WO2011065171A1 - プラズマ処理装置 - Google Patents
プラズマ処理装置 Download PDFInfo
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- WO2011065171A1 WO2011065171A1 PCT/JP2010/068972 JP2010068972W WO2011065171A1 WO 2011065171 A1 WO2011065171 A1 WO 2011065171A1 JP 2010068972 W JP2010068972 W JP 2010068972W WO 2011065171 A1 WO2011065171 A1 WO 2011065171A1
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
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- B01J2219/0807—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electric or magnetic energy giving rise to electric discharges involving electrodes
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- H—ELECTRICITY
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- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H2240/00—Testing
- H05H2240/10—Testing at atmospheric pressure
Definitions
- the present invention relates to a plasma processing apparatus.
- Patent Document 1 discloses an example of a conventional plasma processing apparatus.
- a cathode is provided in the middle of the flow path, and a rod-shaped anode extending in the axial direction of the flow path is provided in the middle of the flow path and upstream of the cathode.
- a pulse voltage is applied between the anode and the cathode, and a discharge is generated between the tip of the anode and the cathode.
- the plasma processing apparatus of Patent Document 1 has a problem in that the range in which plasma is generated is limited, and the efficiency of plasma processing is insufficient. Moreover, the plasma processing apparatus of Patent Document 1 has a problem that the electric field concentrates on the tip of the anode and the anode may be damaged, and the durability of the anode is insufficient.
- the present invention has been made to solve these problems, and an object thereof is to provide a plasma processing apparatus in which the efficiency of plasma processing is improved and the durability of an electrode is improved.
- a plasma processing apparatus has a structure having a flow path through which a fluid flows, and is in the middle of the flow path, crosses a first fluid passage surface, and passes through the first fluid passage.
- a third electrode that occupies, a pulse power source that generates a pulse voltage between the first pole and the second pole, the first electrode electrically connected to the first pole, and the second electrode And a connection line that electrically connects the third electrode to the second electrode, and the first electrode and the second electrode There were opposite to and separated from the axial direction of the flow path, the first electrode and the third electrode are opposed at a distance in the axial direction of the channel.
- the second electrode and the third electrode do not overlap when viewed from the axial direction of the flow path.
- the first electrode and the second electrode when viewed from the axial direction of the flow path, the first electrode and the second electrode intersect, The first electrode and the electrode of the third electrode intersect, and the intersection position of the first electrode and the second electrode and the intersection position of the first electrode and the third electrode are Do not overlap.
- the first electrode has a surface made of an insulator and the second electrode and the third electrode. A first discharge portion facing the electrode.
- the second electrode has a surface made of an insulator and faces the first electrode.
- the third electrode includes a third discharge unit having a surface made of an insulator and facing the first electrode.
- the first electrode is a cathode, and the second electrode and the third electrode are anodes.
- the first electrode is at an edge of the first fluid passage surface, and a first plasma grounding portion is exposed on the surface of a good conductor connected to the first pole by the connection line.
- the first electrode is an anode
- the second electrode and the third electrode are a cathode.
- the second electrode is located at an edge of the second fluid passage surface, and a second plasma grounding portion is exposed on the surface of a good conductor connected to the second pole by the connection line.
- the third electrode is located at an edge of the third fluid passage surface, and a third plasma grounding portion is exposed on the surface of a good conductor connected to the third pole by the connection line, Is provided.
- plasma is generated on the upstream side and the downstream side of the first electrode, so that the efficiency of the processing using the plasma is improved.
- the ends of the first electrode, the second electrode, and the third electrode do not become the start point or end point of the discharge, and the durability of the first electrode, the second electrode, and the third electrode is improved.
- the fluid that is not sufficiently activated on the upstream side of the first electrode is sufficiently activated on the downstream side of the first electrode, so that the efficiency of the plasma treatment is improved. To do.
- the discharge becomes a dielectric barrier discharge, arc discharge is suppressed, and streamer discharge that efficiently activates the fluid is stably generated.
- electrons are easily supplied to the ion sheath layer, and the efficiency of treatment with plasma is improved.
- FIG. 1 is a schematic diagram of a plasma processing apparatus 1004 according to a preferred embodiment of the present invention.
- FIG. 1 shows a cross section of the reactor 1008 of the plasma processing apparatus 1004 and its accessories.
- the plasma processing apparatus 1004 includes a reactor 1008 that generates plasma, a pulse power source 1012 that generates a pulse voltage, a connection line 1016 that electrically connects the pulse power source 1012 and the reactor 1008, and a gas And a gas supply circuit 1020 for supplying.
- the plasma processing apparatus 1004 generates plasma inside the reactor 1008 while supplying gas into the reactor 1008, activates the gas by causing the plasma to act on the gas. “Activation” refers to improving gas reactivity such as excitation of chemical species to higher energy levels, generation of ions, generation of radicals, and the like.
- the reactor 1008 includes a chamber 1024 having a flow path 1032 through which a gas flows, and an electrode array 1028 that applies an electric field.
- the chamber 1024 only needs to be a structure having a flow path 1032.
- the structure and material of the chamber 1024 are not limited as long as the chamber 1024 is not damaged by the gas flowing through the flow path 1032, the electric field applied by the electrode array 1028, the discharge generated by the application of the electric field, Etc. are not limited.
- the gas sucked into the suction port 1036 at one end of the channel 1032 flows in the direction in which the channel 1032 extends, that is, the axial direction D3 of the channel 1032, passes through the electrode array 1028, and passes through the electrode array 1028. It is activated by the plasma generated at the position and discharged from the discharge port 1040 at the other end of the flow path 1032.
- the electrode array 1028 is provided in the middle of the flow path 1032.
- the electrode array 1028 is a discharge body that generates an electric discharge by applying an electric field substantially parallel to the axial direction D3 of the flow path 1032, and is an incompletely closed body that incompletely closes the flow path 1032, that is, a gas is transmitted. It is also a gas permeator. As a result, when the gas passes through the electrode array 1028, the gas is efficiently and uniformly activated by the plasma.
- FIG. 2 is a perspective view
- FIG. 3 is a top view
- FIG. 4 is a front view
- FIG. 5 is a side view.
- the electrode array 1028 has a structure in which the second electrode 1048, the first electrode 1044, and the third electrode 1052 are arranged in the description order in the axial direction D3 of the flow path 1032.
- the second electrode 1048 is on the upstream side of the first electrode 1044
- the third electrode 1052 is on the downstream side of the first electrode 1044.
- connection line 1016 makes the first electrode 1044 a negative electrode of the pulse power source 1012.
- the second electrode 1048 and the third electrode 1052 are connected to the positive electrode of the pulse power source 1012.
- an electric field from the second electrode 1048 toward the first electrode 1044 is applied to the first gap 1056 between the first electrode 1044 and the second electrode 1048, and the third electrode 1052 to the first electrode
- An electric field directed to 1044 is applied to the second gap 1060 between the first electrode 1044 and the third electrode 1052.
- the ion sheath layer IS is generated in the vicinity of the first electrode 1044 on the side facing the second electrode 1048 and the third electrode 1052, and discharge is generated in the first gap 1056 and the second gap 1060. Plasma is generated in the first gap 1056 and the second gap 1060.
- the connection line 1016 connects the first electrode 1044 to the positive electrode of the pulse power source 1012 and the second electrode 1048 and the third electrode 1052 are connected to the negative electrode of the pulse power source 1012. Accordingly, an electric field from the first electrode 1044 toward the second electrode 1048 is applied to the first gap 1056, and an electric field from the first electrode 1044 to the third electrode 1052 is applied to the second gap 1060.
- an ion sheath layer (not shown) is generated on the side of the second electrode 1048 and the third electrode 1052 facing the first electrode 1044, and a discharge is generated in the first gap 1056 and the second gap 1060.
- Plasma is generated in the first gap 1056 and the second gap 1060. Since the second electrode 1048 and the third electrode 1052 are cathodes, the first electrode 1044 to which a high voltage is applied is shielded by the second electrode 1048 and the third electrode 1052, and insulation is easily ensured. Is done.
- the first electrode 1044 is a cathode and an anode
- plasma is generated on the upstream side and the downstream side of the first electrode 1044, and the efficiency of the treatment using the plasma is improved.
- the first electrode 1044 has a rod shape and crosses the first fluid passage surface S1.
- Cross means exiting from one place on the inner wall of the flow path 1032 and entering another place on the inner wall of the flow path 1032 via the inside of the flow path 1032.
- Making the first electrode 1044 cross the first gas passage surface S1 means that the end of the first electrode 1044 that is easily damaged is opposed to the second electrode 1048 and the third electrode 1052, and the start or end point of the discharge. And the durability of the first electrode 1044 is improved.
- the first electrode 1044 extends in a first direction D1 perpendicular to the axial direction D3 of the flow path 1032, and a second electrode perpendicular to the axial direction D3 of the flow path 1032 and perpendicular to the first direction D1.
- Sparsely arranged in the direction D2. “Sparsely” means that there is an opening through which a gas passes between the adjacent first electrodes 1044 without the adjacent first electrodes 1044 being in close contact with each other.
- the gap between the adjacent first electrodes 1044 becomes a band-shaped opening, and the first electrode 1044 occupies only a part of the first fluid passage surface S1 and incompletely closes the first fluid passage surface S1. To do.
- the first electrode 1044 has a structure in which a portion other than the vicinity of the end of the rod 1064 made of a good conductor is covered with a coating 1068 made of an insulator.
- the bar 1064 is connected to the negative electrode of the pulse power source 1012 by the connection line 1016, and when the first electrode 1044 is the anode, the bar 1064 is connected to the negative line by the connection line 1016. , Connected to the positive electrode of the pulse power source 1012.
- First discharge unit 1072 As shown in FIG. 4, among the first electrodes 1044, the first discharge portion 1072 having the covering 1068 and the surface thereof is made of an insulator is separated from the second electrode 1048 in the axial direction D3 of the flow path 1032. And the third electrode 1052.
- the phrase “the surface is made of an insulator” is sufficient if at least the surface is an insulator. Therefore, it is not essential that a good conductor is embedded inside.
- the fact that the surface of the first discharge portion 1072 is made of an insulator contributes to the stable generation of streamer discharge that suppresses arc discharge and efficiently activates the gas by making the discharge a dielectric barrier discharge. .
- First plasma grounding section 1076 As shown in FIG. 4, the first plasma grounding portion 1076 of the first electrode 1044 that has no coating 1068 and has a good conductor exposed on the surface is located at the edge of the first gas passage surface S1.
- the first electrode 1044 is a cathode
- the first plasma grounding portion 1076 contacts the end of the ion sheath layer IS, applies a ground potential to the ion sheath layer IS, and supplies electrons to the ion sheath layer IS. Supply.
- electrons are easily supplied to the ion sheath layer IS, and the efficiency of plasma processing is improved.
- the “edge” means a range in contact with the ion sheath layer IS and is a range having a width in the vicinity of the outer periphery of the first gas passage surface S1.
- the first electrode 1044 is an anode
- the first plasma grounding portion 1076 may be omitted.
- first discharge part 1072 and first plasma grounding part 1076 are integrated. This contributes to reducing the number of parts.
- the first discharge unit 1072 and the first plasma grounding unit 1076 may be separate, and the entire first discharge unit 1072 may not be a good conductor.
- the cross-sectional shape of the first electrode 1044 and the rod 1064 is circular, and the cross-sectional shape of the rod 1064 is also circular.
- the cross-sectional shape of the first electrode 1044 and the rod 1064 may be a shape with few sharp parts other than a circle, for example, an ellipse.
- the cross-sectional shapes of the first electrode 1044 and the rod 1064 may be other than circular.
- the ratio of the area of the opening to the area of the first gas passage surface S1 viewed from the axial direction D3 of the flow path 1032 is desirably 30% or more.
- the aperture ratio of the first gas passage surface S1 is less than the lower limit value, the pressure loss of the first electrode 1044 increases, and the efficiency of plasma processing tends to decrease.
- the width of the first electrode 1044 viewed from the axial direction D3 of the channel 1032 is preferably 0.3 to 5 mm.
- the width of the first electrode 1044 exceeds this upper limit value, the pressure loss of the first electrode 1044 increases, and the efficiency of plasma processing tends to decrease.
- the width of the first electrode 1044 is less than the lower limit value, the strength of the first electrode 1044 is reduced, and the first electrode 1044 is easily damaged.
- the material of the rod 1064 is not particularly limited, but is preferably a metal or alloy that is not easily damaged by discharge and plasma and has high heat resistance.
- metals include Pt (platinum), W (tungsten), WC (tungsten carbide), Mo (molybdenum), nickel-based superalloys, and the like.
- Such alloys include nickel-chromium (Ni-Cr) alloys and the like.
- the material of the covering 1068 is not particularly limited, but is preferably a resin or ceramic that is not easily damaged by discharge and plasma and has high heat resistance.
- resins include fluororesins and polyimide resins.
- ceramics include alumina (Al 2 O 3 ) / zirconia (ZrO 2 ), silicon carbide (SiC), magnesia (MgO), and the like.
- the material of the rod 1064 may be a semiconductor, and the covering 1068 made of an insulator may be omitted.
- the portion of the rod 1064 crossing the first gas passage surface S1 also serves as the first discharge part 1072 and the first plasma grounding part 1076.
- Ceramics include Si-impregnated silicon carbide (SiC).
- the method for forming the coating 1068 is not particularly limited.
- the coating 1068 is formed by coating the surface of the rod 1064 with a ceramic powder compact by a gel casting method and firing the compact. It is desirable. Thereby, it is suppressed that a defect is inherent in the covering 1068.
- first electrodes 1044 (Deformation of arrangement of first electrodes 1044) 1 to 5 show the case where the first electrodes 1044 are evenly arranged, the first electrodes 1044 may be unevenly arranged.
- the first electrodes 1044 are arranged relatively densely in the center of the flow path 1032 where the gas flow rate is relatively high, and the first electrodes 1044 are positioned around the flow path 1032 where the gas flow rate is relatively low. They may be arranged relatively sparsely.
- the electrode rods may be arranged non-parallel.
- the rod-shaped first electrode 1044 that is straight and has no branching (intersection) shown in FIGS. 2 to 5 has an advantage that it is easy to form a coating 1068 that does not contain defects.
- the first electrode 1078 having a branch may be employed instead of the first electrode 1044.
- FIG. 6 is a schematic diagram of a lattice-shaped first electrode 1078 having branches.
- FIG. 6 is a top view of the first electrode 1078 viewed from the same direction as in FIG.
- a first electrode in which a grid 1088 made of a good conductor in which a bar 1080 extending in one direction and a bar 1084 extending in the other direction intersect is covered with a coating 1092 made of an insulator. 1078 may be employed.
- the opening has a quadrangular shape.
- the shape of the lattice 1088 may be further deformed, and the shape of the opening may be deformed into a two-dimensional figure shape other than a square shape, for example, a polygonal shape such as a hexagonal shape, a circular shape, or the like.
- a first electrode in which the punching metal is covered with a coating made of an insulator may be employed.
- the second electrode 1048 and the third electrode 1052 have a plate shape and cross the second fluid passage surface S2 and the third fluid passage surface S3, respectively. Having the second electrode 1048 and the third electrode 1052 traverse the second fluid passage surface S2 and the third fluid passage surface S3, respectively, causes the end of the second electrode 1048 and the third electrode 1052 to be easily damaged. Is opposed to the first electrode 1044 to prevent the discharge from starting or ending, and the durability of the second electrode 1048 and the third electrode 1052 is improved.
- the main surfaces of the second electrode 1048 and the third electrode 1052 are parallel to the axial direction D3 of the flow path 1032. Therefore, the projected shapes of the second electrode 1048 and the third electrode 1052 viewed from the axial direction D3 of the flow path 1032 are rod shapes (elongated shapes). Similarly to the case of the first electrode 1044, the projected shapes of the second electrode 1048 and the third electrode 1052 as viewed from the axial direction D3 of the flow path 1032 may be branched.
- the second electrode 1048 and the third electrode 1052 extend in a second direction D2 perpendicular to the axial direction D3 of the flow path 1032 and are perpendicular to the axial direction D3 of the flow path 1032 and are in the second direction D2. Are sparsely arranged in a first direction D1 perpendicular to.
- the gap between the adjacent second electrodes 1048 and the gap between the adjacent third electrodes 1052 is a band-shaped opening, and the second electrode 1048 and the third electrode 1052 are respectively connected to the second fluid passage surface S2 and the second fluid passage surface S2. It occupies only a part of the third fluid passage surface S3 and incompletely closes the second fluid passage surface S2 and the third fluid passage surface S3.
- the second electrode 1048 and the third electrode 1052 are respectively covered with coverings 1104 and 1108 made of an insulator except for the vicinity of the ends of the rectangular plates 1096 and 1100 made of a good conductor.
- the rectangular plates 1096 and 1100 are connected to the negative electrode of the pulse power source 1012 through the connection line 1016, and the second electrode 1048 and the third electrode 1052 are connected. Is the anode, the rectangular plates 1096 and 1100 are connected to the positive electrode of the pulse power source 1012 by the connection line 1016.
- the first electrode 1044 faces the first electrode 1044 while being separated in the axial direction D3 of the path 1032.
- the surfaces of the second discharge portion 1112 and the third discharge portion 1116 are made of an insulator, so that the discharge is a dielectric barrier discharge, the arc discharge is suppressed, and the streamer discharge that efficiently activates the gas is stabilized. It contributes to generating.
- the second electrode 1048 and the third electrode 1052 As shown in FIG. 5, of the second electrode 1048 and the third electrode 1052, the second plasma grounding portion 1120 and the third plasma grounding portion 1124 in which the good conductor is exposed on the surface without the coverings 1104 and 1108. Are at the edges of the second gas passage surface S2 and the third gas passage surface S3, respectively.
- the second electrode 1048 and the third electrode 1052 are cathodes, the second plasma grounding portion 1120 and the third plasma grounding portion 1124 are in contact with the ends of the ion sheath layer, and the ion sheath layer Is applied with a ground potential to supply electrons to the ion sheath layer.
- the “edge” means a range in contact with the ion sheath layer, and is a range having a width in the vicinity of the outer periphery of the second gas passage surface S2 and the third gas passage surface S3.
- the second electrode 1048 and the third electrode 1052 are anodes, the second plasma grounding portion 1120 and the third plasma grounding portion 1124 may be omitted.
- the second discharge part 1112 and the second plasma grounding part 1120 may be separate, or the third discharge part 1116 and the third plasma grounding may be separate.
- the part 1124 may be a separate body.
- the whole of the second discharge part 1112 and the third discharge part 1116 may be an insulator as in the case of the first electrode 1044.
- cross-sectional shape of the end of the second electrode 1048 and the third electrode 1052 facing the first electrode 1044 may be rounded into a semicircular shape or the like, and the first shape of the rectangular plates 1096 and 1100 The cross-sectional shape of the end on the side facing the electrode 1044 may be rounded to a semicircular shape or the like.
- the second electrode 1048 and the third electrode 1052 may be a perforated body having the same shape as the punching metal as viewed from the axial direction D3 of the flow path.
- the ratio of the area of the opening to the area of the second gas passage surface S2 viewed from the axial direction D3 of the flow path 1032 and the product of the opening to the area of the third gas passage surface S3 viewed from the axial direction D3 of the flow path 1032 The ratio is desirably 30% or more as in the case of the opening ratio of the first gas passage surface S1. The reason is also the same as in the case of the aperture ratio of the first gas passage surface S1.
- width of second electrode 1048 and width of third electrode 1052 The width of the second electrode 1048 viewed from the axial direction D3 of the flow path 1032 and the width of the third electrode 1052 viewed from the axial direction D3 of the flow path 1032 are the same as in the case of the width of the first electrode 1044. It is desirable that it is 0.3 to 5 mm or less. The reason is the same as that of the width of the first electrode 1044.
- the materials of the rectangular plates 1096 and 1100 and the coverings 1104 and 1108 are selected in the same manner as the materials of the rod 1064 and the covering 1068, respectively.
- the formation of the coatings 1104 and 1108 by the gel cast method is desirable as in the case of the first electrode 1044.
- the second electrode 1048 and the third electrode 1052 may be arranged unevenly or non-parallelly.
- the second electrode 1048 and the third electrode 1052 are arranged so that the second electrode 1048 and the third electrode 1052 do not overlap with each other when viewed from the axial direction D3 of the flow path 1032. Staggered arrangement. As a result, the gas that is not sufficiently activated on the upstream side of the first electrode 1044 is sufficiently activated on the downstream side of the first electrode 1044, and the efficiency of the plasma processing is improved.
- the plasma processing apparatus 1004 functions sufficiently even when all or part of the second electrode 1048 and the third electrode 1052 overlap each other when viewed from the axial direction D3 of the flow path 1032.
- a direction D1 in which the first electrode 1044 extends and a direction D2 in which the second electrode 1048 and the third electrode 1052 extend form 90 °. Therefore, when viewed from the axial direction D3 of the flow path 1032, the first electrode 1044 and the second electrode 1048 intersect at a right angle, and the first electrode 1044 and the third electrode 1052 intersect at a right angle.
- the crossing angle ⁇ 1 between the first electrode 1044 and the second electrode 1048 and the crossing angle ⁇ 2 between the first electrode 1044 and the third electrode 1052 are 90 °.
- the first plasma grounding unit 1076, the second plasma grounding unit 1120, and the third plasma grounding unit 1120 are spaced apart from the second plasma grounding unit 1120 and the third plasma grounding unit 1124.
- the occurrence of discharge between the plasma grounding portion 1124 and the plasma grounding portion 1124 is suppressed.
- both or one of the crossing angles ⁇ 1 and ⁇ 2 may be other than 90 °, or may be 0 °.
- the intersection position 1112 between the first electrode 1044 and the second electrode 1048 and the intersection position between the first electrode 1044 and the third electrode 1052 are arranged so that 1116 does not overlap.
- the intersecting positions 1112 and 1116 at which discharge is likely to occur do not overlap, so that the gas that is not sufficiently activated on the upstream side of the first electrode 1044 is sufficiently activated on the downstream side of the first electrode 1044. Processing efficiency is improved.
- the plasma processing apparatus 1004 functions sufficiently even when all or part of the intersecting positions 1112 and 1116 overlap when viewed from the axial direction D3 of the flow path 1032.
- FIGS. 1 to 5 show the case where the first gap 1056 and the second gap 1060 are constant, even if both or one of the first gap 1056 and the second gap 1060 are not constant, FIGS. Good.
- both or one of the first gap 1056 and the second gap 1060 becomes narrow at the center of the flow path 1032 where the gas flow rate is relatively high, and the first gap 1032 is around the flow path 1032 where the gas flow rate is relatively low.
- One or both of the first gap 1056 and the second gap 1060 may be widened.
- the pulse power source 1012 is not particularly limited in form as long as it has a capability of generating a pulse voltage that generates a streamer discharge without generating an arc discharge in the first gap 1056 and the second gap 1060.
- An inductive energy storage (IES) type power source using an SI (electrostatic induction) thyristor (hereinafter referred to as “IES power source”) is desirable. This is because although the IES power supply is small and simple, it generates a pulse voltage having a remarkably large time rise rate dV / dt of the rising voltage V and a short pulse width ⁇ t, and generating a streamer discharge. It is because it is suitable.
- FIG. 7 is a circuit diagram showing a circuit example of the IES power supply 1204.
- the IES power source 1204 includes a DC power source 1208 that supplies DC, a capacitor 1212 that stabilizes the DC supply from the DC power source 1208, a transformer 1216 that accumulates inductive energy, and a primary of the transformer 1216.
- MOSFET metal oxide semiconductor field effect transistor
- the SI thyristor 1228 and the MOSFET 1224 are inserted in series in the supply path 1220 so as to close the supply path 1220 when turned on and open the supply path 1220 when turned off.
- the first end 1256 of the primary winding 1248 is connected to the positive electrode of the DC power supply 1208 and one end of the capacitor 1212, and the anode of the SI thyristor 1228 is connected to the second end 1260 of the primary winding 1248, and SI
- the cathode of thyristor 1228 is connected to the drain of MOSFET 1224, and the source of MOSFET 1224 is connected to the negative electrode of DC power supply 1208 and the other end of capacitor 1212.
- the gate of the SI thyristor 1228 is connected to the first end 1256 of the primary winding 1248 via the diode 1236 by the bias applying path 1232.
- the diode 1236 is inserted in the bias applying path 1232.
- the cathode of the diode 1236 is connected to the first end 1256 of the primary winding 1248, and the anode of the diode 1236 is connected to the gate of the SI thyristor 1228.
- the diode 1236 causes the SI thyristor 1228 to be positively biased by voltage driving and negatively biased by current driving.
- An inductor having a single winding may be used in place of the transformer 1216, and a pulse voltage may be output directly from the inductor.
- the gate of the SI thyristor 1228 is negatively biased by the induced electromotive force generated in the primary winding 1248, and the SI thyristor 1228 is also turned on at high speed. .
- the supply path 1220 is opened at high speed.
- an induced electromotive force is generated in the secondary winding 1252 by mutual induction, and the time of the voltage V at the time of rise between the positive winding 1272 and the negative polarity 1276 from the secondary winding 1252.
- a pulse voltage having a remarkably large increase rate dV / dt is output.
- IES power source 1204 The detailed operation principle of the IES power source 1204 is described in, for example, Katsuji Iida, Ken Sakuma: “Ultra-short pulse generation circuit (IES circuit) using SI thyristor 1228”, SI Device Symposium Proceedings (2002). ing.
- the pulse width of the pulse voltage is preferably about 10 to 1000 ns in terms of full width at half maximum (FWHM), and the time change rate dV / dt of the voltage V at the time of rising is preferably about 30 to 3000 kV / ⁇ s.
- the number of repetitions per unit time is preferably about 100 pps to several tens of kpps, and the peak voltage is preferably about 10 to 30 kV.
- the reason why the desired range is described as “generally” is that the desired range may be wider than the above range depending on the structure, material, gas pressure, and gas flow rate of the reactor 1008.
- the pressure inside the flow path 1032 varies depending on the usage example of the plasma processing apparatus 1004, and can be maintained at atmospheric pressure, reduced pressure, or pressurized.
- FIG. 1 (Usage example of plasma processing apparatus 1004) 8 to 10 are schematic diagrams for explaining an example of use of the plasma processing apparatus 1004. FIG.
- a plasma processing apparatus 1004 when the plasma processing apparatus 1004 is used to activate the gas, plasma is generated inside the reactor 1008 while supplying the gas into the reactor 1008.
- the gas activated in the reactor 1008 is sent from the reactor 1008 to the supply destination.
- Supply destinations include incinerators and firing furnaces.
- the activated gas When the activated gas is supplied to the incinerator, the activated gas contributes to improving the combustion efficiency and the like, and when the activated gas is supplied to the firing furnace, the activated gas is This contributes to the promotion of heat treatment.
- a plasma processing apparatus 1004 may be used to activate a fluid.
- a liquid supply circuit for supplying the liquid is provided instead of the gas supply circuit 1020.
- the gas to be activated is not particularly limited.
- nitrogen (N 2 ) water
- H 2 O hydrogen peroxide
- H 2 O 2 tetrafluoromethane
- CF 4 tetrafluoromethane
- CHF 3 trifluoromethane
- the liquid to be activated is not particularly limited, and examples thereof include water (H 2 O), alcohol, acidic aqueous solution, alkaline aqueous solution, and the like.
- the plasma processing apparatus 1004 when the plasma processing apparatus 1004 is used to treat the surface of an object W made of solid, the object W is accommodated in the reactor 1008, and gas is supplied into the reactor 1008. Plasma is generated inside the reactor 1008 while being supplied. Thereby, plasma acts on the surface of the object W, and the surface of the object W is processed.
- the surface treatment includes a treatment for improving wettability of the surface (modification), a treatment for killing microorganisms attached to the surface (sterilization or sterilization), and the like.
- the activated gas may be blown to the object W outside the reactor 1008.
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Abstract
Description
図1は、本発明の望ましい実施形態のプラズマ処理装置1004の模式図である。図1は、プラズマ処理装置1004のリアクタ1008の断面及びその付属物を示す。
図1に示すように、リアクタ1008は、ガスが流れる流路1032を持つチャンバ1024と、電界を印加する電極配列体1028と、を備える。
図2~図5は、電極配列体1028の模式図である。図2は、斜視図、図3は、上面図、図4は、正面図、図5は、側面図である。
図1に示すように、第1の電極1044が陰極、第2の電極1048及び第3の電極1052が陽極となる場合は、接続線路1016は、第1の電極1044をパルス電源1012の負極に接続し、第2の電極1048及び第3の電極1052をパルス電源1012の正極に接続する。これにより、第2の電極1048から第1の電極1044へ向かう電界が第1の電極1044と第2の電極1048との第1の間隙1056に印加され、第3の電極1052から第1の電極1044へ向かう電界が第1の電極1044と第3の電極1052との第2の間隙1060に印加される。また、第1の電極1044の第2の電極1048及び第3の電極1052に対向する側の近傍にイオンシース層ISが発生し、第1の間隙1056及び第2の間隙1060に放電が発生し、第1の間隙1056及び第2の間隙1060にプラズマが発生する。
図1~図5に示すように、第1の電極1044は、棒形状を有し、第1の流体通過面S1を横切る。「横切る」とは、流路1032の内壁の一の場所から出て、流路1032の内部を経由して、流路1032の内壁の他の場所に入ることをいう。第1の電極1044に第1のガス通過面S1を横切らせることは、損傷しやすい第1の電極1044の末端が第2の電極1048及び第3の電極1052と対向して放電の始点又は終点となることを防止し、第1の電極1044の耐久性を向上する。
図2~図5に示すように、第1の電極1044は、良導体からなる棒1064の末端の近傍以外が絶縁体からなる被覆1068で覆われた構造を有する。第1の電極1044が陰極となる場合は、棒1064は、接続線路1016により、パルス電源1012の負極に接続され、第1の電極1044が陽極となる場合は、棒1064は、接続線路1016により、パルス電源1012の正極に接続される。
図4に示すように、第1の電極1044のうち、被覆1068があって表面が絶縁体からなる第1の放電部1072は、流路1032の軸方向D3に離隔して第2の電極1048及び第3の電極1052と対向する。「表面が絶縁体からなる」とは、少なくとも表面が絶縁体であれば足りる。したがって、内部に良導体が埋設されていることは必須ではない。
図4に示すように、第1の電極1044のうち、被覆1068がなく良導体が表面に露出する第1のプラズマグランディング部1076は、第1のガス通過面S1の縁部にある。第1の電極1044が陰極である場合は、第1のプラズマグランディング部1076は、イオンシース層ISの端部に接触し、イオンシース層ISに接地電位を付与し、イオンシース層ISに電子を供給する。これにより、イオンシース層ISに電子が供給されやすくなり、プラズマによる処理の効率が向上する。「縁部」とは、イオンシース層ISに接触する範囲を意味し、第1のガス通過面S1の外周の近傍にある幅を有する範囲である。第1の電極1044が陽極である場合は、第1のプラズマグランディング部1076はなくてもよい。
図1~図5に示す第1の電極1044が採用された場合、第1の放電部1072と第1のプラズマグランディング部1076とは一体になっている。このことは、部品の数を減らすことに寄与する。ただし、第1の放電部1072と第1のプラズマグランディング部1076とが別体であってもよく、第1の放電部1072の全体が良導体でなくとも良い。
図2~図5に示すように、第1の電極1044の断面形状は円形であり、棒1064の断面形状も円形である。これにより、第1の放電部1072に鋭利な部分が少なくなり、鋭利な部分への電界の集中による第1の放電部1072の損傷が抑制される。また、鋭利な部分が少なくなると、損傷の原因となりやすい欠陥が被覆1068に内在することが抑制される。第1の電極1044及び棒1064の断面形状が円形以外の鋭利な部分が少ない形状、例えば、楕円形であってもよい。被覆1068の形成が若干難しくなることが許容される場合は、第1の電極1044及び棒1064の断面形状が円形以外であってもよい。
流路1032の軸方向D3から見た第1のガス通過面S1の面積に対する開口の面積の比率は、30%以上であることが望ましい。第1のガス通過面S1の開口率がこの下限値を下回ると、第1の電極1044の圧力損失が増加し、プラズマによる処理の効率が低下しやすくなる。
流路1032の軸方向D3から見た第1の電極1044の幅は、0.3~5mmであることが望ましい。第1の電極1044の幅がこの上限値を上回ると、第1の電極1044の圧力損失が増加し、プラズマによる処理の効率が低下しやすくなる。第1の電極1044の幅がこの下限値を下回ると、第1の電極1044の強度が低下し、第1の電極1044が損傷しやすくなる。
棒1064の材質は、特に制限されないが、放電及びプラズマにより損傷しにくく耐熱性が高い金属又は合金であることが望ましい。そのような金属には、Pt(白金)、W(タングステン)、WC(タングステンカーバイド)、Mo(モリブデン)、ニッケル系超合金等がある。そのような合金には、ニッケル-クロム(Ni-Cr)合金等がある。
被覆1068の形成方法は、特に制限されないが、被覆1068の材質がセラミックスである場合は、ゲルキャスト法により棒1064の表面をセラミックス粉末の成形体で被覆し当該成形体を焼成することにより形成することが望ましい。これにより、被覆1068に欠陥が内在することが抑制される。
図1~図5は、第1の電極1044が均等に配列される場合を示すが、第1の電極1044が不均等に配列されてもよい。例えば、ガスの流量が相対的に多い流路1032の中心において第1の電極1044が相対的に密に配列され、ガスの流量が相対的に少ない流路1032の周辺において第1の電極1044が相対的に疎に配列されてもよい。
図2~図5に示す真っ直ぐで枝分かれ(交差)がない棒形状の第1の電極1044には、欠陥を内在しない被覆1068を形成しやすいという利点がある。しかし、第1の電極1044に代えて、枝分かれがある第1の電極1078が採用されてもよい。
図1~図5に示すように、第2の電極1048及び第3の電極1052は、板形状を有し、それぞれ、第2の流体通過面S2及び第3の流体通過面S3を横切る。第2の電極1048及び第3の電極1052にそれぞれ第2の流体通過面S2及び第3の流体通過面S3を横切らせることは、損傷しやすい第2の電極1048及び第3の電極1052の末端が第1の電極1044と対向して放電の始点又は終点となることを防止し、第2の電極1048及び第3の電極1052の耐久性を向上する。
図2~図5に示すように、第2の電極1048及び第3の電極1052は、それぞれ、良導体からなる矩形板1096,1100の末端の近傍以外が絶縁体からなる被覆1104,1108で覆われた構造を有する。第2の電極1048及び第3の電極1052が陰極となる場合は、矩形板1096,1100は、接続線路1016により、パルス電源1012の負極に接続され、第2の電極1048及び第3の電極1052が陽極となる場合は、矩形板1096,1100は、接続線路1016により、パルス電源1012の正極に接続される。
図5に示すように、第2の電極1048及び第3の電極1052のうち、被覆1104,1108があって表面が絶縁体からなる第2の放電部1112及び第3の放電部1116は、流路1032の軸方向D3に離隔して第1の電極1044と対向する。
図5に示すように、第2の電極1048及び第3の電極1052のうち、被覆1104,1108がなく良導体が表面に露出する第2のプラズマグランディング部1120及び第3のプラズマグランディング部1124は、それぞれ、第2のガス通過面S2及び第3のガス通過面S3の縁部にある。第2の電極1048及び第3の電極1052が陰極である場合は、第2のプラズマグランディング部1120及び第3のプラズマグランディング部1124は、イオンシース層の端部に接触し、イオンシース層に接地電位を付与し、イオンシース層に電子を供給する。これにより、イオンシース層に電子が供給されやすくなり、プラズマによる処理の効率が向上する。「縁部」とは、イオンシース層に接触する範囲を意味し、第2のガス通過面S2及び第3のガス通過面S3の外周の近傍にある幅を有する範囲である。第2の電極1048及び第3の電極1052が陽極である場合は、第2のプラズマグランディング部1120及び第3のプラズマグランディング部1124はなくてもよい。
第2の電極1048及び第3の電極1052が流路1032の軸方向D3に延長又は短縮されても、流路1032の軸方向D3から見た第2の電極1048及び第3の電極1052の投影形状が棒形状であることは変化せず、放電に主に寄与する第1の電極1044に対向する側の形状も変化しない。したがって、第2の電極1048及び第3の電極1052が流路1032の軸方向D3に延長又は短縮されてもよい。
流路1032の軸方向D3から見た第2のガス通過面S2の面積に対する開口の面積の比率及び流路1032の軸方向D3から見た第3のガス通過面S3の面積に対する開口の積の比率は、第1のガス通過面S1の開口率の場合と同様に、30%以上であることが望ましい。その理由も、第1のガス通過面S1の開口率の場合と同様である。
流路1032の軸方向D3から見た第2の電極1048の幅及び流路1032の軸方向D3から見た第3の電極1052の幅は、第1の電極1044の幅の場合と同様に、0.3~5mm以下であることが望ましい。その理由も、第1の電極1044の幅の場合と同様である。
矩形板1096,1100及び被覆1104,1108の材質は、それぞれ、棒1064及び被覆1068の材質と同様に選択される。ゲルキャスト法による被覆1104,1108の形成が望ましいことも第1の電極1044の場合と同様である。第2の電極1048及び第3の電極1052が不均等又は非平行に配列されてもよいことも第1の電極1044の場合と同様である。
図3及び図4に示すように、第2の電極1048及び第3の電極1052は、流路1032の軸方向D3から見て第2の電極1048と第3の電極1052とが重ならないように千鳥配置される。これにより、第1の電極1044より上流側において十分に活性化されないガスが第1の電極1044より下流側において十分に活性化され、プラズマによる処理の効率が向上する。
第1の電極1044が延在する方向D1と、第2の電極1048及び第3の電極1052が延在する方向D2とは、90°をなす。したがって、流路1032の軸方向D3から見て、第1の電極1044と第2の電極1048とは直角に交差し、第1の電極1044と第3の電極1052とは直角に交差する。
図1~図5は、第1の間隙1056及び第2の間隙1060が一定である場合を示しているが、第1の間隙1056及び第2の間隙1060の両方又は片方が一定でなくてもよい。例えば、ガスの流量が相対的に多い流路1032の中心において第1の間隙1056及び第2の間隙1060の両方又は片方が狭くなり、ガスの流量が相対的に少ない流路1032の周辺において第1の間隙1056及び第2の間隙1060の両方又は片方が広くなるようにしてもよい。
放電を誘電体バリア放電とするためには、被覆1068,1104,1108の全部が設けられることが望ましいが、対向する放電部のいずれかの表面が絶縁体からなるのであれば、被覆1068,1104,1108の一部が省略されてもよい。例えば、被覆1068が省略されてもよいし、被覆1104,1108が省略されてもよい。
パルス電源1012は、第1の間隙1056及び第2の間隙1060にアーク放電を発生させずにストリーマ放電を発生するパルス電圧を発生する能力を有すれば、特に形式は制限されないが、スイッチング素子にSI(静電誘導)サイリスタを使用した誘導エネルギー蓄積(IES)型の電源(以下では、「IES電源」という。)であることが望ましい。これは、IES電源は、小型で単純であるにもかかわらず、立ち上がり時の電圧Vの時間上昇率dV/dtが著しく大きくパルス幅Δtが短いパルス電圧を発生し、ストリーマ放電を発生させるのに好適であるからである。
駆動回路1240からMOSFET1224へのオン信号の入力が始まり、MOSFET1224がターンオンすると、SIサイリスタ1228のゲートが正バイアスされ、SIサイリスタ1228もターンオンする。これにより、供給経路1220が閉じられる。供給経路1220が閉じられると、1次側巻線1248への直流の供給が始まり、トランス1216への誘導エネルギーの蓄積が始まる。
パルス電圧のパルス幅は、概ね、半値全幅(FWHM)で10~1000nsであることが望ましく、立ち上がり時の電圧Vの時間変化率dV/dtは、概ね、30~3000kV/μsであることが望ましく、単位時間あたりの繰り返し数は、概ね、100pps~数十kppsであることが望ましく、ピーク電圧は、概ね、10~30kVであることが望ましい。望ましい範囲について「概ね」と述べているのは、リアクタ1008の構造、材質、ガスの圧力、ガスの流量によっては、望ましい範囲が上述の範囲よりも広くなる場合もありうるからである。
このようにパルス幅Δtが短く立ち上がり時の電圧Vの時間変化率dV/dtが高いパルス電圧が陽極と陰極との間に印加された場合、陰極の表面にあるガス通過面に沿って薄いイオンシース層が生成し、高密度のイオン及びラジカルが発生する。これに対して、パルス幅が長くなったり立ち上がり時の電圧Vの時間変化率dV/dtが低くなったりすると、陰極の表面に生成するイオンシース層ISが厚くなり、イオン及びラジカルの密度が低くなる。
流路1032の内部の圧力は、プラズマ処理装置1004の使用例によって異なり、大気圧に維持される場合、減圧される場合及び加圧される場合のいずれもありうる。
図8~図10は、プラズマ処理装置1004の使用例を説明する模式図である。
この発明は詳細に説明されたが、上記の説明は、すべての局面において例示であり、この発明は上記の説明に限定されない。例示されない無数の変形例が、この発明の範囲から外れることなく想定されうる。
Claims (7)
- プラズマ処理装置であって、
流体が流れる流路を持つ構造体と、
前記流路の途中にあり、第1の流体通過面を横切り、前記第1の流体通過面の一部のみを占める第1の電極と、
前記流路の途中であって前記第1の電極より上流側にあり、第2の流体通過面を横切り、前記第2の流体通過面の一部のみを占める第2の電極と、
前記流路の途中であって前記第1の電極より下流側にあり、第3の流体通過面を横切り、前記第3の流体通過面の一部のみを占める第3の電極と、
第1の極と第2の極との間にパルス電圧を発生するパルス電源と、
前記第1の電極を前記第1の極に電気的に接続し、前記第2の電極及び前記第3の電極を前記第2の極に電気的に接続する接続線路と、
を備え、
前記第1の電極と前記第2の電極とが前記流路の軸方向に離隔して対向し、前記第1の電極と前記第3の電極とが前記流路の軸方向に離隔して対向するプラズマ処理装置。 - 請求項1のプラズマ処理装置において、
前記流路の軸方向から見て前記第2の電極と前記第3の電極とが重ならないプラズマ処理装置。 - 請求項1のプラズマ処理装置において、
前記流路の軸方向から見て、前記第1の電極と前記第2の電極とが交差し、前記第1の電極と前記第3の電極の電極とが交差し、前記第1の電極と前記第2の電極との交差位置と前記第1の電極と前記第3の電極との交差位置とが重ならないプラズマ処理装置。 - 請求項1のプラズマ処理装置において、
前記第1の電極は、
表面が絶縁体からなり前記第2の電極及び前記第3の電極と対向する第1の放電部、
を備えるプラズマ処理装置。 - 請求項1のプラズマ処理装置において、
前記第2の電極は、
表面が絶縁体からなり前記第1の電極と対向する第2の放電部、
を備え、
前記第3の電極は、
表面が絶縁体からなり前記第1の電極と対向する第3の放電部、
を備えるプラズマ処理装置。 - 請求項1ないし請求項5のいずれかのプラズマ処理装置において、
前記第1の電極が陰極、前記第2の電極及び前記第3の電極が陽極であり、
前記第1の電極は、
前記第1の流体通過面の縁部にあって、前記接続線路により前記第1の極に接続される良導体が表面に露出する第1のプラズマグランディング部、
を備えるプラズマ処理装置。 - 請求項1ないし請求項5のいずれかのプラズマ処理装置において、
前記第1の電極が陽極、前記第2の電極及び前記第3の電極が陰極であり、
前記第2の電極は、
前記第2の流体通過面の縁部にあって、前記接続線路により前記第2の極に接続される良導体が表面に露出する第2のプラズマグランディング部、
を備え、
前記第3の電極は、
前記第3の流体通過面の縁部にあって、前記接続線路により前記第2の極に接続される良導体が表面に露出する第3のプラズマグランディング部、
を備えるプラズマ処理装置。
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Publication number | Priority date | Publication date | Assignee | Title |
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JP2016030231A (ja) * | 2014-07-29 | 2016-03-07 | 株式会社Ihi環境エンジニアリング | ガス処理装置 |
JP2016126967A (ja) * | 2015-01-07 | 2016-07-11 | シャープ株式会社 | プラズマ生成素子、プラズマ生成装置および電気機器 |
US9415127B2 (en) | 2014-01-31 | 2016-08-16 | Ngk Insulators, Ltd. | Plasma treatment method |
WO2016151970A1 (ja) * | 2015-03-20 | 2016-09-29 | 日本碍子株式会社 | プラズマ発生方法及び殺菌水生成方法 |
WO2017081818A1 (ja) * | 2015-11-13 | 2017-05-18 | 国立大学法人東京工業大学 | 液体処理装置及び液体処理方法 |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0551952U (ja) * | 1991-12-09 | 1993-07-09 | 日新電機株式会社 | プラズマ処理装置 |
JP2006510187A (ja) * | 2002-12-13 | 2006-03-23 | ブルー プラネット カンパニー リミテッド | プラズマ反応器及びそれに利用される電極プレート |
JP2006100031A (ja) * | 2004-09-28 | 2006-04-13 | Nittetsu Mining Co Ltd | 絶縁体被膜層担持電極を有する気体励起装置、及び気体励起方法 |
JP2006114450A (ja) * | 2004-10-18 | 2006-04-27 | Yutaka Electronics Industry Co Ltd | プラズマ生成装置 |
JP2006269095A (ja) | 2005-03-22 | 2006-10-05 | Takeshi Nagasawa | プラズマ生成装置 |
JP2009054557A (ja) * | 2007-08-24 | 2009-03-12 | Osamu Sakai | 液体中プラズマ発生装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6811757B2 (en) * | 2001-04-04 | 2004-11-02 | Ecozone Technologies Ltd. | Dielectric barrier discharge fluid purification system |
US6562386B2 (en) * | 2001-05-07 | 2003-05-13 | Regents Of The University Of Minnesota | Method and apparatus for non-thermal pasteurization |
-
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2012
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0551952U (ja) * | 1991-12-09 | 1993-07-09 | 日新電機株式会社 | プラズマ処理装置 |
JP2006510187A (ja) * | 2002-12-13 | 2006-03-23 | ブルー プラネット カンパニー リミテッド | プラズマ反応器及びそれに利用される電極プレート |
JP2006100031A (ja) * | 2004-09-28 | 2006-04-13 | Nittetsu Mining Co Ltd | 絶縁体被膜層担持電極を有する気体励起装置、及び気体励起方法 |
JP2006114450A (ja) * | 2004-10-18 | 2006-04-27 | Yutaka Electronics Industry Co Ltd | プラズマ生成装置 |
JP2006269095A (ja) | 2005-03-22 | 2006-10-05 | Takeshi Nagasawa | プラズマ生成装置 |
JP2009054557A (ja) * | 2007-08-24 | 2009-03-12 | Osamu Sakai | 液体中プラズマ発生装置 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9415127B2 (en) | 2014-01-31 | 2016-08-16 | Ngk Insulators, Ltd. | Plasma treatment method |
JP2016030231A (ja) * | 2014-07-29 | 2016-03-07 | 株式会社Ihi環境エンジニアリング | ガス処理装置 |
JP2016126967A (ja) * | 2015-01-07 | 2016-07-11 | シャープ株式会社 | プラズマ生成素子、プラズマ生成装置および電気機器 |
WO2016151970A1 (ja) * | 2015-03-20 | 2016-09-29 | 日本碍子株式会社 | プラズマ発生方法及び殺菌水生成方法 |
CN107409464A (zh) * | 2015-03-20 | 2017-11-28 | 日本碍子株式会社 | 等离子发生方法及杀菌水生成方法 |
WO2017081818A1 (ja) * | 2015-11-13 | 2017-05-18 | 国立大学法人東京工業大学 | 液体処理装置及び液体処理方法 |
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