WO2010041324A1 - Carte imprimée, ensemble carte imprimée et dispositif de détection de mauvaise insertion - Google Patents

Carte imprimée, ensemble carte imprimée et dispositif de détection de mauvaise insertion Download PDF

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Publication number
WO2010041324A1
WO2010041324A1 PCT/JP2008/068390 JP2008068390W WO2010041324A1 WO 2010041324 A1 WO2010041324 A1 WO 2010041324A1 JP 2008068390 W JP2008068390 W JP 2008068390W WO 2010041324 A1 WO2010041324 A1 WO 2010041324A1
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WO
WIPO (PCT)
Prior art keywords
detection
connector
pins
circuit board
connectors
Prior art date
Application number
PCT/JP2008/068390
Other languages
English (en)
Japanese (ja)
Inventor
徹 村上
悟 海老原
裕資 川本
Original Assignee
株式会社アドバンテスト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社アドバンテスト filed Critical 株式会社アドバンテスト
Priority to PCT/JP2008/068390 priority Critical patent/WO2010041324A1/fr
Priority to JP2010532741A priority patent/JP5351171B2/ja
Priority to KR1020117009874A priority patent/KR101226466B1/ko
Priority to CN2008801314390A priority patent/CN102172107A/zh
Priority to TW098130184A priority patent/TWI405981B/zh
Publication of WO2010041324A1 publication Critical patent/WO2010041324A1/fr

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/11—Printed elements for providing electric connections to or between printed circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/64—Means for preventing incorrect coupling
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007—Types of components
    • H05K2201/10189—Non-printed connector
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10227—Other objects, e.g. metallic pieces
    • H05K2201/10356—Cables
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/163—Monitoring a manufacturing process
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/168—Wrong mounting prevention

Definitions

  • the present invention relates to a circuit board (Circuit Board) provided with a board (Substrate) on which conductor wiring is formed and a plurality of connectors mounted on the board, and a circuit board assembly and erroneous insertion detection provided with the circuit board. Relates to the device.
  • DUT Device Under Test
  • This electronic component testing apparatus tests a DUT that has been tested by sequentially testing a test head having a socket in electrical contact with the DUT, a tester that tests the DUT via the test head, and the DUT onto the test head. And a handler for classifying according to the result.
  • the test head includes a socket board on which a socket is mounted, and a performance board electrically connected to the socket board, and a board in which these boards are connected via a cable is known.
  • a large number of connectors are mounted on any board, and a cable can be attached to and detached from each board.
  • the problem to be solved by the present invention is to provide a circuit board, a circuit board assembly, and an erroneous insertion detection device capable of preventing erroneous insertion of a connector.
  • a circuit board including a board on which conductor wiring is formed and a plurality of connectors mounted on the board, and the plurality of pins each of the connector includes the conductor
  • a circuit board comprising a pair of detection pins electrically connected to each other through wiring is provided (see claim 1).
  • the position of at least one detection pin of the detection pins in the connector is preferably different from the position of the detection pin in another connector of the plurality of connectors. 2).
  • a first circuit board having a first board on which a first conductor wiring is formed, and a plurality of first connectors mounted on the first board;
  • a circuit board assembly including a pair of first detection pins electrically connected to each other via the first conductor wiring is provided (see claim 3).
  • the position of the first detection pin of at least one of the first detection pins in the first connector is in the other first connector of the plurality of first connectors. It is preferable that the position is different from the position of the first detection pin (see claim 4).
  • each of the plurality of cables has a third connector at the other end
  • the circuit board assembly includes a second board on which a second conductor wiring is formed, and the second board. It is preferable to further include a second circuit board that is mounted and has a plurality of fourth connectors that can be fitted to the third connector (see claim 5).
  • each of the plurality of second pins included in the second connector includes a pair of second detection pins arranged at positions corresponding to the first detection pins
  • Each of the plurality of third pins included in the connector includes a pair of third detection pins electrically connected to the second detection pins via a conductor of the cable
  • the fourth connector includes The plurality of fourth pins includes a pair of fourth detection pins arranged at positions corresponding to the third detection pins, and one of the fourth detection pins is the first detection pin. It is preferable to be electrically connected to the fourth detection pin of the other fourth connector via the second conductor wiring (see claim 6).
  • the third pin further includes a pair of fifth detection pins electrically connected to each other via a conductor of the cable, and the fourth pin includes the fifth detection pin.
  • a pair of sixth detection pins arranged at positions corresponding to the pins for detection, and one of the fourth detection pins is connected to the other via the fifth and sixth detection pins. It is preferable that the fourth connector is electrically connected to the fourth detection pin (see claim 8).
  • it further comprises a second circuit board having a second substrate on which a second conductor wiring is formed, and the other ends of the plurality of cables are directly connected to the second substrate. It is preferable (refer to claim 9).
  • an erroneous insertion detection device for detecting an erroneous insertion of a connector in an electronic component testing apparatus, wherein the circuit board assembly is configured to input a detection signal to the circuit board assembly. And a determination means for determining whether or not to supply test power to the circuit board assembly based on whether or not the detection signal is output from the circuit board assembly.
  • An insertion detection device is provided (see claim 10).
  • the determination means determines to supply test power to the circuit board assembly when the detection signal is output from the circuit board assembly, and the detection signal is output from the circuit board assembly. Is not output, it is preferable to determine not to supply test power to the circuit board assembly (see claim 11).
  • a pair of detection pins among a plurality of pins included in the connector are electrically connected to each other. For this reason, after inserting the connector, by confirming that the detection signal input from one of the detection pins is output from the other detection pin, the insertion destination connector is originally inserted before power supply. Since it can be confirmed that the connector is a power connector, it is possible to prevent erroneous insertion of the connector.
  • FIG. 1 is a schematic cross-sectional view of an electronic component testing apparatus according to an embodiment of the present invention.
  • FIG. 2 is a schematic cross-sectional view of the test head in the embodiment of the present invention.
  • FIG. 3 is an exploded view of the test head shown in FIG.
  • FIG. 4 is a diagram illustrating a connection relationship among the socket board, the cable, and the performance board in the embodiment of the present invention.
  • FIG. 5 is a block diagram showing an erroneous insertion detection apparatus in the embodiment of the present invention.
  • FIG. 6 is a diagram illustrating a detection path for erroneous connector insertion according to the embodiment of the present invention.
  • FIG. 1 is a schematic cross-sectional view of an electronic component testing apparatus according to an embodiment of the present invention.
  • FIG. 2 is a schematic cross-sectional view of the test head in the embodiment of the present invention.
  • FIG. 3 is an exploded view of the test head shown in FIG.
  • FIG. 4 is a diagram illustrating a
  • FIG. 7 is a diagram illustrating an example of a connection relationship when a connector is erroneously inserted in the embodiment of the present invention.
  • FIG. 8 is a diagram illustrating an example of a connection relationship when cables having different specifications are erroneously connected in the embodiment of the present invention.
  • FIG. 9 is a diagram showing a connection relationship between a performance board and a cable in another embodiment of the present invention.
  • FIG. 1 is a schematic sectional view of an electronic component testing apparatus according to the present embodiment
  • FIG. 2 is a schematic sectional view of a test head according to the present embodiment
  • FIG. 3 is an exploded view of the test head shown in FIG.
  • the electronic component testing apparatus includes a test head 10 electrically connected to a DUT, a tester that sends a test signal to the DUT via the test head 10 and inspects a response signal. 2 and a handler 1 that sequentially conveys the DUTs onto the test head 10 and classifies the DUTs that have been tested according to the test results.
  • This electronic component testing apparatus tests whether a DUT operates properly in a state where a high or low temperature thermal stress is applied to the DUT (or a normal temperature state), and classifies the DUT according to the test result. It is.
  • a socket 33 that is in electrical contact with the DUT during the test is provided on the top of the test head 10. As shown in the figure, the socket 33 enters the inside of the handler 1 through an opening 1 a formed in the handler 1, and the transported DUT is pressed against the socket 33 by the handler 1.
  • a heat plate type or a chamber type can be used as the handler 1.
  • the test head 10 includes a test head body 11 and HiFix 15 (interface device) as shown in FIGS. Inside the test head main body 11 is accommodated a pin electronics card 12 in which an electronic circuit used for DUT testing is incorporated.
  • the pin electronics card 12 is electrically connected to the tester 2 via the cable 3 shown in FIG. 1 and is detachably connected to the HiFix 15 via connectors 13 and 16.
  • the HiFix 15 is mounted on the test head main body 11 in order to electrically relay the test head main body 11 and the performance board 20 (described later).
  • a connector 17 for electrically connecting to the performance board 20 is provided on the upper part of the HiFix 15.
  • the connectors 16 and 17 included in the HiFix 15 are electrically connected via a cable 18.
  • the test head 10 in this embodiment further includes a socket board 30 and a performance board 20.
  • the performance board 20 is mounted on the HiFix 15 and mounted on the second substrate 21, the fourth connector 24 mounted on the upper surface of the second substrate 21, and the lower surface of the second substrate 21.
  • the connector 23 is provided.
  • the connectors 23 and 24 are electrically connected via a wiring pattern or a through hole (not shown) formed on the second substrate 21.
  • the lower connector 23 can be fitted into the upper connector 17 of the HiFix 15, and the HiFix 15 and the performance board 20 are electrically connected by fitting these connectors 17 and 23 together. It has come to be.
  • the above-described fourth connector 24 is a general term for three fourth connectors 24A to 24C, which will be described later with reference to FIGS. 2 and 3, only two fourth connectors 24 are shown, but actually, several tens to several hundreds of connectors 24 are mounted on one performance board 20.
  • the socket board 30 is provided on the performance board 20, and includes a first substrate 31 on which the socket 33 is mounted on the upper surface, and a plurality of first connectors mounted on the lower surface of the first substrate 31. 35.
  • one or more socket boards 30 are provided on one performance board 20.
  • the socket 33 has a plurality of contact pins 34, and when the DUT is tested, the contact pins 34 and terminals derived from the DUT come into contact with each other, whereby the socket and the DUT are electrically connected.
  • the socket 33 and the first connector 35 are electrically connected via a wiring pattern or a through hole (not shown) formed on the first substrate 31.
  • the above-described first connector 35 is a general term for three first connectors 35A to 35C, which will be described later with reference to FIGS. 2 and FIG. 3 show only two first connectors 35, but actually, dozens of connectors 35 are mounted on one socket board 30.
  • the performance board 20 and the socket board 30 are electrically connected via a cable 40.
  • a second connector 43 that can be fitted to the first connector 35 of the socket board 30 is connected to the upper end of the cable 40 so that the cable 40 can be attached to and detached from the socket board 30.
  • a third connector 45 that can be fitted to the fourth connector 24 of the performance board 20 is connected to the lower end of the cable 40 so that the cable 40 can be detached from the performance board 20.
  • the above-mentioned second connector 43 is a generic name of three second connectors 43A to 43C described later with reference to FIGS. 4 to 8, and the above-mentioned third connector 45 is also referred to the same figure. However, it is a general term for three third connectors 45A to 45C described later.
  • the above-described cable 40 is a general term for three cables 40A to 40C described later with reference to FIGS.
  • FIG. 4 is a diagram showing a connection relationship between the socket board, the cable, and the performance board in the present embodiment
  • FIG. 5 is a block diagram showing an erroneous insertion detection device in the present embodiment.
  • FIG. 4 to FIG. 8 will be described with an example in which the performance board 20 and the socket board 30 are connected by three sets of cables 40A to 40C.
  • the socket board 30 is connected through several tens of cables 40.
  • the three first connectors 35A to 35C shown in FIG. 4 are receptacle type connectors having, for example, eight pins 36a to 36h held in an insulating housing.
  • the eight pins of each connector are referred to as a first pin, a second pin,..., An eighth pin from the left side to the right side in FIG. .
  • the three first connectors 35A to 35C all have the same structure, but the positions of pins (detection pins) for detecting erroneous insertion of the connectors are different.
  • the “detection pin” in the present embodiment has no structural difference from other pins included in the connector, and is an expression used for the sake of convenience in order to clarify the difference in use with the other pins.
  • the number of pins included in the connector is not particularly limited, and actually, several tens of pins are provided in one connector.
  • the first and second pins 36 a and 36 b are connected via the detection wiring pattern 32 formed on the first substrate 31. They are directly connected to each other.
  • the second to sixth pins 36c to 36f are also connected to the wiring pattern on the first substrate 31, but these pins 36c to 36f are not directly connected to each other. .
  • the first and second pins 36a and 36b are used for detecting erroneous insertion of the first and second connectors 35A and 43A, and the third to sixth pins 36c to 36f are used. Are used for testing the DUT, and the seventh and eighth pins 36g and 36h are not particularly used.
  • the third and fourth pins 36c and 36d are the detection wiring patterns. They are directly connected to each other via 32.
  • the first, second, fifth and sixth pins 36a, 36b, 36e and 36f are also connected to the wiring pattern on the first substrate 31, but these pins 36a and 36b. 36e and 36f are not directly connected to each other.
  • the third and fourth pins 36c and 36d are used for detecting erroneous insertion of the first and second connectors 35B and 43B, and the first, second, fifth and fifth pins are used.
  • Six connectors 36a, 36b, 36e, and 36f are used for the DUT test, and the seventh and eighth pins 36g and 36h are not particularly used.
  • the sixth and seventh connectors 36e and 36f are the detection wiring patterns. They are directly connected to each other via 32.
  • the first to fourth pins 36a to 36d are also connected to the wiring pattern on the first substrate 31, but these pins 36a to 36d are not directly connected to each other. .
  • the fifth and sixth pins 36e and 36f are used to detect erroneous insertion of the first and second connectors 35C and 43C, and the first to fourth pins 36a to 36d are used. Are used for testing the DUT, and the seventh and eighth pins 36g and 36h are not particularly used.
  • the present invention is not particularly limited to this. It is only necessary that the position of at least one of the two detection pins is different from the position of the two detection pins in the other connector.
  • the three second connectors 43A to 43C shown in FIG. 4 are plug-type connectors having, for example, eight pins 44a to 44h held in an insulating housing.
  • the three second connectors 43A to 43C all have the same structure.
  • the second connectors 43A to 43C may be receptacle-type connectors.
  • the first connectors 35A to 35C are plug-type connectors.
  • the pins 44a to 44h of the second connectors 43A to 43C can contact the pins 36a to 36h of the first connectors 35A to 35C, respectively, when fitted. Accordingly, the first and second pins 44a and 44b in the second connector 43A on the left side in FIG. 4, the third and fourth pins 44c and 44d in the second connector 43B in the center, and the second pins on the right side in FIG. In the connector 43C, the fifth and sixth pins 44e and 44f correspond to an example of a second detection pin in the present invention.
  • the three third connectors 45A to 45C shown in FIG. 4 are also plug-type connectors having, for example, eight pins 46a to 46h held in an insulating housing, and all have the same structure.
  • the first to sixth pins 46a to 46f are connected to the first to sixth pins 44a to 44f of the second connector 43A via the conducting wire 41 of the cable 40A. Are electrically connected to each other.
  • the first and second pins 46a and 46b in the third connector 45A on the left side in FIG. 4 the third and fourth pins 46c and 46d in the third connector 45B in the center, and the third pin on the right side in FIG.
  • the fifth and sixth pins 46e and 46f in the connector 45C correspond to an example of a third detection pin in the present invention.
  • the seventh and eighth pins 46g and 46h (fifth detection pins) of the third connector 45A on the left side are electrically connected to each other via the detection conductor 42 of the cable 40A.
  • the seventh and eighth pins 44g and 44h are electrically connected to each other via the conducting wire of the cable 40A.
  • the center and right third connectors 45B and 45C are also connected to the second connectors 43B and 43C via the cables 40B and 40C in the same manner.
  • the seventh and eighth pins 46g and 46h are used to detect whether cables having different specifications are not erroneously connected.
  • the four fourth connectors 24A to 24C shown in FIG. 4 are receptacle-type connectors having, for example, eight pins 25a to 25h held in an insulating housing, and all have the same structure.
  • the fourth connectors 24A to 24C may be plug-type connectors.
  • the third connectors 45A to 45C are receptacle-type connectors.
  • the pins 25a to 25h of the fourth connectors 24A to 24C can come into contact with the pins 46a to 46h of the third connectors 45A to 45C, respectively.
  • the seventh and eighth pins 25g and 25h are used to detect whether cables having different specifications are connected by mistake.
  • any two of the first to sixth pins 25a to 25f are not connected to the connector. Used to detect insertion.
  • the first and second pins 25a and 25b are used for detecting erroneous insertion of the connector, and the third to sixth pins 25c. ⁇ 25f is used for DUT testing.
  • the second pin 25b is connected to the seventh pin 25g via the detection wiring pattern 22 formed on the second substrate 21, and the eighth pin 24b
  • the pin 25h is connected to the third pin 25c of the central fourth connector 24B via the detection wiring pattern 22.
  • the third and fourth pins 25c and 25d are used to detect erroneous insertion of the connector, and the first and second pins
  • the second, fifth and sixth pins 25a, 25b, 25e and 25f are used for the DUT test.
  • the fourth pin 25d is connected to the seventh pin 25g via the detection wiring pattern 22, and further, the eighth pin 25h is connected to the detection wiring pattern. 22 is connected to the fifth pin 25e of the fourth connector 24C on the right side.
  • the fifth and sixth pins 25e and 25f are used for detecting erroneous insertion of the connector, and the first to fourth pins are used. Pins 25a to 25d are used for testing the DUT.
  • the sixth pin 25 f is connected to the seventh pin 25 g through the detection wiring pattern 22.
  • the fourth detection pins of the fourth connectors 24A to 24C are directly connected via the detection wiring pattern 22, and the seventh and eighth The pins 25g and 25h may be used for the DUT test.
  • the first pin 25 a of the left fourth connector 24 ⁇ / b> A and the eighth pin 25 h of the right fourth connector 24 ⁇ / b> C are connected to the erroneous insertion detection device 5 provided in the tester 2. Has been.
  • the erroneous insertion detection device 5 is a device for detecting erroneous insertion of the second connectors 43A to 43C into the first connectors 35A to 35C, and includes an input unit 6 and a determination unit 7. As a result, the erroneous insertion detection device 5 can also detect erroneous insertion of the third connectors 45A to 45C into the fourth connectors 24A to 24C.
  • the input unit 6 is connected to the first pin 25a of the left fourth connector 24A, and can input a detection signal for detecting erroneous insertion of the connector to the first pin 25a. ing.
  • a detection signal for detecting erroneous insertion of the connector to the first pin 25a.
  • a confirmation signal for confirming whether or not the HiFix 15 is attached to the test head main body 11 may be used.
  • the determination unit 7 is connected to the eighth pin 25h of the fourth connector 24C on the right side, and confirms whether or not the detection signal input by the input unit 6 is output from the eighth pin 25h. Is possible. When the output of the detection signal is confirmed, the determination unit 7 permits the power supply unit 4 of the tester 2 to supply power for the DUT test. On the other hand, when the output of the detection signal is not confirmed, the determination unit 7 does not permit the power supply unit 4 to supply the test power.
  • FIG. 6 is a diagram illustrating an erroneous insertion detection path in the present embodiment
  • FIG. 7 is a diagram illustrating an example of a connection relationship when a connector is erroneously inserted in the present embodiment
  • FIG. 8 is a diagram of cables having different specifications in the present embodiment. It is a figure which shows an example at the time of being connected accidentally.
  • the second connector 43A to be originally inserted into the left first connector 35A is erroneously inserted into the first first connector 35B, and the first If the second connector 43B to be inserted into the connector 35B is accidentally inserted into the left first connector 35A, the first pin 36a and the second pin 36b of the central first connector 35B are inserted. Are not connected to each other, the erroneous insertion detection path 50 is not formed.
  • the seventh pin 46g of the center second connector 45B is used.
  • the eighth pin 46h the erroneous insertion detection path 50 is blocked.
  • the pair of detection pins among the plurality of pins 36a to 36h included in the first connectors 35A to 35C are electrically connected to each other. For this reason, after inserting the connector, input a detection signal from one detection pin and confirm that the detection signal is output from the other detection pin before supplying test power. Thus, it can be confirmed that the connector at the insertion destination is the connector to be originally inserted.
  • the pair of detection pins among the plurality of pins 46a to 46h included in the third connectors 45A to 45C are electrically connected to each other. For this reason, after inserting the connector, input the detection signal from one detection pin, and check that the detection signal is output from the other detection pin. Can be confirmed.
  • the lower end of the cable 40 may be directly connected to the wiring pattern on the second substrate 21 without using the third and fourth connectors 45 and 24 by soldering or the like.
  • a pair of detection pins electrically connected to each other is provided on the fourth connector 24 of the performance board 20 to detect erroneous insertion of the third connector 46 into the fourth connector 24. Also good.
  • the first and second pins 25 a and 25 b (first detection pins) of the fourth connector 24 are erroneously inserted into the fourth connector 24. Used for detection.
  • the first pin 25 a and the second pin 25 b of the fourth connector 24 are connected to each other via a detection wiring pattern 22 formed on the second substrate 21 of the performance board 20. Is electrically connected.
  • the fourth connector 24 in the present embodiment corresponds to an example of the first connector in the present invention
  • the third connector 45 in the present embodiment corresponds to an example of the second connector in the present invention. Equivalent to.
  • the upper end of the cable 40 may be directly connected to the wiring pattern on the first substrate 31 without using the first and second connectors 35 and 43 by soldering or the like.

Abstract

Carte imprimée (30), comprenant un premier substrat (31) à la surface duquel est formé un motif de circuit (32) utilisé à des fins de détection, et une pluralité de connecteurs (35A-35C) montés sur le premier substrat (31). Une pluralité de broches (36a-36h) respectivement placées sur les connecteurs (35A-35C) comprennent une paire de broches de détection raccordées électriquement par l’intermédiaire du motif de circuit (32).
PCT/JP2008/068390 2008-10-09 2008-10-09 Carte imprimée, ensemble carte imprimée et dispositif de détection de mauvaise insertion WO2010041324A1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
PCT/JP2008/068390 WO2010041324A1 (fr) 2008-10-09 2008-10-09 Carte imprimée, ensemble carte imprimée et dispositif de détection de mauvaise insertion
JP2010532741A JP5351171B2 (ja) 2008-10-09 2008-10-09 回路ボードアッセンブリ及び誤挿入検出装置
KR1020117009874A KR101226466B1 (ko) 2008-10-09 2008-10-09 회로보드 어셈블리
CN2008801314390A CN102172107A (zh) 2008-10-09 2008-10-09 电路板、电路板组件及误插入检测装置
TW098130184A TWI405981B (zh) 2008-10-09 2009-09-08 Circuit board, circuit board assembly and mistaken insertion detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2008/068390 WO2010041324A1 (fr) 2008-10-09 2008-10-09 Carte imprimée, ensemble carte imprimée et dispositif de détection de mauvaise insertion

Publications (1)

Publication Number Publication Date
WO2010041324A1 true WO2010041324A1 (fr) 2010-04-15

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Application Number Title Priority Date Filing Date
PCT/JP2008/068390 WO2010041324A1 (fr) 2008-10-09 2008-10-09 Carte imprimée, ensemble carte imprimée et dispositif de détection de mauvaise insertion

Country Status (5)

Country Link
JP (1) JP5351171B2 (fr)
KR (1) KR101226466B1 (fr)
CN (1) CN102172107A (fr)
TW (1) TWI405981B (fr)
WO (1) WO2010041324A1 (fr)

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CN113655646A (zh) * 2021-08-16 2021-11-16 京东方科技集团股份有限公司 显示面板、显示模组及显示装置

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CN108666824B (zh) * 2017-03-31 2020-11-20 比亚迪股份有限公司 轨道交通车辆及其门系统的接插组件和接插组件的方法
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CN108469583A (zh) * 2018-05-28 2018-08-31 格力电器（郑州）有限公司 一种ict测试仪
CN108469583B (zh) * 2018-05-28 2024-03-22 格力电器（郑州）有限公司 一种ict测试仪
CN113655646A (zh) * 2021-08-16 2021-11-16 京东方科技集团股份有限公司 显示面板、显示模组及显示装置
CN113655646B (zh) * 2021-08-16 2023-10-24 京东方科技集团股份有限公司 显示面板、显示模组及显示装置

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