WO2011155398A1 - 太陽電池素子の電極焼成用焼成炉、太陽電池素子の製造方法及び太陽電池素子 - Google Patents
太陽電池素子の電極焼成用焼成炉、太陽電池素子の製造方法及び太陽電池素子 Download PDFInfo
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- WO2011155398A1 WO2011155398A1 PCT/JP2011/062755 JP2011062755W WO2011155398A1 WO 2011155398 A1 WO2011155398 A1 WO 2011155398A1 JP 2011062755 W JP2011062755 W JP 2011062755W WO 2011155398 A1 WO2011155398 A1 WO 2011155398A1
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- solar cell
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- 238000010304 firing Methods 0.000 title claims abstract description 88
- 238000000034 method Methods 0.000 title claims description 21
- 238000004519 manufacturing process Methods 0.000 title claims description 13
- 239000000758 substrate Substances 0.000 claims abstract description 84
- 238000010438 heat treatment Methods 0.000 claims abstract description 71
- 238000001816 cooling Methods 0.000 claims abstract description 21
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000000605 extraction Methods 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 abstract description 10
- 239000002184 metal Substances 0.000 abstract description 10
- 239000002003 electrode paste Substances 0.000 abstract description 7
- 230000006866 deterioration Effects 0.000 abstract description 4
- 239000000463 material Substances 0.000 abstract description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 18
- 229910052782 aluminium Inorganic materials 0.000 description 18
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 18
- 229910052710 silicon Inorganic materials 0.000 description 18
- 239000010703 silicon Substances 0.000 description 18
- 238000009792 diffusion process Methods 0.000 description 11
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 7
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 6
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 6
- 239000012535 impurity Substances 0.000 description 6
- 229910052709 silver Inorganic materials 0.000 description 6
- 239000004332 silver Substances 0.000 description 6
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- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 3
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- 238000004140 cleaning Methods 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 3
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
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- 238000009825 accumulation Methods 0.000 description 2
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- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
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- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- 239000002966 varnish Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
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- 239000003929 acidic solution Substances 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
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- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
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- 238000005245 sintering Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B17/00—Furnaces of a kind not covered by any preceding group
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B9/00—Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity
- F27B9/14—Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity characterised by the path of the charge during treatment; characterised by the means by which the charge is moved during treatment
- F27B9/20—Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity characterised by the path of the charge during treatment; characterised by the means by which the charge is moved during treatment the charge moving in a substantially straight path tunnel furnace
- F27B9/24—Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity characterised by the path of the charge during treatment; characterised by the means by which the charge is moved during treatment the charge moving in a substantially straight path tunnel furnace being carried by a conveyor
- F27B9/243—Endless-strand conveyor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/6776—Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
- H01L31/1864—Annealing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present invention relates to a firing furnace for firing an electrode of a solar cell element, a method for manufacturing a solar cell element using the same, and a solar cell element.
- FIG. 1 shows a cross-sectional view of the structure of a general solar cell element.
- This solar cell element 1 is a plate having a size of 100 to 150 mm square and a thickness of 0.1 to 0.3 mm, and polycrystalline or single crystal silicon or the like is doped with a p-type impurity such as boron. It consists of a p-type semiconductor substrate 2. This substrate is doped with an n-type impurity such as phosphorus to form an n-type impurity layer 3, an antireflection film 4 such as SiN is attached, and a conductive aluminum paste is applied to the back surface using a screen printing method. Each surface is printed with conductive silver paste, dried and fired to form a back surface aluminum electrode 5 and a back surface field (BSF) layer 6 to form a surface collector electrode 7.
- BSF back surface field
- FIG. 2 is a schematic view of a general mesh belt firing furnace used when firing an electroconductive paste to form an electrode in the method for manufacturing a solar cell element described above.
- the substrate 11 on which the conductive paste is printed is conveyed by the mesh belt 12 driven by the driving unit 15 via the roller 16, and after the conductive paste is baked by the heating unit 13, it is cooled by the cooling unit 14.
- An electrode is formed.
- reference numeral 17 denotes a cleaning tank for removing dirt adhering to the mesh belt.
- the heat capacity of the mesh belt is large, so the power consumption is large.
- a rapid heating / rapid cooling profile is preferable, but a rapid heating / rapid cooling profile is formed in a mesh belt type firing furnace.
- a large number of heaters and water cooling are required.
- Patent Document 1 Japanese Patent Laid-Open No. 08-162446
- the power consumption of the firing furnace is reduced, and the firing processing time is further shortened.
- FIG. 3 the schematic of this wire-type baking furnace is shown.
- the substrate 21 coated with the conductive paste is transported by the wire transport member 22 driven by the driving unit 25 via the roller 26 and passes through the heating unit 23 and the cooling unit 24.
- an electrode is formed.
- a substrate on which a conductive paste is printed is directly placed on a wire and conveyed.
- the wire has a temperature of about 50 ° C. lower than the ambient temperature and the substrate temperature.
- the contact portion The aluminum remains on the wire and gradually accumulates. Since the deposited aluminum becomes hard alumina, the aluminum electrode is damaged when the number of firing treatments is increased. Since this scratch may be a hard protrusion, when the cells are stacked and packed in a box, the cells may be cracked starting from this point. For this reason, there exists a problem of reducing a yield.
- the temperature of the heating part in the firing furnace is lower than that of the atmosphere and the substrate, so that the portion of the substrate that is in contact with the wire is not sufficiently heated. This causes the sintering of the silver electrode to be insufficient and the thickness distribution of the BSF layer to be generated, thereby degrading the characteristics of the solar cell element.
- FIG. 4 shows a schematic diagram of this wire type walking beam conveyance firing furnace.
- This walking beam type firing furnace can be driven in the vertical direction and the front-rear direction by two fixed wires (fixed beams) 32 arranged in parallel and horizontally with a predetermined stroke, and can move the substrate 31.
- a wire (vertical / vertical movable beam) 33 is provided, and the fixed beam 32 and the movable beam 33 are fixed while being wound around rolls 34 and 35, respectively, and extend and contract as necessary.
- the firing furnace further includes a heating unit 36 that heats the substrate and a cooling unit 37 that cools the heated substrate.
- FIG. 5 shows a partially omitted enlarged view of the fixed beam and movable beam portions.
- FIG. 6 shows a state where the substrate 31 is placed on the movable beam 33.
- the movable beam 33 moves forward by one stroke while holding the substrate 31 and stops.
- the movable beam 33 descends in the vertical direction, delivers the substrate 31 to the fixed beam 32, further descends, and then moves backward by one stroke to stop and return to the original position.
- Heat treatment is performed by passing the substrate through the heating part and the cooling part of the furnace by the walking beam by the method as described above.
- the present invention has been made in view of the above circumstances, and prevents metal components in the conductive paste from being deposited on a conveying member such as a wire and damaging the electrodes and the substrate, and reducing unevenness in the firing of the substrate surface.
- An electrode firing firing furnace for a solar cell element capable of efficiently firing an electrode paste and producing a solar cell element with good yield without deteriorating solar cell characteristics, and production of a solar cell element using the firing furnace It is an object to provide a method and a solar cell element.
- the present inventors have found that a transport member for transporting a substrate coated with a conductive paste, a heating unit for heating the substrate and firing the conductive paste, and heating
- the electrode member firing furnace of the solar cell element equipped with a cooling unit for cooling the substrate was used, and the transport member was made into a wire-type structure, and the wire-type transport member was heated by a heating means.
- the temperature of the conveying member can be brought close to the heating portion atmosphere temperature, and the substrate can be efficiently heated. This prevents the metal component of the conductive paste from remaining undissolved on the wire, prevents damage to the electrode and the substrate due to the deposit of the metal component, and also suppresses uneven baking in the substrate surface.
- the present inventors have found that a solar cell element can be produced by firing an electrode paste without reducing the solar cell characteristics and yield, and the present invention has been made.
- the present invention provides the following firing furnace, method for producing a solar cell element, and solar cell element.
- a firing furnace comprising a transport member for transporting a substrate coated with a conductive paste, a heating unit for heating the substrate to fire the conductive paste, and a cooling unit for cooling the heated substrate.
- the conveying member is a member in which at least two wires are arranged so as to be movable in parallel and horizontally along the longitudinal direction of the furnace, and a substrate is placed on the wires and conveyed (1) ) Or (2).
- a method for manufacturing a solar cell element comprising: forming a pn junction on a semiconductor substrate and then applying and baking a conductive paste on a light receiving surface and a non-light receiving surface of the semiconductor substrate to form a power extraction electrode.
- the wire when firing the electrode paste using a wire-type firing furnace, the wire is heated by about 50 ° C. from the normal temperature in order to bring it closer to the temperature of the heating part atmosphere or the temperature of the aluminum paste layer. Baking is performed with the temperature and the atmosphere temperature of the heating section being substantially equal. Thereby, the yield fall by the electrode being damaged by the deposit of the metal component of the electrically conductive paste on a wire is suppressed, and the continuous use of a wire-type baking furnace is attained. Furthermore, the characteristic deterioration can also be suppressed by making the baking unevenness in the board
- the firing furnace of the present invention is a firing furnace for firing electrodes of solar cell elements, a transport member for transporting a substrate coated with a conductive paste, and heating for firing the conductive paste by heating the substrate. And a cooling unit for cooling the heated substrate, and a heating means for heating the transport member is provided.
- the substrate coated with the conductive paste is placed on the transport member and transported through the furnace, and the conductive paste is fired by passing through the heating section to form electrodes.
- the structure of the conveying member that conveys the substrate is not particularly limited, and any of a mesh type, a wire type, and the like may be used, but it is preferable to use a wire-type baking furnace in which the substrate is conveyed by a wire. Thereby, high-throughput firing can be performed with less power consumption than a general mesh belt firing furnace.
- the structure is not particularly limited and may be a conventionally known one. However, at least two wires, particularly 2 to 4 wires, are arranged along the longitudinal direction of the furnace as shown in FIG. A structure that can be moved parallel and horizontally to each other and driven via a roller by a drive unit, or a structure that is arranged parallel to and parallel to each other along the longitudinal direction of the furnace as shown in FIG. Etc. are preferable.
- the material of the wire is preferably stainless steel such as SUS303 or SUS304, and it is preferable to use a material having a thickness of 1 to 20 mm ⁇ from the viewpoint of the balance between the strength of the wire and the power consumption necessary for heating the firing furnace.
- the heat capacity is preferably set at a predetermined heat capacity so that less power is required for heating the firing furnace.
- the use of a wire-type walking beam as shown in FIGS. 4 to 6 is advantageous because less power consumption is required for heating the firing furnace.
- the conveying member on which the substrate is placed is heated, so that the atmosphere of the conveying member and the heating unit is set to substantially the same temperature.
- the temperature of the conductive paste layer of the substrate and the wire in the firing furnace is made substantially equal by heating the wire of the transport member.
- the yield fall by an electrode being damaged by the deposit of the said metal component on a wire can be suppressed. Furthermore, the characteristic deterioration can also be suppressed by making the baking unevenness in the board
- a heating means for heating the conveying member in the case of a wire-type firing furnace, there is an electric means for heating directly by applying a voltage to both ends of the wire and flowing an alternating current or a direct current.
- a heating area is provided outside the firing furnace to heat the wire itself by lamp, a means for heating the wire itself by applying steam to the wire outside the firing furnace, and a current to the wire.
- the means for indirectly heating the wire needs to provide a heating area outside the firing furnace, the means for directly heating the wire is superior in terms of cost and space.
- a means for directly heating the wire By using these means, the temperature difference between the wire and the entire substrate is eliminated, so that the phenomenon that the high-temperature conductive paste that has been generated in the past sticks to the low-temperature wire is eliminated. Accumulation of metal components in the conductive paste can be prevented. Thereby, it is possible to suppress a decrease in yield due to the electrode being damaged by the deposit of the metal component on the wire and a decrease in characteristics due to uneven baking in the surface of the substrate.
- the temperature of the heating part (firing temperature) is usually 500 to 950 ° C., particularly 600 to 850 ° C.
- the heating time is preferably 5 to 30 seconds
- the temperature of the cooling part is 25 to 500 ° C.
- the atmosphere in the furnace may be air, but an atmosphere that can burn organic substances contained in the conductive paste is preferable.
- the temperature of the conveying member is set to be approximately equal to the temperature of the heating section atmosphere, but is preferably 500 to 950 ° C., more preferably 600 to 850 ° C.
- the heating part atmosphere temperature and the conveying member temperature are substantially equal to each other when the temperature difference between the heating part atmosphere and the conveying member is 0 to 200 ° C., preferably 0 to 100 ° C., more preferably 0 to It means 20 ° C., more preferably 0 to 10 ° C.
- the solar cell element 1 includes an n-type diffusion layer 3 on the surface (light-receiving surface) side of a silicon substrate 2 as a main body, and antireflection of SiN or the like formed on the n-type diffusion layer.
- the film 4 has a surface collector electrode 7 connected to the n-type diffusion layer, and a back surface electrode 5 and a back surface field (BSF) layer 6 are provided on the back surface side.
- BSF back surface field
- a substrate such as a p-type silicon substrate is prepared.
- a p-type silicon substrate having a specific resistance of 0.1 to 4.0 ⁇ ⁇ cm is often used. This may be a polycrystal or a single crystal.
- a plate having a size of 100 to 150 mm square and a thickness of 0.1 to 0.3 mm is preferably used.
- a concavo-convex structure called a texture is formed.
- the surface of the p-type silicon substrate that is the light-receiving surface side of the solar cell element is the front surface
- the surface of the p-type silicon substrate that is opposite to the light-receiving surface side is the back surface.
- a p-type silicon substrate is placed in a high-temperature gas of about 800 ° C. or higher containing, for example, POCl 3, and n-type impurity elements such as phosphorus are diffused over the entire surface of the p-type silicon substrate by a thermal diffusion method.
- a type diffusion layer (n-type impurity layer) is formed on the surface.
- the n-type diffusion layer may be formed on both surfaces and end surfaces of the p-type silicon substrate. In this case, the necessary n-type diffusion layer is formed.
- An unnecessary n-type diffusion layer can be removed by immersing a p-type silicon substrate whose surface is covered with an acid-resistant resin in a hydrofluoric acid solution or the like.
- a substrate having a pn junction can be obtained by the above method.
- an antireflection film such as SiN is formed on the surface of the p-type silicon substrate by, for example, a plasma CVD method using ammonia, silane, nitrogen, hydrogen, or the like.
- a conductive paste containing, for example, aluminum, glass frit, varnish, etc. is screen printed and dried.
- a conductive electrode containing, for example, silver, glass frit, varnish and the like is screen-printed on the surface and dried to form a collector electrode.
- each electrode paste is fired using the firing furnace of the present invention, whereby an aluminum electrode and a BSF layer are formed on the back surface side, and a silver electrode is formed on the front surface side.
- the shape of the power extraction electrodes on the front and back surfaces is not particularly limited, and any shape such as a comb shape or a lattice shape can be fired in the firing furnace of the present invention. The firing conditions are as described above.
- a p-type silicon substrate made of p-type polycrystalline silicon doped with boron and sliced to a thickness of 0.2 mm and made of p-type polycrystalline silicon having a specific resistance of about 1 ⁇ ⁇ cm is used to form a square with a side of 15 cm.
- the plate shape Then, this p-type silicon substrate was immersed in a hydrofluoric acid solution for 15 seconds for damage etching, and further chemically etched with a 70 ° C. solution containing 2% by mass of KOH and 2% by mass of isopropyl alcohol (IPA) for 5 minutes.
- IPA isopropyl alcohol
- an n layer was formed on the p-type silicon substrate by a thermal diffusion method in a POCl 3 gas atmosphere at a temperature of 870 ° C. for 30 minutes.
- the sheet resistance of the n layer was about 40 ⁇ / ⁇ .
- the p-type silicon substrate was immersed in a hydrofluoric acid solution for 10 seconds to remove the portion of the n layer where the acid resistant resin was not formed. Thereafter, the acid-resistant resin was removed to form an n layer only on the surface of the p-type silicon substrate.
- SiN serving as an antireflection film was formed with a thickness of 100 nm on the surface of the p-type silicon substrate on which the n layer was formed by plasma CVD using ammonia gas, silane, and nitrogen gas.
- a conductive aluminum paste was printed on the back surface of the substrate on which the antireflection film was formed, and dried at 150 ° C.
- the collector electrode was formed using the electroconductive silver paste on the surface using the screen printing method, and it was made to dry at 150 degreeC.
- the treated substrate was put into a wire-type walking beam firing furnace as shown in FIG. 4 to fire the conductive paste at a maximum temperature of 800 ° C. to fire the electrode.
- the temperature in the firing furnace (heating section) was measured by allowing a K-type thermocouple (manufactured by Keyence Corporation) to enter, and the temperature of the wire was measured by bringing the K-type thermocouple into contact with the wire.
- the temperature of the wire in this case was almost equal to the atmospheric temperature in the heating part (wire temperature: 795 ° C.).
- Table 1 shows the solar cell characteristics and the yield by the firing process when 1000 solar cell elements were fired by the above method.
- the yield in this case represents the percentage of non-defective products in which the above problems (cracks, protrusions, abnormal appearance, etc.) did not occur with respect to the number of substrates put into the firing process.
- the characteristics shown as a comparative example are those obtained by firing without wire heating in the same wire-type firing furnace as in this example.
- the temperature in the firing furnace (heating portion) was measured by allowing a K-type thermocouple to enter, and the temperature of the wire was measured by bringing the K-type thermocouple into contact with the wire.
- the temperature of the wire was about 50 ° C. lower than the atmospheric temperature in the heating part.
- Table 1 by using the firing furnace according to the present invention, the solar cell characteristics and yield can be expected to increase as compared with the firing of the comparative example.
- the main factor is that there is no temperature drop in the wire part.
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Abstract
Description
(1)導電性ペーストを塗布した基板を搬送するための搬送部材、該基板を加熱して該導電性ペーストを焼成するための加熱部、及び加熱した基板を冷却する冷却部を具備する焼成炉であって、上記搬送部材を加熱するための加熱手段を設けたことを特徴とする太陽電池素子の電極焼成用焼成炉。
(2)加熱部雰囲気と搬送部材の温度差が0~200℃である(1)記載の焼成炉。
(3)搬送部材が、少なくとも2本のワイヤーを炉の長手方向に沿って互いに平行かつ水平に移動可能に配置してなり、該ワイヤー上に基板を載置して搬送する部材である(1)又は(2)記載の焼成炉。
(4)搬送部材が、ウォーキングビーム形式である(1)~(3)のいずれかに記載の焼成炉。
(5)搬送部材を加熱するための加熱手段が、電気的手段である(1)~(4)のいずれかに記載の焼成炉。
(6)半導体基板にpn接合を形成した後、該半導体基板の受光面及び非受光面上に導電性ペーストを塗布・焼成して電力取り出し用電極を形成する工程を含む太陽電池素子の製造方法であって、上記導電性ペーストの焼成を(1)~(5)のいずれかに記載の焼成炉を用いて行うことを特徴とする太陽電池素子の製造方法。
(7)(6)記載の製造方法によって得られた太陽電池素子。
ボロンがドープされ、厚さ0.2mmにスライスして作製された比抵抗が約1Ω・cmのp型の多結晶シリコンからなるp型シリコン基板に外径加工を行うことによって、一辺15cmの正方形の板状とした。そして、このp型シリコン基板をフッ硝酸溶液中に15秒間浸漬させてダメージエッチングし、さらに2質量%のKOHと2質量%のイソプロピルアルコール(IPA)を含む70℃の溶液で5分間化学エッチングした後に純水で洗浄し、乾燥させることで、p型シリコン基板表面にテクスチャ構造を形成した。
2 基板
3 n型不純物層
4 反射防止膜
5 裏面電極
6 BSF層
7 表面集電極
11,21,31 基板
12 メッシュベルト
13,23,36 加熱部
14,24,37 冷却部
34,35 ロール
15,25 駆動部
16,26 ローラー
17 洗浄槽
22 ワイヤー式搬送部材
32 固定ワイヤー(固定ビーム)
33 可動ワイヤー(可動ビーム)
Claims (7)
- 導電性ペーストを塗布した基板を搬送するための搬送部材、該基板を加熱して該導電性ペーストを焼成するための加熱部、及び加熱した基板を冷却する冷却部を具備する焼成炉であって、上記搬送部材を加熱するための加熱手段を設けたことを特徴とする太陽電池素子の電極焼成用焼成炉。
- 加熱部雰囲気と搬送部材の温度差が0~200℃である請求項1記載の焼成炉。
- 搬送部材が、少なくとも2本のワイヤーを炉の長手方向に沿って互いに平行かつ水平に移動可能に配置してなり、該ワイヤー上に基板を載置して搬送する部材である請求項1又は2記載の焼成炉。
- 搬送部材が、ウォーキングビーム形式である請求項1乃至3のいずれか1項記載の焼成炉。
- 搬送部材を加熱するための加熱手段が、電気的手段である請求項1乃至4のいずれか1項記載の焼成炉。
- 半導体基板にpn接合を形成した後、該半導体基板の受光面及び非受光面上に導電性ペーストを塗布・焼成して電力取り出し用電極を形成する工程を含む太陽電池素子の製造方法であって、上記導電性ペーストの焼成を請求項1乃至5のいずれか1項記載の焼成炉を用いて行うことを特徴とする太陽電池素子の製造方法。
- 請求項6記載の製造方法によって得られた太陽電池素子。
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KR1020137000148A KR101766315B1 (ko) | 2010-06-10 | 2011-06-03 | 태양전지 소자의 전극 소성용 소성로, 태양전지 소자의 제조방법 및 태양전지 소자 |
SG2012090445A SG186241A1 (en) | 2010-06-10 | 2011-06-03 | Firing furnace for firing electrode of solar cell element, method for manufacturing solar cell element, and solar cell element |
RU2012156276/28A RU2562701C2 (ru) | 2010-06-10 | 2011-06-03 | Печь для вжигания электрода солнечного элемента, способ изготовления солнечного элемента и солнечный элемент |
CN201180036171.4A CN103026480B (zh) | 2010-06-10 | 2011-06-03 | 用于烧制太阳能电池元件电极的燃烧炉、制造太阳能电池元件的方法和太阳能电池元件 |
US13/703,261 US20130133738A1 (en) | 2010-06-10 | 2011-06-03 | Firing furnace for firing electrode of solar cell element, method for manufacturing solar cell element, and solar cell element |
EP11792355.7A EP2581933B1 (en) | 2010-06-10 | 2011-06-03 | Firing furnace for firing electrode of solar cell element, method for manufacturing solar cell element |
AU2011262963A AU2011262963B2 (en) | 2010-06-10 | 2011-06-03 | Firing furnace for firing electrode of solar cell element, method for manufacturing solar cell element, and solar cell element |
US15/821,052 US11616163B2 (en) | 2010-06-10 | 2017-11-22 | Firing furnace for firing electrode of solar cell element, method for manufacturing solar cell element, and solar cell element |
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US13/703,261 A-371-Of-International US20130133738A1 (en) | 2010-06-10 | 2011-06-03 | Firing furnace for firing electrode of solar cell element, method for manufacturing solar cell element, and solar cell element |
US15/821,052 Division US11616163B2 (en) | 2010-06-10 | 2017-11-22 | Firing furnace for firing electrode of solar cell element, method for manufacturing solar cell element, and solar cell element |
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Also Published As
Publication number | Publication date |
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KR101766315B1 (ko) | 2017-08-08 |
KR20130098266A (ko) | 2013-09-04 |
EP2581933A4 (en) | 2015-11-25 |
RU2562701C2 (ru) | 2015-09-10 |
AU2011262963B2 (en) | 2014-11-13 |
RU2012156276A (ru) | 2014-07-20 |
EP2581933A1 (en) | 2013-04-17 |
JP5477180B2 (ja) | 2014-04-23 |
SG186241A1 (en) | 2013-01-30 |
TW201217733A (en) | 2012-05-01 |
TWI503514B (zh) | 2015-10-11 |
US20180108803A1 (en) | 2018-04-19 |
AU2011262963A1 (en) | 2013-01-10 |
US11616163B2 (en) | 2023-03-28 |
EP2581933B1 (en) | 2017-11-15 |
US20130133738A1 (en) | 2013-05-30 |
JP2011258813A (ja) | 2011-12-22 |
CN103026480A (zh) | 2013-04-03 |
CN103026480B (zh) | 2016-05-04 |
MY163740A (en) | 2017-10-31 |
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