WO2006108137A3 - Glass inspection systems and methods for using same - Google Patents

Glass inspection systems and methods for using same Download PDF

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Publication number
WO2006108137A3
WO2006108137A3 PCT/US2006/013012 US2006013012W WO2006108137A3 WO 2006108137 A3 WO2006108137 A3 WO 2006108137A3 US 2006013012 W US2006013012 W US 2006013012W WO 2006108137 A3 WO2006108137 A3 WO 2006108137A3
Authority
WO
WIPO (PCT)
Prior art keywords
methods
inspection systems
same
glass inspection
glass
Prior art date
Application number
PCT/US2006/013012
Other languages
French (fr)
Other versions
WO2006108137A2 (en
Inventor
Leon R Zoeller Iii
Original Assignee
Corning Inc
Leon R Zoeller Iii
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Inc, Leon R Zoeller Iii filed Critical Corning Inc
Priority to EP06749504A priority Critical patent/EP1866625A4/en
Priority to JP2008505569A priority patent/JP2008536127A/en
Priority to CN200680016105XA priority patent/CN101175986B/en
Publication of WO2006108137A2 publication Critical patent/WO2006108137A2/en
Publication of WO2006108137A3 publication Critical patent/WO2006108137A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G01N2021/177—Detector of the video camera type
    • G01N2021/1772—Array detector
    • G01N2021/1774—Line array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G01N2021/8965—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod using slant illumination, using internally reflected light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G01N2201/0612—Laser diodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0635—Structured illumination, e.g. with grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0638—Refractive parts

Abstract

Several different inspection systems (100) and methods are described herein that identify defects (e.g. inclusions, occlusions, scratches, stains, blisters, cords or other imperfections associated with surface discontinuities or materal non-homogeneities) on or within a lass sheet 110 .
PCT/US2006/013012 2005-04-06 2006-04-06 Glass inspection systems and methods for using same WO2006108137A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP06749504A EP1866625A4 (en) 2005-04-06 2006-04-06 Glass inspection systems and methods for using same
JP2008505569A JP2008536127A (en) 2005-04-06 2006-04-06 Glass inspection apparatus and method of use thereof
CN200680016105XA CN101175986B (en) 2005-04-06 2006-04-06 Glass inspection systems and methods for using same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US66917105P 2005-04-06 2005-04-06
US60/669,171 2005-04-06

Publications (2)

Publication Number Publication Date
WO2006108137A2 WO2006108137A2 (en) 2006-10-12
WO2006108137A3 true WO2006108137A3 (en) 2006-11-16

Family

ID=37074107

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/013012 WO2006108137A2 (en) 2005-04-06 2006-04-06 Glass inspection systems and methods for using same

Country Status (6)

Country Link
EP (1) EP1866625A4 (en)
JP (1) JP2008536127A (en)
KR (1) KR20070121820A (en)
CN (1) CN101175986B (en)
TW (1) TWI360652B (en)
WO (1) WO2006108137A2 (en)

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JP2010048745A (en) * 2008-08-25 2010-03-04 Asahi Glass Co Ltd Defect inspection system and defect inspection method
KR101292570B1 (en) 2008-12-31 2013-08-12 엘지디스플레이 주식회사 System for testing distortion of liquid crystal display device
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CN102081047B (en) * 2009-11-27 2015-04-08 法国圣-戈班玻璃公司 Method and system for distinguishing defects of substrate
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CN103868478A (en) * 2014-04-01 2014-06-18 四川虹视显示技术有限公司 Rapid detection method and device for flatness of transparent flat plate
CN103913466A (en) * 2014-04-08 2014-07-09 上海华力微电子有限公司 Detection device and detection method for wafer defect
KR101942260B1 (en) 2014-07-03 2019-01-28 (주)엘지하우시스 Method of detecting corrosion of glass substrate
KR101952617B1 (en) * 2014-07-03 2019-02-28 (주)엘지하우시스 Method of detecting corrosion of glass substrate
CN104297264A (en) * 2014-11-03 2015-01-21 苏州精创光学仪器有限公司 Glass surface blemish on-line detecting system
EP3234591B1 (en) * 2014-12-19 2019-06-19 Merck Patent GmbH Method and device for optically sensing a chromatographic specimen
KR20180033186A (en) * 2015-06-19 2018-04-02 코닝 인코포레이티드 Method and apparatus for inspecting a substrate for defects and locating such defects in three dimensions using optical techniques
CN105372253A (en) * 2015-12-14 2016-03-02 陈艳 Light tube defect detection system
CN107132244B (en) * 2016-02-29 2020-01-07 鞍钢股份有限公司 Quantitative evaluation method for inclusions in steel
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KR102537558B1 (en) 2016-11-02 2023-05-26 코닝 인코포레이티드 Method and apparatus for inspecting defects on a transparent substrate
KR102492294B1 (en) 2016-11-02 2023-01-27 코닝 인코포레이티드 Defect inspection method and device on a transparent substrate, and incident light irradiation method
CN106556573B (en) * 2016-11-17 2018-01-12 仝宁瑶 A kind of experimental provision for being used to determine glass refraction
TWI622764B (en) * 2017-01-11 2018-05-01 由田新技股份有限公司 An automatic optical inspecting system for particle inspection from the surface
JP6796704B2 (en) * 2017-02-28 2020-12-09 東洋ガラス株式会社 Container inspection device and container inspection method
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Also Published As

Publication number Publication date
TWI360652B (en) 2012-03-21
CN101175986A (en) 2008-05-07
EP1866625A2 (en) 2007-12-19
TW200706859A (en) 2007-02-16
EP1866625A4 (en) 2010-12-29
JP2008536127A (en) 2008-09-04
CN101175986B (en) 2010-10-13
KR20070121820A (en) 2007-12-27
WO2006108137A2 (en) 2006-10-12

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