WO2008105251A1 - ドライバ回路 - Google Patents
ドライバ回路 Download PDFInfo
- Publication number
- WO2008105251A1 WO2008105251A1 PCT/JP2008/052635 JP2008052635W WO2008105251A1 WO 2008105251 A1 WO2008105251 A1 WO 2008105251A1 JP 2008052635 W JP2008052635 W JP 2008052635W WO 2008105251 A1 WO2008105251 A1 WO 2008105251A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- signal
- inverted
- input
- output
- outputs
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
- H03K5/02—Shaping pulses by amplifying
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L25/00—Baseband systems
- H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L25/00—Baseband systems
- H04L25/02—Details ; arrangements for supplying electrical power along data transmission lines
- H04L25/03—Shaping networks in transmitter or receiver, e.g. adaptive shaping networks
- H04L25/03006—Arrangements for removing intersymbol interference
- H04L25/03343—Arrangements at the transmitter end
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Nonlinear Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Tests Of Electronic Circuits (AREA)
- Dc Digital Transmission (AREA)
- Manipulation Of Pulses (AREA)
- Logic Circuits (AREA)
Abstract
入力信号に応じた波形の出力信号を出力するドライバ回路10において、入力信号が入力され、入力信号と同一波形の信号を出力信号として出力するメインドライバ14と、入力信号が入力され、入力信号と同一波形の非反転信号と、入力信号を反転した波形の反転信号とからなる差動信号を出力するサブドライバ16と、抵抗28、30(34、36)及び可変容量コンデンサ32(38)により構成され、非反転信号を微分した信号を出力し、反転信号を微分した信号を出力する微分回路と、メインドライバ14の出力信号と非反転信号を微分した信号とを加算した高域強調信号又はメインドライバ14の出力信号と反転信号を微分した信号とを加算した低域強調信号を出力信号として出力する加算部26とを有している。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/583,450 US8115520B2 (en) | 2007-02-27 | 2009-08-20 | Driver circuit |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007047470A JP2008211620A (ja) | 2007-02-27 | 2007-02-27 | ドライバ回路 |
JP2007-047470 | 2007-02-27 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/583,450 Continuation US8115520B2 (en) | 2007-02-27 | 2009-08-20 | Driver circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008105251A1 true WO2008105251A1 (ja) | 2008-09-04 |
Family
ID=39721087
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/052635 WO2008105251A1 (ja) | 2007-02-27 | 2008-02-18 | ドライバ回路 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8115520B2 (ja) |
JP (1) | JP2008211620A (ja) |
KR (1) | KR20090115742A (ja) |
TW (1) | TW200842387A (ja) |
WO (1) | WO2008105251A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016136715A (ja) * | 2015-01-20 | 2016-07-28 | 株式会社東芝 | 波形整形フィルタ及び放射線検出装置 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5540479B2 (ja) * | 2008-08-26 | 2014-07-02 | 株式会社リコー | ドライバ回路 |
TWI399022B (zh) * | 2010-05-24 | 2013-06-11 | Powerforest Technology Corp | 外差雙斜率迴授控制電路及其控制方法與具此控制電路之電源供應系統 |
US8705601B2 (en) * | 2010-08-30 | 2014-04-22 | Tektronix, Inc. | Apparatus and method for varying inter symbol interference and bandwidth extension pre-emphasis on a high speed digital signal |
JP2012195885A (ja) * | 2011-03-17 | 2012-10-11 | Fujitsu Ltd | 信号整形回路 |
CN103036532B (zh) * | 2011-10-10 | 2016-10-12 | 神讯电脑(昆山)有限公司 | 低功率元件自动测试电路 |
US9148130B1 (en) * | 2012-05-10 | 2015-09-29 | Cadence Design Systems, Inc. | System and method for boosting a selective portion of a drive signal for chip-to-chip transmission |
JP6340799B2 (ja) * | 2014-01-21 | 2018-06-13 | 富士通株式会社 | エンファシス信号生成回路 |
JP5910707B2 (ja) * | 2014-11-26 | 2016-04-27 | 富士通株式会社 | 信号整形回路 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10190747A (ja) * | 1996-12-25 | 1998-07-21 | Advantest Corp | 信号伝送方式及び伝送線路駆動回路 |
JP2002544489A (ja) * | 1999-05-10 | 2002-12-24 | テラダイン・インコーポレーテッド | 伝送路損失補償を備えたドライバ |
JP2004172660A (ja) * | 2002-11-15 | 2004-06-17 | Nec Corp | イコライザ回路 |
JP2006345532A (ja) * | 2005-06-09 | 2006-12-21 | Agilent Technol Inc | 信号整形回路 |
WO2007049674A1 (ja) * | 2005-10-28 | 2007-05-03 | Advantest Corporation | ドライバ回路、試験装置及び調整方法 |
WO2007116765A1 (ja) * | 2006-03-30 | 2007-10-18 | Advantest Corporation | 試験装置および試験方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4430626A (en) * | 1979-11-28 | 1984-02-07 | Dbx, Inc. | Networks for the log domain |
US6956908B2 (en) * | 2001-08-30 | 2005-10-18 | Micron Technology, Inc. | Technique to simultaneously distribute clock signals and data on integrated circuits, interposers, and circuit boards |
WO2007096940A1 (ja) * | 2006-02-20 | 2007-08-30 | Fujitsu Limited | 半導体回路 |
JP2008219718A (ja) * | 2007-03-07 | 2008-09-18 | Advantest Corp | ドライバ回路 |
-
2007
- 2007-02-27 JP JP2007047470A patent/JP2008211620A/ja active Pending
-
2008
- 2008-02-18 WO PCT/JP2008/052635 patent/WO2008105251A1/ja active Application Filing
- 2008-02-18 KR KR1020097017788A patent/KR20090115742A/ko not_active Application Discontinuation
- 2008-02-21 TW TW097106116A patent/TW200842387A/zh not_active IP Right Cessation
-
2009
- 2009-08-20 US US12/583,450 patent/US8115520B2/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10190747A (ja) * | 1996-12-25 | 1998-07-21 | Advantest Corp | 信号伝送方式及び伝送線路駆動回路 |
JP2002544489A (ja) * | 1999-05-10 | 2002-12-24 | テラダイン・インコーポレーテッド | 伝送路損失補償を備えたドライバ |
JP2004172660A (ja) * | 2002-11-15 | 2004-06-17 | Nec Corp | イコライザ回路 |
JP2006345532A (ja) * | 2005-06-09 | 2006-12-21 | Agilent Technol Inc | 信号整形回路 |
WO2007049674A1 (ja) * | 2005-10-28 | 2007-05-03 | Advantest Corporation | ドライバ回路、試験装置及び調整方法 |
WO2007116765A1 (ja) * | 2006-03-30 | 2007-10-18 | Advantest Corporation | 試験装置および試験方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016136715A (ja) * | 2015-01-20 | 2016-07-28 | 株式会社東芝 | 波形整形フィルタ及び放射線検出装置 |
Also Published As
Publication number | Publication date |
---|---|
US20100060325A1 (en) | 2010-03-11 |
TW200842387A (en) | 2008-11-01 |
US8115520B2 (en) | 2012-02-14 |
JP2008211620A (ja) | 2008-09-11 |
TWI367342B (ja) | 2012-07-01 |
KR20090115742A (ko) | 2009-11-05 |
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