WO2008117622A1 - 試験装置および電子デバイス - Google Patents

試験装置および電子デバイス Download PDF

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Publication number
WO2008117622A1
WO2008117622A1 PCT/JP2008/053566 JP2008053566W WO2008117622A1 WO 2008117622 A1 WO2008117622 A1 WO 2008117622A1 JP 2008053566 W JP2008053566 W JP 2008053566W WO 2008117622 A1 WO2008117622 A1 WO 2008117622A1
Authority
WO
WIPO (PCT)
Prior art keywords
timing
tester
device under
under test
delay
Prior art date
Application number
PCT/JP2008/053566
Other languages
English (en)
French (fr)
Inventor
Masaru Goishi
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2009506258A priority Critical patent/JP5171811B2/ja
Publication of WO2008117622A1 publication Critical patent/WO2008117622A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

　被試験デバイスを試験する試験装置であって、被試験デバイスに供給する試験信号の変化タイミングおよび被試験デバイスが出力する出力信号の取得タイミングの少なくとも１つのタイミングを定めるタイミングデータを出力するタイミングデータ出力部と、試験装置の基準クロックのパルスを指定された遅延データに応じた遅延量遅延させてタイミングに応じた変化点を有するタイミング信号を発生する可変遅延回路と、タイミングを設定する設定範囲が変更されたことに応じてタイミングデータが１単位変化した場合における遅延データの変化量を変更する範囲変更部と、を備える試験装置を提供する。
PCT/JP2008/053566 2007-03-23 2008-02-28 試験装置および電子デバイス WO2008117622A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009506258A JP5171811B2 (ja) 2007-03-23 2008-02-28 試験装置および電子デバイス

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/690,141 2007-03-23
US11/690,141 US7539592B2 (en) 2007-03-23 2007-03-23 Test apparatus and electronic device

Publications (1)

Publication Number Publication Date
WO2008117622A1 true WO2008117622A1 (ja) 2008-10-02

Family

ID=39775615

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/053566 WO2008117622A1 (ja) 2007-03-23 2008-02-28 試験装置および電子デバイス

Country Status (4)

Country Link
US (1) US7539592B2 (ja)
JP (1) JP5171811B2 (ja)
TW (1) TWI373628B (ja)
WO (1) WO2008117622A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI399551B (zh) * 2009-06-26 2013-06-21 Senao Networks Inc Burner device and burner method
TWI727478B (zh) * 2019-10-31 2021-05-11 瑞昱半導體股份有限公司 測試圖樣產生方法以及失效模型產生方法
CN112765928A (zh) * 2019-11-06 2021-05-07 瑞昱半导体股份有限公司 测试图样产生方法以及失效模型产生方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6147573A (ja) * 1984-08-13 1986-03-08 Advantest Corp タイミング発生装置
JPH08201483A (ja) * 1995-01-24 1996-08-09 Advantest Corp タイミング発生器
JP2003204252A (ja) * 2002-01-09 2003-07-18 Advantest Corp 遅延回路、及び試験装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5566188A (en) * 1995-03-29 1996-10-15 Teradyne, Inc. Low cost timing generator for automatic test equipment operating at high data rates
JPH11304888A (ja) * 1998-04-17 1999-11-05 Advantest Corp 半導体試験装置
US6791316B2 (en) * 2002-09-24 2004-09-14 Advantest Corp. High speed semiconductor test system using radially arranged pin cards
US7382117B2 (en) * 2005-06-17 2008-06-03 Advantest Corporation Delay circuit and test apparatus using delay element and buffer
US7228248B2 (en) * 2005-09-09 2007-06-05 Advantest Corporation Test apparatus, timing generator and program therefor
WO2007129386A1 (ja) * 2006-05-01 2007-11-15 Advantest Corporation 試験装置および試験方法
US7769558B2 (en) * 2006-07-10 2010-08-03 Asterion, Inc. Digital waveform generation and measurement in automated test equipment
US7574633B2 (en) * 2006-07-12 2009-08-11 Advantest Corporation Test apparatus, adjustment method and recording medium

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6147573A (ja) * 1984-08-13 1986-03-08 Advantest Corp タイミング発生装置
JPH08201483A (ja) * 1995-01-24 1996-08-09 Advantest Corp タイミング発生器
JP2003204252A (ja) * 2002-01-09 2003-07-18 Advantest Corp 遅延回路、及び試験装置

Also Published As

Publication number Publication date
US7539592B2 (en) 2009-05-26
TW200839273A (en) 2008-10-01
JP5171811B2 (ja) 2013-03-27
JPWO2008117622A1 (ja) 2010-07-15
US20080234965A1 (en) 2008-09-25
TWI373628B (en) 2012-10-01

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