WO2011111328A1 - 半導体レーザ装置 - Google Patents
半導体レーザ装置 Download PDFInfo
- Publication number
- WO2011111328A1 WO2011111328A1 PCT/JP2011/001133 JP2011001133W WO2011111328A1 WO 2011111328 A1 WO2011111328 A1 WO 2011111328A1 JP 2011001133 W JP2011001133 W JP 2011001133W WO 2011111328 A1 WO2011111328 A1 WO 2011111328A1
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- WO
- WIPO (PCT)
- Prior art keywords
- seal member
- heat sink
- outer periphery
- semiconductor laser
- forming member
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/024—Arrangements for thermal management
- H01S5/02407—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling
- H01S5/02423—Liquid cooling, e.g. a liquid cools a mount of the laser
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4256—Details of housings
- G02B6/4262—Details of housings characterised by the shape of the housing
- G02B6/4265—Details of housings characterised by the shape of the housing of the Butterfly or dual inline package [DIP] type
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4266—Thermal aspects, temperature control or temperature monitoring
- G02B6/4268—Cooling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
- H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/02208—Mountings; Housings characterised by the shape of the housings
- H01S5/02216—Butterfly-type, i.e. with electrode pins extending horizontally from the housings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0225—Out-coupling of light
- H01S5/02251—Out-coupling of light using optical fibres
Definitions
- the present invention relates to a semiconductor laser device, and more particularly to a semiconductor laser device optically coupled to an optical fiber.
- semiconductor laser bar manufacturers in which a plurality of emitters (light emitting portions) are arranged in a one-dimensional manner, have been commercialized by semiconductor laser device manufacturers.
- a method is known in which laser light emitted from these emitters is coupled to an optical fiber so as to be easily used as excitation light or processing of a solid state laser (see, for example, Patent Document 1).
- FIG. 12 shows a conventional semiconductor laser device.
- the semiconductor laser device includes a semiconductor laser device 101 for emitting laser light, a heat sink 102 for cooling the semiconductor laser device 101, and a metal plate 103 fixed and installed after achieving electrical insulation with respect to the heat sink 102. Have.
- the metal wire 104 is bonded to the semiconductor laser device 101 and the metal plate 103, and the semiconductor laser device 101 and the metal plate 103 are electrically connected.
- the electrode plate 106 is for supplying power to the inside of the substantially box-shaped package 105.
- the insulating member 107 electrically insulates the package 105 and the electrode plate 106, and the metal member 108 connects the metal plate 103 and the electrode plate 106.
- the rod lens 109 collimates the laser beam emitted from the semiconductor laser element 101, and the lens fixing base 110 holds the rod lens 109.
- the fiber array 111 is a bundle of optical fibers for guiding the laser light collimated by the rod lens 109 to the outside of the package 105, and the optical fiber 112 guides the laser light to the outside of the package 105. It is for.
- the lid 113 is for sealing the package 105, and the sealing member 114 hermetically seals the package 105 and the lid 113.
- the sealing material 115 is for sealing the package 105 and the optical fiber 112 in an airtight manner.
- the electrical input supplied from the power supply device passes from the package 105 through the heat sink 102, to the anode side of the semiconductor laser device 101, and from the electrode plate 106 through the metal member 108, the metal plate 103, and the metal wire 104 to the semiconductor laser device. It is supplied to the cathode side of 101. As described above, when the electrical input is applied to the semiconductor laser device 101, the semiconductor laser device 101 emits a laser beam.
- the emitted laser light is collimated by the rod lens 109 and then enters the fiber array 111. Then, the laser light is guided to the outside of the package 105 through the optical fiber 112 and used as excitation light of a solid state laser or a direct processing light source.
- the semiconductor laser device 101 When power is supplied to the semiconductor laser device 101, it is photoelectrically converted to cause laser oscillation, and part of the power is consumed by the resistance component of the semiconductor laser device 101 to generate heat. Further, the inside of the package 105 is heated by absorbing a part of the laser light and the scattered light thereof.
- the bottom of the package 105 is cooled by a cooling medium or a Peltier element or the like. As a result, it has been attempted to cool the heat sink 102, the semiconductor laser element 101, and the inside of the package 105 to prevent the temperature rise due to the above-described heat generation.
- the conventional semiconductor laser device As the output of the semiconductor laser device 101 is increased, a large electric input is required, and the amount of heat generation is also increased. As a result, the cooling capacity of the semiconductor laser module is insufficient, and the case temperature of the semiconductor laser device 101 rises. As a result, there is a problem that the reliability of the semiconductor laser device 101 is lowered due to the temperature rise, or the beam quality is deteriorated due to the positional change of the rod lens 109 due to the temperature rise inside the package 105.
- the present invention increases the cooling capacity of the semiconductor laser module to suppress the temperature rise of the semiconductor laser device, and provides a highly reliable and high quality semiconductor laser device.
- a semiconductor laser device comprises a housing, a heat sink provided in the housing and having a cooling medium passage inside, and a laser emitting unit directly or indirectly attached to the heat sink,
- the wall surface of the housing is cooled to the outside of the housing from a first through hole for supplying the cooling medium from the outside of the housing to the cooling medium passage of the heat sink, and the cooling medium passage of the heat sink
- the cooling medium can be supplied to the cooling medium passage of the heat sink and can be cooled effectively, and as a result, the temperature rise inside the housing can be suppressed. As a result, the temperature rise of the semiconductor laser device can be suppressed, and a high-reliability, high-quality semiconductor laser device can be realized.
- the semiconductor laser device of the present invention comprises a housing, a heat sink provided in the housing and having a cooling medium passage inside, a laser emitting portion directly or indirectly attached to the heat sink, and the housing
- the first through hole and the second through hole are provided in the wall surface of the housing facing the flat member, and the inside of the first through hole is provided with a flat member provided outside one of the wall surfaces.
- a first flow path forming member provided with a flow path for supplying the cooling medium to the cooling medium passage of the heat sink is provided, and inside the second through hole, the cooling medium is discharged from the cooling medium passage of the heat sink
- Providing a hole, and forming a second channel of the flat member The corresponding position may be configured to provide a fourth through hole for discharging the cooling medium from the cooling medium passage of the heatsink.
- the cooling medium can be supplied to the cooling medium passage of the heat sink and can be cooled effectively, and as a result, the temperature rise inside the housing can be suppressed. As a result, the temperature rise of the semiconductor laser device can be suppressed, and a high-reliability, high-quality semiconductor laser device can be realized.
- a semiconductor laser device includes a housing, a heat sink provided in the housing and having a cooling medium passage inside, and a laser emitting unit directly or indirectly attached to the heat sink, A first flow passage forming member provided with a first through hole and a second through hole on a wall surface of the body, and a flow passage for supplying a cooling medium to the heat sink inside the first through hole And a second flow path forming member provided with a flow path for discharging the cooling medium from the heat sink inside the second through hole, and the first flow path forming member and the second flow path forming At least one of the members is configured to have a stepped portion engaged with the first through hole portion or the second through hole portion of the corresponding housing.
- the cooling medium can be supplied to the cooling medium passage of the heat sink and can be cooled effectively, and as a result, the temperature rise inside the housing can be suppressed. As a result, the temperature rise of the semiconductor laser device can be suppressed, and a high-reliability, high-quality semiconductor laser device can be realized.
- FIG. 1 is a partially cutaway perspective view showing a semiconductor laser device according to a first embodiment of the present invention.
- FIG. 2 is a partially cutaway perspective view showing a semiconductor laser device according to a second embodiment of the present invention.
- FIG. 3 is a partially cutaway perspective view showing a semiconductor laser device according to a second embodiment of the present invention.
- FIG. 4 is a partially cutaway perspective view showing a semiconductor laser device according to a second embodiment of the present invention.
- FIG. 5 is a partially cutaway perspective view showing a semiconductor laser device according to a second embodiment of the present invention.
- FIG. 6 is a partially cutaway perspective view showing a semiconductor laser device according to a third embodiment of the present invention.
- FIG. 1 is a partially cutaway perspective view showing a semiconductor laser device according to a first embodiment of the present invention.
- FIG. 2 is a partially cutaway perspective view showing a semiconductor laser device according to a second embodiment of the present invention.
- FIG. 3 is a partially cutaway perspective view showing a
- FIG. 7 is a partially cutaway perspective view showing a semiconductor laser device according to a third embodiment of the present invention.
- FIG. 8 is a partially cutaway perspective view showing a semiconductor laser device according to a fourth embodiment of the present invention.
- FIG. 9 is a partially cutaway perspective view showing a semiconductor laser device according to a fourth embodiment of the present invention.
- FIG. 10 is a partially cutaway perspective view showing a semiconductor laser device according to a fourth embodiment of the present invention.
- FIG. 11 is a partially cutaway perspective view showing a semiconductor laser device according to a fifth embodiment of the present invention.
- FIG. 12 is a partially cutaway perspective view showing a conventional semiconductor laser device.
- FIG. 1 is a partially cutaway perspective view showing a semiconductor laser device according to a first embodiment of the present invention.
- the semiconductor laser device 1 for emitting laser light, the heat sink 2 for cooling the semiconductor laser device 1, and the heat sink 2 are fixed in an electrically insulated state.
- a metal plate 3 installed.
- the semiconductor laser device 1 is directly attached to the upper surface of the heat sink 2.
- a plate having both conductivity and thermal conductivity is interposed between the two to make the semiconductor laser device 1 a heat sink. It may be attached to the upper surface of 2 indirectly.
- the metal wire 4 is bonded to the semiconductor laser element 1 and the metal plate 3.
- the substantially box-shaped package 5 used as an example of a housing has a bottom surface and an outer peripheral side surface, and the upper surface is in an open state.
- an electrode plate 6 for supplying power to the inside of the package 5, an insulating member 7 for electrically insulating the package 5 and the electrode plate 6, and a metal plate 3. And a metal member 8 for connecting the electrode plate 6 to the electrode plate 6.
- the semiconductor laser device further includes a rod lens 9, a lens fixing base 10, a fiber array 11, and an optical fiber 12.
- the rod lens 9 collimates the laser light emitted from the semiconductor laser element 1.
- the lens fixing base 10 holds the rod lens 9.
- the fiber array 11 is formed by bundling optical fibers in order to guide the laser light collimated by the rod lens 9 to the outside of the package 5.
- the optical fiber 12 is for guiding laser light to the outside of the package 5 and is an output portion of the semiconductor laser device.
- the lid 13 seals the top opening of the package 5, and the sealing member 14 hermetically seals between the package 5 and the lid 13.
- the lid 13 is mounted on the top opening of the package 5 while the sealing member 14 is mounted on the outer periphery of the top opening of the package 5 and the top of the sealing member 14 is crushed in this state. Airtightness can be achieved in the configured housing.
- the sealing member 15 is for sealing the package 5 and the optical fiber 12 in an airtight manner, which also serves to keep the package 5 airtight.
- the first through holes 16 and the second through holes 17 are formed penetrating the bottom of the package 5 in the vertical direction.
- the cooling medium passage 2 a is provided in the heat sink 2, and the first through hole 16 and the second through hole 17 are connected to the cooling medium passage 2 a, and the first through hole 16 is formed.
- the inflowing coolant flows out of the second through hole 17 out of the package 5 after passing through the coolant passage 2a.
- the first seal member 18 is provided to prevent the coolant from flowing out into the package 5.
- the first seal member 18 is provided on the bottom surface of the package 5 at the outer periphery of the first through hole 16, that is, at the outer periphery of the joint between the heat sink 2 and the first through hole 16. It is pushed to the 5 side.
- the second seal member 19 is also provided to prevent the coolant from flowing out into the package 5.
- the second seal member 19 is provided on the bottom surface of the package 5 at the outer periphery of the second through hole 17, that is, at the outer periphery of the joint between the heat sink 2 and the second through hole 17. It is pushed to the 5 side.
- the electric power supplied from the power supply device is from the package 5 of the semiconductor laser device through the heat sink 2 and the anode side of the semiconductor laser device 1 is from the electrode plate 6 through the metal member 8, the metal plate 3 and the metal wire 4.
- the cathode side of the semiconductor laser device 1 is supplied as the negative side. As a result, a current flows through the semiconductor laser device 1 and this current is converted into light and a laser beam is emitted.
- the emitted laser light is collimated by the rod lens 9 and efficiently enters the fiber array 11, and is guided to the outside of the package 5 through the optical fiber 12, and the excitation light of the solid state laser or the direct light as the output light of the semiconductor laser module It is used as a processing light source.
- the semiconductor laser device 1 when power is supplied to the semiconductor laser device 1, the power is photoelectrically converted to cause laser oscillation, and a part of the power is consumed by the resistance component of the semiconductor laser device 1, thereby the semiconductor laser device 1 itself It also generates fever. As the temperature of the semiconductor laser device 1 rises, the current flowing therein is not confined in the area where the photoelectric conversion is efficiently performed, so that the laser oscillation efficiency is lowered. In addition, when the temperature rises, the power required to obtain the same light output also increases, and the rate at which the semiconductor laser device 1 is deteriorated also increases, so the life becomes short.
- the cooling capacity of the heat sink 2 for cooling the semiconductor laser element 1 is enhanced to suppress the temperature rise of the semiconductor laser element 1. That is, the cooling medium is directly introduced into the cooling medium passage 2 a of the heat sink 2 formed in a portion close to the semiconductor laser device 1 through the first through holes 16 and the second through holes 17 provided in the package 5. By flowing, the temperature rise of the semiconductor laser device 1 is suppressed.
- the cooling capacity of the heat sink 2 is improved, and the temperature rise of the semiconductor laser device 1 can be suppressed, so that a semiconductor laser device with higher reliability and quality and higher output can be realized.
- the semiconductor laser device of the present invention includes the housing 5, the heat sink 2 provided in the housing 5 and having the cooling medium passage 2 a inside, and the laser emitting portion directly or indirectly attached to the heat sink 2 It has one.
- a first through hole 16 and a second through hole 17 are provided on the wall surface of the case 5 of the semiconductor laser device, and the outer periphery of the first through hole 16 in the case 5 is provided with a first through hole 16 and a second through hole 17.
- the first seal member 18 is disposed on the outer periphery of the second through hole 17 and the second seal member 19 is disposed on the outer periphery of the second through hole 17.
- the first through holes 16 supply the cooling medium to the cooling medium passage 2 a of the heat sink 2 from the outside of the housing 5.
- the second through holes 17 discharge the cooling medium from the cooling medium passage 2 a of the heat sink 2 to the outside of the housing 5.
- the laser emission unit 1 also includes a semiconductor laser device 1.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 5 can be suppressed.
- the temperature rise of the semiconductor laser device 1 can be suppressed, and a semiconductor laser device with high reliability and high quality can be realized.
- FIGS. 2 to 5 are partially cutaway perspective views showing a semiconductor laser device according to a second embodiment of the present invention.
- a first flow path forming member 21 and a second flow path forming member 22 are provided in a housing, for example, a substantially box-shaped package 20.
- the plane member 23 is provided on the bottom surface side of the package 20, and the third through holes 24 and the fourth through holes 25 correspond to the first through holes 16 and the second through holes 17, respectively. It is provided.
- the first seal member 26 is provided between the heat sink 2 and the first flow path forming member 21, and the cooling medium flowing through the first through hole 16 and the second through hole 17 flows out into the package 20. To prevent.
- the second seal member 27 is provided between the heat sink 2 and the second flow path forming member 22 to prevent the coolant from flowing out into the package 20.
- the third seal member 28 is provided between the first flow path forming member 21 and the third through hole 24 to prevent the coolant from flowing out of the package.
- the fourth seal member 29 is provided between the second flow passage forming member 22 and the fourth through hole 25 to prevent the coolant from flowing out of the package.
- the fifth seal member 30 is provided on the outer periphery of the third seal member 28 between the package 20 and the flat member 23, and maintains the airtightness inside the package 20.
- the sixth seal member 31 is provided on the outer periphery of the fourth seal member 29 between the package 20 and the flat member 23 and maintains the airtightness of the inside of the package 20.
- the semiconductor laser device of the second embodiment includes the package 20, the heat sink 2, the semiconductor laser element 1 which is the laser emitting unit 1, and the plane member 23.
- the heat sink 2 is provided in the package 20 and has the cooling medium passage 2 a inside.
- the semiconductor laser device 1 is attached directly or indirectly to the heat sink 2, and the flat member 23 is provided outside the bottom surface of the package 20.
- first through hole 16 and a second through hole 17 are provided on the wall surface of the package 20 facing the flat member 23.
- a cylindrical first flow passage forming member 21 provided with a flow passage for supplying a cooling medium to the cooling medium passage 2 a of the heat sink 2 is provided inside the first through hole 16.
- a second flow path forming member 22 having a flow path for discharging the cooling medium from the cooling medium passage 2 a of the heat sink 2 is provided inside the second through hole 17.
- a third through hole 24 for supplying a cooling medium to the cooling medium passage 2 a of the heat sink 2 is provided at a position corresponding to the first flow passage forming member 21 of the plane member 23.
- a fourth through hole 25 for discharging the cooling medium from the cooling medium passage 2 a of the heat sink 2 is also provided at a position corresponding to the second flow passage forming member 22 of the plane member 23.
- the semiconductor laser device of the present invention includes a housing 20, a heat sink 2 provided in the housing 20 and having a cooling medium passage inside, and a laser emitting portion 1 attached directly or indirectly to the heat sink And a flat member 23 provided outside one of the wall surfaces of the housing 20.
- a first through hole 16 and a second through hole 17 are provided on the wall surface of the housing 20 facing the flat member 23. Inside the first through hole 16, a first flow path forming member 21 is provided. A second flow path forming member 22 is provided inside the second through hole 17.
- the first flow path forming member 21 is provided with a flow path for supplying the cooling medium to the cooling medium passage 2 a of the heat sink 2.
- the second flow passage forming member 22 includes a flow passage for discharging the cooling medium to the cooling medium passage 2 a of the heat sink 2.
- a third through hole 24 for supplying a cooling medium to the cooling medium passage 2 a of the heat sink 2 is provided at a position corresponding to the first flow passage forming member 21 of the plane member 23.
- a fourth through hole 25 for discharging the cooling medium from the cooling medium passage 2 a of the heat sink 2 is provided at a position of the flat member 23 corresponding to the second flow passage forming member 22.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 20 can be suppressed.
- the temperature rise of the semiconductor laser device 1 can be suppressed, and a semiconductor laser device with high reliability and high quality can be realized.
- the cooling medium flows through the first through holes 16 and the second through holes 17 in the package 5 to supply the cooling medium to the heat sink 2.
- the material of the package 5 copper or copper alloy which is excellent in both corrosion resistance and conductivity is generally used.
- the first flow path forming member 21 through which the cooling medium flows, the second flow path forming member 22 and the plane member 23 have high corrosion resistance but low conductivity.
- stainless steel or a resin member is used.
- stainless steel, resin, and aluminum alloy can be easily made of a mold, a die cast, a cast such as a lost wax, etc., and mass production can significantly reduce the processing cost.
- the sealing members 26, 27, 28, 29 can prevent the coolant from flowing out, and the sealing members 30, 31 can ensure the airtightness of the inside of the package 20.
- the sealing members 30, 31 for securing the inside of the package 20 may be provided between the heat sink 2 and the package 20 as the sealing members 32, 33 shown in FIG. . That is, the seal members 30 and 31 may be provided on the outer periphery of the seal members 27 and 28.
- the semiconductor laser device of the present invention is provided with the first seal member 26, the second seal member 27, the third seal member 28, and the fourth seal member 29, and the case 20 and the plane are provided.
- the fifth seal member 30 is provided on the outer periphery of the third seal member 28 between the members 23, and the sixth seal member 31 is provided on the outer periphery of the fourth seal member 29 between the housing 20 and the flat member 23.
- the first seal member 26 is provided on the outer periphery of the joint between the heat sink 2 and the first flow path forming member 21.
- the second seal member 27 is provided on the outer periphery of the joint between the heat sink 2 and the second flow path forming member 22.
- the third seal member 28 is provided on the outer periphery of the joint portion of the flat member 23 and the first flow path forming member 21.
- the fourth seal member 29 is provided on the outer periphery of the joint portion of the flat member 23 and the second flow path forming member 22.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 20 can be suppressed. Furthermore, by providing double sealing members, the outflow of the cooling medium can be prevented, and the airtightness of the inside of the package 20 can be secured.
- the first seal member 26, the second seal member 27, the third seal member 28, and the fourth seal member 29 are provided, and the housing 20 and the heat sink are provided.
- the fifth seal member 32 is provided on the outer periphery of the first seal member 26 between the two
- the sixth seal member 33 is provided on the outer periphery of the second seal member 27 between the housing 20 and the heat sink 2
- the first seal member 26 is provided on the outer periphery of the joint between the heat sink 2 and the first flow path forming member 21.
- the second seal member 27 is provided on the outer periphery of the joint between the heat sink 2 and the second flow path forming member 22.
- the third seal member 28 is provided on the outer periphery of the joint portion of the flat member 23 and the first flow path forming member 21.
- the fourth seal member 29 is provided on the outer periphery of the joint portion of the flat member 23 and the second flow path forming member 22.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 20 can be suppressed. Furthermore, by providing double sealing members, the outflow of the cooling medium can be prevented, and the airtightness of the inside of the package 20 can be secured.
- the housing 20 is formed of a metal containing aluminum as a main component, and the first flow path forming member 21, the second flow path forming member 22 and the flat member 23 are formed of a member having better corrosion resistance than aluminum. To be configured.
- the semiconductor laser device 1 Is efficiently cooled by the cooling medium, and the temperature rise is suppressed.
- first flow passage forming member 21, the second flow passage forming member 22 and the flat member 23 are formed of stainless steel or resin.
- the first flow path forming member 21, the second flow path forming member 22 and the flat surface member 23 can be easily formed of a mold, die casting, casting such as lost wax, etc.
- the processing cost can be significantly reduced.
- the fifth seal member 34 for securing the airtightness of the inside of the package 20 is the third seal member 28 and the fourth seal.
- the structure may be provided between the package 20 and the planar member 23 so as to surround the member 29 simultaneously. That is, the semiconductor laser device of the present invention is provided with the first seal member 26, the second seal member 27, the third seal member 28, and the fourth seal member 29, and the housing 20 and the heat sink A fifth seal member 34 surrounding the first seal member 26 and the second seal member 27 is provided between the two.
- the first seal member 26 is provided on the outer periphery of the joint between the heat sink 2 and the first flow path forming member 21.
- the second seal member 27 is provided on the outer periphery of the joint between the heat sink 2 and the second flow path forming member 22.
- the third seal member 28 is provided on the outer periphery of the joint portion of the flat member 23 and the first flow path forming member 21.
- the fourth seal member 29 is provided on the outer periphery of the joint portion of the flat member 23 and the second flow path forming member 22.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 20 can be suppressed. Furthermore, by providing double sealing members, the outflow of the cooling medium can be prevented, and the airtightness of the inside of the package 20 can be secured.
- the fifth seal member 35 for ensuring the airtightness of the inside of the package 20 is the first seal member 26 and the second seal. It may be provided between the heat sink 2 and the package 20 so as to surround the member 27 simultaneously. That is, the semiconductor laser device of the present invention is provided with the first seal member 26, the second seal member 27, the third seal member 28, and the fourth seal member 29, and the case 20 and the plane are provided. A third seal member 28 and a fifth seal member 35 surrounding the fourth seal member 29 are provided between the members 23.
- the first seal member 26 is provided on the outer periphery of the joint between the heat sink 2 and the first flow path forming member 21.
- the second seal member 27 is provided on the outer periphery of the joint between the heat sink 2 and the second flow path forming member 22.
- the third seal member 28 is provided on the outer periphery of the joint portion of the flat member 23 and the first flow path forming member 21.
- the fourth seal member 29 is provided on the outer periphery of the joint portion of the flat member 23 and the second flow path forming member 22.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 20 can be suppressed. Furthermore, by providing double sealing members, the outflow of the cooling medium can be prevented, and the airtightness of the inside of the package 20 can be secured.
- the first flow path forming member 21, the second flow path forming member 22 and the plane member 23 are made of a highly corrosion resistant member, and the package 20 is manufactured.
- a structure using a highly conductive member is employed.
- members of different materials suitable for each application are used in the required parts. As a result, it is inexpensive as a material, and mass production processing becomes easy. Therefore, the cost can be reduced because the cost and the reliability of the semiconductor laser module including the semiconductor laser device can be ensured and the cost can be reduced.
- a cooling medium can be supplied to the cooling medium passage of the heat sink, and this can be effectively cooled, and as a result, the temperature rise inside the housing can be suppressed. Furthermore, by providing the sealing member in a double manner, the outflow of the cooling medium can be prevented, and the airtightness inside the package can be secured.
- Third Embodiment 6 and 7 are partially cutaway perspective views showing a semiconductor laser device according to a third embodiment of the present invention.
- the first seal member 36 of the semiconductor laser device of the third embodiment is provided between the heat sink 2, the first flow path forming member 21 and the package 20, and the cooling medium is a package 20.
- the inside of the package 20 is kept airtight while being prevented from flowing into the inside.
- the second seal member 37 is provided between the heat sink 2, the second flow path forming member 22 and the package 20 to prevent the cooling medium from flowing out into the package 20 and the inside of the package 20. Maintain the air tightness of
- the first seal member 36 is provided between the package 20, the heat sink 2 and the first flow path forming member 21, and the package 20, the heat sink 2 and the second flow path
- a second seal member 37 is provided between the forming members 22.
- the third seal member 28 is provided on the outer periphery of the joint portion of the flat member 23 and the first flow passage forming member 21, and the flat member 23 and the second flow passage forming member
- the fourth seal member 29 is provided on the outer periphery of the joint portion 22, and the structure of the seal member for securing the airtightness of the package 20 is different from the second embodiment.
- any one of the following seal members is required. That is, the fifth seal member 30 and the sixth seal member 31 shown in FIG. 2, the fifth seal member 32 and the sixth seal member 33 shown in FIG. 3, the fifth seal member 34 shown in FIG. A fifth sealing member 35 shown in 5 is required.
- the first seal member 36 sets the heat sink 2, the package 20 and the first flow path forming member 21 between the heat sink 2 and the second seal member 37. Between the package 20 and the second flow path forming member 22 is sealed. That is, in the semiconductor laser device of the present invention, the first seal member 36 is provided between the housing 20, the heat sink 2 and the first flow path forming member 21, and the housing 20, the heat sink 2 and the second flow path forming A second seal member 37 is provided between the members 22.
- the third seal member 28 is provided on the outer periphery of the joint between the planar member 23 and the first flow path forming member 21, and the planar member 23 and the second flow path forming member 22 are coupled
- a fourth seal member 29 is provided on the outer periphery of the portion.
- the third seal member 38 and the fourth seal member 39 for preventing the outflow of the cooling medium and ensuring the airtightness of the inside of the package 20 are planar members 23,
- the structure may be provided between each of the package 20 and the first flow path forming member 21 or the second flow path forming member 22. That is, the semiconductor laser device of the present invention is provided with the first seal member 26 and the second seal member 27, and the third laser is formed between the housing 20, the flat member 23 and the first flow path forming member 21.
- the seal member 38 is provided, and the fourth seal member 39 is provided between the housing 20, the flat member 23, and the second flow path forming member 22.
- first seal member 26 is provided on the outer periphery of the joint between the heat sink 2 and the first flow path forming member 21.
- second seal member 27 is provided on the outer periphery of the joint between the heat sink 2 and the second flow path forming member 22.
- FIGS. 8, 9 and 10 are partially cutaway perspective views showing a semiconductor laser device according to a fourth embodiment of the present invention.
- the semiconductor laser device according to the fourth embodiment shown in FIG. 8 includes a substantially box-shaped package 40, a first flow path forming member 41 provided in the package 40, and a second flow path provided in the package 40.
- a forming member 42, a first seal member 43, a second seal member 44, a third seal member 45, and a fourth seal member 46 are provided.
- the first seal member 43 is a seal member provided between the heat sink 2 and the first flow path forming member 41 for preventing the cooling medium from flowing out into the package 40.
- the second seal member 44 is provided between the heat sink 2 and the second flow path forming member 42 and is a seal member for preventing the cooling medium from flowing out into the inside of the package 40.
- the third seal member 45 is provided between the package 40 and the first flow path forming member 41, and is a seal member for keeping the inside of the package 40 airtight.
- the fourth seal member 46 is provided between the package 40 and the second flow path forming member 42, and is a seal member for keeping the inside of the package 40 airtight.
- the semiconductor laser device of the fourth embodiment is provided in a housing, for example, a package 40, and the heat sink 2 provided in the package 40 and having a cooling medium passage inside and directly or indirectly attached to the heat sink 2.
- the laser emitting portion for example, the semiconductor laser device 1 is provided, and the wall surface of the package 40 is provided with a first through hole 16 and a second through hole 17.
- a first flow path forming member 41 having a flow path for supplying a cooling medium to the heat sink 2 is provided inside the first through hole 16, and a heat sink is provided inside the second through hole 17.
- a second flow path forming member 42 provided with a flow path for discharging the cooling medium from 2 is provided.
- the corresponding first through hole 16 of the package 40 is provided in at least one of the first flow path forming member 41 and the second flow path forming member 42. Stepped parts 16a and 17a engaged with the part or the second through hole 17 are formed.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 40 can be suppressed. Further, by providing the step portions 16a and 17a and the seal member, the outflow of the cooling medium can be prevented as described later, and the airtightness of the inside of the housing 40 can be secured.
- each of the flow path forming members 21 and 22 is prevented from being separated from the casing 20.
- the flat member 23 to support is needed.
- the flat member 23 also needs a seal structure for securing the airtightness inside the package 20.
- the semiconductor laser device of the fourth embodiment at least one of the flow path forming members 41 and 42 is engaged with the corresponding through holes 16 and 17 of the package 40 as shown in FIG.
- the step portions 41a and 42a are formed to extend outward.
- the step portions 16a and 17a are formed in the through holes 16 and 17 so as to engage with the step portions 41a and 42a of the flow path forming members 41 and 42.
- the step portions 41a and 42a are engaged with the step portions 16a and 17a without the flow path forming members 41 and 42 being separated from the through holes 16 and 17 of the package 40.
- the sealing members 45 and 46 for securing the airtightness of the inside of the package 40 between the package 40 and the flow path forming members 41 and 42, respectively, the need for the flat member 23 is eliminated. Thereby, the semiconductor laser device can be manufactured at low cost.
- the housing 40 is formed of a metal containing aluminum as a main component, and the first flow path forming member 41 and the second flow path forming member 42 are formed of a member having better corrosion resistance than aluminum. .
- the semiconductor laser device 1 is efficiently cooled. It is cooled by the medium and the temperature rise is suppressed.
- first flow path forming member 41 and the second flow path forming member 42 are formed of stainless steel or resin. With this configuration, the first flow path forming member 41 and the second flow path forming member 42 can be easily formed of a mold, a die cast, a casting such as a lost wax, etc. Can be significantly cheaper.
- the sealing members 45 and 46 for securing the inside of the package 40 are heat sinks 2 around the flow path forming members 41 and 42 as the sealing members 47 and 48 of the semiconductor laser device shown in FIG. And the package 40 may be provided.
- the first seal member 43 is provided on the outer periphery of the joint between the heat sink 2 and the first flow path forming member 41, and the outer periphery of the joint between the heat sink 2 and the second flow path forming member 42 is A second seal member 44 is provided, a third seal member 47 is provided on the outer periphery of the first seal member 43, and a fourth seal member 48 is provided on the outer periphery of the second seal member 44.
- the first seal member 43 and the second seal member 44 may be disposed between the housing 40 and the heat sink 2.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 40 can be suppressed. Furthermore, by providing the step portions 16a and 17a and the seal member, the flow of the cooling medium can be prevented, and the airtightness of the inside of the housing 40 can be secured. At the same time, it is not necessary to arrange the planar member 23, and the semiconductor laser device can be manufactured inexpensively.
- the fifth seal member 49 for securing the airtightness of the inside of the package 40 is formed so as to surround the flow path forming members 41 and 42.
- the structure may be provided between the heat sink 2 and the package 20.
- the semiconductor laser device of the present invention is provided with the first seal member 43 and the second seal member 44, and the first seal member 43 and the second seal member are provided between the housing 40 and the heat sink 2.
- a fifth seal member 49 surrounding the portion 44 is provided.
- the first seal member 43 is provided on the outer periphery of the joint portion of the heat sink 2 and the first flow path forming member 41.
- the second seal member 44 is provided on the outer periphery of the joint between the heat sink 2 and the second flow path forming member 42.
- the cooling medium can be supplied to the cooling medium passage 2 a of the heat sink 2 and can be cooled effectively, and as a result, the temperature rise inside the housing 40 can be suppressed. Furthermore, by providing the step portions 16a and 17a and the seal member, the flow of the cooling medium can be prevented, and the airtightness of the inside of the housing 40 can be secured. At the same time, it is not necessary to arrange the planar member 23, and the semiconductor laser device can be manufactured inexpensively.
- the flat member 23 provided to support the flow path forming members 41 and 42 and to ensure the airtightness inside the package 40 is disposed. There is no need, and the price can be reduced accordingly. Thus, the semiconductor laser device can be manufactured at lower cost.
- FIG. 11 is a partially cutaway perspective view showing a semiconductor laser device according to a fifth embodiment of the present invention.
- the first seal member 50 is provided between the heat sink 2, the first flow path forming member 41 and the package 40.
- the second seal member 51 is provided between the heat sink 2, the second flow path forming member 42 and the package 40.
- the sealing members 50 and 51 prevent the cooling medium from flowing out into the package 40 and keep the inside of the package 40 airtight.
- the semiconductor laser device of the fifth embodiment is different from that of the fourth embodiment in that the seal members 45 and 46, the seal members 47 and 48, or the seal member 49 used only for securing the airtightness of the package 40 are used. It is a point which did not require it.
- the seal members 45 and 46, the seal members 47 and 48, or the seal member 49 are shown in FIG. It is necessary to be disposed at the predetermined position shown in FIG. 9 and FIG.
- the first seal member 50 makes the heat sink 2
- the second seal member 51 makes the heat sink 2
- the package It is set as the structure which seals between 40 and the 2nd flow-path formation members 42, respectively.
- the first seal member 50 is provided between the housing 40, the heat sink 2 and the first flow path forming member 41, and the housing 40, the heat sink 2 and the second flow path forming
- the second seal member 51 is provided between the members 42.
- the seal members 45 and 46, the seal members 47 and 48, or the seal member 49 used only to ensure the airtightness inside the package 40. There is no need for At the same time, the structure for holding the seal members 45 and 46, the seal members 47 and 48, or the seal member 49 is not necessary, and the cost can be reduced accordingly, so that the semiconductor device can be manufactured more inexpensively.
- the cooling medium passage of the semiconductor laser device of the present invention is not limited to the direction shown in FIGS. 1 to 11, and a direction perpendicular to this direction may be used.
- the passages may be orthogonal or intersecting.
- it is effective to increase the cooling capacity of the semiconductor laser device and to increase the laser output power, if at least a part of the cooling medium passage is formed in the vicinity immediately below the laser emitting unit.
- the semiconductor laser device of the present invention has a structure in which the cooling medium is directly flowed to the heat sink inside the housing to enhance the cooling capacity. Therefore, while being able to ensure reliability and quality, a higher power semiconductor laser device can be mounted. Therefore, it is useful for a laser device that uses semiconductor laser light directly for processing, a laser device that uses semiconductor laser light as excitation light, and the like.
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Abstract
Description
図1は、本発明の実施の形態1にかかる半導体レーザ装置を示す一部切欠斜視図である。図1に示すように、本実施の形態1の半導体レーザ装置は、レーザ光を出射する半導体レーザ素子1と、半導体レーザ素子1を冷却するヒートシンク2と、ヒートシンク2上に電気的絶縁状態で固定設置された金属板3と、を備えている。なお、本実施の形態1では、半導体レーザ素子1をヒートシンク2の上面に直接取り付けているが、この両者間に導電性と、熱伝導性を兼ね備えた板を介在させ、半導体レーザ素子1をヒートシンク2の上面に間接的に取り付けても良い。また、金属ワイヤ4は、半導体レーザ素子1と金属板3にボンディングされている。さらに、筐体の一例として用いた略箱形のパッケージ5は、底面と、外周側面を有し、上面は開口状態となっている。
図2から図5は、本発明の実施の形態2にかかる半導体レーザ装置を示す一部切欠斜視図である。図2に示すように、筐体、例えば略箱形のパッケージ20には、第1の流路形成部材21および第2の流路形成部材22がそれぞれ設けられている。また、平面部材23は、パッケージ20の底面側に設けられ、第3の貫通孔24および第4の貫通孔25が、それぞれ第1の貫通孔16および第2の貫通孔17に対応した位置に設けられている。第1のシール部材26は、ヒートシンク2と第1の流路形成部材21との間に設けられ、第1の貫通孔16および第2の貫通孔17を流れる冷却媒体がパッケージ20内部に流出するのを防止している。同様に、第2のシール部材27は、ヒートシンク2と第2の流路形成部材22との間に設けられ、冷却媒体がパッケージ20内部に流出するのを防止している。第3のシール部材28は、第1の流路形成部材21と第3の貫通孔24との間に設けられ、冷却媒体のパッケージ外部への流出を防止している。第4のシール部材29は、第2の流路形成部材22と第4の貫通孔25との間に設けられ、冷却媒体のパッケージ外部への流出を防止している。
図6、図7は、本発明の実施の形態3にかかる半導体レーザ装置を示す一部切欠斜視図である。図6に示すように、本実施の形態3の半導体レーザ装置の第1のシール部材36は、ヒートシンク2、第1の流路形成部材21およびパッケージ20の間に設けられ、冷却媒体をパッケージ20内部に流出することを防止するとともにパッケージ20内部の気密性を保っている。また、同様に、第2のシール部材37は、ヒートシンク2、第2の流路形成部材22およびパッケージ20の間に設けられ、冷却媒体をパッケージ20内部に流出することを防止するとともにパッケージ20内部の気密性を保っている。
図8、図9、図10は、本発明の実施の形態4にかかる半導体レーザ装置を示す一部切欠斜視図である。図8に示す本実施の形態4の半導体レーザ装置は、略箱形のパッケージ40と、パッケージ40に設けられた第1の流路形成部材41と、パッケージ40に設けられた第2の流路形成部材42と、第1のシール部材43と、第2のシール部材44と、第3のシール部材と45、第4のシール部材46と、を備えている。ここで、第1のシール部材43は、ヒートシンク2と第1の流路形成部材41の間に設けられ、冷却媒体をパッケージ40内部に流出させないためのシール部材である。第2のシール部材44は、ヒートシンク2と第2の流路形成部材42の間に設けられ、冷却媒体を前記パッケージ40内部に流出させないためのシール部材である。また、第3のシール部材45は、パッケージ40と第1の流路形成部材41の間に設けられ、パッケージ40内部の気密性を保つためのシール部材である。第4のシール部材46は、パッケージ40と第2の流路形成部材42の間に設けられ、パッケージ40内部の気密性を保つためのシール部材である。
図11は、本発明の実施の形態5にかかる半導体レーザ装置を示す一部切欠斜視図である。図11に示す半導体レーザ装置において、第1のシール部材50は、ヒートシンク2、第1の流路形成部材41およびパッケージ40の間に設けられている。第2のシール部材51は、ヒートシンク2、第2の流路形成部材42およびパッケージ40の間に設けられている。そして、シール部材50、51は、冷却媒体をパッケージ40内部に流出することを防止するとともにパッケージ40内部の気密性を保っている。
2 ヒートシンク
2a 冷却媒体通路
3 金属板
4 金属ワイヤ
5,20,40 パッケージ(筐体)
6 電極板
7 絶縁部材
8 金属部材
9 ロッドレンズ
10 レンズ固定台
11 ファイバアレイ
12 光ファイバ
13 蓋
14,15 シール部材
16 第1の貫通孔
16a,17a,41a,42a 段差部
17 第2の貫通孔
18,26,36,43,50 第1のシール部材
19,27,37,44,51 第2のシール部材
21,41 第1の流路形成部材
22,42 第2の流路形成部材
23 平面部材
24 第3の貫通孔
25 第4の貫通孔
28,38,45,47 第3のシール部材
29,39,46,48 第4のシール部材
30,32,34,35,49 第5のシール部材
31,33 第6のシール部材
Claims (17)
- 筐体と、前記筐体内に設けられ、内部に冷却媒体通路を有するヒートシンクと、前記ヒートシンクに直接的または間接的に取り付けられたレーザ出射部と、を備え、
前記筐体の壁面には、前記筐体の外から前記ヒートシンクの前記冷却媒体通路に冷却媒体を供給するための第1の貫通孔と、前記ヒートシンクの前記冷却媒体通路から前記筐体の外に冷却媒体を排出するための第2の貫通孔と、を設け、前記筐体内における前記第1の貫通孔の外周には、第1のシール部材を、前記第2の貫通孔の外周には、第2のシール部材を、それぞれ配置した半導体レーザ装置。 - 筐体と、前記筐体内に設けられ、内部に冷却媒体通路を有するヒートシンクと、前記ヒートシンクに直接的または間接的に取り付けられたレーザ出射部と、前記筐体を構成する一つの壁面外に設けた平面部材とを備え、
前記平面部材に対向する前記筐体の前記壁面には、第1の貫通孔と第2の貫通孔を設け、前記第1の貫通孔の内側には、前記ヒートシンクの前記冷却媒体通路に冷却媒体を供給するための流路を備えた第1の流路形成部材を設け、前記第2の貫通孔の内側には、前記ヒートシンクの前記冷却媒体通路から冷却媒体を排出するための流路を備えた第2の流路形成部材を設け、前記平面部材の前記第1の流路形成部材に対応する位置には、前記ヒートシンクの前記冷却媒体通路に冷却媒体を供給するための第3の貫通孔を設け、前記平面部材の前記第2の流路形成部材に対応する位置には、前記ヒートシンクの前記冷却媒体通路から冷却媒体を排出するための第4の貫通孔を設けた半導体レーザ装置。 - 前記筐体はアルミニウムを主成分とする金属で形成し、前記第1の流路形成部材、前記第2の流路形成部材および前記平面部材は、アルミニウムよりも耐食性の優れた部材で形成する請求項2に記載の半導体レーザ装置。
- 前記第1の流路形成部材、前記第2の流路形成部材および前記平面部材は、ステンレスまたは樹脂で形成する請求項3に記載の半導体レーザ装置。
- 前記ヒートシンクと前記第1の流路形成部材の結合部外周に第1のシール部材を設け、前記ヒートシンクと前記第2の流路形成部材の結合部外周に第2のシール部材を設け、前記平面部材と前記第1の流路形成部材の結合部外周に第3のシール部材を設け、前記平面部材と前記第2の流路形成部材の結合部外周に第4のシール部材を設け、前記筐体と前記平面部材の間の前記第3のシール部材の外周に第5のシール部材を設け、前記筐体と前記平面部材の間の前記第4のシール部材の外周に第6のシール部材を設けた請求項2から4のいずれか1項に記載の半導体レーザ装置。
- 前記ヒートシンクと前記第1の流路形成部材の結合部外周に第1のシール部材を設け、前記ヒートシンクと前記第2の流路形成部材の結合部外周に第2のシール部材を設け、前記平面部材と前記第1の流路形成部材の結合部外周に第3のシール部材を設け、前記平面部材と前記第2の流路形成部材の結合部外周に第4のシール部材を設け、前記筐体と前記ヒートシンクの間の前記第1のシール部材の外周に第5のシール部材を設け、前記筐体と前記ヒートシンクの間の前記第2のシール部材の外周に第6のシール部材を設けた請求項2から4のいずれか1項に記載の半導体レーザ装置。
- 前記ヒートシンクと前記第1の流路形成部材の結合部外周に第1のシール部材を設け、前記ヒートシンクと前記第2の流路形成部材の結合部外周に第2のシール部材を設け、前記平面部材と前記第1の流路形成部材の結合部外周に第3のシール部材を設け、前記平面部材と前記第2の流路形成部材の結合部外周に第4のシール部材を設け、前記筐体と前記ヒートシンクの間に前記第1のシール部材および前記第2のシール部材を囲む第5のシール部材を設けた請求項2から4のいずれか1項に記載の半導体レーザ装置。
- 前記ヒートシンクと前記第1の流路形成部材の結合部外周に第1のシール部材を設け、前記ヒートシンクと前記第2の流路形成部材の結合部外周に第2のシール部材を設け、前記平面部材と前記第1の流路形成部材の結合部外周に第3のシール部材を設け、前記平面部材と前記第2の流路形成部材の結合部外周に第4のシール部材を設け、前記筐体と前記平面部材の間に前記第3のシール部材および前記第4のシール部材を囲む第5のシール部材を設けた請求項2から4のいずれか1項に記載の半導体レーザ装置。
- 前記筐体、前記ヒートシンクおよび第1の流路形成部材の間に第1のシール部材を設け、前記筐体、前記ヒートシンクおよび前記第2の流路形成部材の間に第2のシール部材を設け、前記平面部材と前記第1の流路形成部材の結合部外周に第3のシール部材を設け、前記平面部材と前記第2の流路形成部材の結合部外周に第4のシール部材を設けた請求項2から4のいずれか1項に記載の半導体レーザ装置。
- 前記ヒートシンクと前記第1の流路形成部材の結合部外周に第1のシール部材を設け、前記ヒートシンクと前記第2の流路形成部材の結合部外周に第2のシール部材を設け、前記筐体、前記平面部材および前記第1の流路形成部材の間に第3のシール部材を設け、前記筐体、前記平面部材および前記第2の流路形成部材の間に第4のシール部材を設けた請求項2から4のいずれか1項に記載の半導体レーザ装置。
- 筐体と、前記筐体内に設けられ、内部に冷却媒体通路を有するヒートシンクと、前記ヒートシンクに直接的または間接的に取り付けられたレーザ出射部と、を備え、
前記筐体の壁面には、第1の貫通孔と第2の貫通孔を設け、前記第1の貫通孔の内側に、前記ヒートシンクに冷却媒体を供給するための流路を備えた第1の流路形成部材を設け、前記第2の貫通孔の内側に、前記ヒートシンクから冷却媒体を排出するための流路を備えた第2の流路形成部材を設け、前記第1の流路形成部材および前記第2の流路形成部材のうちの少なくとも一方には、それに対応する前記筐体の前記第1の貫通孔部分または前記第2の貫通孔部分に係合する段差部を形成した半導体レーザ装置。 - 前記筐体は、アルミニウムを主成分とする金属で形成し、前記第1の流路形成部材と前記第2の流路形成部材は、アルミニウムよりも耐食性の優れた部材からなる請求項11記載の半導体レーザ装置。
- 前記第1の流路形成部材および前記第2の流路形成部材は、ステンレスまたは樹脂からなる請求項12記載の半導体レーザ装置。
- 前記ヒートシンクと前記第1の流路形成部材の結合部外周に第1のシール部材を設け、前記ヒートシンクと前記第2の流路形成部材の結合部外周に第2のシール部材を設け、前記第1のシール部材の外周に第3のシール部材を設け、前記第2のシール部材外周に第4のシール部材を設けた請求項11から13のいずれか1項に記載の半導体レーザ装置。
- 前記ヒートシンクと前記第1の流路形成部材の結合部外周に第1のシール部材を設け、前記ヒートシンクと前記第2の流路形成部材の結合部外周に第2のシール部材を設け、前記筐体と前記ヒートシンクの間の前記第1のシール部材の外周に第3のシール部材を設け、前記筐体と前記ヒートシンクの間の前記第2のシール部材の外周に第4のシール部材を設けた請求項11から13のいずれか1項に記載の半導体レーザ装置。
- 前記ヒートシンクと前記第1の流路形成部材の結合部外周に第1のシール部材を設け、前記ヒートシンクと前記第2の流路形成部材の結合部外周に第2のシール部材を設け、前記筐体と前記ヒートシンクの間に前記第1のシール部材および前記第2のシール部材を囲む第5のシール部材を設けた請求項11から13のいずれか1項に記載の半導体レーザ装置。
- 前記筐体、前記ヒートシンクおよび前記第1の流路形成部材の間に第1のシール部材を設け、前記筐体、前記ヒートシンクおよび前記第2の流路形成部材の間に第2のシール部材を設けた請求項11から13のいずれか1項に記載の半導体レーザ装置。
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CN2011800024636A CN102474068B (zh) | 2010-03-10 | 2011-02-28 | 半导体激光器装置 |
EP11752994.1A EP2416459B1 (en) | 2010-03-10 | 2011-02-28 | Semiconductor laser apparatus |
JP2012504307A JP5218699B2 (ja) | 2010-03-10 | 2011-02-28 | 半導体レーザ装置 |
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JP2015130461A (ja) * | 2014-01-09 | 2015-07-16 | 三菱電機株式会社 | 半導体レーザ装置 |
JP2016021452A (ja) * | 2014-07-14 | 2016-02-04 | パナソニックIpマネジメント株式会社 | 半導体レーザモジュール |
JP2018056498A (ja) * | 2016-09-30 | 2018-04-05 | 日亜化学工業株式会社 | 光源装置 |
WO2019009172A1 (ja) * | 2017-07-07 | 2019-01-10 | パナソニックIpマネジメント株式会社 | 半導体レーザ装置 |
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CN103579898A (zh) * | 2012-07-25 | 2014-02-12 | 苏州长光华芯光电技术有限公司 | 一种具有高度自适应的主动制冷式二维半导体激光列阵 |
CN104112981A (zh) * | 2013-04-18 | 2014-10-22 | 中国科学院物理研究所 | 一种用于半导体激光器的冷却装置 |
EP3447863B1 (en) * | 2016-04-19 | 2021-03-31 | Panasonic Intellectual Property Management Co., Ltd. | Semiconductor laser device and method for manufacturing same |
JP6484588B2 (ja) * | 2016-05-19 | 2019-03-13 | 日亜化学工業株式会社 | 発光装置及び発光装置用パッケージ |
WO2018051430A1 (ja) | 2016-09-14 | 2018-03-22 | 技術研究組合次世代3D積層造形技術総合開発機構 | 半導体レーザモジュールおよび3次元積層造形装置 |
JP6438502B2 (ja) * | 2017-02-01 | 2018-12-12 | ファナック株式会社 | レーザ装置 |
CN108873195B (zh) * | 2018-08-01 | 2020-10-13 | 青岛海信宽带多媒体技术有限公司 | 光模块及其光发射器件 |
CN111223849A (zh) * | 2020-01-13 | 2020-06-02 | 中国电子科技集团公司第四十四研究所 | 多通道集成制冷单光子雪崩光电二极管器件 |
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CN102474068A (zh) | 2012-05-23 |
JPWO2011111328A1 (ja) | 2013-06-27 |
EP2416459A1 (en) | 2012-02-08 |
US20120320938A1 (en) | 2012-12-20 |
CN102474068B (zh) | 2013-09-11 |
EP2416459B1 (en) | 2015-09-09 |
JP5218699B2 (ja) | 2013-06-26 |
EP2416459A4 (en) | 2015-01-14 |
US8401047B2 (en) | 2013-03-19 |
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