WO2009041365A1 - 有機トランジスタとその製造方法 - Google Patents

有機トランジスタとその製造方法 Download PDF

Info

Publication number
WO2009041365A1
WO2009041365A1 PCT/JP2008/067004 JP2008067004W WO2009041365A1 WO 2009041365 A1 WO2009041365 A1 WO 2009041365A1 JP 2008067004 W JP2008067004 W JP 2008067004W WO 2009041365 A1 WO2009041365 A1 WO 2009041365A1
Authority
WO
WIPO (PCT)
Prior art keywords
covalent bond
gate electrode
insulating layer
organic transistor
gate insulating
Prior art date
Application number
PCT/JP2008/067004
Other languages
English (en)
French (fr)
Inventor
Masakazu Kamura
Shigeru Aomori
Yasutaka Kuzumoto
Original Assignee
Sharp Kabushiki Kaisha
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Kabushiki Kaisha filed Critical Sharp Kabushiki Kaisha
Priority to JP2009534306A priority Critical patent/JP5070292B2/ja
Priority to US12/680,413 priority patent/US8178871B2/en
Publication of WO2009041365A1 publication Critical patent/WO2009041365A1/ja

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • H10K10/471Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising only organic materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • H10K10/474Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a multilayered structure
    • H10K10/476Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a multilayered structure comprising at least one organic layer and at least one inorganic layer
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/466Lateral bottom-gate IGFETs comprising only a single gate

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Thin Film Transistor (AREA)

Abstract

 低閾値電圧の有機トランジスタにおいて、ゲート絶縁層のピンホールが生じ易く、穏和な条件で、ピンホールを塞ぐことが困難であった。  少なくともゲート電極と、該ゲート電極上に形成されたゲート絶縁層とを有する有機トランジスタにおいて、 前記ゲート絶縁層は、前記ゲート電極表面に、第一の共有結合を介して前記ゲート電極表面に対して略垂直方向に結合している第一の有機分子層と、 前記第一の有機分子層の未反応末端部に、第二の共有結合を介して結合している第二の有機分子層とから構成される積層分子膜とを含み、 前記第二の共有結合が、前記積層分子の長軸方向に直交する面方向で、互いに隣接する他の第二の共有結合との間で水素結合を形成していることを特徴とする有機トランジスタを提供することにより上記課題を解決する。
PCT/JP2008/067004 2007-09-27 2008-09-19 有機トランジスタとその製造方法 WO2009041365A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009534306A JP5070292B2 (ja) 2007-09-27 2008-09-19 有機トランジスタとその製造方法
US12/680,413 US8178871B2 (en) 2007-09-27 2008-09-19 Organic transistor and method for producing the same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007251838 2007-09-27
JP2007-251838 2007-09-27

Publications (1)

Publication Number Publication Date
WO2009041365A1 true WO2009041365A1 (ja) 2009-04-02

Family

ID=40511250

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/067004 WO2009041365A1 (ja) 2007-09-27 2008-09-19 有機トランジスタとその製造方法

Country Status (3)

Country Link
US (1) US8178871B2 (ja)
JP (1) JP5070292B2 (ja)
WO (1) WO2009041365A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010240829A (ja) * 2009-03-17 2010-10-28 Toshiba Corp 粒子および近接場光導波路
WO2013008269A1 (ja) * 2011-07-11 2013-01-17 パナソニック株式会社 有機薄膜トランジスタ及び有機薄膜トランジスタの製造方法
WO2021161830A1 (ja) * 2020-02-14 2021-08-19 東京エレクトロン株式会社 成膜方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9171961B2 (en) * 2012-07-11 2015-10-27 Polyera Corporation Coating materials for oxide thin film transistors
US9035287B2 (en) * 2013-02-01 2015-05-19 Polyera Corporation Polymeric materials for use in metal-oxide-semiconductor field-effect transistors
KR102442188B1 (ko) * 2015-06-19 2022-09-13 삼성디스플레이 주식회사 유기 발광 표시 장치 및 그 제조 방법
KR101747264B1 (ko) * 2015-11-30 2017-06-15 엘지디스플레이 주식회사 표시 장치와 그의 제조 방법
WO2020158408A1 (ja) * 2019-02-01 2020-08-06 富士フイルム株式会社 有機薄膜トランジスタおよび有機薄膜トランジスタの製造方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03229710A (ja) * 1990-02-05 1991-10-11 Matsushita Electric Ind Co Ltd 高配向性共役ポリマーの製造方法
JP2003092411A (ja) * 2001-07-26 2003-03-28 Lucent Technol Inc 有機半導体デバイス、有機電界効果トランジスタ及びその製造方法
WO2005109539A1 (de) * 2004-05-03 2005-11-17 Merck Patent Gmbh Elektronische vorrichtungen enthaltend organische halbleiter

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003258260A (ja) 2002-02-28 2003-09-12 Nippon Hoso Kyokai <Nhk> 有機tftおよびその作製方法
JP4260508B2 (ja) 2002-07-18 2009-04-30 シャープ株式会社 有機発光素子およびその製造方法
DE102004005082B4 (de) 2004-02-02 2006-03-02 Infineon Technologies Ag Kondensator mit einem Dielektrikum aus einer selbstorganisierten Monoschicht einer organischen Verbindung und Verfahren zu dessen Herstellung
JP4502382B2 (ja) * 2004-11-02 2010-07-14 キヤノン株式会社 有機トランジスタ

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03229710A (ja) * 1990-02-05 1991-10-11 Matsushita Electric Ind Co Ltd 高配向性共役ポリマーの製造方法
JP2003092411A (ja) * 2001-07-26 2003-03-28 Lucent Technol Inc 有機半導体デバイス、有機電界効果トランジスタ及びその製造方法
WO2005109539A1 (de) * 2004-05-03 2005-11-17 Merck Patent Gmbh Elektronische vorrichtungen enthaltend organische halbleiter

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010240829A (ja) * 2009-03-17 2010-10-28 Toshiba Corp 粒子および近接場光導波路
US8475685B2 (en) 2009-03-17 2013-07-02 Kabushiki Kaisha Toshiba Particle and near-field optical waveguide
WO2013008269A1 (ja) * 2011-07-11 2013-01-17 パナソニック株式会社 有機薄膜トランジスタ及び有機薄膜トランジスタの製造方法
WO2021161830A1 (ja) * 2020-02-14 2021-08-19 東京エレクトロン株式会社 成膜方法
JP7486321B2 (ja) 2020-02-14 2024-05-17 東京エレクトロン株式会社 成膜方法

Also Published As

Publication number Publication date
US20100237337A1 (en) 2010-09-23
JPWO2009041365A1 (ja) 2011-01-27
US8178871B2 (en) 2012-05-15
JP5070292B2 (ja) 2012-11-07

Similar Documents

Publication Publication Date Title
WO2009041365A1 (ja) 有機トランジスタとその製造方法
WO2008114564A1 (ja) 薄膜トランジスタ及び薄膜トランジスタの製造方法
WO2009051663A3 (en) Transistor device and method
TW200943486A (en) Anti-fuse and method for forming the same, unit cell of non volatile memory device with the same
DE602008003796D1 (de) Tors mit einem oxidhalbleiter
JP2010153828A5 (ja) 半導体装置
TW200725912A (en) Organic thin film transistor and method for manufacturing the same
WO2008093741A1 (ja) 薄膜トランジスタ及びその製造方法
WO2009038606A3 (en) Transparent nanowire transistors and methods for fabricating same
JP2009033145A5 (ja)
WO2012127244A3 (en) Transistor device and materials for making
WO2005101524A3 (en) Method of fabricating an optoelectronic device having a bulk heterojunction
WO2010049871A3 (en) Dual gate field-effect transistor and method of producing a dual gate field-effect transistor
TN2010000301A1 (en) Hybrid nanocomposite
WO2011050115A3 (en) Split gate field effect transistor
TW200943487A (en) Memory cell with planarized carbon nanotube layer and methods of forming the same
TW200802888A (en) Thin film transistor and manufacturing method thereof
GB0817058D0 (en) Biosensor using nanoscale material as transistor channel and method of fabricating the same
WO2008099528A1 (ja) 表示装置、表示装置の製造方法
WO2008090969A1 (ja) 有機半導体コンポジット、有機トランジスタ材料ならびに有機電界効果型トランジスタ
TW200743213A (en) Muti-channel thin film transistor
WO2009060934A1 (ja) 半導体装置及びその製造方法
GB2509852A (en) Organic thin film transistors and method of making them
TW200735366A (en) Double gate thin-film transistor and method for forming the same
WO2008108136A1 (ja) スイッチング素子及びその製造方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08834466

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 2009534306

Country of ref document: JP

WWE Wipo information: entry into national phase

Ref document number: 12680413

Country of ref document: US

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08834466

Country of ref document: EP

Kind code of ref document: A1