WO2005091358A1 - 半導体集積回路装置及びそれを用いたスイッチング電源装置 - Google Patents
半導体集積回路装置及びそれを用いたスイッチング電源装置 Download PDFInfo
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- WO2005091358A1 WO2005091358A1 PCT/JP2005/004446 JP2005004446W WO2005091358A1 WO 2005091358 A1 WO2005091358 A1 WO 2005091358A1 JP 2005004446 W JP2005004446 W JP 2005004446W WO 2005091358 A1 WO2005091358 A1 WO 2005091358A1
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 45
- 238000001514 detection method Methods 0.000 claims abstract description 29
- 238000009499 grossing Methods 0.000 claims description 15
- 230000015556 catabolic process Effects 0.000 claims 2
- 239000003990 capacitor Substances 0.000 description 13
- 238000010586 diagram Methods 0.000 description 12
- 239000004020 conductor Substances 0.000 description 11
- 230000010355 oscillation Effects 0.000 description 10
- 239000000779 smoke Substances 0.000 description 6
- 239000000126 substance Substances 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 239000000872 buffer Substances 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 241000287828 Gallus gallus Species 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H7/00—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions
- H02H7/10—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions for converters; for rectifiers
- H02H7/12—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions for converters; for rectifiers for static converters or rectifiers
- H02H7/1213—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions for converters; for rectifiers for static converters or rectifiers for DC-DC converters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/32—Means for protecting converters other than automatic disconnection
Definitions
- FIG. 6 is a circuit block diagram schematically showing a configuration of a conventional semiconductor integrated circuit device.
- reference numeral 90 denotes a semiconductor integrated circuit device (hereinafter, referred to as IC (Integrated Circuit)).
- IC 90 includes a voltage output terminal 91 for outputting a voltage Vout, and a signal input terminal 92 for receiving a control signal SO.
- a P-channel MOS (Metal Oxide Semiconductor) transistor 93 connected between a DC power supply Vpp (voltage is, for example, 50 V) and a voltage output terminal 91, and an external force is also applied through a connection terminal 98. It is composed of a drive circuit 97 for driving a MOS transistor 93 based on a signal, and a control unit 94 for performing predetermined control based on a control signal SO.
- the drain of the MOS transistor 93 is connected to the DC power supply Vpp, the source is connected to the voltage output terminal 91, and the gate is connected to the drive circuit 97.
- the control section 94 has an NPN transistor 95 that amplifies the control signal SO and supplies the amplified signal to an internal control circuit 96.
- the base of the NPN transistor 95 is connected to a signal input terminal 92, and the collector is Connected to control circuit 96, the emitter is connected to ground.
- the control signal SO is transmitted to the internal control circuit 96 by turning on and off the NPN transistor 95 in accordance with the H (High) level ZL (LOW) level of the control signal SO, and the internal control circuit 96 performs a predetermined control, and its control output is output to the outside via the connection terminal 99.
- the withstand voltage of the control unit 94 is set to, for example, 7V.
- the voltage output terminal 91 and the signal input terminal 92 are arranged on the outer peripheral portion of the IC 90 package so as to be adjacent to each other.
- a solder bridge may be generated between the voltage output terminal 91 and the signal input terminal 92.
- foreign substances such as dust may be caught between the voltage output terminal 91 and the signal input terminal 92 during long-term use.
- the foreign matter has conductivity or when a solder bridge is generated, that is, when there is a foreign matter between the voltage output terminal 91 and the signal input terminal 92, such as a conductive material such as a dust bridge or a dub bridge.
- a voltage clamp element 100 such as a zener diode is attached to the signal input terminal 92 to increase the withstand voltage of the control unit 94 to the voltage of the DC power supply Vpp or more, and if the voltage applied to the control unit 94 is equal to or higher than a predetermined voltage. It is advisable to clamp it to provide overvoltage protection.
- Patent Document 1 JP-A-2000-3591
- the current limiting function is not provided by limiting the current, the current will generate heat in the wiring of the short-circuit path including the MOS transistor 93 and the conductor 80, and the IC 90 itself will be destroyed, or the substrate on which the IC 90 is mounted will be damaged. There was a problem of smoke and ignition. Further, when the current limiting function is provided, the IC 90 generates heat even if it does not smoke or ignite, and wasteful power consumption occurs.
- the present invention is a semiconductor integrated circuit device that outputs a predetermined voltage from a voltage output terminal to the outside of the device via a switch element, and a switching power supply device using the same. Destruction even if the voltage output terminal is short-circuited with an adjacent terminal It is an object of the present invention to provide a highly reliable semiconductor integrated circuit device and a switching power supply device using the same.
- the present invention provides an input wiring that is externally connected to an input circuit that operates at a first power supply voltage, and an input wiring that is adjacent to the input wiring and higher than the first power supply voltage.
- the semiconductor integrated circuit device having an output wiring connected to the output of the switch element operating at the power supply voltage of 2, and detecting that a voltage higher than a reference voltage has been input to the input wiring, The output of the switch element connected to the output wiring adjacent to the input wiring is prohibited. According to this configuration, when the input wiring and the output wiring are substantially short-circuited, the second power supply voltage can be prevented from being applied to the input circuit.
- the present invention provides an output unit for outputting a predetermined voltage to the outside from a voltage output terminal via a switch element, and an output unit for outputting a predetermined voltage to a voltage input terminal from a voltage higher than a reference voltage.
- a semiconductor integrated circuit device having a control unit capable of controlling the switch element to open, wherein the voltage input terminal is arranged at a position adjacent to the voltage output terminal. . According to this configuration, when the voltage output terminal is substantially short-circuited with the adjacent voltage input terminal, the voltage applied from the voltage output terminal to the voltage input terminal is higher than the reference voltage. It can be prevented from becoming high.
- the present invention provides a voltage output terminal which outputs a pulse voltage obtained by switching a DC voltage by a switch element to an external smoothing circuit, and an output of the smoothing circuit which is externally input to a voltage input terminal.
- a semiconductor integrated circuit device including a control unit that controls the switch element so that a feedback voltage based on a voltage and a reference voltage match each other, wherein the voltage input terminal is arranged at a position adjacent to the voltage output terminal. It is a feature. According to this configuration, when the voltage output terminal is substantially short-circuited with the adjacent voltage input terminal, the pulse voltage applied to the voltage output terminal becomes higher than the reference voltage. Can be prevented.
- the present invention provides an output unit for outputting a predetermined voltage from a voltage output terminal to an external device via a voltage output line via a switch element, and the voltage output line or the voltage output terminal.
- a control unit that performs a predetermined control based on a control signal input from an external device to a signal input line or a signal input terminal disposed at an adjacent position.
- a voltage detection unit that detects that a voltage higher than a reference voltage is input to the signal input terminal and supplies the voltage detection signal to the output unit; wherein the output unit is configured to switch the switch when the voltage detection signal is supplied; It is characterized by opening the element.
- the voltage output line or the voltage output terminal when the voltage output line or the voltage output terminal is substantially short-circuited with the adjacent signal input line or the signal input terminal, the voltage output line or the voltage output terminal is connected to the voltage input line or the voltage output terminal. It is possible to prevent the voltage applied to the voltage input terminal from becoming higher than the reference voltage.
- the output unit is configured to generate a drive signal for driving the switch element, and output the logical element of the drive signal and the voltage detection signal to obtain the output of the switch element. And a logic gate to be applied to the control terminal.
- the switch element when the voltage detection signal is not given, the switch element can be closed and opened in response to the drive signal from the drive circuit, and when the voltage detection signal is given, the switch circuit can be opened. The switch element can be opened irrespective of the drive signal from the switch.
- the voltage detection unit includes a first transistor that is energized when the voltage of the signal input terminal is higher than the reference voltage, and a second transistor that forms a current mirror circuit together with the first transistor. It is preferable that the voltage detection signal is output from a connection node between the second transistor and a resistor obtained by pulling up the second transistor. According to this configuration, the voltage of the connection node between the resistor and the second transistor is changed in accordance with the voltage of the signal input terminal, and the changed voltage is used as the voltage detection signal, thereby achieving a simple configuration. Thus, it is possible to detect that the voltage of the signal input terminal has become higher than the reference voltage.
- the voltage detecting unit further includes a diode in a current path between the signal input terminal and the first transistor, and a forward voltage of the diode and a voltage of the first transistor. It is preferable that the value added to the base-emitter voltage corresponds to the reference voltage. According to this configuration, a circuit for obtaining a desired reference voltage can be easily configured.
- the present invention also provides an output unit that outputs a predetermined voltage to the outside of the device from a voltage output terminal card via a switch element that is closed and opened according to an output control signal given to an external control device.
- a semiconductor integrated circuit device comprising: a control unit provided to the external control device, wherein the reset input terminal is arranged at a position adjacent to the voltage output terminal. According to this configuration, even when the voltage output terminal is substantially short-circuited with the adjacent reset input terminal, the external control device is reset and the output operation of the external control signal is stopped. Thereby, it is possible to prevent the voltage applied to the reset terminal from being higher than the reference voltage.
- an element withstand voltage of the switch element is higher than an element withstand voltage of the control unit, and a voltage exceeding the element withstand voltage of the control unit can be output via the switch element.
- a voltage output terminal from which a switched pulse voltage is output is substantially equal to an adjacent terminal connected to a control unit of the semiconductor integrated circuit device. Even when a short circuit occurs, it is possible to prevent a voltage higher than the reference voltage from being applied to the control unit.
- the second power supply voltage is not applied to the input circuit, so that the second power supply Even when the voltage exceeds the withstand voltage of the input circuit, it is possible to prevent the input circuit from being destroyed without increasing the withstand voltage of the input circuit or providing overvoltage protection.
- a highly reliable semiconductor integrated circuit device can be realized without increasing the cost.
- a voltage higher than the reference voltage is applied to the control unit. Can be prevented, even when the predetermined voltage exceeds the withstand voltage of the control unit, Without increasing the withstand voltage of the control unit, or by attaching a voltage clamp element or the like to the voltage input terminal to protect the control unit from overvoltage, it is possible to prevent the control unit from being damaged by voltage, and to increase reliability without increasing cost. Accordingly, a semiconductor integrated circuit device can be realized.
- the present invention even when the voltage output terminal is substantially short-circuited with the adjacent voltage input terminal, a voltage higher than the reference voltage is applied to the control unit. Therefore, even if the pulse voltage output from the voltage output terminal exceeds the withstand voltage of the control unit, it is not necessary to increase the withstand voltage of the control unit, and a voltage clamp element is connected to the voltage input terminal. It is possible to prevent the control unit from being destroyed by voltage without providing overvoltage protection by attaching a device or the like, and to realize a highly reliable semiconductor integrated circuit device without increasing cost.
- the control unit even when the voltage output line or the voltage output terminal is substantially short-circuited with the adjacent voltage input line or the voltage input terminal, the reference voltage is supplied to the control unit. Since it is possible to prevent a higher voltage from being applied, even when the predetermined voltage exceeds the withstand voltage of the control unit, it is not necessary to increase the withstand voltage of the control unit.
- the control unit can be prevented from being damaged by voltage without attaching a voltage clamp element or the like to protect the overvoltage, and a highly reliable semiconductor integrated circuit device can be realized without increasing cost.
- the present invention even when the voltage output terminal is substantially short-circuited with the adjacent reset input terminal outside, a voltage higher than a reference voltage is applied to the control unit. Therefore, even if the predetermined voltage exceeds the withstand voltage of the control unit, it is not necessary to increase the withstand voltage of the control unit. It is possible to prevent the control unit from being destroyed by voltage without protection, and to realize a highly reliable semiconductor integrated circuit device without increasing the cost.
- the switching power supply device using the semiconductor integrated circuit device since the switching power supply device using the semiconductor integrated circuit device is provided, a voltage output terminal for outputting a switched pulse voltage is connected to a control unit of the semiconductor integrated circuit device. Even if it is almost short-circuited, It is possible to prevent a voltage higher than the reference voltage from being applied to the control unit, and to realize a highly reliable switching power supply device in which the control unit is prevented from being damaged.
- FIG. 1 is a circuit block diagram showing a configuration of a semiconductor integrated circuit device according to a first embodiment of the present invention.
- FIG. 2 is a circuit block diagram showing a configuration of a regulator IC according to a second embodiment of the present invention.
- FIG. 3 is a circuit block diagram showing a configuration of a semiconductor integrated circuit device according to a third embodiment of the present invention.
- FIG. 4 is a circuit diagram showing an example of a specific circuit of a voltage detection unit shown in FIG. 3.
- FIG. 5 is a circuit block diagram illustrating a configuration of a semiconductor integrated circuit device according to a fourth embodiment of the present invention.
- FIG. 6 is a circuit block diagram showing a configuration of a conventional semiconductor integrated circuit device.
- Vdd DC power supply (first power supply voltage)
- Vpp DC power supply (second power supply voltage)
- FIG. 1 is a circuit block diagram schematically showing a configuration of an IC according to a first embodiment of the present invention.
- 1 is an IC
- IC1 is an output unit 4 for outputting a voltage Vout to the outside from a voltage output terminal 2 via an external output wiring 2a, and an IC1 via a voltage input terminal 3 from an external input wiring 3a.
- the control unit 7 controls the output unit 4 based on an external input or output control voltage Vent supplied from outside, and performs predetermined control based on a control signal S5 supplied via a signal input terminal 24. Have been.
- a DC power supply Vdd (the voltage is, for example, 5 V) as an operation power supply of each unit of the IC 1 is supplied via the power supply terminal 29.
- Vdd the voltage is, for example, 5 V
- the voltage output terminal 2 and the voltage input terminal 3 are arranged so as to be adjacent to each other on the outer peripheral portion of the package of the IC 1, so that the output wiring 2a and the input wiring 3a are adjacent on the way. It is placed in
- the output section 4 is a P-channel MOS transistor 5 connected between the DC power supply Vpp (voltage is, for example, 50 V) and the voltage output terminal 2 with a voltage higher than the DC power supply Vdd! And a drive circuit 6 for driving the MOS transistor 5 based on a signal externally applied through a connection terminal 27.
- the drain of the MOS transistor 5 is connected to the DC power supply Vpp, the source is connected to the voltage output terminal 2, and the gate is connected to the drive circuit 6.
- the control unit 7 includes an NPN transistor 25 that amplifies the control signal S5 and supplies the amplified signal to the internal control circuit 26.
- the base of the NPN transistor 25 is connected to the signal input terminal 24, and the collector is connected to the internal control circuit. 26 and the emitter is connected to ground.
- the control signal S5 is transmitted to the internal control circuit 26 by turning on and off the NPN transistor 25 in accordance with the H level ZL level of the control signal S5, and the internal control circuit 26
- the control output is output to the outside via the connection terminal 28.
- control unit 7 includes a comparator 8 and a reference voltage source 9.
- the non-inverting input terminal (+) of the comparator 8 is connected to the voltage input terminal 3, and the inverting input terminal (one) is connected to the reference voltage source 9. 9 ⁇ It is connected.
- the output terminal of the comparator 8 is connected to the input terminal of the drive circuit 6.
- the comparator 8 compares the output control voltage Vent applied to the non-inverting input terminal (+) with the reference voltage Vref (for example, 2 V) applied to the inverting input terminal (1), and compares the output control voltage Vent with the reference voltage Vent. When the voltage is higher than Vre; f, the output is set to H level.
- the output control voltage Vent When the output control voltage Vent is lower than the reference voltage Vre; f, the output is set to L level.
- the withstand voltage of the control unit 7 is set to, for example, 7V.
- the input wiring 3a is connected to the voltage input terminal 3 The input wiring 3a is not always necessary. It suffices if the voltage is set.
- the drive circuit 6 buffers the output of the comparator 8 and outputs the buffered output to the gate of the MOS transistor 5 to drive the MOS transistor 5. That is, the MOS transistor 5 is turned off when the output of the comparator 8 is at the H level, and turned on when the output of the comparator 8 is at the L level. At this time, the voltage Vout output from the voltage output terminal 2 becomes substantially the same as the voltage of the DC power supply Vpp (about 50 V) when the MOS transistor 5 is on, and the MOS transistor 5 is turned off. 0V when there is.
- the voltage input terminal 3 or the input wiring 3 a is provided between the voltage output terminal 2 and the signal input terminal 24 in the same manner as in the above-described conventional example.
- a short circuit may occur between the signal input terminal 24 and the output wiring 2a and the input wiring for the control signal S5 by a conductor 80 such as a foreign substance or a solder bridge. If the voltage output terminal 2 and the voltage input terminal 3 are short-circuited, or if the output wiring 2a and the input wiring 3a are short-circuited halfway, the voltage input terminal 3
- the voltage Vout is applied to the control unit 7 via the control unit 7.
- the voltage input terminal 3 By arranging the voltage input terminal 3 at a position adjacent to the voltage output terminal 2 as described above, although the number of terminals is increased, the distance between the voltage output terminal 2 and the signal input terminal 24 is increased, resulting in a short circuit. Even if the voltage output terminal 2 is almost short-circuited with the adjacent terminal, it is difficult to increase the withstand voltage of the control unit 7 connected to the adjacent terminal. It is possible to prevent the IC 1 including the control unit 7 from being damaged by voltage by attaching a voltage clamp element or the like to a terminal to be protected, thereby improving the reliability of the IC 1.
- FIG. 2 is a circuit block diagram showing a configuration of a switching power supply device using an IC according to a second embodiment of the present invention.
- reference numeral 30 denotes a switching power supply
- the switching power supply 30 is composed of a regulator IC31 integrated on one chip and a number of external elements externally attached to the regulator IC31. .
- the regulator IC 31 includes five terminals for connecting external elements, an output unit 40, and a control unit 50.
- the output unit 40 includes a P-channel MOS transistor 41 and a drive circuit 42 for driving the MOS transistor 41.
- the control unit 50 includes a reference voltage source 51, an error amplifier 52, a PWM comparator 53, and an oscillation circuit 54. It is composed of
- An input voltage Vin (for example, 50 V) is supplied to the IN terminal 32, and a smoothing capacitor C1 and a noise cutting capacitor C2 are externally connected in parallel between the IN terminal 32 and the ground.
- a smoothing circuit 37 is externally connected to the SW terminal 33 from which the pulse voltage Vpls obtained by switching the input voltage Vin by the MOS transistor 41 is output.
- the smoothing circuit 37 includes a coil L1, a diode (for example, a Schottky barrier diode) D1, and a smoothing capacitor (for example, an electrolytic capacitor) C4.
- the SW terminal 33 has a diode D1 power source and a coil. One end of L1 is connected, the other end of coil L1 is connected to one end of smoothing capacitor C4, and the other end of smoothing capacitor C4 and the anode of diode D1 are connected to ground.
- the other end of the coil L1 is connected to ground via a series circuit of voltage dividing resistors Rl and R2.
- the connection node of the voltage dividing resistors Rl and R2 is connected to the INV terminal 34.
- the INV terminal 34 is connected to the inverting input terminal (1) of the error amplifier 52 inside the regulator IC31.
- the non-inverting input terminal (+) of the error amplifier 52 is connected to the reference voltage source 51, and the output terminal of the error amplifier 52 is connected to the inverting input terminal (1) of the PWM comparator 53 and the FB terminal 35.
- a delay compensating circuit 38 comprising a series circuit of a capacitor C3 and a resistor R3 is externally provided.
- the non-inverting input terminal (+) of the PWM comparator 53 is connected to the output terminal of the oscillation circuit 54, and the output terminal of the PWM comparator 53 is connected to the input terminal of the drive circuit 42.
- the output terminal of the drive circuit 42 is connected to the gate of the MOS transistor 41, the source of the MOS transistor 41 is connected to the IN terminal 32, and the drain is connected to the SW terminal 33.
- the GND terminal 36 is connected to the ground, and the reference potential of the regulator IC 31 is determined.
- Each unit of the IC 31 uses a DC voltage (for example, 5 V) lower than the input voltage Vin generated from the input voltage Vin as an operation power supply.
- the withstand voltage of the control unit 50 is set to, for example, 7V.
- the input voltage Vin is converted into a pulse voltage Vpls by the switching operation of the MOS transistor 41.
- the MOS transistor 41 When the MOS transistor 41 is on, a current flows from the IN terminal 32 to the coil L1 via the MOS transistor 41. As a result, energy is stored in the coil L1, and the smoothing capacitor C4 is charged.
- the MOS transistor 41 when the MOS transistor 41 is off, the energy stored in the coil L1 is circulated by the diode D1, and the smoothing capacitor C4 is charged. Then, the voltage output from the smoothing capacitor C4 is supplied to the outside as the output voltage Vo.
- the feedback voltage Vadj obtained by dividing the output voltage Vo by the voltage dividing resistors R1 and R2 is input to the inverting input terminal (1) of the error amplifier 52 via the INV terminal 34.
- the error amplifier 52 generates an error signal based on the voltage difference between the reference voltage Vref (for example, 2 V) input to the non-inverting input terminal (+) and the feedback voltage Vadj input to the inverting input terminal (1). Is output.
- the reference voltage Vref is set to a feedback voltage Vadj obtained by dividing a predetermined output voltage Vo by voltage dividing resistors Rl and R2.
- the error signal output from the error amplifier 52 is input to the inverting input terminal (1) of the PWM comparator 53.
- a triangular wave having a predetermined frequency is supplied from the oscillation circuit 54 to the non-inverting input terminal (+) of the PWM comparator 53.
- the PWM comparator 53 compares the inverting input terminal (-) voltage with the non-inverting input terminal (+) voltage. If the non-inverting input terminal (+) voltage becomes higher than the inverting input terminal (-) voltage, When the voltage at the H (High) level and the inverting input terminal (1) becomes higher than the voltage at the non-inverting input terminal (+), the PWM signal at the L (Low) level is output to the drive circuit 42.
- the drive circuit 42 outputs the buffered output signal of the PWM signal from the PWM comparator 53 to the gate of the MOS transistor 41, and drives the MOS transistor 41. That is, when the PWM signal is at the H level, the MOS transistor 41 is turned off, and when the PWM signal is at the L level, the MOS transistor 41 is turned on. Accordingly, the output signal of the drive circuit 42 is a pulse signal having the same frequency as the oscillation frequency of the oscillation circuit 54, and its duty is determined based on the error signal from the error amplifier 52.
- the time during which the PWM signal is at the H level that is, the time when the MOS transistor 41 is turned off
- the output voltage Vo falls below the predetermined voltage.
- control is performed so that the time during which the PWM signal is at the SL level, that is, the time during which the MOS transistor 41 is turned on, is lengthened.
- the control elements and the like in the control unit 50 are changed. It is necessary to improve the frequency characteristics. However, if the error amplifier 52 has the excellent frequency characteristics, a problem of circuit oscillation may occur. Therefore, a delay in which a series circuit of the capacitor C3 and the resistor R3 is also provided between the FB terminal 35 and the IN V terminal 34; ⁇ The externally provided phase compensation circuit 38 makes the error amplifier 52 have good frequency characteristics. Thus, even when the switching frequency is set high, oscillation of the circuit can be prevented.
- the feedback operation is performed so that the feedback voltage Vadj matches the reference voltage Vref, and the duty of the PWM signal is adjusted. Therefore, the output voltage Vo is normally stable to a predetermined voltage. Is maintained. Also, if the INV terminal 34 is arranged next to the SW terminal 33 from which the pulse voltage Vpls is output in this circuit, such a switching power supply In the device 30, there is a possibility that the SW terminal 33 and the INV terminal 34 may be substantially short-circuited by the conductor 80 such as a foreign substance or a bridge for the same reason as in the conventional example described above.
- the pulse voltage Vpls is applied to the INV terminal 34, and the feedback operation described above causes the voltage of the INV terminal 34, that is, the voltage of the inverting input terminal (1) of the error amplifier 52 to be reduced. Since the duty of the MOS transistor 41 is immediately adjusted so that it matches the reference voltage Vref, the pulse voltage Vpls applied to the INV terminal 34 falls and does not exceed the reference voltage Vref! / ,.
- the INV terminal 34 By arranging the INV terminal 34 at a position adjacent to the SW terminal 33 as described above, even if the SW terminal 33 is substantially short-circuited with the adjacent INV terminal, the adjacent I NV Does not increase the withstand voltage of the control unit 50 connected to the terminal.Also, does not attach a voltage clamp element etc. to the INV terminal to prevent overvoltage protection.Prevents the voltage regulator IC 31 including the control unit 50 from being damaged. Thus, the reliability of the regulator IC 31 and the switching power supply device 30 can be improved.
- FIG. 3 is a circuit block diagram schematically showing the configuration of the IC according to the third embodiment of the present invention.
- reference numeral 10 denotes an IC
- IC 10 is higher than the voltage of the power supply terminal 39 connected to the DC power supply Vdd (the voltage is, for example, 5 V) as the operating power supply of each part of the IC 10 and the DC power supply Vdd.
- Power supply terminal 11 connected to another DC power supply Vpp (voltage is, for example, 50 V), voltage output terminal 12 to output voltage Vout through external output wiring 12a, and control through external input wiring 13a
- the signal input terminal 13 to which the signal S1 is supplied, the power supply terminal 11 and the voltage output terminal 12 are provided between the output unit 14 and the IC 10 based on the control signal S1 to realize the function of the IC 10.
- the control unit 17 controls the drive circuit 16 and controls the drive circuit 16, and the voltage detection unit 22.
- the voltage output terminal 12 and the signal input terminal 13 are arranged adjacent to each other on the outer peripheral portion of the package of the IC 10.
- the power output wiring 12a and the input wiring 13a are arranged so as to be adjacent in the middle. .
- the withstand voltage of the control unit 17 is set to, for example, 7V.
- the output section 14 includes a P-channel type MOS transistor 15, a drive circuit 16 for generating a drive signal for driving the MOS transistor 15, and a NAND gate 21.
- the drain of the MOS transistor 15 is connected to the power supply terminal 11, the source is connected to the voltage output terminal 12, and the gate is connected to the output terminal of the NAND gate 21.
- One input terminal of the NAND gate 21 is connected to the drive circuit 16, and the other input terminal is connected to the output terminal of the comparator 18 of the voltage detection unit 22.
- the voltage detection unit 22 includes a comparator 18 and a reference voltage source 19.
- the inverting input terminal (1) of the comparator 18 is connected to the signal input terminal 13, and the non-inverting input terminal (+ ) Is connected to a reference voltage source 19.
- the output terminal of the comparator 18 is connected to the other input terminal of the NAND gate 21.
- the comparator 18 compares the voltage Vsig of the signal input terminal 13 supplied to the inverting input terminal (1) with the reference voltage Vref (for example, 2 V) supplied to the non-inverting input terminal (+), and calculates the voltage Vsig.
- Vref for example, 2 V
- the output is given to the NAND gate 21 as a voltage detection signal.
- the NAND gate 21 takes the logical product of the output of the comparator 18 and the drive signal from the drive circuit 16, outputs the output signal internally inverted to the gate of the MOS transistor 15, and Drive. That is, when the output of the comparator 18 is at the H level, the NAND gate 21 outputs an output signal corresponding to the voltage level of the drive signal from the drive circuit 16 and turns the MOS transistor 15 on and off. On the other hand, when the output of the comparator 18 is at L level, the NAND gate 21 outputs an H level signal to turn off the MOS transistor 15 regardless of the voltage level of the drive signal from the drive circuit 16. At this time, the voltage Vout output from the voltage output terminal 12 becomes substantially the same as the voltage of the DC power supply Vpp (about 50 V) when the MOS transistor 15 is on, and the MOS transistor 15 turns off, 0V when
- the IC 10 configured as described above normally operates to turn on / off the MOS transistor 15 according to the output of the control unit 17.
- a voltage output terminal When a short circuit occurs between the signal line 12 and the signal input terminal 13 due to a conductor 80 such as a foreign object or a bridge, or the output line 12a and the input line 13a are short-circuited halfway.
- the voltage Vout is applied to the control unit 17 via the signal input terminal 13.
- the voltage Vsig of the signal input terminal 13 that is, the voltage of the inverting input terminal (i) of the comparator 18 becomes higher than the reference voltage Vre; f, the output of the comparator 18 becomes L level and the MOS transistor 15 is turned off.
- the voltage Vout applied to the signal input terminal 13 does not exceed the reference voltage Vref.
- the voltage detection unit 22 shown in FIG. 3 can be realized by a circuit as shown in FIG.
- FIG. 4 is a circuit diagram showing an example of a specific circuit of the voltage detection unit 22. 4, the same components as those in FIG. 3 are denoted by the same reference numerals, and the description thereof will be omitted.
- the voltage detection unit 22 shown in FIG. 4 includes diodes Dll and D12, a current mirror circuit 23, an internal control power supply Vcc, and a resistor R11.
- the current mirror circuit 23 is composed of a pair of NPN transistors Ql and Q2 whose bases are connected to each other and whose emitters are both connected to the ground.
- the collector of the NPN transistor Q1 is connected to its base.
- the anode of the diode D12 is connected to the power source of the diode D11, and the anode of the diode D11 is connected to the signal input terminal 13.
- the collector of NPN transistor Q 2 is connected to internal control power supply Vcc via resistor R 11, and the connection node between resistor R 11 and NPN transistor Q 2, that is, the voltage of the collector of NPN transistor Q 2 is input to NAND gate 21. Terminal.
- the internal control power supply Vcc Is a DC power supply that supplies a voltage at a level for driving the logic gate.
- the operation of the voltage detection unit 22 having such a configuration will be described.
- the voltage Vsig of the signal input terminal 13 becomes higher than the voltage (for example, 2 V) obtained by adding the forward voltage of the diodes Dll and D12 and the voltage between the base and the emitter of the NPN transistor Ql (for example, 2 V)
- the NPN transistor Q1 turns on and the NPN transistor Q1 is turned on.
- a predetermined collector current flows.
- This collector current is mirrored by the NPN transistor Q2, and the same amount of collector current flows through the NPN transistor Q2.
- the voltage at the collector of the NPN transistor Q2 is at the ground level, that is, at the L level.
- the NPN transistor Q1 is turned off and the NPN transistor Q2 is also turned off. Turns off. At this time, the voltage of the collector of the NPN transistor Q2 becomes the voltage of the internal control power supply Vcc, that is, the H level voltage.
- the voltage of the collector of NPN transistor Q2 can be changed according to the voltage Vsig of signal input terminal 13, and by using this voltage as the voltage detection signal, the signal input can be made with a simple configuration. It can be detected that the voltage Vsig of the terminal 13 has become higher than the reference voltage (2V in this example).
- FIG. 5 is a circuit block diagram schematically showing a configuration of an IC according to a fourth embodiment of the present invention.
- reference numeral 60 denotes an IC
- the IC 60 is based on a power supply terminal 59 connected to a DC power supply V dd (voltage is, for example, 5 V) as an operation power supply of each part of the IC 60 and a voltage of the DC power supply Vdd.
- Power supply terminal 61 connected to another high-voltage DC power supply Vpp (the voltage is, for example, 50 V), a voltage output terminal 62 for outputting the voltage Vout through the external output wiring 62a, and a power supply terminal 61.
- An output unit 64 is provided between the voltage output terminal 62 and an output control terminal 70 to which an output control signal S2 from an external microcomputer 72 is supplied.
- the output section 64 includes a P-channel type MOS transistor 65 and a drive circuit 66 for driving the MOS transistor 65.
- the drain of the MOS transistor 65 is connected to the power supply terminal 61, and the source is a voltage output terminal.
- the gate is connected to the output terminal of the drive circuit 66.
- the input terminal of the drive circuit 66 is connected to the output control terminal 70.
- the drive circuit 66 buffers the output control signal S 2 from the microcomputer 72 given through the output control terminal 70, outputs the buffered output control signal S 2 to the gate of the MOS transistor 65, and drives the MOS transistor 65. That is, when the output control signal S2 is at H level, the MOS transistor 65 is turned off, and when it is at L level, it is turned on.
- the voltage Vout output from the voltage output terminal 62 becomes substantially the same as the voltage of the DC power supply Vpp (approximately 50 V) when the MOS transistor 65 is turned on, and the MOS transistor 65 is turned off. When it is, it becomes 0V.
- the IC 60 also receives a reset input signal S 3 through an external input wiring 63 a, receives the reset input signal S 3, generates a reset output signal S 4, and supplies the reset output signal S 4 through a signal input terminal 73.
- a control unit 67 controls the drive circuit 66 based on the control signal S6, and a reset output terminal 71 that outputs a reset output signal S4 to the microcomputer 72.
- the reset input terminal 63 is arranged so as to be adjacent to the voltage output terminal 62 on the outer periphery of the package of the IC 60, and is arranged so that the output wiring 62a and the input wiring 63a are adjacent on the way.
- the withstand voltage of the control unit 67 is set to, for example, 7V.
- the control section 67 includes an internal control circuit 74 connected to the signal input terminal 73.
- the internal control circuit 74 provides an H level ZL level signal to the drive circuit 66 in response to the control signal S6, and
- the transistor 65 is on / off controlled.
- the control section 67 includes a comparator 68 and a reference voltage source 69.
- the non-inverting input terminal (+) of the comparator 68 is connected to the reset input terminal 63, and the inverting input terminal (-) is Connected to voltage source 69.
- the output terminal of the comparator 68 is connected to the reset output terminal 71.
- This comparator 68 compares the voltage Vres of the reset input signal S3 supplied to the non-inverting input terminal (+) with the reference voltage Vref (for example, 2 V) supplied to the inverting input terminal (1), and compares the voltage. When Vres is higher than the reference voltage Vref, the output is set to the H level. When the voltage Vres is lower than the reference voltage Vre; f, the output is set to the L level.
- the H-level output of the comparator 68 is given to the microcomputer 72 via the reset output terminal 71 as the reset output signal S4. Then, the microcomputer 72 to which the reset output signal S4 has been applied performs a reset operation and stops the output operation of the output control signal S2. By checking the voltage of the reset input signal S3 with the comparator 68 and resetting the microcomputer 72 in this manner, the reset input terminal 63 This prevents the microcomputer 72 from being reset by mistake when a voltage such as noise is applied to the microcomputer 72.
- the microcomputer 72 is positively reset when the voltage of the voltage output terminal 62 is short-circuited to the adjacent terminal by mistake, and the microcomputer 72 is connected to the MOS transistor. Turning off 65 can prevent the abnormal state from continuing.
- the voltage output terminal 62 and the reset input terminal 63 are substantially short-circuited by a conductor 80 such as a foreign substance or a double bridge as in the above-described conventional example.
- a conductor 80 such as a foreign substance or a double bridge as in the above-described conventional example.
- the voltage Vout is applied to the control unit 67 via the reset input terminal 63 and the reset input
- the voltage of the terminal 63 that is, the voltage of the non-inverting input terminal (+) of the comparator 68 becomes higher than the reference voltage Vref.
- the output of the comparator 68 becomes H level and the microcomputer 72 is reset.
- the output control signal S2 is not output and the MOS transistor 65 is turned off, the voltage Vout applied to the reset input terminal 63 does not exceed the reference voltage Vref.
- the reset input terminal 63 By arranging the reset input terminal 63 at a position adjacent to the voltage output terminal 62 as described above, even if the voltage output terminal 62 is substantially short-circuited with the adjacent terminal, the reset input terminal 63 may be connected to the adjacent terminal. There is no need to increase the withstand voltage of the control unit 67 connected to the terminal to be operated. Also, it is not necessary to attach a voltage clamp element or the like to an adjacent terminal to provide overvoltage protection. Further, it is possible to prevent the IC 60 including the control unit 67 from being damaged by voltage, and to improve the reliability of the IC 60.
- a P-channel type MOS transistor is used as a switch element for turning on and off a voltage from a DC power supply. It is also possible to use an OS transistor or a bipolar transistor. Alternatively, the output MOS transistor may be a single output MOS transistor which is described only when the output MOS transistor is in the IC. Then, an input terminal connected to an input signal that is connected to a control input of the output transistor and turns off the output MOS transistor may be adjacent to the output terminal. It is also possible to provide the comparator with hysteresis characteristics or operate it as a logic circuit so that once the output transistor is turned off, the output transistor cannot be turned on until the power is turned on again.
- the voltage output terminal serves as a control unit. Even if a short circuit occurs between the connected adjacent terminal and the outside, a voltage higher than the reference voltage is not applied to the control unit so that the control unit is destroyed. Therefore, reliability can be improved without increasing the cost of the semiconductor integrated circuit device and the switching power supply device using the same.
- Such a semiconductor integrated circuit device having improved reliability and a switching power supply device using the same are particularly effective for use in in-vehicle electronic devices of automobiles that require high reliability.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dc-Dc Converters (AREA)
- Electronic Switches (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006511181A JP4855249B2 (ja) | 2004-03-23 | 2005-03-14 | 半導体集積回路装置及びそれを用いたスイッチング電源装置 |
EP05720714A EP1737032A4 (en) | 2004-03-23 | 2005-03-14 | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SWITCHING POWER SUPPLY SOURCE DEVICE USING THE SAME |
US10/599,177 US20070188155A1 (en) | 2004-03-23 | 2005-03-14 | Semiconductor integrated circuit device and switching power source device using the same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004-084149 | 2004-03-23 | ||
JP2004084149 | 2004-03-23 |
Publications (1)
Publication Number | Publication Date |
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WO2005091358A1 true WO2005091358A1 (ja) | 2005-09-29 |
Family
ID=34993970
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/004446 WO2005091358A1 (ja) | 2004-03-23 | 2005-03-14 | 半導体集積回路装置及びそれを用いたスイッチング電源装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US20070188155A1 (ja) |
EP (1) | EP1737032A4 (ja) |
JP (1) | JP4855249B2 (ja) |
KR (1) | KR20060132941A (ja) |
CN (1) | CN100429764C (ja) |
TW (1) | TW200537779A (ja) |
WO (1) | WO2005091358A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009147495A (ja) * | 2007-12-12 | 2009-07-02 | Yazaki Corp | 負荷制御装置 |
JP2010220415A (ja) * | 2009-03-17 | 2010-09-30 | Toshiba Tec Corp | 直流電源装置 |
JP2019013076A (ja) * | 2017-06-29 | 2019-01-24 | 富士電機株式会社 | スイッチング電源装置の制御回路 |
JPWO2020039531A1 (ja) * | 2018-08-23 | 2021-08-26 | 国立大学法人東北大学 | 光センサ及びその信号読み出し方法並びに光エリアセンサ及びその信号読み出し方法 |
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JP5280176B2 (ja) * | 2008-12-11 | 2013-09-04 | ルネサスエレクトロニクス株式会社 | ボルテージレギュレータ |
CN101937016A (zh) * | 2009-06-29 | 2011-01-05 | 鸿富锦精密工业(深圳)有限公司 | 低电压提示装置 |
CN102111070B (zh) * | 2009-12-28 | 2015-09-09 | 意法半导体研发(深圳)有限公司 | 待机电流减少的调节器过电压保护电路 |
CN102130574B (zh) * | 2010-01-13 | 2013-06-19 | 台达电子工业股份有限公司 | 具可控制能量释放功能的多组输出降压型转换装置 |
GB201007144D0 (en) * | 2010-04-29 | 2010-06-09 | Texas Instr Cork Ltd | Flyback converter switched magnetic sense for output regulation & line overvoltage protection |
JP5797908B2 (ja) * | 2011-02-08 | 2015-10-21 | ローム株式会社 | タッチパネルの制御回路およびそれを用いたタッチパネル入力装置、電子機器 |
JP6788962B2 (ja) * | 2015-11-19 | 2020-11-25 | セイコーエプソン株式会社 | 診断回路、電子回路、電子機器および移動体 |
US20170222430A1 (en) * | 2016-02-01 | 2017-08-03 | Qualcomm Incorporated | Short-resistant output pin circuitry |
DE112016007071T5 (de) * | 2016-08-30 | 2019-03-28 | Mitsubishi Electric Corporation | Störgeräuschdetektionseinrichtung |
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JP2590989B2 (ja) * | 1987-12-14 | 1997-03-19 | セイコーエプソン株式会社 | 液晶表示装置の外部接続端子配列方法 |
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US6307356B1 (en) * | 1998-06-18 | 2001-10-23 | Linear Technology Corporation | Voltage mode feedback burst mode circuit |
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JP2003115724A (ja) * | 2001-10-05 | 2003-04-18 | Matsushita Electric Ind Co Ltd | オペアンプ接続回路及びオペアンプ接続方法 |
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US20030174005A1 (en) * | 2002-03-14 | 2003-09-18 | Latham Paul W. | Cmos digital pulse width modulation controller |
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- 2005-03-14 KR KR1020067018956A patent/KR20060132941A/ko not_active Application Discontinuation
- 2005-03-14 JP JP2006511181A patent/JP4855249B2/ja active Active
- 2005-03-14 WO PCT/JP2005/004446 patent/WO2005091358A1/ja not_active Application Discontinuation
- 2005-03-14 EP EP05720714A patent/EP1737032A4/en not_active Withdrawn
- 2005-03-14 CN CNB2005800082354A patent/CN100429764C/zh active Active
- 2005-03-14 US US10/599,177 patent/US20070188155A1/en not_active Abandoned
- 2005-03-18 TW TW094108304A patent/TW200537779A/zh unknown
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JPS62156849A (ja) * | 1985-12-28 | 1987-07-11 | Canon Inc | 集積回路の保護回路 |
JPH04123466A (ja) * | 1990-09-14 | 1992-04-23 | Hitachi Ltd | 半導体装置 |
JP2000270469A (ja) * | 1999-03-19 | 2000-09-29 | New Japan Radio Co Ltd | 電流制限回路 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009147495A (ja) * | 2007-12-12 | 2009-07-02 | Yazaki Corp | 負荷制御装置 |
JP2010220415A (ja) * | 2009-03-17 | 2010-09-30 | Toshiba Tec Corp | 直流電源装置 |
JP2019013076A (ja) * | 2017-06-29 | 2019-01-24 | 富士電機株式会社 | スイッチング電源装置の制御回路 |
JPWO2020039531A1 (ja) * | 2018-08-23 | 2021-08-26 | 国立大学法人東北大学 | 光センサ及びその信号読み出し方法並びに光エリアセンサ及びその信号読み出し方法 |
JP7333562B2 (ja) | 2018-08-23 | 2023-08-25 | 国立大学法人東北大学 | 光センサ及びその信号読み出し方法並びに光エリアセンサ及びその信号読み出し方法 |
Also Published As
Publication number | Publication date |
---|---|
EP1737032A4 (en) | 2008-05-28 |
KR20060132941A (ko) | 2006-12-22 |
JPWO2005091358A1 (ja) | 2008-02-07 |
US20070188155A1 (en) | 2007-08-16 |
CN1930677A (zh) | 2007-03-14 |
EP1737032A1 (en) | 2006-12-27 |
JP4855249B2 (ja) | 2012-01-18 |
CN100429764C (zh) | 2008-10-29 |
TW200537779A (en) | 2005-11-16 |
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