WO2004097435A1 - 液晶パネル用検査装置 - Google Patents
液晶パネル用検査装置 Download PDFInfo
- Publication number
- WO2004097435A1 WO2004097435A1 PCT/JP2004/005897 JP2004005897W WO2004097435A1 WO 2004097435 A1 WO2004097435 A1 WO 2004097435A1 JP 2004005897 W JP2004005897 W JP 2004005897W WO 2004097435 A1 WO2004097435 A1 WO 2004097435A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- numbered
- odd
- board
- probe
- liquid crystal
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Definitions
- the present invention is directed to a liquid crystal for inspecting a short-circuit state, an open state, TFT characteristics, and pixel characteristics of a conductive pattern for a terminal printed on an array glass for a liquid crystal panel.
- the present invention relates to a crystal panel inspection device.
- the conventional inspection apparatus for a liquid crystal panel makes the probe 2 of the probe block 1 abut the conductive pattern 4 for the terminal of the array glass 3 for the liquid crystal panel and the conductive pattern for the terminal.
- the flexible board 5 that connects one end of the signal from probe 4 to probe 2, probe 2 and the other end of flexible board 5.
- It is configured so as to inspect the short-circuit state, open-state, TFT characteristics, and pixel characteristics of the conductive pattern 4 for terminals by reading with the tester body 7 via the relay board 6 connected to the side. ing.
- the probe block 1 includes a plurality of probes 2 that are in contact with the terminal conductive patterns 4 of the test glass panel array glass 3, and a plurality of probes 2 are provided corresponding to the number of blocks of the terminal conductive patterns 4. (See Figure 4).
- Each of the plurality of probe blocks 1 has an odd-numbered flexible board 5a and an even-numbered flexible board that electrically connects one end to the probe 2 that is in contact with the odd-numbered and even-numbered wirings of the terminal conductive pattern 4, respectively.
- a flexible substrate 5 composed of a substrate 5b is provided.
- the other end of the flexible board 5 is connected to the odd-numbered flexible board 5 a and the even-numbered flexible board 5 b by the probe board 1 at the other end of the relay board 6 provided with the address conversion function.
- Correspondence address part 6a and even number correspondence The connection to the relay board 6 is made by connecting to the address section 6b.
- the tester main body 7 is provided with a plurality of probe pins P (for example, 1200 to 200 pins), and the probe pins P contact the same number of lands L provided on the relay board 6. Thus, electrical connection with the relay board 6 is achieved.
- reference numeral 21 denotes a support frame for supporting the probe block 1.
- the TFT array substrate that composes the liquid crystal panel
- it is used for the pixel signal terminals of the array glass 3 for the liquid crystal panel in the process before joining the TAB and the PCB (mounting printed circuit board) as the LSI for driving the panel lighting.
- a voltage is applied to each of the conductive patterns 4 to perform a characteristic test.
- the probe block 1 having a plurality of probes 2 is connected along the side of the liquid crystal panel array glass 3 along which the conductive patterns 4 for terminals are provided. And set them side by side. In the inspection, pixel inspection signals are sent separately for odd-numbered pixel terminals and even-numbered pixel terminals.
- a probe block 1 shown in FIG. 5 has been proposed (see, for example, Japanese Patent Application Laid-Open No. Hei 8-222229 (pages 3, 4, and 1)). .
- the probe block 1 has a plurality of probes 2 for making contact with each of a plurality of terminal conductive patterns 4 disposed on the pixels of the liquid crystal panel array glass 3, and a main body 20 on which a plate-shaped insulator is laminated. Approximately constituted by supporting by At this time, as shown in FIG. 5, the probe 2 is divided into two lines Ll and L2 corresponding to the odd-numbered and even-numbered terminals of the conductive pattern 4 for terminals (see FIG. 6). The lines L l and L 2 are arranged in a staggered manner. In addition, the probe 2 is configured so that the odd-numbered conductive needles 11a of the plurality of conductive needles projecting upward project above the even-numbered conductive needles 11b.
- the probe 2 connects each of the upper conductive needles 11a and 11b to the lower conductive gold f-shaped body 10 via a conductive coil spring 14 It is constituted by doing. At the time of the inspection, each of the conductive needles 10 comes into contact with one of the plurality of terminal conductive patterns 4 arranged in the pixel of the liquid crystal panel 3.
- the odd-numbered conductive needle 11a which is the longer one, is connected to the odd-numbered signal transmission angle conductive pattern 8 of the odd-numbered flexible board 5a attached to the lower surface of the upper insulating plate 12.
- the conductive pattern for even-numbered signal transmission of the even-numbered flexible board 5 b attached to the lower surface of the lower insulating plate 13 with the shorter even-numbered conductive needle 1 b The upper insulating plate 12 is superimposed on the lower insulating plate 13 so as to come into contact with 9.
- a detection device for a liquid crystal panel using the probe block 1 configured as described above, in order to provide the same number of probes 2 as the number of the conductive patterns 4 for the device, for example, approximately the same as TAB
- the probe 2 is divided into two lines L1 and L2 corresponding to the odd-numbered and even-numbered terminal conductive patterns 4, respectively.
- the staggered arrangement for each of L 1 and L 2 can sufficiently cope with the narrowing of the pitch of the conductive patterns 4 for terminals.However, the odd and even number distribution in the connection between the flexible substrate 5 and the relay substrate 6 can be reduced.
- the wiring 15 is performed using the wiring 15 on the printed circuit board constituting the relay board 6, the number of blocks of the terminal conductive pattern 4 where the crossing of the wirings 15 appears appears to increase. Alternatively, it is not possible to sufficiently cope with an increase in the number of wires per block of the pattern 4 and the pattern 4.
- the crossing state of the wirings 15 described above is based on the printed circuit board constituting the relay board 6.
- the problem can be solved by reducing the number of layers of the board and providing through holes, etc., and arranging the wiring 15 for each layer, but increasing the number of layers of the printed circuit board makes manufacturing difficult. , Cost and weight increase.
- the relay board 6 is configured by a multilayer printed board having 6 to 8 layers.
- the present invention can sufficiently increase the number of conductive patterns for terminals or the number of wirings per block of Z and the pattern without increasing the number of stacked multilayer printed circuit boards constituting the relay board.
- the purpose of the present invention is to provide an inspection apparatus for a liquid crystal panel capable of responding to the following. Disclosure of the invention
- An object of the present invention is to solve at least the above-mentioned problems.
- the inspection apparatus for a liquid crystal panel is provided with a probe block force having a plurality of probes abutting on a conductive pattern for a terminal of an array glass for a test liquid crystal panel.
- Each of the plurality of open blocks has a probe corresponding to an odd-numbered and an even-numbered wiring of the terminal conductive pattern, and an odd-numbered flexible board for electrically connecting one end side to the probe.
- a flexible board made of an even-numbered flexible board is provided, and the other end of the flexible board is arranged with the other end of the odd-numbered flexible board and the even-numbered flexible board for each probe block.
- the flexible substrate includes the odd-numbered flexible substrate and the even-numbered flexible substrate for each probe block.
- the odd pair Each of the connection ends is connected to the relay board by being gradually approached to the odd- and even-numbered address portions, while being distributed to each other according to the installation positions of the address portions and the even-numbered address portions. It is characterized by the following.
- the flexible board is configured such that the odd-numbered flexible board and the even-numbered flexible board are arranged for each probe block in accordance with the positions of the odd-numbered address section and the even-numbered address section in the relay board.
- the connection end portions are connected so as to approach the odd-numbered and even-numbered address portions, respectively, so that the number of layers of the relay board is reduced, and each of the odd-numbered and even-numbered flexible boards is reduced.
- the connection wiring between the connection end portion and the odd-numbered and even-numbered address portion can be set as short as possible.
- the odd-numbered (even-numbered) flexible board has a length sufficient to connect between the connected probe block and the connected odd-numbered (even-numbered) corresponding address portion. The above-mentioned distribution can be easily performed, and as a result, the target connected odd (even) corresponding address portion can be asymptotically approached.
- FIG. 1 is a schematic diagram illustrating an electrical connection state between an array glass for a liquid crystal panel and a relay substrate via a plurality of block blocks in the inspection apparatus for a liquid crystal panel of the present invention.
- FIG. 2 shows a relay board as one embodiment of the present invention.
- FIG. 2 (a) is a plan view thereof, and
- FIG. 2 (b) is a side view thereof.
- FIG. 3 is a schematic explanatory view for explaining an entire electrical connection system of the inspection apparatus for a liquid crystal panel.
- FIG. 4 is a schematic diagram illustrating an electrical connection state between a liquid crystal panel array glass and a relay substrate via a plurality of probe blocks in a conventional liquid crystal panel inspection apparatus.
- FIG. 1 is a schematic diagram illustrating an electrical connection state between an array glass for a liquid crystal panel and a relay substrate via a plurality of block blocks in the inspection apparatus for a liquid crystal panel of the present invention.
- FIG. 2 shows a relay board as one embodiment of the present invention.
- FIG. 5 is a cross-sectional view of a main part of a conventional inspection device for a liquid crystal panel.
- Fig. 6 shows the contact state of the probe with the terminal conductive pattern of the conventional LCD panel inspection device. It is an explanatory view for explaining. BEST MODE FOR CARRYING OUT THE INVENTION
- FIG. 1 shows a connection structure between a flexible board and a relay board as one embodiment of the present invention.
- the entire connection system of the inspection apparatus for a liquid crystal panel makes the probe 2 of the probe block 1 contact the conductive pattern 4 for the terminals of the array glass 3 for the liquid crystal panel.
- the signal from the terminal conductive pattern 4 is read by the tester body 7 via the probe 2, the flexible board 5 connected to one end of the probe 2, and the relay board 6 connected to the other end of the flexible board 5. It is configured to detect the short state, open state, TFT characteristics, and pixel characteristics of the conductive pattern 4 for use.
- the probe block 1 has a plurality of probes 2 that abut on the terminal conductive patterns 4 of the array glass 3 for the test liquid crystal panel, and corresponds to the number of blocks of the terminal conductive patterns 4 (for example, 8 blocks). There are a plurality (8 for 8 blocks) (see Fig. 1). The plurality of probe blocks 1 are mounted on a support frame (see support frame 21 in FIG. 3) and incorporated into the inspection apparatus.
- Each of the plurality of probe blocks 1 has an odd-numbered terminal conductive pattern 4.
- a flexible board 5 composed of an odd-numbered flexible board 5a and an even-numbered flexible board 5b that electrically connects one end side to the probe 2 that abuts on each of the even-numbered wirings is provided.
- the other end of the flexible board 5 is connected to the odd-numbered flexible board 5 a and the even-numbered flexible board 5 b for each probe block 1, and to the odd-numbered address section 6 a and even-numbered section in the relay board 6.
- connection ends 5A and 5B are connected to the relay board 6 by being asymptotically connected to the odd and even corresponding address portions 6a and 6b, respectively. Connected.
- the odd-numbered and even-numbered flexi-pole substrates 5a and 5b constituting the flexi-pull board 5 are connected to the skin connection probe block 1 and the connected odd-numbered (even-numbered) corresponding address section 6a (6b). It is configured to have a sufficient length to connect between them.
- the flexible substrate can be distributed by crossing the flexible substrates, as in the present embodiment, the direction can be changed by the bent portion 5c in the middle portion, and the direction change is performed as described above. Sorting can be performed more easily.
- the bent portion 5 c is determined by the positional relationship between the connected probe block 1 and the connected odd (even) corresponding address portion 6 a (6 b), and is not required when linear connection is possible. However, in other cases, it is easier to sort by forming two or more pieces.
- connection ends 5 A and 5 B of the odd- and even-numbered flexible boards 5 a and 5 b are respectively connected to the odd-numbered and even-numbered address sections 6 by wiring 15 arranged on the relay board 6. Connected to a and 6b.
- connectors to which the connection ends 5A and 5B are connected are provided on the relay board 6.
- the relay board 6 consists of a double-sided printed circuit board.
- Connectors C l and C 3 are flexible for each probe block 1
- the odd-numbered connector to which the board 5a is connected, and the connectors C2 and C4 are the even-numbered connectors to which the even-numbered flexible board 5b of each probe block 1 is connected.
- the solid line indicates the wiring 15 provided on the surface of the relay board 6, and the broken line indicates the wiring 15 provided on the back surface of the relay board 6.
- the numbers “1” to “24” indicate addresses.
- the solid line in the thickness direction of the relay board 6 electrically connects the wirings 15 provided on the front and rear surfaces, respectively.
- reference symbol L denotes a land of each wiring 15 formed on the back surface of the relay board 6.
- the wiring 15 on the front side of the address "1 3" is connected to the wiring 15 on the back side via the snoring line h
- the wiring 15 on the front side of the address "7" is It is connected to the wiring 15 on the back side through the through hole h, and the two seem to intersect the broken line and the solid line in plan view, but avoid the actual intersection due to the difference in the wiring surface of the relay board 6 be able to.
- the odd-numbered even-numbered flexible boards 5 a and 5 ′ b provided in one of the probe blocks 1 are each connected to the connector C 1.
- C2 and the odd-even flexible boards 5a and 5b provided on the other probe block 1 are connected to connectors C3 and C4, respectively.
- Wiring 15 of connectors C 1 and C 3 is connected to land L of odd-numbered address section 6a
- wiring 15 of connectors C 2 and C 4 is connected to land L of even-numbered address section 6b. Connected.
- a probe pin see a probe pin P in FIG. 3
- the relay board 6 uses a plurality of multilayer printed boards on which wirings 15 and through holes; h are appropriately arranged, and connectors C 1, C 2,. Address portions 6a and 6b having lands L on the lowermost surface are provided.
- the flexible substrate 5 (5a, 5b) are to be distributed to each other, so that the intersections of the flexible substrates 5 (5a, 5b) occur, but the inconvenience due to the intersection does not occur, but the force ⁇ A, 5B and the odd-numbered and even-numbered address portions 6a, 6b can be asymptotically set so that the connection wiring 15 can be set as short as possible, and thus the wiring 15 can be simplified.
- the connecting board 6 can sufficiently cope with an increase in the number of blocks of the terminal conductive pattern 4 or an increase in the number of wirings per block of Z and the pattern 4.
- the relay board 6 is arranged so that the flexible boards 5 cross each other, it is possible to simplify the arrangement of the layers 15 that has been conventionally performed, thereby reducing the number of layers as much as possible. It can be constituted by a printed board.
- the conventional apparatus requires lamination of 6 to 8 glass substrates, whereas the present apparatus requires:
- the relay substrate 6 can be configured by laminating two to four glass substrates.
- the odd corresponding flexi-nore board and the even corresponding flexi-nore board are changed according to the installation positions of the odd corresponding address section and the even corresponding address section in the relay board.
- the connection wiring between each connection end of the odd-numbered and even-numbered flexible substrate and the odd-numbered / even-numbered addressable part can be set as short as possible, and the occurrence of the crossing state of the connection wiring can be avoided. Therefore, it is possible to reduce the number of stacked multilayer printed circuit boards constituting the relay board, thereby achieving easy manufacturing, lighter weight of the apparatus, and cost reduction.
- the number of laminated multilayer printed circuit boards constituting the relay board is small, the number of blocks of the conductive pattern for the terminal is increased, or the number of wirings per block of Z and the pattern is sufficiently increased. There is an advantage that it can be done.
- the flexible substrate is configured such that the odd-numbered flexible substrate and the even-numbered flexible substrate are provided for each probe block, and the odd-numbered address in the relay substrate. And even-numbered address sections are allocated to each other according to the installation position, and their connection ends are connected to the odd-numbered and even-numbered addressless sections, respectively.
- the number of layers of the relay board can be reduced, and the connection wiring between each connection end of the odd-numbered and even-numbered flexible boards and the odd-numbered and even-numbered address portions can be set as short as possible.
- Arrays-For testing LCD panels that detect the short-circuit state, open state, TFT characteristics, and pixel characteristics of conductive patterns for terminals printed on glass Te is preferred.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Liquid Crystal (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003122718A JP4219729B2 (ja) | 2003-04-25 | 2003-04-25 | 液晶パネル用検査装置 |
JP2003-122718 | 2003-04-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2004097435A1 true WO2004097435A1 (ja) | 2004-11-11 |
Family
ID=33410089
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2004/005897 WO2004097435A1 (ja) | 2003-04-25 | 2004-04-23 | 液晶パネル用検査装置 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP4219729B2 (ja) |
KR (1) | KR100774016B1 (ja) |
CN (1) | CN100434925C (ja) |
TW (1) | TWI325499B (ja) |
WO (1) | WO2004097435A1 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20060122804A (ko) * | 2006-11-11 | 2006-11-30 | 윤재완 | 디스플레이 패널 검사용 프로브 블록 |
CN101140312B (zh) * | 2007-10-23 | 2010-12-08 | 南京华显高科有限公司 | 等离子体显示板电极短路、断路检测方法及其装置 |
CN104360112B (zh) * | 2014-10-30 | 2018-04-06 | 通富微电子股份有限公司 | 半导体测试治具及其形成方法 |
CN104407182B (zh) * | 2014-10-30 | 2018-09-21 | 通富微电子股份有限公司 | 半导体测试治具 |
US10001509B2 (en) | 2014-10-30 | 2018-06-19 | Tongfu Microelectronics Co., Ltd. | Semiconductor testing fixture and fabrication method thereof |
CN112212782B (zh) * | 2019-06-25 | 2023-01-17 | 合肥欣奕华智能机器股份有限公司 | 一种玻璃基板检测方法、装置及系统 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08222299A (ja) * | 1995-02-17 | 1996-08-30 | Nhk Spring Co Ltd | 導電性接触子ユニット |
JPH0961458A (ja) * | 1995-08-22 | 1997-03-07 | Sharp Corp | 液晶表示パネルの検査装置 |
JP2000310758A (ja) * | 1999-04-27 | 2000-11-07 | Ricoh Co Ltd | 液晶表示装置の検査方法および検査装置 |
JP2003066870A (ja) * | 2001-08-24 | 2003-03-05 | Seiko Epson Corp | 電気光学パネル及びその検査方法並びに電子機器 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3624570B2 (ja) * | 1996-09-02 | 2005-03-02 | セイコーエプソン株式会社 | 液晶表示パネルの検査装置、液晶表示パネルの検査方法及び集積回路の実装方法 |
WO2001036987A1 (fr) * | 1999-11-16 | 2001-05-25 | Toray Engineering Co., Ltd. | Sonde, son procede de fabrication, et procede de verification d'un substrat a l'aide de la sonde |
-
2003
- 2003-04-25 JP JP2003122718A patent/JP4219729B2/ja not_active Expired - Fee Related
-
2004
- 2004-04-23 KR KR1020057020194A patent/KR100774016B1/ko active IP Right Grant
- 2004-04-23 WO PCT/JP2004/005897 patent/WO2004097435A1/ja active Application Filing
- 2004-04-23 CN CNB2004800111422A patent/CN100434925C/zh not_active Expired - Fee Related
- 2004-04-23 TW TW093111359A patent/TWI325499B/zh not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08222299A (ja) * | 1995-02-17 | 1996-08-30 | Nhk Spring Co Ltd | 導電性接触子ユニット |
JPH0961458A (ja) * | 1995-08-22 | 1997-03-07 | Sharp Corp | 液晶表示パネルの検査装置 |
JP2000310758A (ja) * | 1999-04-27 | 2000-11-07 | Ricoh Co Ltd | 液晶表示装置の検査方法および検査装置 |
JP2003066870A (ja) * | 2001-08-24 | 2003-03-05 | Seiko Epson Corp | 電気光学パネル及びその検査方法並びに電子機器 |
Also Published As
Publication number | Publication date |
---|---|
CN1781028A (zh) | 2006-05-31 |
JP2004325962A (ja) | 2004-11-18 |
CN100434925C (zh) | 2008-11-19 |
KR20060003054A (ko) | 2006-01-09 |
JP4219729B2 (ja) | 2009-02-04 |
TW200504373A (en) | 2005-02-01 |
KR100774016B1 (ko) | 2007-11-08 |
TWI325499B (en) | 2010-06-01 |
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