WO2011053025A2 - 태양전지 및 이의 제조방법 - Google Patents
태양전지 및 이의 제조방법 Download PDFInfo
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- WO2011053025A2 WO2011053025A2 PCT/KR2010/007493 KR2010007493W WO2011053025A2 WO 2011053025 A2 WO2011053025 A2 WO 2011053025A2 KR 2010007493 W KR2010007493 W KR 2010007493W WO 2011053025 A2 WO2011053025 A2 WO 2011053025A2
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Images
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- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
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- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
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- H01L31/03928—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate comprising a flexible substrate including AIBIIICVI compound, e.g. CIS, CIGS deposited on metal or polymer foils
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- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
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- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
- H01L31/046—PV modules composed of a plurality of thin film solar cells deposited on the same substrate
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- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
- H01L31/046—PV modules composed of a plurality of thin film solar cells deposited on the same substrate
- H01L31/0465—PV modules composed of a plurality of thin film solar cells deposited on the same substrate comprising particular structures for the electrical interconnection of adjacent PV cells in the module
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- H—ELECTRICITY
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- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
- H01L31/072—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type
- H01L31/0749—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type including a AIBIIICVI compound, e.g. CdS/CulnSe2 [CIS] heterojunction solar cells
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- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
- H01L31/046—PV modules composed of a plurality of thin film solar cells deposited on the same substrate
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- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0475—PV cell arrays made by cells in a planar, e.g. repetitive, configuration on a single semiconductor substrate; PV cell microarrays
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the embodiment relates to a solar cell and a method of manufacturing the same.
- CIGS-based solar cells which are pn heterojunction devices having a substrate structure including a substrate, a metal back electrode layer, a p-type CIGS-based light absorbing layer, a high resistance buffer layer, an n-type window layer, and the like, are widely used.
- Various substrates may be used as the substrate, but when the substrate is a flexible substrate, cracks may occur in the metal back electrode layer formed on the substrate when the substrate is bent.
- the embodiment provides a solar cell and a method of manufacturing the same that can increase the bonding force between the substrate and the back electrode.
- the solar cell according to the embodiment includes a pattern layer disposed on the substrate; A rear electrode disposed on the pattern layer; A light absorbing layer disposed on the back electrode; A buffer layer disposed on the light absorbing layer; And a front electrode disposed on the buffer layer, wherein the pattern layer includes an uneven pattern.
- Method for manufacturing a solar cell comprises the steps of forming a pattern layer on the substrate; Forming a back electrode on the pattern layer; Forming a light absorbing layer on the back electrode; Forming a buffer layer on the light absorbing layer; And forming a front electrode on the buffer layer, wherein the pattern layer includes an uneven pattern formed thereon.
- the solar cell and the method of manufacturing the same according to the embodiment may form a nano-sized concave-convex pattern on the substrate, thereby increasing the bonding force with the back electrode formed on the substrate.
- the rear electrode is also formed in the groove of the pattern of the uneven structure, the coupling force between the substrate and the rear electrode can be increased.
- the light absorbing layer which is partially in contact with the substrate may also be in contact with the pattern of the concave-convex structure, and thus the bonding force between the light absorbing layer and the substrate may be increased.
- 1 to 11 are cross-sectional views illustrating a method of manufacturing a solar cell according to an embodiment.
- each substrate, layer, film, or electrode is described as being formed “on” or “under” of each substrate, layer, film, or electrode, etc.
- "On” and “under” include both “directly” or “indirectly” formed through other components.
- the criteria for the top or bottom of each component will be described with reference to the drawings. The size of each component in the drawings may be exaggerated for description, and does not mean a size that is actually applied.
- FIG. 11 is a cross-sectional view showing a solar cell according to an embodiment.
- the solar cell according to the embodiment includes a substrate 100, a pattern layer 170, a back electrode 200, a light absorbing layer 300, a buffer layer 400, and a front electrode 500. do.
- the pattern layer 170 may include an uneven pattern 150, and the uneven pattern 150 may be formed in a rectangular pyramid shape or a sinusoidal wave shape periodically.
- the concave-convex pattern 150 includes a groove 110 and the projection 120, the width of the groove is 100 ⁇ 300nm, the width of the projection is 100 ⁇ 200nm, The height of the grooves and protrusions may be 100 ⁇ 300 nm.
- the groove 110 and the protrusion 120 have a concave-convex structure, so that the protrusion 120 protrudes from the substrate 100.
- the contact area is enlarged due to the groove 110 and the protrusion 120, thereby increasing the coupling between the substrate 100 and the rear electrode formed thereafter.
- the substrate 100 when the substrate 100 is flexible, it is possible to prevent cracks in the rear electrode by the pattern layer 170 even when the substrate 100 is bent.
- a rear electrode may be formed in the groove 110 of the uneven pattern 150, thereby increasing the bonding force between the substrate 100 and the rear electrode.
- the pattern layer 170 may be formed of a material including a resin in the form of a single or a mixture of epoxy, epoxy melanin, acrylic, urethane resin, and the like.
- 1 to 11 are cross-sectional views illustrating a method of manufacturing a solar cell according to an embodiment.
- the pattern layer 170 including the uneven pattern 150 is formed on the substrate 100.
- the substrate 100 may be glass, and a ceramic substrate such as alumina, stainless steel, a titanium substrate, or a polymer substrate may also be used.
- a ceramic substrate such as alumina, stainless steel, a titanium substrate, or a polymer substrate may also be used.
- Soda lime glass (sodalime glass) may be used as the glass substrate, and polyethylen terephthalate (PET) or polyimide (polyimide) may be used as the polymer substrate.
- PET polyethylen terephthalate
- polyimide polyimide
- the substrate 100 may be rigid or flexible.
- the concave-convex pattern 150 may form a concave-convex pattern on the resin layer after forming a resin layer on the surface of the substrate 100.
- UV curing is performed while a molding process is performed using the mold 230. It can be formed by proceeding the process at the same time.
- the resin layer When the resin layer is applied onto the substrate 100, it may be performed by a spin coating process.
- the resin layer may be formed of a material including resin in the form of a single or a mixture of epoxy, epoxy melanin, acrylic, urethane resin and the like.
- the method of forming the pattern is not limited thereto, and may be formed using a laser light source after the resin layer is formed on the substrate 100.
- FIG. 3 and 4 illustrate the 'A' region of FIG. 1 in detail, wherein the uneven pattern 150 is formed to include the groove 110 and the protrusion 120, and the uneven pattern 150 having a square pillar shape.
- the curvature of is formed periodically.
- the groove 110 and the protrusion 120 have a concave-convex structure, so that the protrusion 120 protrudes from the substrate 100.
- the bonding force between the substrate 100 and the rear electrode formed thereafter may be increased.
- the substrate 100 when the substrate 100 is flexible, even if the substrate 100 is bent, tensile stress is transmitted to the rear electrode by the pattern layer 170 to prevent cracking. Can be.
- the width f of the groove 110 is 100 ⁇ 300nm
- the width g of the protrusion 120 is 100 ⁇ 200nm
- the height (b) of the groove 110 and the projection 120 The height c may be 100 to 300 nm.
- the uneven pattern 150 is formed of the groove 110 and the protrusion 120, but the present invention is not limited thereto, and the pattern is formed to improve the bonding force with the rear electrode to be formed later. Can be formed.
- the uneven pattern 150 having a rectangular pillar shape may be formed long in one direction.
- the concave-convex pattern 150 is not limited to the shape of the square pillar, and as illustrated in FIG. 4, the convex-concave pattern 160 having the curved sinusoidal wave shape may be periodically formed.
- the pattern layer 170 may be formed of a material including a resin in the form of a single or a mixture of epoxy, epoxy melanin, acrylic, urethane resin, and the like.
- the bonding force between the pattern layer 170 and the substrate 100 is strong, the bonding force between the substrate 100 and the rear electrode to be formed later is Can be strong.
- the back electrode 201 is formed on the pattern layer 170.
- the back electrode 201 is a conductive layer.
- the back electrode 201 may allow current generated in the light absorbing layer 300 of the solar cell to move so that current flows to the outside of the solar cell. In order to perform this function, the back electrode 201 should have high electrical conductivity and low specific resistance.
- the rear electrode 201 should be maintained at high temperature stability during heat treatment in a sulfur (S) or selenium (Se) atmosphere accompanying the formation of the CIGS compound.
- the back electrode 201 may be formed of any one of molybdenum (Mo), nickel (Ni), gold (Au), aluminum (Al), chromium (Cr), tungsten (W), and copper (Cu). Among them, in particular, molybdenum (Mo) can meet the characteristics required for the above-described back electrode 201 as a whole.
- the back electrode 201 may include two or more layers.
- each of the layers may be formed of the same metal, or may be formed of different metals.
- the back electrode 201 may also be inserted into the groove 110 of the uneven pattern 150 to increase the bonding force between the back electrode 201 and the substrate 100.
- the surface where the rear electrode 201 is in contact with the pattern layer 170 is formed to have concavities and convexities corresponding to the concave-convex pattern 150 of the pattern layer 170. It may be formed to have a surface parallel to 100).
- the substrate 100 when the substrate 100 is flexible, even if the substrate 100 is bent due to a difference in thermal expansion coefficient between the substrate and the rear electrode, due to the uneven pattern 150 formed on the substrate 100, Cracks may be prevented between the substrate 100 and the rear electrode.
- the thickness of the substrate 100, the uneven pattern 150 and the back electrode 201, the substrate 100 is formed thicker than the uneven pattern 150 and the back electrode 201, the back electrode 201 ) Is formed thicker than the uneven pattern 150.
- the relationship between the thickness and size of the substrate 100, the uneven pattern 150, and the back electrode 201 may be represented as follows with reference to FIG. 6.
- W is 0.17-0.43
- X is 0.03-0.15
- Y is 0.04-0.12
- Z has a value of 1-2.
- a is a distance from the top surface of the protrusion 120 that is the top surface of the uneven pattern 150 to the top surface of the rear electrode pattern 201
- b is the height of the groove 110
- c is the protrusion ( The height of the 120
- d means the thickness from the bottom surface of the groove 110 to the substrate 100 in the pattern layer 170.
- e means the thickness of the substrate 100
- f means the width of the groove 110
- g means the width of the projection 120.
- Conditional expression (1) is a conditional expression representing the relationship between the back electrode 201 and the pattern layer 170.
- the total thickness (a + b) of the back electrode 201 is 0.17 to 0.43 (W) times the total thickness of (c + d) of the pattern layer 170. Can be.
- the d region of the pattern layer 170 which is a buffer layer, becomes thick, and thus the adhesion between the substrate 100 and the pattern layer 170 may decrease.
- Conditional expression (2) means the ratio of the protrusion 120 or the groove 110 in the overall thickness of the pattern layer 170.
- the height c of the protrusion 120 may be 0.03 to 0.15 (X) times the thickness d from the bottom surface of the groove 110 to the substrate 100 in the pattern layer 170.
- the height c of the protrusion 120 is too small to decrease the adhesion area with the rear electrode 201 and the uneven pattern 150 is too small to prevent cracking.
- the buffering role for can be reduced.
- the height c of the protrusion 120 is increased to make it difficult to produce the uneven pattern 150, and the bottom of the groove 110 when the back electrode 201 is deposited. Deposition to the side can be reduced, reducing the buffering role for cracks.
- Conditional expression (3) is a conditional expression representing the relationship between the substrate 100 and the region d which is the thickness from the bottom surface of the groove 110 to the substrate 100 in the pattern layer 170.
- a value d of the thickness of the pattern layer 170 from the bottom surface of the groove 110 to the substrate 100 may be 0.04 to 0.12 (Y) times of the substrate 100.
- the value of Y when the value of Y is smaller than 0.04, the value of d may be low so that the buffering role of the crack by the substrate 100 may be reduced.
- the thickness of the substrate 100 may be relatively reduced, so that warpage of the substrate 100 may easily occur and cracks may easily occur.
- Conditional expression (4) is a conditional expression showing a relationship between the ratio of the width f of the groove 110 to the width g of the protrusion 120.
- the width f of the groove 110 may be 1 to 2 times Z of the width g of the protrusion 120.
- the period h of the uneven pattern 150 may be formed regularly or irregularly, it may be formed in a period of 200 ⁇ 500nm.
- the hardness of the substrate 100, the uneven pattern 150, and the back electrode 201 is harder than that of the substrate 100 and the uneven pattern 150. Hardness of 100 may be the same as that of the uneven pattern 150.
- a patterning process is performed on the back electrode 201 to form a back electrode pattern 200.
- the back electrode pattern 200 may be formed by performing a photo lithography process on the back electrode 201.
- the back electrode pattern 200 may be arranged in a stripe form or a matrix form and may correspond to each cell.
- the back electrode pattern 200 is not limited to the above form and may be formed in various forms.
- a portion of the uneven pattern 150 formed on the substrate 100 may be exposed between the rear electrode patterns 200.
- the light absorbing layer 300 and the buffer layer 400 are formed on the back electrode pattern 200.
- the light absorbing layer 300 includes a p-type semiconductor compound.
- the light absorbing layer 300 includes a group I-III-VI compound.
- the light absorbing layer 300 may be formed of a copper-indium-gallium-selenide-based (Cu (In, Ga) Se 2 ; CIGS-based) crystal structure, copper-indium-selenide-based, or copper-gallium-selenide It may have a system crystal structure.
- a CIG-based metal precursor film is formed on the back electrode pattern 200 using a copper target, an indium target, and a gallium target.
- the metal precursor film is reacted with selenium (Se) by a selenization process to form a CIGS-based light absorbing layer 300.
- Se selenium
- an alkali component included in the substrate 100 may pass through the back electrode pattern 200, and the metal precursor film and the light absorbing layer ( 300).
- An alkali component may improve grain size and improve crystallinity of the light absorbing layer 300.
- the light absorbing layer 300 may form copper, indium, gallium, selenide (Cu, In, Ga, Se) by co-evaporation.
- the light absorbing layer 300 receives external light and converts the light into electrical energy.
- the light absorbing layer 300 generates photo electromotive force by the photoelectric effect.
- a part of the light absorbing layer 300 in contact with the substrate 100 is also formed on the uneven pattern 150.
- a part of the light absorbing layer 300 may also be coupled to the groove 110 and the protrusion 120 of the uneven pattern 150, thereby increasing the bonding force between the light absorbing layer 300 and the substrate 100.
- the buffer layer 400 may be formed of at least one layer, and any one of cadmium sulfide (CdS), ITO, ZnO, and i-ZnO on the substrate 100 on which the light absorbing layer 300 is formed. It may be formed by lamination, and a low resistance value may be obtained by doping indium (In), gallium (Ga), aluminum (Al), and the like.
- CdS cadmium sulfide
- ITO cadmium sulfide
- ZnO zinc oxide
- i-ZnO i-ZnO
- the buffer layer 400 is an n-type semiconductor layer
- the light absorbing layer 300 is a p-type semiconductor layer.
- the light absorbing layer 300 and the buffer layer 400 form a pn junction.
- the buffer layer 400 is disposed between the light absorbing layer 300 and the front electrode to be formed later.
- a good junction may be formed by inserting the buffer layer 400 having a band gap between the two materials.
- one buffer layer is formed on the light absorbing layer 300.
- the present invention is not limited thereto, and the buffer layer 400 may be formed of a plurality of layers.
- a contact pattern 310 penetrating the light absorbing layer 300 and the buffer layer 400 is formed.
- the contact pattern 310 may be formed by a process using a mechanical method or a laser, and a portion of the back electrode pattern 200 is exposed.
- a transparent conductive material is stacked on the buffer layer 400 to form the front electrode 500 and the connection wiring 700.
- the transparent conductive material When the transparent conductive material is stacked on the buffer layer 400, the transparent conductive material may also be inserted into the contact pattern 310 to form the connection wiring 700.
- the back electrode pattern 200 and the front electrode 500 are electrically connected to each other by the connection wiring 700.
- the front electrode 500 is formed of zinc oxide doped with aluminum by performing a sputtering process on the substrate 100.
- the front electrode 500 is a window layer forming a pn junction with the light absorbing layer 300. Since the front electrode 500 functions as a transparent electrode on the front of the solar cell, zinc oxide (ZnO) having high light transmittance and good electrical conductivity is provided. Is formed.
- ZnO zinc oxide
- the aluminum oxide may be doped with aluminum to form an electrode having a low resistance value.
- the zinc oxide thin film as the front electrode 500 may be formed by a method of depositing using a ZnO target by RF sputtering, reactive sputtering using a Zn target, and an organometallic chemical vapor deposition method.
- ITO indium tin oxide
- a separation pattern 320 penetrating the light absorbing layer 300, the buffer layer 400, and the front electrode 500 is formed.
- the separation pattern 320 may be formed by a process using a mechanical method or a laser, and a portion of the back electrode pattern 200 is exposed.
- the buffer layer 400 and the front electrode 500 may be separated by the separation pattern 320, and the cells C1 and C2 may be separated from each other by the separation pattern 320.
- the front electrode 500 buffer layer 400 and the light absorbing layer 300 may be arranged in a stripe shape or a matrix shape by the separation pattern 320.
- the separation pattern 320 is not limited to the above form and may be formed in various forms.
- Cells C1 and C2 including the back electrode pattern 200, the light absorbing layer 300, the buffer layer 400, and the front electrode 500 are formed by the separation pattern 320.
- each of the cells C1 and C2 may be connected to each other by the connection wiring 700. That is, the connection wiring 700 electrically connects the back electrode pattern 200 of the second cell C2 and the front electrode 500 of the first cell C1 adjacent to the second cell C2. do.
- the solar cell and the method of manufacturing the same according to the embodiments described above may increase the bonding force with the back electrode formed on the substrate by forming a nano-sized uneven pattern on the substrate.
- the rear electrode is also formed in the groove of the pattern of the uneven structure, the bonding force between the substrate and the rear electrode can be increased.
- the light absorbing layer which is partially in contact with the substrate may also be in contact with the pattern of the concave-convex structure, and thus the bonding force between the light absorbing layer and the substrate may be increased.
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Abstract
Description
Claims (19)
- 기판 상에 배치된 패턴층;상기 패턴층 상에 배치된 후면전극;상기 후면전극 상에 배치된 광 흡수층;상기 광 흡수층 상에 배치된 버퍼층; 및상기 버퍼층 상에 배치된 전면전극을 포함하며,상기 패턴층은 요철 패턴을 포함하는 태양전지.
- 제 1항에 있어서,상기 요철 패턴은 홈과 돌기가 주기적으로 형성된 것을 포함하는 태양전지.
- 제 2항에 있어서,상기 홈의 폭은 100~300nm이고, 상기 돌기의 폭은 100~200nm이고,상기 홈과 돌기의 높이는 100~300nm이며,상기 홈과 돌기를 포함하는 상기 요철 패턴의 주기는 200~500nm인 것을 포함하는 태양전지.
- 제 2항에 있어서,상기 기판, 패턴층, 후면전극에 대해서,a는 상기 요철 패턴의 상면인 상기 돌기의 상면부터 상기 후면전극의 표면까지의 거리, b는 상기 홈의 높이, c는 상기 돌기의 높이, d는 상기 패턴층에서 상기 홈의 바닥면부터 상기 기판까지의 두께라 할 때,(a+b)=W(c+d)의 조건식을 만족하며, 여기서 W는 0.17~0.43의 값을 가지는 태양전지.
- 제 2항에 있어서,상기 패턴층에 대해서,c는 상기 돌기의 높이, d는 상기 패턴층에서 상기 홈의 바닥면부터 상기 기판까지의 두께라 할 때,(c)=X(d)의 조건식을 만족하며, 여기서 X는 0.03~0.15의 값을 가지는 태양전지.
- 제 2항에 있어서,상기 기판과 패턴층에 대해서,d는 상기 패턴층에서 상기 홈의 바닥면부터 상기 기판까지의 두께, e는 상기 기판의 두께라 할 때,(d)=Y(e)의 조건식을 만족하며, 여기서 Y는 0.04~0.12의 값을 가지는 태양전지.
- 제 2항에 있어서,상기 패턴층에 대해서,f는 상기 홈의 폭, g는 상기 돌기의 폭이라 할 때,(f)=Z(g)의 조건식을 만족하며, 여기서 Z는 1~2의 값을 가지는 태양전지.
- 제 1항에 있어서,상기 패턴층은 에폭시, 에폭시 멜라닌, 아크릴, 우레탄 수지 등의 단독 또는 혼합물 형태의 레진(resin)을 포함하는 물질로 형성된 것을 포함하는 태양전지.
- 제 1항에 있어서,상기 후면전극이 상기 패턴층과 접하는 면은 상기 패턴층의 요철 패턴에 대응하는 요철을 갖도록 형성되고, 상기 후면전극의 상면은 상기 기판과 평행하게 형성되는 태양전지.
- 제 1항에 있어서,상기 요철 패턴은 기판에서 후면전극을 향해 폭이 좁아지도록 형성되는 태양전지.
- 기판 상에 요철 패턴을 포함하는 패턴층을 형성하는 단계;상기 패턴층 상에 후면전극을 형성하는 단계;상기 후면전극 상에 광 흡수층을 형성하는 단계;상기 광 흡수층 상에 버퍼층을 형성하는 단계; 및상기 버퍼층 상에 전면전극을 형성하는 단계를 포함하는 태양전지의 제조방법.
- 제 11항에 있어서,상기 패턴층을 형성하는 단계는,상기 기판 상에 수지층을 형성하는 단계; 및상기 수지층에 금형을 이용한 몰딩(molding) 공정을 진행하면서, UV 경화 공정을 동시에 진행하여, 요철 패턴이 형성된 패턴층을 형성하는 단계를 포함하는 태양전지의 제조방법.
- 제 12항에 있어서,상기 수지층은 에폭시, 에폭시 멜라닌, 아크릴, 우레탄 수지 등의 단독 또는 혼합물 형태의 레진(resin)을 포함하는 물질로 형성된 것을 포함하는 태양전지의 제조방법.
- 제 11항에 있어서,상기 요철 패턴은 홈과 돌기가 주기적으로 형성된 것을 포함하는 태양전지의 제조방법.
- 제 14항에 있어서,상기 홈의 폭은 100~300nm이고, 상기 돌기의 폭은 100~200nm이고,상기 홈과 돌기의 높이는 100~300nm이며,상기 홈과 돌기를 포함하는 상기 요철 패턴의 주기는 200~500nm인 것을 포함하는 태양전지의 제조방법.
- 제 14항에 있어서,상기 기판, 패턴층, 후면전극에 대해서,a는 상기 요철 패턴의 상면인 상기 돌기의 상면부터 상기 후면전극의 표면까지의 거리, b는 상기 홈의 높이, c는 상기 돌기의 높이, d는 상기 패턴층에서 상기 홈의 바닥면부터 상기 기판까지의 두께라 할 때,(a+b)=W(c+d)의 조건식을 만족하며, 여기서 W는 0.17~0.43의 값을 가지는 태양전지의 제조방법.
- 제 14항에 있어서,상기 패턴층에 대해서,c는 상기 돌기의 높이, d는 상기 패턴층에서 상기 홈의 바닥면부터 상기 기판까지의 두께라 할 때,(c)=X(d)의 조건식을 만족하며, 여기서 X는 0.03~0.15의 값을 가지는 태양전지의 제조방법.
- 제 14항에 있어서,상기 기판과 패턴층에 대해서,d는 상기 패턴층에서 상기 홈의 바닥면부터 상기 기판까지의 두께, e는 상기 기판의 두께라 할 때,(d)=Y(e)의 조건식을 만족하며, 여기서 Y는 0.04~0.12의 값을 가지는 태양전지의 제조방법.
- 제 14항에 있어서,상기 패턴층에 대해서,f는 상기 홈의 폭, g는 상기 돌기의 폭이라 할 때,(f)=Z(g)의 조건식을 만족하며, 여기서 Z는 1~2의 값을 가지는 태양전지의 제조방법.
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CN2010800492881A CN102598299A (zh) | 2009-10-28 | 2010-10-28 | 太阳能电池及其制造方法 |
EP10827109.9A EP2434550A4 (en) | 2009-10-28 | 2010-10-28 | SOLAR CELL AND MANUFACTURING METHOD THEREFOR |
US13/379,557 US8987585B2 (en) | 2009-10-28 | 2010-10-28 | Solar cell and method fabricating the same |
JP2012536683A JP5663030B2 (ja) | 2009-10-28 | 2010-10-28 | 太陽電池及びその製造方法 |
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KR101186560B1 (ko) * | 2011-07-07 | 2012-10-08 | 포항공과대학교 산학협력단 | 태양전지용 기판 및 이의 제조방법 |
KR101281005B1 (ko) * | 2011-07-20 | 2013-07-08 | (주)에스티아이 | 박막형 태양전지 |
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CN103000709B (zh) * | 2012-11-26 | 2017-02-08 | 北京大学深圳研究生院 | 背电极、背电极吸收层复合结构及太阳能电池 |
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- 2010-10-28 EP EP10827109.9A patent/EP2434550A4/en not_active Withdrawn
- 2010-10-28 WO PCT/KR2010/007493 patent/WO2011053025A2/ko active Application Filing
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US20140283898A1 (en) * | 2011-09-02 | 2014-09-25 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Non-Planar Photovoltaic Device |
JP2014120628A (ja) * | 2012-12-17 | 2014-06-30 | Rohm Co Ltd | 光電変換装置およびその製造方法 |
Also Published As
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CN102598299A (zh) | 2012-07-18 |
EP2434550A4 (en) | 2013-11-20 |
JP2013509705A (ja) | 2013-03-14 |
WO2011053025A3 (ko) | 2011-09-22 |
US8987585B2 (en) | 2015-03-24 |
US20120097242A1 (en) | 2012-04-26 |
KR20110046195A (ko) | 2011-05-04 |
JP5663030B2 (ja) | 2015-02-04 |
KR101091405B1 (ko) | 2011-12-07 |
EP2434550A2 (en) | 2012-03-28 |
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