TWI318301B - Testing device, adjusting device, adjusting method and record medium having recorded an adjusting program - Google Patents

Testing device, adjusting device, adjusting method and record medium having recorded an adjusting program

Info

Publication number
TWI318301B
TWI318301B TW095147612A TW95147612A TWI318301B TW I318301 B TWI318301 B TW I318301B TW 095147612 A TW095147612 A TW 095147612A TW 95147612 A TW95147612 A TW 95147612A TW I318301 B TWI318301 B TW I318301B
Authority
TW
Taiwan
Prior art keywords
adjusting
recorded
record medium
program
testing device
Prior art date
Application number
TW095147612A
Other languages
Chinese (zh)
Other versions
TW200730852A (en
Inventor
Yasuo Matsubara
Manabu Takasaki
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200730852A publication Critical patent/TW200730852A/en
Application granted granted Critical
Publication of TWI318301B publication Critical patent/TWI318301B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
TW095147612A 2005-12-19 2006-12-19 Testing device, adjusting device, adjusting method and record medium having recorded an adjusting program TWI318301B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005365261 2005-12-19
JP2006284569 2006-10-19

Publications (2)

Publication Number Publication Date
TW200730852A TW200730852A (en) 2007-08-16
TWI318301B true TWI318301B (en) 2009-12-11

Family

ID=38188519

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095147612A TWI318301B (en) 2005-12-19 2006-12-19 Testing device, adjusting device, adjusting method and record medium having recorded an adjusting program

Country Status (3)

Country Link
JP (1) JP4948421B2 (en)
TW (1) TWI318301B (en)
WO (1) WO2007072738A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5023983B2 (en) * 2007-11-14 2012-09-12 横河電機株式会社 Semiconductor test equipment
WO2009069209A1 (en) * 2007-11-29 2009-06-04 Advantest Corporation Short-circuit wiring fixture, method for measuring skew, and method for adjusting skew
CN102057288B (en) * 2008-06-10 2014-02-12 爱德万测试株式会社 Test module, test device, and test method
WO2010007770A1 (en) * 2008-07-15 2010-01-21 株式会社アドバンテスト Testing device
WO2010095167A1 (en) * 2009-02-17 2010-08-26 株式会社アドバンテスト Test apparatus, calibration method and program
KR101315499B1 (en) 2009-06-29 2013-10-07 가부시키가이샤 어드밴티스트 Test apparatus, method for correcting and program
JP2011089857A (en) * 2009-10-21 2011-05-06 Advantest Corp Testing device, adjustment method, board for calibration, adjusting device, and program
TWI519806B (en) 2014-10-31 2016-02-01 致茂電子股份有限公司 Calibration board and timing calibration method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09325174A (en) * 1996-06-06 1997-12-16 Matsushita Electron Corp Semiconductor inspecting instrument
JP3616247B2 (en) * 1998-04-03 2005-02-02 株式会社アドバンテスト Skew adjustment method in IC test apparatus and pseudo device used therefor
CN100573176C (en) * 2001-06-07 2009-12-23 株式会社艾德温特斯特 The calibration steps of semiconductor test instruments

Also Published As

Publication number Publication date
WO2007072738A1 (en) 2007-06-28
TW200730852A (en) 2007-08-16
JPWO2007072738A1 (en) 2009-05-28
JP4948421B2 (en) 2012-06-06

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees