WO2011065021A1 - 真空チャック - Google Patents
真空チャック Download PDFInfo
- Publication number
- WO2011065021A1 WO2011065021A1 PCT/JP2010/006942 JP2010006942W WO2011065021A1 WO 2011065021 A1 WO2011065021 A1 WO 2011065021A1 JP 2010006942 W JP2010006942 W JP 2010006942W WO 2011065021 A1 WO2011065021 A1 WO 2011065021A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- suction pad
- vacuum chuck
- adsorbed
- holes
- suction
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Definitions
- the present invention relates to a vacuum chuck that depressurizes a sealed back side with a vacuum pump and adsorbs and positions an object to be adsorbed placed on the surface of the adsorption pad through a number of through holes.
- the present invention relates to a vacuum chuck capable of adsorbing an object to be adsorbed even when a part of the adsorption surface is not covered with the object to be adsorbed.
- the back side is reduced by a vacuum pump with respect to the surface of the suction pad that sucks the object to be adsorbed. It is necessary to keep the back pressure on the back side close to vacuum with respect to the atmospheric pressure on the side.
- a vacuum chuck if the object to be adsorbed does not cover the entire surface that is the adsorption surface, a part of the through hole opens to the surface, and outside air flows through the through hole, and the differential pressure between the front side and the back side As a result, there is a problem that a predetermined adsorption force cannot be obtained.
- Patent Documents 1 and 2 disclose vacuum chucks in which a large number of through holes communicating with the front surface side and the back surface side of the suction pad have a small diameter to reduce the conductance of the entire through hole.
- this conventional vacuum chuck even if some through-holes are opened on the surface without being covered with the object to be adsorbed, the flow rate flowing from the surface to the back side through the through-holes is limited, The differential pressure can be kept constant, and even an object to be adsorbed placed on a part of the surface can be positioned and held on the surface with a predetermined adsorbing force.
- the above-mentioned conventional suction pad keeps the back pressure constant by paying attention to reducing the conductance of the suction pad by simply making a large number of through holes small in diameter. Cannot be obtained simply by reducing the conductance.
- the object to be adsorbed is absorbed in the vertical direction of the bottom surface covering the opening of the through hole by the differential pressure between the atmospheric pressure acting downward (from the surface to the back) and the back pressure acting upward (from the back to the surface). It is adsorbed on the surface side, and its adsorbing force is obtained by multiplying the total area of the through-hole openings covered by the object to be adsorbed by the differential pressure.
- the present invention has been made in consideration of such conventional problems, and is a vacuum chuck that reliably adsorbs an object to be adsorbed placed on a part of the adsorption surface with an adsorption force required for the vacuum chuck.
- the purpose is to provide.
- the vacuum chuck according to claim 1 is a porous substrate suction pad in which the entire side surface is hermetically sealed and communicated by a large number of through-holes formed on the front surface side and the back surface side at substantially equal density.
- a vacuum chuck that depressurizes the sealed back side with a vacuum pump and sucks the object to be adsorbed placed on the surface through a plurality of through-holes covered with the object to be adsorbed.
- P1 the suction force per unit area required to hold the object to be adsorbed is Fmin
- the suction pressure Pu
- the exhaust efficiency Se.
- the opening ratio n which is the ratio of the total opening area of the through-holes exposed in the surface area, and the conductance C of the entire suction pad by a large number of through-holes
- the adsorption force per unit area is a value obtained by multiplying the differential pressure between the atmospheric pressure P1 and the back pressure by the opening ratio n, and the differential pressure is expressed by (P1 ⁇ Pu) ⁇ Se / (Se + C). Therefore,
- the suction force when sucked by a vacuum pump with an exhaust efficiency of Q in a state where the object to be adsorbed is not placed on the surface of the suction pad satisfying the condition is the minimum adsorption force Fmin per unit area required for holding the object to be adsorbed That's it.
- Fmin the minimum adsorption force per unit area required for holding the object to be adsorbed That's it.
- the conductance C of the adsorption pad decreases regardless of its size. Therefore, the adsorption force obtained from n ⁇ (P1 ⁇ Pu) ⁇ Se / (Se + C) is the minimum adsorption force. It is not less than Fmin. Therefore, even if a part of the surface of the suction pad is not covered with the object to be adsorbed, the object to be adsorbed is held with an adsorption force equal to or greater than the minimum adsorption force Fmin.
- the vacuum chuck according to claim 2 is characterized in that the inner diameter of the through hole of the suction pad is 1 ⁇ m to 10 ⁇ m.
- the vacuum chuck according to claim 3 is characterized in that the suction pad is a porous ceramic substrate having an aperture ratio n of 20% or more.
- Fine through-holes can be formed at a high density with an opening ratio n of 20% or more by ceramic sintering.
- a ceramic substrate having an aperture ratio n of less than 20% a part of the through hole is blocked and a portion where the front and back surfaces do not communicate with each other is generated.
- the suction pad having the aperture ratio n and the conductance C satisfying the formula (1) is used according to the suction capacity of the vacuum pump, thereby reliably suctioning regardless of the size of the object to be sucked. Can hold.
- a suction pad having a low conductance C and a high aperture ratio n can be obtained.
- an adsorption pad having a low conductance C can be obtained by forming fine through holes at a high density with an aperture ratio n of 20% or more. Further, since the ceramic substrate is used, a predetermined strength for placing the object to be adsorbed on the surface can be obtained even if the substrate is relatively thin.
- FIG. 1 is an explanatory view showing a vacuum chuck 1 according to an embodiment of the present invention.
- FIG. 2 is an explanatory view showing the vacuum chuck 1 in a state where the object W is placed on the suction pad 2 and sucked.
- the vacuum chuck 1 has a suction pad 2 that sucks W to hold an object to be sucked and holds it on the surface thereof, and seals all side surfaces of the suction pad 2 so that outside air is placed on the back side of the suction pad 2.
- the chuck body 4 forming the shut-off decompression chamber 3, the vacuum pump 5 exhausting from the exhaust passage communicating with the decompression chamber 3, and the flow rate for detecting the exhaust amount per unit time for detecting the exhaust efficiency Se of the vacuum pump 5
- the flow meter 6 may be removed after selecting a suitable suction pad 2 that satisfies the conditions described later.
- the suction pad 2 is formed of a square porous ceramic substrate having a side of 60 cm.
- through-holes having an average pore diameter of 10 ⁇ m are formed closely, and the suction pad 2 having a porosity n of 35%.
- the porosity n means that the through holes communicating with the back side are formed in the plane of the suction pad 2 at an equal density, and the through holes that open within a unit area with respect to the unit area of the surface of the suction pad 2 The ratio of the total opening area.
- a porous ceramic substrate can be formed with an average pore diameter in the range of 1 to 200 ⁇ m and a porosity n in the range of 10 to 60%.
- the porosity n is less than 20%, In some cases, a part of the through-hole is blocked, and the calculated adsorption force may not be obtained. If it is 60% or more, the voids increase, the strength deteriorates, and there is a risk of breakage.
- the pressure P2 in the decompression chamber 3 (hereinafter referred to as back pressure) P2 when evacuated from the decompression chamber 3 of the vacuum chuck 1 configured as described above by the vacuum pump 5 having the ultimate pressure Pu is large on the surface side of the suction pad 2.
- the atmospheric pressure is P1
- the conductance of the entire suction pad 2 is C
- the exhaust efficiency of the vacuum pump 5 measured by the flow meter 6 is Se
- P2 (Pu + C / Se ⁇ P1) / (1 + C / Se) (2)
- the object to be adsorbed W is placed on the suction pad 2 whose back pressure is P2, as shown in FIG. 2, the atmospheric pressure in the vertical direction is opened at the opening of the through hole covered with the object to be adsorbed W.
- Adsorbed by receiving the pressure difference P between the pressure P1 and the back pressure P2 the object to be adsorbed W is obtained by multiplying the sum S2 of the opening areas of all the through holes covered by the object to be adsorbed W by the difference pressure ⁇ P. Receive.
- P1 is known as the atmospheric pressure
- Pu is known as the ultimate pressure of the vacuum pump 5
- Se is the flow meter 6 in the unit time without the object W shown in FIG. Can be measured as the exhaust efficiency of the vacuum pump 5
- the minimum suction force F ′ by the suction pad 2 having an aperture ratio n and conductance C can be obtained from the equation (6).
- the adsorption force F ′ per unit area does not fall below the adsorption force F ′ calculated from the equation (6) in the state shown in FIG. 'As the minimum adsorption force Fmin necessary to adsorb and hold the object to be adsorbed W of the vacuum chuck 1
- the vacuum chuck 1 that can reliably attract the object W with an adsorption force equal to or greater than the minimum adsorption force Fmin regardless of the size of the object W to be adsorbed. It can be.
- the conductance C of the suction pad 2 can be calculated from Q / ⁇ P by measuring a flow rate Q per unit time flowing between the surface and the back surface in a state where a known differential pressure ⁇ P is applied to the surface side and the back surface side.
- a porous ceramic substrate referred to as B material
- A porous substrate
- a pressure difference 11 kPa
- the flow rate Q (MPa * m3 / s) per unit time was 0.9133 * 10-3 for the A material and 0.0458 * 10-3 for the B material.
- the conductance C of each test piece when a differential pressure of atmospheric pressure P1 is applied is 9.133 * 10-3 (MPa ⁇ m3 / s) for material A and 0.458 * 10-3 (MPa ⁇ m) for material B. m3 / s). From this, the conductance C (L / min) converted to the size of the suction pad 2 of 60 cm square is 197.4 for the A material and 9.9 for the B material.
- the conductance c of each through-hole assuming that the through-hole is a cylindrical pipe has k as the Boltzmann constant and m as the molecular mass.
- R is the radius of the pipe
- L is the length of the pipe
- T is the temperature
- c 4/3 ⁇ r3 / L ⁇ (2 ⁇ ⁇ k ⁇ T / m) 1/2 (8)
- the conductance c proportional to r3 can be reduced.
- the porosity n is slightly lowered to 35% with respect to the A material having the porosity n of 45%.
- the conductance C is reduced to about 1/20 of that of the A material simply by making them.
- the conductance C of the B material according to the present embodiment is 9.9 (L / min) and the porosity n is 0.35.
- the exhaust efficiency Se in the state of FIG. 1 in which the object to be adsorbed W is not placed is 59.4 (L / min) or more, the minimum adsorbing force regardless of the size of the object to be adsorbed W.
- the object to be adsorbed W can be adsorbed and held with an adsorption force of Fmin or more.
- the 60 cm square porous ceramic substrate has been described as the suction pad 2.
- the substrate satisfies the aperture ratio n and the conductance C of Equation (1), substrates of various materials and structures can be used. It can be a suction pad.
- the opening ratio n of the suction pad can be set to an arbitrary value as long as a large number of through holes can be formed structurally, but is required for the vacuum chuck 1 because the maximum value of the suction force is the atmospheric pressure P1.
- the opening ratio n cannot be less than the ratio of the minimum adsorption force Fmin to the atmospheric pressure P1.
- the present invention is suitable for a vacuum chuck that holds workpieces of various sizes without changing the suction pad in the work process of a manufacturing apparatus such as a semiconductor, a liquid crystal, or a printed wiring board, or a printing machine.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
Abstract
Description
P2=(Pu+C/Se・P1)/(1+C/Se)・・・(2)式
で表される。
ΔP=P1-P2=(P1-Pu)・Se/(Se+C)・・・(3)式
となる。
F=nS1・ΔP・・・(4)式
で表され、被吸着物Wの単位面積あたりの吸着力F’は、
F’=F/S1=n・ΔP・・・(5)式
となる。
F’=n・(P1-Pu)・Se/(Se+C)・・・(6)式が得られる。
(6)式において、P1は、大気圧、Puは、真空ポンプ5の到達圧力として既知であり、Seは、図1に示す被吸着物Wを載置しない状態で単位時間中に流量計6で計測される流量を真空ポンプ5の排気効率として計測できるので、(6)式から、開口率nとコンダクタンスCの吸着パッド2による最小の吸着力F’が得られる。
Se=(P1-P2)/(P2-Pu)・C・・・(7)式
で得られるSeまで低下する。(7)式から算定されるSeの値に安定するまでの間、コンダクタンスCが排気効率Seに先行して低下するので、(6)式中のSe/(Se+C)は、少なくとも図1の状態より大きく、単位面積あたりの吸着力F’は上昇する。
c=4/3・r3/L・(2π・k・T/m)1/2・・・(8)式
で表され、半径rを小さい値とするほど、πr2で表される開口面積に対して、r3に比例するコンダクタンスcを低下させることができる。本実施の形態に係るB材による吸着パッド2は、貫通孔を10μmの微細孔で形成することによって、気孔率nが45%であるA材に対して気孔率nが35%とわずかに低下させるだけで、コンダクタンスCを、A材の約1/20まで低下させている。
2 吸着パッド
3 減圧室
5 真空ポンプ
6 流量計
Claims (3)
- 吸着パッドの貫通孔の内径が、1μm乃至20μmであることを特徴とする請求項1に記載の真空チャック。
- 吸着パッドが、開口率nが20%以上の多孔質セラミック基板であることを特徴とする請求項1又は2に記載の真空チャック。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201080054148.3A CN102668059B (zh) | 2009-11-30 | 2010-11-29 | 真空卡盘 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009271134A JP2011114253A (ja) | 2009-11-30 | 2009-11-30 | 真空チャック |
JP2009-271134 | 2009-11-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2011065021A1 true WO2011065021A1 (ja) | 2011-06-03 |
Family
ID=44066126
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2010/006942 WO2011065021A1 (ja) | 2009-11-30 | 2010-11-29 | 真空チャック |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2011114253A (ja) |
KR (1) | KR20120116909A (ja) |
CN (1) | CN102668059B (ja) |
WO (1) | WO2011065021A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016103626A (ja) * | 2014-11-13 | 2016-06-02 | 株式会社ナノテム | 搬送用パッドおよびそれを用いる搬送装置、搬送方法 |
JPWO2017154085A1 (ja) * | 2016-03-08 | 2018-11-22 | 株式会社ナノテム | 搬送用パッドおよびそれを用いる搬送装置、搬送方法 |
JP6815138B2 (ja) * | 2016-09-06 | 2021-01-20 | 株式会社ディスコ | 吸引保持システム |
CN110098143B (zh) * | 2018-01-31 | 2021-06-04 | 上海微电子装备(集团)股份有限公司 | 一种芯片吸附装置及芯片键合系统 |
CN109051771B (zh) * | 2018-07-05 | 2020-10-02 | 珠海格力电器股份有限公司 | 表针放料系统、方法和装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4316175Y1 (ja) * | 1965-07-21 | 1968-07-05 | ||
JP2693720B2 (ja) * | 1994-05-25 | 1997-12-24 | シーケーディ株式会社 | 真空チャックにおける被吸着物の吸着方法 |
JP2009246013A (ja) * | 2008-03-28 | 2009-10-22 | Taiheiyo Cement Corp | 真空吸着装置及びその製造方法 |
JP2009253247A (ja) * | 2008-04-11 | 2009-10-29 | Ariake Materials Co Ltd | 真空吸着装置用吸着体及び真空吸着装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2892771Y (zh) * | 2005-12-29 | 2007-04-25 | 袁建中 | 排气吸盘 |
-
2009
- 2009-11-30 JP JP2009271134A patent/JP2011114253A/ja active Pending
-
2010
- 2010-11-29 CN CN201080054148.3A patent/CN102668059B/zh not_active Expired - Fee Related
- 2010-11-29 KR KR1020127011341A patent/KR20120116909A/ko not_active Application Discontinuation
- 2010-11-29 WO PCT/JP2010/006942 patent/WO2011065021A1/ja active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4316175Y1 (ja) * | 1965-07-21 | 1968-07-05 | ||
JP2693720B2 (ja) * | 1994-05-25 | 1997-12-24 | シーケーディ株式会社 | 真空チャックにおける被吸着物の吸着方法 |
JP2009246013A (ja) * | 2008-03-28 | 2009-10-22 | Taiheiyo Cement Corp | 真空吸着装置及びその製造方法 |
JP2009253247A (ja) * | 2008-04-11 | 2009-10-29 | Ariake Materials Co Ltd | 真空吸着装置用吸着体及び真空吸着装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20120116909A (ko) | 2012-10-23 |
CN102668059A (zh) | 2012-09-12 |
CN102668059B (zh) | 2015-09-16 |
JP2011114253A (ja) | 2011-06-09 |
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