WO2008072696A1 - 固体撮像装置およびその製造方法 - Google Patents
固体撮像装置およびその製造方法 Download PDFInfo
- Publication number
- WO2008072696A1 WO2008072696A1 PCT/JP2007/074037 JP2007074037W WO2008072696A1 WO 2008072696 A1 WO2008072696 A1 WO 2008072696A1 JP 2007074037 W JP2007074037 W JP 2007074037W WO 2008072696 A1 WO2008072696 A1 WO 2008072696A1
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- WIPO (PCT)
- Prior art keywords
- solid
- state imaging
- imaging device
- opening
- manufacturing
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 28
- 239000007787 solid Substances 0.000 title abstract description 7
- 239000000758 substrate Substances 0.000 claims abstract description 41
- 229920005989 resin Polymers 0.000 claims abstract description 28
- 239000011347 resin Substances 0.000 claims abstract description 28
- 238000003384 imaging method Methods 0.000 claims description 119
- 238000000034 method Methods 0.000 claims description 40
- 238000007789 sealing Methods 0.000 claims description 23
- 238000000465 moulding Methods 0.000 claims description 7
- 230000006866 deterioration Effects 0.000 abstract 1
- 239000000565 sealant Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 8
- 206010027146 Melanoderma Diseases 0.000 description 7
- 230000007547 defect Effects 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 230000002093 peripheral effect Effects 0.000 description 5
- 239000000428 dust Substances 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 239000003365 glass fiber Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 239000010408 film Substances 0.000 description 3
- CNQCVBJFEGMYDW-UHFFFAOYSA-N lawrencium atom Chemical compound [Lr] CNQCVBJFEGMYDW-UHFFFAOYSA-N 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 238000007514 turning Methods 0.000 description 2
- 239000004954 Polyphthalamide Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920006375 polyphtalamide Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14618—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/51—Housings
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/57—Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Definitions
- the present invention relates to a solid-state imaging device and a method for manufacturing the same, and in particular, a small-sized solid-state imaging formed using a solid-state imaging device such as a surveillance camera, a medical camera, an in-vehicle camera, or an information communication terminal camera.
- the present invention relates to an apparatus and a manufacturing method thereof.
- a solid-state image pickup device is formed by forming components such as an LSI mounted with a lens, a solid-state image pickup device, a driving circuit thereof, a signal processing circuit, and the like in a casing, a substrate, a structure, or the like, and combining them. Composed.
- each element is mounted on a printed board made of glass fiber, epoxy resin, or the like.
- FIG. 4A is an external perspective view of a solid-state imaging device using a conventional flat printed board.
- Fig. 4 (b) is a cross-sectional view taken along line AA in Fig. 4 (a).
- the printed circuit board 101 on which the components constituting the solid-state imaging device 100 are mounted has a through opening 10la at the center.
- the printed circuit board 101 has a printed wiring pattern 110 formed on one side (hereinafter referred to as the back side) of the flat plate surface.
- a stepped portion 101b is provided on the inner wall of the opening end portion that opens to the other side (hereinafter referred to as the front surface side) where the printed wiring 110 is not formed among the opening end portions of the through opening 101a. It is inserted.
- the printed circuit board 101 has a solid-state image sensor 103 mounted on an opening surface on the back surface side where the printed wiring 110 is formed.
- a diaphragm member 104 for adjusting the amount of light entering the lens 102 is fitted into the through opening 101a so as to overlap the lens.
- the solid-state image sensor 103 is connected to the printed circuit board 101 via bumps 103a formed on the surface. It is connected to a printed wiring pattern 110 provided on the back side and is fixed to the printed circuit board 101 by being sealed with a sealing resin 107.
- the printed wiring pattern 110 of the printed circuit board 101 is electrically connected to a drive circuit, a signal processing circuit, and the like.
- FIGS. 5 and 6 show assembly process diagrams of the conventional solid-state imaging device.
- the printed circuit board 101 on which the printed wiring pattern 110 is formed is formed (FIG. 5A).
- the solid-state imaging element 103 is mounted on the printed wiring pattern 110 at a position where the printed wiring pattern 110 and the bump 103a are in contact with each other so that the solid-state imaging element 103 covers the through opening 101a (FIG. 5 ( b)).
- a sealing resin 107 is injected into the gap between the solid-state imaging device 103 and the printed circuit board 101 while irradiating light (FIG. 5 (c)). At this time, the sealing resin 107 is cured within a range where the irradiated light reaches. In FIG. 5 (c), 107a indicates the encapsulated resin cured portion cured by light irradiation.
- the printed circuit board 101 is inverted (FIG. 6 (a)). Then, the outer peripheral edge 102a of the lens 102 is placed on the step 101b of the printed circuit board 101, and the lens 102 is fitted into the through opening 101a (FIG. 6 (b)). Thereafter, a donut-shaped diaphragm member 104 is further fitted onto the lens (FIG. 6 (c)). After fitting the aperture member 104, an adhesive is applied in the vicinity of the boundary between the aperture member 104 and the printed circuit board 101, and the adhesive is cured to complete the assembly process of the solid-state imaging device 100.
- a flat print substrate made of an insulating material such as glass fiber or epoxy resin includes a lens, a solid-state imaging device, its drive circuit, a signal processing circuit, and the like.
- a solid-state imaging device equipped with various parts such as SI has been proposed.
- Patent Document 1 Japanese Patent Laid-Open No. 2001-245186
- the conventional flat printed circuit board 101 is made of glass fiber 'epoxy resin or the like, foreign matters such as dust' burrs are easily generated at the end of the through opening 101a and the inner wall 101c. It is.
- the solid-state imaging device having the above-described configuration has a structure in which the through-opening 101a of the printed circuit board 101 is blocked by being sandwiched from the front side and the back side by the lens 102 and the solid-state imaging element 103. Even after each member is mounted, the end of the through opening 101a and the inner wall 101c are exposed to the light receiving surface 103b of the solid-state imaging device.
- the solid printed circuit board is formed by die-molding a structural insulating polyphthalamide resin or the like. As a result, the edge of the through-opening c, the inner wall, and the like were clogged and immediately, the burr could cause a black spot image defect.
- the solid-state imaging device described above attaches the solid-state imaging device and the lens to the opening ends on the opposite sides, regardless of whether a flat printed board or a three-dimensional printed board is used. It is a configuration. For this reason, in the manufacturing process, after the process of mounting one of the solid-state imaging device and the lens is completed, a process of turning the substrate upside down is required before mounting the other, which makes the manufacturing process longer. Productivity was low.
- the present invention has been made in view of the above circumstances, and provides a solid-state imaging device and a method for manufacturing the same that prevent burrs from falling off the light-receiving surface causing black spot image defects and improve productivity.
- the purpose is to do.
- a solid-state imaging device of the present invention is a flat plate having a through opening, a stepped portion provided at an opening end of the through opening, and a wiring portion provided on the same plane as the stepped portion.
- Sealing that integrally seals the mounting region of the mounted translucent member and the solid-state imaging device It comprises the part.
- a solid-state imaging device including a flat substrate on which a solid-state imaging device and a lens are mounted, wherein the flat substrate has a through-opening and the light-receiving surface of the solid-state imaging device faces the solid-state imaging device And a step part for attaching a lens to the opening end of the through-opening on the opening surface side, and the solid-state imaging element attached to the wiring part and the step part.
- the lens is integrally sealed with resin.
- one side of the flat substrate (the side on which the wiring portion is formed) is not attached to the solid-state imaging device and the translucent member such as a lens that is sandwiched from both sides as in the prior art. ) Is mounted with a solid-state image sensor and a lens, and they are integrally sealed with resin. Therefore, the inner wall of the through-opening and the end on the light-receiving surface side of the through-opening can be Covered with resin and not exposed to the light-receiving surface of the solid-state imaging device. Therefore, it is possible to prevent foreign matters such as burrs and dusts that cause black spot image failure from dropping on the light receiving surface.
- the through-opening portion of the flat substrate has an end portion on the second surface side opposite to the first surface side on which the light receiving surface of the solid-state imaging element faces. And a diaphragm portion that adjusts the amount of light entering the light receiving surface.
- the amount of light entering the light-receiving surface is measured at an end of the flat plate substrate opposite to the opening surface side where the light-receiving surface of the solid-state imaging element faces.
- the throttle part to be adjusted is formed!
- the diaphragm portion includes an aperture formed integrally with the flat plate substrate.
- the diaphragm portion may include a member formed by a member different from the flat plate substrate.
- the aperture portion may be formed integrally with the flat plate substrate, or may be constituted by a separate member.
- the aperture portion may be formed integrally with the flat plate substrate, or may be constituted by a separate member.
- the translucent member of the solid-state imaging device of the present invention may have an infrared cut function or an antireflection function.
- the method for manufacturing a solid-state imaging device includes a through opening, a step provided at an opening end of the through opening, and a wiring provided on the same plane as the step.
- a flat substrate forming step of forming a flat wiring board having a portion, a translucent member attaching step of attaching the translucent member to the stepped portion, and the solid-state imaging device in the wiring portion A solid-state imaging device mounting step, and a resin sealing step of integrally sealing the solid-state imaging device mounted on the wiring portion and the mounting region of the translucent member mounted on the stepped portion. ,including.
- the translucent member such as a lens and the solid-state imaging device are mounted on the same surface side of the flat plate substrate. Therefore, in order to mount each member on the flat plate substrate, This can be done in a series of steps without reversing the front and back. In other words, it is possible to eliminate the inversion process. In addition, the process of adhering each member can be performed only once by resin sealing, and productivity is improved as compared with the conventional manufacturing method.
- the through opening is on the side opposite to the first surface side where the light-receiving surface of the solid-state imaging element faces.
- the step of forming the flat substrate includes a step of integrally forming the aperture portion.
- the step of molding the flat substrate includes a step of mounting a diaphragm portion formed of a separate member.
- FIG. L (a) Perspective view of appearance of solid-state imaging device according to Embodiment 1, (b) AA line cross-sectional view in FIG.
- FIG. 2 (a) A diagram illustrating a structure forming process of the solid-state imaging device according to the first embodiment, and (b) a lens (translucent member) mounting process of the solid-state imaging device according to the first embodiment. (C) The figure explaining the solid-state image sensor mounting
- FIG. 3A is a diagram for explaining a resin sealing process of the solid-state imaging device of the first embodiment
- FIG. 3B is a diagram for explaining a resin sealing process of the solid-state imaging device of the first embodiment
- FIG. c) A diagram for explaining a usage example of the solid-state imaging device according to the first embodiment.
- FIG. 4 (a) External perspective view of a conventional solid-state imaging device, (b) AA line cross-sectional view in FIG.
- FIG. 5 is a diagram illustrating an assembly process of a conventional solid-state imaging device
- FIG. 6 is a diagram for explaining the assembly process of a conventional solid-state imaging device
- FIG. 1A is an external perspective view of the solid-state imaging device according to the first embodiment.
- Fig. 1 (b) is a cross-sectional view taken along line AA in Fig. 1 (a).
- 2 and 3 are diagrams for explaining the assembly process of the solid-state imaging device according to the first embodiment.
- the solid-state imaging device is provided on one side of a flat plate substrate in which a solid-state imaging element and a translucent member such as a lens are not mounted in a conventional manner. Since the solid-state imaging device and the lens are mounted on the side where the wiring portion is formed and they are integrally sealed with resin, the inner wall of the through opening and the end of the through opening on the light receiving surface side are To prevent foreign matter such as burrs and dust, which is covered with the outer peripheral edge of the window and the sealing resin and not exposed to the light receiving surface of the solid-state image sensor, from causing black spot image defects, to fall on the light receiving surface It is a thing.
- the solid-state imaging device 10 of the first embodiment is provided on a flat printed board 11 as a translucent member.
- the lens 12 and the solid-state image sensor 13 are mounted.
- the A wiring portion 1lc including a terminal pattern for electrical connection with other components is formed on the back surface of the substrate 11! /.
- a stepped portion ib for mounting the lens 12 is formed on the back surface side where the wiring portion 11c is formed.
- the step portion l ib is formed in a size slightly wider than the outer shape of the lens 12 so that the lens 12 can be fitted.
- a diaphragm portion id that adjusts the amount of light entering the lens 12 is formed on the surface side of the through opening 11a. This throttle part l id is obtained by integral molding with the printed circuit board 11.
- the lens 12 is, for example, a convex lens whose central portion is thicker than the outer peripheral edge portion 12a, and guides light incident from the through opening 11a to the light receiving surface 13b of the solid-state imaging device 13. is there.
- the outer peripheral edge portion 12 a of the lens 12 is placed on the step portion l ib of the substrate 11.
- the lens 12 is formed by forming a material having an infrared ray removing function into a convex lens shape, and an antireflection film is applied to the surface by a coating method such as vacuum deposition.
- the solid-state imaging device 13 is a photoelectric conversion device that is integrated into a circuit using semiconductor manufacturing technology, and includes a photodiode that detects light and generates a charge, a charge transfer unit that carries the detected charge, and Are arranged, and are attached to and electrically connected to a part of the wiring portion 11c via the bump 13a.
- the lens 12 is mounted so as to close the through opening 11a.
- the solid-state imaging device 13 is mounted such that its light receiving surface 13b is separated from the lens 12 by a predetermined distance and covers the lens 12.
- the lens 12 and the solid-state image sensor 13 are integrally formed by a resin sealing body 14. In this way, the light receiving surface 13a of the solid-state imaging device 13 is arranged in a sealed space formed by the lens 12 and the resin sealing body 13.
- the light-receiving surface 13b of the solid-state imaging device 13 is not exposed on the inner wall surface of the through opening 11a. Can be prevented from falling off to the light receiving surface.
- the entire device can be made smaller and thinner than a solid-state imaging device using a conventional three-dimensional substrate.
- the optical filter is omitted, so the number of parts can be reduced.
- the translucent member includes a single lens, a single filter, an antireflection film, or a member having a plurality of functions such as a lens, a filter, and an antireflection film.
- a flat printed board 11 having a circular through-opening portion 11a penetrating from one surface to the other surface is formed near the center thereof.
- the material of the printed circuit board 11 is, for example, glass fiber “epoxy resin”.
- a through opening 11a is first formed on the printed board 11 by machining or the like, and a step portion 11b and a narrowed portion 11d are formed in the through opening 11a.
- a wiring portion 11c is formed on a back surface side of the substrate in a predetermined region of the printed circuit board 11 by a thin film process such as a plating process or a sputtering method. Then, as shown in FIG. 2 (a), the substrate 11 is placed with the surface provided with the wiring portion 11c facing upward. [0050] (Lens mounting process)
- the lens 12 is placed on the stepped portion ib so that the optical axis passes through the central portion of the lens 12.
- the outer peripheral edge portion 12a of the lens 12 is placed on the step portion l ib. In this state, the through opening 11a is closed by the lens 12.
- the solid-state imaging device 13 is mounted on the wiring portion 11c of the substrate 11 so that the optical axis passes through the center of the light receiving surface 13b of the solid-state imaging device 13. .
- a bump 13a is formed on the connection electrode of the solid-state imaging element 13, and is connected to a predetermined position of the wiring portion 11c by thermal compression.
- a sealing resin 14 is injected into the gap between the solid-state imaging device 13 and the printed board 11 while irradiating light (FIG. 3 (a)). At this time, the sealing resin 14 is cured within a range where the irradiated light reaches.
- 14a indicates a sealing resin cured portion cured by light irradiation. Further, thereafter, the sealing resin 14 is thermally cured, and the lens 12 and the solid-state imaging device 13 are integrally covered with the resin sealing body 14 (FIG. 3 (b)). In this way, the solid-state imaging device 10 of the first embodiment is manufactured.
- the solid-state imaging device 10 according to the first embodiment is reversed in direction as needed and incorporated in an electronic device or the like.
- the lens 12 and the solid-state imaging device 13 are arranged on the same surface side of the printed circuit board 11.
- the mounting of the member on the printed circuit board 11 can be performed in a series of steps without turning the printed circuit board 11 upside down. That is, the inversion process can be omitted.
- the step of bonding the respective members may be performed once by resin sealing. Since a solid-state imaging device and a translucent member such as a lens are mounted on one surface side of the flat substrate, a diaphragm portion can be formed on the other surface side. In addition, by forming the throttle portion in the structure forming step, the step of attaching the throttle member later can be omitted.
- the manufacturing method of the solid-state imaging device 10 of Embodiment 1 can omit the conventional reversing process and the process of fitting the aperture member, so that it is more effective than the conventional manufacturing method. Productivity is improved.
- the diaphragm portion id is described as being formed integrally with the printed circuit board 11, but the invention is not limited thereto, and the printed circuit board 11 and the diaphragm portion id are formed of separate members. It may be configured. When configuring as a separate member, it is not necessary to change the design of the entire printed circuit board 11 when changing the amount of light entering the light receiving surface 13b of the solid-state image sensor 13. Can be formed.
- the above-described solid-state imaging device is used as a camera in various optical devices such as a reading element such as a CD or a DVD, a reading element of a copying machine, a medical device, or a door phone, which is not limited to the optical communication field. Can be applied.
- the solid-state imaging device and the manufacturing method thereof according to the present invention are useful as a solid-state imaging device and a method for manufacturing the solid-state imaging device that prevent burrs from dropping onto the light-receiving surface, which cause black spot image defects, and improve productivity. .
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Signal Processing (AREA)
- Multimedia (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Studio Devices (AREA)
- Lens Barrels (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/374,971 US20100002107A1 (en) | 2006-12-13 | 2007-12-13 | Solid-state image pickup apparatus and manufacturing method thereof |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006335946A JP2008148222A (ja) | 2006-12-13 | 2006-12-13 | 固体撮像装置とその製造方法 |
JP2006-335946 | 2006-12-13 |
Publications (1)
Publication Number | Publication Date |
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WO2008072696A1 true WO2008072696A1 (ja) | 2008-06-19 |
Family
ID=39511712
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/JP2007/074037 WO2008072696A1 (ja) | 2006-12-13 | 2007-12-13 | 固体撮像装置およびその製造方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20100002107A1 (ja) |
JP (1) | JP2008148222A (ja) |
CN (1) | CN101518050A (ja) |
WO (1) | WO2008072696A1 (ja) |
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WO2011080952A1 (ja) * | 2009-12-28 | 2011-07-07 | 三洋電機株式会社 | 素子搭載用基板、半導体モジュール、カメラモジュールおよび素子搭載用基板の製造方法 |
JP5930263B2 (ja) * | 2011-02-18 | 2016-06-08 | ソニー株式会社 | 固体撮像装置 |
JP5794020B2 (ja) * | 2011-07-27 | 2015-10-14 | ソニー株式会社 | 固体撮像装置 |
US9142695B2 (en) | 2013-06-03 | 2015-09-22 | Optiz, Inc. | Sensor package with exposed sensor array and method of making same |
JP2015099262A (ja) * | 2013-11-19 | 2015-05-28 | ソニー株式会社 | 固体撮像装置およびカメラモジュール、並びに電子機器 |
CN105022511B (zh) * | 2014-04-17 | 2018-10-02 | 宸鸿光电科技股份有限公司 | 触控面板与具有该触控面板的触控装置 |
WO2017094777A1 (ja) * | 2015-12-02 | 2017-06-08 | マイクロモジュールテクノロジー株式会社 | 光学装置及び光学装置の製造方法 |
CN105721641B (zh) * | 2016-04-29 | 2019-04-12 | 信利光电股份有限公司 | 一种摄像模组及组装方法及电子设备 |
US10451863B2 (en) * | 2016-08-05 | 2019-10-22 | Verily Life Sciences Llc | Interposer for integration of multiple image sensors |
US9996725B2 (en) | 2016-11-03 | 2018-06-12 | Optiz, Inc. | Under screen sensor assembly |
JP7191373B2 (ja) * | 2018-11-16 | 2022-12-19 | マイクロモジュールテクノロジー株式会社 | 光学装置、分光センサモジュール、撮像モジュール、及び光学装置の製造方法 |
TWI753795B (zh) | 2021-02-09 | 2022-01-21 | 大立光電股份有限公司 | 成像鏡頭、相機模組與電子裝置 |
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JP3651577B2 (ja) * | 2000-02-23 | 2005-05-25 | 三菱電機株式会社 | 撮像装置 |
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2006
- 2006-12-13 JP JP2006335946A patent/JP2008148222A/ja not_active Withdrawn
-
2007
- 2007-12-13 CN CNA2007800339273A patent/CN101518050A/zh active Pending
- 2007-12-13 US US12/374,971 patent/US20100002107A1/en not_active Abandoned
- 2007-12-13 WO PCT/JP2007/074037 patent/WO2008072696A1/ja active Application Filing
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JP2001345391A (ja) * | 2000-03-28 | 2001-12-14 | Canon Inc | 電子部品及びその製造方法 |
JP2001333332A (ja) * | 2000-05-24 | 2001-11-30 | Matsushita Electric Works Ltd | 鏡筒及びこれを用いた撮像装置 |
JP2005051535A (ja) * | 2003-07-29 | 2005-02-24 | Mitsubishi Electric Corp | 撮像装置およびその製造方法 |
Also Published As
Publication number | Publication date |
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US20100002107A1 (en) | 2010-01-07 |
JP2008148222A (ja) | 2008-06-26 |
CN101518050A (zh) | 2009-08-26 |
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