WO2006109569A1 - ターフェニレン誘導体、テトラハロターフェニル誘導体及びそれらの製造方法 - Google Patents
ターフェニレン誘導体、テトラハロターフェニル誘導体及びそれらの製造方法 Download PDFInfo
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- WO2006109569A1 WO2006109569A1 PCT/JP2006/306352 JP2006306352W WO2006109569A1 WO 2006109569 A1 WO2006109569 A1 WO 2006109569A1 JP 2006306352 W JP2006306352 W JP 2006306352W WO 2006109569 A1 WO2006109569 A1 WO 2006109569A1
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- carbon atoms
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 55
- 238000000034 method Methods 0.000 title claims description 32
- 230000008569 process Effects 0.000 title claims description 4
- 125000006836 terphenylene group Chemical group 0.000 title abstract 3
- 125000004432 carbon atom Chemical group C* 0.000 claims abstract description 81
- 239000004065 semiconductor Substances 0.000 claims abstract description 48
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 47
- 239000010409 thin film Substances 0.000 claims abstract description 38
- 239000000463 material Substances 0.000 claims abstract description 32
- 230000003647 oxidation Effects 0.000 claims abstract description 31
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 31
- 125000003118 aryl group Chemical group 0.000 claims abstract description 24
- 239000005749 Copper compound Substances 0.000 claims abstract description 21
- 150000001880 copper compounds Chemical class 0.000 claims abstract description 21
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims abstract description 20
- 125000001309 chloro group Chemical group Cl* 0.000 claims abstract description 16
- 125000001153 fluoro group Chemical group F* 0.000 claims abstract description 14
- 239000003795 chemical substances by application Substances 0.000 claims abstract description 10
- 125000004986 diarylamino group Chemical group 0.000 claims abstract description 9
- 125000003342 alkenyl group Chemical group 0.000 claims abstract description 5
- 125000001424 substituent group Chemical group 0.000 claims description 133
- 239000000126 substance Substances 0.000 claims description 82
- 238000006243 chemical reaction Methods 0.000 claims description 76
- -1 hydrated oxide Chemical class 0.000 claims description 41
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 40
- NFHFRUOZVGFOOS-UHFFFAOYSA-N palladium;triphenylphosphane Chemical group [Pd].C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 NFHFRUOZVGFOOS-UHFFFAOYSA-N 0.000 claims description 32
- 229910052751 metal Inorganic materials 0.000 claims description 29
- 239000002184 metal Substances 0.000 claims description 29
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 26
- 239000003153 chemical reaction reagent Substances 0.000 claims description 24
- 229910052801 chlorine Inorganic materials 0.000 claims description 22
- 229910052763 palladium Inorganic materials 0.000 claims description 20
- 239000003054 catalyst Substances 0.000 claims description 18
- 239000000758 substrate Substances 0.000 claims description 18
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical group [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 claims description 16
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical group [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 claims description 16
- 229910052731 fluorine Inorganic materials 0.000 claims description 15
- 238000006467 substitution reaction Methods 0.000 claims description 15
- 229910052740 iodine Inorganic materials 0.000 claims description 14
- 229910052725 zinc Inorganic materials 0.000 claims description 8
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims description 7
- 150000004703 alkoxides Chemical class 0.000 claims description 7
- 229910052796 boron Inorganic materials 0.000 claims description 7
- 239000000460 chlorine Substances 0.000 claims description 7
- 150000004820 halides Chemical class 0.000 claims description 7
- 229910052749 magnesium Inorganic materials 0.000 claims description 7
- 229910052759 nickel Inorganic materials 0.000 claims description 7
- 229910052710 silicon Inorganic materials 0.000 claims description 7
- 229910052718 tin Inorganic materials 0.000 claims description 7
- 125000001246 bromo group Chemical group Br* 0.000 claims description 5
- 229910052799 carbon Inorganic materials 0.000 claims description 5
- 125000002947 alkylene group Chemical group 0.000 claims description 3
- 125000003837 (C1-C20) alkyl group Chemical group 0.000 claims description 2
- 125000002521 alkyl halide group Chemical group 0.000 claims 1
- 125000004429 atom Chemical group 0.000 claims 1
- 239000003610 charcoal Substances 0.000 claims 1
- 125000001188 haloalkyl group Chemical group 0.000 claims 1
- 230000006698 induction Effects 0.000 claims 1
- 230000015572 biosynthetic process Effects 0.000 abstract description 41
- 238000000576 coating method Methods 0.000 abstract description 20
- 239000011248 coating agent Substances 0.000 abstract description 9
- 150000001875 compounds Chemical class 0.000 abstract description 9
- 239000001257 hydrogen Substances 0.000 abstract description 4
- 229910052739 hydrogen Inorganic materials 0.000 abstract description 4
- 125000000304 alkynyl group Chemical group 0.000 abstract description 3
- 239000012072 active phase Substances 0.000 abstract 1
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 153
- 239000000243 solution Substances 0.000 description 66
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 63
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 54
- 239000002904 solvent Substances 0.000 description 44
- 238000003786 synthesis reaction Methods 0.000 description 43
- 239000000203 mixture Substances 0.000 description 39
- 239000012074 organic phase Substances 0.000 description 39
- 239000007787 solid Substances 0.000 description 37
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 34
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 27
- 239000012299 nitrogen atmosphere Substances 0.000 description 27
- 239000012071 phase Substances 0.000 description 25
- HPALAKNZSZLMCH-UHFFFAOYSA-M sodium;chloride;hydrate Chemical class O.[Na+].[Cl-] HPALAKNZSZLMCH-UHFFFAOYSA-M 0.000 description 25
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 21
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 20
- 229910052757 nitrogen Inorganic materials 0.000 description 19
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 18
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 18
- 239000000047 product Substances 0.000 description 17
- 239000002253 acid Substances 0.000 description 14
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 14
- 238000003756 stirring Methods 0.000 description 13
- MZRVEZGGRBJDDB-UHFFFAOYSA-N N-Butyllithium Chemical compound [Li]CCCC MZRVEZGGRBJDDB-UHFFFAOYSA-N 0.000 description 12
- 239000012267 brine Substances 0.000 description 12
- 238000004817 gas chromatography Methods 0.000 description 12
- 229910052744 lithium Inorganic materials 0.000 description 12
- 239000002994 raw material Substances 0.000 description 12
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 11
- 238000001816 cooling Methods 0.000 description 11
- 229910052802 copper Inorganic materials 0.000 description 11
- 239000010949 copper Substances 0.000 description 11
- 239000013078 crystal Substances 0.000 description 11
- 239000000376 reactant Substances 0.000 description 11
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 11
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical compound C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 description 10
- RFFLAFLAYFXFSW-UHFFFAOYSA-N 1,2-dichlorobenzene Chemical compound ClC1=CC=CC=C1Cl RFFLAFLAYFXFSW-UHFFFAOYSA-N 0.000 description 10
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 10
- XTHFKEDIFFGKHM-UHFFFAOYSA-N Dimethoxyethane Chemical compound COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 description 10
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 10
- 239000002585 base Substances 0.000 description 10
- 229910052736 halogen Inorganic materials 0.000 description 10
- 150000002367 halogens Chemical class 0.000 description 10
- 238000004458 analytical method Methods 0.000 description 9
- 239000011777 magnesium Substances 0.000 description 9
- LVKCSZQWLOVUGB-UHFFFAOYSA-M magnesium;propane;bromide Chemical compound [Mg+2].[Br-].C[CH-]C LVKCSZQWLOVUGB-UHFFFAOYSA-M 0.000 description 9
- 238000001953 recrystallisation Methods 0.000 description 9
- 229910000029 sodium carbonate Inorganic materials 0.000 description 9
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 8
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 8
- 238000006880 cross-coupling reaction Methods 0.000 description 8
- JIAARYAFYJHUJI-UHFFFAOYSA-L zinc dichloride Chemical compound [Cl-].[Cl-].[Zn+2] JIAARYAFYJHUJI-UHFFFAOYSA-L 0.000 description 8
- 230000032683 aging Effects 0.000 description 7
- 239000007789 gas Substances 0.000 description 7
- WGOPGODQLGJZGL-UHFFFAOYSA-N lithium;butane Chemical compound [Li+].CC[CH-]C WGOPGODQLGJZGL-UHFFFAOYSA-N 0.000 description 7
- SLIUAWYAILUBJU-UHFFFAOYSA-N pentacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC=CC=C5C=C4C=C3C=C21 SLIUAWYAILUBJU-UHFFFAOYSA-N 0.000 description 7
- 150000002978 peroxides Chemical class 0.000 description 7
- 239000003444 phase transfer catalyst Substances 0.000 description 7
- 238000000746 purification Methods 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical group [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 6
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 6
- 239000012298 atmosphere Substances 0.000 description 6
- ODWXUNBKCRECNW-UHFFFAOYSA-M bromocopper(1+) Chemical compound Br[Cu+] ODWXUNBKCRECNW-UHFFFAOYSA-M 0.000 description 6
- OPQARKPSCNTWTJ-UHFFFAOYSA-L copper(ii) acetate Chemical compound [Cu+2].CC([O-])=O.CC([O-])=O OPQARKPSCNTWTJ-UHFFFAOYSA-L 0.000 description 6
- GBRBMTNGQBKBQE-UHFFFAOYSA-L copper;diiodide Chemical compound I[Cu]I GBRBMTNGQBKBQE-UHFFFAOYSA-L 0.000 description 6
- UAOMVDZJSHZZME-UHFFFAOYSA-N diisopropylamine Chemical compound CC(C)NC(C)C UAOMVDZJSHZZME-UHFFFAOYSA-N 0.000 description 6
- 239000011521 glass Substances 0.000 description 6
- 238000001819 mass spectrum Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 239000003921 oil Substances 0.000 description 6
- 230000009257 reactivity Effects 0.000 description 6
- 239000011701 zinc Substances 0.000 description 6
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical group C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 5
- 125000003277 amino group Chemical group 0.000 description 5
- 229910052786 argon Inorganic materials 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 5
- 229910052794 bromium Inorganic materials 0.000 description 5
- 238000004440 column chromatography Methods 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 238000005191 phase separation Methods 0.000 description 5
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 5
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 5
- 125000000168 pyrrolyl group Chemical group 0.000 description 5
- 230000035484 reaction time Effects 0.000 description 5
- 150000003839 salts Chemical class 0.000 description 5
- 229910002027 silica gel Inorganic materials 0.000 description 5
- 239000000741 silica gel Substances 0.000 description 5
- 239000011780 sodium chloride Substances 0.000 description 5
- 238000000859 sublimation Methods 0.000 description 5
- 230000008022 sublimation Effects 0.000 description 5
- 238000010792 warming Methods 0.000 description 5
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 4
- YVKOUANNKYWVHL-UHFFFAOYSA-N C1=CC=CC2=CC=CC=C12.[I] Chemical compound C1=CC=CC2=CC=CC=C12.[I] YVKOUANNKYWVHL-UHFFFAOYSA-N 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 4
- 239000007818 Grignard reagent Substances 0.000 description 4
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 4
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 125000003963 dichloro group Chemical group Cl* 0.000 description 4
- 150000004795 grignard reagents Chemical class 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 239000002932 luster Substances 0.000 description 4
- KHIWWQKSHDUIBK-UHFFFAOYSA-N periodic acid Chemical compound OI(=O)(=O)=O KHIWWQKSHDUIBK-UHFFFAOYSA-N 0.000 description 4
- 229910052700 potassium Inorganic materials 0.000 description 4
- 239000011541 reaction mixture Substances 0.000 description 4
- 238000010898 silica gel chromatography Methods 0.000 description 4
- 239000002002 slurry Substances 0.000 description 4
- 239000006228 supernatant Substances 0.000 description 4
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 4
- WRECIMRULFAWHA-UHFFFAOYSA-N trimethyl borate Chemical compound COB(OC)OC WRECIMRULFAWHA-UHFFFAOYSA-N 0.000 description 4
- 239000011592 zinc chloride Substances 0.000 description 4
- 235000005074 zinc chloride Nutrition 0.000 description 4
- MSBNELVKHUKSPY-UHFFFAOYSA-N 1,2-dibromo-4,5-diphenylbenzene Chemical compound C=1C=CC=CC=1C=1C=C(Br)C(Br)=CC=1C1=CC=CC=C1 MSBNELVKHUKSPY-UHFFFAOYSA-N 0.000 description 3
- HGXHHGLLQBGDPK-UHFFFAOYSA-N ClC1(C(=C(C(=C1Cl)Cl)Cl)Cl)Cl.C1=CC=CC2=CC=CC=C12 Chemical compound ClC1(C(=C(C(=C1Cl)Cl)Cl)Cl)Cl.C1=CC=CC2=CC=CC=C12 HGXHHGLLQBGDPK-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- LCGLNKUTAGEVQW-UHFFFAOYSA-N Dimethyl ether Chemical group COC LCGLNKUTAGEVQW-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- RWRDLPDLKQPQOW-UHFFFAOYSA-N Pyrrolidine Chemical compound C1CCNC1 RWRDLPDLKQPQOW-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 3
- 125000000596 cyclohexenyl group Chemical group C1(=CCCCC1)* 0.000 description 3
- 239000000446 fuel Substances 0.000 description 3
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 3
- 239000011630 iodine Substances 0.000 description 3
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 3
- BZLVMXJERCGZMT-UHFFFAOYSA-N methyl tert-butyl ether Substances COC(C)(C)C BZLVMXJERCGZMT-UHFFFAOYSA-N 0.000 description 3
- 239000012046 mixed solvent Substances 0.000 description 3
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 3
- 239000011368 organic material Substances 0.000 description 3
- 125000001979 organolithium group Chemical group 0.000 description 3
- YJVFFLUZDVXJQI-UHFFFAOYSA-L palladium(ii) acetate Chemical compound [Pd+2].CC([O-])=O.CC([O-])=O YJVFFLUZDVXJQI-UHFFFAOYSA-L 0.000 description 3
- 239000002243 precursor Substances 0.000 description 3
- 238000007639 printing Methods 0.000 description 3
- 239000000725 suspension Substances 0.000 description 3
- KTQYWNARBMKMCX-UHFFFAOYSA-N tetraphenylene Chemical group C1=CC=C2C3=CC=CC=C3C3=CC=CC=C3C3=CC=CC=C3C2=C1 KTQYWNARBMKMCX-UHFFFAOYSA-N 0.000 description 3
- 150000003751 zinc Chemical class 0.000 description 3
- DYLIWHYUXAJDOJ-OWOJBTEDSA-N (e)-4-(6-aminopurin-9-yl)but-2-en-1-ol Chemical compound NC1=NC=NC2=C1N=CN2C\C=C\CO DYLIWHYUXAJDOJ-OWOJBTEDSA-N 0.000 description 2
- QPFMBZIOSGYJDE-UHFFFAOYSA-N 1,1,2,2-tetrachloroethane Chemical compound ClC(Cl)C(Cl)Cl QPFMBZIOSGYJDE-UHFFFAOYSA-N 0.000 description 2
- QCKHVNQHBOGZER-UHFFFAOYSA-N 1,2,4,5-tetrabromobenzene Chemical compound BrC1=CC(Br)=C(Br)C=C1Br QCKHVNQHBOGZER-UHFFFAOYSA-N 0.000 description 2
- OIAQMFOKAXHPNH-UHFFFAOYSA-N 1,2-diphenylbenzene Chemical group C1=CC=CC=C1C1=CC=CC=C1C1=CC=CC=C1 OIAQMFOKAXHPNH-UHFFFAOYSA-N 0.000 description 2
- YJTKZCDBKVTVBY-UHFFFAOYSA-N 1,3-Diphenylbenzene Chemical group C1=CC=CC=C1C1=CC=CC(C=2C=CC=CC=2)=C1 YJTKZCDBKVTVBY-UHFFFAOYSA-N 0.000 description 2
- 125000001637 1-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C(*)=C([H])C([H])=C([H])C2=C1[H] 0.000 description 2
- XKZQKPRCPNGNFR-UHFFFAOYSA-N 2-(3-hydroxyphenyl)phenol Chemical compound OC1=CC=CC(C=2C(=CC=CC=2)O)=C1 XKZQKPRCPNGNFR-UHFFFAOYSA-N 0.000 description 2
- VADKRMSMGWJZCF-UHFFFAOYSA-N 2-bromophenol Chemical compound OC1=CC=CC=C1Br VADKRMSMGWJZCF-UHFFFAOYSA-N 0.000 description 2
- ANGGPYSFTXVERY-UHFFFAOYSA-N 2-iodo-2-methylpropane Chemical compound CC(C)(C)I ANGGPYSFTXVERY-UHFFFAOYSA-N 0.000 description 2
- HMCUGCPHZLJKMS-UHFFFAOYSA-N 4-methoxy-3,6-diphenylbenzene-1,2-diol Chemical compound COC1=CC(C=2C=CC=CC=2)=C(O)C(O)=C1C1=CC=CC=C1 HMCUGCPHZLJKMS-UHFFFAOYSA-N 0.000 description 2
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 2
- 229910021595 Copper(I) iodide Inorganic materials 0.000 description 2
- 229910021592 Copper(II) chloride Inorganic materials 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 2
- 238000003747 Grignard reaction Methods 0.000 description 2
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 2
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical group CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 2
- NQRYJNQNLNOLGT-UHFFFAOYSA-N Piperidine Chemical compound C1CCNCC1 NQRYJNQNLNOLGT-UHFFFAOYSA-N 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 2
- 229910052783 alkali metal Inorganic materials 0.000 description 2
- 150000001340 alkali metals Chemical class 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 150000001502 aryl halides Chemical class 0.000 description 2
- 235000013844 butane Nutrition 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000004587 chromatography analysis Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- LSXDOTMGLUJQCM-UHFFFAOYSA-M copper(i) iodide Chemical compound I[Cu] LSXDOTMGLUJQCM-UHFFFAOYSA-M 0.000 description 2
- 239000002178 crystalline material Substances 0.000 description 2
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- 235000011009 potassium phosphates Nutrition 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- FZHAPNGMFPVSLP-UHFFFAOYSA-N silanamine Chemical class [SiH3]N FZHAPNGMFPVSLP-UHFFFAOYSA-N 0.000 description 1
- 150000004756 silanes Chemical group 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 description 1
- 235000017557 sodium bicarbonate Nutrition 0.000 description 1
- 229910000030 sodium bicarbonate Inorganic materials 0.000 description 1
- 239000001488 sodium phosphate Substances 0.000 description 1
- 229910000162 sodium phosphate Inorganic materials 0.000 description 1
- KEAYESYHFKHZAL-BJUDXGSMSA-N sodium-22 Chemical compound [22Na] KEAYESYHFKHZAL-BJUDXGSMSA-N 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 125000000472 sulfonyl group Chemical group *S(*)(=O)=O 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 1
- ZGNPLWZYVAFUNZ-UHFFFAOYSA-N tert-butylphosphane Chemical compound CC(C)(C)P ZGNPLWZYVAFUNZ-UHFFFAOYSA-N 0.000 description 1
- 125000003698 tetramethyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- FHYUCVWDMABHHH-UHFFFAOYSA-N toluene;1,2-xylene Chemical group CC1=CC=CC=C1.CC1=CC=CC=C1C FHYUCVWDMABHHH-UHFFFAOYSA-N 0.000 description 1
- IMFACGCPASFAPR-UHFFFAOYSA-N tributylamine Chemical compound CCCCN(CCCC)CCCC IMFACGCPASFAPR-UHFFFAOYSA-N 0.000 description 1
- 125000004205 trifluoroethyl group Chemical group [H]C([H])(*)C(F)(F)F 0.000 description 1
- 125000000025 triisopropylsilyl group Chemical group C(C)(C)[Si](C(C)C)(C(C)C)* 0.000 description 1
- 125000005580 triphenylene group Chemical group 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000001291 vacuum drying Methods 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
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- C07C211/54—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton having amino groups bound to two or three six-membered aromatic rings
- C07C211/56—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton having amino groups bound to two or three six-membered aromatic rings the carbon skeleton being further substituted by halogen atoms or by nitro or nitroso groups
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- C07C1/26—Preparation of hydrocarbons from one or more compounds, none of them being a hydrocarbon starting from organic compounds containing only halogen atoms as hetero-atoms
- C07C1/28—Preparation of hydrocarbons from one or more compounds, none of them being a hydrocarbon starting from organic compounds containing only halogen atoms as hetero-atoms by ring closure
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- C07C13/28—Polycyclic hydrocarbons or acyclic hydrocarbon derivatives thereof
- C07C13/32—Polycyclic hydrocarbons or acyclic hydrocarbon derivatives thereof with condensed rings
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- C07C211/57—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings being part of condensed ring systems of the carbon skeleton
- C07C211/61—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings being part of condensed ring systems of the carbon skeleton with at least one of the condensed ring systems formed by three or more rings
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- C07C22/02—Cyclic compounds containing halogen atoms bound to an acyclic carbon atom having unsaturation in the rings
- C07C22/04—Cyclic compounds containing halogen atoms bound to an acyclic carbon atom having unsaturation in the rings containing six-membered aromatic rings
- C07C22/08—Cyclic compounds containing halogen atoms bound to an acyclic carbon atom having unsaturation in the rings containing six-membered aromatic rings containing fluorine
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Definitions
- the present invention relates to a terfenylene derivative capable of being developed into an electronic material such as an organic semiconductor, its use, and a production method thereof. Furthermore, the present invention relates to a tetrahaloterphenyl derivative which is a precursor compound of the terferene derivative and a method for producing the same.
- Organic semiconductor devices represented by organic thin film transistors have recently attracted attention because they have features that are not energy-saving, low-cost, and flexible inorganic semiconductor devices.
- Organic thin film transistors are composed of several kinds of materials such as an organic semiconductor active phase, a substrate, an insulating phase, and an electrode.
- the organic semiconductor active phase responsible for charge carrier movement has the central role of the device.
- the semiconductor device performance depends on the carrier mobility of the organic material constituting the organic semiconductor active phase.
- a method for producing an organic semiconductor active phase is a vacuum deposition method in which an organic material is vaporized under a high-temperature vacuum, and a coating in which the organic material is dissolved in a suitable solvent and applied.
- the law is known.
- Application can also be carried out using printing technology without using high temperature and high vacuum conditions.
- the coating method is an economically preferable process because printing can greatly reduce the manufacturing cost of device fabrication.
- Non-Patent Document 1 a crystalline material such as pentacene has high carrier mobility similar to amorphous silicon and exhibits excellent semiconductor device characteristics.
- Patent Document 1 an attempt to manufacture a device by a coating method by dissolving polyacene such as pentacene (see Patent Document 1).
- pentacene has low solubility due to its strong cohesiveness! Therefore, in order to apply the coating method, conditions such as high-temperature heating are required, and furthermore, the solution of pentacene is very easily oxidized by air. Application was difficult in terms of process and economy.
- unsubstituted terferene is a rigid rod-like molecule and is known to have a structure similar to pentacene, but is unstable. Furthermore, since the synthesis method includes a photo-reaction process with a large number of steps, it was not an industrially preferable production method (see Non-Patent Document 4).
- Non-Patent Document 1 “Journal of Applied Physics” (USA), 2002, 92 ⁇ , 5259-5263
- Non-patent literature 2 “Science” (USA), 1998, 280 ⁇ , 1741–1744
- Non-patent literature 3 “Journal of American Chemical Society”, (USA), 2
- Non-Patent Document 4 "Journal of American Chemical Society” (USA), 1
- Patent Document 1 WO2003Z016599
- the present invention has excellent oxidation resistance and can form a semiconductor active phase by a coating method. Another object is to provide an oxidation-resistant organic semiconductor material and an organic thin film. Further, the present invention provides a tetrahaloterphenol derivative useful as a raw material for the terferene derivative. It aims at providing a body and its manufacturing method.
- the present inventors have found a novel terfenylene derivative of the present invention. Since the terferene derivative has excellent oxidation resistance and can be applied by a coating method, a crystalline thin film can be easily and stably produced. The present inventors have found an oxidation resistant organic semiconductor material and a thin film thereof, and have completed the present invention.
- the present inventors have found a new precursor compound capable of efficiently producing the terferene derivative, that is, a specific tetrahaloterphenyl derivative, and such a tetrahaloterphenyl derivative. To find a method for efficiently producing the present invention and to complete the present invention o
- terferene derivatives having excellent oxidation resistance and capable of forming a semiconductor active phase by a coating method, and uses thereof. Furthermore, in the production method of the present invention, a terferene derivative into which a fluorine atom is introduced can be produced, and an organic semiconductor material can be provided.
- FIG. 1 is a graph showing the results of X-ray diffraction measurement of the thin film prepared in Example 7.
- the present invention is described in detail below.
- the description includes a turf-lene derivative and a production method thereof, a tetrahaloterphenyl derivative which is a precursor compound of the terferene derivative, a production method thereof, an oxidation-resistant organic semiconductor material comprising the terferene derivative, and The thin film will be described in this order.
- the turfene derivative of the present invention is represented by the following general formula (1).
- substituents! ⁇ To 14 are the same or different, hydrogen atom, fluorine atom, chlorine atom, aryl group having 4 to 30 carbon atoms, alkyl group having 3 to 20 carbon atoms, carbon A C2-C30 alkyl group, a C1-C20 alkyl group, a C1-C20 halogenoalkyl group, or a C8-C30 dialylamino group;
- Any two or more of ⁇ ⁇ can be bonded to each other, and any two or more of R 8 to R 13 can be bonded to each other.
- n are each an integer of 0 or 1.
- At least one of the shaku 14 is not a hydrogen atom.
- the bond between the substituents R 3 and R 4 is exemplified as the bond. be able to.
- unsaturated ring formation can be exemplified.
- a bond between the substituents R 1G and R 11 can be preferably mentioned as a bond.
- unsaturated ring formation can be exemplified.
- any two or more of the substituents ⁇ are bonded to each other, and when any two or more of the substituents R 8 to R 13 are bonded to each other, In this case, it may be formed at the same time, or it may be formed only in either case.
- the ring structure of the terferene derivative represented by the general formula (1) of the present invention is not particularly limited, and any structure in which both ends of the ring structure are bilaterally symmetric or bilaterally asymmetric is possible. is there.
- both ends of the ring structure are symmetrical.
- left-right symmetry includes, for example, when 1 and n are different values, and when 1 and n are the same value, but the substituents arranged at the corresponding positions in the left and right ring structures do not match. Can do.
- Ariru group of 4 to 30 carbon atoms is not particularly limited, for example, full E - le group, p-tolyl group, p-(n-Okuchiru) Hue - le group, m-(n —Octyl) phenol group, p-fluorophenyl group, pentafluorophenyl group, p— (trifluoromethyl) phenol group, p— (n perfluorooctyl) phenol Group, 2 chael group, 5— (n—hexyl) —2 chael group, 2, 2, —biphenyl group, 5 biphenyl group, perfluorobiphenyl group, 1 naphthyl group, 2 —Naphtyl group, 1 Perfluoronaphthyl group, Anthracesyl group, 2 Fluorol group, 9, 9 Dimethyl-2 Fluorol group, 1-Bi-Fe-Len
- the alkyl group having 3 to 20 carbon atoms in the substituents ⁇ 4 is an alkynyl group not containing a silyl group, for example, a methylethyl group, an isopropylethyl group, a tertbutylethyl group, (n-octyl) Etul, Trifluoromethyl Etul, Feulture, ⁇ 4 (n-octyl) tation ⁇ Etul, Naftylectur, Anthracer, Ets, Bifer-Lecheur, Tafe- Luetul, Benzylethyl, Bihue-Lenoetul, Perfluorophenyl-Lecheur, ⁇ p- (Trifluoromethyl) tation ⁇ Etul, (n Perfluorooctyl) Etul, ⁇ 4 (n — Perfluorooctyl) fuel ⁇ thur group.
- a silyl group for example, a methylethyl
- an alkenyl group having 2 to 30 carbon atoms is not particularly limited, For example Eteyuru group, Mechirueteyuru group, isopropyl E Saturation Le group, tert- Buchirueteyuru group, (n- Okuchiru) Eteyuru group, ( Trifluoromethyl) etul group, fuerthur group, ⁇ 4 (n-octyl) fuer ⁇ group, naphtylthur group, anthracyl ether group, perfluorophenyl group, ⁇ p (trifluoro group) Methyl) fuel group, (n-perfluorooctyl) ethyl group, biphenyl-tuttle group, terphe-ruthur group, benzyletul group, bifu-renoetul group, fuer (methyl) tulle Group, (trimethylsilyl) ethyl group, (trimethylsilyl) ethy
- the alkyl group having 1 to 20 carbon atoms in the substituents ⁇ 4 is not particularly limited, for example, methyl group, ethyl group, propyl group, nbutyl group, isobutyl group, tbutyl group, neopentyl group, octyl group.
- the halogenated alkyl group having 1 to 20 carbon atoms is not particularly limited, and examples thereof include a trifluoromethyl group, a trifluoroethyl group, and a monofluorooctyl group.
- Jiariruamino group of 8 to 30 carbon atoms is not particularly limited, for example Jifue - Ruamino group, Hue - Le (3 Mechirufue -) amino group, di (3-Mechirufue - Le) Amino group, di ⁇ 4- (n-octyl) phenol ⁇ amino group, di (3-trifluoromethylphenol) amino group, (1 naphthyl) phenolamino group, (2-naphthyl) phenol -Lamino group, di (1 naphthyl) amino group, phenyl (2 fluorenyl) amino group, phenol (9,9-dimethyl--2-fluorenyl) amino group, bis (2-fluorenyl) amino group, di ( 2-Chel) amino group, Phenol (2-Chel) amino group, bis ⁇ 2- (1-Phenol) pyrrolyl ⁇ amino group, ⁇ 2- (1 Phenol
- Examples of the unsaturated ring may include a substituent, a benzene ring, a substituent,! /, A tetra-phenylene ring, or a substituent.
- Examples of the benzene ring that may have a substituent include a benzene ring, a dimethylbenzene ring, a diphenylbenzene ring, a naphthalene ring, a methylnaphthalene ring, a phenylnaphthalene ring, and a triphenylene ring.
- Examples of the tetraphenylene ring that has a substituent may include a tetraphenylene ring and a phenyltetraphenylene ring.
- Examples of the cyclohexene ring which may have a substituent include a cyclohexene ring and a phenol cyclohexene ring.
- Examples of the thiophene ring which may have a substituent, include a thiophene ring, a methylthiophene ring, an (n-octyl) thiophene ring, and a phenolthiophene ring.
- examples of the pyrrole ring may include a pyrrole ring, a methyl pyrrole ring, a vinyl pyrrole ring, and an indole ring.
- the unsaturated ring is preferably a substituent, a benzene ring or a thiophene ring which may have a substituent, and particularly preferably a benzene ring or a thiophene ring.
- the terferene derivative represented by the general formula (1) of the present invention is composed of the terferene derivative, the acid-resistant organic semiconductor material having the strength of the terferene derivative, and a thin film thereof, which has high oxidation resistance. From the standpoint of developing properties and carrier mobility, preferred examples of combinations of substituents include the following:
- Substituents I ⁇ to R 14 are the same or different and are a hydrogen atom, a fluorine atom, an aryl group having 4 to 30 carbon atoms, an alkyl group having 3 to 20 carbon atoms, and an alkyl group having 1 to 20 carbon atoms. at least one or more substituents selected group force consisting of an alkyl group, and at least one ⁇ example, such a hydrogen atom of the substituent to 4;
- Substituents R 3 , R 4 , R 1G and R 11 forces are the same or different and are an aryl group having 4 to 30 carbon atoms, an alkynyl group having 3 to 20 carbon atoms, an alkenyl group having 2 to 30 carbon atoms, carbon An alkyl group having 1 to 20 carbon atoms or a halogenated alkyl group having 1 to 20 carbon atoms, and a diarylamino group having 8 to 30 carbon atoms, a group power of at least one or more selected groups, and a substituent R 1 , R 2 , R 5 to R 9 , R 12 to R 14 are the same or different and are each a hydrogen atom, a fluorine atom or a chlorine atom.
- Child power is a group power, an example of at least one group selected;
- Substituents R 3 , R 4 , R 1G and R 11 forces are the same or different, and are an aryl group having 4 to 30 carbon atoms, an alkyl group having 3 to 20 carbon atoms, and an alkyl having 1 to 20 carbon atoms.
- a group or a group strength of 1 to 20 carbon atoms and a group strength of at least one group selected, and the substituents RR 2 , R 5 to R 9 , and R 12 to R 14 are the same or different, Hydrogen atom and fluorine nuclear power Group power Examples that are at least one or more selected groups;
- the bond formed by any two or more of the substituents is a bond between the substituents R 3 and R 4 , and any two of the substituents R 8 to R 13
- An example where the bond by the above is the bond of the substituent R 1C> and R 11 ;
- the bonded substituent is an unsaturated ring
- the terferene derivative represented by the general formula (1) of the present invention has high oxidation resistance when the terferene derivative, the acid-resistant organic semiconductor material having the strength of the terferene derivative, and a thin film thereof are used.
- the carrier mobility is expressed, there is no particular limitation. Examples thereof include the following compounds.
- the terfenylene derivative represented by the general formula (1) of the present invention is obtained by subjecting a tetrahaloterphenol derivative represented by the following general formula (2) to a tetralithium derivative using a lithiating agent and treating with a copper compound. It is possible to manufacture from what you do. [0038] [Chemical 10]
- substituents 1 to 4 represent a bromine atom, an iodine atom or a chlorine atom.
- Any two or more of ⁇ ⁇ can be bonded to each other, and any two or more of R 8 to R 13 can be bonded to each other.
- n are each an integer of 0 or 1.
- the notation of the general formula (2) is a general term for the para-positional isomer and the meta-positional isomer in which the general formula (2) is represented by the following general formula (3) and general formula (4).
- tetralithiation means that four halogens to 4 in the general formula (2) are each replaced with lithium.
- Alkyl lithium is preferable, and sec butyl lithium is particularly preferable.
- the amount of the lithiating agent used is in the range of 3 to 20 equivalents, preferably 4 to 15 equivalents, more preferably 5 to 10 equivalents, relative to the tetrahaloterphenol derivative of the general formula (2). can do.
- the amount used is 3 equivalents or more, the conversion rate to tetralithioy is promoted, and when the amount used is 20 equivalents or less, the amount of by-products does not increase and can be tetralithized economically.
- the tetralithioi reaction is preferably carried out in a solvent.
- the solvent to be used is not particularly limited, and examples thereof include tetrahydrofuran (hereinafter abbreviated as THF), jetyl ether, methyl tert butyl ether, ethylene glycol dimethyl ether, dioxane, toluene, hexane, cyclohexane, and the like, and particularly preferably THF. is there. These solvents may be used alone or as a mixture of two or more.
- THF tetrahydrofuran
- jetyl ether methyl tert butyl ether
- ethylene glycol dimethyl ether dioxane
- dioxane dioxane
- toluene hexane
- cyclohexane cyclohexane
- THF tetrahydrofuran
- These solvents may be used alone or as a mixture of two or more.
- the tetralithium salt produced by the tetralithioi reaction is then reacted with a copper compound.
- the reaction with the copper compound involves a method of reacting the reaction mixture containing the tetralithium salt generated by the tetralithioi reaction by directly using the copper compound, and once isolating the generated tetralithium salt and then reacting with the copper compound. How to make use of!
- the copper compound used for the reaction between the tetralithium salt and the copper compound is not particularly limited.
- divalent copper such as copper chloride (1), copper bromide (1), copper iodide (1), copper acetate (I), etc.
- Preferred is divalent copper
- particularly preferred is copper chloride ( ⁇ ).
- the reaction with the copper compound is preferably carried out in a solvent.
- the solvent to be used is not particularly limited, and examples thereof include THF, jetyl ether, methyl tert butyl ether, ethylene glycol dimethyl ether, diglyme, dioxane, toluene, hexane, and cyclohexane, and THF is particularly preferable.
- the amount of the copper compound to be used is 1 to 20 equivalents, preferably 4 to 15 equivalents, relative to the tetrahaloterfur derivative of the general formula (2).
- the reaction temperature with the copper compound is ⁇ 100 to 50 ° C., preferably ⁇ 90 to 30 ° C., and the reaction time is 1 to 30 hours, preferably 1 to 18 hours.
- the production of the terferene derivative of the general formula (1) of the present invention is preferably carried out under an inert atmosphere such as nitrogen or argon.
- the tetra- or oral terfel derivative of the general formula (2) is tetralithiated, reacted with zinc chloride, and then copper It can also be treated with a compound.
- the tetrahaloterphenyl derivative represented by the general formula (2) is subjected to tetra Grignard reaction using a Grignard reagent. It can also be produced by treating with a copper compound.
- the Grignard agent to be used is, for example, Mg metal, or power capable of mentioning alkyl Grignard reagents such as acetylmagnesium bromide and isopropylmagnesium bromide, preferably Mg metal.
- the form of the Mg metal is not particularly limited, and examples thereof include a shell shape, a ribbon shape, and a granular shape.
- the Grignard agent is used in the range of 1.8 to 20 equivalents with respect to the tetrano-rotaphenyl derivative represented by the general formula (2).
- the Grignard Louis reaction is preferably carried out in a solvent.
- the solvent to be used is not particularly limited, and examples thereof include those used in the tetralithiation reaction.
- the temperature of the Grignard reaction is ⁇ 20 to 120 ° C., and the reaction time is in the range of 1 to 360 minutes.
- the tetramagnesium salt produced by the Grignard Louis reaction is then reacted with a copper compound.
- the reaction with the copper compound can be carried out under the conditions used in the tetralithiation reaction.
- the turf-lene derivative represented by the general formula (1) of the present invention obtained by force can be further purified.
- the method for purification is not particularly limited, and examples thereof include column chromatography, recrystallization, or sublimation.
- the tetrahaloterphenyl derivative represented by the general formula (2) used as a raw material in the method for producing the terferene derivative represented by the general formula (1) of the present invention has a structure represented by the general formula (1) It has a para type represented by 3) and a meta type represented by general formula (4). But in general As the raw material of the terferene derivative represented by the formula (1), any of these two types of para and meta isomers can be used, and any ratio of these two types of isomers. Even a mixture of these can be used as a raw material.
- substituents 1 to 4 represent a bromine atom, an iodine atom, or a chlorine atom.
- Any two or more of ⁇ ⁇ can be bonded to each other, and any two or more of R 8 to R 13 can be bonded to each other.
- n are each an integer of 0 or 1.
- the notation of the general formula (2) is a general term for the para-positional isomer and the meta-positional isomer in which the general formula (2) is represented by the following general formula (3) and general formula (4).
- n is preferably 0, more preferably 1 and m are 0.
- substituents to X 4 in the general formula (2) are preferably a bromine atom or an iodine atom, and more preferably a bromine atom.
- substituents R 3 , R 4 , R 1C) and R 11 of the tetrahaloterphenyl derivative represented by the general formula (2) of the present invention are preferably the same or different,
- an aryl group having 4 to 30 carbon atoms, an alkyl group having 2 to 20 carbon atoms, and an alkyl group having 1 to 20 carbon atoms or a halogenated alkyl group having 1 to 20 carbon atoms is selected. And particularly preferably selected from the group consisting of aryl groups having 4 to 30 carbon atoms and alkyl groups having 2 to 20 carbon atoms. It is a group.
- the tetrahaloterphenyl derivative represented by the general formula (2) of the present invention is preferably a regioisomer as a para-positional tetrahaloterphenyl derivative represented by the general formula (3). .
- the tetrahaloterfur derivative represented by the general formula (5) is a substituent of the general formula (2) of the present invention.
- the tetrahaloterphenol derivative represented by the general formula (2) of the present invention is not particularly limited. Examples thereof include the following compounds.
- the tetrahaloterfur derivative represented by the general formula (2) of the present invention includes a tetrahaloarene represented by the following general formula (6) and the following general formula (7) and Z or the following general formula (8).
- the 2-haloaryl metal reagent shown can be produced by cross-coupling reaction in the presence of palladium and Z or nickel catalyst.
- substituents X 5 and X 6 represent a bromine atom, an iodine atom or a chlorine atom.
- the substituents R 7 , R 14 , X 2 and X 3 , and the symbol m are represented by the general formula (2) It is synonymous with the substituents and symbols shown, and the notation of the general formula (6) is a general term for the substituents X 5 and X 6 force para-coordination and Z or meta-coordination.
- M represents a halide, hydrated oxide, alkoxide or alkyl compound of Mg, B, Zn, Sn or Si.
- Substituents ⁇ and X 1 , and symbol 1 are represented by the general formula (2 It has the same meaning as the substituents and symbols indicated by
- M represents a halide, hydride oxide, alkoxide or alkyl compound of Mg, B, Zn, Sn or Si.
- Substituents R 8 to R 13 and X 4 , and symbol n is It has the same meaning as the substituent and symbol represented by formula (2).
- substituents X 5 and X 6 in the general formula (6) is preferably a bromine atom and an iodine atom, preferably a further iodine atom.
- the substituent M in the general formulas (7) and (8) is a halide, hydrated oxide, alkoxide, or alkyl chloride of Mg, B, Zn, Sn, or Si, and the above palladium, Z, or nickel catalyst.
- B (OH) or ZnCl Preferably, B (OH) or ZnCl.
- the 2-haloaryl metal reagent represented by the general formulas (7) and (8) is, for example, an aryl dihalogen-substituted product as a raw material thereof, a Grignard reagent such as isopropylmagnesium bromide, or n -butyllithium.
- a Grignard reagent such as isopropylmagnesium bromide, or n -butyllithium.
- the catalyst used for the cross-coupling reaction of the tetrahaloarene represented by the general formula (6) and the general formula (7) and Z or the 2-haloaryl metal reagent represented by the general formula (8) is palladium and Z or There is no particular limitation as long as it is a nickel catalyst.
- a palladium catalyst tetrakis (triphenylphosphine) palladium, tris (dibenzylideneacetone) dipalladium Ztriphenylphosphine mixture, dichlorobis (triphenylphosphine) Palladium, bis (tri-tert-butylphosphine) palladium, diacetatobis (triphenyl) Phosphine) palladium, dichloro (1,2-bis (diphenylphosphino) ethane) palladium, palladium acetate Z triphenylphosphine mixture, palladium acetate Ztree tert-butylphosphine mixture, palladium acetate Z2— (dicyclohexylphosphino) — 1, 1, -biphenyl mixture, dichloro (ethylenediamine) palladium, dichloro (N, N, ⁇ ', ⁇ '-tetrakis (triphenylphos
- a preferable catalyst is a zerovalent palladium compound, and a particularly preferable catalyst is tetrakis (triphenylphosphine) palladium. These catalysts may be used alone or as a mixture of two or more.
- the reaction is preferably carried out in a solvent.
- the solvent to be used include, but are not limited to, tetrahydrofuran (hereinafter abbreviated as THF), jetyl ether, methyl tert-butyl ether, dioxane, ethylene glycol dimethyl ether, toluene, xylene, hexane, cyclohexane, ethanol, water , N, N-dimethylformamide, N-methylpiridone, triethinoleamine, piperidine, pyrrolidine, diisopropylamine, etc., and these solvents can be used alone or in a mixture of two or more. Also good. For example, it can also be used in 2 to 3 component systems such as toluene Z water, toluene Z ethanol Z water.
- a base can also be present in the reaction system.
- the type of base in this case is not particularly limited.
- inorganic substances such as sodium carbonate, sodium hydrogen carbonate, potassium carbonate, cesium carbonate, potassium phosphate, sodium phosphate, sodium tert-butoxide, potassium fluoride, etc.
- Organic bases such as bases, triethylamine, trimethylamine, tributylamine, ethylenediamine, N, N, ⁇ ', ⁇ , monotetramethylethylenediamine, diisopropylamine, pyridine and the like can be mentioned as suitable ones.
- the amount of these bases used is the general formula (6) Of tetrahaloarene of 0.5 to: LO.
- phase transfer catalyst can be used in combination with these bases.
- the type of the phase transfer catalyst is not particularly limited, and suitable examples include trioctylmethyl ammonium chloride, tetraptyl ammonium chloride, cetyl pyridinium chloride, and the like.
- the amount of these phase transfer catalysts used is in the range of 0.1 to 1.5 equivalents, preferably 0.2 to 0.8 equivalents, relative to the tetrahaloarene of the general formula (6).
- phosphine such as triphenylphosphine may be present in the reaction system.
- phosphines can be used in an amount of 0.9 to 8.0 equivalents, preferably 1.0 to 3.0 equivalents, relative to the palladium and Z or nickel catalyst.
- a copper compound may be present in the reaction system.
- the type of copper compound in this case is not particularly limited.
- monovalent copper such as copper chloride (1), copper bromide (1), copper iodide (1), copper acetate (I); copper chloride (11 ), Copper bromide (11), copper iodide (11), copper acetate (11), divalent copper such as acetyl acetylacetate copper ( ⁇ ), and the like.
- Monovalent copper is preferred, and copper (I) iodide is particularly preferred.
- These copper compounds can be used in an amount of 0.3 to: LO. 0 equivalents, preferably 0.6 to 6.0 equivalents with respect to the palladium and Z or nickel catalyst.
- tetrahaloterphenyl derivative represented by the general formula (2) of the present invention two types are generally produced. That is, two positional isomers are produced: a tetrahaloterphenyl derivative represented by general formula (3), which is a para-position isomer, and a tetrahaloterphenyl represented by general formula (4), which is a meta-positional isomer.
- a tetrahaloterphenyl derivative represented by general formula (3) which is a para-position isomer
- a tetrahaloterphenyl represented by general formula (4) which is a meta-positional isomer.
- the method of the present invention can produce only a tetrano or rotanyl derivative having a specific substitution pattern in which a plurality of substitution patterns are not mixed, and a mixture of a plurality of positional isomers. It is also possible to produce only a specific regioisomeric tetrahaloterphenyl derivative.
- Tetrahaloarene represented by general formula (6) and 2-haloaryl metal reagent represented by general formula (7) are used as raw materials.
- the amount of catalyst used relative to tetra halo arene of general formula (6), from 0.1 to 20 mole 0/0, preferably from 1 to 10 mol%.
- the amount of the 2-haloaryl metal reagent of the general formula (7) used is 1.6 to 3.2 equivalents, preferably 1.8 to 2.8 equivalents, more preferably the tetrahaloarene of the general formula (6). 1.
- the reaction temperature is 10 to 120 ° C, preferably 30 to 100 ° C, more preferably 40 to 90 ° C, and the reaction time is 1 to 48 hours, preferably 2 to 30 hours. Can be implemented.
- a tetrahaloarene represented by the general formula (6) As raw materials, a tetrahaloarene represented by the general formula (6), a 2-haloaryl metal reagent represented by the general formula (7), and a 2-haloaryl metal reagent represented by the general formula (8) are used.
- the amount of catalyst used relative to tetra halo arene of general formula (6), from 0.1 to 20 mole 0/0, preferably from 1 to 10 mol%.
- the amount of the 2-haloaryl metal reagent represented by the general formulas (7) and (8) is 0.5 to 1.5 equivalents, preferably 0.8 to 1 with respect to the tetrahaloarene represented by the general formula (6). It can be used in the range of 4 equivalents, more preferably 0.9 to 1.3 equivalents.
- the position at which the carbon-carbon bond is formed by the cross-coupling reaction of the tetrahaloarene represented by the general formula (6) and the 2-haloaryl metal reagent of the general formula (7) and Z or (8) is It can be controlled by the type of rogen.
- reaction position can be arbitrarily determined by utilizing the reactivity of these halogen types. wear.
- the production of only the tetrahaloterphenol derivative represented by the general formula (3) can be performed by arranging X 5 and X 6 of the general formula (6) at the para position with iodine as X 2 and X 3 This can be achieved by using bromine and / or chlorine.
- X 5 and X 6 in the general formula (6) are arranged at the meta position with iodine, and X 2 and X 3 are bromine and Z or This can be achieved by using chlorine.
- the method for producing only this specific positional isomer can also be applied to a method for producing a tetrano or oral terfel derivative having a substitution mode represented by the general formula (5).
- the tetrahaloterphenyl derivative represented by the general formula (2) of the present invention obtained by force can be further purified.
- the method for purification is not particularly limited, and examples thereof include column chromatography, recrystallization, or sublimation.
- the substituents R 3 , R 4 , R 1G and R 11 are the same or different and have 4 to 30 carbon atoms.
- the 2-haloaryl metal reagent represented by the general formula (7) is used in the above production method.
- the 2-haloaryl metal reagent represented by the general formulas (7) and (8) is prepared by using the aryl dihalogen-substituted product represented by the following general formula (10) as a raw material for the Grignard reagent such as isopropyl magnesium bromide or n -It can be prepared by reacting with zinc, trimethoxyborane, etc. after conducting a metal exchange reaction with an organolithium reagent such as butyl lithium.
- the halogen / metal exchange reaction using an organolithium reagent can be performed by, for example, the method described in “Journal of Chemical Research Synopsis”, 1981, page 185 ”.
- each of the substituents R 3 and R 4 in the 2-haloaryl metal reagent represented by (7), as well as the substituents R 1C) and R 1 1 at 2-haloaryl metal reagent represented by the general formula (8) can be produced by using each group selected from the above group strength.
- the aryl dihalogen-substituted product represented by the general formula (10) includes a tetrahaloarene represented by the following general formula (11) and a reactant represented by the following general formula (12) in palladium and Z or nickel. It can also be produced by a cross-coupling reaction in the presence of a catalyst.
- substituent X 7 represents an iodine atom or a bromine atom
- substituent X 8 represents an iodine atom, a bromine atom or a hydrogen atom
- substituent X 1 , R 2 , R 5 and R 6 , and symbol 1 have the same meanings as the substituent and symbol represented by formula (10).
- the substituents X 7 and X 8 are preferably iodine atoms.
- A is a hydrogen atom, a fluorine atom, a chlorine atom, an aryl group having 4 to 30 carbon atoms, an alkyl group having 2 to 20 carbon atoms, an alkyl group having 2 to 30 carbon atoms, or a carbon number of 1 to 20 represents an alkyl group, a halogenated alkyl group having 1 to 20 carbon atoms, or a diarylamino group having 8 to 30 carbon atoms, N represents a hydrogen atom, an alkali metal of Li, Na or K, Mg, B, Zn, Sn Or Si halide, hydride oxide, alkoxide or alkylated compound.
- the substituent X 7 of the tetrahaloarene represented by the general formula (11) and General formula having a desired substituent by introducing a desired substituent into X 8
- the substituent N in the general formula (12) is a hydrogen atom, an alkali metal of Li, Na or K, a halide of Mg, B, Zn, Sn or Si, a hydrated oxide, an alkoxide or an alkylated product, and As long as it is a group capable of reacting with palladium and Z or nickel catalyst of the above, and substituting for noradium and Z or nickel, or a group that becomes a halogen hydrogen in the course of the reaction, it is particularly limited.
- the reactant represented by the general formula (12) is, for example, a halogen Z metal obtained by using, as a raw material, an aryl reel-substituted product using a Grignard reagent such as isopropylmagnesium bromide or an organic lithium reagent such as n-butyllithium. After the exchange reaction, it can be suitably prepared by reacting with sodium chloride, trimethoxyborane or the like. Further, the reactant represented by the general formula (12) may be one kind or a mixture of two kinds.
- the catalyst used in the cross-coupling reaction of the tetrahaloarene represented by the general formula (11) and the reactant represented by the general formula (12) is not particularly limited as long as it is a palladium and Z or nickel catalyst.
- Examples thereof include palladium and Z or nickel catalysts used in the tetrahaloterphenol derivative represented by the general formula (2).
- a preferable catalyst is a zerovalent palladium compound, and a particularly preferable catalyst is tetrakis (triphenylphosphine) palladium.
- the amount of the catalyst used in the cross-coupling reaction is in the range of 0.1 to 20 mol% with respect to the tetrahaloarene of the general formula (11).
- the amount of the reactant of the general formula (12) used is 1.4 to 3.5 equivalents relative to the tetrahaloarene of the general formula (11) when one kind of the reactant of the general formula (10) is used.
- the tetrahaloarene of (11) can be used in the range of 0.6 to 1.8 equivalents, preferably 0.7 to 1.5 equivalents, more preferably 0.8 to 1.4 equivalents. .
- the two types of reactants can be present at the start of the reaction, or the first reaction It is also possible to add the agent and the second reactant after a period of time.
- the reaction is preferably carried out in a solvent.
- a solvent include the solvents used in the tetrahalter terferyl derivative represented by the general formula (2), and these solvents may be used alone or as a mixture of two or more. For example, it can also be used in 2- to 3-component systems such as toluene Z water and toluene Z ethanol Z water.
- a base can also be present in the reaction system. The type of base in this case is not particularly limited, and examples thereof include the base used in the tetrahaloterphenyl derivative represented by the general formula (2).
- phase transfer catalyst can be used in combination with these bases.
- the type of the phase transfer catalyst is not particularly limited, and examples thereof include the phase transfer catalyst used in the tetrahaloterphenyl derivative represented by the general formula (2).
- the amount of these phase transfer catalysts used is in the range of 0.1 to 1.5 equivalents, preferably 0.2 to 0.8 equivalents, relative to the tetrahaloarene of the general formula (11).
- phosphine such as triphenylphosphine may be present in the reaction system. These phosphines can be used in an amount of 0.9 to 8.0 equivalents, preferably 1.0 to 3.0 equivalents, relative to the palladium and Z or nickel catalyst.
- a copper compound may be present in the reaction system.
- the type of copper compound in this case is not particularly limited.
- monovalent copper such as copper chloride (1), copper bromide (1), copper iodide (1), copper acetate (I); copper chloride (11 ), Copper bromide (11), copper iodide (11), copper acetate (11), divalent copper such as acetyl acetylacetate copper ( ⁇ ), and the like.
- Monovalent copper is preferred, and copper (I) iodide is particularly preferred.
- These copper compounds may be used in an amount of 0.3 to L: 0.0 equivalents, preferably 0.6 to 6.0 equivalents with respect to the palladium and Z or nickel catalyst.
- the reaction temperature is 10 to 120 ° C, preferably 30 to 100 ° C, and the reaction time is suitably in the range of 1 to 72 hours.
- the position at which a bond is formed by the cross-coupling reaction of the tetrahaloarene represented by the general formula (11) and the reactant of the general formula (12) can be controlled by the type of halogen.
- reaction position can be arbitrarily determined by utilizing the reactivity of these halogen types. wear.
- the aryl dihalogen-substituted product represented by the general formula (10) is preferably produced in an inert atmosphere such as nitrogen or argon.
- aryl dihalogen substituents represented by the general formula (10) those in which the substituents R 3 and R 4 are combined to form a ring include, for example, “Synthesis”, 1988, 628— It can also be carried out by the method described on page 631.
- the aryl dihalogen-substituted product represented by the general formula (10) can be further purified.
- the method for purification is not particularly limited, and examples thereof include column chromatography, recrystallization, or a method using a brush.
- the oxidation-resistant organic semiconductor material is excellent in solubility in a solvent and oxidation resistance, and has suitable coating properties.
- the oxidation-resistant organic semiconductor material can be produced by dissolving the terferene derivative represented by the general formula (1) of the present invention in a solvent.
- the solvent used for dissolving the terferene derivative represented by the general formula (1) of the present invention is preferably a halogen-based solvent containing a halogen such as chlorine, such as o-dichlorobenzene, benzene, 1,2-dichloroethane, 1,1,2,2-tetrachloroethane, chlorophonol; ether solvents containing one or two oxygens, such as THF, dioxane; aromatic hydrocarbon solvents, such as toluene Xylene; ester solvents such as ethyl acetate, y-butyrate ratatones; amide solvents such as N, N-dimethylformamide, N-methylpyrrolidone; and the like. These solvents may be used alone or as a mixture of two or more. Of these, o-dichlorobenzene or toluene is preferred.
- a halogen such as chlorine, such as o-dichlorobenzene,
- the oxidation-resistant organic semiconductor material containing the terferene derivative represented by the general formula (1) is obtained by mixing and stirring the solvent listed above and the terferene derivative represented by the general formula (1).
- the temperature in this case is 10 to 200 ° C, preferably 20 ° C to 190 ° C. When the temperature is 10 ° C or higher, the concentration becomes suitable and a good thin film can be obtained.
- a solvent that can be used at normal pressure can be adopted, and at the same time, it is economically preferable. Obtained
- the concentration of the resulting solution is a force that can vary with solvent and temperature: 0.01 to: LO. 0% by weight.
- the solution can be prepared in air, preferably under an inert atmosphere such as nitrogen or argon.
- Evaluation of the oxidation resistance of the oxidation-resistant organic semiconductor material containing the terfenylene derivative represented by the general formula (1) can be carried out by a method of contacting the solution with air for a predetermined time.
- the solvent to be used is degassed in advance to remove dissolved oxygen.
- the appropriate contact time with air is a force of 0.5 minutes to 3 hours depending on the temperature.
- the progress of oxidation can be carried out by changing the color of the solution and detecting the oxides by gas chromatography and gas chromatography mass spectrum (GCMS) analysis.
- GCMS gas chromatography mass spectrum
- the terferene derivative itself represented by the general formula (1) used has an appropriate aggregation property. Therefore, since it can be dissolved in a solvent at a relatively low temperature and has acid resistance, it can be suitably applied to the production of an organic thin film by a coating method. That is, since it is not necessary to strictly remove air from the atmosphere, the coating process can be simplified. The application can be carried out in air, but it is preferably carried out in a nitrogen stream in consideration of drying of the solvent. In order to obtain suitable coating properties, the viscosity of the acid-resistant organic semiconductor material containing the terferene derivative represented by the general formula (1) of the present invention is in the range of 0.005 to 20 poise. Is preferred. (Organic thin film)
- an organic thin film using an oxidation-resistant organic semiconductor material containing the terfenylene derivative represented by the general formula (1) of the present invention will be described.
- Such an organic thin film can be produced by recrystallization of the above oxidation-resistant organic semiconductor material solution or application to a substrate.
- the thin film by recrystallization can be formed by cooling the oxidation-resistant organic semiconductor material solution.
- the atmosphere for producing the organic thin film is an inert gas such as nitrogen or argon, and air, but it is preferably performed under an inert gas such as nitrogen or argon.
- Concentration of turf two alkylene derivatives of the formula in the solution (1) is particularly limited nag For example 0.. 01 to:. L0 0 weight 0/0. Cooling is 60-200.
- the temperature power of C is 20-60. C, preferably by cooling between 10 ° C. and 40 ° C.
- the crystalline organic thin film produced in this way is laminated on a suitable substrate, that is, laminated.
- the film thickness of the thin film obtained by recrystallization is not particularly limited, but is preferably 50 nm to 2 mm, particularly preferably 1 ⁇ m to 500 ⁇ m.
- the production of a thin film by coating on a substrate can be carried out by applying the oxidation-resistant organic semiconductor material solution onto the substrate and then evaporating the solvent by a method such as heating, airflow, and natural drying. it can.
- the concentration of the terferene derivative represented by the general formula (1) in the solution is not particularly limited, but is preferably 0.01 to 10.0% by weight.
- the application temperature is not particularly limited, and can be preferably carried out, for example, between 20 ° C and 200 ° C.
- the specific method of application is not particularly limited, and known methods such as spin coating, cast coating, and dip coating can be used. Furthermore, it can be produced using printing techniques such as screen printing, ink jet printing, and gravure printing.
- the material of the substrate to be used is not particularly limited, and various crystalline and non-crystalline materials can be used.
- the substrate may be made of an insulating or dielectric material. Specific examples include plastic substrates such as polyethylene terephthalate, polymethylol methacrylate, polyethylene, polypropylene, polystyrene, cyclic polyolefin, polyimide, polycarbonate, polybutanol, polybutanol, etc .; glass, quartz, acid aluminum Inorganic material substrates such as silicon, silicon oxide, tantalum dioxide, tantalum pentoxide, and indium tin oxide; metal substrates such as gold, copper, chromium, and titanium can be preferably used.
- the surface of these substrates can be used even if they are modified with silanes such as otadecyltrichlorosilane and octadecyltrimethoxysilane or silylamines such as hexamethyldisilazane.
- the solvent can be removed by normal pressure or reduced pressure, or may be dried by heating or nitrogen flow.
- the crystal growth of the terfenylene derivative represented by the general formula (1) of the present invention can be controlled by adjusting the evaporation rate of the solvent.
- the thickness of the thin film obtained by coating on the substrate is not particularly limited, but is preferably 1 nm to 100 ⁇ m, particularly preferably 10 nm to 20 ⁇ m.
- the terferene derivative represented by the general formula (1) of the present invention has a molecular structure with high planar rigidity, it can be expected to give excellent semiconductor characteristics.
- the turf Len derivatives are dissolved in polar solvents such as dichroic benzene and are not easily oxidized by air even in solution. Therefore, a semiconductor thin film can be easily formed by a coating method. Therefore, the terferene derivative represented by the general formula (1) of the present invention is used for an organic semiconductor active phase of a transistor such as an electronic paper, an organic EL display, a liquid crystal display, or an IC tag, and further an organic EL display material, It can be used for organic semiconductor laser materials, organic thin film solar cell materials, or photonic crystal materials.
- a commercially available dehydrated solvent was used as the solvent for the reaction.
- this colorless and transparent oil is 2, 2 ', 4 ,, 2 "-tetrabromo-1
- the white needle crystals were 2, 2 ', 5', 2 "-tetrabromo-1, 1,, 4 ,, 1,, -terfale (0.47 g, 20% yield) ).
- Example 5 In a nitrogen atmosphere, 30 mg of dibenzoterphenylene having a golden metallic luster obtained in Example 5 was mixed with o-dichlorobenzene (95 g), stirred at 180 ° C for 1 hour, A solution was prepared. Cooled from 180 ° C to 20 ° C in 14 hours It was. The precipitated crystals were filtered using a Buchner funnel and dried under reduced pressure to obtain a dibenzophthalene thin film (27 mg).
- Example 5 In a nitrogen atmosphere, 8 mg of dibenzoterphenylene having a golden metallic luster obtained in Example 5 was mixed with odichlorobenzene (25 g), stirred at 180 ° C for 1 hour, and a dibenzoterphenol-blown solution of dibenzoterphenylene. Was prepared.
- a glass substrate having a concave surface was heated to 150 ° C in an air atmosphere, and the above solution was applied onto the substrate with a dropper and dried under normal pressure to produce a thin film having a thickness of 380 nm.
- gas chromatographic analysis of the components of this thin film it was found that the peak was not acidified except for dibenzoterferene. Therefore, it was proved that a thin film of dibenzoterferene can be produced without being oxidized in the air.
- the organic phase was concentrated under reduced pressure and the solvent was distilled off.
- the obtained residue was dissolved in 10 ml of toluene, 70% tert butyl hydride peroxide solution (manufactured by Wako Pure Chemical Industries, Ltd.) (0.1 ml) was added, and the mixture was stirred at room temperature for 2 hours. This solution was washed with water, and the organic phase was concentrated under reduced pressure.
- the acid resistance was evaluated using pentacene.
- the acid resistance was evaluated using terferene obtained in Reference Example 1 in which all substituents were hydrogen.
- 2-ferro- 5 bromo-4-biphenylboronic acid 156 mg synthesized in the same manner as synthesis example 5, 1,4 dibromo-1,2,5-jodobenzene 194 mg synthesized in synthesis example 1 (0.40 mmol), tetrakis (triphenylphosphine) palladium (manufactured by Tokyo Chemical Industry Co., Ltd.) 32 mg (0.028 mmol), toluene 3.1 ml, and ethanol 0.7 ml were added.
- a terferene derivative having excellent oxidation resistance and capable of forming a semiconductor active phase by a coating method and its use Furthermore, in the production method of the present invention, a terferene derivative into which a fluorine atom is introduced can be produced, and an organic semiconductor material can be provided. Therefore, the industrial value of the present invention is remarkable.
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EP06730300.8A EP1867623B1 (en) | 2005-04-08 | 2006-03-28 | Terphenylene derivatives, tetrahaloterphenyl derivatives and processes for the production of both |
US11/910,759 US7985885B2 (en) | 2005-04-08 | 2006-03-28 | Terphenylene derivative, tetrahaloterphenyl derivative, and processes for producing both |
KR1020077022933A KR101253583B1 (ko) | 2005-04-08 | 2006-03-28 | 터페닐렌 유도체, 테트라할로터페닐 유도체 및 이들의제조방법 |
JP2007512766A JP5061896B2 (ja) | 2005-04-08 | 2006-03-28 | ターフェニレン誘導体、テトラハロターフェニル誘導体及びそれらの製造方法 |
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JP2005-366667 | 2005-12-20 | ||
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US (1) | US7985885B2 (ja) |
EP (1) | EP1867623B1 (ja) |
JP (1) | JP5061896B2 (ja) |
KR (1) | KR101253583B1 (ja) |
WO (1) | WO2006109569A1 (ja) |
Cited By (5)
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JP2008247853A (ja) * | 2007-03-30 | 2008-10-16 | Tosoh Corp | ターフェニレン誘導体の製造方法 |
JP2009143835A (ja) * | 2007-12-13 | 2009-07-02 | Tosoh Corp | ヘテロアセン誘導体、(テトラハロ)ジアリールチエノチオフェン誘導体及びそれらの製造方法 |
WO2018181462A1 (ja) * | 2017-03-31 | 2018-10-04 | 東ソー株式会社 | 芳香族化合物、有機半導体層、及び有機薄膜トランジスタ |
JP2018174322A (ja) * | 2017-03-31 | 2018-11-08 | 東ソー株式会社 | 芳香族化合物、有機半導体層、及び有機薄膜トランジスタ |
JP2020029450A (ja) * | 2018-03-27 | 2020-02-27 | 東ソー株式会社 | 芳香族化合物の製造方法 |
Families Citing this family (4)
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WO2008026602A1 (fr) * | 2006-08-28 | 2008-03-06 | Tosoh Corporation | Dérivé hétéroacène, dérivé tétrahalotérphényle, et leurs procédés de production |
JP5272345B2 (ja) * | 2006-08-28 | 2013-08-28 | 東ソー株式会社 | ヘテロアセン誘導体、テトラハロターフェニル誘導体及びそれらの製造方法 |
KR102139406B1 (ko) * | 2017-07-03 | 2020-07-29 | 주식회사 엘지화학 | 할로아릴계 화합물의 연속식 제조방법 |
CN113277493A (zh) * | 2021-01-27 | 2021-08-20 | 同济大学 | 一种氢取代石墨单炔薄膜及其制备方法和应用 |
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2008247853A (ja) * | 2007-03-30 | 2008-10-16 | Tosoh Corp | ターフェニレン誘導体の製造方法 |
JP2009143835A (ja) * | 2007-12-13 | 2009-07-02 | Tosoh Corp | ヘテロアセン誘導体、(テトラハロ)ジアリールチエノチオフェン誘導体及びそれらの製造方法 |
WO2018181462A1 (ja) * | 2017-03-31 | 2018-10-04 | 東ソー株式会社 | 芳香族化合物、有機半導体層、及び有機薄膜トランジスタ |
JP2018174322A (ja) * | 2017-03-31 | 2018-11-08 | 東ソー株式会社 | 芳香族化合物、有機半導体層、及び有機薄膜トランジスタ |
JP7159586B2 (ja) | 2017-03-31 | 2022-10-25 | 東ソー株式会社 | 芳香族化合物、有機半導体層、及び有機薄膜トランジスタ |
JP2020029450A (ja) * | 2018-03-27 | 2020-02-27 | 東ソー株式会社 | 芳香族化合物の製造方法 |
JP7279412B2 (ja) | 2018-03-27 | 2023-05-23 | 東ソー株式会社 | 芳香族化合物の製造方法 |
Also Published As
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US7985885B2 (en) | 2011-07-26 |
EP1867623B1 (en) | 2017-05-10 |
EP1867623A4 (en) | 2014-06-18 |
US20090023957A1 (en) | 2009-01-22 |
JPWO2006109569A1 (ja) | 2008-10-30 |
KR101253583B1 (ko) | 2013-04-11 |
JP5061896B2 (ja) | 2012-10-31 |
KR20070118242A (ko) | 2007-12-14 |
EP1867623A1 (en) | 2007-12-19 |
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