WO2001013517A2 - Ladungspumpe - Google Patents
Ladungspumpe Download PDFInfo
- Publication number
- WO2001013517A2 WO2001013517A2 PCT/DE2000/002791 DE0002791W WO0113517A2 WO 2001013517 A2 WO2001013517 A2 WO 2001013517A2 DE 0002791 W DE0002791 W DE 0002791W WO 0113517 A2 WO0113517 A2 WO 0113517A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- branch
- output
- circuit arrangement
- arrangement according
- current
- Prior art date
Links
- 230000001105 regulatory effect Effects 0.000 claims abstract description 6
- 230000033228 biological regulation Effects 0.000 claims description 3
- 239000010453 quartz Substances 0.000 claims description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 230000010363 phase shift Effects 0.000 claims description 2
- 230000001276 controlling effect Effects 0.000 claims 1
- 239000013256 coordination polymer Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- ANVAOWXLWRTKGA-NTXLUARGSA-N (6'R)-beta,epsilon-carotene Chemical compound CC=1CCCC(C)(C)C=1\C=C\C(\C)=C\C=C\C(\C)=C\C=C\C=C(/C)\C=C\C=C(/C)\C=C\[C@H]1C(C)=CCCC1(C)C ANVAOWXLWRTKGA-NTXLUARGSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 229920000729 poly(L-lysine) polymer Polymers 0.000 description 1
- 238000012358 sourcing Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/089—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal the phase or frequency detector generating up-down pulses
- H03L7/0891—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal the phase or frequency detector generating up-down pulses the up-down pulses controlling source and sink current generators, e.g. a charge pump
- H03L7/0895—Details of the current generators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D13/00—Circuits for comparing the phase or frequency of two mutually-independent oscillations
- H03D13/003—Circuits for comparing the phase or frequency of two mutually-independent oscillations in which both oscillations are converted by logic means into pulses which are applied to filtering or integrating means
- H03D13/004—Circuits for comparing the phase or frequency of two mutually-independent oscillations in which both oscillations are converted by logic means into pulses which are applied to filtering or integrating means the logic means delivering pulses at more than one terminal, e.g. up and down pulses
Definitions
- the invention relates to a circuit arrangement of a charge pump with an input side, an output side and with at least one current mirror and a transistor, which are assigned to a source branch for generating a source current and a sink branch for generating a sink current, wherein at least one branch has an input-side transistor and the two branches each have at least one output-side transistor and a switching transistor as output stage, a first branch being controlled via a reference current.
- the aim is to use a highly accurate reference frequency to generate a further highly accurate and stable frequency F VC o on an oscillator VCO, which may differ from the original reference frequency.
- An exemplary circuit of such a PLL is shown in FIG. 5 described later.
- a mostly quartz-stable frequency F q is divided down to a required reference frequency F ref with a frequency divider R.
- the output frequency F vcc of the voltage-controlled oscillator VCO is divided down to a frequency F vco / N with the aid of a further divider N.
- phase detector PD In which they are compared with respect to their relative phase position, that is to say with respect to a frequency that changes relative to one another.
- the phase detector PD generates two pulse width modulated pulse trains UP and DOWN at its output, the pulse widths of which are in a fixed relationship to the phase difference of the frequencies at its inputs. If the frequency F V o / N is too high against F re f, i.e. if the phase of the frequency F vco / N leads that of F re f, the phase detector switches the DOWN output on longer than the UP output.
- the UP and DOWN pulse trains control a charge pump CP, to the output of which a loop filter LF is connected, which acts like an integrator.
- This loop filter LF can be an active or preferably a passive filter in the phase-locked loop.
- a pulse on the UP line causes the charge pump CP to conduct a current of a defined size into the loop filter LF, so that the voltage at the loop filter V F increases over the duration of the UP-I pulse due to the amount of charge transported into the loop filter.
- This process is referred to as "sourcing" and is effected in the charge pump by the source branch.
- a pulse on the DOWN line pulls a current out of the loop filter LF so that the voltage tends to drop over the duration of the pulse. This process is called “sinking" and is caused by the sink branch of the charge pump.
- the mean voltage change at the loop filter is therefore determined exclusively for the currents of the same size by the relative duration of the UP and DOWN pulses to one another.
- the voltage at the loop filter LF should ideally not change, since the net current into the loop filter is zero and no net charge is transported into the loop filter or away from the loop filter.
- the voltage v_tune at the output V ⁇ f which is set at the loop filter LF, now serves as a control voltage for the oscillator VCO, whose frequency F V co or whose phase is coupled to the phase of the quartz oscillator Q by the now closed control loop.
- the oscillator frequency F vco can be set over a wide range.
- control voltage for the oscillator which is equal to the voltage v_tune at the output V if of the loop filter LF, must be varied within a wide range in order to be able to keep the voltage-controlled oscillator VCO at the desired frequency .
- a charge pump In the circuit arrangement of a charge pump known in the prior art, as shown by way of example in FIG. 1, it has a source branch, consisting of PMOS transistors pl, mp2, mp3, mp4, which represent a switched current mirror, which multiplies the current i_ref_ttle by a predetermined mirror ratio n and feeds from the voltage supply VDD into the output connection Pdout with the voltage v_tune as soon as the UP control signal has a logical LOW potential.
- the inverted UP signal of the phase detector PD is applied to the UP control input.
- this known charge pump has a mirror branch arranged in mirror image to the source branch, which is equipped in accordance with its function with NMOS transistors mnl, mn2, mn3, mn4, which during a logical HIGH potential at the DOWN control connection have the predetermined mirror ratio n multiplied current i_ref_senke derives from the output terminal Pdout in the direction of ground VSS.
- the problem with this circuit arrangement is that the mirror ratios in the source branch and sink branch only occur with a single voltage v_tune at the output Pdout, a specific operating temperature and a specific constellation of the technological parameters (for example output resistance of the transistors, threshold voltage V ⁇ or matching) can be set exactly symmetrically. Due to the channel length modulation of the MOS transistors, the technological scatter (for example matching) and the temperature behavior of the electronic components, there is an asymmetry of the currents i_sammlung and i_senke with all other voltages v_tune.
- the transistor output resistance makes the magnitude of the sink current larger and the magnitude of the source current smaller as the voltage v_tune increases, while the source current i_source increases and the sink current i decreases as the voltage v_tune becomes smaller gets smaller.
- the output transistors mpl and mnl are also no longer operated in the (deep) saturation range, so that the source or sink current is noticeably reduced.
- Sink current i_senke is equal to 0. This means that in voltage ranges v_tune near VSS or near VDD, the symmetry of the sink currents of the sink side i_senke and the source side i source are severely disturbed.
- the usable range for the tuning voltage v_tune is limited to a relatively narrow range of values - around an average ideal value.
- the voltage at the loop filter can only be kept constant on average during each PLL run if the ABL pulse is distorted ⁇ , that is, either the source or the sink part of the pump is switched on a little longer. Only then can the total charge transported to the loop filter in a reference cycle become zero.
- the voltage v_tune at the output Pdout (loop filter voltage) is modulated onto a transient periodic component, which in turn causes the oscillator VCO to generate additional secondary frequencies apart from its nominal frequency at a distance F re f from the main frequency. These secondary frequencies (spurs) are undesirable.
- This uncertainty in the symmetry of the reference currents can be avoided according to the invention in that instead of two reference currents only a single reference current is generated which either in the reference branch mp3 & mp4 of the source branch or in the reference branch mn3 & mn.4 of the sink. Branch is fed.
- a reference circuit can also be added, which exactly replicates the output stage of the charge pump and whose output is subjected to the tuning voltage v_tune from the output of the charge pump Pdout, so that a symmetry current i_sym is generated, which simulates the fault current i_error.
- the tuning voltage should be loaded as little as possible so as not to distort it by the additional measures.
- the symmetry current i_sym is then measured.
- the pump part (source or sink) hanging from the reference current is readjusted in such a way that a symmetry current i_sym of zero results.
- the regulation takes place via the gate voltage of the free branch of the output stage or the reference circuit.
- the switching transistors mn2a and mp2a likewise contained in the reference branch emulating the output stage branch can either be omitted in embodiment variants, placed inside or, as shown for example in FIG. 4, installed outside.
- a symmetry current i_sym regulated to 0 also causes an error current i_error of 0, since the output stage and reference circuit operate under the same conditions.
- the inventors propose a circuit arrangement of a charge pump with an input side, an output side and with at least one current mirror and a transistor, which is a source branch ) f to 1 P> cn o tn o tn o tn o tn
- H P- pj ⁇ ⁇ P- O C ⁇ P- £ ⁇ P- d P- rt wd uq (Sl rt P- rxi 3 P- rt 3 c ⁇ £ J P- y Q 3 ⁇ £ ⁇ ⁇ ⁇ rt P - d ⁇ d uq 5: H ⁇ P- rt z p- uq r + £ uq rt ⁇ ⁇ S Hi d ⁇ HH ⁇ ⁇ 1 d ⁇ ⁇ OH ⁇ cn ⁇ ⁇ ⁇ rt ⁇ C ⁇ C ⁇ uq d ⁇ H P- P- H?: 3 d ⁇ t ⁇ ⁇ C ⁇ P- to 3 d 3 H rt H P- p- d P- ⁇
- Buffer amplifier preferably an operational amplifier connected as a voltage follower.
- the voltage v_tune at the output Pdout remains largely unloaded, is copied and is available to the control stage as an aid for simulating the fault current i_schreib through a symmetry current i_sym.
- a loop filter can be provided between the output stage and the reference circuit, in particular when the charge pump is used in a phase locked loop.
- an attenuator ⁇ at the input of the buffer amplifier or of the operational amplifier connected as a voltage follower is used as the means for regulating the second circuit.
- This attenuator ⁇ can be used to set how quickly the readjustment of the second branch takes place.
- the attenuator ⁇ can consist of a resistor and a capacitance. The time constant of this attenuator should then be set so that the control is fast enough, but there is still no undesirable tendency to oscillate. This means that in the case of an existing loop filter, this time constant must essentially be matched to the loop filter.
- the second branch can furthermore have an input-side transistor if the operational amplifier OP2 used has a current output.
- the circuit arrangement can advantageously be expanded such that at least one switching transistor mn2, mp2 is arranged between the output of the charge pump and the transistor mnl, mpl on the output side.
- the at least one switching transistor mn2, mp2 can also be arranged such that at least one output-side transistor mnl, mpl is arranged between the output of the charge pump and a switching transistor mn2, mp2. Furthermore, the circuit arrangement is improved with regard to its symmetry properties if at least one symmetry transistor mn4, mp4 arranged symmetrically to a circuit transistor mn2, mp2 is provided.
- a capacitance C_sink, C_source can be connected between the gate of at least one switching transistor mn2, mp2 and the gate of the output-side transistor mnl, mpl of the same branch.
- the sink branch is constructed in mirror image to the source branch.
- the transistors of the source branch used can be designed as PMOS transistors and the transistors of the sink branch as NMOS transistors.
- Figure 1 Charge pump for a PLL according to the prior art
- FIG. 2 Simple circuit arrangement according to the invention of a charge pump with a buffer amplifier and an operational amplifier
- Figure 3 Simple circuit arrangement according to the invention of a charge pump with two operational amplifiers and interchanged switching transistors and transistors on the output side
- FIG. 4 Improved circuit arrangement according to the invention of a charge pump with two operational amplifiers with additional symmetry transistors
- Figure 5 Exemplary circuit arrangement of a PLL with a charge pump according to the invention.
- FIG. 1 shows a charge pump CP known from the prior art with inputs i_ref_sammlung, i_ref_senke, UP and DOWN on the input side and an outlet of the charge pump Pdout on the output side.
- the charge pump has a source branch 1 and a sink branch 2 arranged in mirror image thereto.
- each branch 1, 2 there are current mirrors 3, 4, each consisting of an input-side transistor mp3, mn3 and an output-side transistor mpl, mnl.
- the transistors mpl, mnl on the output side are switched by the two switching transistors mp2, mn2, which are connected to the UP and DOWN inputs, so that the pulses are applied to the UP and
- the two symmetry transistors mp4 and mn4 are additionally provided for reasons of symmetry.
- a capacitance C_source and C_sink can be connected between the gate of the switching transistors mp2 and mn2 and the gate of the output-side transistor mpl and mnl or the input i_ref_sammlung or i_ref_senke in order to accelerate the switching processes of the transistors on the output side.
- a loop filter LF is connected to the output of the charge pump, which can actually already be counted as a PLL circuit and consists of two capacitors C1, C2 and a resistor Rl, which integrates the pump output current.
- FIG. 2 shows a simple circuit arrangement according to the invention of a charge pump, in which, instead of two reference currents, only a single reference current i ref is required.
- the charge pump also has only a single current mirror 3 which is arranged on the source side of the charge pump.
- the output stage 5 has the switching transistors mp2 and mn2, which switch the current through end-side transistors mpl and mnl.
- a reference circuit 6 is constructed in which the output stage 5 is repeated. That is, the transistors mpl, mp2, mnl and mn2 are represented by the transistors mpla, mp2a, mnla and mn2a, the gates of mpla being mpled and mnla being mnl, while mp2a and mn2a are not connected to the UP and DOWN Inputs are connected.
- the same fault current i_sym is generated in the reference circuit as in the output stage.
- This symmetry current i_sym is measured as a voltage drop across resistor R3 with the help of an operational amplifier OP2. Its output voltage forms the control voltage for the respective second branch of the output stage or reference circuit and adjusts itself in such a way that the voltage drop across the resistor R3 and thus the symmetry current i_sym is equal to 0, that is to say the fault current i_error is equal to 0.
- a loop filter LF is also connected on the output side of the charge pump.
- This loop filter LF is a useful element when using the charge pump in a phase-locked loop, but is not absolutely necessary for the invention.
- This circuit arrangement ensures, via the control stage, that no fault current i_error occurs over a wide range of the voltage v_tune, and thus the previously known secondary frequencies (spurs) are reduced outside of the optimum operating point.
- FIG. 3 shows a variation of the simple circuit arrangement from FIG. 2, the switching transistors mn2 and mp2 having been interchanged with the output-side transistors mnl and mpl in the output stage 5 of the charge pump. Accordingly, transistors mp2a and mn2a could be dispensed with in reference circuit 6.
- an operational amplifier OP1 has now been placed in front of which an attenuator ⁇ , here consisting of a resistor R2 and a capacitor C3, is connected.
- the PLL consists of a phase detector PD, which compares two frequencies F ref and Fco / N for a possible relative phase shift.
- the reference frequency F re arises from a quartz-stabilized frequency F q , which is generated by a quartz oscillator Q, fed to a reference divider R and where it is reduced by a certain division ratio.
- the second supplied frequency F VC o / N comes from a voltage-controlled oscillator VCO, which is divided down to the frequency F vco / N by a divider.
- F re f is equal to F vco / N
- anti-backlash pulses (ABL pulses) are output at both outputs of the phase detector.
- the UP and DOWN pulse trains control the charge pump CP, to the output of which the loop filter is connected.
- This loop filter acts as an integrator.
- the voltage V F of the loop filter LF in turn serves to control the voltage-controlled oscillator VCO, which closes the control loop of the PLL.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Dc-Dc Converters (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP00962226A EP1205028B1 (de) | 1999-08-18 | 2000-08-17 | Ladungspumpe |
DE50008346T DE50008346D1 (de) | 1999-08-18 | 2000-08-17 | Ladungspumpe |
JP2001517702A JP3653496B2 (ja) | 1999-08-18 | 2000-08-17 | 電荷ポンプ |
US10/078,144 US6509770B2 (en) | 1999-08-18 | 2002-02-19 | Charge pump and PLL |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19939104A DE19939104A1 (de) | 1999-08-18 | 1999-08-18 | Ladungspumpe |
DE19939104.1 | 1999-08-18 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/078,144 Continuation US6509770B2 (en) | 1999-08-18 | 2002-02-19 | Charge pump and PLL |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2001013517A2 true WO2001013517A2 (de) | 2001-02-22 |
WO2001013517A3 WO2001013517A3 (de) | 2001-08-30 |
Family
ID=7918758
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2000/002791 WO2001013517A2 (de) | 1999-08-18 | 2000-08-17 | Ladungspumpe |
Country Status (5)
Country | Link |
---|---|
US (1) | US6509770B2 (de) |
EP (1) | EP1205028B1 (de) |
JP (1) | JP3653496B2 (de) |
DE (2) | DE19939104A1 (de) |
WO (1) | WO2001013517A2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10252618A1 (de) * | 2002-11-11 | 2004-05-27 | Infineon Technologies Ag | Schaltungsanordnung einer Ladungspumpe |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6441660B1 (en) * | 2001-02-02 | 2002-08-27 | Broadcom Corporation | High speed, wide bandwidth phase locked loop |
CA2344787A1 (en) * | 2001-04-19 | 2002-10-19 | Pmc-Sierra Ltd. | A phase detector customized for clock synthesis unit |
US6650156B1 (en) * | 2002-08-29 | 2003-11-18 | Integrated Device Technology, Inc. | Integrated circuit charge pumps having control circuits therein that inhibit parasitic charge injection from control signals |
US6894529B1 (en) | 2003-07-09 | 2005-05-17 | Integrated Device Technology, Inc. | Impedance-matched output driver circuits having linear characteristics and enhanced coarse and fine tuning control |
US7015736B1 (en) * | 2003-07-17 | 2006-03-21 | Irf Semiconductor, Inc. | Symmetric charge pump |
US6844774B1 (en) * | 2003-09-15 | 2005-01-18 | Agilent Technologies, Inc. | Method and apparatus for providing well-matched source and sink currents |
US7184510B2 (en) * | 2003-09-26 | 2007-02-27 | Quicklogic Corporation | Differential charge pump |
US6958637B2 (en) * | 2003-11-12 | 2005-10-25 | International Business Machines Corporation | Spark current cancellation in charge pump of high speed phase lock loop circuit |
KR101099947B1 (ko) | 2003-12-11 | 2011-12-28 | 모사이드 테크놀로지스, 인코포레이티드 | Pll/dll의 고출력 임피던스 충전 펌프 |
US6967501B1 (en) | 2003-12-18 | 2005-11-22 | Integrated Device Technology, Inc. | Impedance-matched output driver circuits having enhanced predriver control |
US7747237B2 (en) * | 2004-04-09 | 2010-06-29 | Skyworks Solutions, Inc. | High agility frequency synthesizer phase-locked loop |
DE102004019652A1 (de) * | 2004-04-22 | 2005-11-17 | Infineon Technologies Ag | Fehlerkompensierte Ladungspumpen-Schaltung und Verfahren zur Erzeugung eines fehlerkompensierten Ausgangsstroms einer Ladungspumpen-Schaltung |
US20060267644A1 (en) * | 2005-05-24 | 2006-11-30 | Edward Youssoufian | Method and apparatus for loop filter size reduction |
US20070018701A1 (en) * | 2005-07-20 | 2007-01-25 | M/A-Com, Inc. | Charge pump apparatus, system, and method |
JP2010103707A (ja) * | 2008-10-22 | 2010-05-06 | Canon Inc | チャージポンプ回路、及びクロック生成器 |
CN110830035B (zh) * | 2019-11-29 | 2024-04-16 | 湖南国科微电子股份有限公司 | 一种锁相环及其锁定检测方法和电路 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989001263A1 (en) * | 1987-08-03 | 1989-02-09 | Western Digital Corporation | Variable frequency system having linear combination of charge pump and voltage controlled oscillator |
US5166641A (en) * | 1992-03-17 | 1992-11-24 | National Semiconductor Corporation | Phase-locked loop with automatic phase offset calibration |
EP0798862A1 (de) * | 1996-03-28 | 1997-10-01 | Nec Corporation | Ladungspumpe für eine Phasenregelschleife |
US5703511A (en) * | 1996-06-19 | 1997-12-30 | Fujitsu Limited | Charge pump circuit, PLL circuit with charge pump circuit, and semiconductor integrated circuit with charge pump circuit |
US5781048A (en) * | 1995-08-23 | 1998-07-14 | Kabushiki Kaisha Toshiba | Synchronous circuit capable of properly removing in-phase noise |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9304954D0 (en) * | 1993-03-11 | 1993-04-28 | Sgs Thomson Microelectronics | Reference current generating circuit |
US5818287A (en) * | 1996-06-20 | 1998-10-06 | Ati Technologies Inc. | Gate-switching charge-pump implemented inside a phase locked loop |
US5801578A (en) * | 1996-12-16 | 1998-09-01 | Northern Telecom Limited | Charge pump circuit with source-sink current steering |
US6329872B1 (en) * | 1998-08-14 | 2001-12-11 | Nortel Networks Limited | Charge pump circuit for a phase locked loop |
US6222402B1 (en) * | 1998-09-04 | 2001-04-24 | International Business Machines Corporation | Differential charge-pump with improved linearity |
-
1999
- 1999-08-18 DE DE19939104A patent/DE19939104A1/de not_active Withdrawn
-
2000
- 2000-08-17 EP EP00962226A patent/EP1205028B1/de not_active Expired - Lifetime
- 2000-08-17 JP JP2001517702A patent/JP3653496B2/ja not_active Expired - Fee Related
- 2000-08-17 DE DE50008346T patent/DE50008346D1/de not_active Expired - Fee Related
- 2000-08-17 WO PCT/DE2000/002791 patent/WO2001013517A2/de active IP Right Grant
-
2002
- 2002-02-19 US US10/078,144 patent/US6509770B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989001263A1 (en) * | 1987-08-03 | 1989-02-09 | Western Digital Corporation | Variable frequency system having linear combination of charge pump and voltage controlled oscillator |
US5166641A (en) * | 1992-03-17 | 1992-11-24 | National Semiconductor Corporation | Phase-locked loop with automatic phase offset calibration |
US5781048A (en) * | 1995-08-23 | 1998-07-14 | Kabushiki Kaisha Toshiba | Synchronous circuit capable of properly removing in-phase noise |
EP0798862A1 (de) * | 1996-03-28 | 1997-10-01 | Nec Corporation | Ladungspumpe für eine Phasenregelschleife |
US5703511A (en) * | 1996-06-19 | 1997-12-30 | Fujitsu Limited | Charge pump circuit, PLL circuit with charge pump circuit, and semiconductor integrated circuit with charge pump circuit |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10252618A1 (de) * | 2002-11-11 | 2004-05-27 | Infineon Technologies Ag | Schaltungsanordnung einer Ladungspumpe |
Also Published As
Publication number | Publication date |
---|---|
US20020113631A1 (en) | 2002-08-22 |
DE19939104A1 (de) | 2001-07-19 |
JP2003507918A (ja) | 2003-02-25 |
US6509770B2 (en) | 2003-01-21 |
JP3653496B2 (ja) | 2005-05-25 |
EP1205028B1 (de) | 2004-10-20 |
EP1205028A2 (de) | 2002-05-15 |
DE50008346D1 (de) | 2004-11-25 |
WO2001013517A3 (de) | 2001-08-30 |
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