TW200730852A - Testing device, adjusting device, adjusting method and adjusting program - Google Patents
Testing device, adjusting device, adjusting method and adjusting programInfo
- Publication number
- TW200730852A TW200730852A TW095147612A TW95147612A TW200730852A TW 200730852 A TW200730852 A TW 200730852A TW 095147612 A TW095147612 A TW 095147612A TW 95147612 A TW95147612 A TW 95147612A TW 200730852 A TW200730852 A TW 200730852A
- Authority
- TW
- Taiwan
- Prior art keywords
- signal input
- signal
- section
- adjusting
- output
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
In this invention, a testing device testing a tested device includes several signal input/output sections, which have respectively a signal output section and a signal input section. At first, as for each signal input/output section, it is adjusted so that the phase difference from the time when the signal output section outputs signals until that the signal input section inputs said signals is approximately equal to that of another signal input/output section. Then, in a state that several signal input/output sections are mutually connected, in order to let the signal outputted by the first signal output section be inputted by the second signal input section, the shift amount that should shift the signal input timing is detected, and in order to let the signal outputted by the second signal output section be inputted by the first signal input section, the shift amount that should shift the signal input timing is detected. Then, an adjustment is performed according to these shift amounts, so that the phases of the signal input/output of the first and the second signal input/output sections are approximately equal.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005365261 | 2005-12-19 | ||
JP2006284569 | 2006-10-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200730852A true TW200730852A (en) | 2007-08-16 |
TWI318301B TWI318301B (en) | 2009-12-11 |
Family
ID=38188519
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095147612A TWI318301B (en) | 2005-12-19 | 2006-12-19 | Testing device, adjusting device, adjusting method and record medium having recorded an adjusting program |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4948421B2 (en) |
TW (1) | TWI318301B (en) |
WO (1) | WO2007072738A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI400463B (en) * | 2009-06-29 | 2013-07-01 | Advantest Corp | A system for correcting a signal of a test device relating to a test piece of the test element and a correction method of the signal, and a computer program for causing the computer to function to correct the signal |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5023983B2 (en) * | 2007-11-14 | 2012-09-12 | 横河電機株式会社 | Semiconductor test equipment |
WO2009069209A1 (en) * | 2007-11-29 | 2009-06-04 | Advantest Corporation | Short-circuit wiring fixture, method for measuring skew, and method for adjusting skew |
JPWO2009150819A1 (en) * | 2008-06-10 | 2011-11-10 | 株式会社アドバンテスト | Test module, test apparatus and test method |
JPWO2010007770A1 (en) * | 2008-07-15 | 2012-01-05 | 株式会社アドバンテスト | Test equipment |
WO2010095167A1 (en) * | 2009-02-17 | 2010-08-26 | 株式会社アドバンテスト | Test apparatus, calibration method and program |
JP2011089857A (en) * | 2009-10-21 | 2011-05-06 | Advantest Corp | Testing device, adjustment method, board for calibration, adjusting device, and program |
TWI519806B (en) * | 2014-10-31 | 2016-02-01 | 致茂電子股份有限公司 | Calibration board and timing calibration method thereof |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09325174A (en) * | 1996-06-06 | 1997-12-16 | Matsushita Electron Corp | Semiconductor inspecting instrument |
JP3616247B2 (en) * | 1998-04-03 | 2005-02-02 | 株式会社アドバンテスト | Skew adjustment method in IC test apparatus and pseudo device used therefor |
DE10296904B4 (en) * | 2001-06-07 | 2010-09-09 | Advantest Corp. | Method for calibrating a semiconductor tester |
-
2006
- 2006-12-14 JP JP2007551059A patent/JP4948421B2/en not_active Expired - Fee Related
- 2006-12-14 WO PCT/JP2006/324971 patent/WO2007072738A1/en active Application Filing
- 2006-12-19 TW TW095147612A patent/TWI318301B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI400463B (en) * | 2009-06-29 | 2013-07-01 | Advantest Corp | A system for correcting a signal of a test device relating to a test piece of the test element and a correction method of the signal, and a computer program for causing the computer to function to correct the signal |
Also Published As
Publication number | Publication date |
---|---|
WO2007072738A1 (en) | 2007-06-28 |
TWI318301B (en) | 2009-12-11 |
JP4948421B2 (en) | 2012-06-06 |
JPWO2007072738A1 (en) | 2009-05-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |