N 0.000 description 2
- GQVMHMFBVWSSPF-UHFFFAOYSA-N cis-alloocimene Natural products CC=C(C)C=CC=C(C)C GQVMHMFBVWSSPF-UHFFFAOYSA-N 0.000 description 2
- 239000000539 dimer Substances 0.000 description 2
- 125000003700 epoxy group Chemical group 0.000 description 2
- 125000000524 functional group Chemical group 0.000 description 2
- NNRLDGQZIVUQTE-UHFFFAOYSA-N gamma-Terpineol Chemical compound CC(C)=C1CCC(C)(O)CC1 NNRLDGQZIVUQTE-UHFFFAOYSA-N 0.000 description 2
- LCWMKIHBLJLORW-UHFFFAOYSA-N gamma-carene Natural products C1CC(=C)CC2C(C)(C)C21 LCWMKIHBLJLORW-UHFFFAOYSA-N 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 description 2
- YPQKTLPPOXNDMC-UHFFFAOYSA-N isocyanic acid;methylcyclohexane Chemical compound N=C=O.CC1CCCCC1 YPQKTLPPOXNDMC-UHFFFAOYSA-N 0.000 description 2
- NIMLQBUJDJZYEJ-UHFFFAOYSA-N isophorone diisocyanate Chemical compound CC1(C)CC(N=C=O)CC(C)(CN=C=O)C1 NIMLQBUJDJZYEJ-UHFFFAOYSA-N 0.000 description 2
- 235000001510 limonene Nutrition 0.000 description 2
- 229940087305 limonene Drugs 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910021645 metal ion Inorganic materials 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 150000002989 phenols Chemical class 0.000 description 2
- 229920001223 polyethylene glycol Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- NDVASEGYNIMXJL-UHFFFAOYSA-N sabinene Chemical compound C=C1CCC2(C(C)C)C1C2 NDVASEGYNIMXJL-UHFFFAOYSA-N 0.000 description 2
- 150000003512 tertiary amines Chemical class 0.000 description 2
- RUELTTOHQODFPA-UHFFFAOYSA-N toluene 2,6-diisocyanate Chemical compound CC1=C(N=C=O)C=CC=C1N=C=O RUELTTOHQODFPA-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 2
- 229920002554 vinyl polymer Polymers 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- IHPKGUQCSIINRJ-UHFFFAOYSA-N β-ocimene Natural products CC(C)=CCC=C(C)C=C IHPKGUQCSIINRJ-UHFFFAOYSA-N 0.000 description 2
- YKFLAYDHMOASIY-UHFFFAOYSA-N γ-terpinene Chemical compound CC(C)C1=CCC(C)=CC1 YKFLAYDHMOASIY-UHFFFAOYSA-N 0.000 description 2
- DTGKSKDOIYIVQL-WEDXCCLWSA-N (+)-borneol Chemical group C1C[C@@]2(C)[C@@H](O)C[C@@H]1C2(C)C DTGKSKDOIYIVQL-WEDXCCLWSA-N 0.000 description 1
- NDVASEGYNIMXJL-NXEZZACHSA-N (+)-sabinene Natural products C=C1CC[C@@]2(C(C)C)[C@@H]1C2 NDVASEGYNIMXJL-NXEZZACHSA-N 0.000 description 1
- WUOACPNHFRMFPN-SECBINFHSA-N (S)-(-)-alpha-terpineol Chemical compound CC1=CC[C@@H](C(C)(C)O)CC1 WUOACPNHFRMFPN-SECBINFHSA-N 0.000 description 1
- RUJPNZNXGCHGID-UHFFFAOYSA-N (Z)-beta-Terpineol Natural products CC(=C)C1CCC(C)(O)CC1 RUJPNZNXGCHGID-UHFFFAOYSA-N 0.000 description 1
- WBYWAXJHAXSJNI-VOTSOKGWSA-M .beta-Phenylacrylic acid Natural products [O-]C(=O)\C=C\C1=CC=CC=C1 WBYWAXJHAXSJNI-VOTSOKGWSA-M 0.000 description 1
- XKSUVRWJZCEYQQ-UHFFFAOYSA-N 1,1-dimethoxyethylbenzene Chemical compound COC(C)(OC)C1=CC=CC=C1 XKSUVRWJZCEYQQ-UHFFFAOYSA-N 0.000 description 1
- GFNDFCFPJQPVQL-UHFFFAOYSA-N 1,12-diisocyanatododecane Chemical compound O=C=NCCCCCCCCCCCCN=C=O GFNDFCFPJQPVQL-UHFFFAOYSA-N 0.000 description 1
- MYWOJODOMFBVCB-UHFFFAOYSA-N 1,2,6-trimethylphenanthrene Chemical compound CC1=CC=C2C3=CC(C)=CC=C3C=CC2=C1C MYWOJODOMFBVCB-UHFFFAOYSA-N 0.000 description 1
- QWUWMCYKGHVNAV-UHFFFAOYSA-N 1,2-dihydrostilbene Chemical group C=1C=CC=CC=1CCC1=CC=CC=C1 QWUWMCYKGHVNAV-UHFFFAOYSA-N 0.000 description 1
- ZGDSDWSIFQBAJS-UHFFFAOYSA-N 1,2-diisocyanatopropane Chemical compound O=C=NC(C)CN=C=O ZGDSDWSIFQBAJS-UHFFFAOYSA-N 0.000 description 1
- QWQFVUQPHUKAMY-UHFFFAOYSA-N 1,2-diphenyl-2-propoxyethanone Chemical compound C=1C=CC=CC=1C(OCCC)C(=O)C1=CC=CC=C1 QWQFVUQPHUKAMY-UHFFFAOYSA-N 0.000 description 1
- VGHSXKTVMPXHNG-UHFFFAOYSA-N 1,3-diisocyanatobenzene Chemical compound O=C=NC1=CC=CC(N=C=O)=C1 VGHSXKTVMPXHNG-UHFFFAOYSA-N 0.000 description 1
- UFXYYTWJETZVHG-UHFFFAOYSA-N 1,3-diisocyanatobutane Chemical compound O=C=NC(C)CCN=C=O UFXYYTWJETZVHG-UHFFFAOYSA-N 0.000 description 1
- IKYNWXNXXHWHLL-UHFFFAOYSA-N 1,3-diisocyanatopropane Chemical compound O=C=NCCCN=C=O IKYNWXNXXHWHLL-UHFFFAOYSA-N 0.000 description 1
- RFFOTVCVTJUTAD-AOOOYVTPSA-N 1,4-cineole Chemical compound CC(C)[C@]12CC[C@](C)(CC1)O2 RFFOTVCVTJUTAD-AOOOYVTPSA-N 0.000 description 1
- ALQLPWJFHRMHIU-UHFFFAOYSA-N 1,4-diisocyanatobenzene Chemical compound O=C=NC1=CC=C(N=C=O)C=C1 ALQLPWJFHRMHIU-UHFFFAOYSA-N 0.000 description 1
- OVBFMUAFNIIQAL-UHFFFAOYSA-N 1,4-diisocyanatobutane Chemical compound O=C=NCCCCN=C=O OVBFMUAFNIIQAL-UHFFFAOYSA-N 0.000 description 1
- CDMDQYCEEKCBGR-UHFFFAOYSA-N 1,4-diisocyanatocyclohexane Chemical compound O=C=NC1CCC(N=C=O)CC1 CDMDQYCEEKCBGR-UHFFFAOYSA-N 0.000 description 1
- DFPJRUKWEPYFJT-UHFFFAOYSA-N 1,5-diisocyanatopentane Chemical compound O=C=NCCCCCN=C=O DFPJRUKWEPYFJT-UHFFFAOYSA-N 0.000 description 1
- VZXPHDGHQXLXJC-UHFFFAOYSA-N 1,6-diisocyanato-5,6-dimethylheptane Chemical compound O=C=NC(C)(C)C(C)CCCCN=C=O VZXPHDGHQXLXJC-UHFFFAOYSA-N 0.000 description 1
- BOCJQSFSGAZAPQ-UHFFFAOYSA-N 1-chloroanthracene-9,10-dione Chemical compound O=C1C2=CC=CC=C2C(=O)C2=C1C=CC=C2Cl BOCJQSFSGAZAPQ-UHFFFAOYSA-N 0.000 description 1
- GZBSIABKXVPBFY-UHFFFAOYSA-N 2,2-bis(hydroxymethyl)propane-1,3-diol;prop-2-enoic acid Chemical compound OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OCC(CO)(CO)CO GZBSIABKXVPBFY-UHFFFAOYSA-N 0.000 description 1
- CERJZAHSUZVMCH-UHFFFAOYSA-N 2,2-dichloro-1-phenylethanone Chemical compound ClC(Cl)C(=O)C1=CC=CC=C1 CERJZAHSUZVMCH-UHFFFAOYSA-N 0.000 description 1
- KWVGIHKZDCUPEU-UHFFFAOYSA-N 2,2-dimethoxy-2-phenylacetophenone Chemical compound C=1C=CC=CC=1C(OC)(OC)C(=O)C1=CC=CC=C1 KWVGIHKZDCUPEU-UHFFFAOYSA-N 0.000 description 1
- LHNAURKRXGPVDW-UHFFFAOYSA-N 2,3-diisocyanatobutane Chemical compound O=C=NC(C)C(C)N=C=O LHNAURKRXGPVDW-UHFFFAOYSA-N 0.000 description 1
- LCHAFMWSFCONOO-UHFFFAOYSA-N 2,4-dimethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC(C)=C3SC2=C1 LCHAFMWSFCONOO-UHFFFAOYSA-N 0.000 description 1
- STMDPCBYJCIZOD-UHFFFAOYSA-N 2-(2,4-dinitroanilino)-4-methylpentanoic acid Chemical compound CC(C)CC(C(O)=O)NC1=CC=C([N+]([O-])=O)C=C1[N+]([O-])=O STMDPCBYJCIZOD-UHFFFAOYSA-N 0.000 description 1
- JAHNSTQSQJOJLO-UHFFFAOYSA-N 2-(3-fluorophenyl)-1h-imidazole Chemical compound FC1=CC=CC(C=2NC=CN=2)=C1 JAHNSTQSQJOJLO-UHFFFAOYSA-N 0.000 description 1
- JKNCOURZONDCGV-UHFFFAOYSA-N 2-(dimethylamino)ethyl 2-methylprop-2-enoate Chemical compound CN(C)CCOC(=O)C(C)=C JKNCOURZONDCGV-UHFFFAOYSA-N 0.000 description 1
- GOXQRTZXKQZDDN-UHFFFAOYSA-N 2-Ethylhexyl acrylate Chemical compound CCCCC(CC)COC(=O)C=C GOXQRTZXKQZDDN-UHFFFAOYSA-N 0.000 description 1
- ZCDADJXRUCOCJE-UHFFFAOYSA-N 2-chlorothioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(Cl)=CC=C3SC2=C1 ZCDADJXRUCOCJE-UHFFFAOYSA-N 0.000 description 1
- KMNCBSZOIQAUFX-UHFFFAOYSA-N 2-ethoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OCC)C(=O)C1=CC=CC=C1 KMNCBSZOIQAUFX-UHFFFAOYSA-N 0.000 description 1
- SJEBAWHUJDUKQK-UHFFFAOYSA-N 2-ethylanthraquinone Chemical compound C1=CC=C2C(=O)C3=CC(CC)=CC=C3C(=O)C2=C1 SJEBAWHUJDUKQK-UHFFFAOYSA-N 0.000 description 1
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 description 1
- BQZJOQXSCSZQPS-UHFFFAOYSA-N 2-methoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OC)C(=O)C1=CC=CC=C1 BQZJOQXSCSZQPS-UHFFFAOYSA-N 0.000 description 1
- HFCUBKYHMMPGBY-UHFFFAOYSA-N 2-methoxyethyl prop-2-enoate Chemical compound COCCOC(=O)C=C HFCUBKYHMMPGBY-UHFFFAOYSA-N 0.000 description 1
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 1
- UWRZIZXBOLBCON-UHFFFAOYSA-N 2-phenylethenamine Chemical compound NC=CC1=CC=CC=C1 UWRZIZXBOLBCON-UHFFFAOYSA-N 0.000 description 1
- YTPSFXZMJKMUJE-UHFFFAOYSA-N 2-tert-butylanthracene-9,10-dione Chemical compound C1=CC=C2C(=O)C3=CC(C(C)(C)C)=CC=C3C(=O)C2=C1 YTPSFXZMJKMUJE-UHFFFAOYSA-N 0.000 description 1
- QZWKEPYTBWZJJA-UHFFFAOYSA-N 3,3'-Dimethoxybenzidine-4,4'-diisocyanate Chemical compound C1=C(N=C=O)C(OC)=CC(C=2C=C(OC)C(N=C=O)=CC=2)=C1 QZWKEPYTBWZJJA-UHFFFAOYSA-N 0.000 description 1
- BUZICZZQJDLXJN-UHFFFAOYSA-N 3-azaniumyl-4-hydroxybutanoate Chemical compound OCC(N)CC(O)=O BUZICZZQJDLXJN-UHFFFAOYSA-N 0.000 description 1
- CBZMQWPBAUBAPO-UHFFFAOYSA-N 4-ethenyl-n,n-diethylaniline Chemical group CCN(CC)C1=CC=C(C=C)C=C1 CBZMQWPBAUBAPO-UHFFFAOYSA-N 0.000 description 1
- SXIFAEWFOJETOA-UHFFFAOYSA-N 4-hydroxy-butyl Chemical group [CH2]CCCO SXIFAEWFOJETOA-UHFFFAOYSA-N 0.000 description 1
- JHWGFJBTMHEZME-UHFFFAOYSA-N 4-prop-2-enoyloxybutyl prop-2-enoate Chemical compound C=CC(=O)OCCCCOC(=O)C=C JHWGFJBTMHEZME-UHFFFAOYSA-N 0.000 description 1
- FIHBHSQYSYVZQE-UHFFFAOYSA-N 6-prop-2-enoyloxyhexyl prop-2-enoate Chemical compound C=CC(=O)OCCCCCCOC(=O)C=C FIHBHSQYSYVZQE-UHFFFAOYSA-N 0.000 description 1
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- 229920002126 Acrylic acid copolymer Polymers 0.000 description 1
- 239000005711 Benzoic acid Substances 0.000 description 1
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical class [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- WBYWAXJHAXSJNI-SREVYHEPSA-N Cinnamic acid Chemical compound OC(=O)\C=C/C1=CC=CC=C1 WBYWAXJHAXSJNI-SREVYHEPSA-N 0.000 description 1
- QSJXEFYPDANLFS-UHFFFAOYSA-N Diacetyl Chemical group CC(=O)C(C)=O QSJXEFYPDANLFS-UHFFFAOYSA-N 0.000 description 1
- UNXHWFMMPAWVPI-UHFFFAOYSA-N Erythritol Natural products OCC(O)C(O)CO UNXHWFMMPAWVPI-UHFFFAOYSA-N 0.000 description 1
- 239000004386 Erythritol Substances 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical group C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- CTKINSOISVBQLD-UHFFFAOYSA-N Glycidol Chemical compound OCC1CO1 CTKINSOISVBQLD-UHFFFAOYSA-N 0.000 description 1
- 239000005909 Kieselgur Substances 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- CNCOEDDPFOAUMB-UHFFFAOYSA-N N-Methylolacrylamide Chemical compound OCNC(=O)C=C CNCOEDDPFOAUMB-UHFFFAOYSA-N 0.000 description 1
- GWGWXYUPRTXVSY-UHFFFAOYSA-N N=C=O.N=C=O.CC1=CC=C(C)C=C1 Chemical compound N=C=O.N=C=O.CC1=CC=C(C)C=C1 GWGWXYUPRTXVSY-UHFFFAOYSA-N 0.000 description 1
- UQBRAHLFLCMLBA-UHFFFAOYSA-N N=C=O.N=C=O.CC1=CC=CC(C)=C1 Chemical compound N=C=O.N=C=O.CC1=CC=CC(C)=C1 UQBRAHLFLCMLBA-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- PXRCIOIWVGAZEP-UHFFFAOYSA-N Primaeres Camphenhydrat Natural products C1CC2C(O)(C)C(C)(C)C1C2 PXRCIOIWVGAZEP-UHFFFAOYSA-N 0.000 description 1
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- MZVQCMJNVPIDEA-UHFFFAOYSA-N [CH2]CN(CC)CC Chemical group [CH2]CN(CC)CC MZVQCMJNVPIDEA-UHFFFAOYSA-N 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 229920000800 acrylic rubber Polymers 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- OVKDFILSBMEKLT-UHFFFAOYSA-N alpha-Terpineol Natural products CC(=C)C1(O)CCC(C)=CC1 OVKDFILSBMEKLT-UHFFFAOYSA-N 0.000 description 1
- 229940088601 alpha-terpineol Drugs 0.000 description 1
- KQAZVFVOEIRWHN-UHFFFAOYSA-N alpha-thujene Natural products CC1=CCC2(C(C)C)C1C2 KQAZVFVOEIRWHN-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000003712 anti-aging effect Effects 0.000 description 1
- 235000010233 benzoic acid Nutrition 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- 150000008366 benzophenones Chemical class 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- HIFVAOIJYDXIJG-UHFFFAOYSA-N benzylbenzene;isocyanic acid Chemical class N=C=O.N=C=O.C=1C=CC=CC=1CC1=CC=CC=C1 HIFVAOIJYDXIJG-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229930006739 camphene Natural products 0.000 description 1
- ZYPYEBYNXWUCEA-UHFFFAOYSA-N camphenilone Natural products C1CC2C(=O)C(C)(C)C1C2 ZYPYEBYNXWUCEA-UHFFFAOYSA-N 0.000 description 1
- 150000001712 car-3-ene derivatives Chemical class 0.000 description 1
- 229930007796 carene Natural products 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- RFFOTVCVTJUTAD-UHFFFAOYSA-N cineole Natural products C1CC2(C)CCC1(C(C)C)O2 RFFOTVCVTJUTAD-UHFFFAOYSA-N 0.000 description 1
- 229930016911 cinnamic acid Natural products 0.000 description 1
- 235000013985 cinnamic acid Nutrition 0.000 description 1
- 238000004581 coalescence Methods 0.000 description 1
- 229930003836 cresol Natural products 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- LDHQCZJRKDOVOX-NSCUHMNNSA-N crotonic acid Chemical compound C\C=C\C(O)=O LDHQCZJRKDOVOX-NSCUHMNNSA-N 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- 125000002704 decyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 125000004386 diacrylate group Chemical group 0.000 description 1
- KORSJDCBLAPZEQ-UHFFFAOYSA-N dicyclohexylmethane-4,4'-diisocyanate Chemical compound C1CC(N=C=O)CCC1CC1CCC(N=C=O)CC1 KORSJDCBLAPZEQ-UHFFFAOYSA-N 0.000 description 1
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 1
- 125000005442 diisocyanate group Chemical group 0.000 description 1
- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Natural products C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 description 1
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007720 emulsion polymerization reaction Methods 0.000 description 1
- UNXHWFMMPAWVPI-ZXZARUISSA-N erythritol Chemical compound OC[C@H](O)[C@H](O)CO UNXHWFMMPAWVPI-ZXZARUISSA-N 0.000 description 1
- 229940009714 erythritol Drugs 0.000 description 1
- 235000019414 erythritol Nutrition 0.000 description 1
- 125000005448 ethoxyethyl group Chemical group [H]C([H])([H])C([H])([H])OC([H])([H])C([H])([H])* 0.000 description 1
- RJLZSKYNYLYCNY-UHFFFAOYSA-N ethyl carbamate;isocyanic acid Chemical group N=C=O.CCOC(N)=O RJLZSKYNYLYCNY-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 229920006242 ethylene acrylic acid copolymer Polymers 0.000 description 1
- 239000005038 ethylene vinyl acetate Substances 0.000 description 1
- 229920006244 ethylene-ethyl acrylate Polymers 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 238000010528 free radical solution polymerization reaction Methods 0.000 description 1
- 239000001530 fumaric acid Substances 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- ZFSLODLOARCGLH-UHFFFAOYSA-N isocyanuric acid Chemical compound OC1=NC(O)=NC(O)=N1 ZFSLODLOARCGLH-UHFFFAOYSA-N 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 239000004611 light stabiliser Substances 0.000 description 1
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 1
- 239000011976 maleic acid Substances 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- 125000005395 methacrylic acid group Chemical group 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- WBYWAXJHAXSJNI-UHFFFAOYSA-N methyl p-hydroxycinnamate Natural products OC(=O)C=CC1=CC=CC=C1 WBYWAXJHAXSJNI-UHFFFAOYSA-N 0.000 description 1
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 1
- 125000001421 myristyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- KXAVXHYIOCQWIB-UHFFFAOYSA-N n-(dimethylaminooxy)-n-methylmethanamine Chemical compound CN(C)ON(C)C KXAVXHYIOCQWIB-UHFFFAOYSA-N 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 150000007823 ocimene derivatives Chemical class 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229920002601 oligoester Polymers 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 125000000913 palmityl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- 125000002467 phosphate group Chemical group [H]OP(=O)(O[H])O[*] 0.000 description 1
- 238000000016 photochemical curing Methods 0.000 description 1
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920005862 polyol Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- QQONPFPTGQHPMA-UHFFFAOYSA-N propylene Natural products CC=C QQONPFPTGQHPMA-UHFFFAOYSA-N 0.000 description 1
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- GHMLBKRAJCXXBS-UHFFFAOYSA-N resorcinol Chemical compound OC1=CC=CC(O)=C1 GHMLBKRAJCXXBS-UHFFFAOYSA-N 0.000 description 1
- 229960001755 resorcinol Drugs 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229930006696 sabinene Natural products 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- IIACRCGMVDHOTQ-UHFFFAOYSA-N sulfamic acid group Chemical group S(N)(O)(=O)=O IIACRCGMVDHOTQ-UHFFFAOYSA-N 0.000 description 1
- 125000000542 sulfonic acid group Chemical group 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- QJVXKWHHAMZTBY-GCPOEHJPSA-N syringin Chemical compound COC1=CC(\C=C\CO)=CC(OC)=C1O[C@H]1[C@H](O)[C@@H](O)[C@H](O)[C@@H](CO)O1 QJVXKWHHAMZTBY-GCPOEHJPSA-N 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- XJPBRODHZKDRCB-UHFFFAOYSA-N trans-alpha-ocimene Natural products CC(=C)CCC=C(C)C=C XJPBRODHZKDRCB-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- RRBYUSWBLVXTQN-VZCHMASFSA-N tricyclene Natural products C([C@@H]12)C3C[C@H]1C2(C)C3(C)C RRBYUSWBLVXTQN-VZCHMASFSA-N 0.000 description 1
- RRBYUSWBLVXTQN-UHFFFAOYSA-N tricyclene Chemical compound C12CC3CC2C1(C)C3(C)C RRBYUSWBLVXTQN-UHFFFAOYSA-N 0.000 description 1
- 125000002889 tridecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
- 150000007964 xanthones Chemical class 0.000 description 1
- 150000003739 xylenols Chemical class 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/38—Pressure-sensitive adhesives [PSA]
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
- C08G18/67—Unsaturated compounds having active hydrogen
- C08G18/671—Unsaturated compounds having only one group containing active hydrogen
- C08G18/672—Esters of acrylic or alkyl acrylic acid having only one group containing active hydrogen
- C08G18/673—Esters of acrylic or alkyl acrylic acid having only one group containing active hydrogen containing two or more acrylate or alkylacrylate ester groups
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/70—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
- C08G18/72—Polyisocyanates or polyisothiocyanates
- C08G18/77—Polyisocyanates or polyisothiocyanates having heteroatoms in addition to the isocyanate or isothiocyanate nitrogen and oxygen or sulfur
- C08G18/78—Nitrogen
- C08G18/79—Nitrogen characterised by the polyisocyanates used, these having groups formed by oligomerisation of isocyanates or isothiocyanates
- C08G18/791—Nitrogen characterised by the polyisocyanates used, these having groups formed by oligomerisation of isocyanates or isothiocyanates containing isocyanurate groups
- C08G18/792—Nitrogen characterised by the polyisocyanates used, these having groups formed by oligomerisation of isocyanates or isothiocyanates containing isocyanurate groups formed by oligomerisation of aliphatic and/or cycloaliphatic isocyanates or isothiocyanates
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/08—Macromolecular additives
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/04—Homopolymers or copolymers of esters
- C09J133/06—Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J4/00—Adhesives based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; adhesives, based on monomers of macromolecular compounds of groups C09J183/00 - C09J183/16
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/38—Pressure-sensitive adhesives [PSA]
- C09J7/381—Pressure-sensitive adhesives [PSA] based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
- C09J7/385—Acrylic polymers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H01L2221/68331—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding of passive members, e.g. die mounting substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
- H01L2221/68336—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding involving stretching of the auxiliary support post dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
Definitions
- the present invention relates to an adhesive sheet and a method for producing an electronic component using the adhesive sheet.
- the semiconductor wafer or substrate is attached to each process such as cutting (dicing), stretching (expanding) the adhesive sheet, and peeling (pickup) the element small piece from the adhesive sheet after bonding the adhesive sheet. Is done.
- the pressure-sensitive adhesive sheet (dicing tape) used in these processes has sufficient adhesive strength to the cut element pieces (chips) in the dicing process, but does not have adhesive residue during the pick-up process. It is hoped that is reduced.
- the pressure-sensitive adhesive sheet there is one in which a pressure-sensitive adhesive layer that undergoes a polymerization and curing reaction with ultraviolet light or the like is applied on a base material that is transparent to active rays such as ultraviolet light and / or electron beams.
- a pressure-sensitive adhesive layer that undergoes a polymerization and curing reaction with ultraviolet light or the like is applied on a base material that is transparent to active rays such as ultraviolet light and / or electron beams.
- ultraviolet light or the like is irradiated to the pressure-sensitive adhesive layer, the pressure-sensitive adhesive layer is polymerized and cured to reduce the pressure-sensitive adhesive force, and then a cut chip is picked up.
- Patent Document 1 and Patent Document 2 disclose a compound having a photopolymerizable unsaturated double bond in its molecule (polyfunctional) that can be three-dimensionally reticulated on the substrate surface by, for example, actinic rays.
- An adhesive sheet coated with an adhesive containing an oligomer) is disclosed.
- the cut element pieces (chips) do not scatter, so the adhesive of the adhesive sheet may contain a tackifying resin, but when irradiated with actinic rays In some cases, the tackifying resin adversely affects the curing of the pressure-sensitive adhesive, and it may not be peeled off during the pick-up process, or an adhesive residue may be generated. Furthermore, the tackifying resin may bleed out over time on the semiconductor wafer or substrate surface.
- the main object of the present invention is to provide a pressure-sensitive adhesive sheet in which chips do not scatter during dicing, can be easily picked up, and adhesive residue hardly occurs.
- the present inventors are pressure-sensitive adhesive sheets obtained by laminating a photocurable pressure-sensitive adhesive layer on a substrate, and the photocurable pressure-sensitive adhesive comprises a (meth) acrylic acid ester copolymer, a photopolymerizable compound, and a polyfunctional compound. It was set as the adhesive sheet which is a terpene phenol resin which contains the isocyanate hardening
- the completely or partially hydrogenated terpene phenol resin has a hydroxyl value of 50 to 250.
- the completely or partially hydrogenated terpene phenol resin has a hydrogenation rate of 30 to 100%.
- the photocurable pressure-sensitive adhesive comprises 100 parts by mass of a (meth) acrylic acid ester copolymer, 5 to 200 parts by mass of a photopolymerizable compound, and 0.5 to 20 polyfunctional isocyanate curing agent. Parts by weight, 0.1 to 20 parts by weight of a photopolymerization initiator, and 0.5 to 100 parts by weight of a completely or partially hydrogenated terpene phenol resin.
- the photocurable pressure-sensitive adhesive comprises a (meth) acrylic acid ester copolymer having a hydroxyl group, a photopolymerization initiator having a hydroxyl group, and a terpene phenol resin completely or partially hydrogenated. And chemically bonded by an isocyanate curing agent.
- the present invention is a method for manufacturing an electronic component using the pressure-sensitive adhesive sheet according to claims 1 to 5, wherein a bonding step of bonding a semiconductor wafer or a substrate to the pressure-sensitive adhesive sheet bonded to a ring frame; A dicing step of dicing the semiconductor wafer or the substrate into a semiconductor chip or a semiconductor component, a light irradiation step of irradiating the adhesive sheet with an actinic ray, and an adhesive sheet for widening the interval between the semiconductor chips or the semiconductor components There is also provided a method for manufacturing an electronic component, which includes an expanding step of stretching the substrate and a pickup step of picking up the semiconductor chip or the semiconductor component from the adhesive sheet.
- an adhesive sheet in which chips are not scattered during dicing, pickup can be easily performed, and adhesive residue is hardly generated.
- the pressure-sensitive adhesive sheet according to the present invention is formed by laminating a photocurable pressure-sensitive adhesive layer (hereinafter also simply referred to as “pressure-sensitive adhesive layer”) on a base material, and the photocurable pressure-sensitive adhesive is a (meth) acrylic acid ester copolymer. It is a terpene phenol resin containing a coalescence, a photopolymerizable compound, a polyfunctional isocyanate curing agent, a photopolymerization initiator, and a tackifying resin, and the tackifying resin is completely or partially hydrogenated.
- a photocurable pressure-sensitive adhesive layer hereinafter also simply referred to as “pressure-sensitive adhesive layer”
- the photocurable pressure-sensitive adhesive is a (meth) acrylic acid ester copolymer. It is a terpene phenol resin containing a coalescence, a photopolymerizable compound, a polyfunctional isocyanate curing agent, a photopolymerization initiator, and
- (meth) acrylic acid ester copolymer is a polymer of only a (meth) acrylic acid ester monomer or a (meth) acrylic acid ester monomer And a vinyl compound monomer.
- (meth) acrylate is a general term for acrylate and methacrylate.
- a compound containing (meth) such as (meth) acrylic acid is a general term for a compound having “meta” in the name and a compound not having “meta”.
- Examples of the (meth) acrylic acid ester monomer include butyl (meth) acrylate, 2-butyl (meth) acrylate, t-butyl (meth) acrylate, pentyl (meth) acrylate, octyl (meth) acrylate, 2- Ethylhexyl (meth) acrylate, nonyl (meth) acrylate, decyl (meth) acrylate, lauryl (meth) acrylate, methyl (meth) acrylate, ethyl (meth) acrylate, isopropyl (meth) acrylate, tridecyl (meth) acrylate, myristyl ( (Meth) acrylate, cetyl (meth) acrylate, stearyl (meth) acrylate, cyclohexyl (meth) acrylate, isobornyl (meth) acrylate, dicyclopentanyl (meth) acryl
- Vinyl compound monomers copolymerizable with (meth) acrylic acid ester monomers include hydroxyl groups, carboxyl groups, epoxy groups, amide groups, amino groups, methylol groups, sulfonic acid groups, sulfamic acid groups, or (sub) Examples thereof include a functional group-containing monomer having one or more functional groups such as a phosphate group.
- Examples of the monomer having a hydroxyl group include 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, and 4-hydroxybutyl (meth) acrylate.
- Examples of the monomer having a carboxyl group include (meth) acrylic acid, crotonic acid, maleic acid, maleic anhydride, itaconic acid, fumaric acid, acrylamide N-glycolic acid and cinnamic acid.
- Examples of the monomer having an epoxy group include allyl glycidyl ether and (meth) acrylic acid glycidyl ether.
- Examples of the monomer having an amide group include (meth) acrylamide.
- Examples of the monomer having an amino group include N, N-dimethylaminoethyl (meth) acrylate.
- Examples of the monomer having a methylol group include N-methylolacrylamide.
- Photopolymerizable compound examples include trimethylolpropane triacrylate, tetramethylolmethane tetraacrylate, pentaerythritol triacrylate, pentaerythritol tetraacrylate, dipentaerythritol monohydroxypentaacrylate, dipenta. Erythritol hexaacrylate, 1,4-butylene glycol diacrylate, 1,6-hexanediol diacrylate, polyethylene glycol diacrylate, cyanuric acid triethyl acrylate, commercially available oligoester acrylate, and the like are used.
- a urethane acrylate oligomer can be used in addition to the acrylate compound.
- the urethane acrylate oligomer is obtained by reacting a (meth) acrylate having a hydroxy group with a terminal isocyanate urethane prepolymer obtained by reacting a polyol compound such as a polyester type or a polyether type with a polyvalent isocyanate compound.
- polyvalent isocyanate compound examples include 2,4-tolylene diisocyanate, 2,6-tolylene diisocyanate, 1,3-xylene diisocyanate, 1,4-xylene diisocyanate, diphenylmethane 4,4-diisocyanate, trimethylhexamethylene diisocyanate. , Hexamethylene diisocyanate, isophorone diisocyanate and the like can be used.
- Examples of the (meth) acrylate having a hydroxy group include 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, polyethylene glycol (meth) acrylate, pentaerythritol triacrylate, and glycidol di (meth). Acrylate, dipentaerythritol monohydroxypentaacrylate, etc. are used.
- a urethane acrylate oligomer having 4 or more vinyl groups is preferable because the adhesive is cured well after irradiation with ultraviolet rays or the like.
- the blending amount of the photopolymerizable compound is preferably 5 parts by mass or more and 200 parts by mass or less, and more preferably 20 parts by mass or more and 120 parts by mass or less with respect to 100 parts by mass of the (meth) acrylic acid ester copolymer. If the blending amount of the photopolymerizable compound is reduced, the peelability of the pressure-sensitive adhesive sheet after irradiation is reduced, and the pick-up failure of the semiconductor chip is likely to occur. On the other hand, when the blending amount of the photopolymerizable compound is increased, pick-up failure is likely to occur due to the glue being picked up during dicing, and a minute adhesive residue due to a reaction residue is generated, which causes contamination.
- polyfunctional isocyanate curing agent has two or more isocyanate groups.
- aromatic polyisocyanate, aliphatic polyisocyanate, alicyclic polyisocyanate, and dimers of these. Body, trimer, adduct body, etc. are used.
- Aromatic polyisocyanates include, for example, 1,3-phenylene diisocyanate, 4,4′-diphenyl diisocyanate, 1,4-phenylene diisocyanate, 4,4′-diphenylmethane diisocyanate, 2,4-tolylene diisocyanate, 2,6- Tolylene diisocyanate, 4,4'-toluidine diisocyanate, 2,4,6-triisocyanate toluene, 1,3,5-triisocyanate benzene, dianisidine diisocyanate, 4,4'-diphenyl ether diisocyanate, 4,4 ', 4 ”-Triphenylmethane triisocyanate, ⁇ , ⁇ ′-diisocyanate-1,3-dimethylbenzene, ⁇ , ⁇ ′-diisocyanate-1,4-dimethylbenzene, ⁇ , ⁇ ′-diisocyanate-1,4-diethylbenzene
- aliphatic polyisocyanate examples include trimethylene diisocyanate, tetramethylene diisocyanate, hexamethylene diisocyanate, pentamethylene diisocyanate, 1,2-propylene diisocyanate, 2,3-butylene diisocyanate, 1,3-butylene diisocyanate, dodecamethylene diisocyanate and 2 4,4-trimethylhexamethylene diisocyanate.
- Examples of the alicyclic polyisocyanate include 3-isocyanate methyl-3,5,5-trimethylcyclohexyl isocyanate, 1,3-cyclopentane diisocyanate, 1,3-cyclohexane diisocyanate, 1,4-cyclohexane diisocyanate, methyl-2, There are 4-cyclohexane diisocyanate, methyl-2,6-cyclohexane diisocyanate, 4,4′-methylene bis (cyclohexyl isocyanate), 1,4-bis (isocyanate methyl) cyclohexane and 1,4-bis (isocyanate methyl) cyclohexane.
- dimers, trimers and adducts examples include diphenylmethane diisocyanate dimer, hexamethylene diisocyanate trimer, trimethylolpropane and tolylene diisocyanate adducts, trimethylolpropane and hexamethylene diisocyanate. There is an adduct body.
- polyisocyanates those having three or more isocyanate groups are preferable, and in particular, a trimer of hexamethylene diisocyanate, an adduct of trimethylolpropane and tolylene diisocyanate, an adduct of trimethylolpropane and hexamethylene diisocyanate. Is preferred.
- the blending ratio of the polyfunctional isocyanate curing agent is preferably 0.5 part by mass or more and 20 parts by mass or less, and more preferably 1.0 part by mass or more and 10 parts by mass or less with respect to 100 parts by mass of the (meth) acrylic acid ester copolymer. preferable. If the polyfunctional isocyanate curing agent is 0.5 parts by mass or more, since the adhesive strength is not too strong, the occurrence of pick-up failure can be suppressed, and the photopolymerization initiator having a hydroxyl group is completely or partially hydrogenated.
- the terpene phenol resin completely or partially hydrogenated with the photopolymerization initiator can suppress contamination due to bleed-out to the pressure-sensitive adhesive surface by chemical bonding with the terpene phenol resin. If it is less than or equal to the portion, the adhesive strength does not decrease, and the retention of the semiconductor chip is maintained during dicing.
- Photopolymerization initiator benzoin, benzoin alkyl ethers, acetophenones, anthraquinones, thioxanthones, ketals, benzophenones or xanthones are used.
- benzoin examples include benzoin, benzoin methyl ether, benzoin ethyl ether, and benzoin propyl ether.
- acetophenones examples include benzoin alkyl ethers, acetophenone, 2,2-dimethoxy-2-acetophenone, 2,2-diethoxy-2-acetophenone, 1,1-dichloroacetophenone, and the like.
- Anthraquinones include 2-methylanthraquinone, 2-ethylanthraquinone, 2-tertiarybutylanthraquinone, 1-chloroanthraquinone and the like.
- Examples of thioxanthones include 2,4-dimethylthioxanthone, 2,4-diisopropylthioxanthone, 2-chlorothioxanthone, and 2,4-diisopropylthioxanthone.
- Examples of ketals include acetophenone dimethyl ketal, benzyldimethylmethal, benzyldiphenylsulfide, tetramethylthiuram monosulfide, azobisisobutyronitrile, dibenzyl, diacetyl, ⁇ -chloranthraquinone, and the like.
- 2-hydroxy-1- ⁇ 4- [4- (2-hydroxy-2-methyl-propionyl) -benzyl] having a hydroxyl group capable of reacting with an isocyanate curing agent in order to prevent contamination of the adherend -Phenyl ⁇ -2-methyl-propan-1-one (manufactured by BASF Japan, product name IRGACURE127) is preferred.
- the blending amount of the photopolymerization initiator is preferably 0.1 parts by mass or more and 20 parts by mass or less with respect to 100 parts by mass of the (meth) acrylic acid ester polymer. If the blending amount is too small, the peelability of the pressure-sensitive adhesive sheet after irradiation is lowered, and the pick-up failure of the semiconductor chip is likely to occur. On the other hand, if the amount is too large, the photopolymerization initiator bleeds out to the pressure-sensitive adhesive surface, causing contamination.
- the photopolymerization initiator may be used in combination with one or more conventionally known photopolymerization accelerators, if necessary.
- group, a tertiary amine, etc. can be used for a photoinitiator.
- the tertiary amine include triethylamine, tetraethylpentamine, dimethylamino ether and the like.
- Tackifying resin As the tackifying resin, a terpene phenol resin obtained by completely or partially hydrogenating a terpene phenol resin is preferable.
- the terpene phenol resin can be produced, for example, by reacting 1 mol of a terpene compound with 0.1 to 50 mol of phenol.
- terpene compounds include myrcene, alloocimene, ocimene, ⁇ -pinene, ⁇ -pinene, dipentene, limonene, ⁇ -ferrandrene, ⁇ -terpinene, ⁇ -terpinene, terpinolene, 1,8-cineole, 1,4-cineole, Examples include ⁇ -terpineol, ⁇ -terpineol, ⁇ -terpineol, camphene, tricyclene, sabinene, paramentadienes, and carenes. Among these compounds, ⁇ -pinene, ⁇ -pinene, limonene, myrcene, alloocimene and ⁇ -terpinene are particularly preferably used in the present invention.
- Phenols include, but are not limited to, phenol, cresol, xylenol, catechol, resorcin, hydroquinone, bisphenol A and the like.
- the ratio of phenols in the terpene phenol resin is about 25 to 50 mol%, but is not limited thereto.
- the hydroxyl value of the completely or partially hydrogenated terpene phenol resin is preferably 50 to 250.
- the reaction with the isocyanate curing agent is not sufficient, bleeds out to the surface of the pressure-sensitive adhesive, causing contamination, and when it exceeds 250, the viscosity increases and the (meth) acrylic acid ester This is because uneven mixing with a polymer or the like occurs and the pickup characteristics are not stable.
- the hydrogenation method is not particularly limited, and for example, a noble metal such as palladium, ruthenium, rhodium or the like supported on a carrier such as activated carbon, activated alumina, or diatomaceous earth is used as a catalyst.
- a noble metal such as palladium, ruthenium, rhodium or the like supported on a carrier such as activated carbon, activated alumina, or diatomaceous earth is used as a catalyst.
- the method of performing is mentioned.
- the hydrogenation rate can be measured by bromine number measurement, iodine number measurement, or the like.
- the hydrogenation rate of the terpene phenol resin completely or partially hydrogenated is preferably 30% or more, more preferably 70% or more. If it is less than 30%, the adhesive force is not sufficiently lowered due to the inhibition of the reaction of the photopolymerizable compound by irradiation with actinic rays, and the pick-up property is lowered.
- the blending ratio of the fully or partially hydrogenated terpene phenol resin is preferably 0.5 parts by mass or more and 100 parts by mass or less, and 1.0 part by mass or more and 50 parts by mass or less with respect to 100 parts by mass of the (meth) acrylic acid ester copolymer. Less than the mass part is more preferable. If the completely or partially hydrogenated terpene phenol resin is 0.5 parts by mass or more, the adhesive strength is not too low, so the retention of the semiconductor chip is maintained during dicing, and if it is 100 parts by mass or less, the pickup is poor. Can be suppressed.
- the thickness of the pressure-sensitive adhesive layer is preferably 3 ⁇ m or more and 100 ⁇ m or less, and particularly preferably 5 ⁇ m or more and 20 ⁇ m or less. If the pressure-sensitive adhesive layer is too thick, the pressure-sensitive adhesive strength becomes too high and the pick-up property is lowered. On the other hand, if the pressure-sensitive adhesive layer is too thin, the pressure-sensitive adhesive force becomes too low, chip retention during dicing is lowered, and peeling may occur between the ring frame and the sheet.
- additives such as anti-aging agents, fillers, ultraviolet absorbers and light stabilizers may be added to the adhesive.
- Base material examples include polyvinyl chloride, polyethylene terephthalate, ethylene-vinyl acetate copolymer, ethylene-acrylic acid-acrylate film, ethylene-ethyl acrylate copolymer, polyethylene, and polypropylene. , Propylene-based copolymers, ethylene-acrylic acid copolymers, ethylene- (meth) acrylic acid copolymers, ethylene- (meth) acrylic acid- (meth) acrylic acid ester copolymers, etc. with metal ions Examples include crosslinked ionomer resins.
- the base material may be a mixture or copolymer of these resins, and may be a laminate of films and sheets made of these resins.
- an ionomer resin as a material for the base film.
- ionomer resins if an ionomer resin obtained by crosslinking a copolymer having an ethylene unit, a methacrylic acid unit, and a (meth) acrylic acid alkyl ester unit with a metal ion such as Na + , K + , or Zn 2+ is used, cutting The dust suppressing effect is remarkable and is preferably used.
- the base material may be a single layer or a multilayer film or sheet made of the above material, or may be a laminate of films made of different materials.
- the thickness of the substrate is 50 to 200 ⁇ m, preferably 70 to 150 ⁇ m.
- an antistatic treatment it is preferable to apply an antistatic treatment to the substrate.
- the antistatic treatment include a treatment for adding an antistatic agent to the substrate, a treatment for applying the antistatic agent to the substrate surface, and a treatment by corona discharge.
- a quaternary amine salt monomer can be used as the antistatic agent.
- the quaternary amine salt monomer include dimethylaminoethyl (meth) acrylate quaternary chloride, diethylaminoethyl (meth) acrylate quaternary chloride, methylethylaminoethyl (meth) acrylate quaternary chloride, p-dimethyl.
- examples include aminostyrene quaternary chloride and p-diethylaminostyrene quaternary chloride. Of these, dimethylaminoethyl methacrylate quaternary chloride is preferred.
- an adhesive sheet is affixed to a semiconductor wafer (or substrate) and a ring frame.
- the wafer may be a conventional general-purpose wafer such as a silicon wafer and a gallium nitride wafer, a silicon carbide wafer, or a sapphire wafer.
- the substrate may be a general-purpose substrate such as a package substrate in which a chip is sealed with a resin or an LED package substrate.
- actinic rays such as ultraviolet rays are irradiated from the substrate side to the photocurable pressure-sensitive adhesive layer.
- actinic rays such as ultraviolet rays are irradiated from the substrate side to the photocurable pressure-sensitive adhesive layer.
- the ultraviolet light source a low-pressure mercury lamp, a high-pressure mercury lamp, an ultra-high pressure mercury lamp, or a metal halide lamp can be used.
- an electron beam may be used instead of ultraviolet rays, and ⁇ -rays, ⁇ -rays, and ⁇ -rays can be used as a light source for the electron beams.
- the light-sensitive adhesive layer is three-dimensionally reticulated and cured by light irradiation, and the adhesive strength of the pressure-sensitive adhesive layer is reduced. At this time, as described above, since the pressure-sensitive adhesive sheet according to the present invention does not excessively adhere to a wafer or the like even when heated, a sufficient decrease in adhesive force can be obtained by irradiation with ultraviolet rays or the like.
- a photocurable pressure-sensitive adhesive was prepared according to the formulation shown in “Table 1”. This photocurable pressure-sensitive adhesive was coated on a polyethylene terephthalate separator film, and coated so that the thickness of the pressure-sensitive adhesive layer after drying was 20 ⁇ m. This pressure-sensitive adhesive layer was laminated on a base film and aged at 40 ° C. for 7 days to obtain a pressure-sensitive adhesive sheet.
- the base film is an ionomer resin mainly composed of an ethylene-methacrylic acid-methacrylic acid alkyl ester copolymer Zn salt, MFR value 1.0 g / 10 min (JIS K7210, 210 ° C.), melting point 86
- a material containing Zn2 + ions (Mitsui / DuPont Polychemical Co., Ltd., product number: HM1855) formed into a film of 100 ⁇ m by T-die extrusion was used.
- A-1 SK dyne 1496 manufactured by Soken Chemical Co., Ltd. A copolymer of 96% 2-ethylhexyl acrylate and 4% 2-hydroxyethyl acrylate, obtained by solution polymerization.
- A-2 Acrylic rubber AR53L manufactured by Nippon Zeon Co., Ltd .; a copolymer of ethyl acrylate 42%, butyl acrylate 22%, methoxyethyl acrylate 36%, obtained by emulsion polymerization.
- B-1 UN-905 manufactured by Negami Kogyo Co., Ltd. A trimer of isophorone diisocyanate is reacted with an acrylate containing dipetaerythritol pentaacrylate as a main component, and has 15 vinyl groups.
- B-2 Shin-Nakamura Chemical Co., Ltd. A-TMPT; trimethylolpropane triacrylate, having 3 vinyl groups.
- Multifunctional isocyanate curing agent C-1: Coronate L-45E manufactured by Nippon Polyurethane; Adduct body of 2,4-tolylene diisocyanate with trimethylolpropane.
- D-1 IRGACURE127 manufactured by BASF Japan; 2-hydroxy-1- ⁇ 4- [4- (2-hydroxy-2-methyl-propionyl) -benzyl] -phenyl ⁇ -2-methyl-propan-1-one.
- D-2 IRGACURE651 manufactured by BASF Japan Ltd .; benzyldimethyl ketal.
- E-1 In-house synthesized product having a hydroxyl value of 120 and a hydrogenation rate of 75% The following is a terpene phenol that has been completely or partially hydrogenated using a terpene phenol resin that has been reacted by changing the molar ratio of ⁇ -pinene and phenol. A resin was obtained.
- E-2 In-house synthesized product with a hydroxyl value of 5 and a hydrogenation rate of 75%
- E-3 In-house synthesized product with a hydroxyl value of 250 and a hydrogenation rate of 75%
- E-4 In-house synthesis with a hydroxyl value of 3 and a hydrogenation rate of 75%
- Product E-5 In-house synthetic product with hydroxyl value 300 and hydrogenation rate 75%
- E-6 In-house synthesized product with hydroxyl value 120 and hydrogenation rate 30%
- E-7 In-house product with hydroxyl value 120 and hydrogenation rate 20%
- Synthetic product E-8 In-house synthetic product with hydroxyl value 120 and hydrogenation rate 0%
- E-9 In-house synthetic product with hydroxyl value 120 and hydrogenation rate 100%
- the obtained adhesive sheet was bonded to a silicon wafer having a diameter of 8 inches and a thickness of 0.1 mm on which a dummy circuit pattern was formed and a ring frame, and diced. Then, each process of light irradiation, an expand, and a pick-up was performed.
- the conditions for the dicing process were as follows.
- Dicing machine DAD341 manufactured by DISCO Dicing blade: NBC-ZH205O-27HEEE made by DISCO Dicing blade shape: outer diameter 55.56 mm, blade width 35 ⁇ m, inner diameter 19.05 mm
- Dicing blade rotation speed 40,000 rpm
- Dicing blade feed rate 50 mm / sec.
- Dicing size 10 mm square cutting depth: 40 ⁇ m
- Cutting water volume 1.0 l / min
- UV irradiation 150 mJ / cm 2 with a high-pressure mercury lamp
- Chip Retention The chip retention was evaluated according to the following criteria based on the remaining ratio of the semiconductor chips held on the adhesive sheet after the dicing step. Excellent ( ⁇ ): Chip skip is less than 5% Good ( ⁇ ): Chip skip is 5% or more and less than 10% Impossible ( ⁇ ): Chip skip is 10% or more
- Chip pickup success rate is 95% or more
- Chip pickup success rate is 80% or more and less than 95%
- Impossible Chip pickup success rate is less than 80%
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Adhesive Tapes (AREA)
- Dicing (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
1.粘着シート
(メタ)アクリル酸エステル共重合体は、(メタ)アクリル酸エステル単量体のみの重合体、又は、(メタ)アクリル酸エステル単量体とビニル化合物単量体との共重合体である。なお、(メタ)アクリレートとはアクリレートおよびメタアクリレートの総称である。(メタ)アクリル酸等の(メタ)を含む化合物等も同様に、名称中に「メタ」を有する化合物と「メタ」を有さない化合物の総称である。
カルボキシル基を有する単量体としては、例えば、(メタ)アクリル酸、クロトン酸、マレイン酸、無水マレイン酸、イタコン酸、フマール酸、アクリルアミドN-グリコール酸およびケイ皮酸がある。
エポキシ基を有する単量体としては、例えば、アリルグリシジルエーテルおよび(メタ)アクリル酸グリシジルエーテルがある。
アミド基を有する単量体としては、例えば、(メタ)アクリルアミドがある。
アミノ基を有する単量体としては、例えば、N,N-ジメチルアミノエチル(メタ)アクリレートがある。
メチロール基を有する単量体としては、例えば、N-メチロールアクリルアミドがある。
このうち、被着体への汚染を防止するため、イソシアネート硬化剤と反応し得る水酸基を有する単量体を含むことが好ましい。
光重合性化合物としては、例えば、トリメチロールプロパントリアクリレート、テトラメチロールメタンテトラアクリレート、ペンタエリスリトールトリアクリレート、ペンタエリスリトールテトラアクリレート、ジペンタエリスリトールモノヒドロキシペンタアクリレート、ジペンタエリスリトールヘキサアクリレート、1,4-ブチレングリコールジアクリレート、1,6-ヘキサンジオールジアクリレート、ポリエチレングリコールジアクリレート、シアヌル酸トリエチルアクリレート、市販のオリゴエステルアクリレートなどが用いられる。
多官能イソシアネート硬化剤には、イソシアネート基を2個以上有するものであり、例えば芳香族ポリイソシアネート、脂肪族ポリイソシアネート、脂環族ポリイソシアネート、これらの二量体や三量体、アダクト体などが用いられる。
光重合開始剤には、ベンゾイン、ベンゾインアルキルエーテル類、アセトフェノン類、アントラキノン類、チオキサントン類、ケタール類、ベンゾフェノン類またはキサントン類などが用いられる。
アセトフェノン類としては、例えばベンゾインアルキルエーテル類、アセトフェノン、2,2-ジメトキシ-2-アセトフェノン、2,2―ジエトキシ-2-アセトフェノン、1,1-ジクロロアセトフェノンなどがある。
アントラキノン類としては、2-メチルアントラキノン、2-エチルアントラキノン、2-ターシャリブチルアントラキノン、1-クロロアントラキノンなどがある。
チオキサントン類としては、例えば2,4-ジメチルチオキサントン、2,4-ジイソプロピルチオキサントン、2-クロロチオキサントン、2,4-ジイソプロピルチオキサントンなどがある。
ケタール類としては、例えばアセトフェノンジメチルケータル、ベンジルジメチルメタール、ベンジルジフエニルサルフアイド、テトラメチルチウラムモノサルフアイド、アゾビスイソブチロニトリル、ジベンジル、ジアセチル、β-クロールアンスラキノンなどがある。
このうち、被着体への汚染を防止するため、イソシアネート硬化剤と反応し得る水酸基を有する2-ヒドロキシ-1-{4-[4-(2-ヒドロキシ-2-メチル-プロピオニル)-ベンジル]-フェニル}-2-メチル-プロパン-1-オン(BASFジャパン社製、製品名IRGACURE127)などが好ましい。
粘着付与樹脂としては、テルペンフェノール樹脂を完全又は部分水添したテルペンフェノール樹脂が好ましい。
基材の材料としては、例えば、ポリ塩化ビニル、ポリエチレンテレフタレート、エチレン-酢酸ビニル共重合体、エチレン-アクリル酸-アクリル酸エステルフィルム、エチレン-エチルアクリレート共重合体、ポリエチレン、ポリプロピレン、プロピレン系共重合体、エチレン-アクリル酸共重合体、および、エチレン-(メタ)アクリル酸共重合体やエチレン-(メタ)アクリル酸-(メタ)アクリル酸エステル共重合体等を金属イオンで架橋したアイオノマ樹脂などが挙げられる。基材は、これら樹脂の混合物又は共重合体であってよく、これら樹脂からなるフィルムやシートの積層体であってもよい。
本発明に係る電子部品の製造方法の具体的な工程を順に説明する。
まず、貼付工程において、粘着シートを半導体ウエハ(又は基板)とリングフレームに貼り付ける。ウエハは、シリコンウエハおよびガリウムナイトライドウエハ、炭化ケイ素ウエハ、サファイアウエハなどの従来汎用のウエハであってよい。基板は樹脂でチップを封止したパッケージ基板、LEDパッケージ基板などの汎用の基板であってよい。
ダイシング工程では、シリコンウエハ等をダイシングして半導体チップ又は半導体部品にする。
光照射工程では、基材側から光硬化型粘着剤層に紫外線等の活性光線を照射する。紫外線の光源としては、低圧水銀灯、高圧水銀灯、超高圧水銀灯、メタルハライドランプを用いることができる。また、紫外線に替えて電子線を用いてもよく、電子線の光源としてはα線、β線、γ線を用いることができる。
エキスパンド工程/ピックアップ工程では、半導体チップ又は半導体部品同士の間隔を広げるため粘着シートを引き伸ばし、チップ又は部品をニードルピン等で突き上げる。その後、チップ又は部品を真空コレットまたはエアピンセット等で吸着し、粘着シートの粘着剤層から剥離してピックアップする。この際、本発明に係る粘着シートでは紫外線等の照射により十分な接着力の低下が得られているため、チップ又は部品と粘着剤層との間の剥離が容易となり、良好なピックアップ性が得られ、糊残りなどの不良が生じることもない。
「表1」に示す配合に従って光硬化型粘着剤を調製した。この光硬化型粘着剤をポリエチレンテレフタレート製のセパレーターフィルム上に塗布し、乾燥後の粘着層の厚みが20μmとなるように塗工した。この粘着層を基材フィルムに積層し、40℃で7日間熟成し、粘着シートを得た。
〔(メタ)アクリル酸エステル共重合体〕
A-1:綜研化学社製SKダイン1496;2-エチルヘキシルアクリレート96%、2-ヒドロキシエチルアクリレート4%の共重合体、溶液重合により得られる。
A-2:日本ゼオン社製アクリルゴムAR53L;エチルアクリレート42%、ブチルアクリレート22%、メトキシエチルアクリレート36%の共重合体、乳化重合により得られる。
B-1:根上工業社製UN-905;イソホロンジイソシアネートの三量体にジペタエリスリトールペンタアクリレートを主成分とするアクリレートを反応させたものであり、ビニル基の数が15個。
B-2:新中村化学社製A-TMPT;トリメチロールプロパントリアクリレート、ビニル基の数が3個。
C-1:日本ポリウレタン社製コロネートL-45E;2,4-トリレンジイソシアネートのトリメチロールプロパンとのアダクト体。
D-1:BASFジャパン社製IRGACURE127;2-ヒドロキシ-1-{4-[4-(2-ヒドロキシ-2-メチル-プロピオニル)-ベンジル]-フェニル}-2-メチル-プロパン-1-オン。
D-2:BASFジャパン社製IRGACURE651;ベンジルジメチルケタール。
α-ピネン(ヤスハラケミカル(株)製α-ピネン、純度95%)1モルとフェノール(関東化学(株)製フェノール、純度99%)0.5モルを反応させ、GPCによる数平均分子量600、重量平均分子量800のテルペンフェノール樹脂を用い、E-1の部分水添されたテルペンフェノール樹脂を得た。
E-1:水酸基価120、水添率75%の自社合成品
以下は、α-ピネンとフェノールのモル比率を変更し反応させた、テルペンフェノール樹脂を用い、完全又は部分水添されたテルペンフェノール樹脂を得た。
E-2:水酸基価5、水添率75%の自社合成品
E-3:水酸基価250、水添率75%の自社合成品
E-4:水酸基価3、水添率75%の自社合成品
E-5:水酸基価300、水添率75%の自社合成品
E-6:水酸基価120、水添率30%の自社合成品
E-7:水酸基価120、水添率20%の自社合成品
E-8:水酸基価120、水添率0%の自社合成品
E-9:水酸基価120、水添率100%の自社合成品
ダイシング装置:DISCO社製DAD341
ダイシングブレード:DISCO社製NBC-ZH205O-27HEEE
ダイシングブレード形状:外径55.56mm、刃幅35μm、内径19.05mm
ダイシングブレード回転数:40,000rpm
ダイシングブレード送り速度:50mm/秒
ダイシングサイズ:10mm角
粘着シートへの切り込み量:40μm
切削水温度:25℃
切削水量:1.0リットル/分
紫外線照射:高圧水銀灯で照射量150mJ/cm2
ピックアップ装置:キヤノンマシナリー社製CAP-300II
エキスパンド量:8mm
ニードルピン形状:250μmR
ニードルピン数:5本
ニードルピン突き上げ高さ:0.3mm
(1)チップ保持性
チップ保持性は、ダイシング工程後において、半導体チップが粘着シートに保持されている半導体チップの残存率に基づき、以下の基準により評価した。
優(◎) :チップ飛びが5%未満
良(○) :チップ飛びが5%以上10%未満
不可(×):チップ飛びが10%以上
ピックアップ性は、ピックアップ工程において、半導体チップがピックアップできた率に基づき、以下の基準により評価した。
優(◎) :チップのピックアップ成功率が95%以上
良(○) :チップのピックアップ成功率が80%以上95%未満
不可(×):チップのピックアップ成功率が80%未満
粘着シートをシリコン製ミラーウエハに貼り付けて、20分後に高圧水銀灯で紫外線を150mJ/cm2照射した後、粘着シートを剥離した。シリコン製ミラーウエハの貼り付け面上に残留した0.28μm以上の粒子数をパーティクルカウンターにて測定した。
優(◎) :パーティクルが500個未満
良(○) :パーティクルが2000個未満
不可(×):パーティクルが2000個以上
Claims (6)
- 基材に光硬化型粘着剤層を積層してなる粘着シートであって、該光硬化型粘着剤が、(メタ)アクリル酸エステル共重合体と光重合性化合物と多官能イソシアネート硬化剤と光重合開始剤と粘着付与樹脂とを含み、前記粘着付与樹脂が完全又は部分水添されたテルペンフェノール樹脂である粘着シート。
- 前記完全又は部分水添されたテルペンフェノール樹脂が、水酸基価50~250である請求項1記載の粘着シート。
- 前記完全又は部分水添されたテルペンフェノール樹脂が、水添率30~100%である請求項1又は2記載の粘着シート。
- 前記光硬化型粘着剤が、(メタ)アクリル酸エステル共重合体100質量部と光重合性化合物5~200質量部と多官能イソシアネート硬化剤0.5~20質量部と光重合開始剤0.1~20質量部と完全又は部分水添されたテルペンフェノール樹脂0.5~100質量部とを含む請求項1~3記載の粘着シート。
- 前記光硬化型粘着剤は、水酸基を有する(メタ)アクリル酸エステル共重合体と水酸基を有する光重合開始剤と完全又は部分水添されたテルペンフェノール樹脂とが、イソシアネート硬化剤により化学結合している請求項1~4記載の粘着シート。
- 請求項1~5記載の前記粘着シートを用いた電子部品の製造方法であって、
リングフレームに貼り合わせられた前記粘着シートに半導体ウェハ又は基板を貼り付ける貼付工程と、
前記半導体ウエハ又は前記基板をダイシングして半導体チップ又は半導体部品にするダイシング工程と、
前記粘着シートに活性光線を照射する光照射工程と、
前記半導体チップ又は前記半導体部品同士の間隔を広げるため粘着シートを引き伸ばすエキスパンド工程と、
前記粘着シートから前記半導体チップ又は前記半導体部品をピックアップするピックアップ工程と、を含む電子部品の製造方法。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201280066931.0A CN104066806A (zh) | 2012-01-12 | 2012-12-27 | 粘合片及电子器件的制造方法 |
JP2013553251A JP6031047B2 (ja) | 2012-01-12 | 2012-12-27 | 粘着シートおよび電子部品の製造方法 |
KR1020147022176A KR102032006B1 (ko) | 2012-01-12 | 2012-12-27 | 점착 시트 및 전자 부품의 제조 방법 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012004493 | 2012-01-12 | ||
JP2012-004493 | 2012-01-12 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2013105455A1 true WO2013105455A1 (ja) | 2013-07-18 |
Family
ID=48781411
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2012/083954 WO2013105455A1 (ja) | 2012-01-12 | 2012-12-27 | 粘着シートおよび電子部品の製造方法 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6031047B2 (ja) |
KR (1) | KR102032006B1 (ja) |
CN (1) | CN104066806A (ja) |
TW (1) | TWI583767B (ja) |
WO (1) | WO2013105455A1 (ja) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104130726A (zh) * | 2013-07-19 | 2014-11-05 | 日东电工株式会社 | 再剥离粘合剂组合物、粘合片及电子部件的切断加工方法 |
JP2015165000A (ja) * | 2014-02-06 | 2015-09-17 | 住友ゴム工業株式会社 | 部分水添フェノール系樹脂、ゴム組成物および空気入りタイヤ |
EP2905307A3 (en) * | 2014-02-06 | 2015-10-07 | Sumitomo Rubber Industries, Ltd. | Partially hydrogenated phenolic resin, rubber composition and pneumatic tire |
JP2015230916A (ja) * | 2014-06-03 | 2015-12-21 | アキレス株式会社 | 半導体製造工程用テープの基材フィルム |
WO2016009879A1 (ja) * | 2014-07-14 | 2016-01-21 | 電気化学工業株式会社 | 粘着シート、電子部品の製造方法 |
WO2017110839A1 (ja) * | 2015-12-21 | 2017-06-29 | 積水化学工業株式会社 | 粘着剤組成物及び粘着テープ |
JP2018508622A (ja) * | 2015-02-06 | 2018-03-29 | テーザ・ソシエタス・ヨーロピア | 黄色度指数の減少した接着剤化合物 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI678409B (zh) * | 2015-01-09 | 2019-12-01 | 日商電化股份有限公司 | 切割膠帶 |
JP2020097737A (ja) * | 2018-12-14 | 2020-06-25 | 三菱ケミカル株式会社 | 粘着剤樹脂組成物、粘着剤樹脂硬化物、粘着シート及び画像表示装置積層体 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007224258A (ja) * | 2006-02-24 | 2007-09-06 | Yasuhara Chemical Co Ltd | アクリル系粘着剤組成物 |
JP2007291147A (ja) * | 2005-04-19 | 2007-11-08 | Denki Kagaku Kogyo Kk | 粘着剤、それを用いた粘着シート、粘着シートを用いた電子部品製造方法。 |
JP2008103516A (ja) * | 2006-10-19 | 2008-05-01 | Nitto Denko Corp | 半導体ウエハ及び/又は基板加工用粘着シート |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0616524B2 (ja) | 1984-03-12 | 1994-03-02 | 日東電工株式会社 | 半導体ウエハ固定用接着薄板 |
JPS60223139A (ja) | 1984-04-18 | 1985-11-07 | Nitto Electric Ind Co Ltd | 半導体ウエハ固定用接着薄板 |
JPH0733832A (ja) * | 1992-10-27 | 1995-02-03 | Sekisui Chem Co Ltd | 光重合性組成物及び粘弾性製品の製造方法 |
JP2003277695A (ja) * | 2002-03-22 | 2003-10-02 | Dainippon Ink & Chem Inc | Uv硬化型アクリル系粘着剤組成物 |
JP2003292910A (ja) * | 2002-03-29 | 2003-10-15 | Oji Paper Co Ltd | 粘着シート |
JP2009124135A (ja) * | 2007-10-24 | 2009-06-04 | Hitachi Chem Co Ltd | 半導体用接着部材及び半導体装置 |
JP5428158B2 (ja) * | 2007-12-27 | 2014-02-26 | Dic株式会社 | 両面粘着テープ |
JP2010053192A (ja) * | 2008-08-27 | 2010-03-11 | Nitto Denko Corp | 粘着テープ又はシート |
JP5530621B2 (ja) * | 2008-11-12 | 2014-06-25 | 株式会社寺岡製作所 | 紫外線重合性粘着剤組成物、紫外線重合性粘着剤組成物を用いた感圧性接着剤及びこの感圧性接着剤を用いた接着シ―ト |
JP2010168541A (ja) * | 2008-12-22 | 2010-08-05 | Nitto Denko Corp | 粘着テープ又はシート |
JP5607401B2 (ja) * | 2010-03-30 | 2014-10-15 | 古河電気工業株式会社 | 帯電防止型半導体加工用粘着テープ |
-
2012
- 2012-12-27 WO PCT/JP2012/083954 patent/WO2013105455A1/ja active Application Filing
- 2012-12-27 CN CN201280066931.0A patent/CN104066806A/zh active Pending
- 2012-12-27 KR KR1020147022176A patent/KR102032006B1/ko active IP Right Grant
- 2012-12-27 JP JP2013553251A patent/JP6031047B2/ja active Active
-
2013
- 2013-01-10 TW TW102100833A patent/TWI583767B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007291147A (ja) * | 2005-04-19 | 2007-11-08 | Denki Kagaku Kogyo Kk | 粘着剤、それを用いた粘着シート、粘着シートを用いた電子部品製造方法。 |
JP2007224258A (ja) * | 2006-02-24 | 2007-09-06 | Yasuhara Chemical Co Ltd | アクリル系粘着剤組成物 |
JP2008103516A (ja) * | 2006-10-19 | 2008-05-01 | Nitto Denko Corp | 半導体ウエハ及び/又は基板加工用粘着シート |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104130726A (zh) * | 2013-07-19 | 2014-11-05 | 日东电工株式会社 | 再剥离粘合剂组合物、粘合片及电子部件的切断加工方法 |
JP2015021083A (ja) * | 2013-07-19 | 2015-02-02 | 日東電工株式会社 | 再剥離粘着剤組成物、粘着シート及びテープ |
JP2015165000A (ja) * | 2014-02-06 | 2015-09-17 | 住友ゴム工業株式会社 | 部分水添フェノール系樹脂、ゴム組成物および空気入りタイヤ |
EP2905307A3 (en) * | 2014-02-06 | 2015-10-07 | Sumitomo Rubber Industries, Ltd. | Partially hydrogenated phenolic resin, rubber composition and pneumatic tire |
JP2015230916A (ja) * | 2014-06-03 | 2015-12-21 | アキレス株式会社 | 半導体製造工程用テープの基材フィルム |
CN106488963A (zh) * | 2014-07-14 | 2017-03-08 | 电化株式会社 | 粘合片、电子部件的制造方法 |
WO2016009879A1 (ja) * | 2014-07-14 | 2016-01-21 | 電気化学工業株式会社 | 粘着シート、電子部品の製造方法 |
KR20170033327A (ko) * | 2014-07-14 | 2017-03-24 | 덴카 주식회사 | 점착 시트, 전자 부품의 제조 방법 |
JPWO2016009879A1 (ja) * | 2014-07-14 | 2017-06-01 | デンカ株式会社 | 粘着シート、電子部品の製造方法 |
US9934997B2 (en) | 2014-07-14 | 2018-04-03 | Denka Company Limited | Adhesive sheet and method of manufacturing electronic component |
KR102360607B1 (ko) | 2014-07-14 | 2022-02-08 | 덴카 주식회사 | 점착 시트, 전자 부품의 제조 방법 |
JP2018508622A (ja) * | 2015-02-06 | 2018-03-29 | テーザ・ソシエタス・ヨーロピア | 黄色度指数の減少した接着剤化合物 |
US10144853B2 (en) | 2015-02-06 | 2018-12-04 | Tesa Se | Adhesive compound with reduced yellowness index |
WO2017110839A1 (ja) * | 2015-12-21 | 2017-06-29 | 積水化学工業株式会社 | 粘着剤組成物及び粘着テープ |
Also Published As
Publication number | Publication date |
---|---|
JP6031047B2 (ja) | 2016-11-24 |
KR102032006B1 (ko) | 2019-10-14 |
CN104066806A (zh) | 2014-09-24 |
JPWO2013105455A1 (ja) | 2015-05-11 |
TWI583767B (zh) | 2017-05-21 |
TW201343849A (zh) | 2013-11-01 |
KR20140123951A (ko) | 2014-10-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6031047B2 (ja) | 粘着シートおよび電子部品の製造方法 | |
US8389629B2 (en) | Adhesive, adhesive sheet, multi-layered adhesive sheet, and production method for electronic part | |
JP6604972B2 (ja) | ダイシングテープ | |
JP7149487B2 (ja) | 半導体加工用粘着テープ、及び半導体装置の製造方法 | |
JP6506756B2 (ja) | 粘着シート、電子部品の製造方法 | |
JP5889892B2 (ja) | 粘着シート及び電子部品の製造方法 | |
TWI704208B (zh) | 半導體加工用黏合膠帶和使用該膠帶的半導體晶片或半導體部件的製造方法 | |
JP5890405B2 (ja) | 粘着シートおよび電子部品の製造方法 | |
JP5210346B2 (ja) | 粘着シート及び電子部品の製造方法 | |
TWI639673B (zh) | 黏著片 | |
JP6886831B2 (ja) | 粘着シート及びそれを用いた半導体チップ又は半導体部品の製造方法 | |
JP7069116B2 (ja) | バックグラインドテープ用基材 | |
JP2011233632A (ja) | 粘着シート及び電子部品の製造方法 | |
US20240010881A1 (en) | Adhesive tape and processing method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 12864994 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2013553251 Country of ref document: JP Kind code of ref document: A |
|
ENP | Entry into the national phase |
Ref document number: 20147022176 Country of ref document: KR Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 12864994 Country of ref document: EP Kind code of ref document: A1 |