WO2009017253A1 - 接着剤用液状樹脂組成物、半導体装置及び半導体装置の製造方法 - Google Patents
接着剤用液状樹脂組成物、半導体装置及び半導体装置の製造方法 Download PDFInfo
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- WO2009017253A1 WO2009017253A1 PCT/JP2008/064167 JP2008064167W WO2009017253A1 WO 2009017253 A1 WO2009017253 A1 WO 2009017253A1 JP 2008064167 W JP2008064167 W JP 2008064167W WO 2009017253 A1 WO2009017253 A1 WO 2009017253A1
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- resin composition
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- adhesive
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/62—Alcohols or phenols
- C08G59/621—Phenols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/68—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the catalysts used
- C08G59/688—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the catalysts used containing phosphorus
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J163/00—Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12044—OLED
Definitions
- the present invention relates to a liquid resin composition for an adhesive, a semiconductor device produced using the same, and a method for producing the semiconductor device.
- a film type dielectric material is used instead of using a liquid type dielectric material. After the film type die attach material is attached to the support, it is heated. While mounting the semiconductor element, support the semiconductor element with die attach material heated by sticking it to the dicing sheet after it is pasted to the dicing sheet with the film-shaped dielectric material attached to the back side of the semiconductor wafer.
- film-type die attach materials must have a suitable film for each size of the semiconductor element to be used and the thickness of the die attach material.
- a method of replacing a film material by forming a die attach material layer on a support substrate by printing and semi-curing it is also being used.
- Adhesives for such applications must always proceed to a certain semi-cured state, where they must be stopped. For this reason, it is often used to design a curing system up to a semi-cured state and a curing system up to the complete curing. (For example, see Patent Document 3.)
- a mixed system of acryl resin and epoxy resin can be considered.
- the thickness of the adhesive layer when mounting a semiconductor element on a support substrate tends to be about 30 ⁇ m or even thinner, and at such a thickness, it is difficult to control the curing reaction of the acrylic resin, and it is near room temperature. The stickiness will remain. The stickiness near room temperature causes the support substrates printed with adhesive to adhere to each other, which causes a problem in the automatic transport of the support substrate in the process of mounting semiconductor elements.
- Patent Document 1 Japanese Patent Application Laid-Open No. 200 2-2 94 1 7 7
- Patent Document 2 Japanese Patent Application Laid-Open No. 200 3-34 7 3 2 1
- Patent Document 3 Special Publication 200 5— 5 1 3 1 9 2
- Patent Document 4 Japanese Patent Application Laid-Open No. 200 1-2 20 5 5 6
- an object of the present invention is to provide a liquid resin composition for an adhesive that is excellent in continuous printability at the time of printing and has good semiconductor element mountability after solvent volatilization, and has no stickiness at room temperature. It is. Disclosure of the invention
- a liquid resin composition for an adhesive containing a curing accelerator (D)
- the epoxy resin (B) and the epoxy resin curing agent (C) are dissolved in the solvent (A),
- the curing accelerator (D) is converted into the solvent (A) by using the epoxy resin (B) and the epoxy resin curing agent (C).
- the temperature is from a temperature higher than the temperature at which the solvent (A) is volatilized to a curing temperature.
- a liquid resin composition for an adhesive characterized in that the force becomes a size that cannot be visually observed within a range, or dissolves in the adhesive layer.
- the epoxy resin (B) and the epoxy resin curing agent (C) are dissolved in the solvent (A),
- the curing accelerator (E) is a curing accelerator having a cation part and an anion part.
- the curing accelerator having the cation part and the anion part is a curing accelerator represented by the following general formula (1):
- RR 2 and R 3 each represent one kind selected from a hydrogen atom, a methyl group, a methoxy group, and a phenolic hydroxyl group, and It may be one or different.
- n is 0-2.
- Rene ring or an aromatic group represented by the following general formula (2) is shown.
- R 4 , R ⁇ R 6 and R 7 each represent one selected from a hydrogen atom, a halogen atom and an organic group having 1 to 6 carbon atoms, and they may be the same or different from each other
- V represents a single bond, an ether group, a sulfone group, a sulfide group, a carbonyl group or an organic group having 1 to 13 carbon atoms o)
- the curing accelerator having the cation part and the anion part is a curing accelerator represented by the following general formula (4): (1) or (2) Liquid resin composition.
- RR 2 and R 3 each represent one selected from a hydrogen atom, a methyl group, a methoxy group, and a phenolic hydroxyl group, and may be the same or different from each other.
- Y 1 and Y 2 are either an oxygen atom, a nitrogen atom, or a sulfur atom, and they may be the same or different Good.
- X represents an organic group, which may be the same or different.
- At least one of ⁇ 3 , ⁇ ⁇ ⁇ ⁇ 5 and ⁇ 6 is a group formed by the release of one proton by a Proton donor that has at least one Proton released out of the molecule, They may be the same or different from each other.
- the solvent (A) has a boiling point of 200 ° C or higher.
- the liquid resin composition for adhesive according to any one of the above, a printing process for printing on the support substrate, and the solvent is volatilized from the liquid resin composition for adhesive,
- a method for manufacturing a semiconductor device comprising: a volatilizing step for forming an adhesive layer; a mounting step for mounting a semiconductor element; and a curing step for curing the adhesive layer.
- the liquid resin composition for an adhesive according to the first embodiment of the present invention (hereinafter also referred to as the liquid resin composition for an adhesive of the present invention (1)) is composed of at least a solvent (A) and two in one molecule.
- Liquid for adhesive containing epoxy resin (B) having two or more epoxy groups, epoxy resin having two or more phenolic hydroxyl groups in one molecule, curing agent (C), and curing accelerator (D) A resin composition comprising:
- the epoxy resin (B) and the epoxy resin curing agent (C) are dissolved in the solvent (A),
- the curing accelerator (D) is from normal temperature to the temperature at which the solvent (A) is volatilized. In the temperature range, the epoxy resin (B) and the epoxy resin curing agent (C) are dissolved in the solvent (A) in the varnish (W) and from the varnish (W) to the solvent (A). In the adhesive layer obtained by volatilization, it exists in a size that can be visually observed, and cannot be visually observed in a temperature range from a temperature higher than the temperature at which the solvent (A) is volatilized to the curing temperature. It is a liquid resin composition for an adhesive that becomes a size or dissolves in the adhesive layer.
- the temperature at which the solvent (A) is volatilized may be equal to or lower than the boiling point of the solvent (A) as long as the solvent (A) is volatilized.
- the curing temperature is a temperature at which the adhesive layer obtained by volatilizing the solvent (A) from the liquid resin composition for adhesive of the present invention is cured.
- the liquid resin composition for adhesives (1) of the present invention is a liquid resin composition for adhesives used for bonding a semiconductor element onto a support substrate.
- the liquid resin composition for adhesives (1) of this invention is the printing process which prints the liquid resin composition layer for adhesives on a support substrate by continuous printing, Then, for adhesives printed on the support substrate A volatilization step of forming an adhesive layer on the support substrate by volatilizing the solvent (A) from the liquid resin composition layer, and then a mounting step of mounting a semiconductor element on the support substrate on which the adhesive layer is formed After performing the above, it is used in a method for manufacturing a semiconductor device having a step of bonding a semiconductor element onto a supporting substrate by performing a curing step of curing the adhesive layer.
- the volatilization temperature for volatilizing the solvent (A) in the volatilization step is 25 to 150 ° (: preferably 80 to 120 ° C.
- the adhesive layer is cured in the curing step.
- the curing temperature is 90 to 170 ° C., preferably 140 to 160 ° C.
- the temperature at which the semiconductor element is mounted is about the same as the volatilization temperature.
- the curing temperature is higher than the volatilization temperature
- the solvent (A) according to the liquid resin composition for adhesives (1) of the present invention dissolves the epoxy resin (B) and the epoxy resin curing agent (C). Is a solvent .
- the boiling point of the solvent (A) is 20 T : It is preferable that it is above, it is especially preferable that it is 2200-2600C, and 2100-2500C is more preferable. If the epoxy resin (B) and the epoxy resin curing agent (C) do not dissolve in the solvent (A), the surface after printing will not be smooth, and there will be defects (for example, semiconductors) The device may not be horizontal, etc.) and air may remain when mounted on the support substrate.
- the boiling point of the solvent (A) is less than 200 ° C, the viscosity change due to the volatilization of the solvent becomes too large during printing, resulting in uneven thickness and fading.
- the boiling point of the solvent (A) is higher at 2600, it takes too much time for the solvent to volatilize, the amount of residual volatiles becomes too much, and stickiness remains. There is a possibility.
- the solvent (A) is not particularly limited as long as it can dissolve the epoxy resin (B) and the epoxy resin curing agent (C).
- a solvent having a halogen atom is preferable because it is used for a semiconductor. Absent.
- a solvent that deteriorates the storage stability of the liquid resin composition for an adhesive such as a solvent containing a primary amine or a secondary amine is not preferable.
- the solvent (A) may be used alone or in combination of two or more.
- Solvents (A) include, for example, ethyl benzoate, propyl benzoate, butyl benzoate, butyl lactone, dibutyl oxalate, dimethyl maleate, jetyl maleate, ethylene glycol monobutyrate, propylene carbonate, N-methylpyrrole Don, 2- (hexyloxy) ethanol, diethylene glycol, diethylene glycol monoethyl ether, diethylene glycol monobutyl ether, triethylenoglycol monomethylol ether, dipropylene glycol.
- Examples thereof include coal monomethylol ether, methyl salicylate, diethylene glycol monoethylenoate etherate, diethylene glycol monobutinoleate tenaceta.
- ethyl benzoate having a boiling point of 2 10 to 2500 ° C.
- propyl benzoate butyl benzoate
- ⁇ -petit oral ratatone dibutyl oxalate
- jetyl maleate ethylene glycol monobutyrate
- carbonic acid Propylene, diethylene glycol, ethylene glycol monobutinoleate ⁇ /, triethylene glycolenomonomethylenoate, dipropylene glycol, tripropylene glycol monomethyl etherenole, methyl salicylate, diethylene glycol monoethyl / lei Tenoleate, diethylene glycol monobutynoate noate acetate and the like are preferred.
- epoxy resin ( ⁇ ) having two or more epoxy groups in one molecule of the liquid resin composition for adhesives (1) of the present invention (hereinafter also simply referred to as an epoxy resin ( ⁇ )), Phenolic novolac type epoxy resin, cresol novolac type epoxy resin, phenol aralkyl type epoxy resin, biphenyl aralkyl type epoxy resin, dicyclopentagen type epoxy resin, and other triphenylmethine skeleton Epoxy tree, epoxy resin having naphthalene skeleton, epoxy resin having anthracene skeleton, and the like. Of these, epoxy resins that are solid at room temperature are preferred. Epoxy resin ( ⁇ ) may be used alone or in combination of two or more.
- those that are solid at room temperature include epoxy resins with a softening point of 55 ° C or higher, such as cresol novolac type epoxy resins, phenol aralkyl type epoxy resins, biphenyls.
- Epoxy resin curing agent (C) having two or more phenolic hydroxyl groups in one molecule according to the liquid resin composition for adhesives (1) of the present invention (hereinafter also simply referred to as epoxy resin curing agent (C)) )
- Bisphenols such as bisphenol A, bisphenol F, bisphenol monole S, phenol novolac, cresol novolac, etc., a compound obtained by the reaction of phenol or its derivative with formaldehyde, phenol or its derivative and benzaldehyde.
- examples of the epoxy resin curing agent that is solid at room temperature include epoxy resin curing agents having a softening point of 55 or more, such as phenol novolac, phenol aralkyl type phenol resin, bif? Examples thereof include an enilaralkyl type phenol resin and bisphenol F, and a phenol novolac and a phenol noral quinol type phenol resin are preferable.
- the softening point of the epoxy resin hardener (C) is high, the softening point of the mixture decreases when mixed with the epoxy resin (B).
- the softening point of the epoxy resin hardener (C) is 1 5 It can be 0 ° C. If both epoxy resin (B) and epoxy resin curing agent (C) are not sticky at room temperature after volatilization of solvent (A), a partially liquid epoxy resin ( B) or a liquid epoxy resin curing agent (C) may be used.
- Liquid epoxy resin (B) or liquid epoxy resin curing agent ( C) includes semi-solid resins with a softening point of less than 55 ° C, and includes cresol novolac epoxy resins, bisphenol A epoxy resins, and arylphenol epoxy resin hardeners.
- the ratio of the epoxy resin (B) to the epoxy resin curing agent (C) is preferably such that the phenolic hydroxyl group is 0.7 to 1.3 with respect to the epoxy group 1.
- a more preferable ratio of the phenolic hydroxyl group to the epoxy group 1 is 0.9 to 1.2.
- the curing accelerator (D) according to the liquid resin composition for adhesives (1) of the present invention promotes the reaction between the epoxy group of the epoxy resin (B) and the phenolic hydroxyl group of the epoxy resin curing agent (C). It is a curing accelerator.
- the curing accelerator (D) is a varnish in which the epoxy resin (B) and the epoxy resin curing agent (C) are dissolved in the solvent (A).
- W and in the adhesive layer obtained by volatilizing the solvent (A) from the varnish (W), and present in a size that can be visually observed, and higher than the temperature at which the solvent (A) is volatilized.
- the curing accelerator (D) is in the temperature range from room temperature to 100 ° C. It can be visually observed in the varnish (W) during volatilization of the solvent (A) at 100 ° C and in the adhesive layer obtained by volatilizing the solvent (A) from the varnish (W). It exists in the size of about. Then, to cure the adhesive layer, it becomes a size that cannot be visually observed at some temperature during heating from 100 ° C to 175 ° C, or on the adhesive layer. Dissolve.
- the curing accelerator (D) having such properties, in the printing process and the volatilization process, The curing reaction hardly occurs, and the curing reaction occurs when heating up to the curing temperature in the curing process after the mounting process.
- Curing Accelerator (D) Force In the temperature range from room temperature to the temperature at which the solvent (A) is volatilized, it becomes a size that cannot be visually observed or dissolved in the varnish (W) or adhesive layer. The reaction gradually progresses even at normal temperature, so the storage stability at room temperature deteriorates, the curing reaction progresses in the volatilization process, and sufficient adhesion cannot be obtained in the subsequent semiconductor element mounting process. Even if the volatilization process is completed with adhesive strength, the storage stability when left at room temperature after the volatilization process is extremely short.
- the temperature at which the curing accelerator (D) existing in a size that can be visually observed becomes a size that cannot be visually observed or is dissolved in the adhesive layer is set to a value of the curing accelerator (D). Stated as state change temperature. Since the state change temperature of the curing accelerator (D) varies depending on the type of the curing accelerator (D), a curing accelerator (D) having a higher state change temperature than the volatilization temperature may be appropriately selected.
- the state change temperature of the promoter (D) is preferably 100 to 160 ° C., particularly preferably 120 to 150.
- the state change temperature of the curing accelerator (D) means that 95% by weight of the varnish (W) is mixed with 5% by weight of the curing accelerator (D), heated, and visually observed.
- Curing Accelerator (D) Force Existing in Size That Can Be Observed at a Temperature of 10% by Weight Curing Accelerator (90% by weight in a varnish (W) or 90% by weight D), and measured with a DSC (Differential Scanning Calorimeter, Seiko Instruments, DSC 220) at a rate of temperature increase of 5 ° CZ, the curing accelerator (D) force, and the endothermic peak during dissolution. This is the temperature at which appears.
- the curing reaction initiation temperature of the curing accelerator (D) is preferably 130 ° C or higher, more preferably 140 ° C or higher.
- the curing reaction start temperature is defined as DSC (Differential Scanning Calorimeter, Seiko Instruments Measured at a heating rate of 7 ° CZ using DSC 2 20) manufactured by Mentsu Co., Ltd .: This is the temperature at which the line connecting the bottoms of the reaction peaks begins.
- the liquid resin composition for adhesives of the second form of the present invention (hereinafter also referred to as the liquid resin composition for adhesives of the present invention (2)) is at least a solvent (A) and in one molecule.
- a liquid resin composition comprising:
- the epoxy resin (B) and the epoxy resin curing agent (C) are dissolved in the solvent (A),
- the curing accelerator (E) 1 is a liquid resin composition for adhesives, which is a curing accelerator having a cation part and an anion part.
- the liquid resin composition for adhesives (2) of the present invention is a liquid resin composition for adhesives used for bonding a semiconductor element onto a support substrate.
- the solvent (A), the epoxy resin (B) and the epoxy resin curing agent (C) according to the liquid resin composition for adhesives (2) of the present invention are related to the liquid resin composition for adhesives (1) of the present invention. Same as solvent (A), epoxy resin (B) and epoxy resin curing agent (C).
- the curing accelerator (E) according to the liquid resin composition for adhesives (2) of the present invention is a curing accelerator having a cation part and an anion part, and the curing accelerator (E
- RR 2 and R 3 each represent one selected from a hydrogen atom, a methyl group, a methoxy group, and a phenolic hydroxyl group, and may be the same or different from each other.
- N is 0 to 2.
- A represents a naphthalene ring or an aromatic group represented by the following general formula (2).
- R 4 , R 5 , R 6 and R 7 each represent one selected from a hydrogen atom, a halogen atom and an organic group having 1 to 6 carbon atoms, and are identical to each other.
- V may be a single bond, an ether group, a sulfone group, a sulfide group, a carbonyl group, or an organic group having 1 to 13 carbon atoms.
- the anion portion when n is 0, is a conjugate base of a compound having one or more phenolic hydroxyl groups and phenoxide groups in one molecule.
- the anion portion when n is larger than 0, is composed of a compound having two or more phenolic hydroxyl groups in one molecule and one or more phenolic hydroxyl groups and phenol in one molecule. It is a molecular association with a conjugate base of a compound having an enoxide group.
- Examples of the curing accelerator represented by the general formula (1) include the following general formula.
- RR 2 and R 3 each represent one selected from a hydrogen atom, a methyl group, a methoxy group, and a phenolic hydroxyl group, and may be the same or different from each other.
- N is 0 to 2.
- the curing accelerator (E) having a cation part and an anion part according to the liquid resin composition for an adhesive (2) of the present invention includes the following general formula ( The curing accelerator represented by 4) can be mentioned.
- RR 2 and R 3 each represent one selected from a hydrogen atom, a methyl group, a methoxy group, and a phenolic hydroxyl group, and may be the same or different from each other.
- Y 1 and Y 2 are oxygen atoms, Either a nitrogen atom or a sulfur atom, which may be the same or different.
- X represents an organic group.
- Z represents a substituted or unsubstituted aromatic cyclic organic group or a heterocyclic organic group.
- X, Y 1 and Y 2 form a chelate structure with a silicon atom.
- Examples of the curing accelerator represented by the general formula (4) include the following general formula (5).
- RR 2 and R 3 each represent one selected from a hydrogen atom, a methyl group, a methoxy group, and a phenolic hydroxyl group, and may be the same or different from each other.
- P h is a phenyl group.
- the curing accelerator (E) having a cation part and an anion part according to the liquid resin composition for adhesives (2) of the present invention is represented by the following general formula (6): And the curing accelerator represented.
- R 1 R 2 and R 3 each represent one selected from a hydrogen atom, a methyl group, a methoxy group, and a phenolic hydroxyl group, and they may be the same or different from each other. be good Rere. ⁇ 3, ⁇ 4,.
- one at least of Upsilon 5 and Upsilon 6 are pro tons donor to one chromatic least pro tons of releasing the molecules outside are one releasing pro ton And they may be the same or different from each other.
- ⁇ 3 , ⁇ 4 , ⁇ 5 and ⁇ 6 are organic groups or aliphatic groups having an aromatic ring or a heterocyclic ring, and ⁇ 3 , ⁇ 4 , ⁇ 5 and ⁇ At least one of the six is aromatic aromatic rubonic acid having one or more carboxyl groups, and aromatic carboxylic acid having at least one acid anhydride group and / or carboxyl group in one molecule.
- a proton donor selected from the group consisting of phenol compounds having one or more hydroxyl groups in one molecule and aromatic compounds each having at least one carboxyl group and phenolic hydroxyl group in one molecule.
- a group formed by releasing one of them may be the same or different from each other.
- Examples of the curing accelerator represented by the general formula (6) include the following general formula (7).
- the liquid resin composition for an adhesive of the present invention (2) is a printing step of printing the liquid resin composition layer for an adhesive on a supporting substrate by continuous printing, From the liquid resin composition layer for adhesive printed on the support substrate, the solvent (A) was volatilized to volatilize the adhesive layer on the support substrate, and then the adhesive layer was formed.
- the semiconductor device is used in a method for manufacturing a semiconductor device having a step of bonding a semiconductor element on a support substrate by performing a curing step of curing an adhesive layer after mounting the semiconductor element on the support substrate.
- the volatilization temperature for volatilizing the solvent (A) in the volatilization step is 25 to 1550 ° C, preferably 80 to 120 ° C.
- the curing temperature for curing the adhesive layer in the curing step is 90 to 170 ° C., preferably 140 to 160 ° C.
- the temperature at which the semiconductor element is mounted is about the same as the volatilization temperature.
- the curing temperature is higher than the volatilization temperature.
- the curing accelerator (E) is large enough to be visually observed in the volatilization process at the volatilization temperature in the varnish (W) and in the adhesive layer obtained by volatilizing the solvent (A) from the varnish (W). It exists.
- the curing accelerator (E) hardly accelerates the curing reaction.
- the curing accelerator (E) is visually observed while being heated to the curing temperature, that is, at a temperature in the temperature range from a temperature higher than the volatilization temperature to the curing temperature in order to perform the curing process. The size becomes unobservable, or dissolves in the adhesive layer. As a result, the curing accelerator (E) accelerates the curing reaction.
- liquid resin composition for adhesives (2) of the present invention by utilizing the action of such a curing accelerator (E), a curing reaction hardly occurs in the volatilization process, and only in the curing process.
- the curing reaction can be easily controlled by causing the curing reaction.
- the curing accelerator (E) force that existed in a size that can be visually observed is a force that cannot be visually observed, or the temperature at which it dissolves in the adhesive layer. It is described as change temperature. Since the state change temperature of the curing accelerator (E) varies depending on the type of the curing accelerator (E), a curing accelerator (E) having a higher state changing temperature than the volatilization temperature may be selected.
- the state change temperature of (E) is preferably 100 to 160 ° C., particularly preferably 120 to 150.
- the state change temperature of the curing accelerator (E) is such that 95% by weight of varnish (W) is mixed with 5% by weight of curing accelerator (D), heated and visually observed.
- D Existence of curing accelerator (D) force Temperature that would not be visually observable, or 90% by weight of varnish (W), 10% by weight of curing accelerator (E), and DSC It is a temperature at which an endothermic peak appears when it is dissolved, as measured with a differential scanning calorimeter (DSC 220, manufactured by Seiko Instruments Inc., DSC 220).
- the curing reaction start temperature of the curing accelerator (E) is preferably 130 ° C. or higher, more preferably 140 ° C. or higher.
- the curing reaction start temperature is The liquid resin composition for adhesive was measured with a DSC (Differential Scanning Calorimeter, Seiko Instruments Co., Ltd., DSC 2 20) at a heating rate of 7 ° CZ and the line connecting the bottoms of the reaction peaks was measured. It is the starting temperature.
- the viscosity of the liquid resin composition for adhesives (1) and (2) of the present invention is 10 to 600 Pa ⁇ s, preferably 20 to 300 Pa ⁇ s, more preferably 30 to 200 Pa. ⁇ S.
- the viscosity of the liquid resin composition is a value measured at 25 ° C. and 2.5 rpm by using an E-type viscometer (manufactured by Toyo Sangyo Co., Ltd., 3 ° cone).
- the liquid resin composition for adhesives (1) and (2) of the present invention can further contain a filler.
- a filler organic fillers such as silicone and urethane particles and inorganic fillers such as silica and calcium carbonate are used to improve printability.
- any material can be used as long as it functions as a viscosity adjusting material for maintaining the shape of the printed matter and suppressing movement to a place other than the opening portion of the mask.
- the liquid resin composition for adhesives (1) and (2) of the present invention may further contain a coupling agent, a leveling agent, an antifoaming agent, a surfactant and the like as necessary.
- the liquid resin composition for adhesives (1) and (2) of the present invention is excellent in continuous printability at the time of printing and has good semiconductor element mounting property after solvent volatilization, but is not sticky at room temperature. This is a liquid resin composition for adhesives.
- the liquid resin composition for adhesives (1) and (2) of the present invention is printed on a support substrate on which a semiconductor element is mounted.
- the support substrate is a printed circuit board such as a lead frame, an organic substrate, or a flexible substrate.
- a semiconductor element is mounted on the support substrate and electrically connected by a gold wire.
- it may be the semiconductor element itself or other things.
- As a printing method of the liquid resin composition for adhesive, screen printing, stencil printing, and the like are possible, but from the viewpoint of surface smoothness, it is preferably applied by a stencil printing method using a stencil mask.
- the stencil printing method can be performed by a known method.
- the supporting substrate on which the liquid resin composition for adhesive is printed is heated in an oven or a hot platen to perform a volatilization process for volatilizing the solvent (A).
- the adhesive layer obtained by volatilizing the solvent in the volatilization process contains a large amount of volatile components, it may cause stickiness of the adhesive layer and void in the semiconductor element mounting process.
- the volatile content of the adhesive layer after the process is preferably 1% by weight or less.
- the temperature of the volatilization process may be in the range below the temperature at which the solvent evaporates and the state of the curing accelerator changes. However, from the viewpoint of productivity, etc., 80 ° or more is required to complete the process within 120 minutes. Is preferred. Further, in order to prevent warpage from occurring by exposing the support substrate before sealing to a high temperature, it is preferably 1550 ° C. or less, more preferably 120 ° C. or less.
- the volatile content of the adhesive layer after the volatilization process means a stencil mask with a thickness of 50 ⁇ m, a urethane squeegee with a length of 27 cm, a squeegee load of 2 kg, and a squeegee speed of 2 O m mZ s.
- a more preferred weight loss rate is 0.5% by weight or less, and particularly preferred is 0.1% by weight or less.
- the adhesive layer is preferably free from tack (stickiness) at room temperature. If there is stickiness, they stick to each other when the support substrates are placed on top of each other In addition, there is a risk of problems occurring in the support substrate pick-up process of the semiconductor device mounting apparatus. For this reason, the liquid resin composition for adhesive was printed on a support substrate using a 50 ⁇ thick stencil mask and a urethane squeegee with a length of 27 cm, a squeegee load of 2 kg, and a squeegee speed of 20 mm / s.
- the adhesive layer after heat treatment for 80 ⁇ 3 minutes in a dryer at 100 ° C ⁇ 5 ° C has a tack force at 25 ° C of not more than 0.05 N, which is an index of stickiness. It is preferable that it exists.
- Tack force was measured using a tuck force measuring machine (RHE S CA) Probe descending speed (I mmersion Speed) 30 mm / min, test speed 600 mm / min, contact load (P reload) 0.2 N Adhesion retention time (Press Time) 1.0 second, measured with probe 5.1 ⁇ (SUS 3 04).
- the thus obtained support substrate for mounting a semiconductor element with an adhesive layer is usually set on top of the die bonder, picked up (a process of taking the support substrate one by one from the top), and then carried onto the heater block.
- the semiconductor element is mounted in a heated state.
- picking up the support substrate it is necessary to peel off at the interface between the adhesive layer printed on the support substrate to be picked up and the back surface (back side) where the adhesive of the other support substrate is not printed.
- the adhesive layer has a tack force at 25 ° C greater than 0.05 N, the support substrate for mounting semiconductor elements with the adhesive layer will stick, and the support substrate cannot be picked up. There is a risk of problems such as two supporting substrates overlapping and part of the adhesive layer remaining on the back side of the supporting substrate.
- Support substrates for mounting semiconductor elements with adhesive layers are lead frames, organic substrates
- the liquid resin composition for adhesive is printed on the substrate and the solvent is volatilized.
- the second semiconductor element mounted on the lead frame, organic substrate, etc.
- the semiconductor element mounting temperature is preferably 150 ° C or lower, more preferably 1300 ° C or lower. Mounting semiconductor elements at high temperatures often causes warping. A load is applied in the semiconductor element mounting process, but the load is governed by the type of die bonder. Some models, such as some LOC (Lead On Chip) bonders, can apply a load of about 20 N per semiconductor element, but are usually performed with a load of about 3-5 N.
- the semiconductor elements can be mounted at 5 N or less, more preferably 1 to 4 N.
- the mounting time time during which the semiconductor element is pressed against the support
- the mounting time is preferably 10 seconds or less from the viewpoint of productivity, more preferably 3 seconds or less, and particularly preferably 1 second or less.
- a liquid resin composition for adhesive was used with a stencil mask with a thickness of 50 ⁇ m, a urethane squeegee with a length of 27 cm, a squeegee load of 2 kg, and a squeegee speed of 20
- the shear strength is measured by picking up semiconductor elements separated into 6 x 6 mm on a die bonder, bond weight 1.0 N, support substrate heating temperature 100 ° C, mounting time 8 seconds (support P BGA (P lastic B all G) under the condition of the temperature of the substrate surface rising to 100 ° C (including 7 seconds) rid Array) Board (Package size 3 5 X 3 5 mm, Core material: BT (Bismaleimide Triazine) resin, Solder resist: PS R4000 AUS 308 (manufactured by Taiyo Ink Manufacturing Co., Ltd.), thickness 56 mm ) Shear strength at 100 ° C of the sample mounted on). The shear strength was measured with a die shear tester (D age, series 4000).
- the adhesive layer After mounting the semiconductor element, the adhesive layer is hardened and electrical connection is made with a gold wire.
- the adhesive layer is cured at a temperature equal to or higher than the temperature change state of the curing accelerator. This temperature is preferably 200 or less, more preferably 180 ° C. or less, and particularly preferably 160 ° C. or less in consideration of the warp of the support substrate and the decomposition temperature of the adhesive layer.
- the viscosity of the obtained liquid resin composition A for adhesive was 45 Pa ⁇ s. Viscosity was measured at 25 ° C and 2.5 rpm using an E-type viscometer (manufactured by Toki Sangyo Co., Ltd., 3 ° cone). )
- 3-Glycidoxyprovir trimethoxysilane 0.2 part by weight Curing accelerator of the following formula (9) (state change temperature 1 20 ° C, curing reaction start temperature 1 40 ° C) 0.2 part by weight Aerosil 20 OV ( DEGUS SA Co., Ltd.) 4.0 parts by weight Organic filler with an average particle size of 6 ⁇ (C-800, manufactured by Negami Kogyo Co., Ltd.)
- the viscosity of the obtained liquid resin composition for adhesives was 45 Pa ⁇ s. • Liquid resin composition C for adhesives
- 3-Glycidoxyprovir trimethyoxysilane 0.2 parts by weight Curing accelerator of the above formula (8) (state change temperature 140 ° C, curing reaction start temperature 1 60 ° C) 0.2 part by weight Aerosil 20 OV (DEGUS 4.0 parts by weight Organic filler with an average particle size of 6 ⁇ (C-800, manufactured by Negami Kogyo Co., Ltd.)
- the viscosity of the obtained liquid resin composition C for adhesive was 40 Pa ⁇ s.
- 3-Glycidoxyprovir trimethoxysilane 0.2 parts by weight Curing accelerator of the above formula (8) (state change temperature 140 ° C, curing reaction start temperature 1 60 ° C) 0.2 parts by weight Aerosil 200 V (DEGUS SA) 4. 0 parts by weight Organic filler with an average particle size of 6 m (C—800, manufactured by Negami Kogyo Co., Ltd.)
- 2,4-Diamino 1 _ [2, -Methylimidazolyl (1,)] 1-ethyl-S-triazine (state change temperature 80 ° C or less, curing reaction start temperature 100 ° C) 0.2 parts by weight OV (manufactured by DEGUS SA) 4.0 parts by weight Organic filler with an average particle size of 6 ⁇ (C-800, manufactured by Negami Kogyo Co., Ltd.)
- 3-Glycidoxyprovir trimethoxysilane 0.2 parts by weight Triphenylphosphine (state change temperature 80 ° C or less, curing reaction start temperature 120 ° C) 0.2 parts by weight Aerosil 20 OV ( DEGUS SA) 4.0 parts by weight Organic filler with an average particle size of 6 / zm (C—800, manufactured by Negami Kogyo Co., Ltd.)
- the viscosity of the obtained liquid resin composition J for adhesive was 40 Pa ⁇ s.
- the above liquid resin compositions A to J for adhesives are used as substrates for BOC (Board On Chip) type semiconductor devices, that is, BT (Bismaleimide Triazine) resin substrates (resist: PSR 400 0AUS 3 0 8 (Manufactured by Taiyo Ink Manufacturing Co., Ltd.), thickness 0.56 mm).
- the squeegee moving speed and squeegee load were adjusted so that the thickness of the stencil mask used was 50 / m and the printing thickness was 35 ⁇ ⁇ 5 after the solvent was volatilized.
- the liquid resin composition for adhesives is printed on a slide glass so as to have a thickness of 50 ⁇ m, and is heated at 100 ° C. for 80 minutes.
- the slide glass with an adhesive layer was obtained by volatilizing the solvent from the liquid resin composition for adhesive.
- the state change temperature was higher than 100 ° C and lower than 175 ° C, and the state change temperature was 1 75 ° C. Those exceeding C were designated as X (above volatilization temperature).
- the curing reaction start temperature was measured with DSC (Differential Scanning Calorimeter, Seiko Instruments Inc., DSC 220) at a heating rate of 7 ° C / min for liquid resin compositions A to J for adhesives. The measurement was performed at the temperature at which the line connecting the bottoms of the reaction peaks started.
- DSC Different Scanning Calorimeter, Seiko Instruments Inc., DSC 220
- Table 1 shows the measurement results. The amount is in parts by weight.
- Example 1 The following tests were conducted using a semiconductor support substrate with an adhesive layer and a slide glass with an adhesive layer, prepared using the above liquid resin composition A for adhesive.
- Volatile content was measured as the volatile content of the adhesive layer after the volatilization process.
- a volatilization process that is, 100 ° C
- probe lowering speed 30 mmZm in, test speed 6 0 OmmZm in, adhesion load (preceding load) with a tack force measuring machine (RHE S CA) 0 2 N, adhesion retention time (pressing time) 1. 0 sec, probe 5.1 mm ⁇ (S US 3 04 )
- liquid resin composition for adhesive is placed on the stencil mask used for printing. After printing twice in succession, the cycle of resting for 1 hour is left as it is for 1 cycle, and continuous printing is performed. Sex was evaluated. During this cycle, if the liquid resin composition for the adhesive dries and the printed material is drowned, it is judged as NG. Also, it is dried on the stencil mask and does not clog, but the thickness after evaporation of the solvent is 3 5 / im soil 5 NG when deviating from ⁇ m.
- the time during which the semiconductor element could be mounted was defined as the life of the adhesive layer.
- a simulated semiconductor wafer (P hase 8 manufactured by Hitachi UL SI) with a circuit surface side protected with polyimide resin (CRC-8880 manufactured by Sumitomo Bakelite Co., Ltd.)
- the semiconductor element prepared by cutting to X 5 mm was mounted on the surface of the polyimide resin side with the above adhesive layer (BOC (BOC (B It is mounted toward the adhesive layer of the BT resin substrate, which is an oard On Chip) type package), and is electrically connected with a gold wire.
- BOC BOC (B It is mounted toward the adhesive layer of the BT resin substrate, which is an oard On Chip) type package
- Comparative Examples 1 and 2 the solvent dries in the middle of continuous printing. As a result, the continuous printability was NG. In Comparative Example 35, when the solvent was volatilized, the curing progressed too much and the semiconductor element could not be mounted.
- the adhesive layer after solvent volatilization is not sticky at room temperature, and it is possible to provide a semiconductor support substrate with an adhesive layer that is excellent in continuous printability. Furthermore, by providing a semiconductor device using a semiconductor support substrate with an adhesive layer, productivity can be improved.
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- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Die Bonding (AREA)
- Epoxy Resins (AREA)
Abstract
Description
Claims
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CN200880100733.5A CN101765646B (zh) | 2007-07-31 | 2008-07-31 | 粘接剂用液体树脂组合物、半导体装置以及半导体装置的制造方法 |
JP2009525470A JP5585760B2 (ja) | 2007-07-31 | 2008-07-31 | 接着剤用液状樹脂組成物、半導体装置及び半導体装置の製造方法 |
KR1020107002160A KR101489021B1 (ko) | 2007-07-31 | 2008-07-31 | 접착제용 액상 수지 조성물, 반도체 장치 및 반도체 장치의 제조 방법 |
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KR (1) | KR101489021B1 (ja) |
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Cited By (2)
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WO2011068157A1 (ja) * | 2009-12-02 | 2011-06-09 | 三井金属鉱業株式会社 | 多層フレキシブルプリント配線板の接着層形成用の樹脂組成物、樹脂ワニス、樹脂付銅箔、多層フレキシブルプリント配線板製造用の樹脂付銅箔の製造方法及び多層フレキシブルプリント配線板 |
JP2013007001A (ja) * | 2011-06-27 | 2013-01-10 | Shin-Etsu Chemical Co Ltd | 接着剤組成物 |
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KR101627019B1 (ko) * | 2013-10-10 | 2016-06-03 | 제일모직주식회사 | 반도체 소자 밀봉용 에폭시수지 조성물 및 이를 사용하여 밀봉된 반도체 소자 |
JP7150560B2 (ja) * | 2017-12-28 | 2022-10-11 | 東京応化工業株式会社 | 硬化膜形成用組成物、及び硬化膜形成方法 |
KR102078371B1 (ko) * | 2018-09-21 | 2020-02-17 | 엘지전자 주식회사 | 이동 단말기 |
CN111378252A (zh) * | 2018-12-29 | 2020-07-07 | 太阳油墨(苏州)有限公司 | 树脂填充材料 |
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- 2008-07-31 JP JP2009525470A patent/JP5585760B2/ja active Active
- 2008-07-31 CN CN200880100733.5A patent/CN101765646B/zh not_active Expired - Fee Related
- 2008-07-31 WO PCT/JP2008/064167 patent/WO2009017253A1/ja active Application Filing
- 2008-07-31 TW TW102136950A patent/TWI491695B/zh active
- 2008-07-31 KR KR1020107002160A patent/KR101489021B1/ko active IP Right Grant
- 2008-07-31 TW TW97128969A patent/TWI443164B/zh not_active IP Right Cessation
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WO2011068157A1 (ja) * | 2009-12-02 | 2011-06-09 | 三井金属鉱業株式会社 | 多層フレキシブルプリント配線板の接着層形成用の樹脂組成物、樹脂ワニス、樹脂付銅箔、多層フレキシブルプリント配線板製造用の樹脂付銅箔の製造方法及び多層フレキシブルプリント配線板 |
CN102640576A (zh) * | 2009-12-02 | 2012-08-15 | 三井金属矿业株式会社 | 多层柔性印刷电路板的粘合层形成用的树脂组合物、树脂清漆、带树脂铜箔,多层柔性印刷电路板制造用的带树脂铜箔的制造方法以及多层柔性印刷电路板 |
JP5750049B2 (ja) * | 2009-12-02 | 2015-07-15 | 三井金属鉱業株式会社 | 多層フレキシブルプリント配線板の接着層形成用の樹脂組成物、樹脂ワニス、樹脂付銅箔、多層フレキシブルプリント配線板製造用の樹脂付銅箔の製造方法及び多層フレキシブルプリント配線板 |
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JP2013007001A (ja) * | 2011-06-27 | 2013-01-10 | Shin-Etsu Chemical Co Ltd | 接着剤組成物 |
Also Published As
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KR20100055396A (ko) | 2010-05-26 |
JP5585760B2 (ja) | 2014-09-10 |
TWI491695B (zh) | 2015-07-11 |
TW200918624A (en) | 2009-05-01 |
TWI443164B (zh) | 2014-07-01 |
TW201402747A (zh) | 2014-01-16 |
CN101765646B (zh) | 2015-03-04 |
JPWO2009017253A1 (ja) | 2010-10-28 |
KR101489021B1 (ko) | 2015-02-02 |
CN101765646A (zh) | 2010-06-30 |
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