WO2006041027A1 - 機能基板 - Google Patents
機能基板 Download PDFInfo
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- WO2006041027A1 WO2006041027A1 PCT/JP2005/018621 JP2005018621W WO2006041027A1 WO 2006041027 A1 WO2006041027 A1 WO 2006041027A1 JP 2005018621 W JP2005018621 W JP 2005018621W WO 2006041027 A1 WO2006041027 A1 WO 2006041027A1
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- WIPO (PCT)
- Prior art keywords
- partition wall
- functional
- substrate
- organic
- partition
- Prior art date
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
- H10K71/13—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
- H10K71/135—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing using ink-jet printing
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/26—Light sources with substantially two-dimensional radiating surfaces characterised by the composition or arrangement of the conductive material used as an electrode
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/122—Pixel-defining structures or layers, e.g. banks
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/20—Changing the shape of the active layer in the devices, e.g. patterning
- H10K71/231—Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers
- H10K71/233—Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers by photolithographic etching
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
Definitions
- the present invention relates to a functional substrate represented by an organic EL element, a color filter substrate, and the like.
- an organic-electric-mouth luminescent element (hereinafter sometimes referred to as "organic EL element”) can be given.
- an organic EL element includes an active matrix substrate having a plurality of pixel electrodes arranged in a matrix on the surface, a partition (bank) that partitions each pixel electrode, and a plurality of pixels.
- each of the organic EL light emitting layers forms a pixel.
- Organic EL elements can be broadly classified according to the type of organic functional layer. Specifically, it can be broadly classified into low molecular organic EL (OLED) elements mainly composed of low molecular organic materials and polymer organic EL (PLED) elements mainly composed of high molecular organic materials. Among these, in the high molecular organic EL element, the organic functional layer is generally formed by a wet coating method such as an ink jet method (for example, Patent Document 1).
- Patent Document 1 Japanese Patent Application Laid-Open No. 2000-353594
- FIG. 6 is a schematic sectional view for explaining a process of forming the organic functional layer 120 by an ink jet method which is a kind of wet coating method.
- the organic functional layer 120 is formed by the following process. That is, the organic functional layer 120 drops an ink droplet containing a material (for example, a light emitting material) for forming the organic functional layer 120 on the active matrix substrate 110 on which the partition wall 130 is formed, and is heated and dried. It is formed by doing.
- a material for example, a light emitting material
- the drying of the ink droplets starts from the vicinity of the slope (slope) 131 of the partition wall 130.
- the ink droplet has a shape S5 that is greatly raised.
- the ink droplet shape gradually changes from S5 to S6 and from S6 to S7.
- the drying of the solvent in the ink droplet does not progress so much, and the viscosity of the ink droplet is relatively low. For this reason, the organic material in the ink droplet hardly adheres to the slope 131 at the stage where the ink droplet is dried up to the shape S6.
- the organic material in the ink droplet begins to adhere to the inclined surface 131 of the partition wall 130 on the inclined surface 131. This is because the solvent in the ink droplets has been dried and the viscosity of the ink droplets (particularly in the vicinity of the contact surface with the slope of the partition wall 130) has increased. As the ink droplets are further dried, the viscosity of the ink droplets gradually increases, and the amount of organic material in the ink droplets attached to the partition wall slope 131 also increases. Therefore, as shown in FIG. 6, the organic functional layer 120 is formed in a concave shape in which the layer thickness near the partition wall 130 is thicker than the central layer (pixel portion). This phenomenon is generally called “pinning”.
- the organic functional layer 120 In the organic functional layer 120, more current flows in the central portion where the layer thickness is thin than in the peripheral portion where the layer thickness is thick. In other words, most of the current flowing through the organic functional layer 120 flows centrally in the organic functional layer 120. For this reason, the deterioration rate of the central portion of the organic functional layer 120 is faster than the deterioration rate of the peripheral portion. Therefore, there is a problem that the lifetime of the organic EL element is shortened when the pying occurs.
- the difference between the layer thickness of the central portion of the organic functional layer 120 and the layer thickness of the peripheral portion becomes more prominent, and a desired layer is formed in the central portion of the organic functional layer 120. Thickness cannot be obtained. For this reason, there is a problem that a sufficiently high emission luminance cannot be obtained and a desired image display quality cannot be obtained.
- the present invention has been made in view of the above points, and an object of the present invention is to provide a functional substrate such as an organic EL element having a functional layer having a uniform layer thickness (no layer thickness unevenness). That is true.
- a functional substrate according to the present invention includes a substrate body, a plurality of functional layers arranged in a predetermined pattern on the substrate body, and partition walls that divide the plurality of functional layers.
- the partition wall includes at least a first partition wall portion having a substantially trapezoidal cross section provided on the substrate body and a second partition wall portion having a substantially trapezoidal cross section provided on the first partition wall portion.
- the partition walls are formed such that the length of the lower base in the cross section of the second partition wall portion is shorter than the length of the upper base in the cross section of the first partition wall portion.
- the partition may contain an organic material! / ⁇ .
- it may contain one type or two or more types of resin selected from the group consisting of polyimide resin, acrylic resin, and novolac resin.
- the slope and the top surface of the partition wall have liquid repellency.
- the surface of the partition wall may be made liquid-repellent by including a liquid-repellent material in the partition wall.
- the partition wall is preferably formed so that its height is greater than 1 m.
- the height of the first partition wall is formed to be smaller than 1.5 m.
- the functional layer preferably contains a polymer organic material. Further, the functional layer may be formed by a wet coating method.
- the “wet coating method” refers to a method of forming a thin film using an ink in which a thin film forming material is dissolved in a solvent (water, organic solvent, etc.). Specific examples include an inkjet method, a printing method, a spin coating method, and the like.
- “contact angle” refers to a value measured using a CA-W (automatic contact angle meter) manufactured by Kyowa Interface Science Co., Ltd.
- the functional layer may be a color filter layer, an organic electoluminescent layer, a conductive layer, an organic semiconductor layer, a lens layer, or the like. That is, the functional substrate according to the present invention has a color filter. It may be a filter substrate, an organic electoluminescence device, a circuit substrate, an organic semiconductor substrate (for example, an organic thin film transistor substrate), a microlens array substrate, or the like.
- the display panel according to the present invention has a functional substrate.
- the functional substrate includes a substrate body, a plurality of display medium layers arranged in a predetermined pattern on the substrate body, and partition walls that divide the plurality of display medium layers.
- the partition wall has at least a first partition wall portion having a substantially trapezoidal cross section provided on the substrate body and a second partition wall portion having a substantially trapezoidal cross section provided on the first partition wall portion.
- the partition wall is formed such that the length of the lower base in the cross section of the second partition wall portion is shorter than the length of the upper base in the cross section of the first partition wall portion.
- the display device includes a functional substrate.
- the functional substrate includes a substrate body, a plurality of display medium layers arranged in a predetermined pattern on the substrate body, and partition walls that divide the plurality of display medium layers.
- the partition wall has at least a first partition wall portion having a substantially trapezoidal cross section provided on the substrate body and a second partition wall portion having a substantially trapezoidal cross section provided on the first partition wall portion.
- the partition wall is formed such that the length of the lower base in the cross section of the second partition wall portion is shorter than the length of the upper base in the cross section of the first partition wall portion.
- the “display medium layer” refers to a layer in which light transmittance or light reflectance is modulated by a potential difference between electrodes facing each other, or opposed to each other. A layer that emits light by current flowing between electrodes.
- Specific examples of the display medium layer include, for example, a liquid crystal layer, an inorganic or organic electoric luminescent layer, a light emitting gas layer, an electrophoretic layer, and an electoric chromic layer.
- the manufacturing method according to the present invention is a method for manufacturing the functional substrate according to the present invention, and includes a step of forming a film on the substrate body and half-exposure to the film to form a partition wall. Process.
- FIG. 1 is a schematic sectional view of an organic EL element 1 (organic EL element) according to an embodiment.
- FIG. 2 is a front view of the organic EL element 1 in which the side force of the sealing substrate 60 is also viewed.
- FIG. 3 is a detailed cross-sectional view of a portion surrounded by a dotted line ⁇ in FIG.
- FIG. 4 is a schematic cross-sectional view for explaining a step of forming a hole transport layer 21 by dropping ink droplets.
- FIG. 5 is a schematic cross-sectional view of an active matrix substrate 10 on which partition walls 30 are formed.
- FIG. 6 is a schematic sectional view for explaining a step of forming the organic functional layer 120 by an ink jet method.
- FIG. 1 is a schematic cross-sectional view of an organic EL element 1 (organic EL element) according to an embodiment.
- FIG. 2 is a front view showing the side force of the sealing substrate 60 of the organic EL element 1.
- FIG. 3 is a detailed cross-sectional view of a portion surrounded by a dotted line ⁇ in FIG.
- the sealing substrate 60 and the upper common electrode 40 are not drawn in FIG. In FIG. 3, the upper common electrode 40 is not drawn.
- the organic EL element 1 includes an active matrix substrate (substrate body) 10 in which a plurality of pixel electrodes 19 are arranged in a matrix, a plurality of organic functional layers 20, a partition wall (bank) 30, and an upper common electrode. An electrode 40, a sealing substrate 60, and a seal 50 are provided. Each of the plurality of organic functional layers 20 arranged in a matrix form a pixel. As shown in FIG. 3, the active matrix substrate 10 includes a substrate body 11, a plurality of source lines 12, a plurality of gate lines 13, a plurality of TFTs 14, a plurality of pixel electrodes 19, and a flat film 18. And.
- the substrate body 11 has a function of ensuring the mechanical durability of the organic EL element 1 and a function of suppressing moisture and oxygen from entering the organic functional layer 20 and the like from the outside.
- the substrate body 11 may be an insulating inorganic substrate such as a glass substrate, a quartz substrate, a ceramic substrate (for example, an alumina ceramic substrate), a plastic substrate (for example, a polyethylene terephthalate substrate), or the like.
- a metal substrate such as aluminum or iron is made of SiO (silica gel)
- the substrate body 11 is preferably formed of a material having high light transmittance such as glass or plastic.
- the plurality of source lines (data signal lines) 12 are formed to extend in parallel to each other. Each source line 12 is electrically connected to the TFT 14, and data is transmitted to each TFT 14. Enter the number.
- the plurality of gate lines (scanning signal lines) 13 are formed to extend in parallel with each other at an angle in the direction in which the source line 12 extends. Each gate line 13 is electrically connected to the TFT 14 and inputs a scanning signal to each TFT 14. Each TFT 14 supplies a current to the pixel electrode 19 based on the data signal and the scanning signal input from the source line 12 and the gate line 13, respectively.
- the source line 12 and the gate line 13 can be formed of a conductive material (for example, a conductive metal) such as aluminum (A1), tantalum (Ta), or tungsten (W).
- the TFT 14 has a gate line (gate metal) 13, an island-like semiconductor 16 provided thereon, a gate insulating film 15, and a drain electrode 17 provided on the island-like semiconductor 16.
- the gate insulating film 15 has a function of insulating the gate line 13 and the island-shaped semiconductor 16 from each other and ensuring the withstand voltage of the TFT 14.
- the gate insulating film 15 can be composed of a silicon film, a silicon nitride film, a tantalum oxide film, or the like. Further, it may be formed of a stack of an oxide silicon film, a silicon nitride film, and an oxide silicon film.
- the island-like semiconductor 16 can be formed of polysilicon (Si) or the like.
- the drain electrode 17 is made of aluminum or the like and is electrically connected to the pixel electrode 19.
- the TFT 14 has a bottom gate structure.
- the present invention is not limited to this, and may have a top gate structure, for example.
- other switching elements such as MIM (Metal Insulator Metal) diodes may be used instead of TFT14.
- the flat film 18 has a function of flattening one surface (the upper surface in FIG. 3) of the active matrix substrate 10.
- the pixel electrode 19, the organic functional layer 20, and the like formed on the flattening film 18 can be formed flat.
- the planarizing film 18 can be formed of a resin material such as acrylic, novolac, or polyimide.
- a plurality of pixel electrodes 19 are arranged in a predetermined arrangement (for example, in a matrix) on the flat film 18.
- the pixel electrode 19 can be formed of a metal material, an alloy, a conductive oxide, or the like.
- the metal materials include silver (Ag), aluminum (A1), vanadium (V), cobalt (Co), nickel (Ni), tungsten (W), gold (Au), calcium (Ca), Titanium (Ti), Yttrium (Y), Sodium (Na), Ruthenium (Ru), Manganese (Mn), Indium (In), magnesium (Mg), lithium (Li), ytterbium (Yb), lithium fluoride (LiF), and the like.
- Alloys include magnesium (Mg) Z copper (Cu), magnesium (Mg) Z silver (Ag), sodium (Na) Z potassium (K), astatine (At) Z acid ⁇ astatine (AtO), lithium (Li ) Z Aluminum (A1), Lithium (Li) Z Calcium (Ca) Z Aluminum
- the conductive oxide include tin oxide (SnO), zinc oxide (ZnO), indium tin oxide (ITO), and indium zinc oxide (IZO). From the viewpoint of realizing high hole injection efficiency from the pixel electrode 19 to the organic functional layer 20, among these materials, for example, indium tin oxide (ITO), indium zinc oxide (IZO), etc. Larger materials are more preferred.
- the pixel electrode 19 is preferably formed of a light transmissive material such as indium stannate (ITO).
- ITO indium stannate
- the pixel electrode 19 is formed of a light reflective material such as aluminum (A1). , Prefer to be.
- the layer thickness of the pixel electrode 19 is preferably 50 nm or more and 500 nm or less. If it is smaller than 50 nm, the desired film strength cannot be obtained, and the desired resistance value cannot be obtained. If it is larger than 500 nm, the pixel electrode 19 may be peeled off.
- the pixel electrode 19 may be subjected to a lyophilic process.
- a lyophilic treatment By performing the lyophilic treatment, the affinity between the pixel electrode 19 and the organic functional layer 20 is improved, so that the organic functional layer 20 having a more uniform layer thickness can be formed.
- lyophilic treatment UV / O treatment
- lyophilic treatment refers to a treatment for imparting lyophilicity.
- lyophilic refers to the property that the contact angle between the ink droplet and the pixel electrode 19 for forming the organic functional layer by the wet coating method is 20 degrees or less.
- the pixel electrode 19 is formed in a substantially rectangular shape, but the pixel electrode 19 may be formed in a circular shape, an elliptical shape, or the like.
- the organic functional layer 20 provided on each pixel electrode 19 includes a hole transport layer 21 formed on the pixel electrode 19 and an organic EL light emitting layer 22 formed on the hole transport layer 21. Yes.
- the organic functional layer 20 is not limited to this configuration.
- the organic functional layer 20 may be composed of only the organic EL light emitting layer 22.
- the organic EL light emitting layer 22 may be composed of one or more layers selected from a hole injection layer, a hole transport layer 21, an electron injection layer, and an electron transport layer.
- the hole transport layer 21 has a function of improving the hole transport efficiency from the pixel electrode 19 to the organic EL light emitting layer 22.
- hole transport materials for forming the hole transport layer 21 include porphyrin derivatives, aromatic tertiary amine compounds, styrylamine derivatives, polyvinyl carbazole, poly p-phenolene vinylene, polysilane, triazole derivatives, oxadiazole derivatives, Imidazole derivatives, polyarylalkane derivatives, pyrazoline derivatives, pyrazolone derivatives, furylenediamine derivatives, arylamine derivatives, amine-substituted chalcone derivatives, oxazole derivatives, styrylanthracene derivatives, fluorenone derivatives, hydrazone derivatives, stilbene derivatives, hydrogenated amorphous silicon, Hydrogenated amorphous silicon carbide, zinc sulfide, selenium zinc and the like.
- the organic EL light emitting layer 22 has a function of emitting light by recombining holes injected from the pixel electrode 19 and electrons injected from the upper common electrode 40.
- the light-emitting materials for forming the organic EL light-emitting layer 22 include metal oxinoid compounds [8-hydroxyquinoline metal complexes], naphthalene derivatives, anthracene derivatives, diphenylethylene derivatives, vinylacetone derivatives, triphenylamine derivatives, butadiene derivatives, coumarins.
- the partition walls 30 are formed in a lattice shape in a plan view, and a plurality of pixel electrodes 19 and a plurality of organic electrodes arranged in a matrix on the active matrix substrate 10.
- Each functional layer 20 is partitioned.
- the shape of the opening of the partition wall 30 (the portion where the pixel electrode 19 is exposed) has a substantially rectangular corner.
- a substantially rectangular shape means a rectangular shape or a rectangular shape with obtuse corners.
- making the corner obtuse means that the corner is composed of an angle (more than one) or a curve exceeding 90 degrees.
- the corner may be constituted by a combination of a curve and an obtuse angle.
- the partition wall 30 includes a first partition wall portion 32 provided on the active matrix substrate 10 and a second partition wall portion provided on the first partition wall portion 32.
- Each of the first partition wall 32 and the second partition wall has a substantially trapezoidal cross section (hereinafter, the “substantially trapezoid formed by the cross section of the first partition wall 32” is referred to as “substantially trapezoid a”), The “substantially trapezoid formed by the cross section of the part 31” is referred to as “substantially trapezoid b”).
- a part of the top surface 32b of the first partition wall portion 32 is exposed at the upper base of the substantially trapezoid a, which is longer than the lower bottom of the substantially trapezoid b.
- the first partition wall portion 32 and the second partition wall portion 31 are formed so as to form a step.
- the height of the partition wall 30 is preferably larger than 1 ⁇ m. More preferably, it is 1.5 ⁇ m or more.
- the height of the first partition wall 32 is preferably less than 1.5 m. More preferably, it is 1 m or less.
- At least the surface of the partition wall 30 preferably has liquid repellency.
- the method for manufacturing the partition wall 30 having liquid repellency on the surface include a method of forming the partition wall 30 using a material having liquid repellency and a method of applying a liquid repellency treatment to the partition wall 30.
- the liquid repellency treatment refers to a treatment that imparts liquid repellency. A state where the contact angle force between the ink droplet and the partition wall 30 for forming the organic functional layer 20 by the wet coating method is 0 degree or more is called “liquid repellency”.
- the partition wall 30 can be formed of an organic material.
- organic materials it is preferably formed of, for example, polyimide resin, acrylic resin, novolac resin, or a mixed resin thereof.
- Polyimide resin, acrylic resin, and novolac resin have good heat resistance (thermal stability) among organic materials, and are not easily degassed, discolored, altered, or deformed. Therefore, the stability of the partition wall 30 can be improved by including one type or two types or more of selected types of resin including polyimide resin, acrylic resin, and novolac resin.
- an organic EL element 1 having a long product life can be realized.
- the upper common electrode 40 has a function of injecting electrons into the organic functional layer 20.
- the upper common electrode 40 is, for example, silver (Ag), aluminum (A1), vanadium (V), connort (Co), nickel (Ni), tungsten (W), gold (Au), calcium (Ca).
- Alloys such as (Li) Z aluminum (A1), lithium (Li) Z calcium (Ca) Z aluminum (A1), or lithium fluoride (LiF) Z calcium (Ca) Z aluminum (A1) (SnO), acid zinc (ZnO), or conductive oxide such as indium stannate (ITO) or indium zinc oxide (IZO) may be used.
- the upper common electrode 40 may be formed by laminating a plurality of layers having these material forces.
- Materials with a low work function include magnesium (Mg), lithium (Li), lithium fluoride (LiF), magnesium (Mg) Z copper (Cu), magnesium (Mg) Z silver (Ag), sodium ( Na) Z potassium (K), lithium (Li) Z aluminum (A1), lithium (Li) Z calcium (Ca) Z aluminum (A1), or lithium fluoride (Li F) Z calcium (Ca) Z Examples include aluminum (A1).
- the organic EL element 1 is a so-called top emission method in which the side force of the upper common electrode 40 also takes out light from the organic EL light emitting layer 22
- the upper common electrode 40 is preferably formed of a light-transmitting material such as indium stannate (ITO).
- ITO indium stannate
- the organic EL element 1 is a so-called bottom emission method in which light from the organic EL light emitting layer 22 is extracted from the substrate body 11 side
- the upper common electrode 40 is formed of a light reflective material such as aluminum (A1). It is preferable to do this.
- the sealing substrate 60 has a function of preventing oxygen and moisture from entering the organic functional layer 20 and the like.
- the sealing substrate 60 can be formed of a glass substrate, a quartz substrate, or the like. Sealing substrate 60 is bonded and fixed by a seal 50.
- the material of the seal 50 is preferably a material having low oxygen permeability and moisture permeability such as epoxy resin.
- UV is applied to the pixel electrodes 19 arranged in a matrix on the active matrix substrate 10.
- the affinity and adhesion between the hole transport layer 21 and the pixel electrode 19 can be improved.
- a hole transport layer 21 having a uniform layer thickness can be realized.
- a resin film made of polyimide or the like is formed on the active matrix substrate 10 using a spin coating method or the like.
- the resin film is half-exposed and etched into a desired shape to form the partition walls 30.
- “Half exposure” is a process in which a portion of the exposed portion of the photosensitive resin film exposed on completion of development (the surface opposite to the exposed surface of the photosensitive resin film) remains to some extent. That means. In other words, it is a process in which exposure is performed so that the lower layer of the photosensitive resin film is not exposed.
- the second partition wall 31 is formed by exposing with an appropriate exposure amount.
- the entire upper part of the area where the partition wall 30 is formed is shielded with a photomask or the like, and exposed completely in that state (that is, with an exposure amount that completely eliminates the photosensitive resin during development).
- the partition wall 30 composed of the second partition wall portion 31 and the first partition wall portion 32 can be completed.
- the first partition wall 32 and the second partition wall 31 can be formed from the same resin film. Therefore, compared with the case where the first partition wall portion 32 and the second partition wall portion 31 are formed from separate thin films, the formation process of the resin film and the development process can be reduced, so that the organic EL element 1 Manufacturing cost can be reduced.
- the formed partition wall 30 is subjected to a liquid repellency treatment.
- the liquid repellent treatment include fluorine plasma treatment such as carbon tetrafluoride (C F) plasma treatment. Carbon tetrafluoride (CF) bra
- the treatment time can be appropriately determined depending on the material of the partition wall 30 preferably between 20 seconds and 30 minutes.
- the output is in the range of 10: LOOOWZm 2 It is preferable.
- the partition wall 30 may contain a liquid repellent material (additive).
- the partition wall 30 may be formed of a material having liquid repellency.
- the liquid repellent material (additive) include a fluorine-based material, a silica-based material, and a polyimide resin having a methyl group or a fluorine group introduced into the side chain.
- the fluorine-based material include fluorination power, sodium hexafluoride sodium, sodium fluoride, sodium monofluorophosphate, fluoroethylene, and the like.
- silica-based materials include polysilazane and tetraethoxysilane.
- the degree of freedom in selecting the material of the partition wall 30 is increased, and the degree of freedom in the production method is increased. Can be used.
- the partition wall 30 is formed of a material having liquid repellency, it is not necessary to perform a liquid repellency treatment process, so that the manufacturing process can be simplified and the organic EL element 1 can be easily formed. Can be manufactured.
- the hole transport layer 21 is formed on the plurality of pixel electrodes 19 partitioned by the partition walls 30 by a wet coating method such as an ink jet method. Specifically, the hole transport layer 21 is formed by dropping an ink in which the hole transport material is dissolved (or dispersed) in a solvent into each region partitioned by the partition walls 30 and drying. For drying, it is preferable to heat at 150 ° C to 250 ° C for 0.5 to 120 minutes using a hot plate or oven.
- Solvents that dissolve (or disperse) the hole transport material include toluene, o-xylene, m-xylene, p-xylene, ethylbenzene, hemimeritene [1, 2, 3 trimethylbenzene], pseudocumene [1, 2, 4 trimethyl] Benzene], mesitylene [1, 3, 5 trimethylbenzene], tamen [isopropylbenzene], pre-tene [1, 2, 3, 4-tetramethylbenzen], isodurene [1, 2, 3, 5-tetra Methylbenzene], durene [1, 2, 4, 5-tetramethylbenzene], p-cymene [isopropyltoluene], tetralin [1, 2, 3, 4-tetrahydronaphthalene], cyclohexylbenzene, melitene [hexamethyl] Benzene], methanol, ethanol, 1 propanol, 2-propanol [IPA;
- FIG. 4 is a schematic cross-sectional view for explaining the process of forming the hole transport layer 21 by dropping ink droplets.
- the shape S1 indicated by the broken line in FIG. 4 is the shape of the ink droplet immediately after dropping. As shown in Fig. 4, as the ink droplet dries, the volume decreases, and the shape force changes from S3 to S3, and from S3 to S4.
- the cross-sectional width of the bottom surface of the second partition wall portion 31 is made shorter than the cross-sectional width of the top surface of the first partition wall portion 32, and a step structure
- the slope 31a of the second partition wall portion 31 and the top surface 32b of the first partition wall portion 32 hardly slip and slip, while the slope 32a of the first partition wall portion 32 has a peak. It was found to be. It has also been found that this phenomenon appears particularly prominently when the pixel electrode 19 has lyophilicity and the top surface 32b of the first partition wall 32 has liquid repellency.
- the ink droplets are prevented from piling on the slope 31a, the difference between the layer thickness of the peripheral portion of the hole transport layer 21 and the layer thickness of the central portion can be reduced. That is, the hole transport layer 21 having a uniform layer thickness (no layer thickness unevenness) can be formed. Therefore, it is possible to realize the organic EL element 1 capable of displaying a high-quality image with less luminance unevenness in each pixel.
- the partition wall 30 has a step structure, the ink droplets are prevented from piling onto the inclined surface 31a regardless of the height L1 of the second partition wall portion 31 and the height L3 of the partition wall 30. That is, for example, even if the height L1 of the second partition wall 31 is relatively high in order to suppress the inflow of the dropped ink droplets to adjacent pixels, the ink droplets on the inclined surface 31a can be Pieng is suppressed. Therefore, according to this structure, the thickness unevenness of each hole transport layer 21 is reduced, and the inflow of ink for forming the organic EL light emitting layer 22 to be dropped later is effectively suppressed. be able to. Also, the height L1 of the second partition wall 31 is set to be relatively large.
- the height of the partition wall 30 is preferably larger than 1 ⁇ m. More preferably, it is 1.5 m or more.
- the height L3 of the partition wall 30 is a distance to the tip of the partition wall 30 with reference to the pixel electrode 19 on which the hole transport layer 21 is formed immediately above, as shown in FIG.
- the organic EL light emitting layer 22 is formed on the hole transport layer 21.
- a method for forming the organic EL light emitting layer 22 an inkjet method or the like can be cited as in the method for forming the hole transport layer 21.
- the organic EL light emitting layer 22 is formed by forming a film containing a light emitting material by an inkjet method and then drying the film. For drying, it is preferably heated at 150 ° C. to 250 ° C. for 0.5 to 120 minutes using a hot plate or oven.
- the solvent that can be used for the ink for forming the organic EL light emitting layer 22 is the same as the solvent that can be used for forming the hole transport layer 21 described above.
- the ink droplet containing the material of the organic EL light emitting layer 22 is dried.
- the slip is made without being pegged on the slope 31a of the second partition wall 31 or the top surface 32b of the first partition wall 32. Therefore, a uniform organic EL light emitting layer 22 can be formed with little difference in the layer thickness between the central portion and the peripheral portion.
- the height L1 of the second partition wall portion 31 can be made sufficiently high, so that the organic EL light emitting layer 22 having a large layer thickness can be formed.
- the upper common electrode 40 is formed so as to cover the entire partition 30 and the organic EL light emitting layer 22.
- Examples of the method for forming the upper common electrode 40 include sputtering and vapor deposition.
- the height L2 of the first partition wall portion 32 is preferably smaller than 1.5 m.
- the step formed between the first partition wall 32 and the organic EL light emitting layer 22 is very large. This is because there is a possibility that the upper common electrode 40 may be disconnected at a portion.
- the height L2 of the first partition wall portion 32 is more preferably 1 ⁇ m or less. As shown in FIG. 4, the height L2 of the first partition wall 32 is the distance from the tip of the first partition wall 32 to the pixel electrode 19 on which the hole transport layer 21 is formed immediately above. It is distance.
- the organic EL element 1 is completed by bonding and fixing the sealing substrate 60 with the seal 50.
- the step of adhering the sealing substrate 60 to the active matrix substrate 10 with the seal 50 is preferably performed in an inert gas atmosphere such as nitrogen or argon.
- an inert gas atmosphere such as nitrogen or argon.
- oxygen and moisture remain in the organic EL element 1 and the organic functional layer 20 and the like are deteriorated, so that a desired lifetime cannot be obtained.
- the material of each member and the manufacturing method of the organic EL element 1 listed in this embodiment are merely examples, and the present invention is not limited to these. Further, in the present embodiment, the force described in detail for the active matrix type organic EL element 1
- the organic EL element according to the present invention may adopt a passive matrix type.
- the functional substrate according to the present invention is not limited to the organic EL element described above.
- a color filter substrate whose functional layer is a color filter layer
- a circuit substrate whose functional layer is a conductive layer
- an organic thin film transistor substrate whose functional layer is an organic semiconductor layer
- a microlens substrate whose functional layer has a lens layer force, etc. It may be.
- the functional substrate according to the present invention has a functional layer having a uniform layer thickness (no layer thickness unevenness). Therefore, for example, in the case of a functional layer force S color filter layer, a color filter substrate with less light transmittance spots in the color filter layer can be realized.
- a plurality of types of substrates having different heights L1 of the second partition walls 31 are created, and ink droplets 70 containing a hole transport material are dropped on each of the substrates.
- the dropped ink droplet 70 flows over the partition wall 30 and onto the adjacent pixel electrode 19.
- the force force (the presence or absence of liquid leakage) was observed.
- the presence or absence of liquid leakage was determined by observing each substrate with an optical microscope immediately after the ink droplet 70 was dropped.
- FIG. 6 is a schematic cross-sectional view of the active matrix substrate 10 on which the partition walls 30 are formed.
- ITO indium tin oxide
- a spin coat method was used to apply a photoresist on the formed indium tin oxide (ITO) thin film, and the photomask was used to expose a desired pattern. After the exposure, the substrate was developed with a developer and washed with water to obtain a desired resist pattern.
- the indium tin oxide (ITO) thin film was etched into a desired shape by immersing the substrate on which the desired resist pattern was formed in a commercially available iron (III) chloride solution for 5 minutes and washing with water. Next, the substrate was immersed in a stripping solution for 5 minutes and washed with water to strip the photoresist.
- the pixel electrode 19 was formed by these processes.
- the partition wall 30 was formed by spin-coating a polyimide resin material and then performing a photo patterning process such as a half exposure technique and a development process.
- the substrate is UVZO treated to make the surface of the pixel electrode 19 lyophilic.
- the partition wall 30 is subjected to liquid repellent treatment (CF plasma treatment) to make the partition wall 30 liquid repellent.
- liquid repellent treatment CF plasma treatment
- the height L2 of the first partition wall 32 was set to 0.
- the distance L8 between the partition walls 30 was 50 m.
- the pixel electrode 19 surrounded by the partition wall 30 has a substantially square shape with obtuse corners.
- the width L4 of the bottom surface of the first partition wall 32 and the width L5 of the top surface were 50 m and 40 m, respectively.
- the width L6 of the bottom surface and the width L7 of the top surface of the second partition wall 31 were 30 ⁇ and 20 ⁇ m, respectively.
- Polythiophene and polymer acid were used as the hole transport material. Pure water was used as the solvent for dissolving the hole transport material. The concentration of the hole transport material was 5%.
- the total ink droplet volume dropped per pixel was 400 picoliters.
- the ink droplet 70 was ejected from the pixel electrode 19 at an initial velocity of lOmZs from lmm above.
- Table 1 below shows the relationship between the height L3 of the partition wall 30 and the liquid leakage.
- the hole transport layer 21 is preferably formed with less liquid leakage. It was found that it can be formed. Further, it was found that the height L1 of the second partition wall portion 31 is preferably 1 / zm or more, and the height L3 of the partition wall 30 is more preferably 1.5 ⁇ m or more.
- a hole transport layer 21 and an organic EL light emitting layer 22 were formed on the active matrix substrate 10 on which the partition walls 30 were formed by an inkjet method.
- the partition wall 30 and the active matrix substrate 10 were configured in the same manner as in Example 1.
- the height L1 is set to 0. L4 to 8 excluding the other height L2 are the same as those in the first embodiment.
- the hole transport material was polythiophene and polymer acid.
- the luminescent material was polyphenylene vinylene.
- the ink solvent for forming the hole transport layer 21 and the organic EL light emitting layer 22 was xylene.
- the ink concentrations for forming the hole transport layer 21 and the organic EL light emitting layer 22 were 5% and 10%, respectively.
- the hole transport layer 21 and the organic EL light emitting layer 22 were formed by an ink jet method and then dried at 100 to 200 ° C. for 5 to 30 minutes.
- Example 2 a plurality of types of substrates having different heights L2 of the first partition walls 32 in the configuration described above.
- An upper common electrode 40 was formed by vapor deposition.
- the material of the upper common electrode 40 is a laminated film of an aluminum layer and a calcium layer.
- the layer thickness of the upper common electrode 40 was 0.1 / zm.
- the state of the upper common electrode 40 at this time was observed with an optical microscope. Table 2 below shows the correlation between the presence / absence of disconnection in the step portion between the first partition wall portion 32 of the upper common electrode 40 and the organic EL light emitting layer 22 and the height L2 of the first partition wall portion 32.
- the disconnection of the upper common electrode 40 can be effectively suppressed when the height L2 of the first partition wall portion 32 is less than 1.5 m. It was found that the height L2 of the first partition wall 32 is more preferably 1 ⁇ m or less.
- the functional board according to the present invention is useful for mobile phones, PDAs, televisions, electronic books, monitors, electronic posters, watches, electronic shelf labels, emergency guides, and the like.
Abstract
Description
Claims
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JP2006540918A JP5105877B2 (ja) | 2004-10-13 | 2005-10-07 | 機能基板 |
US11/577,304 US7910271B2 (en) | 2004-10-13 | 2005-10-07 | Functional substrate |
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US7910271B2 (en) | 2011-03-22 |
US20080063949A1 (en) | 2008-03-13 |
JPWO2006041027A1 (ja) | 2008-05-15 |
JP5105877B2 (ja) | 2012-12-26 |
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