WO2012058131A2 - Composite film for board level emi shielding - Google Patents

Composite film for board level emi shielding Download PDF

Info

Publication number
WO2012058131A2
WO2012058131A2 PCT/US2011/057418 US2011057418W WO2012058131A2 WO 2012058131 A2 WO2012058131 A2 WO 2012058131A2 US 2011057418 W US2011057418 W US 2011057418W WO 2012058131 A2 WO2012058131 A2 WO 2012058131A2
Authority
WO
WIPO (PCT)
Prior art keywords
composite film
bottom layer
film according
conductive
top layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2011/057418
Other languages
English (en)
French (fr)
Other versions
WO2012058131A3 (en
Inventor
Chih-Min Cheng
Bo Xia
George Thomas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Henkel Corp
Original Assignee
Henkel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Henkel Corp filed Critical Henkel Corp
Priority to FIEP11836909.9T priority Critical patent/FI2633746T3/fi
Priority to KR1020137013255A priority patent/KR101584872B1/ko
Priority to EP11836909.9A priority patent/EP2633746B1/en
Priority to JP2013536689A priority patent/JP6082696B2/ja
Priority to CN201180051609.6A priority patent/CN103190209B/zh
Publication of WO2012058131A2 publication Critical patent/WO2012058131A2/en
Publication of WO2012058131A3 publication Critical patent/WO2012058131A3/en
Priority to US13/798,895 priority patent/US8847184B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21FPROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F1/00Shielding characterised by the composition of the materials
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields
    • H05K9/0073Shielding materials
    • H05K9/0081Electromagnetic shielding materials, e.g. EMI, RFI shielding
    • H05K9/0088Electromagnetic shielding materials, e.g. EMI, RFI shielding comprising a plurality of shielding layers; combining different shielding material structure

Definitions

  • This invention relates to a film for shielding electronic devices, such as, computers, communication devices, printers, video cameras, and the like, from emitting electromagnetic radiation (EMI).
  • EMI electromagnetic radiation
  • Electronic devices emit electromagnetic radiation that can interfere with television, radio, and other communications.
  • the level of EMI is regulated by governments, and consequently the manufacturers of electronic devices are required to limit the level of EMI produced by their devices.
  • a second reason for limiting EMI is that stray signals within a device can cause internal interference or cross-talk.
  • Two approaches are used currently to limit EMI: suppressing the electromagnetic radiation at the source, or containing the radiation so that it does not escape the device.
  • Containment can be accomplished per Faraday's principle by enclosing the emitting device in a perfectly conducting shield, such as, a metallic can or a conformal coating.
  • a perfectly conducting shield such as, a metallic can or a conformal coating.
  • the metallic can is less than optimum because there are always areas from which radiation can escape, it adds cost and weight to the electronic device, and it is not suitable for a flexible substrate.
  • the metallic can must be de-soldered and then re- soldered, which increases the risk of damaging active devices.
  • Conformal coatings also have disadvantages. They are typically applied in multiple layers, a dielectric insulating layer and a conductive layer, which require multiple processing steps.
  • the conductive layer is usually applied as a liquid ink and if not carefully controlled may lead to deposition in an undesired area and cause shorts in the circuitry.
  • the drying curing time for printed conductive inks is in the range of 10 to 30 minutes, longer than desired, and conductive inks may contain volatile organic solvent.
  • the dielectric layer is interposed between the conductive layer and the circuitry to prevent the conductive layer from electrically contacting predetermined areas of the circuitry and substrate.
  • This invention is a composite film, which shields for EMI, for use in fabricating printed circuit boards (PCB).
  • the film has at least two layers, a top layer electrically conductive in all directions (isotropic), and a bottom layer electrically conductive only in the Z (thickness) direction (anisotropic) after thermo-compression. (Thermo-compression is the application of heat and pressure.)
  • the bottom layer is in contact with the grounding pads of the circuitry of the electronic device.
  • the conductive top layer functions similarly to metallic boxes to prevent the electromagnetic radiation from both entering the boxes and escaping into the environment.
  • the bottom layer interconnects the top conductive layer to the grounding pads on the PCB after thermo-compression so that electromagnetic waves collected by the top layer are directed and released to PCB grounding pads through the bottom layer.
  • the level of conductive filler in the bottom layer is below the level that would cause electrical shorting in the circuitry of the device without the application of thermo-compression. That is, for those areas of the substrate and circuitry outside of the grounding pads and consequently not subject to thermo-compression processing, the conductive filler in the bottom layer is at too low a level to allow conductance. However, when thermo-compression processing is applied to localized areas, the pressure and heat at those localized areas cause the conductive fillers in those localities to sinter and interconnect, thereby allowing the connection of the active device to the top conductive layer.
  • the level of thermo-compression is an effective level to cause the interconnection of the conductive filler particles between the top layer and the bottom layer.
  • the conductive top layer functions similarly to metallic cans or metal cases, and contains an effective amount of conductive filler to prevent the ingress or egress of electromagnetic radiation (without thermo-compression).
  • the top layer of the EMI shielding film can be composed in alternative embodiments establishing isotropic conductivity.
  • the top layer comprises a polymeric resin filled with conductive particles at a loading level effective to establish isotropic
  • the polymeric resin comprises at least one thermoset resin, and/or at least one thermoplastic resin.
  • suitable thermoset resins include vinyl, acrylic, phenolic, epoxy, maleimide, polyimide, or silicon-containing resins.
  • exemplary suitable thermoplastic resins include acrylics, phenoxy resins, thermoplastic polyesters, polyamides, polyurethanes, polyolefins, polysulfide rubbers, and nitrile rubbers.
  • the conductive filler particles for the top layer can be any effective filler at any effective loading to provide isotropic conductivity.
  • Suitable fillers include silver, nickel, copper, graphite, carbon nanotubes, or core/shell particles.
  • the core can be an inorganic particle, such as silica, glass, boron nitride, or metal, or it can be an organic resin, such as polyethylene, polystyrene, phenol resin, epoxy resin, acryl resin or benzoguanamine resin;
  • the shell can be a conductive element such as silver, nickel, or copper.
  • Suitable conductive filler loading levels are 15 volume percent or greater, depending on the shape and size of the conductive fillers, with respect to the total composition of the top layer.
  • Silver coated copper (Ag/Cu) is suitable.
  • the top layer can be a metal foil or a metal mesh, such as, for example, copper or aluminum.
  • the top layer can be a combination of a metal foil or metal mesh and the polymeric resin filled with conductive particles.
  • the bottom layer of the EMI shielding film will be sufficiently adhesive to connect the composite film to the EMI shielded components or substrate.
  • the bottom layer comprises an adhesive polymeric resin filled with conductive particles at a loading level effective to establish anisotropic conductivity upon the application of thermo-compression.
  • the bottom layer polymeric resin comprises at least one thermoset resin, and/or at least one thermoplastic resin.
  • Exemplary suitable thermoset resins include vinyl, acrylic, phenolic, epoxy, maleimide, polyimide, or silicon-containing resins.
  • Exemplary suitable thermoplastic resins include acrylics, phenoxy resins, thermoplastic polyesters, polyamides, polyurethanes, polyolefins, polysulfide rubber, and nitrile rubbers.
  • the conductive fillers for the bottom layer are loaded typically at 2 to 20 volume percent (vol%) with respect to the total composition of the bottom layer. In one embodiment, the conductive filler for the bottom layer is present in an amount of about 1 to about 5 volume percent.
  • the bottom layer filler particle diameter is selected to be smaller than the bottom layer thickness. Suitable particle diameters are in the range of 1 ⁇ to 125 ⁇ .
  • Suitable bottom layer fillers include silver, copper, nickel, and graphite. Conductive filler with conductive shell and conductive or dielectric core can also be used. Examples include gold coated polymer spheres, Ag coated silicate, tungsten carbide (WC) coated aluminum, and graphite coated metal.
  • Other suitable bottom layer fillers include silver, copper, nickel, and graphite with a dielectric outer coating to further ensure no possibility of circuitry shorting. If such a dielectric outer coating is used, it should be selected to breakup easily with pressure or melt away with heat, so that when thermo-compression is applied in localized areas, conductive interconnections can be formed.
  • the bottom layer may also contain thermally conductive but electrically non-conductive (dielectric) fillers to enhance thermal conductivity of the package.
  • thermally conductive dielectric fillers include boron nitride, aluminum oxide, aluminum nitride, and particles coated with these materials. When thermally conductive dielectric fillers are present, they are present in the range of 10 weight percent to 80 weight percent (wt%) with respect to the total composition of the bottom layer.
  • the thermally conductive dielectric fillers (or other functional non-conductive fillers) will have a maximum particle size smaller than the particle size of the conductive fillers in the bottom layer.
  • hot melt resins are homogenized with conductive fillers (for example, using a heated compounding machine). This hot melt mixture is extruded through a slot die to a given thickness and the extruded film calendared further for reduced thickness.
  • the bottom layer is prepared from one or more solvent-free liquid B-stageable thermoset resins or a combination of thermoset and thermoplastic resins. Conductive fillers are dispersed into the liquid resins using conventional mixing vessels and blades. The mixture is disposed directly onto the top layer, or disposed onto a release liner. Using heat or UV radiation, the bottom layer is cured to form a B-staged coating or film. If the bottom layer mixture is disposed onto a release liner, after B-staging it is contacted to the top layer, the bottom and top layers are laminated, and the release liner is removed.
  • the bottom layer will be further crosslinked to provide a reliable interconnect during the thermo-compression process occurring in the EMI assembly, or later if there is a post-cure step.
  • the bottom layer can be prepared from a solvent based thermoplastic or thermoset resin system. Conductive fillers are dispersed in the solvent and resin mixture using conventional mixing vessels and blades. The mixture is disposed onto the top layer or disposed onto a release liner, followed by solvent evaporation to form a film. If the mixture is disposed onto a release liner, after solvent evaporation and film formation, the bottom layer is contacted to the top layer, the layers are laminated, and the release liner is later removed.
  • the bottom layer can be prepared as a composite of different layers in which, for example, the first layer is a film prepared from a reactive resin, and the second layer is a film prepared from a curing agent; optionally, a third layer prepared from an inert material can be inserted between the first and second layer to prevent pre-reaction between those layers, thereby enhancing the shelf life of the composite bottom layer film.
  • the bottom layer will be substantially dry to the touch after solvent evaporation, after thermal or UV B-staging, or after hot melt extrusion and cooling.
  • the composite film of top layer and bottom layer is prepared by laminating the conductive top layer to the bottom layer, or by coating the bottom layer directly onto the top layer.
  • the bottom layer thickness will be 50 ⁇ or greater, and the top layer thickness will be between 10-100 ⁇ , depending on requirements for film conductivity and shielding effectiveness.
  • a third pressure-sensitive-layer can be added below the bottom layer to control positioning during assembly processes.
  • the composite film can be slit to the desired width and cut to the desired length, and can be packaged on a reel.
  • Utilization of the composite film as an EMI shield for printed circuit boards (PCB) can occur in several embodiments.
  • the EMI shield composite film is picked-up and placed on top of the PCB.
  • the film is softened by heating the assembly from the top and/or bottom to a temperature 30° to 50°C above the softening temperature of the composite film.
  • the softened film will conform to the contour of the components needing EMI shielding protection.
  • a hot air stream or a heated metal block with contours matching the PCB layout can be used as the heat source.
  • Interconnects between the conductive top layer to the PCB ground pads is established by thermo-compression, that is, by thermally compressing the composite film to the PCB ground pad with a heated source, such as, a heated metal bar or a high pressure hot air stream.
  • a heated source such as, a heated metal bar or a high pressure hot air stream.
  • the film softening/conforming and interconnect are done in a single step.
  • the composite film can be picked-up and placed to the desired substrate and the softening/conforming step can be done together with solder reflow and electrical connection of all the components.
  • a metal bar can be used to establish the interconnect as described above. This assembly scenario is fully compatible with the current metallic can process.
  • filler is one that is sharp and hard, for example, tungsten carbide coated aluminum, and the bottom dielectric film has proper softness at room temperature
  • a cold stamping process followed by heat curing the dielectric resin, can be used to make the interconnect between the top conductive layer and PCB ground pads.
  • the heat cure following the cold stamping secures the interconnect and provides strong adhesion. In this case the thermo-compression step is not needed.
  • a catalyst or accelerator can be dispensed to the PCB ground pad before placement of the EMI shielding composite film to further improve the cure speed of the bottom layer.
  • the proposed composite film may be cramped into a wavy format.
  • the advantage of a wavy format film compared to a flat format film is to provide expansion, which better accommodates any three dimensional electronic components underneath the EMI composite film.

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Laminated Bodies (AREA)
  • Non-Insulated Conductors (AREA)
PCT/US2011/057418 2010-10-26 2011-10-24 Composite film for board level emi shielding Ceased WO2012058131A2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FIEP11836909.9T FI2633746T3 (fi) 2010-10-26 2011-10-24 Piirilevytasoiseen EMI-suojaukseen tarkoitettu komposiittikalvo
KR1020137013255A KR101584872B1 (ko) 2010-10-26 2011-10-24 기판 수준 emi 차폐를 위한 복합 필름
EP11836909.9A EP2633746B1 (en) 2010-10-26 2011-10-24 Composite film for board level emi shielding
JP2013536689A JP6082696B2 (ja) 2010-10-26 2011-10-24 基板レベルのemi遮蔽のための複合フィルム
CN201180051609.6A CN103190209B (zh) 2010-10-26 2011-10-24 用于板级emi屏蔽的复合膜
US13/798,895 US8847184B2 (en) 2010-10-26 2013-03-13 Composite film for board level EMI shielding

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40670510P 2010-10-26 2010-10-26
US61/406,705 2010-10-26

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US13/798,895 Continuation US8847184B2 (en) 2010-10-26 2013-03-13 Composite film for board level EMI shielding

Publications (2)

Publication Number Publication Date
WO2012058131A2 true WO2012058131A2 (en) 2012-05-03
WO2012058131A3 WO2012058131A3 (en) 2012-06-28

Family

ID=45994675

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2011/057418 Ceased WO2012058131A2 (en) 2010-10-26 2011-10-24 Composite film for board level emi shielding

Country Status (8)

Country Link
US (1) US8847184B2 (enExample)
EP (1) EP2633746B1 (enExample)
JP (2) JP6082696B2 (enExample)
KR (1) KR101584872B1 (enExample)
CN (1) CN103190209B (enExample)
FI (1) FI2633746T3 (enExample)
TW (1) TWI507120B (enExample)
WO (1) WO2012058131A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3075798A1 (en) * 2015-04-01 2016-10-05 Ronald R. Savin Coating compositions

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9678499B2 (en) 2012-06-27 2017-06-13 Mitsubishi Electric Research Laboratories, Inc. Method for controlling redundantly actuated machines for cutting a pattern of disconnected contours
TWI573523B (zh) * 2014-04-10 2017-03-01 Joinsoon Electronic Manufacturing Co Ltd Prevention and control of electrical signals are disturbed by the method and its circuit structure
CN106465568B (zh) * 2014-06-02 2019-01-01 大自达电线股份有限公司 导电性接合膜、印刷布线板及电子设备
KR102314774B1 (ko) 2014-11-26 2021-10-21 삼성전자주식회사 반도체 패키지
US9635789B2 (en) 2015-01-30 2017-04-25 Laird Technologies, Inc. Board level electromagnetic interference (EMI) shields with increased under-shield space
KR101862121B1 (ko) * 2015-02-02 2018-05-29 토요잉크Sc홀딩스주식회사 전자파 차폐 시트, 프린트 배선판 및 전자 기기
JP3216710U (ja) 2015-06-12 2018-06-21 グラフテック インターナショナル ホールディングス インコーポレイティド グラファイト複合材料及び熱管理システム
US9968004B2 (en) 2015-09-25 2018-05-08 Laird Technologies, Inc. Thermal interface materials including electrically-conductive material
CN213951063U (zh) 2016-03-31 2021-08-13 新格拉夫解决方案有限责任公司 噪声抑制石墨物品和组件
JP6528733B2 (ja) 2016-06-21 2019-06-12 株式会社デンソー エジェクタ式冷凍サイクル
US10080317B2 (en) 2016-06-29 2018-09-18 Microsoft Technology Licensing, Llc Polymeric electromagnetic shield for electronic components
TWI619561B (zh) * 2016-07-28 2018-04-01 Rotating target
US10477738B2 (en) 2017-03-06 2019-11-12 Laird Technologies, Inc. Board level shields and systems and methods of applying board level shielding
KR20190076250A (ko) 2017-12-22 2019-07-02 삼성전자주식회사 반도체 패키지 및 반도체 모듈
KR102616814B1 (ko) * 2018-03-09 2023-12-21 삼성전자주식회사 반도체 패키지 및 반도체 모듈
CN111972051A (zh) 2018-03-16 2020-11-20 华为技术有限公司 用于电磁干扰屏蔽的组件及方法
KR102075669B1 (ko) * 2018-10-26 2020-02-10 오재숙 신호 전송 커넥터 및 그 제조방법
KR102869375B1 (ko) * 2020-07-28 2025-10-14 삼성전자주식회사 Fpcb 조립체 및 이를 포함하는 전자 기기
KR102521564B1 (ko) * 2021-01-14 2023-04-12 성균관대학교산학협력단 방열 및 전자파 차폐 복합재료, 이를 구비하는 전자 소자 패키지 및 이의 제조방법

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030079893A1 (en) 2001-01-25 2003-05-01 Osamu Hashimoto Electric-wave absorber
WO2008146014A2 (en) 2007-06-01 2008-12-04 Hexcel Composites Limited Improved structural adhesive materials
JP2009290103A (ja) 2008-05-30 2009-12-10 Tatsuta System Electronics Kk 電磁波シールド材及びプリント配線板

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3157344B2 (ja) * 1993-04-27 2001-04-16 三洋電機株式会社 導電シート及び表示器の製造方法
US5639989A (en) 1994-04-19 1997-06-17 Motorola Inc. Shielded electronic component assembly and method for making the same
JPH087658A (ja) * 1994-06-22 1996-01-12 Hitachi Chem Co Ltd 異方導電性接着フィルム
US6900383B2 (en) 2001-03-19 2005-05-31 Hewlett-Packard Development Company, L.P. Board-level EMI shield that adheres to and conforms with printed circuit board component and board surfaces
US6674652B2 (en) * 2002-01-29 2004-01-06 3Com Corporation Integrated shield wrap
US20060225874A1 (en) * 2005-04-11 2006-10-12 Shives Gary D Sandwiched thermal article
US20060247352A1 (en) * 2005-04-29 2006-11-02 Ariel - University Research And Development Ltd. EMI shielding material
JP4319167B2 (ja) 2005-05-13 2009-08-26 タツタ システム・エレクトロニクス株式会社 シールドフィルム、シールドプリント配線板、シールドフレキシブルプリント配線板、シールドフィルムの製造方法及びシールドプリント配線板の製造方法
KR100608533B1 (ko) * 2005-05-13 2006-08-08 쓰리엠 이노베이티브 프로퍼티즈 캄파니 전기 전도성이 우수한 고분자 수지 및 그 제조방법
JP2007073547A (ja) * 2005-09-02 2007-03-22 Yuji Suda 電子部品の加圧装置
KR101367040B1 (ko) * 2006-03-28 2014-02-24 파커-한니핀 코포레이션 분배성 경화 수지
JP4914262B2 (ja) * 2006-03-29 2012-04-11 タツタ電線株式会社 シールドフィルム及びシールドプリント配線板
JP2007324161A (ja) * 2006-05-30 2007-12-13 Yuji Suda ビルドアップ多層配線板の製造方法
JP5129935B2 (ja) * 2006-06-13 2013-01-30 日東電工株式会社 シート状複合材料及びその製造方法
US20100096181A1 (en) * 2007-03-29 2010-04-22 Munetomo Nakamura Electromagnetic shield sheet and rfid plate
JP5487419B2 (ja) * 2008-02-12 2014-05-07 タツタ電線株式会社 導電性接着シート及びそれを備えた配線板、導電性接着シートの製造方法
BR112012000203B1 (pt) * 2009-06-12 2020-01-28 Lord Corp método para proteção de um substrato contra relâmpagos
KR101332362B1 (ko) 2012-09-21 2013-12-02 재단법인 철원플라즈마 산업기술연구원 나노금속―그래핀을 이용한 열 확산기 및 이의 제조방법

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030079893A1 (en) 2001-01-25 2003-05-01 Osamu Hashimoto Electric-wave absorber
WO2008146014A2 (en) 2007-06-01 2008-12-04 Hexcel Composites Limited Improved structural adhesive materials
JP2009290103A (ja) 2008-05-30 2009-12-10 Tatsuta System Electronics Kk 電磁波シールド材及びプリント配線板

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2633746A4

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3075798A1 (en) * 2015-04-01 2016-10-05 Ronald R. Savin Coating compositions

Also Published As

Publication number Publication date
JP2016122859A (ja) 2016-07-07
TWI507120B (zh) 2015-11-01
KR20130132450A (ko) 2013-12-04
JP6082696B2 (ja) 2017-02-15
US8847184B2 (en) 2014-09-30
EP2633746B1 (en) 2023-07-19
WO2012058131A3 (en) 2012-06-28
EP2633746A2 (en) 2013-09-04
CN103190209B (zh) 2016-05-18
KR101584872B1 (ko) 2016-01-13
US20130207005A1 (en) 2013-08-15
FI2633746T3 (fi) 2023-07-24
CN103190209A (zh) 2013-07-03
JP2014502221A (ja) 2014-01-30
TW201228589A (en) 2012-07-01
EP2633746A4 (en) 2017-11-29

Similar Documents

Publication Publication Date Title
US8847184B2 (en) Composite film for board level EMI shielding
JP6511473B2 (ja) 電磁波シールドフィルム
CN101690442B (zh) 具有屏蔽及散热性的高频模块及其制造方法
TWI477229B (zh) Printed wiring board with shielding film and printed wiring board
US9685413B1 (en) Semiconductor package having an EMI shielding layer
TWI787448B (zh) 用於屏蔽系統級封裝組件免受電磁干擾的方法
KR102477543B1 (ko) 전자파 차폐 시트 및 전자부품 탑재 기판
JP6303597B2 (ja) 電子部品モジュールの製造方法
WO2020090726A1 (ja) 電磁波シールドフィルム、シールドプリント配線板の製造方法、及び、シールドプリント配線板
JP2023120233A (ja) 電磁波シールドフィルム及びシールドプリント配線板
KR20180122597A (ko) 전자파 차폐 필름
CN114496814B (zh) 一种电磁屏蔽封装方法以及电磁屏蔽封装结构
JP6196131B2 (ja) プレス接着用金属箔及び電子部品パッケージ
TW202029846A (zh) 屏蔽印刷配線板及屏蔽印刷配線板之製造方法
JP2012015548A (ja) シールド及び放熱性を有する高周波モジュール及びその製造方法
CN110784992B (zh) 自由接地膜、线路板及自由接地膜的制备方法
CN110784983B (zh) 自由接地膜、线路板及自由接地膜的制备方法
CN110784986B (zh) 自由接地膜、线路板及自由接地膜的制备方法
CN110784989B (zh) 自由接地膜、线路板及自由接地膜的制备方法
JP2001274300A (ja) 接着材およびこれを用いた電子部品
JP6321944B2 (ja) プレス接着用金属箔及び電子部品パッケージ
CN108697044A (zh) 一种电磁波干扰遮蔽薄膜
JP2018046282A (ja) 電子部品モジュールの製造方法
JP6583455B2 (ja) 電子部品モジュールの製造方法
JP6196132B2 (ja) プレス接着用金属箔及び電子部品パッケージ

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 11836909

Country of ref document: EP

Kind code of ref document: A2

ENP Entry into the national phase

Ref document number: 2013536689

Country of ref document: JP

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 2011836909

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: DE

ENP Entry into the national phase

Ref document number: 20137013255

Country of ref document: KR

Kind code of ref document: A