WO2002044799A1 - Dispositif detecteur du motif de circuit et procede de detection de motif de circuit - Google Patents
Dispositif detecteur du motif de circuit et procede de detection de motif de circuit Download PDFInfo
- Publication number
- WO2002044799A1 WO2002044799A1 PCT/JP2001/010478 JP0110478W WO0244799A1 WO 2002044799 A1 WO2002044799 A1 WO 2002044799A1 JP 0110478 W JP0110478 W JP 0110478W WO 0244799 A1 WO0244799 A1 WO 0244799A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- circuit pattern
- layer
- pattern detecting
- electro
- reflection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/133502—Antiglare, refractive index matching layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/03—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on ceramics or electro-optical crystals, e.g. exhibiting Pockels effect or Kerr effect
- G02F1/0305—Constructional arrangements
- G02F1/0311—Structural association of optical elements, e.g. lenses, polarizers, phase plates, with the crystal
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Tests Of Electronic Circuits (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Measurement Of Current Or Voltage (AREA)
- Manufacturing Of Printed Wiring (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/295,847 US6894514B2 (en) | 2000-12-01 | 2002-11-18 | Circuit pattern detecting apparatus and circuit pattern inspecting method |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000366788 | 2000-12-01 | ||
JP2000-366788 | 2000-12-01 | ||
JP2001313771 | 2001-10-11 | ||
JP2001-313771 | 2001-10-11 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/295,847 Continuation US6894514B2 (en) | 2000-12-01 | 2002-11-18 | Circuit pattern detecting apparatus and circuit pattern inspecting method |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002044799A1 true WO2002044799A1 (fr) | 2002-06-06 |
Family
ID=26605061
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/010478 WO2002044799A1 (fr) | 2000-12-01 | 2001-11-30 | Dispositif detecteur du motif de circuit et procede de detection de motif de circuit |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR100826505B1 (ja) |
CN (1) | CN1265232C (ja) |
TW (1) | TWI269878B (ja) |
WO (1) | WO2002044799A1 (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI391685B (zh) * | 2009-10-16 | 2013-04-01 | Ind Tech Res Inst | 繞線製品檢測機台及其層間短路之檢測方法 |
CN102207514B (zh) * | 2011-03-23 | 2013-07-17 | 吉林大学 | 一种基于流体电光材料的电光探头及用于探测电场的方法 |
EP2662758A3 (en) | 2012-05-09 | 2015-03-04 | LG Innotek Co., Ltd. | Electrode member and touch window including the same |
JP5417651B1 (ja) * | 2013-01-08 | 2014-02-19 | オー・エイチ・ティー株式会社 | 回路パターン検査装置 |
JP6182974B2 (ja) * | 2013-05-20 | 2017-08-23 | 日本電産リード株式会社 | 基板検査方法 |
CN105988059A (zh) * | 2015-03-26 | 2016-10-05 | 上海纪显电子科技有限公司 | 检测装置及检测方法 |
CN106154596A (zh) * | 2015-04-08 | 2016-11-23 | 上海纪显电子科技有限公司 | 光电显示装置、检测装置及其方法 |
IT201700040531A1 (it) * | 2017-04-12 | 2018-10-12 | Ricerca Sul Sist Energetico Rse S P A | Metodo per la misura vettoriale di campi elettrici e relativa apparecchiatura. |
JP7551915B2 (ja) * | 2021-05-21 | 2024-09-17 | 株式会社日立ハイテク | 試料検査装置 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4906922A (en) * | 1987-07-13 | 1990-03-06 | Hamamatsu Photonics K. K. | Voltage mapping device having fast time resolution |
JPH063375A (ja) * | 1992-06-23 | 1994-01-11 | Nippon Steel Corp | 電気光学効果を利用した電界分布測定装置 |
JPH06175092A (ja) * | 1992-12-09 | 1994-06-24 | Ngk Insulators Ltd | 空間光変調素子 |
JPH0792236A (ja) * | 1993-08-06 | 1995-04-07 | Nikon Corp | 基板表面の電圧分布の検査装置 |
JPH07134147A (ja) * | 1993-11-10 | 1995-05-23 | Fujitsu Ltd | 信号波形測定装置 |
JPH07181212A (ja) * | 1993-12-24 | 1995-07-21 | Yokogawa Electric Corp | 表面電位計測センサ |
JP2000292755A (ja) * | 1999-04-01 | 2000-10-20 | Yamaha Corp | 収差補正素子およびこれを用いた光ピックアップ |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03167490A (ja) * | 1989-11-27 | 1991-07-19 | Fujitsu Ltd | 実装プリント板試験装置 |
JPH05134219A (ja) * | 1991-03-13 | 1993-05-28 | Ngk Insulators Ltd | 空間光変調素子 |
JP2884807B2 (ja) * | 1991-04-08 | 1999-04-19 | ダイキン工業株式会社 | 空気調和装置のデフロスト装置 |
JPH0682508A (ja) * | 1992-09-03 | 1994-03-22 | Fujitsu Ltd | 基板検査装置 |
JPH08122515A (ja) * | 1994-10-26 | 1996-05-17 | Dainippon Toryo Co Ltd | カラーフィルターの製造方法 |
JP2735048B2 (ja) * | 1995-09-01 | 1998-04-02 | 日本電気株式会社 | 電子部品の半田接続検査方法及び検査装置 |
JPH10293932A (ja) | 1997-04-17 | 1998-11-04 | Mitsumi Electric Co Ltd | 光ディスク駆動装置における光ピックアップのスキュー調整機構 |
-
2001
- 2001-11-30 CN CNB018040187A patent/CN1265232C/zh not_active Expired - Fee Related
- 2001-11-30 WO PCT/JP2001/010478 patent/WO2002044799A1/ja active Application Filing
- 2001-11-30 TW TW090129745A patent/TWI269878B/zh not_active IP Right Cessation
- 2001-11-30 KR KR1020027009927A patent/KR100826505B1/ko not_active IP Right Cessation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4906922A (en) * | 1987-07-13 | 1990-03-06 | Hamamatsu Photonics K. K. | Voltage mapping device having fast time resolution |
JPH063375A (ja) * | 1992-06-23 | 1994-01-11 | Nippon Steel Corp | 電気光学効果を利用した電界分布測定装置 |
JPH06175092A (ja) * | 1992-12-09 | 1994-06-24 | Ngk Insulators Ltd | 空間光変調素子 |
JPH0792236A (ja) * | 1993-08-06 | 1995-04-07 | Nikon Corp | 基板表面の電圧分布の検査装置 |
JPH07134147A (ja) * | 1993-11-10 | 1995-05-23 | Fujitsu Ltd | 信号波形測定装置 |
JPH07181212A (ja) * | 1993-12-24 | 1995-07-21 | Yokogawa Electric Corp | 表面電位計測センサ |
JP2000292755A (ja) * | 1999-04-01 | 2000-10-20 | Yamaha Corp | 収差補正素子およびこれを用いた光ピックアップ |
Also Published As
Publication number | Publication date |
---|---|
KR20030009349A (ko) | 2003-01-29 |
CN1395697A (zh) | 2003-02-05 |
KR100826505B1 (ko) | 2008-05-02 |
CN1265232C (zh) | 2006-07-19 |
TWI269878B (en) | 2007-01-01 |
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