WO2008050380A1 - Appareil de test de panneau d'affichage et procédé de test - Google Patents

Appareil de test de panneau d'affichage et procédé de test Download PDF

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Publication number
WO2008050380A1
WO2008050380A1 PCT/JP2006/321037 JP2006321037W WO2008050380A1 WO 2008050380 A1 WO2008050380 A1 WO 2008050380A1 JP 2006321037 W JP2006321037 W JP 2006321037W WO 2008050380 A1 WO2008050380 A1 WO 2008050380A1
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WO
WIPO (PCT)
Prior art keywords
anode
voltage
cathode
display panel
current
Prior art date
Application number
PCT/JP2006/321037
Other languages
English (en)
Japanese (ja)
Inventor
Masato Togashi
Keisuke Moriya
Original Assignee
Pioneer Corporation
Tohoku Pioneer Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Corporation, Tohoku Pioneer Corporation filed Critical Pioneer Corporation
Priority to PCT/JP2006/321037 priority Critical patent/WO2008050380A1/fr
Publication of WO2008050380A1 publication Critical patent/WO2008050380A1/fr

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/30—Driver circuits
    • H05B45/395—Linear regulators
    • H05B45/397—Current mirror circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/40—Details of LED load circuits
    • H05B45/44—Details of LED load circuits with an active control inside an LED matrix
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3216—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using a passive matrix
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
    • Y02B20/30—Semiconductor lamps, e.g. solid state lamps [SSL] light emitting diodes [LED] or organic LED [OLED]

Definitions

  • the present invention relates to a display panel inspection apparatus and inspection method using a capacitive element such as an organic EL (elect mouth luminescence) element as a display pixel.
  • a capacitive element such as an organic EL (elect mouth luminescence) element as a display pixel.
  • the organic EL element described above is basically a transparent electrode constituting an anode (anode) on a transparent substrate, a light emitting functional layer containing an organic compound, and a cathode (force sword), for example, a metal electrode.
  • this organic EL element can be electrically replaced with a light emitting element having a diode characteristic and a parasitic capacitance component coupled in parallel to the light emitting element, and the organic EL element is a capacitive light emitting element. Can do.
  • the organic layer functioning as a light emitting layer is laminated unevenly in the manufacturing process, or when a thin film such as a cathode electrode is laminated. In some cases, dot defects are generated by damaging the organic layer or by oxidizing the cathode electrode itself with impurities.
  • the above-described dot defects are electrically short-circuited.
  • the EL element in the defective state is connected to the anode line or the cathode line connected thereto.
  • an inspection process is performed to detect EL elements with dot defects.
  • each EL element is a matrix.
  • the scanning lines hereinafter also referred to as cathode lines
  • the drive lines hereinafter also referred to as anode lines
  • a defective EL element can be detected by applying a reverse bias voltage.
  • Patent Document 1 discloses a detection means for applying a reverse bias voltage to each EL element connected in a matrix.
  • Patent Document 1 Japanese Patent Laid-Open No. 2003-229262
  • an ammeter is connected to each of the scanning lines and to each of the drive lines, and each ammeter is monitored to detect defective elements. It tries to detect the exact position.
  • the position of the short-circuited element can be easily determined from the connection position of the ammeter on the drive line side where the predetermined current value is measured and the connection position of the ammeter on the scan line side where the predetermined current value is also measured. It is explained that can be known.
  • FIG. 1 illustrates the above-described problem.
  • Reference numeral 1 denotes a display panel, and a configuration other than the display panel 1 constitutes a display panel inspection apparatus.
  • display panel 1 m anode lines Al to Am are arranged in the vertical direction, and n cathode lines Kl to ⁇ are arranged in the horizontal direction, and at each intersecting portion (a total of m X n locations), Display elements (EL elements) E11 to Emn indicated by a parallel combination of diode and capacitor symbol marks constitute display panel 1.
  • the anode lines Al to Am in the display panel 1 are connected to an anode line drive circuit having a constant current source, and the cathode lines Kl to Kn have cathode line drive circuits. Connected.
  • the cathode line scanning circuit sequentially sets the cathode lines to be scanned to the scanning potential, and in synchronization with this, the anode line drive circuit selectively supplies a forward current to the anode lines Al to Am, thereby displaying the display.
  • the display elements arranged in panel 1 are controlled to be lit so that they can emit light continuously. In the inspection circuit shown in FIG.
  • each of the cathode side switches Skl to Skn is connected to each of the cathode lines Kl to ⁇ , and the cathode side switches Skl to Skn are connected to the display panel 1 described above.
  • the positive terminal of the power source E is connected to the other end via the current measuring means 2.
  • One end of each of the anode side switches Sal to Sam is connected to each anode line Al to Am of the display panel 1, and the other end of each of the anode side switches Sal to Sam is connected to the negative terminal of the power source E. RU
  • the power source E functions to apply a voltage having a reverse polarity to the forward voltage applied when the EL element in the display panel 1 is driven to emit light, that is, a reverse bias voltage.
  • the cathode side switch Sk3 and the anode side switch Sa3 are turned on, and the other cathode side All switches and anode switches are set to the off state.
  • a reverse bias voltage from the power source E is applied to the display element indicated by E33.
  • the current measuring means 2 does not detect the current value. Further, if the display element E33 is in a short circuit state, the current measuring means 2 detects a large current value and detects that this is a defect state.
  • the display element may cause a leakage phenomenon in which a current leaking in a reverse direction is slightly leaked in a completely short-circuited state.
  • a leak occurs in the display elements E13 and E32, a wraparound leak current flows through the display element E12 as indicated by the dashed arrow, and similarly the display element E33 is normal.
  • erroneous detection occurs as if the display element E33 is in a leak state.
  • each positive electrode corresponding to one cathode line is necessary for accurately grasping a defective element.
  • the inspection for detecting the current value for each polar line is repeated, and the inspection for detecting the current value for each anode line is similarly repeated by changing the cathode line.
  • each of the display elements has a parasitic capacitance. Therefore, when the reverse bias voltage is charged for each of the elements as described above, It is necessary to detect the value of the current flowing through the display element after a sufficient time to charge the parasitic capacitance.
  • the present invention has been made by paying attention to the above-mentioned problems, and it is possible to eliminate the standby time for charging the parasitic capacitance and to eliminate the occurrence of the sneak current as described above. It is an object of the present invention to provide an inspection apparatus and an inspection method capable of inspecting an element with high accuracy.
  • a display panel inspection apparatus which has been made to solve the above-mentioned problems, as described in claim 1, at each intersection position of a plurality of anode lines and a plurality of cathode lines intersecting each other.
  • a display panel inspection apparatus comprising: a display element connected between the anode line and the cathode line, wherein a display operation is performed when the anode line force forward current is passed through the display element.
  • an inspection power source that is electrically connected to the cathode line of the display panel and outputs an inspection voltage, and is electrically connected to all anode lines and negative lines of the display panel, and all the anode lines and Electrode for setting the potential of the cathode line and the measurement target cathode line and the potential setting means connected to the display element to be measured
  • It is characterized in that it includes a current measuring means that is selectively connected to Z or a measurement target anode line and measures a current flowing in the display element to be measured.
  • the display panel is inspected according to the present invention.
  • a display panel inspection method in which a display operation is performed by applying a forward current of the anode line force to an element, wherein an inspection voltage is applied to at least one of the cathode lines, and the potential of the cathode line is The electrode potential setting step for setting the potentials of all the anode lines and the cathode lines so as to have a relationship equal to or higher than the potentials of the anode lines, and the measurement target cathode lines and Z or measurement objects to which the display elements to be measured are connected
  • the method is characterized in that a current measuring step is performed which is selectively connected to a positive electrode and measures the current flowing through the display element to be measured.
  • FIG. 1 is a circuit configuration diagram showing an example of a conventional inspection apparatus together with a display panel.
  • FIG. 2 is a circuit configuration diagram showing a first embodiment of an inspection apparatus according to the present invention together with a display panel.
  • FIG. 3 is a circuit configuration diagram showing the second embodiment together with the display panel.
  • FIG. 4 is a circuit configuration diagram showing the third embodiment together with the display panel.
  • FIG. 5 is a circuit configuration diagram showing the fourth embodiment together with the display panel.
  • FIG. 6 is a circuit configuration diagram showing the fifth embodiment together with the display panel.
  • FIG. 7 is an explanatory view showing a defect state determination means performed in the inspection apparatus shown in FIG. 6.
  • FIG. 2 shows the first embodiment.
  • Reference numeral 1 denotes the display panel already described with reference to FIG. 1, and therefore the description thereof is omitted.
  • an inspection power source E1 for individually applying a reverse bias voltage to a display element (EL element) to be measured is provided, and a positive terminal of the inspection power source E1 One end of the current measuring means 2 is connected in series.
  • the other end of the current measuring means 2 is configured to be selectively connectable to the cathode lines Kl to Kn arranged on the display panel 1 through the switches Ski 1, Sk21, Sk31, ... Sknl.
  • the positive voltage of the inspection power source E1 acts so as to be applied alternatively to the cathode lines ⁇ 1 to ⁇ .
  • the negative terminal of the inspection power supply E1 is set to the ground potential.
  • the switches Sai l, Sa21, Sa 31, ... Saml force are respectively connected to the anode lines Al to Am arranged on the display panel 1, and these switches Sai l, Sa21, Sa31, ... • ••
  • the other end of Saml is connected to a measurement anode power source that can output a measurement anode voltage whose voltage value is lower than the positive voltage value of the inspection power source E1.
  • the measurement anode voltage is set to the ground potential.
  • the switches Sail, Sa21, Sa31,... Saml are selectively turned on, so that the measured anode voltage (grounding) with respect to any deviation of the anode lines Al to Am is detected. It works like an electric potential.
  • the cathode lines Kl to Kn arranged on the display panel 1 are further connected to switches Skl2, Sk22, Sk32,... Skn2, and via these switches, the positive voltage of the measurement power source E2 Is supplied to the cathode lines Kl to Kn.
  • the negative terminal of the non-measuring power source 2 is set to the ground potential.
  • the switches Ski 1, Sk21, Sk31, ... Sk nl connected to the cathode lines Kl to Kn and the switches Skl2, Sk22, Sk32, ... Skn2 are connected to each cathode line as shown in the figure. Accordingly, a pair is formed, and each switch constituting the pair is controlled so that one of them is turned on.
  • switches Sal2, Sa22, Sa32,... Sam2 are further connected to the anode lines Al to Am arranged in the display panel 1, and the non-measurement power source E2 is connected to these switches via these switches.
  • a positive voltage is configured to be supplied to the anode lines Al to Am.
  • the negative terminal of inspection power supply E1 and the negative terminal of non-measurement power supply E2 are both grounded, and the positive voltage value of inspection power supply E1 is The value of the positive voltage of the measuring power supply E2 is set to the relation, etc.!
  • the switch that forms a pair connected to the cathode lines Kl to Kn of the display panel 1 and the switch that forms a pair connected to the anode lines Al to Am each include a plurality of cathode lines.
  • a plurality of selection means for selectively setting a plurality of types of potentials for 1 to Kn and a plurality of anode lines A 1 to Am are configured.
  • the electrode potential setting means includes a plurality of selection means by each switch, the non-measurement power source E2, and the measurement anode power source (in this embodiment, the ground potential).
  • the current measuring means 2 is selectively connected to the measurement target cathode line and the measurement target anode line, to which the display element to be measured is connected, via the selection means, and the measurement is performed. It fulfills the function of measuring the current flowing through the target display element.
  • the state shown in FIG. 2 shows an example in which a display element indicated by E33 indicated by a circle in the display panel 1 is inspected as an example! That is, when the switch Sk31 is turned on, the positive voltage of the inspection power supply E1, that is, the inspection voltage is applied to the cathode line K3 corresponding to the display element to be measured. In this case, display elements other than the measurement target are connected.
  • Each of the switches Skl 1, Sk 21,... Sknl interposed between the non-measured cathode line and the inspection power supply El is put into a state of talent.
  • the switch Sa31 when the switch Sa31 is turned on to the anode line A3 corresponding to the display element to be measured, the measurement anode voltage (in this embodiment, the ground potential) from the measurement anode power source is set. Supplied. In this case, each of the switches Sal 1, Sa21,... Saml interposed between the non-measurement anode line connected to the display element other than the measurement object and the measurement anode power source is turned off.
  • a closed circuit including the inspection power source E1 and the current measuring means 2 is formed via the switch Sk31, the cathode line K3, the display element ⁇ 33 to be measured, the anode line A3, and the switch Sa31, and the display element A reverse bias voltage is applied to E33 by the inspection power supply E1 (electrode potential setting step).
  • the switch Sk32 interposed between the cathode line K3 corresponding to the display element E33 to be measured and the positive terminal of the non-measurement power supply E2 is turned off, and the display elements other than the measurement object are connected.
  • Each of the switches Ski 2, Sk22,... Skn2 interposed between the cathode line not measured and the positive terminal of the non-measuring power supply E2 is brought into a stale state.
  • the switch Sa32 interposed between the anode wire A3 corresponding to the display element E33 to be measured and the positive terminal of the non-measurement power supply E2 is turned off, and display elements other than the measurement object are connected.
  • Each switch Sal2, Sa22,... Sam2 interposed between the measured non-measurement anode wire and the positive terminal of the non-measuring power supply E2 is brought into a stale state.
  • the reverse bias voltage from the inspection power supply E1 is applied only to the display element E33 to be measured, and the potentials at both ends of the display element that is not to be measured become the same potential. For this reason, even if a display element that is not to be measured is short-circuited, no current flows through the display element, as described with reference to FIG. Almost no "current" occurs!
  • FIG. 3 shows a second embodiment of an inspection apparatus according to the present invention.
  • parts that perform the same functions as those shown in FIG. 2 are denoted by the same reference numerals, and therefore detailed description thereof is omitted.
  • the non-measurement power supply E2 shown in FIG. 2 is configured by an operational amplifier OP1. That is, the non-inverting input terminal of the operational amplifier OP1 is connected to the positive terminal of the inspection power supply E1, and the output terminal of the operational amplifier OP1 is connected to the inverting input terminal. That is, the operational amplifier OP1 functions as a buffer amplifier.
  • the output terminal of the operational amplifier OP1 performs the same function as the positive terminal of the non-measurement power supply E2 shown in FIG. 2, and the test voltage of the inspection power supply E 1 is connected to the output terminal of the operational amplifier OP 1.
  • the same voltage value will be produced.
  • FIG. 4 shows a third embodiment of an inspection apparatus according to the present invention.
  • parts that perform the same functions as those shown in FIG. 3 are denoted by the same reference numerals, and thus detailed description thereof is omitted.
  • the non-inverting input terminal of the operational amplifier OP1 is connected at the connection position between the current measuring means 2 and the switches Ski 1, Sk21, Sk31,. The rest is the same as the configuration shown in FIG.
  • the non-measurement voltage in which the voltage drop by the current measuring means 2 is compensated for the output voltage from the inspection power supply E1 can be output to the output terminal of the operational amplifier OP1. Also in the third embodiment shown in FIG. 4, it is possible to obtain the same effects as those in the embodiment shown in FIG.
  • FIG. 5 shows a fourth embodiment of an inspection apparatus according to the present invention.
  • parts that perform the same functions as those shown in FIG. 3 are denoted by the same reference numerals, and therefore detailed description thereof is omitted.
  • the inspection power source E 1 is replaced with the constant current source 3. ing.
  • the output terminal of the constant current source 3 is connected to the non-inverting input terminal of the operational amplifier OP1, so that the voltage value at the output terminal of the operational amplifier OP1 always matches the voltage value at the output terminal of the constant current source 3. Controlled.
  • voltage measuring means 4 is provided that can measure the voltage value across the constant current source 3 including the current measuring means 2 as necessary. Also in the fourth embodiment shown in FIG. 5, the same effects as those of the embodiment shown in FIG. 2 can be obtained.
  • FIG. 6 shows a fifth embodiment of the inspection apparatus according to the present invention, and reference numeral 1 denotes the display panel already described based on FIG. The explanation is omitted.
  • the output of the inspection power source E 1 can be applied to the cathode lines Kl to Kn arranged on the display panel 1 via the main switch SW.
  • a resistance element Rrl is connected in series to the main switch SW, and each switch Ski, Sk2, Sk3,... Having one end connected to the cathode lines Kl to Kn via the resistance element Rrl. ... Commonly connected to the other end of Skn.
  • Each switch Ski, Sk2, Sk3, ... Skn connected to each cathode line Kl to Kn acts so as to be turned on alternatively during the execution of the inspection, so that the positive voltage of the inspection power source E 1 is reduced to the cathode line Kl to Acts as an alternative to Kn.
  • each of the anode lines Al to Am arranged in the display panel 1 is connected to the switch Sal, Sa2, Sa3, ... 'Sam, and the other end is connected in common to the resistance element Rr2. It is connected to a measurement anode power source capable of outputting a measurement anode voltage having a voltage value lower than that of the inspection power source E1. In the embodiment shown in FIG. 6, the measurement anode voltage is set to the ground potential.
  • the switches Sal, Sa2, Sa3,... Sam connected to the anode lines Al to Am act so as to be selectively turned on when the inspection is performed. Acts so that pressure (ground potential) is applied alternatively to the anode wires Al to Am
  • the inspection power supply is provided on each of the cathode lines Kl to Kn.
  • the resistance element Rrl connected in series with El is equipped with a voltmeter that can measure the voltage at both ends of the resistance element Rrl. This is a cathode current that substantially measures the amount of current flowing through the resistance element Rrl.
  • the measuring means 7 is configured as follows.
  • a voltmeter capable of measuring the voltage at both ends of the resistance element Rr2 connected in series with the measurement anode power supply (ground potential) across the anode lines Al to Am. This constitutes a cathode current measuring means 8 that substantially measures the amount of current flowing through the resistance element Rr2.
  • resistance elements Rkl, Rk2, Rk3,... Rkn are connected between the inspection power source E1 and the cathode lines Kl to Kn, respectively, and the cathode lines Kl to The inspection voltage from the inspection power supply El is applied to ⁇ .
  • resistance elements Ral, Ra2, Ra3,... Ram are connected between the measurement anode power source (ground potential) and each of the anode lines Al to Am, and each anode is connected to each anode via these resistance elements. The voltage (ground potential) from the measurement anode power supply is applied to the wires Al to Am! Speak.
  • each switch Ski, Sk2, Sk3, ... Skn and each resistance element Rkl, Rk2, Rk3, ... Rkn each connected to the cathode lines Kl to Kn of the display panel 1, the display panel
  • Each of the switches Sal, Sa2, Sa3,... Sam and each of the resistance elements Ral, Ra2, Ra3,... Ram connected to one anode line Al to Am constitutes an electrode potential setting means.
  • the state shown in FIG. 6 shows an example in which a display element indicated by E33 indicated by a circle in the display panel 1 is inspected as an example! That is, the inspection voltage from the inspection power source E1 is applied to the cathode line K3 corresponding to the display element E33 to be measured by turning on the switch Sk3.
  • the switches Ski, Sk2,... Sknl interposed between the non-measuring cathode line to which the display element other than the measuring object is connected and the inspection power source E1 are turned off.
  • the switch Sa3 since the switch Sa3 is turned on to the anode line A3 corresponding to the display element E33 to be measured, the measurement anode voltage (ground potential) from the above-described measurement anode power source is supplied. .
  • each of the switches Sal, Sa2,... Saml interposed between the non-measuring anode line to which the display element other than the measuring object is connected and the measuring anode power source is turned off. Made.
  • measurement is performed with the inspection power source E1 via the cathode current measuring means 7, the switch Sk3, the cathode line K3, the display element ⁇ 33 to be measured, the anode line A3, the switch Sa3, and the anode current measuring means 8.
  • a closed circuit is formed with the anode power source, and a reverse noise voltage is applied to the display element E33 based on the potential difference between the inspection power source E1 and the measurement anode power source.
  • the voltage from the inspection power supply El is applied to all the cathode lines in the display panel 1 through the resistance elements Rkl, Rk 2, Rk3,.
  • a voltage from the measurement positive electrode power source is applied to the anode wire through the resistance elements Ral, Ra2, Ra3,.
  • the voltage value from the inspection power source E1 is set to a value V higher than the voltage value of the measurement anode power source, so that each display element in the display panel 1 has a forward direction. No current will flow. Therefore, almost no “sneak current” is generated through a defective element that is not measured, and the state of the display element E33 to be inspected is acquired by the cathode current measuring means 7 and the anode current measuring means 8. The current value can be verified with high accuracy.
  • the calculating means 9 has a force that causes the display panel 1 to be defective. It is configured to determine whether or not, and also determine the type of defect and the location of the defect.
  • FIG. 7 illustrates a defect state determination unit performed by the calculation unit 9 shown in FIG.
  • an inspection voltage (E1) is applied to each cathode line of a non-defective display panel, and the measured anode voltage is selectively applied to each anode line.
  • a statistically defined maximum value and minimum value when is applied is used. That is, the maximum value of the current flowing through each cathode line in a normal display panel is shown as IKmax, the minimum value is shown as IKmin, the maximum value of current flowing through each anode line is shown as IAmax, and the minimum value is shown as IAmin. Therefore, it is judged as bad when the value is out of the range.
  • the arithmetic means 9 shown in FIG. 6 has a No. 1 circuit according to the relationship between the current value flowing through the anode wire obtained by the anode current measuring means 8 and the current value flowing through the cathode wire obtained by the cathode current measuring means 7. As shown in 1 to 7, the determination is made according to the presence / absence of a defective display element, the location of the defective element, and the type of defect.
  • separation failure means a separation failure between adjacent electrodes, that is, a short state.
  • Dark line means that the electrode is disconnected (electrically open).
  • the current measuring means 2 is connected in series to the inspection power source E1, but this is connected to the inspection power source E1. It is also possible to adopt a configuration in which a resistance element is connected in series and the current value is obtained by measuring the voltage across the resistance element, that is, a configuration similar to the cathode current measuring means 7 shown in FIG.
  • the inspection apparatus and the inspection method have been described for a display panel using an organic EL element as a display element.
  • the present invention is not limited to a display panel using an organic EL element.
  • Other display panels having display elements having diode characteristics and capacitive properties can be targeted, and similar effects can be obtained.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

La présente invention concerne un appareil permettant de tester un panneau d'affichage (1) dans lequel les éléments d'affichage (E11-Emn) sont reliés dans une matrice à des intersections respectives d'une pluralité de lignes d'anode (A1-Am) et à une pluralité de lignes de cathode (K1-Kn). Une tension provenant d'une source d'alimentation de test (E1) est appliquée à la ligne de cathode reliée à un élément d'affichage à évaluer, tandis qu'une tension (potentiel de terre) provenant d'une source d'alimentation d'anode de détermination, qui est inférieure en valeur de tension à la source d'alimentation de test (E1), est appliquée à la ligne d'anode reliée à l'élément d'affichage à évaluer. Pendant ce temps, la tension d'une source d'alimentation de non-détermination (E2), qui a la même valeur de tension que la source d'alimentation de test (E1), est appliquée à chacune des lignes de cathode et d'anode qui ne sont pas connectées à l'élément d'affichage à évaluer. Dans la structure décrite jusqu'ici, la valeur d'un courant circulant de la source d'alimentation de test (E1) est déterminée par un moyen de détermination du courant (2), moyennant quoi l'état potentiellement défectueux de l'élément d'affichage à évaluer peut être examiné avec précision sans recevoir l'affection d'un 'courant parasite' via un élément défectueux qui n'est pas l'élément d'affichage à évaluer.
PCT/JP2006/321037 2006-10-23 2006-10-23 Appareil de test de panneau d'affichage et procédé de test WO2008050380A1 (fr)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2487994A3 (fr) * 2011-02-11 2013-11-20 Tai-Her Yang Dispositif DEL avec unité de limitation de tension et résistance de limitation de courant de dérivation
WO2016030081A1 (fr) * 2014-08-26 2016-03-03 Osram Oled Gmbh Procédé permettant d'identifier un court-circuit dans un premier élément diode électroluminescente, et module optoélectronique
WO2019219366A1 (fr) * 2018-05-18 2019-11-21 Arcelik Anonim Sirketi Configuration de circuit annulant une chute de tension inverse dans une diode électroluminescente (del)

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JP2002090408A (ja) * 2000-09-12 2002-03-27 Tdk Corp マトリクス検査方法及び装置
JP2003229262A (ja) * 2002-01-31 2003-08-15 Toyota Industries Corp 有機ｅｌ表示パネルの短絡画素検査方法及びその装置

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Publication number Priority date Publication date Assignee Title
JP2002090408A (ja) * 2000-09-12 2002-03-27 Tdk Corp マトリクス検査方法及び装置
JP2003229262A (ja) * 2002-01-31 2003-08-15 Toyota Industries Corp 有機ｅｌ表示パネルの短絡画素検査方法及びその装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2487994A3 (fr) * 2011-02-11 2013-11-20 Tai-Her Yang Dispositif DEL avec unité de limitation de tension et résistance de limitation de courant de dérivation
WO2016030081A1 (fr) * 2014-08-26 2016-03-03 Osram Oled Gmbh Procédé permettant d'identifier un court-circuit dans un premier élément diode électroluminescente, et module optoélectronique
US10578665B2 (en) 2014-08-26 2020-03-03 Osram Oled Gmbh Method for identifying a short circuit in a first light emitting diode element, and optoelectronic subassembly
WO2019219366A1 (fr) * 2018-05-18 2019-11-21 Arcelik Anonim Sirketi Configuration de circuit annulant une chute de tension inverse dans une diode électroluminescente (del)

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