WO2003008352B1 - Device and method for scribing fragile material substrate - Google Patents

Device and method for scribing fragile material substrate

Info

Publication number
WO2003008352B1
WO2003008352B1 PCT/JP2002/007326 JP0207326W WO03008352B1 WO 2003008352 B1 WO2003008352 B1 WO 2003008352B1 JP 0207326 W JP0207326 W JP 0207326W WO 03008352 B1 WO03008352 B1 WO 03008352B1
Authority
WO
WIPO (PCT)
Prior art keywords
material substrate
brittle material
initial crack
scribing
planned
Prior art date
Application number
PCT/JP2002/007326
Other languages
English (en)
French (fr)
Other versions
WO2003008352A1 (en
Inventor
Haruo Wakayama
Original Assignee
Mitsuboshi Diamond Ind Co Ltd
Haruo Wakayama
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsuboshi Diamond Ind Co Ltd, Haruo Wakayama filed Critical Mitsuboshi Diamond Ind Co Ltd
Priority to KR1020037010418A priority Critical patent/KR100551526B1/ko
Priority to JP2003513913A priority patent/JP4133812B2/ja
Publication of WO2003008352A1 publication Critical patent/WO2003008352A1/ja
Publication of WO2003008352B1 publication Critical patent/WO2003008352B1/ja
Priority to HK05101802A priority patent/HK1069377A1/xx

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/09Severing cooled glass by thermal shock
    • C03B33/091Severing cooled glass by thermal shock using at least one focussed radiation beam, e.g. laser beam
    • C03B33/093Severing cooled glass by thermal shock using at least one focussed radiation beam, e.g. laser beam using two or more focussed radiation beams
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • B23K26/382Removing material by boring or cutting by boring
    • B23K26/386Removing material by boring or cutting by boring of blind holes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/073Shaping the laser spot
    • B23K26/0736Shaping the laser spot into an oval shape, e.g. elliptic shape
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/40Removing material taking account of the properties of the material involved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70Auxiliary operations or equipment
    • B23K26/702Auxiliary equipment
    • B23K26/703Cooling arrangements
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/02Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
    • C03B33/023Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
    • C03B33/03Glass cutting tables; Apparatus for transporting or handling sheet glass during the cutting or breaking operations
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/09Severing cooled glass by thermal shock
    • C03B33/091Severing cooled glass by thermal shock using at least one focussed radiation beam, e.g. laser beam
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00Materials to be soldered, welded or cut
    • B23K2103/50Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2249/00Aspects relating to conveying systems for the manufacture of fragile sheets
    • B65G2249/04Arrangements of vacuum systems or suction cups
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Thermal Sciences (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)
  • Laser Beam Processing (AREA)

Claims

捕正書の請求の範囲 [ 2 0 0 3年 1月 6日 (0 6 . 0 1 . 0 3 ) 国際事務局受理:新しい請求の範囲 8— 1 0が加えられた;出願当初の請求の範囲 4は捕正された;他の請求の範囲は変更 なし。 (2頁) ]
1 . (補正後) 脆性材料基板の表面におけるスクライブ形成予定ラインに沿つ て、 該脆性材料基板の軟化点よりも低い温度で連続して加熱する加熱手段と、 該加熱手段によって加熱された脆性材料基板表面の領域の近傍を冷却する冷 却手段と、
前記加熱手段によって前記脆性材料表面の初期亀裂の形成予定箇所が加熱さ れた後に、 該スクライブ形成予定ラインに沿つた初期亀裂を該初期亀裂の形成 予定箇所に形成する亀裂形成手段と、
を具備する脆性材料基板のスクライブ装置。
2 . 前記冷却手段にて冷却された領域の近傍をさらに加熱する加熱手段が設け られている請求項 1に記載の脆性材料基板のスクライブ装置。
3 . 前記亀裂形成手段は、 短波長のパルスレーザ一発振器を有している請求項 1に記載の脆性材料基板のスクライブ装置。
4 . (補正後) 脆性材料基板の表面におけるスクライブ形成予定ラインに沿つ て、 該脆性材料基板の軟化点よりも低い温度で脆性材料基板の表面を加熱しつ つ、 該加熱された領域の近傍の領域を連続して冷却することにより、 該スクラ ィブ形成予定ラインに沿ってクラックを形成する脆性材料基板のスクライブ方 法であって、
前記脆性材料基板表面の初期亀裂の形成予定箇所が、 まず加熱された後の時 点で該初期亀裂の形成予定箇所にスクライブ形成予定ラインに沿つた初期亀裂 を形成することを特徴とする脆性材料基板のスクライブ方法。
5 . 前記初期亀裂は、 短波長のパルスレ一ザビームによって形成されることを 特徴とする請求項 4に記載の脆性材料基板のスクライブ方法。
6 . 前記初期亀裂は、 前記脆性基板の側縁部に形成される請求項 5に記載の脆 性材料基板のスクライブ方法。
7 . 前記初期亀裂は、 前記形成されたスクライブラインに対して、 前記形成さ れたスクライブラインの直後に、 ほぼ直角に接するように形成される請求項 6 に記載の脆性材料基板のスクライブ方法。
8 . (追加) 脆性材料基板の表面におけるスクライブ形成予定ラインに沿って、
20
補正された用紙 (条約第 19条) 該脆性材料基板の軟化点よりも低い温度で連続して加熱する加熱手段と、 該加熱手段によって加熱された脆性材料基板表面の領域の近傍を冷却する冷 却手段と、
該スクライブ形成予定ラインに沿った初期亀裂を脆性材料基板表面の初期亀 裂の形成予定箇所に形成する亀裂形成手段と、
を具備する脆性材料基板のスクライブ装置において、
前記加熱手段によつて前記初期亀裂の形成予定箇所が加熱され、 該初期亀裂 の形成予定箇所の周辺に圧縮応力が発生した状況で、 前記初期亀裂形成手段に よつて前記スクライブ予定ラインに沿つた初期亀裂を形成することを特徴とす る脆性材料基板のスクライブ装置。
9 . (追加) 前記冷却手段にて冷却された領域の近傍をさらに加熱する加熱手 段が設けられている請求項 8に記載の脆性材料基板のスクライブ装置。
1 0 . (追加) 前記亀裂形成手段は、 短波長のパルスレーザー発振器を有して いる請求項 8に記載の脆性材料基板のスクライブ装置。
21
補正された用紙(条約第 19条)
PCT/JP2002/007326 2001-07-18 2002-07-18 Device and method for scribing fragile material substrate WO2003008352A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020037010418A KR100551526B1 (ko) 2001-07-18 2002-07-18 취성재료 기판의 스크라이브 장치 및 스크라이브 방법
JP2003513913A JP4133812B2 (ja) 2001-07-18 2002-07-18 脆性材料基板のスクライブ装置およびスクライブ方法
HK05101802A HK1069377A1 (en) 2001-07-18 2005-03-01 Device and method for scribing fragile material substrate

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001218572 2001-07-18
JP2001-218572 2001-07-18

Publications (2)

Publication Number Publication Date
WO2003008352A1 WO2003008352A1 (en) 2003-01-30
WO2003008352B1 true WO2003008352B1 (en) 2003-03-20

Family

ID=19052739

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/007326 WO2003008352A1 (en) 2001-07-18 2002-07-18 Device and method for scribing fragile material substrate

Country Status (6)

Country Link
JP (1) JP4133812B2 (ja)
KR (1) KR100551526B1 (ja)
CN (1) CN1264768C (ja)
HK (1) HK1069377A1 (ja)
TW (1) TW592868B (ja)
WO (1) WO2003008352A1 (ja)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4175636B2 (ja) 2003-10-31 2008-11-05 株式会社日本製鋼所 ガラスの切断方法
WO2006038565A1 (ja) * 2004-10-01 2006-04-13 Mitsuboshi Diamond Industrial Co., Ltd. 脆性材料のスクライブ方法およびスクライブ装置
TW200633808A (en) * 2004-12-28 2006-10-01 Mitsuboshi Diamond Ind Co Ltd Method for cutting brittle material substrate and substrate cutting system
JP5011048B2 (ja) * 2007-09-27 2012-08-29 三星ダイヤモンド工業株式会社 脆性材料基板の加工方法
CN101234850B (zh) * 2008-02-20 2010-12-08 友达光电股份有限公司 玻璃基板的激光切割方法
WO2009128334A1 (ja) * 2008-04-14 2009-10-22 三星ダイヤモンド工業株式会社 脆性材料基板の加工方法
JP2009294461A (ja) * 2008-06-05 2009-12-17 Toshiba Mobile Display Co Ltd 液晶表示装置及びその製造方法
JP5443851B2 (ja) * 2009-06-29 2014-03-19 三星ダイヤモンド工業株式会社 薄板ガラス基板のスクライブ方法およびスクライブ装置
WO2011002089A1 (ja) * 2009-07-03 2011-01-06 旭硝子株式会社 脆性材料基板の割断方法及び割断装置並びにその割断方法により得られる車両用窓ガラス
US8932510B2 (en) 2009-08-28 2015-01-13 Corning Incorporated Methods for laser cutting glass substrates
CN102596831B (zh) * 2009-11-03 2015-01-07 康宁股份有限公司 具有非恒定速度的移动玻璃带的激光刻划
US8946590B2 (en) 2009-11-30 2015-02-03 Corning Incorporated Methods for laser scribing and separating glass substrates
JP5237318B2 (ja) * 2010-03-19 2013-07-17 三星ダイヤモンド工業株式会社 基板分断装置
JP5500377B2 (ja) * 2010-08-30 2014-05-21 日本電気硝子株式会社 ガラスフィルムの製造方法及び製造装置
US8720228B2 (en) 2010-08-31 2014-05-13 Corning Incorporated Methods of separating strengthened glass substrates
US9938180B2 (en) 2012-06-05 2018-04-10 Corning Incorporated Methods of cutting glass using a laser
US9610653B2 (en) 2012-09-21 2017-04-04 Electro Scientific Industries, Inc. Method and apparatus for separation of workpieces and articles produced thereby
CN107000254B (zh) * 2015-02-03 2019-09-24 中央硝子株式会社 平板玻璃的切割方法、平板玻璃的切割装置、切割平板玻璃的制造方法以及切割平板玻璃
JP6775822B2 (ja) * 2016-09-28 2020-10-28 三星ダイヤモンド工業株式会社 脆性材料基板の分断方法並びに分断装置
CN110416155B (zh) * 2019-07-05 2021-10-15 佛山市国星半导体技术有限公司 一种led晶圆切割劈裂方法及led芯片

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JP2000167681A (ja) * 1998-12-04 2000-06-20 Samsung Electronics Co Ltd レ―ザ切断用基板,液晶表示装置パネルおよび液晶表示装置パネルの製造方法
JP2001176820A (ja) * 1999-12-15 2001-06-29 Hitachi Cable Ltd 基板の加工方法及びその加工装置
JP2002100590A (ja) * 2000-09-22 2002-04-05 Sony Corp 割断装置及びその方法
KR100673073B1 (ko) * 2000-10-21 2007-01-22 삼성전자주식회사 레이저 빔을 이용한 비금속 기판의 절단 방법 및 장치

Also Published As

Publication number Publication date
JP4133812B2 (ja) 2008-08-13
TW592868B (en) 2004-06-21
KR20040010588A (ko) 2004-01-31
HK1069377A1 (en) 2005-05-20
CN1264768C (zh) 2006-07-19
KR100551526B1 (ko) 2006-02-13
WO2003008352A1 (en) 2003-01-30
JPWO2003008352A1 (ja) 2004-11-04
CN1525944A (zh) 2004-09-01

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