WO2007044191A2 - High resolution and wide dynamic range integrator - Google Patents

High resolution and wide dynamic range integrator Download PDF

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Publication number
WO2007044191A2
WO2007044191A2 PCT/US2006/036786 US2006036786W WO2007044191A2 WO 2007044191 A2 WO2007044191 A2 WO 2007044191A2 US 2006036786 W US2006036786 W US 2006036786W WO 2007044191 A2 WO2007044191 A2 WO 2007044191A2
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output
integrator
signal
phase
input signal
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French (fr)
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WO2007044191A3 (en
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Sorin Davidovici
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RJS Tech Inc
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RJS Tech Inc
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Priority to CN200680042054.8A priority Critical patent/CN101512543B/zh
Priority to EP06836131A priority patent/EP1938584A4/en
Priority to JP2008532373A priority patent/JP4537483B2/ja
Publication of WO2007044191A2 publication Critical patent/WO2007044191A2/en
Anticipated expiration legal-status Critical
Publication of WO2007044191A3 publication Critical patent/WO2007044191A3/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/64—Analogue/digital converters with intermediate conversion to phase of sinusoidal or similar periodical signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/71—Circuitry for evaluating the brightness variation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/76—Circuitry for compensating brightness variation in the scene by influencing the image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/51—Control of the gain
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/53—Control of the integration time
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/571—Control of the dynamic range involving a non-linear response
    • H04N25/575—Control of the dynamic range involving a non-linear response with a response composed of multiple slopes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Definitions

  • This invention relates generally to the field of sensor devices and more particularly to an integration method and apparatus.
  • the integration function is a mathematical function that is well known in the art. Briefly, an integral is a mathematical object that can be interpreted as an area or a generalization of area. If a signal is plotted as a curve, the integral of the signal is the area under the curve.
  • An integrator is a device that integrates a signal present at its input and produces an integrated version of the input signal at its output.
  • FIG. 1 illustrates a signal source 100 and a signal processing chain that consists of integrator 110, analog to digital converter (ADC) 120 and DSP 130.
  • ADC analog to digital converter
  • DSP 130 digital signal processing steps
  • Signal source 100 generates a signal.
  • signal source 100 could be a sensor such as a strain gage, a fuel flow sensor, a light intensity sensor or any other type of device that generates a signal in response to external stimuli.
  • Signal source 100 is often, but not always, physically removed from the circuit assembly containing integrator 110, analog to digital converter (ADC) 120 and DSP 130.
  • ADC analog to digital converter
  • integrator 110 which integrates the signal V IN - Figure 2 illustrates the nature of the signal improvement.
  • Waveform 200 is the combination of a constant value signal generated by signal source 100 and additive noise that corrupts the constant value signal.
  • Waveform 210 is the integrator output generated in response to input signal waveform 200. It is readily observed that signal fluctuations caused by the additive noise are decreased by operation of the integrator, as illustrated by waveform 210.
  • the output of integrator 110, V O u ⁇ is input to ADC 120.
  • ADC 120 performs the analog to digital conversion function.
  • the analog to digital conversion function is well known in the art.
  • the analog signal V OUT present at ADC 120 input is converted into signal V D that can take one of a set of discrete levels.
  • Figure 3 illustrates two ADC 120 input signals, 300 and 310, and corresponding ADC 320 output levels.
  • Signals 300 and 310 are integrator 110 outputs in response to input signals of unequal power.
  • Signal 300 is an integrator 110 output in response to a higher power input signal.
  • Signal 310 is an integrator 110 output in response to a low power input signal.
  • Vertical bar 320 represents the ADC conversion characteristic.
  • An analog ADC 120 input signal value will be mapped into one of a finite set of discrete signal output values.
  • the horizontal tic marks on bar 320 illustrate the set of discrete ADC 120 output values.
  • ADC 120 is a five-bit device as illustrated here and it converts input signals into one of 32 discrete values. The discrete values span the range of 0 to 31 or 00000 to 11111 in binary representation. There are 32 corresponding tic marks on bar 320, each one corresponding to a specific analog voltage value.
  • Signal 310 reaches a value of approximately 0.5 volts and it is converted to digital value three which is a relatively low output code. of ADC 120.
  • An ADC input signal value that does not correspond exactly to one of the tick marks on bar 320 will be rounded-off to the value of the nearest tick-mark.
  • the conversion error introduced by the rounding-off process is represented as quantization noise.
  • the quantization error and associated quantization noise introduced by ADC is well known to one versed in the art.
  • the round-off errors are proportionally more significant for lower value signals and less significant for higher value signals.
  • Signal 300 will be affected less by quantization noise than signal 310.
  • the signal to quantization noise ratio of signal 300 will be higher than the signal to quantization noise ration of signal 310.
  • Signal to quantization noise ratio is a measure of signal degradation that negatively affects system performance.
  • the minimum acceptable signal to quantization noise ratio is a design parameter and for that reason the minimum number of levels or equivalently the minimum number of bits of ADC 120 is a system design requirement.
  • FIG. 4 Another kind of noise that degrades signal quality is additive thermal noise.
  • signal 520 is the input to the integrator due to signal #1 which has a constant value of 1.5 volts and signal 530 is the input to the integrator due to signal #2 which has a constant value of 1 volt.
  • Signal 500 is the integrator output due to input signal 520 and signal 510 is the
  • signal 560 is the input to integrator 110 due to signal #3 which has a constant value of 2.5 volts.
  • Signal 570 is the input to integrator 110 due to signal #4 which has a constant value of 1 volt.
  • Signal 540 is the integrator 110 output due to input signal 560.
  • Signal source 100 will generate a signal of sufficient maximum amplitude to insure that thermal noise effects are limited and do not significantly degrade system performance. This implies that at times the output of integrator 110 might be required to have a value larger than the available power supply voltage.
  • Figure 5 illustrates a simple integrator circuit.
  • the integrator input signal is generated by signal source 1000 and corrupted by noise source 1010.
  • the signal and noise are added by adder 1020.
  • This is a diagrammatic representation of signal and additive noise.
  • the electronic components intrinsically generate noise and the addition of noise to the signal occurs > through inductive and other effects intrinsic to the physical component and system design and layout.
  • Capacitor 1040 is a simple integrator. The input to the integrator is the output of adder 1020. Capacitor 1040 is reset by switch 1050 which is in the closed position prior to starting the integration process and resets the integrator. At the start of the integration process switch 1050 opens and the voltage across capacitor 1040 begins to change in response to the input signal originating from the output of adder 1020. At the end of the integration process switch 1030 closes and integrator output
  • FIG. 4 is an illustrative diagram. The implementation of other similar integrators with identical functionality is well known and obvious to one skilled in the art.
  • Integrator output 1060, Vou ⁇ 5 cannot in general exceed the upper limit imposed by the available power supply voltage. Power supply voltages are decreasing in state-of-the-art equipment due to stringent power consumption requirements.
  • the required output voltage range of integrator 110 and input voltage range of ADC 120 can be in excess of the available system power supply voltage. By way of example this can occur when the output range of signal generator 100 is close to or larger than the available system power supply voltage. When the required output voltage range of integrator 110 is in excess of the available system power supply voltage the integrator output enters into saturation. [0022] Integrator output saturation occurs when the output voltage reaches its maximum value, here the available power supply voltage, and is unable to further increase its value in response to the input signal stimulus. Signal saturation causes system performance degradation. This condition will cause saturation when using conventional integrators, a simplified version of which is illustrated in Figure 4. Solutions to this problem have been published.
  • an integration method includes the step of generating an integrated value of an input signal using a response provided by an oscillator coupled to the input signal. Because the integrated signal is generated using the oscillator's response, rather than the signal itself, a wider dynamic range of input voltages may be supported by the integrator; an integrator of the present invention can represent output values which are greater than the power supply of the sensor, because the saturation of the oscillator output cannot occur, hi addition, an integrator of the present invention can represent voltages at all ranges with increased resolution; as a result quantization errors are reduced and intensity levels of the signals may be more tightly compressed.
  • an integrator includes an input for receiving a signal, an oscillator coupled to the input and operable to provide a response in accordance with a value of the signal, and a mechanism for translating the response provided by the oscillator into an integrator result.
  • the novel approach disclosed herein implements accurate integrators that can accommodate output signal values far in excess of available power supply voltages and with very high accuracy and dynamic range.
  • Figure 1 is a block diagram illustrating several components that are typically included in a sensor device that includes an integrator
  • Figure 2 is a graph of a signal value and a corresponding integrated signal value, provided to illustrate the operation of an integrator
  • Figure 3 is a graph illustrating a pair of integrated signals over time, and a quantization scale and is used to describe quantization;
  • Figures 4A and 4B are graphs illustrating signals affected by thermal noise.
  • Figure 4A illustrates how the effects of thermal noise may cause confusion for signal intensity spacing of small amounts, while Figure 4B illustrates that a larger intensity of signal spacing reduces the chances of integrator output value confusion;
  • Figure 5 is a circuit diagram of a typical integrated circuit integrator;
  • Figures 6A-6D are graphs, each of which illustrate outputs of different types of oscillators;
  • Figure 7 A is a graph which illustrates an oscillator waveform that varies in frequency in response to an oscillator input illustrated in Figure 7B;
  • Figures 8A and 8B are respective graphs which are used to describe a phase unwrapping technique of the present invention;
  • Figures 9 A and 9B are graphs illustrating an oscillator phase, as determined using the unwrapping method of Figures 8A-8B, and a integrator output signal (9B), and is used to describe the signal integration capabilities of the present invention;
  • Figure 10 is a circuit diagram illustrating representative components that may be included in an integrator operating according to the principles of the present invention.
  • the present invention provides an integration method and integrator which uses a frequency response of an oscillator to integrate an input signal.
  • the present invention recognizes that a relationship exists between the voltage of the signal and the frequency of the oscillator output, and that the phases of the oscillator output can be correlated to the integrated signal value.
  • the correlation allows for integrated output values to be provided with a high degree of resolution, thereby overcoming the problems associated with quantization error, hi addition, because the integrator output value is based on oscillator phases, rather than on a simple voltage accuracy of the result is improved because saturation will not occur.
  • Oscillators are a class of circuits well known in the art.
  • the output of oscillator circuits can have a variety of shapes but they are all periodic, meaning that the output waveform is repetitive.
  • One repetition of the output waveform comprises one oscillation cycle and the duration of a cycle is defined as its period of oscillation.
  • the frequency of oscillation, f 0S c 3 is defined as the number of periods of oscillation per unit time and it is usually measured in Hertz (periods of oscillation per second).
  • the frequency of oscillation of electronic oscillator circuits can be fixed or variable.
  • a common oscillator with variable frequency of oscillation is the voltage-controlled oscillator (VCO).
  • VCO voltage-controlled oscillator
  • a VCO has a voltage input at which a signal voltage Sj n controls the frequency of oscillation.
  • Voltage relates to current through Ohm's law and a signal Sj n can also be said to control the frequency of oscillation through its current rather than voltage characteristic.
  • a VCO may also have a nominal frequency of oscillation f nom .
  • the VCO oscillates at f nom when the frequency control input Sj n level is not present or of a value that does not modify the nominal frequency of oscillation, such as for example zero volts.
  • the nominal frequency of oscillation can have any specified value including zero Hertz.
  • the output frequency of the VCO changes in response to amplitude variations of the input signal.
  • the instantaneous frequency of oscillation of the VCO will differ from the nominal frequency of oscillation of the VCO by some value f de i ta and will be given by
  • FIG. 7 A illustrates the input and output signals of a VCO.
  • the frequency of oscillation of the VCO output changes in response to variations in the input signal amplitude, as illustrated in Figure 7B.
  • the VCO output segment 700 corresponds to input signal segment 720.
  • the VCO output segment 710 corresponds to input signal segment 730.
  • the frequency of oscillation of VCO output segment 700 is lower than the frequency of oscillation of VCO output segment 710.
  • the amplitude of input signal segment 720 is lower than the amplitude of input signal segment 730. Therefore f ga i n has a positive value and the VCO frequency of oscillation is directly proportional to the input control signal amplitude.
  • a VCO may also have additional inputs, such as RESET/ENABLE.
  • RESET/ENABLE The function of RESET/ENABLE
  • RESET/ENABLE when in the RESET state is to reset the VCO output waveform to a predetermined voltage that can be any value within the peak-to-peak voltage range.
  • the function of RESET/ENABLE when in the ENABLE state is to enable the VCO output to oscillate.
  • a VCO has an output V ou t- During each period of oscillation V ou t traverses an angular phase of 2 ⁇ radians. This implies that the output phase is measurable modulo 2 ⁇ and oscillator output values at phases that are separated by exactly 2 ⁇ are identical.
  • Figure 6 illustrates several common VCO output waveforms. During a complete period each waveform in Figure 6 traverses exactly 2 ⁇ radians and waveforms values at phases that are separated by exactly 2 ⁇ are identical for all waveforms.
  • the phase traversed by the oscillator output during a subset of one period is determined by sampling the oscillator output at the two instances of time marking the beginning and end of the subset of one period, identifying the phase associated with each sample and subtracting the two phases.
  • the phase traversed by the oscillator output during a duration of time that spans more than one period of oscillation can only be determined modulo 2 ⁇ radians when using a method based on direct observation of the VCO output at two time instances.
  • the integration may take place over a period of time, herein referred to as the integration period, and according to one aspect of the invention, the number of phases that the oscillator signal traverses over the integration period is accumulated.
  • the present invention includes an additional function that counts the number of periods or significant fractions of a period traversed by the VCO output in order to resolve the ambiguity and provide a high resolution and dynamic range output signal.
  • a circuit that counts the number of periods or significant fractions of a period traversed by the VCO output in a time interval, or 'unwraps' the phase, can be readily implemented in many forms. Waveforms associated with such a circuit are illustrated in Figures 8A and 8B.
  • the transition times are labeled 930, 940 and 950 and they correspond to the VCO output states labeled 900, 910 and 920, respectively.
  • the phase unwrapping circuit correlates the respective number of periods of an oscillator output signal to an integrated output voltage.
  • the relationship between the VCO output and the output of the phase unwrapping circuit illustrated over one period of the VCO output can be extended over any number of VCO output periods with the output of the phase unwrapping circuit increasing in value by a predetermined amount each time the VCO output goes through its 0 and ⁇ (modulo 2 ⁇ ) phase values. It is obvious to one skilled in the art that there are alternative ways to implement the phase unwrapping function and mark the value of the unwrapped phase traversed by the VCO output, and the present invention is not limited by or to the particular method disclosed herein.
  • the total phase traversed by the VCO output is given by the summation of two terms.
  • the first term is the total unwrapped phase recorded by the phase unwrapping circuit.
  • the second term is the total phase traversed by the VCO output since the last update of the phase unwrapping circuit output. This quantity can be unambiguously obtained by direct measurement of the VCO output.
  • Figure 10 incorporates a simplified block diagram of the VCO subset of ICL8038 a commercially available IC provided by IntersilTM Corporation of Palm Bay, FL 32905. Additional phase unwrapping logic 835, total phase traversed logic 840 and VCO RESET/ENABLE functions 805 of the present invention are added.
  • Flip-flop 825 changes states when triggered by comparators 815 and 820. Comparator 815 is triggered when capacitor 845 reaches a predetermined high voltage. Comparator 820 is triggered when capacitor 845 reaches a predetermined low voltage. Thus the comparators control the shape and voltage of the oscillating output.
  • comparator 815 When comparator 815 is triggered, flip-flop 825 changes state such as to cause switch 865 to close. Current I 2 of current source 860 causes capacitor 845 to discharge thus causing the voltage across capacitor 845 to decrease. The decrease of the voltage across capacitor 845 immediately causes comparator 815 to change state.
  • comparator 820 When the voltage across capacitor 845 decreases to a sufficiently low value comparator 820 is triggered. When comparator 820 is triggered flip-flop 825 changes state such as to cause switch 865 to open. Current I 1 of current source 855 causes capacitor 845 to charge thus causing the voltage across capacitor 845 to increase. The increase of the voltage across capacitor 845 immediately causes comparator 820 to change state.
  • a constant current causes a linear change in the charge held by capacitor 845 as a function of time.
  • the linear change in the charge held by capacitor 845 as a function of time causes a linear change in voltage across capacitor 845 as a function of time.
  • the time required to charge and discharge capacitor 845 is determined by the magnitude of currents I 1 and I 2 generated by current sources 860 and 855.
  • the sum of the times required to charge and discharge capacitor 845 to voltage levels that trigger comparators 815 and 820 determine the period of oscillation of the VCO. Therefore the magnitudes of currents I 1 and I 2 determine the period and frequency of oscillation of the VCO.
  • the control signal applied at input 870 controls current sources 860 and 855 and therefore controls the VCO frequency of oscillation.
  • a simple voltage or current splitter known as well to one versed in the art can be added between the control signal applied at 870 and current sources 860 and 855 to adjust the waveform symmetry.
  • Counter 835 Reversal of the voltage across capacitor 845 is controlled by the state of flip-flop 825.
  • Counter 835 is triggered and modifies its output state correspondingly each time flip-flop 825 changes state.
  • the change in counter 835 output state can be a modified voltage level as shown in Figure 8B.
  • Other voltage level modification schemes can be used as long as separate states are resolvable.
  • Counter 835 output can also be of a digital format consisting of a digital word containing B bits. In such case a change in its output state can be a binary number where different states differ in one or more bits.
  • the output state of counter 835 changes each time flip-flop 825 changes states and therefore counts how many times the VCO output reached its minimum and maximum values. If the output state of counter 835 is an even number the output of the VCO traversed an integer multiple of 2 ⁇ radians. The number of 2 ⁇ radians traversed by the VCO output is then given by dividing the output count of counter 835 by two.
  • the output state of counter 835 is an odd number the number of 2 ⁇ radians traversed by the output of the VCO has an integer and a fractional part.
  • the integer part of the number of 2 ⁇ radians traversed by the output of the VCO is given by dividing by two a number obtained by subtracting one from the output state of counter 835.
  • the fractional part of the number of 2 ⁇ radians traversed by the output of the VCO depends on the degree of asymmetry between the rising and falling segments of the waveform and can be readily obtained by one skilled in the art. By way of example if the rising segment of the waveform takes twice as long as the falling segment of the waveform than then it requires 2/3 of a period of oscillation to complete.
  • the voltage across capacitor 845 is proportional to the phase traversed by the VCO output following the last change in state of flip-flop 825. It can be readily obtained by one skilled in the art if a) the trigger voltages of comparators 815 and 820 (i.e., the maximum and minimum voltages of the VCO output) and b) the asymmetry between the rising and falling segments of the VCO output waveform are known. By way of example consider that if a) the VCO output voltage is halfway between the minimum and maximum value on the rising segment of the waveform and b) the rising segment of the waveform takes twice as long as the falling segment of the waveform then the waveform measurement is at 1/3 of a period of oscillation.
  • the total phase traversed by the output of the VCO is obtained by summing the phase traversed by the VCO output as recorded by the voltage to phase converter 840 and by counter and phase converter 835. This function is performed by summer 880 and made available at output 890.
  • Switch 850 resets capacitor 845 and therefore the VCO oscillator output to an initial voltage output by voltage source 810.
  • Flip-flop 825 is reset by signal 895.
  • the initial voltage of voltage source 810 together with the reset state of flip-flop 825 and the degree of asymmetry between the rising and falling segments of the VCO output waveform are sufficient to determine the initial phase of the VCO output waveform. This derivation is well known to one versed in the art.
  • Phase and frequency have a differential relationship.
  • K is a constant that is a function of the constant value f nom and ⁇ T (the integration tine) and is therefore well known.
  • the second term consists of a constant value multiplier f ga i n and the term I Sj n dt which is the integral of the input signal Sj n .
  • Sj n is comprised of two constant value segments, the first segments labeled 720 in Figure 7B being lower in value than the second segments, labeled 730 in Figure 7B.
  • Integrator output segment 620 is the integral output as a function of time of Sj n when the lower value Sj n segment 720 was input to the integrator.
  • Integrator output segment 630 is the integral output as a function of time of Sj n when the higher value Sj n segment 730 was input to the integrator.
  • the phase accumulation rate is the integral of the phase traversed by the VCO as a function of time and can be expressed in units of radians.
  • the velocity with which the VCO traverses a unit of phase is the frequency of oscillation and can be expressed in units of radians per second.
  • the VCO control signal input waveform segment 720 causes the VCO to output waveform segment 700.
  • the plot of the VCO output phase as a function of time generates the curve segment 600.
  • the VCO control signal input waveform segment 730 causes the VCO to output waveform segment 710.
  • the plot of the VCO output phase as a function of time generates the curve segment 610.
  • the time domain integral of the input signal Sj n is therefore functionally equivalent to the phase domain integral of the input signal Sj n .
  • the time domain integral of the input signal Sj n and the phase domain integral of the input signal Sj n are related through two constants, one of which may equal zero.
  • phase measurement based integration measures the phase traversed by the oscillator output ⁇ during integration time ⁇ T.
  • the phase traversed by the oscillator output ⁇ during integration time ⁇ T is proportional to the integral of the input control signal during integration time ⁇ T and the two are proportional.
  • the minimum ⁇ value occurs for the smallest integral output.
  • f ga i n - J s in dt ⁇ - K where K is a constant.
  • ⁇ - K can be independently set to a specific value for any given value of J Sj n dt, including its minimum, by simply adjusting the VCO gain f ga i n -
  • the ability to set the gain of the integrator and hence the minimum value of the measured integrator output variable eliminates the quantization noise issue associated with conventional integrators.
  • variable oscillator circuits are common and fundamental building blocks of a wide variety of systems. Therefore they are widely available and have been highly optimized.
  • oscillator based integrators are far superior to conventional integrators in quantization noise and dynamic range or lack of output saturation. Other advantages exist and are apparent to one versed in the art.

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PCT/US2006/036786 2005-09-21 2006-09-21 High resolution and wide dynamic range integrator Ceased WO2007044191A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN200680042054.8A CN101512543B (zh) 2005-09-21 2006-09-21 高分辨率和宽动态范围的积分仪
EP06836131A EP1938584A4 (en) 2005-09-21 2006-09-21 INTEGRATOR WITH HIGH RESOLUTION AND FURTHER DYNAMIC RANGE
JP2008532373A JP4537483B2 (ja) 2005-09-21 2006-09-21 高分解能および広ダイナミックレンジ積分器

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US71930405P 2005-09-21 2005-09-21
US60/719,304 2005-09-21
US60/719,306 2005-09-21
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US72789705P 2005-10-18 2005-10-18
US60/727,897 2005-10-18

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009509475A (ja) * 2005-09-21 2009-03-05 アール・ジェイ・エス・テクノロジー・インコーポレイテッド 高ダイナミックレンジ感度センサ素子またはアレイのためのシステムおよび方法
US8153954B2 (en) 2008-08-08 2012-04-10 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and electronic device having the same

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007036973A1 (de) 2007-02-24 2008-09-04 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Pixelzelle, Verfahren zum Betreiben einer Pixelzelle, Verfahren zum Bestimmen einer Position eines Maximums einer Hüllkurve eines analogen amplituden-modulierten Signals, Vorrichtung zum Bestimmen einer Ladungsmenge, Vorrichtung und Verfahren zum Bestimmen einer Ladungsmenge auf einem kapazitiven Element, Vorrichtung und Verfahren und Setzen eines Schaltungsknotens auf eine vorbestimmte Spannung, Vorrichtung und Verfahren zum ladungsbasierten analog-/digital-Wandeln und Vorrichtung und Verfahren zur ladungsbasierten Signalverarbeitung
KR101733755B1 (ko) * 2010-01-15 2017-05-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기
WO2012093387A2 (en) * 2011-01-09 2012-07-12 Emza Visual Sense Ltd. Pixel design with temporal analysis capabilities for scene interpretation
US10197501B2 (en) 2011-12-12 2019-02-05 Kla-Tencor Corporation Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors
EP2815393B1 (en) 2012-02-14 2023-04-05 Gentex Corporation High dynamic range imager system
JP6041500B2 (ja) * 2012-03-01 2016-12-07 キヤノン株式会社 撮像装置、撮像システム、撮像装置の駆動方法、撮像システムの駆動方法
WO2013137907A1 (en) * 2012-03-16 2013-09-19 Empire Technology Development Llc Low light adaptive imaging device
KR101895415B1 (ko) 2012-03-27 2018-09-06 삼성전자주식회사 아날로그-디지털 변환 회로와 이를 포함하는 적산 회로
US9496425B2 (en) 2012-04-10 2016-11-15 Kla-Tencor Corporation Back-illuminated sensor with boron layer
US9601299B2 (en) 2012-08-03 2017-03-21 Kla-Tencor Corporation Photocathode including silicon substrate with boron layer
US9426400B2 (en) 2012-12-10 2016-08-23 Kla-Tencor Corporation Method and apparatus for high speed acquisition of moving images using pulsed illumination
US9478402B2 (en) 2013-04-01 2016-10-25 Kla-Tencor Corporation Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensor
US9347890B2 (en) * 2013-12-19 2016-05-24 Kla-Tencor Corporation Low-noise sensor and an inspection system using a low-noise sensor
US9748294B2 (en) 2014-01-10 2017-08-29 Hamamatsu Photonics K.K. Anti-reflection layer for back-illuminated sensor
US9410901B2 (en) 2014-03-17 2016-08-09 Kla-Tencor Corporation Image sensor, an inspection system and a method of inspecting an article
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US10462391B2 (en) 2015-08-14 2019-10-29 Kla-Tencor Corporation Dark-field inspection using a low-noise sensor
US10778925B2 (en) 2016-04-06 2020-09-15 Kla-Tencor Corporation Multiple column per channel CCD sensor architecture for inspection and metrology
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TWI611282B (zh) * 2017-01-03 2018-01-11 友達光電股份有限公司 電源供應電路及電源供應方法
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US11848350B2 (en) 2020-04-08 2023-12-19 Kla Corporation Back-illuminated sensor and a method of manufacturing a sensor using a silicon on insulator wafer
TWI840098B (zh) * 2022-04-11 2024-04-21 義明科技股份有限公司 高感度的光感測器及其感測方法
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CN120445398B (zh) * 2025-07-02 2025-09-26 南京大学 基于复合介质栅双晶体管光敏探测器的感算一体方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6407610B2 (en) 1999-12-30 2002-06-18 Stmicroelectronics S.R.L. Circuit and a method for extending the output voltage range of an integrator circuit
US20020176067A1 (en) 2001-05-23 2002-11-28 Canesta, Inc. Method and system to enhance dynamic range conversion useable with CMOS three-dimensional imaging
US6794922B2 (en) 2001-02-20 2004-09-21 Teac Corporation Signal processing circuit integrating pulse widths of an input pulse signal according to polarities

Family Cites Families (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US682145A (en) * 1901-04-23 1901-09-03 William J Jones Apparatus for carbonating liquids.
US4352210A (en) * 1980-09-12 1982-09-28 General Electric Company Linear mixer with reduced spurious responses
JPS5795771A (en) * 1980-12-05 1982-06-14 Fuji Photo Film Co Ltd Solid-state image pickup device
US4419692A (en) 1981-12-31 1983-12-06 Texas Medical Instruments, Inc. High speed infrared imaging system
US4629879A (en) * 1984-06-11 1986-12-16 Eastman Kodak Company Light beam intensity controlling apparatus
JPS6313520A (ja) * 1986-07-04 1988-01-20 Sony Corp Ad変換回路
US4825144A (en) 1987-11-10 1989-04-25 Motorola, Inc. Dual channel current mode switching regulator
JP2720478B2 (ja) * 1988-10-18 1998-03-04 株式会社ニコン 縦型オーバーフロードレインを備える固体撮像素子を用いた測光装置
US5416616A (en) * 1990-04-06 1995-05-16 University Of Southern California Incoherent/coherent readout of double angularly multiplexed volume holographic optical elements
KR100396203B1 (ko) * 1993-06-17 2003-12-31 소니 가부시끼 가이샤 노광장치및방법,그노광장치를가지는비디오카메라
US5461426A (en) 1993-08-20 1995-10-24 Samsung Electronics Co., Ltd. Apparatus for processing modified NTSC television signals, with digital signals buried therewithin
KR0168451B1 (ko) 1994-03-31 1999-01-15 다까노 야스아끼 컬러 고체 촬상 소자
DE4423214C2 (de) * 1994-07-01 1998-02-12 Harris Corp Multinorm-Dekoder für Videosignale und Verfahren zum Dekodieren von Videosignalen
JPH1022489A (ja) * 1996-07-02 1998-01-23 Fuji Xerox Co Ltd 固体撮像素子
CN1105449C (zh) * 1996-09-27 2003-04-09 马库斯·伯姆 局部自适应光学传感器
US5794922A (en) * 1996-12-13 1998-08-18 Meglino; Don A. Fence slats with locking portions
US5796392A (en) * 1997-02-24 1998-08-18 Paradise Electronics, Inc. Method and apparatus for clock recovery in a digital display unit
JP3697678B2 (ja) * 1997-05-09 2005-09-21 ローム株式会社 V/f変換回路
US6615241B1 (en) * 1997-07-18 2003-09-02 Net Exchange, Llc Correspondent-centric management email system uses message-correspondent relationship data table for automatically linking a single stored message with its correspondents
US6229133B1 (en) * 1997-10-27 2001-05-08 Texas Instruments Incorporated Image sensing device with delayed phase frequency modulation
US6452633B1 (en) * 1998-02-26 2002-09-17 Foveon, Inc. Exposure control in electronic cameras by detecting overflow from active pixels
US6529241B1 (en) * 1998-02-27 2003-03-04 Intel Corporation Photodetecting device supporting saturation detection and electronic shutter
US20020176009A1 (en) 1998-05-08 2002-11-28 Johnson Sandra Marie Image processor circuits, systems, and methods
US6188056B1 (en) 1998-06-24 2001-02-13 Stmicroelectronics, Inc. Solid state optical imaging pixel with resistive load
US6396561B1 (en) * 1998-11-10 2002-05-28 Maniabarco N.V. Method and device for exposing both sides of a sheet
US6249807B1 (en) * 1998-11-17 2001-06-19 Kana Communications, Inc. Method and apparatus for performing enterprise email management
US6757018B1 (en) * 1998-12-18 2004-06-29 Agilent Technologies, Inc. CMOS image sensor with pixel level gain control
US6654787B1 (en) * 1998-12-31 2003-11-25 Brightmail, Incorporated Method and apparatus for filtering e-mail
US6777663B2 (en) * 1999-05-07 2004-08-17 Intel Corporation Enhanced Photocell with sample and hold amplifier
US7123301B1 (en) * 1999-06-11 2006-10-17 Analog Devices, Inc. Pixel gain amplifier
US6400810B1 (en) * 1999-07-20 2002-06-04 Ameritech Corporation Method and system for selective notification of E-mail messages
JP3903361B2 (ja) * 1999-08-13 2007-04-11 日本放送協会 固体撮像装置
US7133074B1 (en) * 1999-09-28 2006-11-07 Zoran Corporation Image sensor circuits including sampling circuits used therein for performing correlated double sampling
JP4550957B2 (ja) * 1999-11-15 2010-09-22 浜松ホトニクス株式会社 光検出装置
US6438215B1 (en) * 2000-02-29 2002-08-20 Ameritech Corporation Method and system for filter based message processing in a unified messaging system
US6882367B1 (en) * 2000-02-29 2005-04-19 Foveon, Inc. High-sensitivity storage pixel sensor having auto-exposure detection
JP4011818B2 (ja) 2000-02-29 2007-11-21 キヤノン株式会社 半導体固体撮像装置
JP3753925B2 (ja) * 2000-05-12 2006-03-08 株式会社ルネサステクノロジ 半導体集積回路
US7032023B1 (en) * 2000-05-16 2006-04-18 America Online, Inc. Throttling electronic communications from one or more senders
US6654594B1 (en) * 2000-05-30 2003-11-25 Motorola, Inc. Digitized automatic gain control system and methods for a controlled gain receiver
WO2002005428A2 (en) 2000-07-10 2002-01-17 Silicon Laboratories, Inc. Digitally-synthesized loop filter circuit particularly useful for a phase locked loop
WO2002007587A2 (en) * 2000-07-14 2002-01-31 Xillix Technologies Corporation Compact fluorescent endoscopy video system
JP3840050B2 (ja) * 2000-11-01 2006-11-01 キヤノン株式会社 電磁波変換装置
US6580496B2 (en) * 2000-11-09 2003-06-17 Canesta, Inc. Systems for CMOS-compatible three-dimensional image sensing using quantum efficiency modulation
US20020113887A1 (en) * 2001-02-16 2002-08-22 Iimura Russell M. CMOS image sensor with extended dynamic range
US7176962B2 (en) * 2001-03-01 2007-02-13 Nikon Corporation Digital camera and digital processing system for correcting motion blur using spatial frequency
US6867693B1 (en) * 2001-07-25 2005-03-15 Lon B. Radin Spatial position determination system
US7176976B2 (en) * 2001-08-30 2007-02-13 Lightsurf Technologies, Inc. Autoexposure methodology in a digital camera
US6849841B2 (en) 2001-09-28 2005-02-01 Raytheon Company System and method for effecting high-power beam control with outgoing wavefront correction utilizing holographic sampling at primary mirror, phase conjugation, and adaptive optics in low power beam path
US6809358B2 (en) * 2002-02-05 2004-10-26 E-Phocus, Inc. Photoconductor on active pixel image sensor
JP4086514B2 (ja) 2002-02-13 2008-05-14 キヤノン株式会社 光電変換装置及び撮像装置
US20030184673A1 (en) * 2002-04-02 2003-10-02 Michael Skow Automatic exposure control for digital imaging
US7031409B2 (en) * 2002-08-23 2006-04-18 Samsung Electronics Co., Ltd. Fully digital AGC circuit with wide dynamic range and method of operation
US7277129B1 (en) * 2002-10-31 2007-10-02 Sensata Technologies, Inc. Pixel design including in-pixel correlated double sampling circuit
CN100388764C (zh) * 2002-11-07 2008-05-14 罗姆股份有限公司 平面图像传感器
KR100920353B1 (ko) * 2003-03-14 2009-10-07 삼성전자주식회사 표시 장치용 광원의 구동 장치
US20050057670A1 (en) * 2003-04-14 2005-03-17 Tull Damon L. Method and device for extracting and utilizing additional scene and image formation data for digital image and video processing
CN1823336A (zh) * 2003-05-07 2006-08-23 Dvip多媒体股份有限公司 消除传感器电平图像失真的方法和装置
JP2005244311A (ja) 2004-02-24 2005-09-08 Canon Inc 撮像装置、撮像装置の制御方法、及び制御プログラム
US6972995B1 (en) * 2004-04-09 2005-12-06 Eastman Kodak Company Imaging cell with a non-volatile memory that provides a long integration period and method of operating the imaging cell
JP4664017B2 (ja) * 2004-07-12 2011-04-06 浜松ホトニクス株式会社 光半導体集積回路装置
US7489351B2 (en) * 2005-01-21 2009-02-10 Bae Systems Information And Electronic Systems Integration Inc. Dynamic range extension for focal plane arrays
US7560679B1 (en) * 2005-05-10 2009-07-14 Siimpel, Inc. 3D camera
JP4699524B2 (ja) * 2005-09-21 2011-06-15 アール・ジェイ・エス・テクノロジー・インコーポレイテッド 測光およびリアルタイムのレポート能力を有する画像センサ素子またはアレイのためのシステムおよび方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6407610B2 (en) 1999-12-30 2002-06-18 Stmicroelectronics S.R.L. Circuit and a method for extending the output voltage range of an integrator circuit
US6794922B2 (en) 2001-02-20 2004-09-21 Teac Corporation Signal processing circuit integrating pulse widths of an input pulse signal according to polarities
US20020176067A1 (en) 2001-05-23 2002-11-28 Canesta, Inc. Method and system to enhance dynamic range conversion useable with CMOS three-dimensional imaging

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
See also references of EP1938584A4
VU T T ET AL.: "A gaAs Phase Digitizing and Summing System for Microwave Signal Storage", IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 24, no. 1, February 1989 (1989-02-01)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009509475A (ja) * 2005-09-21 2009-03-05 アール・ジェイ・エス・テクノロジー・インコーポレイテッド 高ダイナミックレンジ感度センサ素子またはアレイのためのシステムおよび方法
US8153954B2 (en) 2008-08-08 2012-04-10 Semiconductor Energy Laboratory Co., Ltd. Photoelectric conversion device and electronic device having the same

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